CN105572187A - Server cabinet based on quick responses to humidity changes - Google Patents

Server cabinet based on quick responses to humidity changes Download PDF

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CN105572187A
CN105572187A CN201610021666.4A CN201610021666A CN105572187A CN 105572187 A CN105572187 A CN 105572187A CN 201610021666 A CN201610021666 A CN 201610021666A CN 105572187 A CN105572187 A CN 105572187A
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layer
silicon chip
heavy doping
doping silicon
tube
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陈杨珑
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/223Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance for determining moisture content, e.g. humidity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/227Sensors changing capacitance upon adsorption or absorption of fluid components, e.g. electrolyte-insulator-semiconductor sensors, MOS capacitors

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Abstract

The invention discloses a server cabinet based on quick responses to humidity changes. A humidity-sensitive sensor module is installed outside a cabinet body of the server cabinet, and therefore the changes of humidity in surroundings can be detected in the use process of the server cabinet, and the server cabinet is protected well. The humidity-sensitive sensor module is creatively designed on the aspects of the sensitive material, manufacturing condition, structure and the like of a sensor, so that the response speed is high, sensitivity is greatly improved, testing repeatability is good, an unexpected technical effect is achieved, and great market application prospects are achieved.

Description

A kind of server cabinet based on response humidity change fast
Technical field
The invention belongs to server field, more specifically relate to a kind of server cabinet based on response humidity change fast.
Background technology
Server cabinet is used to parts such as combination installation panel, plug-in unit, subrack, electronic component etc., makes it form an overall install bin.Be generally square, land placement.Environment and security protection that it provides adaptation for electronic equipment normally works.
But, there is following technical matters in the server cabinet in correlation technique, such as in use, the surrounding enviroment of server cabinet are difficult to avoid there will be the larger situation of humidity, and the impact of humidity on electronic equipment is larger, severe patient can cause equipment corrosion, fault etc., and only adopts the method for human at periodic intervals's inspection to check humidity condition at present, wastes a large amount of man power and materials and is not easy to monitoring.
Summary of the invention
The present invention is directed to background technology Problems existing, a kind of server cabinet based on response humidity change is fast provided.
Object of the present invention is achieved through the following technical solutions:
A kind of server cabinet based on response humidity change fast, it is characterized in that, the cabinet outside of described server cabinet is provided with moisture sensor module, and this moisture sensor module comprises the heavy doping silicon chip laid successively from top to bottom, the SiO being close to heavy doping silicon chip 2layer, carbon nanotube layer, be positioned at SiO 2bottom electrode and the top electrode be positioned on carbon nanotube layer of interlayer, described carbon nanotube layer is grown on SiO 2on layer; Described bottom electrode has metallic film, and described metallic film is followed successively by from inside to outside has the Cr layer of adhesion, the Cu layer of conductive and heat-conductive and the Au layer as electrode layer, and the thickness of described Cr layer, Cu layer and Au layer is followed successively by 30nm, 300nm and 300nm; Described carbon nanotube layer adopts catalyzer and/or photoetching process to realize the growth of its localization, described carbon nanotube layer using plasma after growth makes it produce hydroxyl modified, and carbon nanotube layer have passed through and adds the acetic acid of micro-tungsten powder and the process of hydrogen peroxide mixed solution before plasma hydroxyl modified; The surface of described metallic film is glued with the bacterial enzyme rete of sensing bacterial growth, and this bacterial enzyme rete forms the bacterium wet sensitive sensor of sensing moisture together with metallic film; Described bottom electrode with top electrode is connected with a micro-control processor for being connected with client communication.
Preferably, the making of described moisture sensor comprises the following steps:
S1:SiO 2layer makes: get described heavy doping silicon chip, put it in tubular furnace, and according to the ramp of 10 DEG C/min to 500 DEG C, insulation 12h, then naturally cools to room temperature, can form SiO at heavy doping silicon chip surface 2layer;
S2: bottom electrode makes: have SiO by what obtain in step S1 2the heavy doping silicon chip of layer uses acetone, ethanol, washed with de-ionized water 15min post-drying successively, at its surperficial spin coating photoresist, uses bottom electrode mask to expose it, and development after 120 DEG C of oven dry 2min, oven dry, at CHF 3dry etching SiO under atmosphere 2layer, etching 30min, will etch SiO 2heavy doping silicon chip after layer cleaning puts into magnetic control sputtering device, lower than 1.5 × 10 -3magnetron sputtering C r layer, Cu layer and Au layer successively under pa vacuum; By fixing for the bottom electrode (1) of good for magnetron sputtering Cr layer, Cu layer and Au layer surface upper bacterium enzyme membrane, then cleaning photoetching glue; The size of described heavy doping silicon chip is 2cm × 2cm;
S3: gas blowout catalyst film, step is as follows:
A. use Fe/Ni nano particle as the catalyzer of carbon nano tube growth, first, to the heavy doping silicon chip spin coating photoresist with bottom electrode, adopt the localization mask of catalyzer to expose it, then through development, clean for subsequent use;
B. the dispersion liquid of catalyst Fe/Ni is prepared: the Fe nano particle and the Ni nano particle that take 200mg, 50mg respectively, added the 98%H of 60ml 2sO 4with 69% of 40ml HNO 3in mixed solution, in 80 DEG C of water-baths, ultrasonic 3h, then filters with after washed with de-ionized water, obtain dry Fe/Ni mix nanoparticles, then take the Fe/Ni nano particle of 100mg, add in the deionized water of 500ml, after fully stirring, obtain the dispersion liquid of Fe/Ni mix nanoparticles;
C. use high pure nitrogen as gas blowout carrier, regulate the horizontal and vertical distance between airbrush and heavy doping silicon chip, just volatilize when the solvent of dispersion liquid is arrived on substrate and be as the criterion, gas blowout 5 times, each gas blowout 20s, makes the uniform thickness of formation one deck be about the mix nanoparticles film of the catalyst Fe/Ni of 20nm;
S4:CVD method carbon nano-tube:
Carbon nano-tube reactant gas source is CH 4and H 2mixed gas, first the heavy doping silicon chip with patterned catalyst particle is cleaned, remove photoresist, put into reaction chamber; Then vacuumize, after reaching vacuum requirement, pass into hydrogen, apply microwave and make to produce plasma in reflection chamber; Heated substrate makes it reach certain temperature and keep 40min, passes into methane gas, and now carbon nano-tube starts growth; In growth course lumen, vacuum tightness remains unchanged; Through about 10min, close microwave source and radio heater, stop passing into methane gas, close hydrogen, pass into argon gas, take out the substrate of heavy doping silicon chip, obtain the carbon nano-tube of patterning;
S5: Surface Modification of Carbon Nanotube By Plasma:
A. first the hydrogen peroxide of 60% acetic acid of 40ml and 10% of 20ml is put into beaker, fully mix, add micro-tungsten powder wherein, then have the substrate of the heavy doping silicon chip of Patterned Carbon Nanotube to put into growth, leave standstill 2h;
B. there is the substrate of the heavy doping silicon chip of carbon nano-tube to send in plasma generator growth, be evacuated to 1.0 × 10 -1below pa, then with inert gas N 2for carrier gas, by reactant ammoniacal liquor with N 2air-flow is brought in instrument, makes air-flow velocity be stabilized in 20mL/min, waits for 1h, open power source, be adjusted to 50W, in instrument, produce aura, under action of plasma, gas molecule valence link is destroyed, and great amount of hydroxy group produces, carbon nano-tube in the environment of acetic acid and hydrogen peroxide through the effect of tungsten powder, carbon nano-tube is by the hydroxyl modified produced, after Cement Composite Treated by Plasma 30min, close power source, take out substrate;
S6: prepare top electrode: by the heavy doping silicon chip ozone clean 20min obtained in step S1 ~ S5, covers the ceramic mask of top electrode, then heavy doping silicon chip is put into magnetic control sputtering device, lower than 1.5 × 10 -3under pa vacuum, sputtering has the top electrode of Au layer, and wherein, the thickness of Au layer is about 200nm;
S7: welding encapsulation: with lead-in wire, top electrode is connected with bottom electrode respectively, described moisture sensor is encapsulated, and digital electric bridge is welded with carbon nano-tube capacity type wet dependent sensor, digital electric bridge is used for reading in the capacitance variations of moisture sensor under humidity changing environment, demarcates water vapor concentration with this.
Preferably, in step S2, the parameter of spin coating photoresist is arranged as follows: low speed 900rpm, 15s; High speed 3500rpm, 50s.
Usefulness of the present invention is:
(1) what embodiments of the invention provided is a kind of based on the quick server cabinet responding humidity change, its cabinet outer setting has moisture sensor, this moisture sensor is capacity type wet dependent sensor, and bottom electrode and heavy doping silicon chip, top electrode and carbon nano-tube all form Ohmic contact; Bottom electrode is connected with silicon chip and forms two pole plates of electric capacity with top electrode, SiO 2layer and carbon nano-tube are the medium between electric capacity, when residing for device, ambient humidity changes, water vapour molecule and carbon nano-tube interact, and cause the change in electrical properties of carbon nano-tube, the i.e. change in dielectric constant of electric capacity, therefore from Output rusults can monitoring of environmental humidity change.And this moisture sensor is highly sensitive, and the response time is short, manufacturing process is simple, and the repeatability of experimental technique is high, is easy to batch production.
(2) what embodiments of the invention provided is a kind of based on the quick server cabinet responding humidity change, the moisture sensor adopted, Cement Composite Treated by Plasma is carried out to the carbon nano-tube after growth, make carbon nano tube modified upper oh group, because it is to hydrone strong interaction, promote that carbon nano-tube is to the suction-operated of water vapor, and then increase the wet sensitive performance of carbon nano-tube, and be glued with the bacterial enzyme rete of sensing bacterial growth on its electrode, this bacterial enzyme rete forms the bacterium wet sensitive sensor of sensing moisture together with metallic film; This bacterium enzyme membrane, can dual sensing humidity by sensing bacterial growth amount and then sensitive context humidity, solves the problem of conventional wet dependent sensor hydraulic performance decline after metallic film Long-Time Service.
(3) what embodiments of the invention provided is a kind of based on the quick server cabinet responding humidity change, the Electrode connection of the moisture sensor adopted has a micro-control processor, for connecting mobile client, user can check humidity condition by client.
Accompanying drawing explanation
The invention will be further described to utilize accompanying drawing, but the embodiment in accompanying drawing does not form any limitation of the invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, can also obtain other accompanying drawing according to the following drawings.
Fig. 1 is schematic diagram of the present invention.
The humidity sensor structural representation that Fig. 2 provides for embodiments of the invention.
Embodiment
Carbon nano-tube is a kind of allotrope of carbon, and its structure is: radial dimension is nanometer scale, and axial dimension is micron dimension, and pipe two ends are all sealed substantially.It is the body of the seamless hollow that the close heap graphite flake layer of hexagonal formed by carbon atom is rolled into, and is a kind of accurate One-dimensional Quantum material.Curling and become Single Walled Carbon Nanotube (SWNT) by one deck graphite, multi-walled carbon nano-tubes (MWNT) is made up of the coaxial pipe of several layers to tens of layers.Carbon nano-tube has good mechanical property, and its tensile strength is 100 times of steel, has good pliability, and hardness is suitable with adamas, is desirable high tensile strength fibrous material.Carbon nano-tube generally adopts arc discharge, laser evaporation and chemical vapor deposition growth method.Research shows, carbon nano-tube has demonstrated the response to gases such as water vapor, ammonia, nitrogen dioxide, hydrogen, methane, sulphuric dioxide, sulfuretted hydrogen and oxygen.
Containing steam or the how many physical quantity of hydrone in humidity describe environment, humidity-sensitive element refer to have that ambient humidity maybe can be converted to by response to ambient humidity accordingly can the element of measuring-signal (such as resistance, electric capacity, frequency etc.).Humidity sensor is converted to the device of electric signal ambient humidity, and it has a wide range of applications in fields such as industrial and agricultural production, environment measuring, household electrical appliance, meteorology, Engineering Control.The core of humidity sensor is humidity-sensitive material, and it utilizes the hydrone in the direct adsorb atmospheric of adsorption effect, and the electrology characteristic etc. of material is changed, thus detects the change of humidity.Carbon nano-tube has very large specific surface area, and has very strong interaction between the medium of surrounding, therefore very responsive to humidity of external environment condition etc., has obvious Unordered system.
Carbon nano-tube capacitance type sensor mainly through dielectric layer constant change so that cause measurable capacitance variations to detect gas to be measured.
In conjunction with legend the present invention made and further illustrating:
Fig. 1 is schematic diagram of the present invention.10 is server cabinet of the present invention, and 20 for being arranged on the moisture sensor module of cabinet outside.
The humidity sensor structural representation that Fig. 2 provides for embodiments of the invention.Wherein: 1-heavy doping silicon chip, 2-SiO 2layer, 3-bottom electrode, 4-carbon nano-tube, 5-top electrode.
5 embodiments are provided to be described further described moisture sensor module below:
Embodiment 1
Based on a server cabinet for response humidity change fast, the cabinet outside of described server cabinet is provided with moisture sensor module, and this moisture sensor module comprises the heavy doping silicon chip laid successively from top to bottom, the SiO being close to heavy doping silicon chip 2layer, carbon nanotube layer, be positioned at SiO 2bottom electrode and the top electrode be positioned on carbon nanotube layer of interlayer, described carbon nanotube layer is grown on SiO 2on layer; Described bottom electrode has metallic film, and described metallic film is followed successively by from inside to outside has the Cr layer of adhesion, the Cu layer of conductive and heat-conductive and the Au layer as electrode layer, and the thickness of described Cr layer, Cu layer and Au layer is followed successively by 30nm, 300nm and 300nm; Described carbon nanotube layer adopts catalyzer and/or photoetching process to realize the growth of its localization, described carbon nanotube layer using plasma after growth makes it produce hydroxyl modified, and carbon nanotube layer have passed through and adds the acetic acid of micro-tungsten powder and the process of hydrogen peroxide mixed solution before plasma hydroxyl modified; The surface of described metallic film is glued with the bacterial enzyme rete of sensing bacterial growth, and this bacterial enzyme rete forms the bacterium wet sensitive sensor of sensing moisture together with metallic film; Described bottom electrode with top electrode is connected with a micro-control processor for being connected with client communication.
Further, the making of described moisture sensor comprises the following steps:
S1:SiO 2layer makes: get described heavy doping silicon chip, put it in tubular furnace, and according to the ramp of 10 DEG C/min to 500 DEG C, insulation 12h, then naturally cools to room temperature, can form SiO at heavy doping silicon chip surface 2layer;
S2: bottom electrode makes: have SiO by what obtain in step S1 2the heavy doping silicon chip of layer uses acetone, ethanol, washed with de-ionized water 15min post-drying, successively at its surperficial spin coating photoresist (low speed 900rpm, 15s; High speed 3500rpm, 50s), use bottom electrode mask to expose it, development after 120 DEG C of oven dry 2min, oven dry, at CHF 3dry etching SiO under atmosphere 2layer, etching 30min, will etch SiO 2heavy doping silicon chip after layer cleaning puts into magnetic control sputtering device, lower than 1.5 × 10 -3magnetron sputtering C r layer, Cu layer and Au layer successively under pa vacuum; By fixing for the bottom electrode (1) of good for magnetron sputtering Cr layer, Cu layer and Au layer surface upper bacterium enzyme membrane, then cleaning photoetching glue; The size of described heavy doping silicon chip is 2cm × 2cm;
S3: gas blowout catalyst film, step is as follows:
A. use Fe/Ni nano particle as the catalyzer of carbon nano tube growth, first, to the heavy doping silicon chip spin coating photoresist with bottom electrode, adopt the localization mask of catalyzer to expose it, then through development, clean for subsequent use;
B. the dispersion liquid of catalyst Fe/Ni is prepared: the Fe nano particle and the Ni nano particle that take 200mg, 50mg respectively, added the 98%H of 60ml 2sO 4with 69% of 40ml HNO 3in mixed solution, in 80 DEG C of water-baths, ultrasonic 3h, then filters with after washed with de-ionized water, obtain dry Fe/Ni mix nanoparticles, then take the Fe/Ni nano particle of 100mg, add in the deionized water of 500ml, after fully stirring, obtain the dispersion liquid of Fe/Ni mix nanoparticles;
C. use high pure nitrogen as gas blowout carrier, regulate the horizontal and vertical distance between airbrush and heavy doping silicon chip, just volatilize when the solvent of dispersion liquid is arrived on substrate and be as the criterion, gas blowout 5 times, each gas blowout 20s, makes the uniform thickness of formation one deck be about the mix nanoparticles film of the catalyst Fe/Ni of 20nm;
S4:CVD method carbon nano-tube:
Carbon nano-tube reactant gas source is CH 4and H 2mixed gas, first the heavy doping silicon chip with patterned catalyst particle is cleaned, remove photoresist, put into reaction chamber; Then vacuumize, after reaching vacuum requirement, pass into hydrogen, apply microwave and make to produce plasma in reflection chamber; Heated substrate makes it reach certain temperature and keep 40min, passes into methane gas, and now carbon nano-tube starts growth; In growth course lumen, vacuum tightness remains unchanged; Through about 10min, close microwave source and radio heater, stop passing into methane gas, close hydrogen, pass into argon gas, take out the substrate of heavy doping silicon chip, obtain the carbon nano-tube of patterning;
S5: Surface Modification of Carbon Nanotube By Plasma:
A. first the hydrogen peroxide of 60% acetic acid of 40ml and 10% of 20ml is put into beaker, fully mix, add micro-tungsten powder wherein, then have the substrate of the heavy doping silicon chip of Patterned Carbon Nanotube to put into growth, leave standstill 2h;
B. there is the substrate of the heavy doping silicon chip of carbon nano-tube to send in plasma generator growth, be evacuated to 1.0 × 10 -1below pa, then with inert gas N 2for carrier gas, by reactant ammoniacal liquor with N 2air-flow is brought in instrument, makes air-flow velocity be stabilized in 20mL/min, waits for 1h, open power source, be adjusted to 50W, in instrument, produce aura, under action of plasma, gas molecule valence link is destroyed, and great amount of hydroxy group produces, carbon nano-tube in the environment of acetic acid and hydrogen peroxide through the effect of tungsten powder, carbon nano-tube is by the hydroxyl modified produced, after Cement Composite Treated by Plasma 30min, close power source, take out substrate;
S6: prepare top electrode: by the heavy doping silicon chip ozone clean 20min obtained in step S1 ~ S5, covers the ceramic mask of top electrode, then heavy doping silicon chip is put into magnetic control sputtering device, lower than 1.5 × 10 -3under pa vacuum, sputtering has the top electrode of Au layer, and wherein, the thickness of Au layer is about 200nm;
S7: welding encapsulation: with lead-in wire, top electrode is connected with bottom electrode respectively, described moisture sensor is encapsulated, and digital electric bridge is welded with carbon nano-tube capacity type wet dependent sensor, digital electric bridge is used for reading in the capacitance variations of moisture sensor under humidity changing environment, demarcates water vapor concentration with this.
Test data: carbon nano-tube capacity type wet dependent sensor is placed on a metal sealing chamber (1m 3) in, metal sealing chamber is with air intake opening and gas outlet.During test, digital electric bridge output frequency is 50Hz, and probe temperature is 20 DEG C, and then controlling relative humidity variations scope is 5% ~ 95%, reads capacitance with humidity situation of change;
The sensitivity definition of this carbon nano-tube capacity type wet dependent sensor is: ︱ C rH-C 11︱/C 11× 100%, wherein C rHfor the sensor electrical capacitance obtained under test environment humidity, C 11for the capacitance of relative humidity 11% lower sensor.The response of this carbon nano-tube capacity type wet dependent sensor or be defined as testing capacitor value release time and reach total variation 80% time used at the variable quantity of 11%RH to 75%RH;
Test finds, under the relative humidity of 95%, sensitivity is up to 3626, and optimal response and release time are respectively 6s and 13s, and through 2000 repeated tests, the pad value of its electric capacity is less than 10%.The electric capacity of the carbon nano-tube capacitance type sensor of this server cabinet is good with envionmental humidity linear change, highly sensitive, fast response time, good stability.
Embodiment 2
Based on a server cabinet for response humidity change fast, the cabinet outside of described server cabinet is provided with moisture sensor module, and this moisture sensor module comprises the heavy doping silicon chip laid successively from top to bottom, the SiO being close to heavy doping silicon chip 2layer, carbon nanotube layer, be positioned at SiO 2bottom electrode and the top electrode be positioned on carbon nanotube layer of interlayer, described carbon nanotube layer is grown on SiO 2on layer; Described bottom electrode has metallic film, and described metallic film is followed successively by from inside to outside has the Cr layer of adhesion, the Cu layer of conductive and heat-conductive and the Au layer as electrode layer, and the thickness of described Cr layer, Cu layer and Au layer is followed successively by 30nm, 400nm and 500nm; Described carbon nanotube layer adopts catalyzer and/or photoetching process to realize the growth of its localization, described carbon nanotube layer using plasma after growth makes it produce hydroxyl modified, and carbon nanotube layer have passed through and adds the acetic acid of micro-tungsten powder and the process of hydrogen peroxide mixed solution before plasma hydroxyl modified; The surface of described metallic film is glued with the bacterial enzyme rete of sensing bacterial growth, and this bacterial enzyme rete forms the bacterium wet sensitive sensor of sensing moisture together with metallic film; Described bottom electrode with top electrode is connected with a micro-control processor for being connected with client communication.
Further, the making of described moisture sensor comprises the following steps:
S1:SiO 2layer makes: get described heavy doping silicon chip, put it in tubular furnace, and according to the ramp of 10 DEG C/min to 500 DEG C, insulation 12h, then naturally cools to room temperature, can form SiO at heavy doping silicon chip surface 2layer;
S2: bottom electrode makes: have SiO by what obtain in step S1 2the heavy doping silicon chip of layer uses acetone, ethanol, washed with de-ionized water 15min post-drying, successively at its surperficial spin coating photoresist (low speed 900rpm, 15s; High speed 3500rpm, 50s), use bottom electrode mask to expose it, development after 120 DEG C of oven dry 2min, oven dry, at CHF 3dry etching SiO under atmosphere 2layer, etching 30min, will etch SiO 2heavy doping silicon chip after layer cleaning puts into magnetic control sputtering device, lower than 1.5 × 10 -3magnetron sputtering C r layer, Cu layer and Au layer successively under pa vacuum; By fixing for the bottom electrode (1) of good for magnetron sputtering Cr layer, Cu layer and Au layer surface upper bacterium enzyme membrane, then cleaning photoetching glue; The size of described heavy doping silicon chip is 2cm × 2cm;
S3: gas blowout catalyst film, step is as follows:
A. use Fe/Ni nano particle as the catalyzer of carbon nano tube growth, first, to the heavy doping silicon chip spin coating photoresist with bottom electrode, adopt the localization mask of catalyzer to expose it, then through development, clean for subsequent use;
B. the dispersion liquid of catalyst Fe/Ni is prepared: the Fe nano particle and the Ni nano particle that take 200mg, 60mg respectively, added the 98%H of 60ml 2sO 4with 69% of 40ml HNO 3in mixed solution, in 80 DEG C of water-baths, ultrasonic 3h, then filters with after washed with de-ionized water, obtain dry Fe/Ni mix nanoparticles, then take the Fe/Ni nano particle of 100mg, add in the deionized water of 500ml, after fully stirring, obtain the dispersion liquid of Fe/Ni mix nanoparticles;
C. use high pure nitrogen as gas blowout carrier, regulate the horizontal and vertical distance between airbrush and heavy doping silicon chip, just volatilize when the solvent of dispersion liquid is arrived on substrate and be as the criterion, gas blowout 5 times, each gas blowout 20s, makes the uniform thickness of formation one deck be about the mix nanoparticles film of the catalyst Fe/Ni of 20nm;
S4:CVD method carbon nano-tube:
Carbon nano-tube reactant gas source is CH 4and H 2mixed gas, first the heavy doping silicon chip with patterned catalyst particle is cleaned, remove photoresist, put into reaction chamber; Then vacuumize, after reaching vacuum requirement, pass into hydrogen, apply microwave and make to produce plasma in reflection chamber; Heated substrate makes it reach certain temperature and keep 40min, passes into methane gas, and now carbon nano-tube starts growth; In growth course lumen, vacuum tightness remains unchanged; Through about 10min, close microwave source and radio heater, stop passing into methane gas, close hydrogen, pass into argon gas, take out the substrate of heavy doping silicon chip, obtain the carbon nano-tube of patterning;
S5: Surface Modification of Carbon Nanotube By Plasma:
A. first the hydrogen peroxide of 60% acetic acid of 40ml and 10% of 20ml is put into beaker, fully mix, add micro-tungsten powder wherein, then have the substrate of the heavy doping silicon chip of Patterned Carbon Nanotube to put into growth, leave standstill 2h;
B. there is the substrate of the heavy doping silicon chip of carbon nano-tube to send in plasma generator growth, be evacuated to 1.0 × 10 -1below pa, then with inert gas N 2for carrier gas, by reactant ammoniacal liquor with N 2air-flow is brought in instrument, makes air-flow velocity be stabilized in 20mL/min, waits for 1h, open power source, be adjusted to 50W, in instrument, produce aura, under action of plasma, gas molecule valence link is destroyed, and great amount of hydroxy group produces, carbon nano-tube in the environment of acetic acid and hydrogen peroxide through the effect of tungsten powder, carbon nano-tube is by the hydroxyl modified produced, after Cement Composite Treated by Plasma 30min, close power source, take out substrate;
S6: prepare top electrode: by the heavy doping silicon chip ozone clean 20min obtained in step S1 ~ S5, covers the ceramic mask of top electrode, then heavy doping silicon chip is put into magnetic control sputtering device, lower than 1.5 × 10 -3under pa vacuum, sputtering has the top electrode of Au layer, and wherein, the thickness of Au layer is about 120nm;
S7: welding encapsulation: with lead-in wire, top electrode is connected with bottom electrode respectively, described moisture sensor is encapsulated, and digital electric bridge is welded with carbon nano-tube capacity type wet dependent sensor, digital electric bridge is used for reading in the capacitance variations of moisture sensor under humidity changing environment, demarcates water vapor concentration with this.
Test data: carbon nano-tube capacity type wet dependent sensor is placed on a metal sealing chamber (1m 3) in, metal sealing chamber is with air intake opening and gas outlet.During test, digital electric bridge output frequency is 50Hz, and probe temperature is 20 DEG C, and then controlling relative humidity variations scope is 5% ~ 95%, reads capacitance with humidity situation of change;
The sensitivity definition of this carbon nano-tube capacity type wet dependent sensor is: ︱ C rH-C 11︱/C 11× 100%, wherein C rHfor the sensor electrical capacitance obtained under test environment humidity, C 11for the capacitance of relative humidity 11% lower sensor.The response of this carbon nano-tube capacity type wet dependent sensor or be defined as testing capacitor value release time and reach total variation 80% time used at the variable quantity of 11%RH to 75%RH;
Test finds, under the relative humidity of 95%, sensitivity is up to 2854, and optimal response and release time are respectively 9s and 16s, and through 2000 repeated tests, the pad value of its electric capacity is less than 10%.The electric capacity of the carbon nano-tube capacitance type sensor of this server cabinet is good with envionmental humidity linear change, highly sensitive, fast response time, good stability.
Embodiment 3
Based on a server cabinet for response humidity change fast, the cabinet outside of described server cabinet is provided with moisture sensor module, and this moisture sensor module comprises the heavy doping silicon chip laid successively from top to bottom, the SiO being close to heavy doping silicon chip 2layer, carbon nanotube layer, be positioned at SiO 2bottom electrode and the top electrode be positioned on carbon nanotube layer of interlayer, described carbon nanotube layer is grown on SiO 2on layer; Described bottom electrode has metallic film, and described metallic film is followed successively by from inside to outside has the Cr layer of adhesion, the Cu layer of conductive and heat-conductive and the Au layer as electrode layer, and the thickness of described Cr layer, Cu layer and Au layer is followed successively by 30nm, 260nm and 360nm; Described carbon nanotube layer adopts catalyzer and/or photoetching process to realize the growth of its localization, described carbon nanotube layer using plasma after growth makes it produce hydroxyl modified, and carbon nanotube layer have passed through and adds the acetic acid of micro-tungsten powder and the process of hydrogen peroxide mixed solution before plasma hydroxyl modified; The surface of described metallic film is glued with the bacterial enzyme rete of sensing bacterial growth, and this bacterial enzyme rete forms the bacterium wet sensitive sensor of sensing moisture together with metallic film; Described bottom electrode with top electrode is connected with a micro-control processor for being connected with client communication.
Further, the making of described moisture sensor comprises the following steps:
S1:SiO 2layer makes: get described heavy doping silicon chip, put it in tubular furnace, and according to the ramp of 10 DEG C/min to 500 DEG C, insulation 12h, then naturally cools to room temperature, can form SiO at heavy doping silicon chip surface 2layer;
S2: bottom electrode makes: have SiO by what obtain in step S1 2the heavy doping silicon chip of layer uses acetone, ethanol, washed with de-ionized water 15min post-drying, successively at its surperficial spin coating photoresist (low speed 900rpm, 15s; High speed 3500rpm, 50s), use bottom electrode mask to expose it, development after 120 DEG C of oven dry 2min, oven dry, at CHF 3dry etching SiO under atmosphere 2layer, etching 30min, will etch SiO 2heavy doping silicon chip after layer cleaning puts into magnetic control sputtering device, lower than 1.5 × 10 -3magnetron sputtering C r layer, Cu layer and Au layer successively under pa vacuum; By fixing for the bottom electrode (1) of good for magnetron sputtering Cr layer, Cu layer and Au layer surface upper bacterium enzyme membrane, then cleaning photoetching glue; The size of described heavy doping silicon chip is 2cm × 2cm;
S3: gas blowout catalyst film, step is as follows:
A. use Fe/Ni nano particle as the catalyzer of carbon nano tube growth, first, to the heavy doping silicon chip spin coating photoresist with bottom electrode, adopt the localization mask of catalyzer to expose it, then through development, clean for subsequent use;
B. the dispersion liquid of catalyst Fe/Ni is prepared: the Fe nano particle and the Ni nano particle that take 100mg, 50mg respectively, added the 98%H of 60ml 2sO 4with 69% of 40ml HNO 3in mixed solution, in 80 DEG C of water-baths, ultrasonic 3h, then filters with after washed with de-ionized water, obtain dry Fe/Ni mix nanoparticles, then take the Fe/Ni nano particle of 100mg, add in the deionized water of 500ml, after fully stirring, obtain the dispersion liquid of Fe/Ni mix nanoparticles;
C. use high pure nitrogen as gas blowout carrier, regulate the horizontal and vertical distance between airbrush and heavy doping silicon chip, just volatilize when the solvent of dispersion liquid is arrived on substrate and be as the criterion, gas blowout 5 times, each gas blowout 20s, makes the uniform thickness of formation one deck be about the mix nanoparticles film of the catalyst Fe/Ni of 20nm;
S4:CVD method carbon nano-tube:
Carbon nano-tube reactant gas source is CH 4and H 2mixed gas, first the heavy doping silicon chip with patterned catalyst particle is cleaned, remove photoresist, put into reaction chamber; Then vacuumize, after reaching vacuum requirement, pass into hydrogen, apply microwave and make to produce plasma in reflection chamber; Heated substrate makes it reach certain temperature and keep 40min, passes into methane gas, and now carbon nano-tube starts growth; In growth course lumen, vacuum tightness remains unchanged; Through about 10min, close microwave source and radio heater, stop passing into methane gas, close hydrogen, pass into argon gas, take out the substrate of heavy doping silicon chip, obtain the carbon nano-tube of patterning;
S5: Surface Modification of Carbon Nanotube By Plasma:
A. first the hydrogen peroxide of 60% acetic acid of 40ml and 10% of 20ml is put into beaker, fully mix, add micro-tungsten powder wherein, then have the substrate of the heavy doping silicon chip of Patterned Carbon Nanotube to put into growth, leave standstill 2h;
B. there is the substrate of the heavy doping silicon chip of carbon nano-tube to send in plasma generator growth, be evacuated to 1.0 × 10 -1below pa, then with inert gas N 2for carrier gas, by reactant ammoniacal liquor with N 2air-flow is brought in instrument, makes air-flow velocity be stabilized in 20mL/min, waits for 1h, open power source, be adjusted to 50W, in instrument, produce aura, under action of plasma, gas molecule valence link is destroyed, and great amount of hydroxy group produces, carbon nano-tube in the environment of acetic acid and hydrogen peroxide through the effect of tungsten powder, carbon nano-tube is by the hydroxyl modified produced, after Cement Composite Treated by Plasma 30min, close power source, take out substrate;
S6: prepare top electrode: by the heavy doping silicon chip ozone clean 20min obtained in step S1 ~ S5, covers the ceramic mask of top electrode, then heavy doping silicon chip is put into magnetic control sputtering device, lower than 1.5 × 10 -3under pa vacuum, sputtering has the top electrode of Au layer, and wherein, the thickness of Au layer is about 300nm;
S7: welding encapsulation: with lead-in wire, top electrode is connected with bottom electrode respectively, described moisture sensor is encapsulated, and digital electric bridge is welded with carbon nano-tube capacity type wet dependent sensor, digital electric bridge is used for reading in the capacitance variations of moisture sensor under humidity changing environment, demarcates water vapor concentration with this.
Test data: carbon nano-tube capacity type wet dependent sensor is placed on a metal sealing chamber (1m 3) in, metal sealing chamber is with air intake opening and gas outlet.During test, digital electric bridge output frequency is 50Hz, and probe temperature is 20 DEG C, and then controlling relative humidity variations scope is 5% ~ 95%, reads capacitance with humidity situation of change;
The sensitivity definition of this carbon nano-tube capacity type wet dependent sensor is: ︱ C rH-C 11︱/C 11× 100%, wherein C rHfor the sensor electrical capacitance obtained under test environment humidity, C 11for the capacitance of relative humidity 11% lower sensor.The response of this carbon nano-tube capacity type wet dependent sensor or be defined as testing capacitor value release time and reach total variation 80% time used at the variable quantity of 11%RH to 75%RH;
Test finds, under the relative humidity of 95%, sensitivity is up to 1843, and optimal response and release time are respectively 18s and 38s, and through 2000 repeated tests, the pad value of its electric capacity is less than 10%.The electric capacity of the carbon nano-tube capacitance type sensor of this server cabinet is good with envionmental humidity linear change, highly sensitive, fast response time, good stability.
Embodiment 4
Based on a server cabinet for response humidity change fast, the cabinet outside of described server cabinet is provided with moisture sensor module, and this moisture sensor module comprises the heavy doping silicon chip laid successively from top to bottom, the SiO being close to heavy doping silicon chip 2layer, carbon nanotube layer, be positioned at SiO 2bottom electrode and the top electrode be positioned on carbon nanotube layer of interlayer, described carbon nanotube layer is grown on SiO 2on layer; Described bottom electrode has metallic film, and described metallic film is followed successively by from inside to outside has the Cr layer of adhesion, the Cu layer of conductive and heat-conductive and the Au layer as electrode layer, and the thickness of described Cr layer, Cu layer and Au layer is followed successively by 30nm, 120nm and 400nm; Described carbon nanotube layer adopts catalyzer and/or photoetching process to realize the growth of its localization, described carbon nanotube layer using plasma after growth makes it produce hydroxyl modified, and carbon nanotube layer have passed through and adds the acetic acid of micro-tungsten powder and the process of hydrogen peroxide mixed solution before plasma hydroxyl modified; The surface of described metallic film is glued with the bacterial enzyme rete of sensing bacterial growth, and this bacterial enzyme rete forms the bacterium wet sensitive sensor of sensing moisture together with metallic film; Described bottom electrode with top electrode is connected with a micro-control processor for being connected with client communication.
Further, the making of described moisture sensor comprises the following steps:
S1:SiO 2layer makes: get described heavy doping silicon chip, put it in tubular furnace, and according to the ramp of 10 DEG C/min to 500 DEG C, insulation 12h, then naturally cools to room temperature, can form SiO at heavy doping silicon chip surface 2layer;
S2: bottom electrode makes: have SiO by what obtain in step S1 2the heavy doping silicon chip of layer uses acetone, ethanol, washed with de-ionized water 15min post-drying, successively at its surperficial spin coating photoresist (low speed 900rpm, 15s; High speed 3500rpm, 50s), use bottom electrode mask to expose it, development after 120 DEG C of oven dry 2min, oven dry, at CHF 3dry etching SiO under atmosphere 2layer, etching 30min, will etch SiO 2heavy doping silicon chip after layer cleaning puts into magnetic control sputtering device, lower than 1.5 × 10 -3magnetron sputtering C r layer, Cu layer and Au layer successively under pa vacuum; By fixing for the bottom electrode (1) of good for magnetron sputtering Cr layer, Cu layer and Au layer surface upper bacterium enzyme membrane, then cleaning photoetching glue; The size of described heavy doping silicon chip is 2cm × 2cm;
S3: gas blowout catalyst film, step is as follows:
A. use Fe/Ni nano particle as the catalyzer of carbon nano tube growth, first, to the heavy doping silicon chip spin coating photoresist with bottom electrode, adopt the localization mask of catalyzer to expose it, then through development, clean for subsequent use;
B. the dispersion liquid of catalyst Fe/Ni is prepared: the Fe nano particle and the Ni nano particle that take 220mg, 45mg respectively, added the 98%H of 60ml 2sO 4with 69% of 40ml HNO 3in mixed solution, in 80 DEG C of water-baths, ultrasonic 3h, then filters with after washed with de-ionized water, obtain dry Fe/Ni mix nanoparticles, then take the Fe/Ni nano particle of 100mg, add in the deionized water of 500ml, after fully stirring, obtain the dispersion liquid of Fe/Ni mix nanoparticles;
C. use high pure nitrogen as gas blowout carrier, regulate the horizontal and vertical distance between airbrush and heavy doping silicon chip, just volatilize when the solvent of dispersion liquid is arrived on substrate and be as the criterion, gas blowout 5 times, each gas blowout 20s, makes the uniform thickness of formation one deck be about the mix nanoparticles film of the catalyst Fe/Ni of 20nm;
S4:CVD method carbon nano-tube:
Carbon nano-tube reactant gas source is CH 4and H 2mixed gas, first the heavy doping silicon chip with patterned catalyst particle is cleaned, remove photoresist, put into reaction chamber; Then vacuumize, after reaching vacuum requirement, pass into hydrogen, apply microwave and make to produce plasma in reflection chamber; Heated substrate makes it reach certain temperature and keep 40min, passes into methane gas, and now carbon nano-tube starts growth; In growth course lumen, vacuum tightness remains unchanged; Through about 10min, close microwave source and radio heater, stop passing into methane gas, close hydrogen, pass into argon gas, take out the substrate of heavy doping silicon chip, obtain the carbon nano-tube of patterning;
S5: Surface Modification of Carbon Nanotube By Plasma:
A. first the hydrogen peroxide of 60% acetic acid of 40ml and 10% of 20ml is put into beaker, fully mix, add micro-tungsten powder wherein, then have the substrate of the heavy doping silicon chip of Patterned Carbon Nanotube to put into growth, leave standstill 2h;
B. there is the substrate of the heavy doping silicon chip of carbon nano-tube to send in plasma generator growth, be evacuated to 1.0 × 10 -1below pa, then with inert gas N 2for carrier gas, by reactant ammoniacal liquor with N 2air-flow is brought in instrument, makes air-flow velocity be stabilized in 20mL/min, waits for 1h, open power source, be adjusted to 50W, in instrument, produce aura, under action of plasma, gas molecule valence link is destroyed, and great amount of hydroxy group produces, carbon nano-tube in the environment of acetic acid and hydrogen peroxide through the effect of tungsten powder, carbon nano-tube is by the hydroxyl modified produced, after Cement Composite Treated by Plasma 30min, close power source, take out substrate;
S6: prepare top electrode: by the heavy doping silicon chip ozone clean 20min obtained in step S1 ~ S5, covers the ceramic mask of top electrode, then heavy doping silicon chip is put into magnetic control sputtering device, lower than 1.5 × 10 -3under pa vacuum, sputtering has the top electrode of Au layer, and wherein, the thickness of Au layer is about 360nm;
S7: welding encapsulation: with lead-in wire, top electrode is connected with bottom electrode respectively, described moisture sensor is encapsulated, and digital electric bridge is welded with carbon nano-tube capacity type wet dependent sensor, digital electric bridge is used for reading in the capacitance variations of moisture sensor under humidity changing environment, demarcates water vapor concentration with this.
Test data:
Carbon nano-tube capacity type wet dependent sensor is placed on a metal sealing chamber (1m 3) in, metal sealing chamber is with air intake opening and gas outlet.During test, digital electric bridge output frequency is 50Hz, and probe temperature is 20 DEG C, and then controlling relative humidity variations scope is 5% ~ 95%, reads capacitance with humidity situation of change;
The sensitivity definition of this carbon nano-tube capacity type wet dependent sensor is: ︱ C rH-C 11︱/C 11× 100%, wherein C rHfor the sensor electrical capacitance obtained under test environment humidity, C 11for the capacitance of relative humidity 11% lower sensor.The response of this carbon nano-tube capacity type wet dependent sensor or be defined as testing capacitor value release time and reach total variation 80% time used at the variable quantity of 11%RH to 75%RH;
Test finds, under the relative humidity of 95%, sensitivity is up to 1693, and optimal response and release time are respectively 12s and 29s, and through 2000 repeated tests, the pad value of its electric capacity is less than 10%.The electric capacity of the carbon nano-tube capacitance type sensor of this server cabinet is good with envionmental humidity linear change, highly sensitive, fast response time, good stability.
Embodiment 5
Based on a server cabinet for response humidity change fast, the cabinet outside of described server cabinet is provided with moisture sensor module, and this moisture sensor module comprises the heavy doping silicon chip laid successively from top to bottom, the SiO being close to heavy doping silicon chip 2layer, carbon nanotube layer, be positioned at SiO 2bottom electrode and the top electrode be positioned on carbon nanotube layer of interlayer, described carbon nanotube layer is grown on SiO 2on layer; Described bottom electrode has metallic film, and described metallic film is followed successively by from inside to outside has the Cr layer of adhesion, the Cu layer of conductive and heat-conductive and the Au layer as electrode layer, and the thickness of described Cr layer, Cu layer and Au layer is followed successively by 40nm, 60nm and 650nm; Described carbon nanotube layer adopts catalyzer and/or photoetching process to realize the growth of its localization, described carbon nanotube layer using plasma after growth makes it produce hydroxyl modified, and carbon nanotube layer have passed through and adds the acetic acid of micro-tungsten powder and the process of hydrogen peroxide mixed solution before plasma hydroxyl modified; The surface of described metallic film is glued with the bacterial enzyme rete of sensing bacterial growth, and this bacterial enzyme rete forms the bacterium wet sensitive sensor of sensing moisture together with metallic film; Described bottom electrode with top electrode is connected with a micro-control processor for being connected with client communication.
Further, the making of described moisture sensor comprises the following steps:
S1:SiO 2layer makes: get described heavy doping silicon chip, put it in tubular furnace, and according to the ramp of 10 DEG C/min to 500 DEG C, insulation 12h, then naturally cools to room temperature, can form SiO at heavy doping silicon chip surface 2layer;
S2: bottom electrode makes: have SiO by what obtain in step S1 2the heavy doping silicon chip of layer uses acetone, ethanol, washed with de-ionized water 15min post-drying, successively at its surperficial spin coating photoresist (low speed 900rpm, 15s; High speed 3500rpm, 50s), use bottom electrode mask to expose it, development after 120 DEG C of oven dry 2min, oven dry, at CHF 3dry etching SiO under atmosphere 2layer, etching 30min, will etch SiO 2heavy doping silicon chip after layer cleaning puts into magnetic control sputtering device, lower than 1.5 × 10 -3magnetron sputtering C r layer, Cu layer and Au layer successively under pa vacuum; By fixing for the bottom electrode (1) of good for magnetron sputtering Cr layer, Cu layer and Au layer surface upper bacterium enzyme membrane, then cleaning photoetching glue; The size of described heavy doping silicon chip is 2cm × 2cm;
S3: gas blowout catalyst film, step is as follows:
A. use Fe/Ni nano particle as the catalyzer of carbon nano tube growth, first, to the heavy doping silicon chip spin coating photoresist with bottom electrode, adopt the localization mask of catalyzer to expose it, then through development, clean for subsequent use;
B. the dispersion liquid of catalyst Fe/Ni is prepared: the Fe nano particle and the Ni nano particle that take 200mg, 50mg respectively, added the 98%H of 60ml 2sO 4with 69% of 40ml HNO 3in mixed solution, in 80 DEG C of water-baths, ultrasonic 3h, then filters with after washed with de-ionized water, obtain dry Fe/Ni mix nanoparticles, then take the Fe/Ni nano particle of 100mg, add in the deionized water of 500ml, after fully stirring, obtain the dispersion liquid of Fe/Ni mix nanoparticles;
C. use high pure nitrogen as gas blowout carrier, regulate the horizontal and vertical distance between airbrush and heavy doping silicon chip, just volatilize when the solvent of dispersion liquid is arrived on substrate and be as the criterion, gas blowout 5 times, each gas blowout 20s, makes the uniform thickness of formation one deck be about the mix nanoparticles film of the catalyst Fe/Ni of 20nm;
S4:CVD method carbon nano-tube:
Carbon nano-tube reactant gas source is CH 4and H 2mixed gas, first the heavy doping silicon chip with patterned catalyst particle is cleaned, remove photoresist, put into reaction chamber; Then vacuumize, after reaching vacuum requirement, pass into hydrogen, apply microwave and make to produce plasma in reflection chamber; Heated substrate makes it reach certain temperature and keep 40min, passes into methane gas, and now carbon nano-tube starts growth; In growth course lumen, vacuum tightness remains unchanged; Through about 10min, close microwave source and radio heater, stop passing into methane gas, close hydrogen, pass into argon gas, take out the substrate of heavy doping silicon chip, obtain the carbon nano-tube of patterning;
S5: Surface Modification of Carbon Nanotube By Plasma:
A. first the hydrogen peroxide of 30% acetic acid of 60ml and 10% of 20ml is put into beaker, fully mix, add micro-tungsten powder wherein, then have the substrate of the heavy doping silicon chip of Patterned Carbon Nanotube to put into growth, leave standstill 2h;
B. there is the substrate of the heavy doping silicon chip of carbon nano-tube to send in plasma generator growth, be evacuated to 1.0 × 10 -1below pa, then with inert gas N 2for carrier gas, by reactant ammoniacal liquor with N 2air-flow is brought in instrument, makes air-flow velocity be stabilized in 20mL/min, waits for 1h, open power source, be adjusted to 50W, in instrument, produce aura, under action of plasma, gas molecule valence link is destroyed, and great amount of hydroxy group produces, carbon nano-tube in the environment of acetic acid and hydrogen peroxide through the effect of tungsten powder, carbon nano-tube is by the hydroxyl modified produced, after Cement Composite Treated by Plasma 30min, close power source, take out substrate;
S6: prepare top electrode: by the heavy doping silicon chip ozone clean 20min obtained in step S1 ~ S5, covers the ceramic mask of top electrode, then heavy doping silicon chip is put into magnetic control sputtering device, lower than 1.5 × 10 -3under pa vacuum, sputtering has the top electrode of Au layer, and wherein, the thickness of Au layer is about 200nm;
S7: welding encapsulation: with lead-in wire, top electrode is connected with bottom electrode respectively, described moisture sensor is encapsulated, and digital electric bridge is welded with carbon nano-tube capacity type wet dependent sensor, digital electric bridge is used for reading in the capacitance variations of moisture sensor under humidity changing environment, demarcates water vapor concentration with this.
Test data: carbon nano-tube capacity type wet dependent sensor is placed on a metal sealing chamber (1m 3) in, metal sealing chamber is with air intake opening and gas outlet.During test, digital electric bridge output frequency is 50Hz, and probe temperature is 20 DEG C, and then controlling relative humidity variations scope is 5% ~ 95%, reads capacitance with humidity situation of change;
The sensitivity definition of this carbon nano-tube capacity type wet dependent sensor is: ︱ C rH-C 11︱/C 11× 100%, wherein C rHfor the sensor electrical capacitance obtained under test environment humidity, C 11for the capacitance of relative humidity 11% lower sensor.The response of this carbon nano-tube capacity type wet dependent sensor or be defined as testing capacitor value release time and reach total variation 80% time used at the variable quantity of 11%RH to 75%RH;
Test finds, under the relative humidity of 95%, sensitivity is up to 1948, and optimal response and release time are respectively 15s and 27s, and through 2000 repeated tests, the pad value of its electric capacity is less than 10%.The electric capacity of the carbon nano-tube capacitance type sensor of this server cabinet is good with envionmental humidity linear change, highly sensitive, fast response time, good stability.
The above; be only the present invention's preferably embodiment; but protection scope of the present invention is not limited thereto; anyly be familiar with those skilled in the art in the technical scope that the present invention discloses; be equal to according to technological invention of the present invention and inventive concept thereof and replace or change, all should be encompassed within protection scope of the present invention.

Claims (3)

1. the server cabinet based on response humidity change fast, it is characterized in that, the cabinet outside of described server cabinet is provided with moisture sensor module, and this moisture sensor module comprises the heavy doping silicon chip (1) laid successively from top to bottom, the SiO being close to heavy doping silicon chip (1) 2layer (2), carbon nanotube layer (4), be positioned at SiO 2bottom electrode (3) between layer (2) and the top electrode (5) be positioned on carbon nanotube layer (4), described carbon nanotube layer (4) is grown on SiO 2on layer (2); Described bottom electrode (3) is metallic film, described metallic film is followed successively by from inside to outside has the Cr layer of adhesion, the Cu layer of conductive and heat-conductive and the Au layer as electrode layer, and the thickness of described Cr layer, Cu layer and Au layer is followed successively by 30nm, 300nm and 300nm; Described carbon nanotube layer (4) adopts catalyzer and/or photoetching process to realize the growth of its localization, described carbon nanotube layer (4) using plasma after growth makes it produce hydroxyl modified, and carbon nanotube layer (4) have passed through and adds the acetic acid of micro-tungsten powder and the process of hydrogen peroxide mixed solution before plasma hydroxyl modified; The surface of described metallic film is glued with the bacterial enzyme rete of sensing bacterial growth, and this bacterial enzyme rete forms the bacterium wet sensitive sensor of sensing moisture together with metallic film; Described bottom electrode (3) is connected with a micro-control processor for being connected with client communication with on top electrode (5).
2. a kind of server cabinet based on response humidity change fast according to claim 1, it is characterized in that, the making of described moisture sensor comprises the following steps:
S1:SiO 2layer makes: get described heavy doping silicon chip (1), put it in tubular furnace, and according to the ramp of 10 DEG C/min to 500 DEG C, insulation 12h, then naturally cools to room temperature, can form SiO on heavy doping silicon chip (1) surface 2layer (2);
S2: bottom electrode makes: have SiO by what obtain in step (1) 2the heavy doping silicon chip (1) of layer (2) uses acetone, ethanol, washed with de-ionized water 15min post-drying successively, at its surperficial spin coating photoresist, uses bottom electrode mask to expose it, and development after 120 DEG C of oven dry 2min, oven dry, at CHF 3dry etching SiO under atmosphere 2layer (2), etching 30min, will etch SiO 2heavy doping silicon chip (1) after layer (2) cleaning puts into magnetic control sputtering device, lower than 1.5 × 10 -3magnetron sputtering C r layer, Cu layer and Au layer successively under pa vacuum; By fixing for the bottom electrode (1) of good for magnetron sputtering Cr layer, Cu layer and Au layer surface upper bacterium enzyme membrane, then cleaning photoetching glue; The size of described heavy doping silicon chip (1) is 2cm × 2cm;
S3: gas blowout catalyst film, step is as follows:
A. the catalyzer that Fe/Ni nano particle grows as carbon nano-tube (4) is used, first, to heavy doping silicon chip (1) the spin coating photoresist with bottom electrode (3), adopt the localization mask of catalyzer to expose it, then through development, clean for subsequent use;
B. the dispersion liquid of catalyst Fe/Ni is prepared: the Fe nano particle and the Ni nano particle that take 200mg, 50mg respectively, added the 98%H of 60ml 2sO 4with 69% of 40ml HNO 3in mixed solution, in 80 DEG C of water-baths, ultrasonic 3h, then filters with after washed with de-ionized water, obtain dry Fe/Ni mix nanoparticles, then take the Fe/Ni nano particle of 100mg, add in the deionized water of 500ml, after fully stirring, obtain the dispersion liquid of Fe/Ni mix nanoparticles;
C. use high pure nitrogen as gas blowout carrier, regulate the horizontal and vertical distance between airbrush and heavy doping silicon chip (1), just volatilize when the solvent of dispersion liquid is arrived on substrate and be as the criterion, gas blowout 5 times, each gas blowout 20s, makes the uniform thickness of formation one deck be about the mix nanoparticles film of the catalyst Fe/Ni of 20nm;
S4:CVD method carbon nano-tube:
Carbon nano-tube (4) reactant gas source is CH 4and H 2mixed gas, first the heavy doping silicon chip (1) with patterned catalyst particle is cleaned, remove photoresist, put into reaction chamber; Then vacuumize, after reaching vacuum requirement, pass into hydrogen, apply microwave and make to produce plasma in reflection chamber; Heated substrate makes it reach certain temperature and keep 40min, passes into methane gas, and now carbon nano-tube (4) starts growth; In growth course lumen, vacuum tightness remains unchanged; Through about 10min, close microwave source and radio heater, stop passing into methane gas, close hydrogen, pass into argon gas, take out the substrate of heavy doping silicon chip (1), obtain the carbon nano-tube (4) of patterning;
S5: Surface Modification of Carbon Nanotube By Plasma:
A. first the hydrogen peroxide of 60% acetic acid of 40ml and 10% of 20ml is put into beaker, abundant mixing, add micro-tungsten powder wherein, then growth had the substrate of the heavy doping silicon chip (1) of Patterned Carbon Nanotube (4) to put into, leave standstill 2h;
B. growth there is is the substrate of the heavy doping silicon chip (1) of carbon nano-tube (4) to send in plasma generator, be evacuated to 1.0 × 10 -1below pa, then with inert gas N 2for carrier gas, by reactant ammoniacal liquor with N 2air-flow is brought in instrument, makes air-flow velocity be stabilized in 20mL/min, waits for 1h, open power source, be adjusted to 50W, in instrument, produce aura, under action of plasma, gas molecule valence link is destroyed, and great amount of hydroxy group produces, carbon nano-tube (4) in the environment of acetic acid and hydrogen peroxide through the effect of tungsten powder, carbon nano-tube is by the hydroxyl modified produced, after Cement Composite Treated by Plasma 30min, close power source, take out substrate;
S6: prepare top electrode: the heavy doping silicon chip (1) obtained in step S1 ~ S5 is used ozone clean 20min, cover the ceramic mask of top electrode (5), then heavy doping silicon chip (1) is put into magnetic control sputtering device, lower than 1.5 × 10 -3under pa vacuum, sputtering has the top electrode (5) of Au layer, and wherein, the thickness of Au layer is about 200nm;
S7: welding encapsulation: with lead-in wire, top electrode (5) is connected with bottom electrode (3) respectively, described moisture sensor is encapsulated, and digital electric bridge is welded with carbon nano-tube capacity type wet dependent sensor, digital electric bridge is used for reading in the capacitance variations of moisture sensor under humidity changing environment, demarcates water vapor concentration with this.
3. a kind of server cabinet based on response humidity change fast according to claim 2, it is characterized in that, in described step S2, the optimum configurations of spin coating photoresist is as follows: low speed 900rpm, 15s; High speed 3500rpm, 50s.
CN201610021666.4A 2016-01-13 2016-01-13 Server cabinet based on quick responses to humidity changes Pending CN105572187A (en)

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