CN105548733B - The test method and device of noise - Google Patents
The test method and device of noise Download PDFInfo
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- CN105548733B CN105548733B CN201510884190.2A CN201510884190A CN105548733B CN 105548733 B CN105548733 B CN 105548733B CN 201510884190 A CN201510884190 A CN 201510884190A CN 105548733 B CN105548733 B CN 105548733B
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- noise
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
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- General Physics & Mathematics (AREA)
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Abstract
The present invention provides a kind of test method and device of noise, and the test method of the noise includes：When in talking state, pass through the capacitor noise on the mainboard of secondary microphone acquisition terminal；Wherein the secondary microphone has a sound hole, and the sound hole of the secondary microphone is in sealing state；Obtain the level of noise of the capacitor noise.The test method and device of the noise of the present invention, in communication process, sealing state is in by the sound hole of secondary microphone；The capacitor noise on mainboard is gathered by secondary microphone again；And obtain the level of noise of the capacitor noise；It is achieved thereby that the automatic test to terminal noise, improves testing efficiency.
Description
Technical field
The present invention relates to field of terminal, more particularly to the test method and device of a kind of noise.
Background technology
With the development of becoming increasingly popular for terminal, particularly smart mobile phone, requirement of the user to smart mobile phone is higher and higher,
Concern especially is compared to the noise of mobile phone.
If a mobile phone noise is very big, bad experience is necessarily brought to consumer.Therefore, in mobile phone development process
In, the control of noise is particularly important.But in the process of development, the capacitor noise on mainboard is more in quiet ring by people
Survey is listened under border, while also there are problems that device uniformity and the individual difference judged the sensitivity of noise, therefore is being confirmed
It needs largely to listen test sample sheet during the degree of mainboard capacitor noise, very big inconvenience is brought to test noise, so as to reduce test effect
Rate.
The content of the invention
The embodiment of the present invention provides a kind of test method and device of noise, to solve the capacitance on the mainboard of existing terminal
The technical issues of noise testing mode, testing efficiency is low.
To solve the above problems, technical solution provided by the invention is as follows：
The embodiment of the present invention provides a kind of test method of noise, including：
When in talking state, pass through the capacitor noise on the mainboard of secondary microphone acquisition terminal；Wherein described secondary wheat
Gram wind has a sound hole, and the sound hole of the secondary microphone is in sealing state；
Obtain the level of noise of the capacitor noise.
The embodiment of the present invention also provides a kind of test device of noise, including：
Acquisition module, for when in talking state, passing through the capacitor noise on the mainboard of secondary microphone acquisition terminal；
Wherein described secondary microphone has a sound hole, and the sound hole of the secondary microphone is in sealing state；
Acquisition module, for obtaining the level of noise of the capacitor noise.
Compared to the prior art, the test method and device of noise of the invention, in communication process, by secondary microphone
Sound hole is in sealing state；The capacitor noise on mainboard is gathered by secondary microphone again；And obtain the noise of the capacitor noise
Value；It is achieved thereby that the automatic test to terminal noise, improves testing efficiency.
Description of the drawings
Fig. 1 is the flow chart of the test method for the noise that the embodiment of the present invention one provides；
Fig. 2 is the flow chart of the test method of noise provided by Embodiment 2 of the present invention；
Fig. 3 is the structure diagram of the test device for the noise that the embodiment of the present invention three provides.
Specific embodiment
Below in conjunction with the attached drawing in the embodiment of the present invention, the technical solution in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, the every other implementation that those skilled in the art are obtained without creative efforts
Example, belongs to the scope of protection of the invention.
Fig. 1 is refer to, Fig. 1 is the flow chart of the test method for the noise that the embodiment of the present invention one provides.
The test method of the noise of this preferred embodiment, including：
Step S101 when in talking state, passes through the capacitor noise on the mainboard of secondary microphone acquisition terminal；
Wherein terminal has a main microphon and a secondary microphone, which has a sound hole, specifically, at end
Before holding acquisition noise, the sound hole of the secondary microphone is in sealing state；Such as the display reminding information before acquisition, it reminds
User seals the sound hole of secondary microphone.The terminal is the equipment such as mobile phone, tablet computer.
Step S102 obtains the level of noise of the capacitor noise；
Such as terminal obtains the noise figure of the capacitor noise collected；The decibel value of noise can be obtained by test software.
Specifically, the step of level of noise of the acquisition capacitor noise may include：
Obtain the average value of the capacitor noise in preset time period.
For example, terminal obtains multiple decibel values of the capacitor noise in 5 seconds；Calculate the average value of the plurality of decibel value.
The sound hole of secondary microphone in communication process, is in sealing state by the test method of the noise of the present embodiment；
The capacitor noise on mainboard is gathered by secondary microphone again；And obtain the level of noise of the capacitor noise；It is achieved thereby that terminal
The automatic test of noise, improves testing efficiency.
Fig. 2 is refer to, Fig. 2 is the flow chart of the test method of noise provided by Embodiment 2 of the present invention.
The test method of the noise of this preferred embodiment, including：
Step S201, display reminding information；
Such as the prompt message is used to that user to be prompted to seal the sound hole of the secondary microphone, specifically, opens terminal
After noise testing software, terminal shows a prompting frame；Such as whether display content is " having sealed sound hole "；
Step S202 receives the selection instruction that user is inputted by the prompt message；
For example, if user seals sound hole, in the prompt message, selection is or no user；If with
Family selects "Yes", then performs step S203；If user selects "No"；It does not deal with then；
Step S203 is instructed according to the selection and is opened the secondary microphone.
Such as terminal is receiving the confirmation of user after sealed orders, opens secondary microphone.
Step S204 when in talking state, passes through the capacitor noise on the mainboard of secondary microphone acquisition terminal；
Such as in communication process, the capacitor noise on secondary microphone acquisition mainboard；Wherein the secondary microphone has one
Sound hole, before acquisition noise, the sound hole of the secondary microphone is in sealing state；To prevent secondary microphone from collecting outside
Sound, so as to test interfere.
The capacitor noise of preset duration can also be gathered by secondary microphone.Specifically, which can root
It is set according to empirical value；Such as the capacitor noise of acquisition 5 seconds.
Step S205 obtains the level of noise of the capacitor noise.
Such as terminal obtains the noise figure of the capacitor noise collected；Specifically, can noise be obtained by test software
Decibel value.
Specifically, the step of level of noise of the acquisition capacitor noise may include：
Obtain the average value of the capacitor noise in preset time period.
For example, terminal obtains multiple decibel values of the capacitor noise in 5 seconds；Calculate the average value of the plurality of decibel value.
Step S206, judges whether the level of noise is more than pre-set threshold value；
For example, terminal judges whether the level of noise is more than pre-set threshold value, to determine whether the terminal is qualified；The pre-set threshold value
Specifically acquisition modes can be：Test equipment is connected into mobile phone in advance, adjusts the transmission power of test equipment to adjust noise figure,
When most people listens survey to think noise qualification, noise figure at this time is recorded, is integrated into the noise testing software and makees
For pre-set threshold value.
Preferably, if the average value of the capacitor noise obtained；Then judge whether the average value is more than pre-set threshold value.Such as
Fruit is then to perform step S207；Otherwise, step S208 is performed.
Step S207, if it is decided that the level of noise is more than the pre-set threshold value, it is determined that the terminal is unqualified；
For example, terminal judges whether the average value is more than pre-set threshold value；If it is determined that the average value is more than the pre-set threshold value,
Then judge that the terminal is unqualified；
Step S208, if it is decided that the level of noise is less than or equal to the pre-set threshold value, it is determined that the terminal is qualified.
Such as, if it is decided that the average value is less than or equal to the pre-set threshold value, then judges terminal qualification.It certainly can be with
The judging result and noise figure are displayed on the screen.
The test method of the noise of the present embodiment, leads in communication process, and the sound hole of secondary microphone is in seal shape
State；The capacitor noise on mainboard is gathered by secondary microphone again；And obtain the level of noise of the capacitor noise；And according to the level of noise
Judge whether terminal is qualified；The automatic test to terminal noise is realized, improves testing efficiency.
The test method of above-mentioned noise is described in detail below in conjunction with specific embodiment：
Such as when test man clicks on the Application testing mainboard noise, terminal active call public telephone is simultaneously established logical
Words connection, the prompt message of the sound hole of the secondary microphone of display reminding sealing afterwards, after user confirms sealing, click determines to press
Otherwise button rests on the interface；
After terminal receives determine instruction, open secondary microphone and be acquired the noise of mainboard, while test is called to lead
The audio frequency parameter of plate noise；To obtain noise figure；By obtained level of noise compared with default level of noise, if the level of noise
More than default level of noise, then current level of noise and test result are shown, that is, show " unqualified "；If the level of noise is less than or waits
In default level of noise, then show the current level of noise of display and test result, that is, show " qualification ".
Wherein the default noise figure can obtain in the following manner：Mobile phone is connected with test equipment, by adjusting test
The transmission power of instrument adjusts noise figure, when most users listen survey to think qualification, noise figure at this time is recorded,
It is integrated into software as default noise figure.
Fig. 3 is refer to, Fig. 3 is the structure diagram of the test device for the noise that the embodiment of the present invention three provides.This is preferably
The test device 30 of the noise of embodiment includes：Display module 31, receiving module 32, opening module 33, acquisition module 34, acquisition
Module 35, judgment module 36；
The display module 31, for before the capacitor noise on the mainboard by secondary microphone acquisition terminal, display to carry
Show information, which is used to that user to be prompted to seal the sound hole of the secondary microphone；
The receiving module 32, for receiving the selection instruction that user is inputted by the prompt message；
The opening module 33 opens the secondary microphone for being instructed according to the selection.
The acquisition module 34, for when in talking state, passing through the capacitance on the mainboard of secondary microphone acquisition terminal
Noise；Wherein the secondary microphone has a sound hole, and the sound hole of the secondary microphone is in sealing state；
The acquisition module 35, for obtaining the level of noise of the capacitor noise.
The acquisition module 34 is specifically used for：The capacitor noise of preset duration is gathered by secondary microphone.
The acquisition module 35 is specifically used for：Obtain average value of the capacitor noise in preset time period.
The judgment module 36, is used for：
Judge whether the level of noise is more than pre-set threshold value, to determine whether the terminal is qualified；
If it is determined that the level of noise is more than the pre-set threshold value, it is determined that the terminal is unqualified；
If it is determined that the level of noise is less than or equal to the pre-set threshold value, it is determined that the terminal is qualified.The level of noise is average
Value.
The test device of the noise of the present embodiment, leads in communication process, and the sound hole of secondary microphone is in seal shape
State；The capacitor noise on mainboard is gathered by secondary microphone again；And obtain the level of noise of the capacitor noise；And according to the level of noise
Judge whether terminal is qualified；The automatic test to terminal noise is realized, improves testing efficiency.
The test method and device of a kind of noise provided above the embodiment of the present invention are described in detail, herein
In apply specific case the principle of the present invention and embodiment be set forth, the explanation of above example is only intended to sides
Assistant solves the method and its core concept of the present invention；Meanwhile for those skilled in the art, thought according to the invention,
There will be changes in specific embodiment and application range are to sum up somebody's turn to do, and this specification content should not be construed as to the present invention
Limitation.
Claims (8)
1. a kind of test method of noise, applied in terminal, which is characterized in that the terminal has mainboard, a main microphon
With a secondary microphone, the secondary microphone has a sound hole, and the test method of the noise includes：
Display reminding information, the prompt message prompting user seal the sound hole of the secondary microphone；
Receive the selection instruction that user is inputted by the prompt message；
The secondary microphone is opened according to the selection instruction；
When the sound hole that the terminal is in talking state and the secondary microphone is in sealing state, pass through the secondary wheat
Capacitor noise gram described in elegance collection on mainboard；
Obtain the level of noise of the capacitor noise.
2. the test method of noise according to claim 1, which is characterized in that described that institute is gathered by the secondary microphone
The step of stating the capacitor noise on mainboard includes：
The capacitor noise of preset duration is gathered by the secondary microphone.
3. the test method of noise according to claim 1, which is characterized in that
The step of level of noise of the acquisition capacitor noise, includes：
Obtain average value of the capacitor noise in preset time period.
4. the test method of noise according to claim 1, which is characterized in that the method further includes：
Judge whether the level of noise is more than pre-set threshold value, to determine whether the terminal is qualified；
If it is determined that the level of noise is more than the pre-set threshold value, it is determined that the terminal is unqualified；
If it is determined that the level of noise is less than or equal to the pre-set threshold value, it is determined that the terminal is qualified.
5. a kind of test device of noise, applied in terminal, which is characterized in that the terminal has mainboard, a main microphon
With a secondary microphone, the test device of the noise includes：
Display module, for before the capacitor noise on the mainboard by secondary microphone acquisition terminal, display reminding information, institute
Prompt message prompting user is stated to seal the sound hole of the secondary microphone；
Receiving module, for receiving the selection instruction that user is inputted by the prompt message；
Opening module, for opening the secondary microphone according to the selection instruction；
Acquisition module, for when the sound hole in talking state and the secondary microphone is in sealing state, by described
Secondary microphone gathers the capacitor noise on the mainboard；
Acquisition module, for obtaining the level of noise of the capacitor noise.
6. the test device of noise according to claim 5, which is characterized in that the acquisition module is specifically used for：
The capacitor noise of preset duration is gathered by secondary microphone.
7. the test device of noise according to claim 5, which is characterized in that the acquisition module is specifically used for：
Obtain average value of the capacitor noise in preset time period.
8. the test device of noise according to claim 5, which is characterized in that further include：Judgment module；
The judgment module, is used for：
Judge whether the level of noise is more than pre-set threshold value, to determine whether the terminal is qualified；
If it is determined that the level of noise is more than the pre-set threshold value, it is determined that the terminal is unqualified；
If it is determined that the level of noise is less than or equal to the pre-set threshold value, it is determined that the terminal is qualified.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510884190.2A CN105548733B (en) | 2015-12-03 | 2015-12-03 | The test method and device of noise |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510884190.2A CN105548733B (en) | 2015-12-03 | 2015-12-03 | The test method and device of noise |
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| Publication Number | Publication Date |
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| CN105548733A CN105548733A (en) | 2016-05-04 |
| CN105548733B true CN105548733B (en) | 2018-05-29 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510884190.2A Active CN105548733B (en) | 2015-12-03 | 2015-12-03 | The test method and device of noise |
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Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109459132B (en) * | 2018-12-18 | 2023-07-25 | 江西众安职业危害评价检测有限公司 | Noise testing device for factory building |
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|---|---|---|---|---|
| CN101358875A (en) * | 2008-09-25 | 2009-02-04 | 国网武汉高压研究院 | Method for measuring capacitor noise by multi-frequency power implantation and apparatus thereof |
| CN201682531U (en) * | 2010-04-12 | 2010-12-22 | 上海华勤通讯技术有限公司 | Mobile phone capable of detecting environmental noise |
| CN102469387A (en) * | 2010-11-15 | 2012-05-23 | 财团法人工业技术研究院 | System and method for suppressing noises |
| CN102841268A (en) * | 2012-07-20 | 2012-12-26 | 敦泰科技有限公司 | Method and system for detecting noises of capacitive screen |
| CN104244162A (en) * | 2014-10-11 | 2014-12-24 | 广东欧珀移动通信有限公司 | Noise detecting method and device of loudspeaker |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7031886B1 (en) * | 2004-12-14 | 2006-04-18 | Synaptics Incorporated | Methods and systems for detecting noise in a position sensor using minor shifts in sensing frequency |
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2015
- 2015-12-03 CN CN201510884190.2A patent/CN105548733B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101358875A (en) * | 2008-09-25 | 2009-02-04 | 国网武汉高压研究院 | Method for measuring capacitor noise by multi-frequency power implantation and apparatus thereof |
| CN201682531U (en) * | 2010-04-12 | 2010-12-22 | 上海华勤通讯技术有限公司 | Mobile phone capable of detecting environmental noise |
| CN102469387A (en) * | 2010-11-15 | 2012-05-23 | 财团法人工业技术研究院 | System and method for suppressing noises |
| CN102841268A (en) * | 2012-07-20 | 2012-12-26 | 敦泰科技有限公司 | Method and system for detecting noises of capacitive screen |
| CN104244162A (en) * | 2014-10-11 | 2014-12-24 | 广东欧珀移动通信有限公司 | Noise detecting method and device of loudspeaker |
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| CN105548733A (en) | 2016-05-04 |
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Address after: Changan town in Guangdong province Dongguan 523860 usha Beach Road No. 18 Patentee after: OPPO Guangdong Mobile Communications Co., Ltd. Address before: Changan town in Guangdong province Dongguan 523860 usha Beach Road No. 18 Patentee before: Guangdong Opel Mobile Communications Co., Ltd. |