CN105607312A - Automated optical inspection device and method for defect inspection of LCD (liquid crystal display) module - Google Patents
Automated optical inspection device and method for defect inspection of LCD (liquid crystal display) module Download PDFInfo
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- CN105607312A CN105607312A CN201610046322.9A CN201610046322A CN105607312A CN 105607312 A CN105607312 A CN 105607312A CN 201610046322 A CN201610046322 A CN 201610046322A CN 105607312 A CN105607312 A CN 105607312A
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
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- Theoretical Computer Science (AREA)
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- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The invention relates to the technical field of automated optical inspection of LCD (liquid crystal display) modules, in particular to an automated optical inspection device for defect inspection of an LCD module and an automated optical inspection method for the defect inspection of the LCD module. The device comprises a central control processing unit, an image acquisition module, an image processing module and a PG (Pattern Generate) module. The method comprises the following steps of receiving a PG configuration parameter and a camera configuration parameter, lighting up modules according to the PG configuration parameter, configuring a camera according to the camera configuration parameter, controlling the camera to shoot an module image and collect the shot image, performing image processing and defect inspection on the collected original image, and outputting a defect inspection result and processed image data. The device and the method provided by the invention have the advantages that the image acquisition module, the PG module and the image processing module are integrated on an FPGA (Field Programmable Gate Array), and the whole testing process is performed based on the FPGA, so that the system integration degree is improved, the interaction complexity is lowered, the real-time processing performance is improved, the defect inspection time is shortened, the system stability is greatly improved, the inspection time is shortened, and the factory production efficiency is improved.
Description
Technical field
The automated optical detection technique field that the present invention relates to liquid crystal module, is specifically related to oneFor optical automatic detection device and the method for LCD liquid crystal module defects detection.
Background technology
Automatically detect in (AOI) field at liquid crystal module optics, all can relate to IMAQ,Several large modules such as PG (PatternGenerate-pattern generate equipment) and image processing orEquipment, traditional AOI method for designing is all that this three part is separately realized: PC controlIndependently PG generates the test pattern needing, then adopts by existing image pick-up card on marketCollection image, finally holds to PC by PCIE bus transfer, and then PC end carries out image deflectsTesting.
A PG of configuration separately, special in generating test pictures, be so unfavorable for system collectionBecome, be unfavorable for again systematic collaboration traffic control. IMAQ, PG, image are processed three partsSeparately realize, equipment is complicated alternately, and cost is high, and can not carry out also by figure image by host computerRow is processed, and the defects detection time is long, inefficiency.
Summary of the invention
For solving the problems of the technologies described above, the invention provides one and can realize detection picture certainlyMoving switching, integrate IMAQ and image processing function, and detection efficiency is highFor optical automatic detection device and the method for LCD liquid crystal module defects detection.
The present invention is for the optical automatic detection device of LCD liquid crystal module defects detection, its technologyScheme is, comprises and is integrated in a PLD:
Data transmission bus: for receiving flow process control command and configuration information, output is processedAfter image and testing result;
Center-control processing unit: the configuration information receiving for basis is to camera and moduleBe configured, realize IMAQ, image place according to the flow process control command receivingFlow process control and the debugging of reason and image transmission function;
PG module: for receive center-control processing unit send test pattern switching command andThe configuration information that data transmission bus sends, raw according to the PG configuration parameter in configuration informationBecome corresponding image clock signal, light module, switch module according to test pattern switching commandTest pictures;
Image capture module: there are multiple IMAQs that can be coupled with camera data output portTerminal, the original image of taking for gathering camera;
Image processing module: for the original image of image capture module collection is carried out to image placeReason and defects detection.
Further, also comprise the register that is integrated in PLD, described registerThe test that the configuration information that storage data transmission bus sends and center-control processing unit sendImage switching order, described configuration information comprises PG configuration parameter and camera configuration parameter.
Further, also comprise that external memory storage and the outside that is integrated in PLD depositStorage controller, described external storage controller is for by the original image of collection be disposedImage is read or is write in external memory storage and stores.
Further, also comprise the serial ports controller that is integrated in PLD, for rootThe camera configuration parameter configuration camera issuing according to center-control processing unit, according to center-control placeWhat reason unit issued adopts figure order control camera shooting module image.
Further, also comprise the interrupt control unit that is integrated in PLD, described inDisconnected controller is for receiving the flow process control command that data transmission bus issues, according to flow process controlSystem order generates different interrupt signals, controls center-control processing unit and carries out accordinglyProcess.
Further, in the time that the flow process control command receiving is test command, interrupt controllingDevice is to center-control processing unit output test interrupt signal, and center-control processing unit starts wholeIndividual testing process;
When the flow process control command receiving is when adopting figure order, interrupt control unit is controlled to central authoritiesFigure interrupt signal is adopted in processing unit output processed, and center-control processing unit passes through serial ports controllerControl collected by camera module image;
In the time that the flow process control command receiving is test pattern switching command, interrupt control unitTo center-control processing unit output test pattern handoff signal, center-control processing unitSend and cut figure order and cut figure desired parameters to PG module by register.
Further, also comprise the image reading module that is integrated in PLD, described inAfter the defects detection result and processing of image reading module for storage in reading external memoryView data, and by defects detection result and image data transmission after treatment to dataTransfer bus.
The present invention is for the optics automatic testing method of LCD liquid crystal module defects detection, its technologyScheme is: receive PG configuration parameter and camera configuration parameter, light according to PG configuration parameterModule, according to camera configuration parameter configuration camera, control camera take module image and to clapThe image of taking the photograph gathers, and the original image that gathers gained is carried out to image processing and defects detection,By defects detection result and view data after treatment output.
Further, while carrying out large-scale LCD liquid crystal module defects detection, adopt multiple described inCamera is taken this LCD liquid crystal module simultaneously, and the original image of taking gained is adoptedAfter collection, carry out image processing and defects detection, then by defects detection result and image after treatmentData output.
Further, described image processing comprise camera distortion rectification, image interpolation and enhancing,Binaryzation, background suppress and noise remove.
Beneficial effect of the present invention: by image capture module, PG module and image processing module collectionBecome on FPGA, whole testing process is carried out based on FPGA, can realize and detect picture certainlyMoving switching, IMAQ and processing. So both improved level of integrated system, reduced mutual complicatedDegree. In addition,, according to optics automatic detecting machine system, PG can fast and accurately generate necessaryTest signal, can generate test desired signal, again can requirement of real time, can also reduceHolistic cost. Utilize fully the interface logic of enriching of FPGA, expanded multiple CameralinkInterface or GigE interface (Cameralink and GigE all belong to camera interface standard), thanGeneral image pick-up card rich interface, can connect more camera, has facilitated large size panelThe detection of curtain. And come transmitting image and configuration parameter and send out by PCIE bus between PCThe order of losing one's life, transfer rate is fast, has versatility.
Brief description of the drawings
Fig. 1 is module connection layout of the present invention;
Fig. 2 is control flow chart of the present invention;
In figure: 1-center-control processing unit, 2-image capture module, 3-image placeReason module, 4-interrupt control unit, 5-serial ports controller, 6-register, 7-PGModule, 8-external storage controller, 9-outer memory module, 10-reading imagesModule, 11-data transmission bus, 12-camera, 13-module, 14-PC.
Detailed description of the invention
Below in conjunction with accompanying drawing and example, the invention will be further described, and obvious described example onlyA part of example of the present invention, instead of whole example, so described example should not be construed asLimitation of the present invention.
As shown in Figure 1, the present invention detects automatically for the optics of LCD liquid crystal module defects detectionDevice comprises: the center-control processing unit 1, the image capture module that are integrated in FPGA inside2, image processing module 3, interrupt control unit 4, serial ports controller 5, register 6, PG mouldPiece 7, external storage controller 8, reading images module 10, data transmission bus 11 and positionIn outer memory module 9, camera 12, module 13 and the PC individual calculus of FPGA outsideMachine 14. Wherein, data transmission bus 11 adopts PCIE bus.
If Fig. 2 is the optics automatic testing method of the present invention for LCD liquid crystal module defects detection,It comprises the following steps:
Step 1: center-control processing unit 1 initialisation image acquisition module 2, PG module 7And image processing module 3, wait for that personal computer 14 sends test command.
Step 2: personal computer 14 by PCIE bus issue camera configuration parameter, PG joinsPut number and test command. Camera configuration parameter, PG configurable number are all stored in register, phaseMachine configuration parameter is different and different according to image, and it comprises time for exposure, gain etc., sends out at every turnLose one's life order before all camera parameter is configured. PG configurable number comprises the picture letter that needs showBreath, as image size, sequential requirement, image type etc., image type comprise again gridiron pattern,GTG, pure color etc. Test command issues after parameter is sent completely.
Step 3: center-control processing unit 1 is received after test command, controls PG module 7 pointsBright module backlight. PCIE bus issues test command to interrupt control unit 4, interrupts controllingDevice 4 receives after test command, generates test interrupt signal, and this interrupt signal is sent toCenter-control processing unit 1. Center-control processing unit 1 is received after test command interrupt signalSend PG configuration parameter by register 6 to PG module 7. PG module 7 is according to readingPG configuration parameter generate the output of correct image clock signal, finally become by hardware conversionAfter the signal level that module needs, just can light module. Wherein, when needs switch test imageTime, personal computer 14 issues test pattern switching command by PCIE bus, interrupts controlDevice 4 processed generates test pattern handoff signal after receiving test pattern switching command, and willThis signal is sent to center-control processing unit 1. Center-control processing unit 1 receives testAfter image switching interrupt signal, send test pattern by register 6 to PG module 7 and switch lifeOrder and switch image required configuration parameter, PG module 7 control module realize image fromMoving switching.
Step 4: after module displays is stable, center-control processing unit 1 is read from registerGet camera configuration parameter, configure time for exposure and the gain etc. of camera by serial ports controller 5.
Step 5: personal computer 14 is issued and adopted figure order by PCIE bus, controls cameraTake module image, and gather image by image capture module 2. Interrupt control unit 4 receivesTo adopting after figure order, generate and adopt figure interrupt signal, and this interrupt signal is sent to center-controlProcessing unit 1, center-control processing unit 1 is controlled camera by serial ports controller 5 and is taken mouldGroup image. Image capture module 2 gathers camera by Cameralink or GigE interface and clapsTake the photograph gained image, i.e. original image, is packaged into AXI bus format by original image, passes throughAXI bus transfer is to external storage controller 8, and external storage controller 8 is write original imageEntering external memory storage 9 stores.
Step 6: read original image, original image is processed and defects detection. OutsideStorage control 8 is read original image from external memory storage 9, and by AXI busTransfer to image processing module 3, image processing module 3 carries out camera distortion to original image and rectifysJust, image interpolation and enhancing, binaryzation, background inhibition, noise remove and the inspection of some line defectSurvey. Wherein, the image processing process in whole image processing module 3 is prior art, hereinDo not repeat. After image processing module 3 is disposed by AXI bus by testing result andImage data transmission after treatment is to external storage controller 8, and external storage controller 8 will be examinedSurvey result and view data after treatment and be stored to external memory storage 9.
Step 7: output detections result and view data after treatment are to personal computer 14. ReadGet image module 10 by testing result and processing in AXI bus reading external memory 9After view data, be translated into the transformat of PCIE bus, by PCIE busExport personal computer 14 to and show output. Divide by the complete display defect of personal computer 14Category information and positional information, provide next step to process reference frame to operator.
The above, be only the specific embodiment of the present invention, it should be pointed out that any basis of being familiar withThe technical staff in field in the disclosed technical scope of the present invention, the variation that can expect easily orReplace, within all should being encompassed in protection scope of the present invention.
Claims (10)
1. for the optical automatic detection device of LCD liquid crystal module defects detection, its spyLevy and be, comprise and be integrated in PLD:
Data transmission bus: for receiving flow process control command and configuration information, output is processedAfter image and testing result;
Center-control processing unit: the configuration information receiving for basis is to camera and moduleBe configured, realize IMAQ, image place according to the flow process control command receivingFlow process control and the debugging of reason and image transmission function;
PG module: for receive center-control processing unit send test pattern switching command andThe configuration information that data transmission bus sends, raw according to the PG configuration parameter in configuration informationBecome corresponding image clock signal, light module, switch module according to test pattern switching commandTest pictures;
Image capture module: there are multiple IMAQs that can be coupled with camera data output portTerminal, the original image of taking for gathering camera;
Image processing module: for the original image of image capture module collection is carried out to image placeReason and defects detection.
2. automatically examine for the optics of LCD liquid crystal module defects detection as claimed in claim 1Survey device, it is characterized in that: also comprise the register that is integrated in PLD, described inThe configuration information that register-stored data transmission bus sends and center-control processing unit sendTest pattern switching command, described configuration information comprises PG configuration parameter and camera configurationParameter.
3. automatically examine for the optics of LCD liquid crystal module defects detection as claimed in claim 1Survey device, it is characterized in that: also comprise external memory storage and be integrated in PLDExternal storage controller, described external storage controller is used for the original image and the processing that gatherComplete image is read or is write in external memory storage and stores.
4. automatically examine for the optics of LCD liquid crystal module defects detection as claimed in claim 1Survey device, it is characterized in that: also comprise the serial ports controller that is integrated in PLD,For the camera configuration parameter configuration camera issuing according to center-control processing unit, according to central authoritiesWhat controlled processing unit issued adopts figure order control camera shooting module image.
5. automatically examine for the optics of LCD liquid crystal module defects detection as claimed in claim 1Survey device, it is characterized in that: also comprise the interrupt control unit that is integrated in PLD,Described interrupt control unit is used for receiving the flow process control command that data transmission bus issues, according toFlow process control command generates different interrupt signals, controls center-control processing unit and carries outCorresponding processing.
6. automatically examine for the optics of LCD liquid crystal module defects detection as claimed in claim 5Survey device, it is characterized in that: in the time that the flow process control command receiving is test command,Interrupt control unit is to center-control processing unit output test interrupt signal, and center-control is processed singleUnit starts whole testing process;
When the flow process control command receiving is when adopting figure order, interrupt control unit is controlled to central authoritiesFigure interrupt signal is adopted in processing unit output processed, and center-control processing unit passes through serial ports controllerControl collected by camera module image;
In the time that the flow process control command receiving is test pattern switching command, interrupt control unitTo center-control processing unit output test pattern handoff signal, center-control processing unitSend and cut figure order and cut figure desired parameters to PG module by register.
7. automatically examine for the optics of LCD liquid crystal module defects detection as claimed in claim 3Survey device, it is characterized in that: also comprise the image reading module that is integrated in PLD,Described image reading module is used for the defects detection result of storage in reading external memory and locatesView data after reason, and defects detection result and image data transmission after treatment are givenData transmission bus.
8. for the optics automatic testing method of LCD liquid crystal module defects detection, its spyLevy and be: receive PG configuration parameter and camera configuration parameter, light according to PG configuration parameterModule, according to camera configuration parameter configuration camera, control camera take module image and to clapThe image of taking the photograph gathers, and the original image that gathers gained is carried out to image processing and defects detection,By defects detection result and view data after treatment output.
9. the optics for LCD liquid crystal module defects detection as claimed in claim 8 is automaticDetection method, is characterized in that: while carrying out large-scale LCD liquid crystal module defects detection, adoptThis LCD liquid crystal module is taken with multiple described cameras simultaneously, and will take gainedAfter original image collection, carry out image processing and defects detection, then by defects detection result and locateView data output after reason.
10. the optics for LCD liquid crystal module defects detection as claimed in claim 8 is automaticDetection method, is characterized in that: described image processing comprises that camera distortion is corrected, image is insertedValue and enhancing, binaryzation, background suppress and noise remove.
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| CN107817216A (en) * | 2017-10-31 | 2018-03-20 | 武汉精测电子技术股份有限公司 | A kind of automatic optical detecting system based on CPU+GPU+FPGA frameworks |
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