CN105579798B - The equipment to be defrosted using infrared light emitting diode sensor to the evaporator of refrigeration system - Google Patents
The equipment to be defrosted using infrared light emitting diode sensor to the evaporator of refrigeration system Download PDFInfo
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- CN105579798B CN105579798B CN201480046703.6A CN201480046703A CN105579798B CN 105579798 B CN105579798 B CN 105579798B CN 201480046703 A CN201480046703 A CN 201480046703A CN 105579798 B CN105579798 B CN 105579798B
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- 238000005057 refrigeration Methods 0.000 title claims abstract description 18
- 238000001514 detection method Methods 0.000 claims abstract description 71
- 238000006243 chemical reaction Methods 0.000 claims abstract description 4
- 238000010257 thawing Methods 0.000 claims description 59
- 238000000034 method Methods 0.000 claims description 16
- 230000005540 biological transmission Effects 0.000 claims description 2
- 230000005855 radiation Effects 0.000 claims 6
- 230000035945 sensitivity Effects 0.000 description 12
- 238000001816 cooling Methods 0.000 description 11
- 230000000694 effects Effects 0.000 description 7
- 238000001704 evaporation Methods 0.000 description 7
- 230000008020 evaporation Effects 0.000 description 7
- 239000003507 refrigerant Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 239000003638 chemical reducing agent Substances 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 3
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 230000005494 condensation Effects 0.000 description 2
- 238000009833 condensation Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000001186 cumulative effect Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000007791 liquid phase Substances 0.000 description 2
- 239000012808 vapor phase Substances 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 238000010025 steaming Methods 0.000 description 1
- 230000008719 thickening Effects 0.000 description 1
Classifications
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25D—REFRIGERATORS; COLD ROOMS; ICE-BOXES; COOLING OR FREEZING APPARATUS NOT OTHERWISE PROVIDED FOR
- F25D21/00—Defrosting; Preventing frosting; Removing condensed or defrost water
- F25D21/002—Defroster control
- F25D21/006—Defroster control with electronic control circuits
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25D—REFRIGERATORS; COLD ROOMS; ICE-BOXES; COOLING OR FREEZING APPARATUS NOT OTHERWISE PROVIDED FOR
- F25D21/00—Defrosting; Preventing frosting; Removing condensed or defrost water
- F25D21/02—Detecting the presence of frost or condensate
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0896—Optical arrangements using a light source, e.g. for illuminating a surface
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3554—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25B—REFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
- F25B2700/00—Sensing or detecting of parameters; Sensors therefor
- F25B2700/11—Sensor to detect if defrost is necessary
- F25B2700/111—Sensor to detect if defrost is necessary using an emitter and receiver, e.g. sensing by emitting light or other radiation and receiving reflection by a sensor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/062—LED's
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Thermal Sciences (AREA)
- Combustion & Propulsion (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Defrosting Systems (AREA)
Abstract
The present invention relates to a kind of equipment to be defrosted using infrared light emitting diode sensor to the evaporator in refrigeration system, it includes：I) white detection sensor 50, it is used to receive white sensing signal from the output section of control processor 60, and frost detection signal is transmitted to the input unit of the control processor 60, wherein, by receiving reflection infrared ray to frost projection infrared ray and projection and from frost signal is detected to generate the frost；Ii) the control processor 60, it is used in signal conversion part the frost detection signal is converted into digital signal whether to estimate the frost detection signal higher than the threshold value set by signal configuration part 61, and operation signal is sent to frost removal 70 and display signal is sent to signal display unit 62；And iii) frost removal 70, it is operated based on the signal from the control processor 60.
Description
Technical field
The present invention relates to a kind of equipment to be defrosted by following steps to the evaporator of refrigeration system：I) sent out using infrared ray
Penetrate the frost that diode-transducer detection is formed on the evaporator assembled in refrigerator, freezer, freezer or heat pump；Ii) will letter
Number it is sent to from control processor except defrosting system；And iii) by operation except defrosting system defrosts evaporator.
On the other hand, the korean patent application 10-2013- that the requirement of this PCT application was submitted on the 26th in August in 2013
No. 100895 " equipment to be defrosted using infrared light emitting diode sensor to the evaporator in refrigeration system " and in 2014
17 days 2 months year, the korean patent application submitted the 10-2014-17681st was " using infrared detection sensor in refrigeration system
The equipment of the evaporator defrosting " priority of both.
Background technology
In refrigerator, freezer, freezer or heat pump, using refrigerant by circulation and heat exchange come cooling space.It is logical
Often, cooled down by the circulation including 4 cooling cycle steps, these steps be the compression of refrigerant, condensation, expansion and
With the evaporation of heat exchange.Therefore, compressor reducer, condenser, expansion valve and evaporator are equipped with refrigeration systems.
Description below can be carried out to 4 cooling cycle steps.Vapor phase refrigerant is compressed in compressor reducer, within the condenser
The refrigerant of compression is cooled down by carrying out heat exchange with surrounding air, the liquid phase refrigerant stream of cooling is adjusted simultaneously at expansion valve
Make its expansion, and liquid phase refrigerant is flashed into gas phase in evaporator, wherein amount of heat is absorbed for evaporation.Most
Afterwards, in the storeroom or cooling space that the air of cooling can be provided in refrigeration system.
In addition, the vapor phase refrigerant for carrying out flash-pot is set to be recycled in compressor reducer.Afterwards, the cycle is begun to cool down from compressor reducer
And repeat the cooling cycle.As amount of heat is absorbed into the space surrounded by evaporator, the temperature on the surface of evaporator
It can be lower.Therefore, because relatively hot and moist surrounding air, the moisture of condensation occurs on the surface of evaporator,
This will cause to form frost on the surface of evaporator.
In addition, the frost formed on the surface of evaporator can be thickening with the time.Therefore, with the effect of the heat exchange of surrounding air
Rate can be lower, this will cause, and cooling effectiveness declines and electric energy consumes excessively.
In general, it is this in order to solve the problems, such as, timer is assembled in refrigeration system, for measuring the accumulation of compressor reducer
Operating time.After by threshold value cumulative operational time, defrosting is performed by operating the heating part around evaporator.
However, in the case of this tradition defrosting, it is necessary to which the passage based on threshold value cumulative operational time is come periodically
Defrosting is performed, without being measured to the frost amount being formed on the surface of evaporator.Therefore, its shortcoming is effectively to move
Except the frost being formed on the surface of evaporator.Further, since defrosting operation, also causes unnecessary power consumption and temperature to increase
Add.
In order to overcome this defect, No. 10-2011-88745 " cooling device and for detecting frost is formerly disclosed in South Korea
Method " in disclose by electric sensor come detect and measure frost and removed according to the signal from electric sensor
Frost.
According to the patent, using multiple sensors, frost is detected and measures by the capacitance between cooling pin.In addition,
White amount is measured and calculated by capacitance.However, in addition to the relative complexity of the detection method, due in detection signal
It may include noise signal, therefore detection signal cannot be considered as reliably.
On the other hand, disclosed in South Korea formerly discloses No. 10-2013-143452 " white detection device and method " logical
Infrared external reflection is crossed to detect and measure the white formation on evaporator, it comprises the following steps：Launch from infrared emitting portion red
Outside line；Infrared ray is reflected on frost；And reflected infrared ray is measured at infrared receiver portion.
However, from emission part launch infrared ray and at infrared receiver portion receive and measure reflected it is infrared
In the case of line, it can be changed from the sensitivity of the infrared ray of frost reflection according to the condition of medium.In addition, the absorption of infrared ray
Also can be different according to the type of medium.Certainly, even if launching the infrared ray of same intensity from infrared emitting portion, from red
The infrared ray of outer generator also likely to be present strength variance, this can cause the difference of detection sensitivity.
During simultaneously receiving infrared-ray is produced, in order to which the deviation or mistake that occur in white detection sensor is completely eliminated
Difference, present inventor develop it is a kind of using infrared light emitting diode sensor in refrigeration system evaporator defrost
Equipment, which is operated by these following steps：I) under normal voltage, produced from infrared light emitting diode D1
Infrared ray, and infrared ray is projected to evaporator；Ii) the projection detection infrared ray at infrared light emitting diode D2, and receive
Infrared ray is reflected, is applied with measurement to the voltage of infrared light emitting diode D2；Iii) based on application to two pole of infrared emitting
The voltage declined by infrared ray interference and photoelectric effect of pipe D2, estimates the frost thickness on evaporator at control processor；
And iv) when frost thickness are higher than threshold value, operation removes defrosting system.
The content of the invention
Technical problem
Problem to be solved is to develop a kind of evaporator using infrared light emitting diode sensor to refrigeration system
The equipment of defrosting, the deviation or mistake that occur in white detection sensor is completely eliminated during simultaneously receiving infrared-ray is produced
Difference.In addition, the equipment to defrost to the evaporator of refrigeration system can be operated by following steps：I) under normal voltage,
Infrared ray is produced from infrared light emitting diode D1, and infrared ray is projected to evaporator；Ii) in infrared light emitting diode D2
Projection detection infrared ray in place's simultaneously receives reflection infrared ray, is applied with measurement to the voltage of infrared light emitting diode D2；Iii) base
In the voltage declined by infrared ray interference and photoelectric effect of application to infrared light emitting diode D2, at control processor
Estimate the frost thickness on evaporator；And iv) make defrosting system operatio when frost thickness are higher than threshold value.
Technical solution
It is an object of the invention to provide a kind of evaporator using infrared light emitting diode sensor to refrigeration system
The equipment of defrosting, it includes：I) white detection sensor 50, it is used to receive frost sensing letter from the output section of control processor 60
Number, and to the input unit transmission frost detection signal of the control processor 60, wherein, by projecting infrared ray to frost and projecting
The frost detection signal is generated with reflection infrared ray is received from frost；Ii) the control processor 60, it is used to change in signal
The frost detection signal is converted into digital signal to estimate whether the frost detection signal is higher than by signal configuration part 61 in portion
The threshold value of setting, and operation signal is sent to frost removal 70 and display signal is sent to signal display unit 62；And
Iii) the frost removal 70, it is operated based on the signal from the control processor 60.
In addition, the frost detection sensor 50 follows the steps below operation：I) marked at infrared emitting portion 51
Quasi- voltage V1It is lower that the infrared ray from infrared light emitting diode D1 is projected to the evaporator；Ii) connect in infrared ray
Projection detects infrared ray and receives the reflection infrared ray at the infrared light emitting diode D2 in receipts portion 52, wherein, due to infrared
Line disturbs and photoelectric effect, applies to the signal voltage V of the infrared light emitting diode D22Compared to the standard electric pressure drop
It is low；And iii) the measurement signal voltage.
In addition, in the case of not forming frost 40 on the evaporator 20, because can be thrown in a manner of no infrared ray disturbs
The detection infrared ray is penetrated, so the measured signal voltage V2Do not reduce, and frost is formed on the evaporator 20
In the case of 40, because difficult since the infrared ray between the detection infrared ray and the reflection infrared ray from frost disturbs
To project the detection infrared ray, so the measured signal voltage V2Reduce.
As another embodiment of white detection sensor 50, it is described frost detection sensor 50 can according to following steps into
Row operation：I) in normal voltage V at infrared emitting portion 511It is lower by the infrared ray from infrared light emitting diode D1
It is projected to the evaporator；Ii) projection detects infrared ray and receives the reflection at the transistor TR in infrared receiver portion 52
Infrared ray, wherein, due to infrared ray interference and photoelectric effect, apply to the signal voltage V of the transistor TR2Compared to described
Normal voltage V1Reduce；And iii) measure the signal voltage.
In addition, the control processor 60 includes：I) signal configuration part 61, can be inputted in the signal configuration part and
It is set with defrosting mode, defrosting time, Defrost method, defrosting sensitivity, frost formation sensitivity and/or forces the defrosting period；With
And ii) signal display unit 62, it can show that setting defrosting mode, setting defrosting time, setting remove in the signal display unit
White method and/or the alarm signal to evaporator defrosting.
In addition, the wavelength of the infrared ray is 800~950nm, and the infrared ray hair in the infrared emitting portion 51
Penetrate the normal voltage V of diode D11For 5V.
Beneficial effect
The beneficial effects of the present invention are provide it is a kind of using infrared light emitting diode sensor to refrigeration system
The equipment of evaporator defrosting, it is inclined to occur completely in white detection sensor is eliminated during generation and receiving infrared-ray
Difference or error.In addition, the equipment to defrost to the evaporator of refrigeration system can be operated by following steps：I) in standard electric
Pressure, infrared ray is produced from infrared light emitting diode D1, and infrared ray is projected to evaporator；Ii) in infrared emitting two
Projection detects infrared ray and receives reflection infrared ray at pole pipe D2, is applied with measurement to the voltage of infrared light emitting diode D2；
Iii) the voltage declined by infrared ray interference and photoelectric effect based on application to infrared light emitting diode D2, at control
Manage the frost thickness estimated at device on evaporator；And iv) make defrosting system operatio when frost thickness are higher than threshold value.
The other beneficial effects of the present invention are to make the operating time of frost removal to minimize, this is because being removed to evaporator
When white, the operation meeting basis of frost removal stops from the live signal of control processor.Certainly, since the operating time is minimum
Change, can effectively save defrosting cost.
Brief description of the drawings
Fig. 1 is white detection sensor, the block diagram of the structure of control processor and frost removal for representing the present invention.Control process
Device 60 includes signal configuration part 61 and signal display unit 62, can input and be set with defrosting mode, defrosting in signal configuration part
Time, Defrost method, defrosting sensitivity, frost form sensitivity and/or force defrosting cycle, and can be shown in signal display unit
Show setting defrosting mode, setting defrosting time, setting Defrost method and/or the alarm signal to evaporator defrosting.
Fig. 2 shows the schematic diagram of the defroster system of the present invention.
Fig. 3 a show the infrared ray projection for representing not formed on an evaporator in the case of frost at infrared emitting portion 51
And the detailed figure of the detection infrared ray projection at infrared receiver portion 52.
Fig. 3 b show represent to be formed on an evaporator infrared ray projection in the case of frost at infrared emitting portion 51 and
The detailed figure of detection infrared ray projection at infrared receiver portion 52.Infrared ray interference can occur from infrared receiver portion
Detect infrared ray and between white reflection infrared ray.
Fig. 3 c show the another of another embodiment for not forming the white detection sensor in the case of frost on an evaporator
One figure.In the case of not forming frost on an evaporator, infrared ray is projected from infrared emitting portion 51, but project infrared ray not from
Evaporator reflects.Therefore, the infrared ray of reflection will not be detected at infrared receiver portion 52.
Fig. 3 d show another width for forming another embodiment of white detection sensor in the case of frost on an evaporator
Figure.In the case of forming frost on an evaporator, infrared ray is projected from infrared emitting portion 51, and the infrared ray projected is from evaporation
Frost reflection on device.Therefore, can be generated by the voltage at the transistor TR in infrared receiver portion 52 to detect reflection
Infrared ray.
Fig. 4 a show the circuit in the infrared emitting portion 51 and infrared receiver portion 52 that form in white detection sensor.It is red
Infrared light emitting diode D1 in outside line emission part is applied with normal voltage (5V), and the infrared ray in infrared receiver portion
Emitting diode D2 is applied with signal voltage (5V backward voltages).
Fig. 4 b show represent at the infrared receiver portion of white detection sensor measure signal voltage and frost thickness it
Between relation curve map.With the increase of frost thickness, signal voltage at infrared receiver portion because of the generation of backward voltage and
Reduce.The threshold thickness of frost is by T1Represent, and the signal voltage measured at the thickness is by V1Represent.
Fig. 4 c show another embodiment of the circuit in another white detection sensor.Under normal voltage, from red
Infrared light emitting diode D1 in outside line emission part 51 projects infrared ray to evaporator 20.According to reflection infrared ray intensity,
The formation of frost can be measured by the voltage generated at the transistor TR in infrared receiver portion 52.
Fig. 5 shows the schematic diagram of white detection sensor.White detection sensor is included positioned at the pin connection treated with evaporator
Sensor anterior right connection part and left connection part.
Fig. 6 shows the flow chart for the setting operation condition for representing the frost removal in the control processor of the present invention.Root
According to the setting operation condition, frost removal is operated based on the signal from control processor.
Description of reference numerals
10. the frost of 20. evaporator of cooling device 30.
40. 51. infrared emitting portion D1 of the white detection sensor of infrared reflection 50.
52. 70. frost removal of infrared receiver portion 60. control processors of D2
100. the evaporation pin of evaporation tube 110. in evaporator
Embodiment
The present invention relates to a kind of equipment to be defrosted using infrared light emitting diode sensor to the evaporator of refrigeration system,
The equipment includes：I) white detection sensor 50, it is used to receive the white sensing signal from the output section of control processor 60, and
Frost detection signal is sent to the input unit of control processor 60, wherein, by frost projection infrared ray and project and receive come
Frost detection signal is generated from the reflection infrared ray of frost；Ii) control processor 60, it is used in signal conversion part detect frost
Signal is converted into digital signal, with estimation frost detection signal whether higher than the threshold value set by signal configuration part 61, and will operation
Signal is sent to frost removal 70, and display signal is sent to signal display unit 62；And iii) frost removal 70, it is based on coming from
The signal of control processor 60 is operated.
It is referred to attached drawing and the present invention is explained in greater detail.
Fig. 1 be represent the white detection sensor of the present invention, control processor and frost removal construction block diagram.
Control processor 60 is the key element of the construction of the present invention.White detection sensor 50 connects with control processor 60
Connect, to transmit electric signal.In addition, frost removal 70 is also connected with control processor, to be operated to defrost to evaporator.
White detection sensor 50 includes infrared emitting portion and infrared receiver portion, and is connected with control processor 60, with
Just electric signal is transmitted.Under normal voltage, preferably under 5V normal voltages, two pole of infrared emitting in infrared emitting portion 51
Pipe D1 is generated and is projected infrared ray, and is projected to evaporator 20.Infrared light emitting diode in infrared receiver portion 52
D2 is also generated and is projected detection infrared ray, is applied with measurement to the signal voltage of infrared light emitting diode D2, due to infrared ray
Interference and photoelectric effect, the signal voltage are reduced compared to normal voltage.Then, the measuring signal in white detection sensor is passed
Send to control processor 60.
In addition, the analog voltage signal from white detection sensor is filtered in the signal conversion part of control processor 60
And it is converted into digital signal.Then, if digital signal is higher than white threshold value, then the operation signal quilt from control processor
It is sent to frost removal 70.
In addition, control processor 60 includes signal configuration part 61 and signal display unit 62, can be defeated in signal configuration part
Enter and be set with defrosting mode, defrosting time, Defrost method, defrosting sensitivity, frost formed sensitivity and/or force defrosting when
Section, and can show setting defrosting mode, setting defrosting time in signal display unit, set Defrost method and/or to steaming
Send out the alarm signal of device defrosting.
Finally, defrosted by the operation of frost removal 70 to the frost being formed on the evaporator of refrigeration system, wherein,
Frost removal is operated according to the signal from control processor 60.Certainly, as long as heating equipment can defrost evaporator, appoint
The frost removal for type of anticipating is available.
Fig. 2 shows the schematic diagram of the defroster system of the present invention.
As shown in Fig. 2, the infrared ray from infrared emitting portion 51 is being projected to evaporator 20, formed on an evaporator
Frost reflection infrared ray 40, and at the infrared receiver portion 52 after detection and measurement infrared ray interference, white detection sensor can
To measure infrared ray interference signal.
The scope of the wavelength of the infrared ray is 800~950nm.
Fig. 3 a show the infrared ray projection for representing not formed on an evaporator in the case of frost at infrared emitting portion 51
And the detailed figure of the detection infrared ray projection at infrared receiver portion 52.
If not forming frost on an evaporator, from infrared emitting portion 51 project infrared ray evaporator evaporation tube
100 or evaporation pin 110 be absorbed.Therefore, infrared ray is not reflected from evaporator.In addition, projected from infrared receiver portion 52
Detection infrared ray is projected in the case of from any interference.Therefore, the infrared light emitting diode in infrared receiver portion 52
The voltage of D2 should be identical with the voltage of the infrared light emitting diode D1 in infrared emitting portion 51.Infrared light emitting diode D1
Voltage be preferably 5V.
Fig. 3 b show represent to be formed on an evaporator infrared ray projection in the case of frost at infrared emitting portion 51 and
The detailed figure of detection infrared ray projection at infrared receiver portion 52.Infrared ray interference can occur from infrared receiver portion
Detect infrared ray and between white reflection infrared ray.
If white, quilt on the frost of the infrared ray projected from infrared emitting portion 51 on an evaporator is formed on an evaporator
Reflection.Therefore, infrared ray is reflected from evaporator.In addition, from the detection infrared ray that infrared receiver portion 52 projects with being reflected from frost
Infrared ray exist interference.Therefore, because the infrared ray disturbs, the electricity of the infrared light emitting diode D2 in infrared receiver portion 52
Pressure should decline compared to the voltage of the infrared light emitting diode D1 in infrared emitting portion 51.
Fig. 3 c are shown does not form the another of another embodiment of white detection sensor in the case of frost on an evaporator
Figure.
In the case of not forming frost on an evaporator, infrared ray, but the infrared ray projected are projected from infrared emitting portion 51
Do not reflected from evaporator.Therefore, the infrared ray of reflection will not be detected at infrared receiver portion 52.So as to, be not in by
Voltage caused by the infrared ray of reflection generates.
Fig. 3 d show another figure for forming another embodiment of white detection sensor in the case of frost on an evaporator.
In the case of forming frost on an evaporator, infrared ray, and the infrared ray projected are projected from infrared emitting portion 51
From the frost reflection on evaporator.Therefore, can be generated by the voltage at the transistor TR in infrared receiver portion 52 to detect
The infrared ray of reflection.
Fig. 4 a show the circuit in the infrared emitting portion 51 and infrared receiver portion 52 that form in white detection sensor.
Infrared light emitting diode D1 in infrared emitting portion is applied with normal voltage (5V), and in infrared receiver portion
Infrared light emitting diode D2 be applied with signal voltage (5V backward voltages).It is reversely electric with the increase of the infrared ray of reflection
Pressure also increases, this causes the signal voltage at infrared light emitting diode D2 to decline.Therefore, because the infrared ray disturbs, it is infrared
The voltage of infrared light emitting diode D2 in line receiving division 52 should be compared to the infrared emitting in infrared emitting portion 51
The voltage (5V) of diode D1 declines.
On the other hand, if not forming frost, infrared ray is not reflected, this will not cause the generation of backward voltage.Therefore, it is red
The signal voltage of outside line receiving division should be identical with the normal voltage in infrared emitting portion.
Fig. 4 b show represent at the infrared receiver portion of white detection sensor measure signal voltage and frost thickness it
Between relation curve map.
With the increase of frost thickness, the signal voltage at infrared receiver portion is reduced because of the generation of backward voltage.Frost
Threshold thickness is by T1Represent, and the signal voltage measured at the thickness is by V1Represent.
Of course, it is possible to pass through the signal voltage V at infrared receiver portion1To measure the threshold thickness T of frost1.In addition, also may be used
With at control processor 60 by the setting in signal configuration part 61 come setting signal voltage V1。
Fig. 4 c show another embodiment of the circuit in another white detection sensor.
In another embodiment of circuit, the infrared light emitting diode in preferred embodiment is replaced using transistor
D2, to measure voltage.
Under normal voltage, projected from the infrared light emitting diode D1 in infrared emitting portion 51 to evaporator 20 infrared
Line.According to the intensity of reflection infrared ray, can be measured by the voltage generated at the transistor TR in infrared receiver portion 52
The formation of frost.
Fig. 5 shows the schematic diagram of white detection sensor.White detection sensor is included positioned at the pin connection treated with evaporator
Sensor anterior right connection part and left connection part.
In addition, white detection sensor 50 includes the infrared emitting portion comprising infrared light emitting diode D1 and comprising infrared
The infrared receiver portion of line emitting diode D2.
Fig. 6 shows the flow chart of the setting operation condition of the frost removal in the control processor for representing the present invention.According to
The setting operation condition, frost removal are operated based on the signal from control processor.
Control processor 60 includes signal configuration part 61 and signal display unit 62, can input and set in signal configuration part
Surely defrosting mode, defrosting time, Defrost method, defrosting sensitivity, frost form sensitivity and/or force the defrosting period, and
Setting defrosting mode, setting defrosting time can be shown in signal display unit, sets Defrost method and/or to evaporator defrosting
Alarm signal.
In the figure, setting defrosting time, defrosting mode, Defrost method and the process of frosting sensitivity are shown.In addition,
Also show the step of given threshold frost forms sensitivity, defrosting period and identification time delay.
In addition, if the signal more than threshold value is sent to control processor 60 from white detection sensor 50, then defrosting
Device 70 will be operated according to the operation signal from control processor and based on the program installed.Complete white removal
Afterwards, will stop in response to the signal detected by white detection sensor 50, frost removal.
In addition, the present invention can minimize the operating time of frost removal, this is because when defrosting to evaporator, defrosting
The operation meeting basis of device stops from the live signal of control processor.Certainly, can be effective since the operating time minimizes
Ground saving defrosting cost.
Claims (4)
1. a kind of equipment to be defrosted using infrared light emitting diode sensor to the evaporator in refrigeration system, it includes：
I) white detection sensor, it is used to receive white sensing signal from the output section of control processor, and to the control process
Device input unit transmission frost detection signal, wherein, by frost projection infrared radiation and from frost receive reflection infrared ray come
The frost detection signal is generated,
Wherein, the white detection sensor includes the first infrared light emitting diode (D1) and the second infrared light emitting diode
(D2), first infrared light emitting diode (D1) will be described red for being in infrared emitting portion under normal voltage (V1)
UV radiation is projected to the evaporator, and second infrared light emitting diode (D2) is used at infrared receiver portion
Projection detection infrared ray simultaneously receives reflection infrared ray from the evaporator,
Wherein, it is less than the standard electric by measuring the signal voltage (V2) at the second infrared light emitting diode (D2) place
Press (V1), detect frost；
Ii) the control processor, it is used in signal conversion part the frost detection signal being converted into digital signal to estimate
The frost detection signal is calculated whether higher than the threshold value set by signal configuration part, and operation signal is sent to frost removal and is incited somebody to action
Display signal is sent to signal display unit；And
Iii) the frost removal, it is operated based on the operation signal from the control processor.
2. the equipment according to claim 1 to evaporator defrosting, wherein, do not form white situation on the evaporator
Under, because dry with the infrared radiation from second infrared light emitting diode (D2) without producing there is no frost
Disturb, so the measured signal voltage (V2) is not less than the normal voltage (V1), and wherein, on the evaporator
In the case of forming frost, because the presence of frost generates the infrared radiation from second infrared light emitting diode (D2)
And by the interference between the infrared radiation of frost reflection, so the measured signal voltage (V2) is less than the normal voltage
(V1)。
3. the equipment according to claim 1 to evaporator defrosting, wherein, the control processor includes：
I) the signal configuration part, defrosting mode, defrosting time, defrosting can be inputted and be set with the signal configuration part
Method and/or pressure defrosting period；And
Ii) the signal display unit, setting defrosting mode, setting defrosting time can be shown in the signal display unit, is set
Determine Defrost method and/or the alarm signal to evaporator defrosting.
4. the equipment according to claim 1 to evaporator defrosting, wherein, the wavelength of the infrared radiation for 800~
950nm, and the normal voltage (V1) of first infrared light emitting diode (D1) in the infrared emitting portion is 5V.
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2013-0100895 | 2013-08-26 | ||
| KR20130100895A KR101499499B1 (en) | 2013-08-26 | 2013-08-26 | Frost removing apparatus for evaporator in cooling system using light-emitting diode infra-red detection sensor |
| KR10-2014-0017681 | 2014-02-17 | ||
| KR1020140017681A KR101402705B1 (en) | 2014-02-17 | 2014-02-17 | Frost removing apparatus for evaporator in cooling system using infra-red detection sensor |
| PCT/KR2014/006580 WO2015030369A1 (en) | 2013-08-26 | 2014-08-01 | Apparatus for defrosting evaporator in refrigeration system using infrared light-emitting diode sensor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105579798A CN105579798A (en) | 2016-05-11 |
| CN105579798B true CN105579798B (en) | 2018-04-17 |
Family
ID=52586869
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201480046703.6A Expired - Fee Related CN105579798B (en) | 2013-08-26 | 2014-08-01 | The equipment to be defrosted using infrared light emitting diode sensor to the evaporator of refrigeration system |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9657983B2 (en) |
| CN (1) | CN105579798B (en) |
| SG (1) | SG11201600769QA (en) |
| WO (1) | WO2015030369A1 (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107796083A (en) * | 2016-08-31 | 2018-03-13 | 青岛海尔智能技术研发有限公司 | The frosting degree detecting method and apparatus of outdoor machine of air-conditioner evaporator |
| WO2019033315A1 (en) * | 2017-08-16 | 2019-02-21 | 深圳市启惠智能科技有限公司 | Monitoring and processing method, server and computer storage medium |
| CN108240696A (en) * | 2018-03-15 | 2018-07-03 | 重庆物奇科技有限公司 | A kind of air-conditioner defrosting deicing system and method |
| EP3640568B1 (en) | 2018-10-16 | 2022-09-14 | Vestel Elektronik Sanayi ve Ticaret A.S. | Freezing sensor |
| CN110186229A (en) * | 2019-06-19 | 2019-08-30 | 贵州大学 | A kind of air source heat pump defrosting control method and air source heat pump based on infrared ray |
| CN111707026A (en) * | 2020-05-14 | 2020-09-25 | 广东纽恩泰新能源科技发展有限公司 | Method for detecting frost layer of finned evaporator by adopting infrared rays, and defrosting device and method |
| CN113883770A (en) * | 2020-07-01 | 2022-01-04 | 海信（山东）冰箱有限公司 | Refrigerator and defrosting control method |
| CN114593549A (en) * | 2022-02-09 | 2022-06-07 | 广东和益节能科技股份有限公司 | Air source heat pump defrosting control method based on infrared rays and air source heat pump |
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| US4593533A (en) * | 1974-12-05 | 1986-06-10 | Alsenz Richard H | Method and apparatus for detecting and controlling the formation of ice or frost |
| US4109481A (en) * | 1976-12-16 | 1978-08-29 | Gte Sylvania Incorporated | Frost detector |
| US4615179A (en) * | 1985-01-17 | 1986-10-07 | General Electric Company | Defrost diagnostic arrangement for self-defrosting refrigerator appliance |
| US4831833A (en) * | 1987-07-13 | 1989-05-23 | Parker Hannifin Corporation | Frost detection system for refrigeration apparatus |
| AU663738B2 (en) * | 1991-10-22 | 1995-10-19 | Thermotech International Pty Ltd | Cooling system for drinking water |
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| WO2011148413A1 (en) * | 2010-05-26 | 2011-12-01 | 三菱電機株式会社 | Refrigeration and air-conditioning device |
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- 2014-08-01 CN CN201480046703.6A patent/CN105579798B/en not_active Expired - Fee Related
- 2014-08-01 SG SG11201600769QA patent/SG11201600769QA/en unknown
- 2014-08-01 WO PCT/KR2014/006580 patent/WO2015030369A1/en active Application Filing
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| CN1035716A (en) * | 1988-03-07 | 1989-09-20 | 焦晓青 | Defrostingsensor for refrigerating system |
| JP2007271168A (en) * | 2006-03-31 | 2007-10-18 | Mitsubishi Electric Corp | Frost detecting device and defrost device |
| CN103216994A (en) * | 2013-04-16 | 2013-07-24 | 青岛澳柯玛超低温冷冻设备有限公司 | Operation method of one-driving-multiple intelligent instant freezer |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105579798A (en) | 2016-05-11 |
| WO2015030369A1 (en) | 2015-03-05 |
| SG11201600769QA (en) | 2016-03-30 |
| US9657983B2 (en) | 2017-05-23 |
| US20150247663A1 (en) | 2015-09-03 |
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