CN105388331A - LED aging testing instrument - Google Patents

LED aging testing instrument Download PDF

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Publication number
CN105388331A
CN105388331A CN201510925010.0A CN201510925010A CN105388331A CN 105388331 A CN105388331 A CN 105388331A CN 201510925010 A CN201510925010 A CN 201510925010A CN 105388331 A CN105388331 A CN 105388331A
Authority
CN
China
Prior art keywords
contact
socket
led aging
led
spring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201510925010.0A
Other languages
Chinese (zh)
Other versions
CN105388331B (en
Inventor
胡清辉
高芬
胡建
柏云
杨明周
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Datai Technology (Guangzhou) Co.,Ltd.
Original Assignee
Jiangyin Lexu Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jiangyin Lexu Optical Co Ltd filed Critical Jiangyin Lexu Optical Co Ltd
Priority to CN201510925010.0A priority Critical patent/CN105388331B/en
Publication of CN105388331A publication Critical patent/CN105388331A/en
Application granted granted Critical
Publication of CN105388331B publication Critical patent/CN105388331B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416Connectors, terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/44Testing lamps

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The invention discloses an LED aging testing instrument. The LED aging testing instrument comprises a frame, a substrate, a first connecting wire and sockets; the substrate is installed in the frame; the substrate is provided with the plurality of sockets; the socket comprises a body, jacks, contact components and second connecting wires, wherein the plurality of contact components are arranged in the body, the jacks are arranged on the body and are aligned with the contact components, and each contact component includes a plurality of contact bodies, a spring and a mounting body, wherein the contact bodies form a ring through encircling and are fixed through the spring, and the mounting body is arranged on the body contacts; the connecting wires are connected with the mounting bodies. The LED aging testing instrument of the invention has the advantages of simple structure, excellent contact, long service life, safety and reliability.

Description

LED aging tester
Technical field
The invention belongs to LED checkout equipment field, more specifically relate to LED aging tester.
Background technology
In the process of direct insertion LED production and processing, later stage needs the LED lamp bead of whole finished product to carry out normal ageing, accelerated deterioration, light decay etc. and tests, some LED lamp bead sockets are distributed with above current LED aging tester, in order to test LED lamp bead performance, what current lamp pearl socket inside contacted with LED pole pin is all conductive metal pipe, after long-term mounting or dismounting, metal tube can loosen and cause metal tube bad with contacting of pole pin.
Summary of the invention
In order to solve the problem, the invention provides that a kind of structure is simple, contact is good, long service life, safe and reliable LED aging tester.
According to an aspect of the present invention, LED aging tester comprises frame, substrate, first connecting line and socket, substrate is arranged in frame, substrate is provided with some sockets, socket comprises body, socket, contact element and the second connecting line, some contact elements are provided with in described body, socket is arranged on body, socket is just to contact element, contact element comprises some contacts, spring and fixing body, contact surrounds into annular, contact fixed by spring, fixing body is arranged on contact, connecting line connection body, so that realize contacting well with LED lamp bead pole pin, longer service life.
In some embodiments, some contact element one end diameter is greater than other end diameter, so that LED lamp bead pole pin inserts convenient.
In some embodiments, contact element diameter large one rectify to socket so that LED lamp bead pole pin insert convenient.
In some embodiments, spring is through contact, and described spring can make contact surround into annular, so that realize contacting well with LED lamp bead pole pin.
In some embodiments, contact and spring are conductor, so that ensure energising.
In some embodiments, body and substrate are insulator, so that ensure safety.
In some embodiments, the first connecting line is connected or is parallel with some second connecting lines, so that form complete loops.
The beneficial effect of LED aging tester of the present invention is: structure of the present invention is simple, contact is good, long service life, safe and reliable.
Accompanying drawing explanation
Fig. 1 is the structural representation of a kind of LED aging tester of the present invention;
Fig. 2 is the structural representation of the socket of a kind of LED aging tester of the present invention;
Fig. 3 is the contact piece structure schematic diagram of the socket of a kind of LED aging tester of the present invention;
Fig. 4 is the contact element using state figure of the socket of a kind of LED aging tester of the present invention.
Embodiment
Below in conjunction with embodiment, the present invention is further illustrated.
As shown in Figure 1, a kind of LED aging tester of an embodiment of the present invention comprises frame 1, substrate 2, first connecting line 3 and socket 4, and substrate 2 is arranged in frame 1, substrate 2 is provided with some sockets 4.
As shown in Figure 2, socket 4 comprises body 41, socket 42, contact element 43 and the second connecting line 44.Body 41 is insulator, so that ensure to use safety when detecting.Body 41 is provided with multiple socket 42 above, and the quantity of socket 42 is optimum is 4.If socket 42 quantity is too many, having socket 42 to contact generation problem just needs whole socket to change, and is unfavorable for repairing safeguarding.Be provided with contact element 43 immediately below socket 42, contact element 43 directly contacts energising with the pole pin of LED.Second connecting line 44 is fixedly connected with contact element 43, forms complete loop.
As shown in Figure 2, contact element 43 is the tubulose of hollow, and the diameter of one end is greater than the diameter of the other end, and in horn-like, one end that diameter is larger is placed in immediately below socket 42, to insert in contact element 43 with the pole pin realizing LED.
As shown in Figure 3, contact element 43 comprises some contacts 431, spring 432 and fixing body 433.Several contacts 431 surround into hollow tubular, and spring 432 can make contact 431 surround into annular.Spring 432 can be centered around outside contact 431, and optimum is punching in the middle of contact 431, and spring 432 passes contact 431, so that make several contacts surround into annular.What current lamp pearl socket inside contacted with LED pole pin is all conductive metal pipe, general is all metal tube made of copper, after long-term mounting or dismounting, metal tube can loosen and cause metal tube bad with contacting of pole pin, and cannot use, Long-Time Service can be solved by the cooperation between multiple contact 431 and spring 432 and contact bad problem, first enter the larger one end of diameter when LED pole pin inserts contact element 43, be convenient to LED pole pin and insert.By clamp-oning of LED pole pin, spring 432 is upheld, contact 431 is enclosed in LED pole pin surrounding thus solves Long-Time Service and contacts bad technical matters.
Arbitrary contact 431 is fixedly connected with fixing body 433, and optimum adopts welding.Second connecting line 44 is fixedly connected with fixing body 433, forms loop.Contact 431, spring 432 and fixing body 433 are metallic conductor, consider economy, electric conductivity optimum is made of copper.First connecting line 3 is connected or is parallel with the second connecting line 44, so that form complete loops.
Structure of the present invention is simple, contact is good, long service life, safe and reliable.
Above-described is only some embodiments of the present invention, it should be pointed out that for the person of ordinary skill of the art, and under the prerequisite not departing from creation design of the present invention, can also make other distortion and improve, these all belong to protection scope of the present invention.

Claims (7)

1.LED aging tester, it is characterized in that, comprise frame (1), substrate (2), first connecting line (3) and socket (4), described substrate (2) is arranged in frame (1), described substrate (2) is provided with some sockets (4), described socket (4) comprises body (41), socket (42), contact element (43) and the second connecting line (44), some contact elements (43) are provided with in described body (41), described socket (42) is arranged on body (41), described socket (42) is just to contact element (43), described contact element (43) comprises some contacts (431), spring (432) and fixing body (433), described contact (431) surrounds into annular, contact (431) fixed by described spring (432), described fixing body (433) is arranged on contact (431), described connecting line (44) connection body (433).
2. LED aging tester according to claim 1, is characterized in that, described some contact elements (43) one end diameter is greater than other end diameter.
3. LED aging tester according to claim 2, is characterized in that, described contact element (43) diameter large one rectify to socket (42).
4. LED aging tester according to claim 3, is characterized in that, described spring (432) is through contact (431), and described spring (432) can make contact (431) surround into annular.
5. LED aging tester according to claim 4, is characterized in that, described contact (431) and spring (432) are conductor.
6., according to the arbitrary described LED aging tester of claim 1 to 5, it is characterized in that, described body (41) and substrate (2) are insulator.
7. LED aging tester according to claim 1, is characterized in that, described first connecting line (3) is connected or is parallel with some second connecting lines (44).
CN201510925010.0A 2015-12-14 2015-12-14 LED aging testers Active CN105388331B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510925010.0A CN105388331B (en) 2015-12-14 2015-12-14 LED aging testers

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510925010.0A CN105388331B (en) 2015-12-14 2015-12-14 LED aging testers

Publications (2)

Publication Number Publication Date
CN105388331A true CN105388331A (en) 2016-03-09
CN105388331B CN105388331B (en) 2018-09-28

Family

ID=55420834

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510925010.0A Active CN105388331B (en) 2015-12-14 2015-12-14 LED aging testers

Country Status (1)

Country Link
CN (1) CN105388331B (en)

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2519473Y (en) * 2002-02-06 2002-10-30 李洪万 Single-phase two and three poles dual purpose lock type connector plug and socket
CN2627673Y (en) * 2003-06-05 2004-07-21 李自先 Electric appliance switchover mechanism socket
CN2788388Y (en) * 2004-12-20 2006-06-14 丹东英普朗特科技有限公司 Ion implantation apparatus ion source electrode socket
CN101310419A (en) * 2005-11-15 2008-11-19 卡斯滕·霍恩舒·波尔森 Touch-safe socket
CN201430277Y (en) * 2009-04-23 2010-03-24 张晓雷 Durable socket
CN101765783A (en) * 2007-08-01 2010-06-30 阿尔卑斯电气株式会社 Socket and burn-in board provided with the socket
US20100181178A1 (en) * 2009-01-22 2010-07-22 James Tseng Hsu Chang End cap with safety protection switch
CN201594622U (en) * 2010-02-04 2010-09-29 尹良松 Clip plug
CN101960204A (en) * 2008-02-28 2011-01-26 泰科电子公司 Integrated LED driver for LED socket
CN203415731U (en) * 2013-08-26 2014-01-29 浙江启星电气科技有限公司 Conductive terminal for industrial plugs and sockets
CN205246708U (en) * 2015-12-14 2016-05-18 江阴乐圩光电股份有限公司 LED aging testing appearance

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2519473Y (en) * 2002-02-06 2002-10-30 李洪万 Single-phase two and three poles dual purpose lock type connector plug and socket
CN2627673Y (en) * 2003-06-05 2004-07-21 李自先 Electric appliance switchover mechanism socket
CN2788388Y (en) * 2004-12-20 2006-06-14 丹东英普朗特科技有限公司 Ion implantation apparatus ion source electrode socket
CN101310419A (en) * 2005-11-15 2008-11-19 卡斯滕·霍恩舒·波尔森 Touch-safe socket
CN101765783A (en) * 2007-08-01 2010-06-30 阿尔卑斯电气株式会社 Socket and burn-in board provided with the socket
CN101960204A (en) * 2008-02-28 2011-01-26 泰科电子公司 Integrated LED driver for LED socket
US20100181178A1 (en) * 2009-01-22 2010-07-22 James Tseng Hsu Chang End cap with safety protection switch
CN201430277Y (en) * 2009-04-23 2010-03-24 张晓雷 Durable socket
CN201594622U (en) * 2010-02-04 2010-09-29 尹良松 Clip plug
CN203415731U (en) * 2013-08-26 2014-01-29 浙江启星电气科技有限公司 Conductive terminal for industrial plugs and sockets
CN205246708U (en) * 2015-12-14 2016-05-18 江阴乐圩光电股份有限公司 LED aging testing appearance

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Effective date of registration: 20180820

Address after: 510000 Guangdong Guangzhou economic and Technological Development Zone, Lan Yu four street 9 science and Technology Park 3 factory 701 room

Applicant after: Guangzhou Da Testing Technology Co., Ltd.

Address before: 214000 Changle Road 85, Zhouzhuang Town, Jiangyin, Wuxi, Jiangsu

Applicant before: JIANGYIN LEXU OPTICAL CO., LTD.

GR01 Patent grant
GR01 Patent grant
CP01 Change in the name or title of a patent holder
CP01 Change in the name or title of a patent holder

Address after: 510000 Guangdong Guangzhou economic and Technological Development Zone, Lan Yu four street 9 science and Technology Park 3 factory 701 room

Patentee after: Datai Technology (Guangzhou) Co.,Ltd.

Address before: 510000 Guangdong Guangzhou economic and Technological Development Zone, Lan Yu four street 9 science and Technology Park 3 factory 701 room

Patentee before: Guangzhou, which reaches, surveys Science and Technology Ltd.