CN105590300A - Image quality improving method based on wavefront distortion and optical axis jitter measuring information - Google Patents
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Abstract
The invention discloses an image quality improving method based on wavefront distortion and optical axis jitter measuring information. The method includes: step 1, obtaining wavefront distortion information and optical axis jitter measuring information of an optical system; step 2, calculating a wavefront distortion point spread function PSF1 by employing wavefront distortion measuring data; step 3, calculating a point spread function PSF2 according to the optical axis jitter information measured within the exposure time; step 4, obtaining a total degradation PSF of an imaging system with the combination of the wavefront distortion point spread function PSF1 and the optical axis jitter point spread function PSF2; and step 5, performing non-blind image restoration processing according to the total degradation PSF. By employing the above technical scheme and the integrated measuring information, a comprehensive image degeneration model with superposed influence of two influence factors of wavefront distortion and optical axis jitter is obtained in a fusion manner, the calculating precision of the degradation point spread function is improved, the non-blind image restoration algorithm is employed, and high-quality image quality improving effect is obtained.
Description
Technical field
The invention belongs to image and recover field, relate to one and utilize space camera wavefront distortion and optical jitter to measureInformation is carried out synthetic image quality and is promoted the method for processing.
Background technology
High-resolution imaging technology has great demand in military, civilian earth observation field, along with imaging refers toTarget promotes, and image quality is also more responsive to the various disturbance factors in imaging process.
According to the mechanism that affects on image quality, disturbance factor mainly can be divided into two classes. One class is that correspondence causes lightLearn the environmental change factor of system state change, as in the process of entering the orbit, the transient state of optical element is shifted or distortion,The slow variations of optical system structure that rail material degeneration causes etc., these factors all can cause imaging optical system shapeThe variation of state and parameter, causes wavefront distortion and directly causes image quality to decline. Another kind of is various causing intoPicture systematic optical axis points to micro-vibrational perturbation factor of shake, causes the shake that imaging system optical axis points to, and makes to amassDivide time indoor setting thing repeatedly to move in imaging focal plane, cause the degeneration of picture quality.
How in the situation that above-mentioned factor causes deteriroation of image quality, to recover obtaining high-quality image and become thisField needs the technical problem solving always.
Summary of the invention
The present invention just the demand based on prior art proposes. The technical problem to be solved in the present invention is:A kind of method of efficiently and accurately is provided, solves the remote sensing figure causing of space camera wavefront distortion and optical jitterImage quality degenerate problem.
In order to solve this technical problem, technical scheme provided by the invention comprises: a kind of based on wavefront distortion and lightThe picture quality method for improving of dither axis metrical information, step is as follows: step 1, the integrated optical system of obtainingWavefront distortion information and optical jitter metrical information; Described wavefront distortion information is { a1,…,ak, wherein akFor Zernike multinomial coefficient; Wavefront is expressed aszk(x, y) is ZernikeMultinomial k item primitive corrugated, x, y is pupil areal coordinate; Optical jitter metrical information is { (jx1,jy1)，…,(jxi,jyi), wherein (jxi,jyi) represent that in the time for exposure, i sampled point optical axis is initial with respect to exposureThe image planes side-play amount in moment. Step 2, utilize wavefront distortion measurement data, calculate wavefront distortion point spread functionPSF1; Wherein, first corresponding different phase difference distributes, and calculates different single color point spread functionsPSFλ(u,v)；Wherein, A (x, y) is pupil face light waveAmplitude, determines according to pupil shape, and effectively logical optical position value is 1, and all the other get 0;F is focal length, and λ is monochromatic wavelength, and (u, v) is image coordinates, and (x, y) is pupil areal coordinate; Then, rightSingle color point spread function is weighted on average, is white point spread function PSF1;Wherein, ωλFor solar spectrum distribution, target optical spectrum reflectivity, lightThe product of electric explorer spectral response. Step 3, according to the optical jitter information calculation level of measuring in the time for exposureSpread function PSF2;Wherein, N represents the sum of sampled point in the time for exposure,N (u, v) represents to fall into the sampling number of image planes (u, v) positionWherein, N represents to expose to the sunThe sum of sampled point in light time, n (u, v) represents to fall into the sampling number of image planes (u, v) position; (u, v) basisThe optical jitter information of measuring is calculated, u=ROUNDDOWN (jxi)、v＝ROUNDDOWN(jyi)，Wherein ROUNDDOWN () represents to round downwards. Step 4, complex wave front-distortion point spread function PSF1Obtain total degeneration PSF of imaging system with optical jitter point spread function PSF2; Step 2 and step 3 are obtainedThe point spread function PSF1 based on wavefront measurement data getting and the point spread function based on optical jitter measurement dataCount PSF2, after the two convolution, obtain total degeneration PSF of imaging system; Step 5, according to described total degeneration PSF,Carry out non-blind image restoring processing.
The present invention adopts technique scheme to have following beneficial effect:
1. employing integrated measuring instrument carries out the integral measuring of wavefront distortion and optical jitter, can be at space cameraIn imaging process, carry out the synchro measure of two class disturbance factors, improve the real-time of image degradation information inflight measurementProperty and accuracy; 2. utilize integrated measuring information, obtain wavefront distortion and optical jitter by the mode mergingThe synthetic image degradation model of two kinds of influence factor overlaying influences, the computational accuracy of raising Degenerate Point spread function,Adopt non-Blind image restoration algorithm, obtain high-quality picture quality and promote effect.
Brief description of the drawings
The integrated measuring instrument structural representation of Fig. 1;
Fig. 2 is a kind of picture quality based on wavefront distortion and optical jitter metrical information in the embodiment of the present inventionPromote the block diagram of processing method;
Fig. 3 is that a kind of integrated measuring instrument in the embodiment of the present invention is in the space camera of face battle array gazing typeArrangement figure;
Fig. 4 is the method conceptual scheme that the utilization pendulum mirror in the embodiment of the present invention folds visual field, edge;
Fig. 5 is a kind of integrated measuring instrument in another embodiment of the present invention pushing away the cloth of sweeping in type space cameraPut conceptual scheme;
Detailed description of the invention
In order to understand better essence of the present invention, below in conjunction with accompanying drawing to the specific embodiment of the present invention do intoThe explanation of one step. But this detailed description of the invention be only to optimal technical scheme of the present invention for example, can notBe interpreted as limiting the scope of the invention.
This detailed description of the invention provides a kind of picture quality based on wavefront distortion and optical jitter metrical informationMethod for improving, its key step as shown in Figure 2. For this detailed description of the invention is described, two enforcements are adoptedExample is introduced the method under different scenes.
Embodiment 1
The present embodiment has been described for the picture quality of the space camera of planar array detector and has been promoted processing method. This realityExecute routine the method and can be described as following steps:
Step 1, the wavefront distortion information of obtaining optical system and optical jitter metrical information
For an imaging system, wavefront distortion and optical jitter two class disturbance factors act on imaging simultaneouslyQuality, consider this influence factor aspect two as a whole must and process in compensation time. First need and overcome above-mentioned impactTo detect the data that affect of above-mentioned two aspect influence factors, could realize according to the actual length that affectsThe lifting of picture quality.
This detailed description of the invention adopts the method for the integrated sensing of space camera wavefront distortion and optical jitter, passes throughThe correlatingHartmann Shack wavefront sensor of transformation, carries out the integral measuring of wavefront distortion and optical jitter information.In the present embodiment, will be called " integrated measuring instrument " through the Shack-Hartmann wavefront sensor of transformation.
The structure of the integrated measuring instrument 7 in present embodiment as shown in Figure 1. It comprises field stop 2, inLens 3, array lens 4, image detector 5 and Wavefront processor 6 continue. By described integrated measuring instrumentOptical system 1 is carried out to the measurement of relevant parameter.
Optical system 1 is imaged on target being observed on its focal plane. The field stop 2 of described integrated measuring instrumentCan avoid mutually overlapping between subimage. Focal plane image is imaged on image spy through relay lens 3 and array lens 4Survey on device 5, array lens 4 forms to a hundreds of lens by tens, can produce tens to hundreds of on CCDNumber of sub images. Wavefront processor 6 completes the processing of CCD output image, provides wavefront measurements. EachThe side-play amount of subimage is varied to direct ratio with the wavefront G-bar in corresponding sub-aperture; Measuring side-play amount can deriveEach sub-aperture wavefront slope, then adopt and can reconstruct optical system as methods such as Zernike fitting of a polynomialsWavefront information. Realize the integral measuring of wavefront distortion and optical jitter by this device.
Integrated measuring instrument is measured owing to both can be used for high-resolution wavefront distortion, also can be used for high-speed light dither axisMeasure, thereby can save a road detector, the integral measuring of implementation space camera wavefront distortion and optical jitter.In this tool embodiment, utilize integrated measuring instrument to measure in real time this two classes disturbance factor, can be quick and preciselyGround obtains the system mode in imaging moment. Set up essence for utilizing the dual metrical information of wavefront distortion and optical jitterTrue image degradation model carries out non-blind recovery to degraded image and provides the foundation.
As shown in Figure 3, light is sent to described battle array gazing type by optical system 1 described in the present embodiment 1It is upper that the focal plane of space camera is surveyed CCD8, forms image by described battle array gazing type camera. For not affecting skyBetween the normal imaging of camera survey, described integrated measuring instrument is positioned over to the space camera of described front gazing typeField of view edge position carry out the measurement of wavefront distortion and optical jitter information.
In the present embodiment 1, if due to volume or the reasons in structure of the space camera of face battle array gazing type, be difficult toAdopt the method that directly integrated measuring instrument is positioned over to focal plane detector side. In the present embodiment, pass through pendulum mirror 9Realize the wavefront error of visual field, center or multiple field positions is surveyed.
As shown in Figure 4, by pendulum rotating mirror 9, visual field, center or visual field to be measured are deflected on Wavefront sensor,To realize, the wavefront error of visual field, center or a certain field positions is surveyed. Make in this way described oneChange measuring instrument and there is larger installation remaining, thereby can propose the use occasion that expands this method.
Change feature slowly because wavefront distortion has, only need certain period of interval to measure once. Optical axis is trembledWhen moving information measurement, the amount of jitter of full visual field is identical, and visual field, Zhi Xudui center or a certain visual field are measured; In the time carrying out the measurement of optical jitter data, because optical jitter changes fast, need to be at camera exposureContinuing in the time measured.
In the present embodiment 1, can measure following data by described integrated measuring instrument:
Wavefront distortion information: { a1,…,ak, wherein akFor Zernike multinomial coefficient, in present embodimentPreferably get k=35; Wavefront can be expressed aszk(x, y) is Zernike multinomialK item primitive corrugated, x, y is pupil areal coordinate.
Optical jitter metrical information: { (jx1,jy1)，…,(jxi,jyi), wherein (jxi,jyi) represent to exposeInterior i sampled point optical axis of time is with respect to the image planes side-play amount of exposure initial time. Optical jitter in this patentMeasurement sample frequency is 600Hz.
Step 2, utilize wavefront distortion measurement data, calculate wavefront distortion point spread function PSF1;
Because being distributed as two-dimentional optical path difference, wavefront distributes, for the light of different wave length, and corresponding different phase differencesCloth, calculates different single color point spread function PSFλ(u,v)；
Wherein, A (x, y) is pupil face light wave amplitude, determines according to pupil shape, and effectively logical optical position value is 1,All the other get 0;F is focal length, and λ is monochromatic wavelength, and (u, v) is image coordinates,(x, y) is pupil areal coordinate.
Single color point spread function is weighted on average, is white point spread function PSF1;
Wherein, ωλFor the product of solar spectrum distribution, target optical spectrum reflectivity, photodetector spectral response,Solar spectrum distribution, target optical spectrum reflectivity, photodetector spectral response are determined by actual service conditions.
Step 3, according to the optical jitter information calculation level spread function PSF2 measuring in the time for exposure;
Wherein, N represents the sum of sampled point in the time for exposure, and n (u, v) represents to fall into image planes (u, v) positionSampling number.
Step 4, complex wave front-distortion point spread function PSF1 obtain into optical jitter point spread function PSF2Total degeneration PSF of picture system;
By step 2, the point spread function PSF1 based on wavefront measurement data that step 3 is obtained and based on optical axisThe point spread function PSF2 of jitter measurement data, obtains total degeneration PSF of imaging system after the two convolution;
Step 5, according to described total degeneration PSF, carry out non-blind image restoring processing;
Calculate the comprehensive point spread function PSF of image degradation by wavefront distortion and optical jitter metrical information,Can directly utilize deconvolution, Wiener filtering or RL scheduling algorithm to carry out image recovery; Calculate mistake for eliminating PSFThe impacts such as difference and noise, can apply regularization to recuperation; Also can adopt existing ring inhibition method,Reduce image ring, improve restored image quality. Taking Richardson-Lucy (RL) algorithm as example, image is multipleFormer process can be expressed as:
Wherein, g, f represents respectively blurred picture, restored image, h represents the circular matrix form of PSF, mRepresent iterations.
Embodiment 2
The present embodiment has been described the picture quality lifting processing method of sweeping type space camera for pushing away. At the present embodimentIn 2, described optical system 1 is sent to light to push away and sweeps on type space camera, sweeps type camera formation figure by pushing awayPicture. Described to push away the sight line of sweeping type space camera be linear field, and focal plane device adopts TDI (TimeDelayIntegration) linear array images detector 10, is spliced by TDI linear array images detector described in multi-disc.Concrete grammar in the present embodiment is similar to embodiment, and difference is to have carried out corresponding for pushing away the type camera of sweepingAdjustment.
The method of the present embodiment can be described as following steps:
Step 1, the wavefront distortion information of obtaining optical system and optical jitter metrical information.
Adopt integrated measuring instrument to carry out the integral measuring of wavefront distortion and optical jitter information. In the present embodiment,After described optical system, adopt and push away and sweep type space camera, described in to push away the visual field of sweeping type space camera be linear field, canPushing away the detector side installation integrated measuring instrument measurement related data of sweeping type camera, its structure as shown in Figure 5.
Can measure the following data of described optical system by described integrated measuring instrument:
Wavefront distortion information: { a1,…,ak, wherein akFor Zernike multinomial coefficient, in this patent, get k=35,Wavefront can be expressed aszk(x, y) is Zernike multinomial k item primitive rippleFace, x, y is pupil areal coordinate.
Optical jitter metrical information { (jx1,jy1)，…,(jxi,jyi), wherein (jxi,jyi) represent when exposureInterior i sampled point optical axis is with respect to the image planes side-play amount of exposure initial time. In this patent, optical jitter is surveyedAmount sample frequency is 600Hz.
Integrated measuring instrument is measured owing to both can be used for high-resolution wavefront distortion, also can be used for high-speed light dither axisMeasure, thereby can save a road detector, the integral measuring of implementation space camera wavefront distortion and optical jitter.In this tool embodiment, utilize integrated measuring instrument to measure in real time this two classes disturbance factor, can be quick and preciselyGround obtains the system mode in imaging moment. Set up essence for utilizing the dual metrical information of wavefront distortion and optical jitterTrue image degradation model carries out non-blind recovery to degraded image and provides the foundation.
Step 2, utilize wavefront distortion measurement data, calculate wavefront distortion point spread function PSF1.
Because being distributed as two-dimentional optical path difference, wavefront distributes, for the light of different wave length, and corresponding different phase differencesCloth, calculates different single color point spread function PSFλ(u,v)；
Wherein, A (x, y) is pupil face light wave amplitude, determines according to pupil shape, and effectively logical optical position value is 1,All the other get 0;F is focal length, and λ is monochromatic wavelength, and (u, v) is image coordinates,(x, y) is pupil areal coordinate.
Single color point spread function is weighted on average, is white point spread function PSF1;
ωλFor the product of solar spectrum distribution, target optical spectrum reflectivity, photodetector spectral response, the sunSpatial distribution, target optical spectrum reflectivity, photodetector spectral response are determined by actual service conditions.
Step 3, within the time for exposure, measure optical jitter track, calculate optical jitter point spread function PSF2.
Wherein, N represents the sum of sampled point in the time for exposure, and n (u, v) represents to fall into image planes (u, v) positionSampling number.
Step 4, complex wave front-distortion point spread function PSF1 obtain into optical jitter point spread function PSF2Total degeneration PSF of picture system.
By step 2, the point spread function PSF1 based on wavefront measurement data that step 3 is obtained and based on optical axisThe point spread function PSF2 of jitter measurement data, obtains the total degeneration PSF of imaging system after the two convolution;
Step 5, according to described total degeneration PSF, carry out non-blind image restoring processing.
According to the poly-4 comprehensive PSF that obtain of step, carry out non-blind image restoring processing; By wavefront distortion and optical axisJitter measurement information calculates the comprehensive point spread function PSF of image degradation, can directly utilize deconvolution, dimensionNanofiltration ripple or RL scheduling algorithm carry out image recovery;
Step 6, every a line to linear array scan image, to step 5, carry out non-blind figure according to step 2 line by linePicture restoration disposal, and recombinate by original row order, complete restored image obtained.
Other products of some that the present invention relates to or method are routine techniques technique, belong to those skilled in the art ripeThe category of knowing, does not repeat them here. Above-described specific embodiment, to object of the present invention, technical schemeFurther describe with beneficial effect, institute it should be understood that and the foregoing is only of the present invention concreteEmbodiment, is not limited to the present invention, within the spirit and principles in the present invention all, and that does is anyRevise, be equal to replacement, improvement etc., within all should being included in protection scope of the present invention.
Claims (10)
1. the picture quality method for improving based on wavefront distortion and optical jitter metrical information, is characterized in that,Described method comprises the steps:
Step 1, integrated wavefront distortion information and the optical jitter metrical information of obtaining optical system;
Described wavefront distortion information is { a1,…,ak, wherein akFor Zernike multinomial coefficient; Wavefront representsForzk(x, y) is Zernike multinomial k item primitive corrugated, x, and y is pupilAreal coordinate; Optical jitter metrical information is { (jx1,jy1)，…,(jxi,jyi), wherein (jxi,jyi) representInterior i sampled point optical axis of time for exposure is with respect to the image planes side-play amount of exposure initial time;
Step 2, utilize wavefront distortion measurement data, calculate wavefront distortion point spread function PSF1;
Wherein, first corresponding different phase difference distributes, and calculates different single color point spread functionsPSFλ(u,v)；
Wherein, A (x, y) is pupil face light wave amplitude,Determine according to pupil shape, effectively logical optical position value is 1, and all the other get 0;fFor focal length, λ is monochromatic wavelength, and (u, v) is image coordinates, and (x, y) is pupil areal coordinate;
Then, single color point spread function is weighted on average, is white point spread function PSF1;
Wherein, ωλFor the product of solar spectrum distribution, target optical spectrum reflectivity, photodetector spectral response;
Step 3, according to the optical jitter information calculation level spread function PSF2 measuring in the time for exposure;
Wherein, N represents the sum of sampled point in the time for exposure, and n (u, v) represents to fall intoThe sampling number of image planes (u, v) position; Calculate point spread function according to the optical jitter information of measuring in the time for exposureNumber PSF2;
Wherein, N represents the sum of sampled point in the time for exposure, and n (u, v) representsFall into the sampling number of image planes (u, v) position; (u, v) calculates according to the optical jitter information of measuring, u＝ROUNDDOWN(jxi)、v＝ROUNDDOWN(jyi), wherein ROUNDDOWN () representsRound downwards;
Step 4, complex wave front-distortion point spread function PSF1 obtain into optical jitter point spread function PSF2Total degeneration PSF of picture system;
The point spread function PSF1 based on wavefront measurement data that step 2 and step 3 are obtained and based on optical axisThe point spread function PSF2 of jitter measurement data, obtains total degeneration PSF of imaging system after the two convolution;
Step 5, according to described total degeneration PSF, carry out non-blind image restoring processing.
2. a kind of figure picture element based on wavefront distortion and optical jitter metrical information according to claim 1Amount method for improving, is characterized in that, utilizes described deconvolution, Wiener filtering or RL algorithm in described step 5Carry out image recovery.
3. the according to claim a kind of picture quality based on wavefront distortion and optical jitter metrical informationMethod for improving, is characterized in that, the procedural representation that described image recovers is:
Wherein, g, f represents respectively blurred picture, restored image, h represents the circular matrix form of PSF, mRepresent iterations.
4. the picture quality method for improving based on wavefront distortion and optical jitter metrical information, is characterized in that,Described method comprises the steps:
Step 1, integrated wavefront distortion information and the optical jitter metrical information of obtaining optical system
Described wavefront distortion information and optical jitter metrical information comprise following data: wavefront distortion information:{a1,…,ak, wherein akFor Zernike multinomial coefficient, wavefront can be expressed aszk(x, y) is Zernike multinomial k item primitive corrugated, x, and y is pupil faceCoordinate; Optical jitter metrical information { (jx1,jy1)，…,(jxi,jyi), wherein (jxi,jyi) represent to exposeInterior i sampled point optical axis of time is with respect to the image planes side-play amount of exposure initial time;
Step 2, utilize wavefront distortion measurement data, calculate wavefront distortion point spread function PSF1;
Wherein, first corresponding different phase difference distributes, and calculates different single color point spread functionsPSFλ(u,v)；
Wherein, A (x, y) is pupil face light wave amplitude,Determine according to pupil shape, effectively logical optical position value is 1, and all the other get 0;fFor focal length, λ is monochromatic wavelength, and (u, v) is image coordinates, and (x, y) is pupil areal coordinate;
Then, single color point spread function is weighted on average, is white point spread function PSF1;
Wherein, ωλFor the product of solar spectrum distribution, target optical spectrum reflectivity, photodetector spectral response;
Step 3, according to the optical jitter information calculation level spread function PSF2 measuring in the time for exposure;
Wherein, N represents the sum of sampled point in the time for exposure, and n (u, v) representsFall into the sampling number of image planes (u, v) position; (u, v) calculates according to the optical jitter information of measuring,u＝ROUNDDOWN(jxi)、v＝ROUNDDOWN(jyi), wherein ROUNDDOWN () representsRound downwards;
Step 4, complex wave front-distortion point spread function PSF1 obtain into optical jitter point spread function PSF2Total degeneration PSF of picture system;
The point spread function PSF1 based on wavefront measurement data that step 2 and step 3 are obtained and based on optical axisThe point spread function PSF2 of jitter measurement data, obtains total degeneration PSF of imaging system after the two convolution;
Step 5, according to described total degeneration PSF, carry out non-blind image restoring processing;
Step 6, every a line to linear array scan image, to step 5, carry out non-blind figure according to step 2 line by linePicture restoration disposal, and recombinate by original row order, complete restored image obtained.
5. a kind of figure picture element based on wavefront distortion and optical jitter metrical information according to claim 4Amount method for improving, is characterized in that, in described step 5, utilizes described deconvolution, Wiener filtering or RL to calculateMethod is carried out image recovery.
6. the according to claim 4 kind of picture quality based on wavefront distortion and optical jitter metrical informationMethod for improving, is characterized in that, the procedural representation that described image recovers is:
Wherein, g, f represents respectively blurred picture, restored image, h represents the circular matrix form of PSF, mRepresent iterations.
7. according to the method described in any one in claim 1-6, it is characterized in that, by integrated measuring instrumentCarry out the integral measuring of wavefront distortion and optical jitter information; Described integrated measuring instrument comprise field stop, inLens, array lens, image detector and Wavefront processor continue.
8. according to the method described in any one in claim 1-7, it is characterized in that, described field stop is used forAvoid mutually overlapping between subimage; Focal plane image is imaged on described image through described relay lens and array lensOn detector, Wavefront processor, by becoming the processing of described image detector output image, provides wavefront measurements.
9. method according to claim 8, is characterized in that, described array lens comprises multiple sub-lens,Described multiple sub-lens can produce the subimage of respective numbers on described image detector.
10. method according to claim 9, is characterized in that, the sampling that described optical jitter is measured frequentlyRate is 600Hz.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108665415A (en) * | 2017-03-27 | 2018-10-16 | 纵目科技（上海）股份有限公司 | Picture quality method for improving based on deep learning and its device |
| CN108692820A (en) * | 2018-05-23 | 2018-10-23 | 马晓燠 | A kind of Wavefront measuring apparatus and method |
| CN110987377A (en) * | 2019-12-18 | 2020-04-10 | 中国空间技术研究院 | Optical axis angle measuring method of space optical camera |
| CN111024068A (en) * | 2019-12-18 | 2020-04-17 | 中国空间技术研究院 | Ground-free control point imaging method of space optical camera |
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| CN108665415A (en) * | 2017-03-27 | 2018-10-16 | 纵目科技（上海）股份有限公司 | Picture quality method for improving based on deep learning and its device |
| CN108665415B (en) * | 2017-03-27 | 2021-11-09 | 深圳纵目安驰科技有限公司 | Image quality improving method and device based on deep learning |
| CN108692820A (en) * | 2018-05-23 | 2018-10-23 | 马晓燠 | A kind of Wavefront measuring apparatus and method |
| CN108692820B (en) * | 2018-05-23 | 2019-11-29 | 马晓燠 | A kind of Wavefront measuring apparatus and method |
| CN110987377A (en) * | 2019-12-18 | 2020-04-10 | 中国空间技术研究院 | Optical axis angle measuring method of space optical camera |
| CN111024068A (en) * | 2019-12-18 | 2020-04-17 | 中国空间技术研究院 | Ground-free control point imaging method of space optical camera |
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