CN105548843A - Withstand voltage testing device for printed circuit board - Google Patents

Withstand voltage testing device for printed circuit board Download PDF

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Publication number
CN105548843A
CN105548843A CN201610048967.6A CN201610048967A CN105548843A CN 105548843 A CN105548843 A CN 105548843A CN 201610048967 A CN201610048967 A CN 201610048967A CN 105548843 A CN105548843 A CN 105548843A
Authority
CN
China
Prior art keywords
circuit board
detector probe
printed circuit
voltage
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610048967.6A
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Chinese (zh)
Inventor
黄志宏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
APCB Electronics Kunshan Co Ltd
Original Assignee
APCB Electronics Kunshan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by APCB Electronics Kunshan Co Ltd filed Critical APCB Electronics Kunshan Co Ltd
Priority to CN201610048967.6A priority Critical patent/CN105548843A/en
Publication of CN105548843A publication Critical patent/CN105548843A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G01R31/1263Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
    • G01R31/129Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of components or parts made of semiconducting materials; of LV components or parts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

The invention discloses a withstand voltage testing device for a printed circuit board, and the device comprises a withstand voltage tester and a testing tool. The withstand voltage tester is provided with a high-voltage output end and a testing loop low end. The testing tool comprises a bottom plate and a bearing assembly, and the front surface of the bottom plate is provided with a plurality of groups of detection probe units which are corresponding to a plurality of PCS plates in a one-to-one manner. Each group of detection probe units consist of a first detection probe in electrical connection with the high-voltage output end, and a second detection probe in electrical connection with the testing loop low end. The bearing assembly is disposed above the front surface of the bottom plate, and can elastically move relative to the front surface of the bottom plate. The elastic displacement of the bearing assembly can enable the plurality of detection probe units to be inserted into and separated from the bearing assembly, thereby enabling the plurality of detection probe units to be connected and disconnected with the corresponding PCS plates. The device can complete the withstand voltage testing among the plurality of PCS plates on the printed circuit board at a time, and greatly improves the detection efficiency.

Description

Withstand voltage test device for printed circuit board
Technical field
The present invention relates to printed-board technology field, a kind of withstand voltage test device for printed circuit board is specifically provided.
Background technology
Based on the requirement to printed circuit board (PCB) product reliability, need to carry out proof voltage test to it, to assess this printed circuit board (PCB) to high-tension tolerance.One printed circuit board is made up of multiple PCS plate, and the proof voltage ability of a printed circuit board is the electric insulation capacity between two PCS plates.
In prior art, withstands voltage tester is usually used to carry out the proof voltage ability of testing printed circuit board.During test, respectively the positive and negative electrode test lead of withstands voltage tester is connected with two PCS plates to be measured in printed circuit board (PCB), applies test required voltage by withstands voltage tester, the object of the proof voltage aptitude tests between reaching described two PCS plates to be measured.But when utilizing above-mentioned method of testing to carry out proof voltage test, once only can carry out proof voltage test between two PCS plates to be measured, and a printed circuit board is made up of multiple PCS plate usually, the test therefore completing a printed circuit board will consume the long time, and testing efficiency is very low.In addition, above-mentioned method of testing is all that operating personnel's manual operations completes usually, and like this concerning operating personnel, not only working strength is large, but also has potential safety hazard to a certain extent.
Summary of the invention
In order to overcome above-mentioned defect, the invention provides a kind of withstand voltage test device for printed circuit board, this voltage-resistant test device disposablely can complete the proof voltage aptitude tests on a printed circuit board (PCB) between multiple PCS plate simultaneously, substantially increases the quality of detection efficiency and printed circuit board (PCB).
The present invention in order to the technical scheme solving its technical matters and adopt is: a kind of withstand voltage test device for printed circuit board, one printed circuit board is made up of multiple PCS plate, and this voltage-resistant test device is in order to test the proof voltage ability of the multiple PCS plates in a printed circuit board simultaneously; This voltage-resistant test device comprises withstands voltage tester and measurement jig, and wherein, described withstands voltage tester has high-voltage output end and test loop low side; Described measurement jig comprises base plate and in order to carry the bearing assembly of test print circuit board, described base plate is horizontal positioned, its front is laid with the detector probe array be made up of some groups of detector probe unit, these some groups of detector probe unit respectively with the multiple PCS plate one_to_one corresponding on test print circuit board, and each group detector probe unit is also each is made up of the first detector probe be electrically connected with described high-voltage output end and the second detector probe of being electrically connected with described test loop low side respectively; Described bearing assembly is arranged at the top in described base plate front, and elastic displacement can be made in relatively described base plate front, and the elastic displacement of described bearing assembly also be able to make these some groups of detector probe unit plant and depart from described bearing assembly, so make these some groups of detector probe unit respectively PCS plate be corresponding thereto connected and disconnect.
As a further improvement on the present invention, described withstands voltage tester includes PLC;
This voltage-resistant test device also includes a high tension device, described high tension device is mainly integrated with a control circuit be electrically connected with described PLC and a relay array be electrically connected with described control circuit, and the high-voltage output end of described withstands voltage tester and test loop low side all switch on and off some first detector probe in described detector probe array and the second detector probe by described relay array correspondence.
As a further improvement on the present invention, described relay array is made up of some group relay unit, this some group relay unit and this some groups of detector probe unit corresponding matching, and each group relay unit is also respectively made up of the first relay be electrically connected between described high-voltage output end and described first detector probe and the second relay be electrically connected between described test loop low side and described second detector probe respectively.
As a further improvement on the present invention, described bearing assembly comprises back up pad and two pieces in arrange up and down and in order to the current-carrying plate of sandwiched test print circuit board, wherein, described back up pad is arranged at described base plate upper front, and can make elastic displacement in relatively described base plate front; Two pieces of described current-carrying plates are laid on the upper surface of described back up pad described base plate dorsad freely; And described back up pad also offers some groups respectively with the through hole unit of these some groups of detector probe unit corresponding matching, each is organized, and described through hole unit is each to be visited the second through hole interted form by detecting the first through hole of visiting and interting for described first and detect for described second respectively.
As a further improvement on the present invention, the front of described base plate has a test zone, described detector probe array is laid in this test zone, and the edge of this test zone also locating open be provided with multiple gathering sill;
Also be provided with many vertical guide rods, these many vertical guide rods and the corresponding cooperation of described multiple gathering sill, and the upper end of these many vertical guide rods is all located by connecting with described back up pad, what the lower end of these many vertical guide rods was all corresponding is freely inserted in the plurality of gathering sill; Also described in each vertical guide rod lower end outside be arranged with elastic component, and the two ends of described elastic component also respectively elasticity be resisted against in the lower end of described vertical guide rod and the groove bottom wall of described gathering sill.
As a further improvement on the present invention, also be provided with lift cylinder and a cover plate be made up of transparent material, described lift cylinder is positioned the top of described back up pad, the piston rod of described cover plate and described lift cylinder is located by connecting, and can cover under the drive of described lift cylinder piston rod and depart from described back up pad.
As a further improvement on the present invention, on the front of described base plate, also location is provided with a vertical supports, and described lift cylinder is located by connecting in described vertical supports.
The invention has the beneficial effects as follows: compared to prior art, this voltage-resistant test device is easy and simple to handle, can detect that whether printed circuit board (PCB) is qualified fast, especially, this voltage-resistant test device also disposablely can complete the proof voltage aptitude tests on a printed circuit board (PCB) between multiple PCS plate simultaneously, substantially increase the quality of detection efficiency and printed circuit board (PCB), be particularly suitable for testing the proof voltage of printed circuit board (PCB) in enormous quantities; In addition, this voltage-resistant test device also avoid the manual operations of operating personnel, not only considerably reduces the labour intensity of operating personnel, also improves the job security of operating personnel.
Accompanying drawing explanation
Fig. 1 is the principle of work block scheme of voltage-resistant test device of the present invention;
Fig. 2 is the side-looking structural representation of measurement jig of the present invention;
Fig. 3 is the cross-sectional view of bearing assembly of the present invention.
By reference to the accompanying drawings, make the following instructions:
1---withstands voltage tester 10---high-voltage output end
11---test loop low side 2---measurement jig
20---base plate 21---detector probe array
220---back up pad 221---current-carrying plate
The vertical guide rod of 222---through hole unit 23---
24---lift cylinder 25---cover plate
26---vertical supports 3---high tension device
30---control circuit 31---relay array
Embodiment
Referring to figure to a preferred embodiment of the present invention will be described in detail.
A kind of withstand voltage test device for printed circuit board of the present invention, a printed circuit board is made up of multiple PCS plate, and this voltage-resistant test device is in order to test the proof voltage ability of the multiple PCS plates in a printed circuit board simultaneously; This voltage-resistant test device comprises withstands voltage tester 1 and measurement jig 2, and wherein, described withstands voltage tester 1 has high-voltage output end 10 and test loop low side 11 (it is common practise, does not describe in detail at this); Described measurement jig 2 comprises base plate 20 and in order to carry the bearing assembly of test print circuit board, described base plate 20 is horizontal positioned, its front is laid with the detector probe array 21 be made up of some groups of detector probe unit, these some groups of detector probe unit respectively with the multiple PCS plate one_to_one corresponding on test print circuit board, and each group detector probe unit is also each is made up of the first detector probe be electrically connected with described high-voltage output end 10 and the second detector probe of being electrically connected with described test loop low side 11 respectively; Described bearing assembly is arranged at the top in described base plate 20 front, and elastic displacement can be made in relatively described base plate 20 front, and the elastic displacement of described bearing assembly also be able to make these some groups of detector probe unit plant and depart from described bearing assembly, so make these some groups of detector probe unit respectively PCS plate be corresponding thereto connected and disconnect.This voltage-resistant test device disposablely can complete the proof voltage aptitude tests on a printed circuit board (PCB) between multiple PCS plate simultaneously, substantially increases the quality of detection efficiency and printed circuit board (PCB), is particularly suitable for testing the proof voltage of printed circuit board (PCB) in enormous quantities.
In the present embodiment, described withstands voltage tester 1 includes PLC; This voltage-resistant test device also includes a high tension device 3, described high tension device 3 is mainly integrated with the control circuit be electrically connected with described PLC 30 and the relay array 31 be electrically connected with described control circuit, and the high-voltage output end 10 of described withstands voltage tester 1 and test loop low side 11 all switch on and off some first detector probe in described detector probe array 21 and the second detector probe by described relay array 31 correspondence.
Preferably, described relay array is made up of some group relay unit, this some group relay unit and this some groups of detector probe unit corresponding matching, and each group relay unit is also respectively made up of the first relay be electrically connected between described high-voltage output end 10 and described first detector probe and the second relay be electrically connected between described test loop low side 11 and described second detector probe respectively.
In the present embodiment, described bearing assembly comprises back up pad 220 and two pieces in arrange up and down and in order to the current-carrying plate 221 of sandwiched test print circuit board, wherein, described back up pad 220 is arranged at described base plate 20 upper front, and can make elastic displacement in relatively described base plate 20 front; Two pieces of described current-carrying plates 221 are laid on the upper surface of described back up pad 220 described base plate 20 dorsad freely; And described back up pad 220 also offers some groups respectively with the through hole unit 222 of these some groups of detector probe unit corresponding matching, each is organized, and described through hole unit is each to be visited the second through hole interted form by detecting the first through hole of visiting and interting for described first and detect for described second respectively.
Preferably, the front of described base plate 20 has a test zone, described detector probe array 21 is laid in this test zone, and the edge of this test zone also locating open be provided with multiple gathering sill;
Also be provided with many vertical guide rods 23, these many vertical guide rods 23 and the corresponding cooperation of described multiple gathering sill, and the upper end of these many vertical guide rods 23 is all located by connecting with described back up pad 220, what the lower end of these many vertical guide rods 23 was all corresponding is freely inserted in the plurality of gathering sill; Also described in each vertical guide rod 23 lower end outside be arranged with elastic component, and the two ends of described elastic component also respectively elasticity be resisted against in the lower end of the described vertical guide rod matched with it and the groove bottom wall of described gathering sill.Further preferred, can described in each vertical lower end of the guide rod lateral wall on be formed with a circle fin, the two ends of described elastic component can elasticity be resisted against in the fin of described vertical guide rod and the groove bottom wall of described gathering sill respectively; By arranging the combination of many vertical guide rods and elastic component, this back up pad 220 relatively described base plate 20 front being arranged at described base plate 20 upper front can be made to make elastic displacement.
In the present embodiment, also be provided with lift cylinder 24 and a cover plate be made up of transparent material 25, described lift cylinder 24 is positioned the top of described back up pad 220, described cover plate 25 is located by connecting with the piston rod of described lift cylinder 24, and can cover under the drive of described lift cylinder 24 piston rod and depart from described back up pad 220.On the one hand, the power that lift cylinder used by described cover plate can drive described back up pad to move down, and detector probe is worn and exposes outside through hole, and then realizes detector probe and test print circuit board is connected; On the other hand, described cover plate can also cover to form an airtight test space with described back up pad mutually, effectively makes test print circuit board completely cut off any chaff interference, is beneficial to test and carries out.
Preferably, on the front of described base plate 20, also location is provided with a vertical supports 26, and described lift cylinder 24 is located by connecting in described vertical supports 26.

Claims (7)

1. a withstand voltage test device for printed circuit board, a printed circuit board is made up of multiple PCS plate, and this voltage-resistant test device is in order to test the proof voltage ability of the multiple PCS plates in a printed circuit board simultaneously, it is characterized in that: this voltage-resistant test device comprises withstands voltage tester (1) and measurement jig (2), wherein, described withstands voltage tester (1) has high-voltage output end (10) and test loop low side (11), described measurement jig (2) comprises base plate (20), and one in order to carry the bearing assembly of test print circuit board, described base plate (20) is horizontal positioned, its front is laid with the detector probe array (21) be made up of some groups of detector probe unit, these some groups of detector probe unit respectively with the multiple PCS plate one_to_one corresponding on test print circuit board, and each group detector probe unit is also each respectively by the first detector probe be electrically connected with described high-voltage output end (10), and the second detector probe to be electrically connected with described test loop low side (11) forms, described bearing assembly is arranged at the top in described base plate (20) front, and elastic displacement can be made in relatively described base plate (20) front, and the elastic displacement of described bearing assembly also be able to make these some groups of detector probe unit plant and depart from described bearing assembly, so make these some groups of detector probe unit respectively PCS plate be corresponding thereto connected and disconnect.
2. withstand voltage test device for printed circuit board according to claim 1, is characterized in that: described withstands voltage tester (1) includes PLC;
This voltage-resistant test device also includes a high tension device (3), described high tension device (3) is mainly integrated with a control circuit be electrically connected with described PLC (30) and a relay array be electrically connected with described control circuit (31), and the high-voltage output end (10) of described withstands voltage tester (1) and test loop low side (11) all switch on and off some first detector probe in described detector probe array (21) and the second detector probe by described relay array (31) correspondence.
3. withstand voltage test device for printed circuit board according to claim 2, it is characterized in that: described relay array is made up of some group relay unit, this some group relay unit and this some groups of detector probe unit corresponding matching, and each group relay unit is also respectively made up of the first relay be electrically connected between described high-voltage output end (10) and described first detector probe and the second relay be electrically connected between described test loop low side (11) and described second detector probe respectively.
4. withstand voltage test device for printed circuit board according to claim 1, it is characterized in that: described bearing assembly comprises back up pad (220) and two pieces in arrange up and down and in order to the current-carrying plate (221) of sandwiched test print circuit board, wherein, described back up pad (220) is arranged at described base plate (20) upper front, and can make elastic displacement in relatively described base plate (20) front; Two pieces of described current-carrying plates (221) are laid on the upper surface of described back up pad (220) described base plate (20) dorsad freely; And described back up pad (220) also offers some groups respectively with the through hole unit (222) of these some groups of detector probe unit corresponding matching, each is organized, and described through hole unit is each to be visited the second through hole interted form by detecting the first through hole of visiting and interting for described first and detect for described second respectively.
5. withstand voltage test device for printed circuit board according to claim 4, it is characterized in that: the front of described base plate (20) has a test zone, described detector probe array (21) is laid in this test zone, and the edge of this test zone also locating open be provided with multiple gathering sill;
Also be provided with many vertical guide rods (23), these many vertical guide rods (23) and the corresponding cooperation of described multiple gathering sill, and the upper end of these many vertical guide rods (23) is all located by connecting with described back up pad (220), what the lower end of these many vertical guide rods (23) was all corresponding is freely inserted in the plurality of gathering sill; Also described in each vertical guide rod (23) lower end outside be arranged with elastic component, and the two ends of described elastic component also respectively elasticity be resisted against in the lower end of described vertical guide rod and the groove bottom wall of described gathering sill.
6. withstand voltage test device for printed circuit board according to claim 4, it is characterized in that: be also provided with lift cylinder (24) and a cover plate be made up of transparent material (25), described lift cylinder (24) is positioned the top of described back up pad (220), described cover plate (25) is located by connecting with the piston rod of described lift cylinder (24), and can cover under the drive of described lift cylinder (24) piston rod and depart from described back up pad (220).
7. withstand voltage test device for printed circuit board according to claim 6, it is characterized in that: on the front of described base plate (20), also location is provided with a vertical supports (26), and described lift cylinder (24) is located by connecting in described vertical supports (26).
CN201610048967.6A 2016-01-25 2016-01-25 Withstand voltage testing device for printed circuit board Pending CN105548843A (en)

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Application Number Priority Date Filing Date Title
CN201610048967.6A CN105548843A (en) 2016-01-25 2016-01-25 Withstand voltage testing device for printed circuit board

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105974300A (en) * 2016-06-14 2016-09-28 浪潮电子信息产业股份有限公司 Testing method for realizing ICT test coverage rate increase through adding relay board
CN107390098A (en) * 2017-07-27 2017-11-24 深圳崇达多层线路板有限公司 A kind of high pressure resistant test device of PCB and method of testing
CN107478968A (en) * 2017-08-07 2017-12-15 纳恩博(天津)科技有限公司 detecting tool
CN107831427A (en) * 2017-11-09 2018-03-23 伟创力电子技术(苏州)有限公司 A kind of automatic high pressure test system
CN107884701A (en) * 2017-10-12 2018-04-06 中车青岛四方机车车辆股份有限公司 A kind of experimental provision and experimental method of circuit board tolerance overvoltage damage
CN110548687A (en) * 2019-09-06 2019-12-10 东莞市冠佳电子设备有限公司 Full-automatic electronic component test equipment
CN113820585A (en) * 2021-08-16 2021-12-21 胜宏科技(惠州)股份有限公司 Multi-channel Hipot test machine capable of monitoring single PCS (personal communications system) failure

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CN202285039U (en) * 2011-11-03 2012-06-27 北大方正集团有限公司 Withstand voltage test device for printed circuit board
CN204065332U (en) * 2014-07-10 2014-12-31 浙江通达磁业有限公司 A kind of pressure resistant test tool
CN204596754U (en) * 2015-03-27 2015-08-26 海南汉能薄膜太阳能有限公司 A kind of photovoltaic power test and withstand voltage Insulation test board combination unit
CN205539328U (en) * 2016-01-25 2016-08-31 竞陆电子(昆山)有限公司 Printed circuit board withstand voltage test device

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CN102466787A (en) * 2010-11-18 2012-05-23 亚旭电脑股份有限公司 Light emitting diode array detection jig
CN202285039U (en) * 2011-11-03 2012-06-27 北大方正集团有限公司 Withstand voltage test device for printed circuit board
CN204065332U (en) * 2014-07-10 2014-12-31 浙江通达磁业有限公司 A kind of pressure resistant test tool
CN204596754U (en) * 2015-03-27 2015-08-26 海南汉能薄膜太阳能有限公司 A kind of photovoltaic power test and withstand voltage Insulation test board combination unit
CN205539328U (en) * 2016-01-25 2016-08-31 竞陆电子(昆山)有限公司 Printed circuit board withstand voltage test device

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105974300A (en) * 2016-06-14 2016-09-28 浪潮电子信息产业股份有限公司 Testing method for realizing ICT test coverage rate increase through adding relay board
CN107390098A (en) * 2017-07-27 2017-11-24 深圳崇达多层线路板有限公司 A kind of high pressure resistant test device of PCB and method of testing
CN107478968A (en) * 2017-08-07 2017-12-15 纳恩博(天津)科技有限公司 detecting tool
CN107884701A (en) * 2017-10-12 2018-04-06 中车青岛四方机车车辆股份有限公司 A kind of experimental provision and experimental method of circuit board tolerance overvoltage damage
CN107884701B (en) * 2017-10-12 2020-06-16 中车青岛四方机车车辆股份有限公司 Experimental device and experimental method for circuit board to withstand overvoltage damage
CN107831427A (en) * 2017-11-09 2018-03-23 伟创力电子技术(苏州)有限公司 A kind of automatic high pressure test system
CN110548687A (en) * 2019-09-06 2019-12-10 东莞市冠佳电子设备有限公司 Full-automatic electronic component test equipment
CN113820585A (en) * 2021-08-16 2021-12-21 胜宏科技(惠州)股份有限公司 Multi-channel Hipot test machine capable of monitoring single PCS (personal communications system) failure
CN113820585B (en) * 2021-08-16 2024-03-08 胜宏科技(惠州)股份有限公司 Multi-channel Hipot tester capable of detecting single PCS failure

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