CN105606948A - Circuit detection method and system - Google Patents
Circuit detection method and system Download PDFInfo
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- CN105606948A CN105606948A CN201610070073.7A CN201610070073A CN105606948A CN 105606948 A CN105606948 A CN 105606948A CN 201610070073 A CN201610070073 A CN 201610070073A CN 105606948 A CN105606948 A CN 105606948A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Abstract
The invention discloses a circuit detection method and system, mainly for solving the problem of low short-circuit detection sensitivity existing in a conventional touch screen short-circuit detection method. The circuit detection method is applied to detection of a capacitive touch screen and the like, the capacitive touch screen comprises multiple driving lines and an induction line intersected with the multiple driving lines, and capacitive nodes are formed at intersection positions between the driving lines and the induction line. The method comprises the following steps: loading voltages to a driving line to be detected, hanging at least a part of the driving lines besides the driving line to the detected in chip internal paths, detecting an electric parameter on the induction line, and determining whether the driving line to be detected is at a short-circuit state through comparing the detected electric parameter with a set value. According to the circuit detection method provided by the invention, when the driving line to be detected is at the short-circuit state, the electric parameter at the induction line is substantially changed, even short-circuit resistance is quite large, whether the driving line to be detected is at the short-circuit state can still be accurately determined, and thus the detection sensitivity is greatly improved.
Description
Technical field
The present invention relates to electric circuit inspection field, be specifically related to a kind of circuit detecting method for capacitance touch screen and inspectionExamining system.
Background technology
Projected capacitive (Projectivecapacitance) touch screen has been widely used in mobile phone, flat boardIn the human-computer interaction interface of computer, ATM and various management systems. Projected capacitive touch screen curtain hasThe advantages such as light rate is high, wear-resistant, the life-span is long.
Projected capacitive touch screen curtain comprises self-capacitance (selfcapacitance) formula capacitance touch screen and mutual capacitance(mutualcapacitance) formula capacitance touch screen.
In self-capacitance touch screen curtain, at for example tin indium oxide (Indium of conductive material for surface of glass substrateTinOxide, ITO) be made into laterally and longitudinal electrode array, also can adopt other transparent conductive oxides to makeLaterally, with longitudinal electrode array, these horizontal and vertical electrod-arrays form Detection capacitance array with ground respectively, examineSurveying electric capacity is described self-capacitance. In the time that finger (or pointer) touches screen, the electric capacity of finger will be added toOn Detection capacitance, Detection capacitance amount is increased. Touching while detecting, self-capacitance screen detect respectively successively laterally withLongitudinal electrode, according to the variation of electric capacity before and after touching, determines respectively lateral coordinates and along slope coordinate, is then combined intoThe touch coordinate of plane.
In mutual capacitance touchscreens curtain, many horizontal drive wires are set on a side surface of glass substrate, and inMany longitudinal lines of induction are set on the opposite side surface of glass substrate. Drive wire and the line of induction form detection arrays,Detection arrays taking number of arrays as 8X8 is example, and it can be equivalent to RC grid chart as shown in Figure 1, the driving of 8 rowThe sense wire RX composition of line TX and 8 row has the network of 8*8 node, and each mesh forms one and repeats singleUnit, wherein, Rt is that drive wire is walked line resistance in single repetitive, Rr is that the line of induction is at single repetitiveIn walk line resistance, the mutual capacitance that Cc is single repetitive. In the time that finger touch arrives screen, near touch pointDetection capacitance Cc causes Detection capacitance Cc size to change with finger electric capacity and body capacitance coupling. Drive wire TX successivelySend pumping signal, sense wire RX receives signal simultaneously, can obtain like this size of the Detection capacitance Cc of node,Can calculate the coordinate of touch point. Even if there are multiple touch points, also can calculate the true coordinate of each touch point,Realize multi-point touch, therefore mutual capacitance touchscreens curtain becomes the main flow of prior art.
Mutual capacitance touchscreens curtain after completing need to detect and judge whether it exists defect. Common defectFor example: short circuit between short circuit between drive wire, the line of induction, drive wire self short circuit, the line of induction self open circuit andShort circuit etc. between drive wire and the line of induction.
For example, to detect two drive wires (TX5 and TX6), whether short circuit is as example below, describes one of prior artPlant circuit detecting method. With reference to Fig. 2, on-load voltage VTX on drive wire TX5, supposes that the amplitude of voltage VTX isV1, by drive wire TX6 ground connection, R1 is short-circuit resistance, N be on drive wire location of short circuit and drive wire initiating terminal itBetween the quantity of equivalent resistance Rt. Get a line of induction (for example line of induction RX4) as test side, by with this senseThe circuit of answering line to connect detects the variation of electric charge, judges between two drive wires whether short circuit by the variation of electric charge.If two the A place of the location of short circuit of drive wire in Fig. 1, now N is 0, due to driving force restriction,The upper VTX amplitude of line of induction RX4 is for slightly diminishing, but along with short-circuit resistance R1 becomes large, the amplitude that V1 diminishes can be got overCome less. If short-circuit resistance R1 is larger, be for example greater than 10K Ω, the change of V1 amplitude is very little, line of induction RX4The electric charge change amount receiving will be very little, cannot judge between two drive wires whether short circuit.
If drive wire TX5 and drive wire TX6 location of short circuit are not A place at initiating terminal, but in the middle of the drive wire orEnd, for example, at B place, position as shown in Figure 1, now N=4, formed one as shown in Figure 2 Rt*N,The resistance series connection of R1 and Rt*N, although the voltage in TX6 line centre position can lift, TX5 line centre positionVoltage also can lower, and both cancel out each other in variation, and line of induction RX4 holds the quantity of electric charge (TX voltage and the Cc that detectProduct) change very little, detect effect also not obvious.
Summary of the invention
In view of this, the invention provides the highly sensitive circuit detecting method of a kind of short-circuit detecting.
A kind of circuit detecting method, for comprising the detection of capacitance touch screen, described capacitance touch screen comprises manyBar drive wire and with described many drive wires line of induction arranged in a crossed manner, at described drive wire and the described line of inductionCrossover location forms capacitive node, and described method comprises: on-load voltage on drive wire to be measured, and treat described in removingSurvey at least part of drive wire outside drive wire with the chip internal path of its existence electrical connection in unsettled, detectElectrical quantity on the line of induction, judges that by the size of the electrical quantity that relatively detects and setting value described drive wire to be measured isNo is short-circuit condition.
Preferably, described electrical quantity comprises charge variation amount, curtage.
Preferably, described method comprises: on-load voltage on drive wire to be measured, and by except drive wire to be measuredAt least partly drive wire with the chip internal path of its existence electrical connection in unsettled, detect the electric charge on the line of inductionVariable quantity/current/voltage, sets charge variation amount/setting electric current if the charge variation amount/current/voltage detecting is greater than/ setting voltage, judges that described drive wire to be measured is short-circuit condition.
Preferably, by all the other drive wires except described drive wire to be measured all with the core of its existence electrical connectionUnsettled in sheet inner track.
Preferably, the voltage loading on described drive wire to be measured comprises that amplitude, frequency and/or phase place in time canThe voltage changing.
Preferably, the voltage loading on described drive wire to be measured comprises pulse voltage or alternating voltage.
Preferably, described setting charge variation amount Q comprises, on-load voltage on drive wire to be measured, and described in removingAll the other drive wires outside drive wire to be measured are unsettled in chip internal path, and drive wire to be measured is while being normal condition,Charge variation amount on the described line of induction.
Preferably, in the time that the charge variation amount Q ' detecting is more than or equal to the setting charge variation amount Q of a times, judgeDescribed drive wire to be measured is short-circuit condition.
Preferably, 1.2≤a≤2.
Preferably, detect successively described drive wire by setting order.
The present invention also provides a kind of checking system for PCB, can improve the sensitivity of short-circuit detecting.
For reaching this object, the present invention by the following technical solutions:
A kind of checking system for PCB, for comprising the detection of capacitance touch screen, described capacitance touch screen comprises manyBar drive wire and with described many drive wires line of induction arranged in a crossed manner, described system comprises:
The first configuration module, for when wherein a drive wire detects, by except drive wire to be measured extremelySmall part drive wire be configured to the chip internal path of its existence electrical connection in unsettled;
The second configuration module, is used to described drive wire on-load voltage to be measured;
Detection module, for detection of the electrical quantity on the line of induction;
Whether comparison module, for the electrical quantity of relatively detection and the size of setting value, judge described drive wire to be measuredFor short-circuit condition.
Preferably, described the first configuration module is configured to all the other drive wires except drive wire to be measured all at coreUnsettled in sheet inner track.
Preferably, described detection module is configured to detect charge variation amount, the curtage on the line of induction.
Preferably, charge variation amount/current/voltage that described comparison module is configured to relatively detect becomes with setting electric chargeElectric current/setting voltage is measured/is set in change, and when the charge variation amount/current/voltage detecting be greater than the charge variation amount set/While setting electric current/setting voltage, judge that described drive wire to be measured is short-circuit condition.
Preferably, described the second configuration module be configured on described drive wire to be measured loading amplitude, frequency and/orThe voltage that phase place can change in time.
Preferably, described the first configuration module is configured to successively described drive wire be detected by setting order.
The invention has the beneficial effects as follows:
Circuit detecting method provided by the invention is on-load voltage on drive wire to be measured, and except drive wire to be measuredAt least part of drive wire is set in chip internal path unsettled, so, and when drive wire to be measured is short-circuit conditionTime, the electrical quantity at line of induction place can produce significantly and change, even if short-circuit resistance very greatly also can judge accuratelyDrive wire to be measured, whether in short-circuit condition, has improved detection sensitivity greatly, and in addition, this kind of detection method onlyThe driving pin configuration of having revised while detection, can extra circuits area, reduce testing cost.
Checking system for PCB provided by the invention passes through the first configuration module by least portion except drive wire to be measuredDivide drive wire to be configured in chip internal path unsettled, so, in the time that drive wire to be measured is short-circuit condition, inductionThe electrical quantity at line place can produce significantly and change, even if short-circuit resistance very greatly also can judge driving to be measured accuratelyLine, whether in short-circuit condition, has improved detection sensitivity greatly, and in addition, this kind of detection method is only to have revisedDriving pin configuration when detection, can extra circuits area, and testing cost is low.
Brief description of the drawings
By the description to the embodiment of the present invention referring to accompanying drawing, above-mentioned and other object of the present invention, featureWith advantage will be more clear, in the accompanying drawings:
Fig. 1 is the equivalent RC grid chart of mutual capacitance touchscreens 8X8 detection arrays;
Fig. 2 detects the whether detection method schematic diagram of short circuit of two drive wires in prior art;
Fig. 3 is the circuit detecting method schematic diagram that the specific embodiment of the invention provides;
Fig. 4 is the structural representation of the checking system for PCB that provides of the specific embodiment of the invention.
In figure, 1, the first configuration module; 2, the second configuration module; 3, detection module; 4, comparison module.
Detailed description of the invention
Based on embodiment, present invention is described below, but the present invention is not restricted to these embodiment. ?In below details of the present invention being described, detailed some specific detail sections of having described. To those skilled in the artDo not have the description of these detail sections can understand the present invention completely yet. For fear of obscuring essence of the present invention,Known method, process, flow process, element do not describe in detail.
The embodiment of circuit testing method of the present invention and system is described below with reference to Fig. 3 and Fig. 4.
Embodiment of the method:
The invention provides a kind of circuit detecting method, for comprising the detection of capacitance touch screen. As Fig. 1 instituteShow, capacitance touch screen comprise many drive wires and with many lines of induction that drive wire is arranged in a crossed manner. Drive wire and senseAnswer line to exist in Different Plane and mutually vertical, because drive wire and the line of induction are in Different Plane, its intersection formsCapacitive node. Fig. 1 is the equivalent RC grid chart as example taking number of arrays as 8X8, and actual array number can be according to screen certainlyCurtain size is adjusted, and can be any number. Each mesh forms a repetitive, and wherein, Rt is for drivingMoving-wire is walked line resistance in single repetitive, and Rr is that the line of induction is walked line resistance, Cc in single repetitiveFor the mutual capacitance of single repetitive. This circuit detecting method comprises, on-load voltage on drive wire to be measured, and willAt least part of drive wire except drive wire to be measured is unsettled in chip internal path, detects the electricity ginseng on the line of inductionNumber, judges by the electrical quantity that relatively detects and the size of setting value whether drive wire to be measured is short-circuit condition.
The circuit detecting method of confession of the present invention by least part of drive wire except drive wire to be measured on chip internal roadUnsettled in footpath, so, in the time that drive wire to be measured is short-circuit condition, the electrical quantity at line of induction place can produce significantlyChange,, greatly carry whether in short-circuit condition even if short-circuit resistance very greatly also can judge drive wire to be measured accuratelyHigh detection sensitivity, in addition, this kind of detection method is only the driving pin configuration of having revised while detection, can notExtra circuits area, testing cost is low.
For improving to greatest extent detection sensitivity, preferred, in the time detecting, will be except drive wire to be measuredAll the other drive wires all unsettled in chip internal path.
The electrical quantity wherein detecting can but to be not limited to be that charge variation amount, electric current, voltage or other can lead toCross aforementioned parameters and calculate the parameter obtaining.
The voltage type being carried on drive wire to be measured is not limit, as long as can be in induction in the time that drive wire to be measured is short circuitLine detects the variation of electrical quantity. Voltage can but to be not limited to be that amplitude, frequency and/or phase place in time canThe voltage changing, can change in time herein can be that temporal evolution amplitude and/or direction are alwaysChanging, can be also to change and the indeclinable voltage of other times in some or a period of time. For example, be carried inVoltage on drive wire to be measured can but to be not limited to be pulse voltage or alternating voltage, pulse voltage wherein canBeing one, can be also the stack of multiple pulse voltages.
Below taking drive wire TX5 and TX6 as example illustrates detection method of the present invention, testing circuit can be equivalent to as figureCircuit shown in 3. Using drive wire TX5 as drive wire to be measured, on-load voltage VTX on drive wire TX5, amplitudeFor V1, drive wire TX6 is unsettled in its chip internal path.
Get a line of induction as test side, for example the line of induction RX4 in Fig. 3. Taking electrical quantity as charge variation amountFor example, if drive wire TX5 and TX6 do not have short circuit, due to the existence of capacitor C c, the voltage on drive wire TX5The amplitude of Vtx5 is V1, and the amplitude of voltage Vtx6 on drive wire TX6 is 0, and line of induction RX4 is upper detectsCharge variation amount be
Vtx5*Cc+Vtx6*Cc＝V1*Cc，
And in the time there is short circuit between drive wire TX5 and TX6, no matter A place or the B of location of short circuit in Fig. 1Place, because drive wire TX6 is unsettled, therefore, the voltage Vtx5 that amplitude is V1 if having on drive wire TX5,There is same signal, i.e. Vtx5=Vtx6=V1 last time in drive wire TX6. So, the electric charge on the line of inductionVariable quantity is
Vtx5*Cc+Vtx6*Cc＝2*V1*Cc。
Hence one can see that, and in the time there is short circuit between drive wire TX5 and TX6, the electric charge detecting on the line of induction becomesChange amount is original twice, even if short-circuit resistance R1 very greatly also can detect between drive wire whether short circuit, greatlyImprove the sensitivity detecting.
Further, set charge variation amount Q can but be not limited to and be, on-load voltage on drive wire to be measured,And by unsettled in chip internal path all the other drive wires except drive wire to be measured, and drive wire to be measured is normalWhen state, the charge variation amount on the line of induction.
Detect accuracy for improving, avoid erroneous judgement, set a coefficient a, when the charge variation amount Q ' detecting is greater thanWhile equaling the setting charge variation amount Q of a times, judge that drive wire to be measured is as short-circuit condition. The span of a canBut be not limited to be 1.2≤a≤2.
Further, can set a detection order, detect successively drive wire by setting order, for example, canBut be not limited to be, by TX1, TX2 ..., TX8 order detect, detect driving in short-circuit conditionMoving-wire, for example, if detect TX5 and two drive wires of TX6 in short-circuit condition, show TX5 and TX6 itBetween short circuit.
Provide the embodiment of a concrete detection method below, by TX1, TX2 ..., TX8 order to driveLine detects, and testing process is, the voltage that loading amplitude is V1 on drive wire to be measured, and by all the other drive wiresUnsettled in its chip internal path, appoint and get a line of induction as test side, detect the charge variation on this line of inductionAmount Q ' also compares with setting charge variation amount Q, if Q ' >=1.5Q judges that this drive wire to be measured is short circuitState, otherwise judge that this drive wire to be measured is normal. Successively eight drive wires are detected, determine be judged as shortBetween two drive wires of line state, there is short circuit, if nowhere in the drive wire of short-circuit condition, determine this capacitive touchThe drive wire of touching screen is all normal.
In the time that electrical quantity is other parameters, detection mode and preceding method are similar, for example, and in the time that electrical quantity is electric current,On-load voltage on drive wire to be measured, and by least part of drive wire except drive wire to be measured with its existence electricityUnsettled in the chip internal path that gas connects, detect the electric current on the line of induction, if the electric current detecting is greater than setting electric current,Judge that drive wire to be measured is as short-circuit condition. In the time that electrical quantity is voltage, on-load voltage on drive wire to be measured, andBy at least part of drive wire except drive wire to be measured with the chip internal path of its existence electrical connection in unsettled,Detect the voltage on the line of induction, if the voltage detecting is greater than setting voltage, judge that drive wire to be measured is as short-circuit condition.
Device embodiment:
The present invention also provides a kind of checking system for PCB, for comprising the detection of capacitance touch screen. Capacitance plateComprise many drive wires and with many lines of induction that drive wire is arranged in a crossed manner. Drive wire and the line of induction exist in differencePlane and mutually vertical, because drive wire and the line of induction are in Different Plane, its intersection forms capacitive node. This isTurnkey is drawn together the first configuration module 1, the second configuration module 2, detection module 3 and comparison module 4. Wherein, first joinsPut module 1 for when wherein a drive wire detects by least part of drive wire except drive wire to be measuredBe configured to the chip internal path of its existence electrical connection in unsettled. The second configuration module 2 is used to be measured drivingMoving-wire on-load voltage. Detection module 3 is for detection of the electrical quantity on the line of induction. Comparison module 4 is for relatively detectingElectrical quantity and the size of setting value, judge whether described drive wire to be measured is short-circuit condition.
Checking system for PCB provided by the invention is at least part of by except drive wire to be measured by the first configuration moduleDrive wire is configured in chip internal path unsettled, so, in the time that drive wire to be measured is short-circuit condition, the line of inductionThe electrical quantity at place can produce significantly and change, even if short-circuit resistance very greatly also can judge drive wire to be measured accuratelyWhether, in short-circuit condition, greatly improved detection sensitivity, in addition, this kind of detection method is only to have revised inspectionDriving pin configuration when survey, can extra circuits area, and testing cost is low.
For improving to greatest extent detection sensitivity, preferred, in the time detecting, the first configuration module is configured toAll the other drive wires except drive wire to be measured are all unsettled in chip internal path.
Fig. 4 illustrates structural representation when checking system for PCB provided by the invention detects. The second configurationModule 2 is drive wire TX1 on-load voltage to be measured, and the first configuration module 1 is configured to all the other drive wires at its chipUnsettled in inner track. Get line of induction RX4 as test side, detection module 3 detects the charge variation amount on RX4Q '. The charge variation amount Q ' that comparison module 4 relatively detects and setting charge variation amount Q, if the electric charge detecting becomesChange amount Q ' is greater than setting charge variation amount Q, judges that drive wire TX1 to be measured is short-circuit condition.
Certainly, the electrical quantity detecting on the line of induction is not limited to above-mentioned charge variation amount, and detection module 3 is all rightBut be not limited to the curtage that is configured to detect on the line of induction. Its detection method and electrical quantity are charge variation amountTime similar. For example, detection module 3 is configured to detect the electric current on the line of induction, and comparison module is configured to relatively examineThe electric current of surveying and setting electric current, and in the time that the electric current detecting is greater than setting electric current, judge that drive wire to be measured is as short circuit shapeState. Detection module 3 also can be configured to the voltage detecting on the line of induction, the electricity that comparison module is configured to relatively detectPress and setting voltage, and in the time that the voltage detecting is greater than setting voltage, judge that drive wire to be measured is as short-circuit condition.
Setting value wherein can be to be pre-stored in comparison module 4, can be also that comparison module 4 obtains by calculating,Certainly, independent base modules can also be set, setting value is stored in base modules, and comparison module 4 calls baseThe setting value of storing in quasi-mode piece and the electrical quantity of detection compare.
Further, the second configuration module 2 be configured on drive wire to be measured loading amplitude, frequency and/or phase place withThe voltage that time can change, more preferably pulse voltage or alternating voltage, pulse voltage wherein canBeing one, can be also the stack of multiple pulse voltages.
Further, the second configuration module 2 is configured to by the detection order of setting successively to drive wire on-load voltage,Detect the drive wire in short-circuit condition, for example, if detect TX5 and two drive wires of TX6 in short circuit shapeState, shows short circuit between TX5 and TX6.
In addition, it should be understood by one skilled in the art that the accompanying drawing providing at this is all for illustrative purposes,And accompanying drawing is not necessarily drawn in proportion.
Meanwhile, should be appreciated that example embodiment is provided, so that the disclosure is comprehensively, and by abundant its scopeConvey to those skilled in the art. A lot of specific detail (for example example of specific features, equipment and method) are givenGo out to provide thorough understanding of the disclosure. It will be apparent to one skilled in the art that and do not need to adopt specific detail, showExample embodiment can be implemented with a lot of different forms, and example embodiment should not be understood to limit the disclosureScope. In some example embodiment, well-known device structure and well-known technology are not in detailDescribe.
When an element or layer be mentioned as another element or layer " on ", " being engaged to ", " being connected to "Or " being coupled to " another element or when layer, its can be directly on another element or layer, directly engaged, connectedOr be connected to another element or layer, or can there is intermediary element or layer. By contrast, when an element is mentioned as" directly " another element or layer " on ", " being directly engaged to ", " being directly connected to " or " directlyBe coupled to " another element or when layer, can not there is not intermediary element or layer. For describing its of relation between elementIts word should be in a similar manner explained (for example, " and between " with " directly between ", " vicinity " and " directlyAdjoining near " etc.). As used herein, term "and/or" comprises in the Listed Items of one or more associationsArbitrary or all combination.
Although term first, second, third, etc. can be used to describe each element, parts, region, layer at thisAnd/or section, but these elements, parts, region, layer and/or section should not limited by these terms. ThisA little terms can be only for by element, parts, region, layer or a section and another element, region, layer or sectionDistinguish. Term and other numerical value term such as " first ", " second " are inferior when not meaning that in the time that this usesOrder or order, unless context explicitly points out. Thereby, the first element discussed below, parts, region, layer orSection can be called as the second element, parts, region, layer or section, and does not deviate from the instruction of example embodiment. ThisOutward, in description of the invention, except as otherwise noted, the implication of " multiple " is two or more.
The foregoing is only the preferred embodiments of the present invention, be not limited to the present invention, for art technology peopleMember, the present invention can have various changes and variation. All do within spirit of the present invention and principle anyRevise, be equal to replacement, improvement etc., within all should being included in protection scope of the present invention.
Claims (16)
1. a circuit detecting method, for comprising the detection of capacitance touch screen, described capacitance touch screen comprisesMany drive wires and with described many drive wires line of induction arranged in a crossed manner, at described drive wire and the described line of inductionCrossover location form capacitive node, it is characterized in that, described method comprises: on-load voltage on drive wire to be measured,And by least part of drive wire except described drive wire to be measured with the chip internal path of its existence electrical connectionIn unsettled, detect the electrical quantity on the line of induction, described in the size judgement of the electrical quantity that relatively detects and setting valueWhether drive wire to be measured is short-circuit condition.
2. circuit detecting method according to claim 1, is characterized in that, described electrical quantity comprises that electric charge becomesChange amount, curtage.
3. circuit detecting method according to claim 2, is characterized in that, described method comprises: to be measuredOn-load voltage on drive wire, and at least part of drive wire except drive wire to be measured is being electrically connected with its existenceChip internal path in unsettled, detect the charge variation amount/current/voltage on the line of induction, if the electric charge detecting becomesChange amount/current/voltage is greater than sets charge variation amount/setting electric current/setting voltage, judges described drive wire to be measuredFor short-circuit condition.
4. circuit detecting method according to claim 1, is characterized in that, will except described drive wire to be measured itAll the other outer drive wires all with the chip internal path of its existence electrical connection in unsettled.
5. according to the circuit detecting method described in claim 1 to 4 any one, it is characterized in that, described to be measuredThe voltage loading on drive wire comprises the voltage that amplitude, frequency and/or phase place can change in time.
6. circuit detecting method according to claim 5, is characterized in that, on described drive wire to be measured, addsThe voltage carrying comprises pulse voltage or alternating voltage.
7. circuit detecting method according to claim 3, is characterized in that, described setting charge variation amount QComprise, on-load voltage on drive wire to be measured, and by all the other drive wires except described drive wire to be measured at chipUnsettled in inner track, and drive wire to be measured is while being normal condition, the charge variation amount on the described line of induction.
8. circuit detecting method according to claim 7, is characterized in that, as the charge variation amount Q ' detectingWhile being more than or equal to the setting charge variation amount Q of a times, judge that described drive wire to be measured is short-circuit condition.
9. circuit detecting method according to claim 8, is characterized in that, 1.2≤a≤2.
10. according to the circuit detecting method described in claim 1 to 4,7 to 9 any one, it is characterized in that, pressSetting order detects described drive wire successively.
11. 1 kinds of checking system for PCBs, for comprising the detection of capacitance touch screen, described capacitance touch screen bagDraw together many drive wires and with described many drive wires line of induction arranged in a crossed manner, it is characterized in that described system bagDraw together:
The first configuration module (1), for when wherein a drive wire detects, will be except drive wire to be measuredAt least part of drive wire be configured to the chip internal path of its existence electrical connection in unsettled;
The second configuration module (2), is used to described drive wire on-load voltage to be measured;
Detection module (3), for detection of the electrical quantity on the line of induction;
Comparison module (4), for the electrical quantity of relatively detection and the size of setting value, judges described drive wire to be measuredWhether be short-circuit condition.
12. checking system for PCBs according to claim 11, is characterized in that, described the first configuration module (1)Be configured to all the other drive wires except drive wire to be measured all unsettled in chip internal path.
13. checking system for PCBs according to claim 11, is characterized in that, described detection module (3)Be configured to detect charge variation amount, curtage on the line of induction.
14. checking system for PCBs according to claim 13, is characterized in that, described comparison module (4)Charge variation amount/the current/voltage that is configured to relatively detect and setting charge variation amount/setting electric current/setting voltage,And in the time that the charge variation amount/current/voltage detecting is greater than setting charge variation amount/setting electric current/setting voltage, sentenceFixed described drive wire to be measured is short-circuit condition.
15. checking system for PCBs according to claim 11, is characterized in that, described the second configuration module (2)Be configured to the voltage that loading amplitude, frequency and/or phase place can change in time on described drive wire to be measured.
16. checking system for PCBs according to claim 11, is characterized in that, described the second configuration module (2)Be configured to by setting order successively to described drive wire on-load voltage.
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| CN106526398A (en) * | 2016-10-28 | 2017-03-22 | 昆山国显光电有限公司 | Detection method and device of capacitive touch screen |
| WO2017215496A1 (en) * | 2016-06-15 | 2017-12-21 | 深圳信炜科技有限公司 | Fingerprint-sensor testing apparatus, fingerprint sensor, and electronic device |
| WO2017215562A1 (en) * | 2016-06-15 | 2017-12-21 | 深圳信炜科技有限公司 | Fingerprint sensor detection method and device, fingerprint sensor, electronic device |
| TWI628574B (en) * | 2016-10-31 | 2018-07-01 | 南韓商樂金顯示科技股份有限公司 | Touch-type display panel and short-repair method thereof |
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