CN105371892A - Method and device for screening low-grade components used by satellite - Google Patents
Method and device for screening low-grade components used by satellite Download PDFInfo
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Abstract
The invention provides a method and device for screening low-grade components used by a satellite. The method comprises a step 1 of determining the quality assurance grades of the components according to the severity and the redundancy state of the components to be screened; a step 2 of eliminating the components with first quality assurance grades, and performing a screening test and a DPA test or just a screening test on the components with other quality assurance grades in order to obtain a test result; and a step 3 of using the components with qualified test results as the components of the satellite. The method for screening the low-grade components used by the satellite grades the components according to the severity and the redundancy state of the components, then performs corresponding DPA and screening tests on the components with different grades, and singles out the components that can be used by the satellite from multiple batches of the components to be screened, thereby decreasing satellite development cost and increasing development efficiency.
Description
Technical field
The present invention relates to micro-nano satellite components and parts technical field, relate to a kind of inferior grade screening of electric components method for satellite and device thereof especially.
Background technology
Since the nineties in 20th century, the research to micro-nano satellite has been carried out in multiple countries and regions in the world.Micro-nano satellite is light with its quality, volume is little, the lead time is short, cost is low, functional density is large and launch the advantages such as flexible, receives extensive concern.Micro-nano satellite has broad application prospects in fields such as commercialization, communication, remote sensing, also in the military requirement of local burst war, has advantageous advantage.
The aerospace level device cost ratio COTS device high several times be extensively suitable in large satellite production run, and performance fell behind for 2 ~ 3 generations.And US and European limits implementation of China in aerospace level and army grade space flight devices field at present, delivery cycle is difficult to ensure.These all cause large satellite aerospace level device cannot meet micro-nano satellite miniaturization, low cost, short-period requirement.For high-grade aerospace level device, the key property of inferior grade commercial devices (another name: technical grade or business level) such as integrated level, operating rate, capacity, power consumption etc. are all far superior to the aerospace level device in space.The buying of commercial devices can not by the restriction of other countries simultaneously.Micro-nano satellite track is generally near-earth low orbit satellite, is in the below of radiation belt, and the space radiation impact be subject to is less.Under the condition meeting overall reliability requirement, if the commercial devices of advanced person can be applied to the development of micro-nano satellite, not only to reduction micro-nano satellite overall power volume, improving performance, reduce costs significant, and to the space application of micro-nano satellite, there is important strategic importance.
But commercial devices is when being applied to this kind of spacecraft of micro-nano satellite, inevitably there is following problem:
1) commercial devices capability of resistance to radiation is poor, can cause device damage in various degree and inefficacy in space environment;
2) temperature applicable range of commercial devices is little, and space environment exists the situation of the comparatively large and temperature jump of temperature variation;
3) commercial devices lacks reliability data.
In order to reduce the impact that the problems referred to above use commercial devices aviationization, need before use to screening, test, assessment etc. that commercial devices is added.The device that wherein can not meet aerospace level requirement on devices is got rid of.At present, the screening technique of the special COTS device for micro-nano satellite is not had.
Summary of the invention
The object of the present invention is to provide a kind of inferior grade screening of electric components method for satellite and device thereof, it is poor for reliability during micro-nano satellite that the present invention mainly solves COTS components and parts in prior art, and shortage is carried out efficiently commercial devices, accurately screened, thus obtain the technical matters with the screening technique of higher reliability device.
The invention provides a kind of inferior grade screening of electric components method for satellite, comprise the following steps:
Step S1: according to severity and the standby redundancy situation of components and parts to be screened, determine the quality assurance grade of components and parts; Step S2: get rid of the components and parts that quality assurance grade is 1 grade, carries out shaker test and DPA test to the components and parts of other grades or only carries out shaker test, obtaining test findings; Step S3: be eligible by test findings, elects satellite components and parts as; After severity refers to that components and parts lost efficacy on star, to the influence degree that whole star task completes; Quality assurance grade comprises 1 ~ 4 grade, sequentially reduces from 1 to 4 the significance level that whole star task completes, and wherein quality assurance 1 grade is that single-point is arranged and inefficacy can cause the components and parts of whole star mission failure in using on star; After shaker test refers to and components and parts to be screened to be placed at environment temperature >=80 DEG C continuous working >=160 hour, by screening of electric components defective in components and parts out.
Further, quality assurance 2 ~ 3 grades of components and parts carry out DPA and shaker test, and quality assurance grade is that the components and parts of 4 grades only carry out shaker test.
Further, also step S201 is comprised: judge whether components and parts to be screened have experience of successfully flying in step S2, if be successfully completed, carry out shaker test to components and parts, the experience if components and parts successfully do not fly, then carry out DPA and shaker test to components and parts.
Further, also comprise step S202 in step S2: carry out random sampling to components and parts to be screened, amount of sampling is 10% of a collection of components and parts total amount, and the component counts to be screened of extraction is 1 ~ 5.
Further, when need carry out shaker test and DPA test, the components and parts choosing qualified batch of test findings after first carrying out DPA test carry out shaker test simultaneously.
Further, DPA test comprises and treats that screening components and parts sequentially carry out visual examination, X-ray examination, internal visual inspection, SEM, bond-pull intensity and Chip Adhesion Strength detect.
Further, shaker test comprises and sequentially carrying out components and parts to be screened: the components and parts performance test 1) before test and visual examination; 2) shaker test; 3) the components and parts performance test after test and visual examination
The present invention additionally provides on the other hand a kind of device of the inferior grade screening of electric components for satellite, comprises with lower module: quality assurance grade module, for according to the severity of components and parts to be screened and standby redundancy situation, determines the quality assurance grade of components and parts; Tentative module, for getting rid of the components and parts that quality assurance grade is 1 grade, carrying out shaker test and DPA test to the components and parts of other grades or only carrying out shaker test, obtaining test findings; Choosing module, for being eligible by test findings, electing satellite inferior grade components and parts as; After severity refers to that components and parts lost efficacy on star, to the influence degree that whole star task completes; Quality assurance grade comprises 1 ~ 4 grade, sequentially reduces from 1 to 4 the significance level that whole star task completes, and wherein quality assurance 1 grade is that single-point is arranged and inefficacy can cause the components and parts of whole star mission failure in using on star; After shaker test refers to and components and parts to be screened to be placed at environment temperature >=80 DEG C continuous working >=160 hour, by screening of electric components defective in components and parts out.
Further, tentative module also comprises flight experience judge module, for judging whether components and parts to be screened have experience of successfully flying, if had, carries out shaker test to components and parts, if components and parts did not complete on star and work, then DPA and shaker test were carried out to components and parts.
Further, tentative module also comprises decimation blocks, carries out random sampling to components and parts to be screened, and amount of sampling is 10% of a collection of components and parts total amount, and the component counts to be screened of extraction is 1 ~ 5.
Advantage of the present invention:
After inferior grade screening of electric components method for satellite provided by the invention carries out classification according to the severity of this device environment for use and redundancy condition, respectively corresponding DPA and screening experiment are carried out to the device of different brackets.According to obtained experimental result, select from multiple batches of device to be screened, may be used for the inferior grade components and parts on satellite, improve screening effeciency.The device meeting aerospace requirement in the inexpensive device such as COTS device also be can be used on micro-nano satellite, thus reduce the production cost that micro-nano satellite etc. can use the satellite of COTS device, alleviate satellite weight, shorten the satellite production cycle.The device reliability adopting the method to filter out can reach the request for utilization of respective satellite completely, thus ensure that satellite reliability in use.
With reference to above and other aspect of the present invention being made apparent according to the following description of the various embodiments of the inferior grade screening of electric components method for satellite of the present invention.
Accompanying drawing explanation
The present invention is explained in more detail referring now to accompanying drawing, wherein:
Fig. 1 is the inferior grade screening of electric components method flow schematic diagram for satellite of the preferred embodiments of the present invention;
Fig. 2 is the inferior grade screening of electric components device schematic diagram for satellite of the preferred embodiments of the present invention.
Embodiment
The invention provides a kind of inferior grade screening of electric components method for satellite.Method provided by the invention is particularly useful for all screening lower than the COTS device of aerospace level requirement on devices properties requirement, from multiple batches of COTS device, filter out the device meeting aerospace requirement, realization inferior grade device substitutes the object of high-grade device.Below describe and carry out for the use of micro-nano satellite, following methods also may be used for other to be needed to use on the satellite of inferior grade components and parts.
Need to illustrate that components and parts are divided into aerospace level, army grade, technical grade and business level.Inferior grade components and parts refer to the components and parts that can have commercially bought herein, comprise technical grade and business level components and parts.COTS herein, refers to the components and parts that can directly buying on the market.This is relative to aerospace level, and aerospace level is difficult to buy, general not stock, and majority needs import, and the cycle is very long.Aerospace level in addition and army grade also may be embargoed.Experience of flying herein refers to that these components and parts are used to satellite, and for successfully completing the task in orbit of satellite.
See Fig. 1, the inferior grade screening of electric components method for satellite provided by the invention comprises the following steps:
Step S1: according to severity and the standby redundancy situation of components and parts to be screened, determine the quality assurance grade of components and parts;
Step S2: get rid of the components and parts that quality assurance grade is 1 grade, carries out shaker test and DPA test to the components and parts of other grades or only carries out shaker test, obtaining test findings;
Step S3: be eligible by test findings, elects satellite inferior grade components and parts as;
After severity refers to that components and parts lost efficacy on star, to the influence degree that whole star task completes;
Quality assurance comprises 1 ~ 4 grade, sequentially reduces from 1 to 4 the significance level that whole star task completes, and wherein quality assurance 1 grade is that single-point is arranged and inefficacy can cause the components and parts of whole star mission failure in using on star.Rational classification can be carried out to components and parts to be screened according to the severity of components and parts and standby redundancy situation those skilled in the art.
The classification that quality assurance is 1 ~ 4 grade is specifically see table 1, foundation for the severity classification of satellite components and parts is that components and parts are in satellite use procedure, to the influence degree that whole star task completes after inefficacy, be divided into serious level and general level successively, wherein serious level refer to component failure will to cause on whole star mission failure, star main task failure or the key technical indexes not up to standard.General level only secondary mission failure or do not affect the key technical indexes on star after referring to component failure, this satellite still can complete leading indicator and obtain task.Wherein in shaker test with defective components and parts account for extract batch total amount less than 5% time be qualified batch of components and parts.
Standby redundancy refers to the situation for ensureing the of the same type alternative components and parts set by whole star reliability, is divided into single-point level and backup level.Backup level refers to and needs to arrange more than one components and parts of the same type on star.Single-point level refers to the components and parts being only provided with a type on star.According to severity and standby redundancy graduation, obtain 4 quality assurance grades, as shown in table 1.
Table 1 quality assurance table of grading
| Quality assurance grade | Serious level | General level |
| Single-point level | 1 | 2 |
| Backup level | 3 | 4 |
Step S2: get rid of the components and parts that quality assurance grade is 1 grade, carries out shaker test and DPA test to the components and parts of other grades or only carries out shaker test, obtaining test findings; Quality assurance test project corresponding to each quality assurance grade is as shown in table 2.
Table 2 quality assurance test contents table
| Quality assurance grade | 1 | 2 | 3 | 4 |
| Quality assurance test content | / | Shaker test+DPA | Shaker test+DPA | Shaker test |
In table 2, DPA (DestructivePhysicalAnalysis, Destructive Physical Analysis is tested), can carry out the whole test items under the type test by relevant regulations of the prior art.Shaker test to enter hot environment test before, in and in after-stage, the critical nature of these components and parts carries out the experiment checked.The project of shaker test can be all kinds of performance tests that may relate to that star works.Be not limited to environment on certain concrete star.This test can be undertaken by artificial and testing equipment, also can be undertaken by adopting test card.Hot environment herein and can carrying out for the testing requirement of microelectronic component according in GB for a long time.Temperature need meet >=80 DEG C at continuous working >=160 hour.
As shown in Table 1, be the components and parts of 1 grade for quality assurance grade, due to it once lose efficacy, then can substitute it without any backup components and parts and play a role, non-aerospace level components and parts do not selected by the components and parts being thus 1 grade for quality assurance.Quality assurance grade is the components and parts of 1 grade, without the need to carrying out follow-up experiment.
Preferably reduce detecting step, improve detection efficiency, also step S201 is comprised: judge whether components and parts to be screened have successful flight to experience in step S2, if be successfully completed, shaker test was carried out to components and parts, if components and parts do not have successful flight to experience, then DPA and shaker test are carried out to components and parts.
For the components and parts applied on micro-nano satellite, according to service condition once, if when namely these components and parts are used for satellite, do not occur losing efficacy, can cancel and under the quality assurance grade of its correspondence, need the DPA carried out to test to these components and parts.If when these components and parts are used for satellite, once there is inefficacy, then need to carry out DPA test to the components and parts of this batch.When quality guarantee grade is 2 or 3, can selects and there is no the device experienced that star flies, but DPA test must be done.If do not carry out DPA test, then directly drop into the failure risk that star uses larger.Such as, when the quality assurance grade of A inferior grade components and parts is 2 or 3, then can accept or reject DPA content of the test according to the situation of A components and parts on satellite time.
Preferably, for improving screening effeciency, being the components and parts of 2 or 3 for quality guarantee grade, selecting the device of flight experience as far as possible, thus only needing to do shaker test.
Preferably, in order to reject batch underproof device as early as possible, improve screening effeciency, DPA test can first be carried out; After DPA stand the test, carry out shaker test more afterwards.For the device that quality assurance grade is 4 grades, then directly can carry out shaker test.
The selection result is more accurate more at most for DPA test and shaker test sampling, but when ensureing screening accuracy and screening effeciency is higher, first carrying out random sampling to the components and parts to be screened needed for DPA test and/or shaker test, testing afterwards again.Amount of sampling is 10% of this batch of components and parts total amount to be screened, the sampling number year 1 ~ 5 of components and parts to be screened.The quantity minimum requirements of sampling is as shown in table 3.
Table 3 is sampled and is required table
Can by DPA test requirement carry out a complete set of DPA detection, in order to improve screening effeciency, simultaneously ensure screening after components and parts broadcast TV programs by satellite reliability when, preferably, carry out the DPA analysis of experiments project of following items, list in table 4.
Table 4DPA pilot project table
| Project and program | GJB548B-2005 method number |
| Visual examination | 2009 |
| X-ray examination | 2012 |
| Internal visual inspection | 1010 |
| SEM (scanning electron microscope) | 2018 |
| Bond-pull intensity | 2011 |
| Chip Adhesion Strength | 2019 |
Analyze DPA test findings: if all assays all meet the requirements, it is qualified to be evaluated as.If check out batch defect, then should batchly scrap; If check out defect to belong to non-batch defect, and when defective sample size is 1, sampling analysis can be doubled in former sample size.Namely after carrying out 2 times of sampling analyses, if result is qualified, test is proceeded.
Preferably, in order to submit screening effeciency to and obtain the components and parts with the reliability that meets the demands, shaker test comprises the front performance test of test and visual examination, hot environment test and performance test and visual examination after testing, and concrete operations are listed in table 5.Wherein hot environment test is undertaken by user's board test plate; Performance Detection sets according to mission requirements on the star of components and parts to be screened.
Table 5 shaker test repertory
User Defined content measurement in table 5 refers to the task performed on satellite according to inferior grade components and parts, and the critical nature these components and parts being completed to this required by task detects.The major function completed needed for these components and parts are on satellite is carried out to the test of function and performance.Count example with temperature, if required screening is thermometer, then the numerical value that thermometer measures temperature under a certain temperature conditions is detected.Before detection comprises test, after test neutralization test.This thermometer function of three phases is normal, and measured temperature is consistent with environment temperature, could calculate shaker test qualified.Screen by this, effectively can improve screening effeciency, and ensure the components and parts of gained batch, the needs that star is finished the work can be met.
Shaker test is realized by design corresponding test board, and board uses corresponding element device socket, tested components and parts are arranged in socket.Shaker test at normal temperatures (normal temperature refers to room temperature+25 DEG C) first, breadboard is carried out Function detection one by one to screened device, and is monitored breadboard working current.Normal chip will be tested at normal temperatures and put into high-temperature cabinet, at+80 DEG C of temperature, screened device is with normal operating voltage, power up work 160h continuously, and every 24h carries out functional test one by one to screened device, whether monitoring components and parts or components and parts partial function module are damaged during the course.Test allows percent defective to be 5%, if there is inefficacy, needs to carry out failure analysis to ineffective part.
Preferably, in order to improve the utilization factor to test findings, also step S301 is comprised in step S3: test result analysis.When test result analysis components and parts are analyzed through the DPA of regulation, shaker test is qualified, the conclusion of quality assurance is qualified.Components and parts are analyzed through the DPA of regulation, a certain test of shaker test does not meet the demands and failure analysis conclusion is batch problem, and the conclusion of quality assurance is defective.
See Fig. 2, the present invention additionally provides a kind of inferior grade screening of electric components device for satellite on the other hand, and this device comprises with lower module:
Quality assurance grade module 100, for according to the severity of components and parts to be screened and standby redundancy situation, determines the quality assurance grade of components and parts;
Tentative module 200, for getting rid of the components and parts that quality assurance grade is 1 grade, carrying out shaker test and DPA test to the components and parts of other grades or only carrying out shaker test, obtaining test findings;
Choosing module 300, for being eligible by test findings, electing satellite inferior grade components and parts as.The operational module with above-mentioned functions can be obtained by state of the art with upper module.Can realize screening inferior grade components and parts, therefrom select the components and parts batch that may be used for satellite, reduce satellite production cost, improve screening effeciency.
Preferably, tentative module 200 also comprises flight experience judge module, for judging whether components and parts to be screened have experience of successfully flying, if had, carries out shaker test to components and parts, if components and parts did not complete on star and work, then DPA and shaker test were carried out to components and parts.Can tested number be reduced, improve screening effeciency.Wherein shaker test is identical with aforementioned shaker test.
Preferably, tentative module also comprises decimation blocks, carries out random sampling to components and parts to be screened, and amount of sampling is 10% of a collection of components and parts total amount, and the component counts to be screened of extraction is 1 ~ 5.Can tested number be reduced by sampling, improve screening effeciency when batch components and parts are detected.
Method provided by the invention has following Advantageous Effects:
(1) significantly satellite development cost is reduced; The price of aerospace level device is the decades of times even hundred times of technical grade device price.Although shaker test can increase some costs, but still well below the cost of aerospace level device;
(2) the satellite lead time is shortened; The buying of technical grade device is unrestricted, and delivery cycle is short, is not therefore subject to the restriction of device buying when satellite is developed, greatly can shortens the lead time.
Be described for the screening technique of concrete inferior grade components and parts below:
Above-mentioned screening technique provided by the invention is applied to xx-2 satellite Star Service Computer Design.Xx-2 house keeping computer adopts two panels single-chip microcomputer two-shipper cold standby framework.Single-chip microcomputer is atmel corp's technical grade product, and concrete model is AT90CAN128.This single-chip microcomputer had 3 years trouble-free flight experience.
In the present embodiment, according to above-mentioned screening technique, first determine the quality assurance grade of this single-chip microcomputer.This single-chip microcomputer is the main control equipment of satellite, if inefficacy can bring the failure of whole star task; But house keeping computer have employed two-shipper cold standby framework, so according to aforementioned table 1, the quality assurance grade of this single-chip microcomputer is 3 grades.Can determine that the quality assurance test content of this single-chip microcomputer is shaker test and DPA according to aforementioned table 2 thus.Because this single-chip microcomputer had flight experience, so DPA test can be cancelled.What final needs carried out only has shaker test.The results are shown in Table 6 in this single-chip microcomputer quality assurance demand analysis.
Table 6AT90CAN128 quality assurance demand analysis table
This single-chip microcomputer belongs to integrated circuit, and that to extract batch 10% tests.On final star, the quantity of this single-chip microcomputer required is 2, so the device of same batch of buying 40 screens.Shaker test designs special test board card and tests accordingly.
Screening is according to following steps:
1) first carry out visual examination to all devices, outward appearance is without damaged, flawless, and device pin is without skew;
2) test before hot test, this test is carried out at normal temperatures.Content measurement comprises external interface functional test, inner flash, ram readwrite tests, analog acquisition, IO input/output test;
3) test board is put into sweat box, keep temperature 80 DEG C, continuous working 160 hours.Once tested every 24 hours therebetween, content measurement comprises external interface functional test, inner flash, ram readwrite tests, analog acquisition, IO input/output test;
4) after hot test completes, test board is taken out from sweat box, carry out testing rear test after recovering normal temperature.Content measurement comprises external interface functional test, inner flash, ram readwrite tests, analog acquisition, IO input/output test;
In above-mentioned screening process, 40 higher device temperature, normal temperature are all working properly.Through above-mentioned shaker test, devices function is normal, can think that device quality is qualified, use of broadcasting TV programs by satellite of can installing.Adopting screening technique provided by the invention, can effectively avoiding broadcasting TV programs by satellite use to there are the possible components and parts of larger inefficacy.Realize object inferior grade components and parts being used for satellite, both reduced the production cost of satellite, and turn improved the screening effeciency to available devices.
Clear scope of the present invention is not restricted to example discussed above by those skilled in the art, likely carries out some changes and amendment to it, and does not depart from the scope of the present invention of appended claims restriction.Although oneself is through illustrating in detail in the accompanying drawings and the description and describing the present invention, such explanation and description are only explanations or schematic, and nonrestrictive.The present invention is not limited to the disclosed embodiments.
By to accompanying drawing, the research of instructions and claims, it will be appreciated by those skilled in the art that when implementing of the present invention and realize the distortion of the disclosed embodiments.In detail in the claims, term " comprises " does not get rid of other steps or element, and indefinite article " " or " one " are not got rid of multiple.The fact of some measure of quoting in mutually different dependent claims does not mean that the combination of these measures can not be advantageously used.Any reference marker in claims does not form the restriction to scope of the present invention.
Claims (10)
1., for an inferior grade screening of electric components method for satellite, it is characterized in that, comprise the following steps:
Step S1: according to severity and the standby redundancy situation of described components and parts to be screened, determine the quality assurance grade of described components and parts;
Step S2: get rid of the described components and parts that quality assurance grade is 1 grade, carries out shaker test and DPA test to the described components and parts of other grades or only carries out shaker test, obtaining test findings;
Step S3: be eligible by described test findings, elects described satellite components and parts as;
After described severity refers to that described components and parts lost efficacy on star, to the influence degree that whole star task completes;
Described quality assurance grade comprises 1 ~ 4 grade, sequentially reduces from 1 to 4 the significance level that whole star task completes, and wherein said quality assurance 1 grade is that single-point is arranged and inefficacy can cause the described components and parts of whole star mission failure in using on star;
After described shaker test refers to and described components and parts to be screened to be placed at environment temperature >=80 DEG C continuous working >=160 hour, by screening of electric components defective in described components and parts out.
2. the inferior grade screening of electric components method for satellite according to claim 1, it is characterized in that, described quality assurance grade is that the described components and parts of 2 ~ 3 grades carry out described DPA and described shaker test, and described quality assurance grade is that the described components and parts of 4 grades only carry out described shaker test.
3. the inferior grade screening of electric components method for satellite according to claim 1 and 2, it is characterized in that, also step S201 is comprised: judge whether described components and parts to be screened have experience of successfully flying in described step S2, if be successfully completed, shaker test was carried out to described components and parts, the experience if described components and parts successfully do not fly, then carry out DPA and shaker test to described components and parts.
4. the inferior grade screening of electric components method for satellite according to claim 3, it is characterized in that, also step S202 is comprised: random sampling is carried out to described components and parts to be screened in described step S2, described amount of sampling is 10% of a collection of described components and parts total amount, and the to be screened described component counts of extraction is 1 ~ 5.
5. the inferior grade screening of electric components method for satellite according to claim 3, it is characterized in that, when need carry out described shaker test and described DPA test, first carry out described DPA test, the described components and parts choosing qualified batch of test findings afterwards carry out described shaker test simultaneously.
6. the inferior grade screening of electric components method for satellite according to claim 5, it is characterized in that, described DPA test comprises to be treated the described components and parts of screening and sequentially carries out visual examination, X-ray examination, internal visual inspection, SEM, bond-pull intensity and Chip Adhesion Strength and detect.
7. the inferior grade screening of electric components method for satellite according to claim 5, is characterized in that, described shaker test comprises sequentially carries out described components and parts to be screened: the components and parts performance test 1) before test and visual examination; 2) shaker test; 3) the components and parts performance test after test and visual examination.
8. for a device for the inferior grade screening of electric components of satellite, it is characterized in that, comprise with lower module:
Quality assurance grade module, for according to the severity of described components and parts to be screened and standby redundancy situation, determines the quality assurance grade of described components and parts;
Tentative module, for getting rid of the described components and parts that quality assurance grade is 1 grade, carrying out shaker test and DPA test to the described components and parts of other grades or only carrying out shaker test, obtaining test findings;
Choosing module, for being eligible by described test findings, electing described satellite inferior grade components and parts as;
After described severity refers to that described components and parts lost efficacy on star, to the influence degree that whole star task completes;
Described quality assurance grade comprises 1 ~ 4 grade, sequentially reduces from 1 to 4 the significance level that whole star task completes, and wherein said quality assurance 1 grade is that single-point is arranged and inefficacy can cause the described components and parts of whole star mission failure in using on star;
After described shaker test refers to and described components and parts to be screened to be placed at environment temperature >=80 DEG C continuous working >=160 hour, by screening of electric components defective in described components and parts out.
9. the device of the inferior grade screening of electric components for satellite according to claim 8, it is characterized in that, described tentative module also comprises flight experience judge module, for judging whether described components and parts to be screened have experience of successfully flying, if had, shaker test is carried out to described components and parts, if described components and parts did not complete on star and work, then DPA and shaker test were carried out to described components and parts.
10. the device of the inferior grade screening of electric components for satellite according to claim 9, it is characterized in that, described tentative module also comprises decimation blocks, random sampling is carried out to described components and parts to be screened, described amount of sampling is 10% of a collection of described components and parts total amount, and the to be screened described component counts of extraction is 1 ~ 5.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111438066A (en) * | 2020-02-21 | 2020-07-24 | 浙江时空道宇科技有限公司 | Component selection method and device for satellite and electronic equipment |
| CN112184063A (en) * | 2020-10-23 | 2021-01-05 | 中国运载火箭技术研究院 | Aircraft equipment screening method and equipment and storage medium |
| CN114755512A (en) * | 2022-03-21 | 2022-07-15 | 知一航宇(北京)科技有限公司 | Selection method of small satellite components |
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| CN111438066A (en) * | 2020-02-21 | 2020-07-24 | 浙江时空道宇科技有限公司 | Component selection method and device for satellite and electronic equipment |
| CN112184063A (en) * | 2020-10-23 | 2021-01-05 | 中国运载火箭技术研究院 | Aircraft equipment screening method and equipment and storage medium |
| CN114755512A (en) * | 2022-03-21 | 2022-07-15 | 知一航宇(北京)科技有限公司 | Selection method of small satellite components |
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