CN105450318A - AGC calibration method and apparatus - Google Patents
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- CN105450318A CN105450318A CN201410438509.4A CN201410438509A CN105450318A CN 105450318 A CN105450318 A CN 105450318A CN 201410438509 A CN201410438509 A CN 201410438509A CN 105450318 A CN105450318 A CN 105450318A
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Abstract
An AGC calibration method and apparatus are used for calibrating a downstream radio frequency link gain of an LTE terminal. The method comprises the steps of obtaining a first gain value corresponding to a gain control word obtained by the LTE terminal at a first frequency point and under a first test signal; obtaining a first compensation value associated to a gain value of the LTE terminal at a second frequency point; obtaining a second compensation value associated to a gain value corresponding to a fixed control word obtained by the LTE terminal at the first frequency point and under a second test signal; and obtaining an actual gain value of the LTE terminal based on the first gain value, the first compensation value and the second compensation value. The method combines the gain value of a center channel in a frequency band, the first compensation value for compensating other channels and the second compensation value for compensating the signal loss of a radio frequency filter, the gain value of the downstream radio frequency link of the LTE terminal is accurately obtained, and the accuracy of the calibration is improved.
Description
Technical field
The present invention relates to communication technical field, particularly relate to a kind of for LTE (LongTermEvolutionsystem, Long Term Evolution) the downlink radio frequency link gain of terminal carries out AGC (AutomaticGainControl, the automatic growth control) calibration steps calibrated and device.
Background technology
LTE system is the wide-band communication system with high-speed data service proposed by 3GPP (The3rdGenerationPartnershipProject, third generation partner program), is at present by the wireless communication technology extensively approved.
3GPP gives the frequency spectrum planning proposal of LTE system, the bandwidth of operation of LTE system can be 1.4MHz, 3MHz, 5MHz, 10MHz, 15MHz and 20MHz, the channel grid of LTE system is 100kHz, and namely the real work frequency of LTE terminal needs the integral multiple for 100kHz.In the production process of LTE terminal, needing the AGC calibration process performing terminal equipment, for controlling the power of the Received signal strength of LTE terminal, preventing the saturated of the Received signal strength of LTE terminal, reduce the quantizing noise in each signal processing, thus improve the signal to noise ratio in receiver.
Usually computer, test instrumentation and LTE terminal etc. are needed in AGC calibration process, test instrumentation can be controlled by computer and specify CW (ContinueWave frequency exporting specified power, continuous wave) signal, LTE terminal according to now by the signal power value accessed by baseband chip, can calculate yield value.Described LTE terminal can according to the yield value of the signal strength signal intensity received and correspondence, to the RSRP (ReferenceSignalReceivingPower of base station downlink signal, Reference Signal Received Power) report, the purposes such as line loss are judged for base station.
But because LTE signal bandwidth is larger, when described LTE terminal works under broadband signal, radio-frequency performance is also uneven, the unevenness of the radio-frequency performance in the whole frequency range that the front end filter in described LTE terminal and other devices may cause, the loss etc. of the filtering signal that the baseband filter etc. in the receiver of LTE terminal also may cause, above-mentioned phenomenon easily results through the yield value that AGC calibrates the LTE terminal obtained and is inaccurate.And AGC calibration steps adopts the gain of CW signal to different frequent points to scan usually in prior art, the gain measurement of different frequent points is obtained by the signal power that the CW signal of single frequency specified power of specifying obtains usually.Said method is when LTE signal broadband is larger, due to the unevenness with interior radio-frequency performance, and the limitation etc. of the metering system of appointment CW signal, be difficult to the yield value of Obtaining Accurate to the downlink radio frequency link of LTE terminal, the calibration of the downlink radio frequency link gain of LTE terminal is inaccurate.
Summary of the invention
The problem that the present invention solves is the problem being difficult to accurately calibrate the gain of the downlink radio frequency link of LTE terminal.
For solving the problem, technical solution of the present invention provides a kind of AGC calibration steps, for calibrating the downlink radio frequency link gain of LTE terminal.Described method comprises:
Obtain the first yield value, described first yield value is for described LTE terminal is at the first frequency and the yield value of the corresponding gain control word obtained under the first test signal, and described first frequency is the center frequency point of frequency band;
Obtain the first offset, described first offset is associated with the yield value of described LTE terminal at the second frequency, and described second frequency is the frequency in described LTE terminal bandwidth range;
Obtain the second offset, described second offset is associated with described LTE terminal at described first frequency and the correspondence obtained under the second test signal fixes the yield value of control word, and described fixing control word is corresponding with gain mode;
The actual gain value of described LTE terminal is obtained according to described first yield value, the first offset and the second offset.
Optionally, the difference of the frequency of described first test signal and described first frequency is within the first scope, and described first scope is associated with the frequency range of the baseband filter of described LTE terminal.
Optionally, the yield value that the yield value of described second frequency fixes control word according to described LTE terminal in the correspondence that the second frequency obtains is determined.
Optionally, the process of described acquisition first offset comprises:
Obtain gain value sets, described gain value sets to fix the yield value of control word for described LTE terminal in the correspondence that in described frequency band, other each frequency place obtains except described first frequency;
Determine that described LTE terminal is the yield value in the fixing control word of the second frequency place correspondence in described gain value sets at the yield value at the second frequency place;
The average of the yield value described LTE terminal obtained at each second frequency place is defined as first offset of described LTE terminal in working frequency points with corresponding difference of fixing the first yield value of control word.
Optionally, the frequency interval between the adjacent frequency in described frequency band is first threshold.
Optionally, the frequency of described second test signal and frequency sequence one_to_one corresponding, in the bandwidth range that described frequency sequence is included in the LTE terminal centered by described first frequency from described first frequency by each frequency that stepping threshold value obtains.
Optionally, the process of described acquisition second offset comprises:
Obtain described LTE terminal at described first frequency and the correspondence obtained under each second test signal fixes the yield value of control word;
Obtain the pad value of corresponding second test signal, the pad value of described corresponding second test signal for described LTE terminal is at described first frequency place and the correspondence obtained under the second test signal fixes the yield value of control word and the difference of the error amount of corresponding described second test signal, the first offset of the working frequency points of the described LTE terminal that the frequency that the working frequency points that the error amount of described second test signal of described correspondence is described LTE terminal is described second test signal and corresponding described fixing control word obtain;
Average and the difference of the first yield value of corresponding described fixing control word of the pad value of the described fixing control word of correspondence described LTE terminal obtained under each second test signal are defined as the second offset of corresponding described fixing control word.
Optionally, the process of described acquisition second offset also comprises:
The second offset of corresponding gain control word is obtained according to the second offset of the described fixing control word of described correspondence.
Optionally, the process of the actual gain value of the described LTE terminal of described acquisition comprises:
By formula: Gain=Centergain+Channeldelta+Filterdelta determines the actual gain value Gain of described LTE terminal, wherein, first yield value of Centergain corresponding to described LTE terminal gain control word; Channeldelta is first offset of described LTE terminal in working frequency points, second offset of Filterdelta corresponding to described LTE terminal gain control word.
Optionally, described first test signal and the second test signal are CW signal.
For solving the problem, technical solution of the present invention also provides a kind of AGC calibrating installation, for calibrating the downlink radio frequency link gain of LTE terminal.Described device comprises:
First yield value acquiring unit, for obtaining the first yield value, described first yield value is for described LTE terminal is at the first frequency and the yield value of the corresponding gain control word obtained under the first test signal, and described first frequency is the center frequency point of frequency band;
First offset acquiring unit, for obtaining the first offset, described first offset is associated with the yield value of described LTE terminal at the second frequency, and described second frequency is the frequency in described LTE terminal bandwidth range;
Second offset acquiring unit, for obtaining the second offset, described second offset is associated with described LTE terminal at described first frequency and the correspondence obtained under the second test signal fixes the yield value of control word, and described fixing control word is corresponding with gain mode;
Yield value acquiring unit, for obtaining the actual gain value of described LTE terminal according to described first yield value, the first offset and the second offset.
Compared with prior art, technical scheme of the present invention has the following advantages:
First obtain the yield value of LTE terminal corresponding each gain control word at the center frequency point place of frequency band, namely first obtain the yield value corresponding to each gain control word of central channel of described frequency band; And then can other channel in frequency band be compensated, namely the first offset is obtained, described first offset is associated with the yield value of described LTE terminal at the second frequency, and described second frequency is the frequency in described LTE terminal bandwidth range except the working frequency points of described LTE terminal; Consider that the effect of the various radio-frequency filters in LTE terminal is on the impact of the actual gain value of LTE terminal, so also need acquisition second offset, described second offset is associated with described LTE terminal at described first frequency and the correspondence obtained under the second test signal fixes the yield value of control word; The last actual gain value obtaining described LTE terminal according to described first yield value, the first offset and the second offset.The method is in the process of actual gain value obtaining LTE terminal, in conjunction with the second offset that the yield value at the central channel place in frequency band, the first offset compensated other channel and the loss of radio frequency filter signal compensate, can Obtaining Accurate to the yield value of the downlink radio frequency link of LTE terminal, effectively improve the accuracy of the gain calibration of LTE terminal downlink radio frequency link.
Further, the first test signal and the second test signal can adopt CW signal, carry out the method for calibrating compared to adopting LTE signal in prior art, effectively can save the cost overhead of the instrument sent test massage, and reduce calibration cost.
Accompanying drawing explanation
Fig. 1 is the schematic flow sheet of the AGC calibration steps that technical solution of the present invention provides;
Fig. 2 is the schematic flow sheet of acquisition first yield value that the embodiment of the present invention provides;
Fig. 3 is the schematic flow sheet of acquisition first offset that the embodiment of the present invention provides;
Fig. 4 is the schematic flow sheet of acquisition second offset that the embodiment of the present invention provides;
Fig. 5 is the structural representation of the AGC calibrating installation that the embodiment of the present invention provides.
Embodiment
Because LTE signal bandwidth is larger, when described LTE terminal works under broadband signal, radio-frequency performance is also uneven, due to the impact etc. of channel effect, radio-frequency filter in LTE bandwidth, adopt prior art to be difficult to the yield value of Obtaining Accurate to the downlink radio frequency link of LTE terminal, the calibration of the downlink radio frequency link gain of LTE terminal is inaccurate.
For solving the problem, technical solution of the present invention provides a kind of AGC calibration steps, for calibrating the downlink radio frequency link gain of LTE terminal.
Fig. 1 is the schematic flow sheet of the AGC calibration steps that technical solution of the present invention provides.
Step S1, obtains the first yield value, and described first yield value is for LTE terminal is at the first frequency and the yield value of the corresponding gain control word obtained under the first test signal.
In present specification, described first frequency is the center frequency point of frequency band, and such as, when frequency band is Band38, described first frequency is the center frequency point of frequency band Band38, and the channel of described center frequency point is called central channel.Described first test signal is the CW signal provided for LTE terminal by test instrumentation (as radio-frequency signal source).
In step sl, the frequency of configuration LTE terminal is described first frequency, and the frequency range of baseband filter according to LTE terminal, the power of the first test signal that described test instrumentation sends is arranged, such as, by configuring described first test signal, make the difference of the frequency of the frequency of described first test signal and described first frequency be within the first scope, described first scope can be determined accordingly according to the frequency range of baseband filter.
After the frequency of LTE terminal and the first test signal are configured, can gain control word in corresponding A GC gain table, concrete yield value accessed under obtaining each gain control word, in present specification, by LTE terminal at the first frequency and the yield value that test signal is the LTE terminal under described first test signal accessed by gain control word is called should the first yield value, described first yield value and the gain control word one_to_one corresponding of gain control word.
Step S2, obtains the first offset, and described first offset is associated with the yield value of described LTE terminal at the second frequency.
In frequency band except the central channel corresponding to above-mentioned first frequency, also there are other channels multiple, and the radio-frequency performance of each channel may be all different, realize the compensation to other channels outside central channel by described first offset.
The yield value that described first offset can obtain at the second frequency according to LTE terminal is determined, described second frequency is the frequency in described LTE terminal bandwidth range.Such as, when the bandwidth of described LTE terminal is 20MHz (megahertz), described second frequency is the frequency in the bandwidth of operation 20MHz of described LTE terminal, containing multiple frequency in the bandwidth of operation of usual LTE terminal, namely in the bandwidth of operation of LTE terminal, there is multiple second frequency.
In step s 2, the yield value got at each second frequency place according to LTE terminal obtains described first offset, in each working frequency points of LTE terminal, correspondingly can obtain corresponding first offset.Such as, the average of yield value that LTE terminal can be got at each second frequency place and first offset of the difference of the first yield value of the corresponding gain control word obtained in step sl as the working frequency points of corresponding current LTE terminal.Described corresponding gain control word refers to that the gain control word of each LTE terminal at each second frequency is corresponding with the gain control word corresponding to described first yield value.
Step S3, obtains the second offset, and described second offset is associated with described LTE terminal at described first frequency and the correspondence obtained under the second test signal fixes the yield value of control word.
Consider that the parameter of baseband filter under different gains pattern is different, so determine accordingly according to gain mode the compensation of baseband filter in step s3, namely compensate accordingly for each gain mode, obtain the second offset.
According to different gain modes, can set corresponding gain control word respectively, in present specification, the gain control word of corresponding gain mode is called fixing control word, each gain mode corresponding has a corresponding gain control word corresponding with it.In present specification, described gain mode mainly refers to gain mode baseband filter characteristic being had to comparatively obviously impact.
According to the frequency of the frequency determination test signal in the bandwidth of LTE terminal, determine that the test signal of the second offset is called the second test signal at this by being used for.
The frequency of configuration LTE terminal is described first frequency, the i.e. center frequency point of frequency band, and obtains frequency sequence according to the bandwidth range of LTE terminal, and described frequency sequence is each frequency in the bandwidth range of described LTE terminal.Configure the frequency of the second test signal and described frequency sequence one_to_one corresponding, the frequency namely in every corresponding LTE broadband range, determines second test signal accordingly.
The yield value of LTE terminal under fixing each second test signal corresponding to control word of acquisition, and then obtain described second offset according to described yield value.
It should be noted that, the yield value of LTE terminal under this adopts the second test signal obtained corresponding to fixing control word, when concrete enforcement, also the yield value of LTE terminal under corresponding second test signal can be obtained to each gain control word, but operand in acquisition process can be caused so comparatively large, acquisition process more complicated.
Step S4, obtains the actual gain value of described LTE terminal according to described first yield value, the first offset and the second offset.
At the real work frequency place of LTE terminal, the first corresponding yield value, the first offset and the second offset can be obtained according to the current gain control word of LTE terminal, obtain the actual gain value of LTE terminal according to the linear combination of described first yield value, the first offset and the second offset.
The method is in the process of actual gain value obtaining LTE terminal, in conjunction with the second offset that the yield value at the central channel place in frequency band, the first offset compensated other channel and the loss of radio frequency filter signal compensate, can Obtaining Accurate to the yield value of the downlink radio frequency link of LTE terminal, effectively improve the accuracy of the gain calibration of LTE terminal downlink radio frequency link.
For enabling above-mentioned purpose of the present invention, feature and advantage more become apparent, and are described in detail specific embodiments of the invention below in conjunction with accompanying drawing.
In the present embodiment, the process of acquisition first yield value, the first offset and the second offset is elaborated.
First the process obtaining the first yield value of corresponding each gain control word is described.Fig. 2 is the schematic flow sheet of acquisition first yield value that the present embodiment provides.
Perform step S201, obtain the first frequency, described first frequency is configured to the working frequency points of LTE terminal.
Choose center frequency point in the frequency band of LTE terminal place as the first frequency, the working frequency points of configuration LTE terminal is described first frequency.
Perform step S202, the frequency of frequency range to the first test signal according to baseband filter is configured.
The frequency of the first test signal can set accordingly according to the frequency range of baseband filter, particularly, difference between the frequency of the frequency of described first test signal and the real work frequency of LTE terminal should be within the first default scope, and described first scope can be determined accordingly in conjunction with the frequency range of the baseband filter of LTE terminal.
Such as, when the frequency range of the baseband filter of LTE terminal is 5MHz, frequency deviation between the frequency of described first test signal and the working frequency points (described first frequency) of LTE terminal can at [100kHz, 2MHz] scope within, particularly, in the present embodiment, the frequency configuring the first test signal is the CW signal with the first frequency frequency deviation 1MHz.
Perform step S203, obtain the first yield value of LTE terminal corresponding each gain control word at the first frequency and under the first test signal.
Obtain LTE terminal at the first frequency and under the first test signal time, the yield value under each gain control word, using first yield value of the yield value of corresponding gain control word as each gain control word of correspondence.First yield value of each for correspondence gain control word can be stored in nonvolatile random access memory (NVRAM, Non-VolatileRandomAccessMemory) in, so that can obtain in real time, rapidly in the process of calibrating the yield value of LTE terminal.In the present embodiment, data are stored with NVRAM, in other embodiments, also can be stored in other memories.
The first yield value of corresponding each gain control word can be obtained by step S201 to step S203.
Fig. 3 is the schematic flow sheet of acquisition first offset that the present embodiment provides.
Perform step S301, obtain gain value sets, described gain value sets to fix the yield value of control word for LTE terminal in the correspondence that in frequency band, other each frequency place obtains except the first frequency.
In the present embodiment, described LTE terminal fixes control word yield value in the correspondence that in frequency band, other each frequency place obtains except the first frequency can be obtained in advance, be called gain value sets.
Consider that the impact of the radio-frequency performance for LTE terminal of the front-end devices such as low noise amplifier under identical gain mode meets linear characteristic, so the yield value of corresponding fixing control word also can be obtained under each gain mode, other gain control word then under this gain mode all can adopt the yield value accessed by described fixing control word, effectively can simplify the complexity of acquisition process like this.Described fixing control word refers to the gain control word of corresponding gain mode, i.e. each gain mode corresponding, chooses the gain control word of a fixing control word representatively this gain mode.
Each fixing control word corresponding, working frequency points from the initial frequency in frequency band to end frequency to LTE terminal is configured, for each frequency that the frequency interval between the adjacent frequency in frequency band is first threshold, the yield value of corresponding current fixing control word correspondingly can be obtained at each frequency place.Frequency interval between adjacent frequency in described frequency band can carry out suitable adjustment according to resource space, calibration speed and compensation precision etc.Such as in the present embodiment, described first threshold can be set to 500kHz, in frequency band from initial frequency, the frequency every 500kHz carries out gain scan, obtains the yield value of the corresponding current fixing control word in each frequency place.
In the process of above-mentioned acquisition yield value, test signal is stablized constant, is in identical test environment.
Perform step S302, obtain the yield value of described LTE terminal at the second frequency place according to described gain value sets.
Described second frequency is the frequency in LTE terminal bandwidth range, and the yield value that the yield value of described second frequency fixes control word according to described LTE terminal in the correspondence that the second frequency obtains is determined.
First offset is mainly used in compensating other channels in frequency band except central channel, when frequency corresponding to other channel of the working frequency points of LTE terminal, can compensate according to the yield value of the second frequency to LTE terminal working frequency points in LTE terminal bandwidth range.
LTE terminal can obtain at the yield value at each second frequency place from described gain value sets, owing to storing the yield value of the fixing control word of each frequency correspondence in frequency band in gain value sets, then can fixing control word corresponding to the second frequency current gain control word, from described gain value sets, obtain corresponding yield value.Fixing control word corresponding to described second frequency current gain control word refers to the fixing control word corresponding to gain mode belonging to current gain control word.
Perform step S303, obtain the first offset according to described LTE terminal at the yield value of the second frequency.
In the present embodiment, the average of the yield value that described LTE terminal can be obtained at each second frequency place is defined as first offset of described LTE terminal in current working frequency with the difference of the first yield value of corresponding gain control word.
After the yield value getting all second frequencies in LTE terminal bandwidth range, matching can be carried out to the yield value of the second frequency in LTE terminal, such as adopt the mean value simply getting gain-value data, or adopt linear, that nonlinear fitting mode obtains the yield value of all second frequencies in LTE terminal bandwidth range average; And then the difference of obtained average and corresponding current gain pattern being fixed the first yield value of control word is as first offset of LTE terminal in the corresponding current gain pattern of working frequency points.
According to said method, when the working frequency points in LTE is other frequency any outside the first frequency in frequency band range, first offset of LTE terminal in the corresponding current gain pattern of working frequency points all can be got.For all gain control words under same gain mode, described LTE terminal can be thought identical at the first offset of correspondence each gain control word that same frequency obtains, and can compensate thus to the yield value of any channel of LTE terminal.
In addition, in the process of acquisition first offset, the frequency interval between each frequency is first threshold, first offset corresponding according to each frequency place, by the method for interpolation, matching, the first offset corresponding to any frequency be between frequency interval can be got.The first offset corresponding to any frequency can be stored in NVRAM, so that can obtain in real time, rapidly in the process of calibrating the yield value of LTE terminal.
The first offset corresponding to any frequency can be obtained by step S301 to step S303.
Fig. 4 is the schematic flow sheet of acquisition second offset that the present embodiment provides.
Perform step S401, obtain LTE terminal at the first frequency and the correspondence obtained under each second test signal fixes the yield value of control word.
The frequency of described second test signal can set accordingly according to the bandwidth of LTE terminal, such as, when the bandwidth of LTE terminal is 20MHz, the gain control word of configuration LTE terminal is the fixing control word of corresponding current gain pattern, the working frequency points of configuration LTE terminal is the first frequency, the frequency of each frequency of the frequency configuring the second test signal for obtaining by stepping threshold value from-10M within the scope of the 20MHz that puts centered by described first frequency, described stepping threshold value can carry out suitable adjustment according to resource space, calibration speed and compensation precision etc.Such as in the present embodiment, described stepping threshold value can be set to 200kHz, within the scope of the corresponding 20MHz put centered by described first frequency, the frequency values of each frequency, can determine the second test signal of each corresponding frequency, i.e. described second test signal and each frequency one_to_one corresponding accordingly.Described second test signal is the CW signal provided for LTE terminal by test instrumentation (as radio-frequency signal source).
The fixing control word corresponding to each gain mode of corresponding LTE terminal, can get the yield value of LTE terminal at the first frequency and under each second test signal.
Perform step S402, obtain the pad value of corresponding second test signal.
Containing the error caused due to radio-frequency performance unevenness in the yield value of each second test signal of correspondence accessed in step S401, in order to obtain gain calibration value more accurately, so can be deducted by the error amount caused due to radio-frequency performance unevenness in the yield value of each second test signal of correspondence, yield value and the difference of the error amount of corresponding described second test signal of described second test signal of correspondence LTE terminal obtained at the first frequency place are called the pad value of corresponding second test signal.
The frequency that the frequency that the error amount of described second test signal of described correspondence is the working frequency points in described LTE terminal is described second test signal and gain control word identical with described fixing control word time the first offset of the working frequency points of corresponding described LTE terminal of obtaining.
The yield value of described second test signal of correspondence obtained at described first frequency place according to described LTE terminal and the difference of the error amount of corresponding described second test signal, can determine the pad value of corresponding each second test signal.
Perform step S403, the pad value according to described corresponding second test signal obtains the second offset.
In the present embodiment, average and the difference of the first yield value of corresponding described fixing control word of the pad value of the described fixing control word of correspondence that LTE terminal can be obtained under each second test signal are defined as the second offset of corresponding described fixing control word.
Getting the pad value of corresponding each second test signal of LTE terminal, matching can be carried out to all pad value data, such as adopt the mean value simply getting pad value data, or adopt linear, that nonlinear fitting mode obtains the pad value of the gain control word of corresponding gain mode average; And then using obtained average and corresponding second offset of difference as the corresponding fixing control word of LTE terminal fixing the first yield value of control word.
For all gain control words under same gain mode, second offset of the corresponding each gain control word of described LTE terminal can think with to should gain mode the second offset of fixing control word be identical, the second offset corresponding to any gain control word can be obtained thus.The second offset corresponding to any gain control word can be stored in NVRAM, so that can obtain in real time, rapidly in the process of calibrating the yield value of LTE terminal.
The second offset corresponding to any AGC control word can be obtained by step S401 to step S403.
In conjunction with the method for acquisition first yield value, the first offset and the second offset that go out as shown in Figure 2, Figure 3 and Figure 4, in the real work of LTE terminal, can calibrate the yield value of the downlink radio frequency link of LTE terminal.
Particularly, the actual gain value Gain that formula (1) obtains LTE terminal can be passed through.
Gain＝Centergain+Channeldelta+Filterdelta(1)
Wherein, first yield value of Centergain corresponding to the actual AGC control word of described LTE terminal; Channeldelta is first offset of described LTE terminal in working frequency points, second offset of Filterdelta corresponding to described LTE terminal AGC control word.
Such as, in the course of work of LTE terminal, first yield value of the gain control word that can adopt according to current LTE terminal from NVRAM corresponding to quick obtaining to described gain control word, and from described NVRAM, directly obtain the first offset corresponding to described working frequency points according to the real work frequency of LTE terminal, and then from NVRAM, obtain the second offset corresponding to described gain control word according to the gain control word that LTE terminal adopts, the actual gain value Gain of current LTE terminal is obtained by formula (1).
In conjunction with the signal strength signal intensity received by LTE terminal, the RSRP of base station downlink signal can be reported, judges the purposes such as line loss for base station according to the actual gain value of obtained LTE terminal further.
The AGC calibration steps that the present embodiment provides, test signal adopts CW signal, the method of calibrating is carried out compared to adopting LTE signal in prior art, the test instrumentation higher due to LTE signal demand cost just can provide, so the AGC calibration steps that the present embodiment provides can effectively reduce calibration cost.
The AGC calibration steps that the present embodiment provides is in the process of actual gain value obtaining LTE terminal, in conjunction with the first yield value, the first offset and the second offset, can Obtaining Accurate to the yield value of the downlink radio frequency link of LTE terminal, effectively improve the accuracy of the gain calibration of LTE terminal downlink radio frequency link.
Corresponding above-mentioned AGC calibration steps, the embodiment of the present invention also provides a kind of AGC calibrating installation, and described device comprises the first yield value acquiring unit U11, the first offset acquiring unit U12, the second offset acquiring unit U13 and yield value acquiring unit U14.
Described first yield value acquiring unit U11, for obtaining the first yield value, described first yield value is for described LTE terminal is at the first frequency and the yield value of the corresponding gain control word obtained under the first test signal, and described first frequency is the center frequency point of frequency band.
Described first offset acquiring unit U12, for obtaining the first offset, described first offset is associated with the yield value of described LTE terminal at the second frequency, and described second frequency is the frequency in described LTE terminal bandwidth range.
Described first offset acquiring unit U12 comprises the first acquisition subelement U121, determines subelement U122 and the first difference subelement U123.
Described first obtains subelement U121, and for obtaining gain value sets, described gain value sets to fix the yield value of control word for described LTE terminal in the correspondence that in described frequency band, other each frequency place obtains except described first frequency.
Describedly determine subelement U122, for determining that described LTE terminal is the yield value in the fixing control word of the second frequency place correspondence in described gain value sets at the yield value at the second frequency place.
Described first difference subelement U123, the average for the yield value described LTE terminal obtained at each second frequency place is defined as first offset of described LTE terminal in current working frequency with corresponding difference of fixing the first yield value of control word.
Described second offset acquiring unit U13, for obtaining the second offset, described second offset is associated with described LTE terminal at described first frequency and the correspondence obtained under the second test signal fixes the yield value of control word, and described fixing control word is corresponding with gain mode.
Described second offset acquiring unit U13 comprises: second obtains subelement U131, pad value obtains subelement U132 and the second difference subelement U133.
Described second obtains subelement U131, for obtaining described LTE terminal at described first frequency and the correspondence obtained under each second test signal fixes the yield value of control word.
Described pad value obtains subelement U132, for obtaining the pad value of corresponding second test signal, the pad value of described corresponding second test signal for described LTE terminal is at described first frequency place and the correspondence obtained under the second test signal fixes the yield value of control word and the difference of the error amount of corresponding described second test signal, the first offset of the working frequency points of the described LTE terminal that the frequency that the working frequency points that the error amount of described second test signal of described correspondence is described LTE terminal is described second test signal and corresponding described fixing control word obtain.
Described second difference subelement U133, average and the difference of the first yield value of corresponding described fixing control word of the pad value of the described fixing control word of the correspondence for described LTE terminal being obtained under each second test signal are defined as the second offset of corresponding described fixing control word.
Described second offset acquiring unit U13 also comprises: the 3rd obtains subelement U134, for obtaining the second offset of corresponding gain control word according to the second offset of the described fixing control word of described correspondence.
Described yield value acquiring unit U14, for obtaining the actual gain value of described LTE terminal according to described first yield value, the first offset and the second offset.
Although the present invention discloses as above, the present invention is not defined in this.Any those skilled in the art, without departing from the spirit and scope of the present invention, all can make various changes or modifications, and therefore protection scope of the present invention should be as the criterion with claim limited range.
Claims (14)
1. an AGC calibration steps, for calibrating the downlink radio frequency link gain of LTE terminal; It is characterized in that, comprising:
Obtain the first yield value, described first yield value is for described LTE terminal is at the first frequency and the yield value of the corresponding gain control word obtained under the first test signal, and described first frequency is the center frequency point of frequency band;
Obtain the first offset, described first offset is associated with the yield value of described LTE terminal at the second frequency, and described second frequency is the frequency in described LTE terminal bandwidth range;
Obtain the second offset, described second offset is associated with described LTE terminal at described first frequency and the correspondence obtained under the second test signal fixes the yield value of control word, and described fixing control word is corresponding with gain mode;
The actual gain value of described LTE terminal is obtained according to described first yield value, the first offset and the second offset.
2. AGC calibration steps as claimed in claim 1, it is characterized in that, the difference of the frequency of described first test signal and described first frequency is within the first scope, and described first scope is associated with the frequency range of the baseband filter of described LTE terminal.
3. AGC calibration steps as claimed in claim 1, it is characterized in that, the yield value that the yield value of described second frequency fixes control word according to described LTE terminal in the correspondence that the second frequency obtains is determined.
4. AGC calibration steps as claimed in claim 3, it is characterized in that, the process of described acquisition first offset comprises:
Obtain gain value sets, described gain value sets to fix the yield value of control word for described LTE terminal in the correspondence that in described frequency band, other each frequency place obtains except described first frequency;
Determine that described LTE terminal is the yield value in the fixing control word of the second frequency place correspondence in described gain value sets at the yield value at the second frequency place;
The average of the yield value described LTE terminal obtained at each second frequency place is defined as first offset of described LTE terminal in working frequency points with corresponding difference of fixing the first yield value of control word.
5. AGC calibration steps as claimed in claim 1, it is characterized in that, the frequency interval between the adjacent frequency in described frequency band is first threshold.
6. AGC calibration steps as claimed in claim 1, it is characterized in that, the frequency of described second test signal and frequency sequence one_to_one corresponding, in the bandwidth range that described frequency sequence is included in the LTE terminal centered by described first frequency from described first frequency by each frequency that stepping threshold value obtains.
7. AGC calibration steps as claimed in claim 6, it is characterized in that, the process of described acquisition second offset comprises:
Obtain described LTE terminal at described first frequency and the correspondence obtained under each second test signal fixes the yield value of control word;
Obtain the pad value of corresponding second test signal, the pad value of described corresponding second test signal for described LTE terminal is at described first frequency place and the correspondence obtained under the second test signal fixes the yield value of control word and the difference of the error amount of corresponding described second test signal, the first offset of the working frequency points of the described LTE terminal that the frequency that the working frequency points that the error amount of described second test signal of described correspondence is described LTE terminal is described second test signal and corresponding described fixing control word obtain;
Average and the difference of the first yield value of corresponding described fixing control word of the pad value of the described fixing control word of correspondence described LTE terminal obtained under each second test signal are defined as the second offset of corresponding described fixing control word.
8. AGC calibration steps as claimed in claim 7, it is characterized in that, the process of described acquisition second offset also comprises:
The second offset of corresponding gain control word is obtained according to the second offset of the described fixing control word of described correspondence.
9. AGC calibration steps as claimed in claim 1, it is characterized in that, the process of the actual gain value of the described LTE terminal of described acquisition comprises:
By formula: Gain=Centergain+Channeldelta+Filterdelta determines the actual gain value Gain of described LTE terminal, wherein, first yield value of Centergain corresponding to described LTE terminal gain control word; Channeldelta is first offset of described LTE terminal in working frequency points, second offset of Filterdelta corresponding to described LTE terminal gain control word.
10. AGC calibration steps as claimed in claim 1, it is characterized in that, described first test signal and the second test signal are CW signal.
11. 1 kinds of AGC calibrating installations, for calibrating the downlink radio frequency link gain of LTE terminal; It is characterized in that, comprising:
First yield value acquiring unit, for obtaining the first yield value, described first yield value is for described LTE terminal is at the first frequency and the yield value of the corresponding gain control word obtained under the first test signal, and described first frequency is the center frequency point of frequency band;
First offset acquiring unit, for obtaining the first offset, described first offset is associated with the yield value of described LTE terminal at the second frequency, and described second frequency is the frequency in described LTE terminal bandwidth range;
Second offset acquiring unit, for obtaining the second offset, described second offset is associated with described LTE terminal at described first frequency and the correspondence obtained under the second test signal fixes the yield value of control word, and described fixing control word is corresponding with gain mode;
Yield value acquiring unit, for obtaining the actual gain value of described LTE terminal according to described first yield value, the first offset and the second offset.
12. AGC calibrating installations as claimed in claim 11, is characterized in that, described first offset acquiring unit comprises:
First obtains subelement, and for obtaining gain value sets, described gain value sets to fix the yield value of control word for described LTE terminal in the correspondence that in described frequency band, other each frequency place obtains except described first frequency;
Determine subelement, for determining that described LTE terminal is the yield value in the fixing control word of the second frequency place correspondence in described gain value sets at the yield value at the second frequency place;
First difference subelement, the average for the yield value described LTE terminal obtained at each second frequency place is defined as first offset of described LTE terminal in working frequency points with corresponding difference of fixing the first yield value of control word.
13. AGC calibrating installations as claimed in claim 11, is characterized in that, described second offset acquiring unit comprises:
Second obtains subelement, for obtaining described LTE terminal at described first frequency and the correspondence obtained under each second test signal fixes the yield value of control word;
Pad value obtains subelement, for obtaining the pad value of corresponding second test signal, the pad value of described corresponding second test signal for described LTE terminal is at described first frequency place and the correspondence obtained under the second test signal fixes the yield value of control word and the difference of the error amount of corresponding described second test signal, the first offset of the working frequency points of the described LTE terminal that the frequency that the working frequency points that the error amount of described second test signal of described correspondence is described LTE terminal is described second test signal and corresponding described fixing control word obtain;
Second difference subelement, average and the difference of the first yield value of corresponding described fixing control word of the pad value of the described fixing control word of the correspondence for described LTE terminal being obtained under each second test signal are defined as the second offset of corresponding described fixing control word.
14. AGC calibrating installations as claimed in claim 13, it is characterized in that, described second offset acquiring unit also comprises: the 3rd obtains subelement, for obtaining the second offset of corresponding gain control word according to the second offset of the described fixing control word of described correspondence.
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