CN105444783A - Device performance evaluation method used for reliability screening of linear-array detectors - Google Patents

Abstract

The invention discloses a device performance evaluation method used for reliability screening of linear-array detectors. Firstly, a detection device obtains the response ratio and noise data under certain radiation conditions, on one hand, standard radiation and the radiation deviation ratio are calculated through a radiation response temperature feature formula, and radiation inconsistency is calculated through standard radiation; on the other hand, the noise equivalent value is calculated, device performance parameters are further calculated, and finally, performance of the detectors after reliability screening is judged according to the device performance parameters. The detection device comprises a radiation source, an operational amplifier, an A/D converter, a controller, a serial interface driver and a computer. The method effectively solves the problem of device performance evaluation of the linear-array detectors in the reliability screening process, and digitized standards are put forward.

Description

For the device performance appraisal procedure of linear array detector reliability screening

Technical field

The present invention relates to the use of linear array infrared earth sensor linear array detector.Be specifically related to a kind of device performance appraisal procedure for linear array detector reliability screening.

Background technology

Infrared earth sensor, it is the attitude of satellite optical sensor based on earth sensitive for infrared radiation principle, can be used for spacecraft relative to the pitching of the local vertical line of the earth, roll attitude angle signal measurement, original state time spacecraft to the earth catch and steady-state operation time spacecraft gesture stability, hold the balance in the application importance of space industry.And linear array infrared earth sensor is an important branch of its development, its important parts is the detector that it is selected, and its accuracy and reliability depend on the performance parameter that it selects detector largely.Wherein, in infrared earth sensor application process, the linear array detector index of major effect unit duty comprises the stability of responding ability, different unit responds consistance and noise intensity: the stability of responding ability will be conducive to the on-orbit calibration on ground, ensure the operating accuracy of infrared earth sensor; Different units response consistance catches the order of accuarcy of the earth by affecting infrared earth sensor in-orbit; The large young pathbreaker of signal to noise ratio (S/N ratio) ability largely affects the stochastic error of infrared earth sensor work.

Therefore, carry out reliability screening test to linear array detector and be necessary, this finds the overproof serious device of performance index by being conducive to, and filters out the relatively superior device of performance, effectively improves the performance of infrared earth sensor.Existing detector performance evaluation scheme high degree depends on pick-up unit: the device had is complicated, measuring process is loaded down with trivial details, and after reliability screening, Performance Evaluation is effective, but the cost elements such as a large amount of human and material resources of whole process need consumption; Some devices are simple, but comparatively large by the impact of each factor such as environmental quality, device performance, and then affect the judgement of device performance after reliability screening.So in the urgent need to proposing a kind of scheme that accurately can complete detector performance assessment in reliability screening process, reducing the dependence to measurement mechanism, reducing the limitation of environmental factor.

Summary of the invention

The object of the invention is to propose the device performance appraisal procedure for linear array detector reliability screening, the linear array detector that screenability is superior, ensure the reliability after its application.

For the device performance appraisal procedure of linear array detector reliability screening, it is characterized in that comprising the following steps:

(1), by linear array detector access pick-up unit, keep more than 2 hours under cold state;

(2), to the device of (1) state power up, arrange source temperature value is 35 DEG C simultaneously, keeps this state 5min;

(3), by pick-up unit obtain the response quautity of detector 1 ~ k pixel under current radiation source temperature, be designated as D ₁~ D _k, unit is V, and wherein k is linear array detector pixel sum, records current environmental temperature value Te simultaneously _now;

(4), obtained the noise equivalent value of linear array detector 1 ~ k pixel by pick-up unit, be designated as N ₁~ N _k, unit is mV;

(5), power-off is carried out to device;

(6), according to linear array detector the 1st pixel radiometric response temperature characterisitic formula D=m ₁ts+m ₂te+m ₃, wherein m ₁, m ₂, m ₃its radiate linear factor of influence, the environment temperature linear effect factor, constant factor respectively, Ts is source temperature, Te is environment temperature, D is the radiometric response amount under corresponding source temperature and ambient temperature conditions, calculate when source temperature value be 35 DEG C, ambient temperature value is 23 DEG C of corresponding response quautity, be the Standard Ratio of the 1st pixel, its value is designated as Db ₁;

(7) the ambient temperature value Te, source temperature being worth 35 DEG C and being obtained by step (3) _nowsubstitute in the radiometric response temperature characterisitic formula described in step (6), obtain corresponding radiometric response amount, be theoretical value D _l1, in conjunction with linear array detector the 1st pixel response quautity measured value D obtained by step (3) ₁, according to formula calculate radial deviation rate Dif ₁;

(8), by step (6) ~ (7), obtain the Standard Ratio of linear array detector 2 ~ k pixel successively, correspond to Db respectively ₂..., Db _k, and radial deviation rate, correspond to Dif respectively ₂..., Dif _k;

(9) the maximal value Db obtaining linear array detector 1 ~ k pixel Standard Ratio by step (6) ~ (8), is calculated _max, minimum value Db _minwith mean value Db _ave, by formula calculate the inconsistency of all pixel radiation, its value is designated as △.

(10), calculating device performance parameter wherein B _△, B _dif, B _n,b _db, B _dbfbe respectively inconsistency threshold value, response variance threshold value, noise threshold, responding ability threshold value, response discrimination threshold value;

(11) if the device parameter performance s obtained by step (10) is less than 1.4, then think that this linear array detector is qualified.

Described pick-up unit comprises radiation source, operational amplifier, A/D converter, controller, serial driver, computing machine.Wherein:

Radiation source is SR800R constant temperature black matrix;

Operational amplifier adopts OP97, operating voltage range-8V ~+8V;

A/D change-over circuit precision is 14, inversion frequency 16384Hz;

Serial driver adopts 232 serial driver MAX232;

Controller adopts microcontroller, FPGA or processor;

Linear array detector access operational amplifier front end, produces signal after the radiation in received radiation source.After signal is amplified by operational amplifier, convert digital response amount to by AD converter and store in the controller.Computing machine is by port, and the digital response amount stored by controller obtained through serial driver transmission is gone forward side by side row relax display.

Advantage of the present invention:

The present invention efficiently solves the problem of linear array detector device performance assessment in reliability screening process, and the validity of device Performance Evaluation is ensured by proposing digital standards, the basis controlling reliability screening cost accurately completes device performance assessment.

Accompanying drawing explanation

Fig. 1 is apparatus structure schematic diagram.

Fig. 2 is bulk treatment method flow diagram.

Embodiment

According to the method for the invention, the linear array infrared earth sensor linear array detector of certain model aircraft supporting devises a pick-up unit, has carried out replication experiment, and has assessed in conjunction with infrared earth sensor.

In replication experiment, the value of each parameter is as follows:

Label in literary composition and in formula	Value or parameter
		k	64 yuan
B △	4％
		B Dif	6％
B N	10mV
		B Db	4.45V
B Dbf	0.1V

Test result:

Claims (2)

1., for a device performance appraisal procedure for linear array detector reliability screening, it is characterized in that comprising the following steps:

(1), by linear array detector access pick-up unit, keep more than 2 hours under cold state;

(2), to the device be in step (1) state power up, arrange source temperature value is 35 DEG C simultaneously, keeps this state 5min;

(3), by pick-up unit obtain the response quautity of detector 1 ~ k pixel under current radiation source temperature, be designated as D ₁~ D _k, unit is V, and wherein k is linear array detector pixel sum, records current environmental temperature value Te simultaneously _now;

(4), obtained the noise equivalent value of linear array detector 1 ~ k pixel by pick-up unit, be designated as N ₁~ N _k, unit is mV;

(5), power-off is carried out to device;

(6), according to linear array detector the 1st pixel radiometric response temperature characterisitic formula D=m ₁ts+m ₂te+m ₃, wherein m ₁, m ₂, m ₃its radiate linear factor of influence, the environment temperature linear effect factor, constant factor respectively, Ts is source temperature, Te is environment temperature, D is the radiometric response amount under corresponding source temperature and ambient temperature conditions, calculate when source temperature value be 35 DEG C, ambient temperature value is 23 DEG C of corresponding response quautity, be the Standard Ratio of the 1st pixel, its value is designated as Db ₁;

(7) the ambient temperature value Te, source temperature being worth 35 DEG C and being obtained by step (3) _nowsubstitute in the radiometric response temperature characterisitic formula described in step (6), obtain corresponding radiometric response amount, be theoretical value D _l1, in conjunction with linear array detector the 1st pixel response quautity measured value D obtained by step (3) ₁, according to formulae discovery radial deviation rate Dif ₁:

${\mathrm{Dif}}_1=\left|\frac{D_{L1}-D_1}{D_1}\right|;$

(8), by step (6) ~ (7), obtain the Standard Ratio of linear array detector 2 ~ k pixel successively, correspond to Db respectively ₂..., Db _k, and radial deviation rate, correspond to Dif respectively ₂..., Dif _k;

(9) the maximal value Db obtaining linear array detector 1 ~ k pixel Standard Ratio by step (6) ~ (8), is calculated _max, minimum value Db _minwith mean value Db _ave, by formula calculate the inconsistency of all pixel radiation, its value is designated as △;

(10), calculating device performance parameter s:

$s=\frac{\mathrm{\Δ}\·\underset{i=1}{\overset{k}{\Σ}}{\mathrm{Dif}}_i\·\underset{i=1}{\overset{k}{\Σ}}{N}_i}{B_{\mathrm{\Δ}}\·B_{Dif}\·B_N}\·e^{\left|\frac{{\mathrm{Db}}_{ave}-B_{Db}}{B_{Dbf}}\right|}$

Wherein B _△, B _dif, B _n,b _db, B _dbfbe respectively inconsistency threshold value, response variance threshold value, noise threshold, responding ability threshold value, response discrimination threshold value;

(11) if the device parameter performance s obtained by step (10) is less than 1.4, then think that this linear array detector is qualified.

2. the device performance appraisal procedure for linear array detector reliability screening according to claim 1, it is characterized in that: the pick-up unit described in step (1) comprises radiation source, operational amplifier, AD converter, controller, serial driver, computing machine, wherein:

Described radiation source is SR800R constant temperature black matrix;

Described operational amplifier adopts OP97, operating voltage range-8V ~+8V;

Described A/D convertor circuit precision is 14, inversion frequency 16384Hz;

Described serial driver adopts 232 serial driver MAX232;

Described controller adopts microcontroller, FPGA or processor;

Linear array detector access operational amplifier front end, signal is produced after the radiation in received radiation source, after signal is amplified by operational amplifier, convert digital response amount to by AD converter and store in the controller, computing machine is by port, and the digital response amount stored by controller obtained through serial driver transmission is gone forward side by side row relax display.