CN105352860B - A kind of data processing method of infrared dust sensor - Google Patents
A kind of data processing method of infrared dust sensor Download PDFInfo
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- 239000000428 dust Substances 0.000 title claims abstract description 127
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- 238000002474 experimental method Methods 0.000 claims abstract description 8
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- 230000006641 stabilisation Effects 0.000 claims abstract description 4
- 238000011105 stabilization Methods 0.000 claims abstract description 4
- 238000012360 testing method Methods 0.000 claims description 29
- 230000001815 facial effect Effects 0.000 claims description 4
- 238000010200 validation analysis Methods 0.000 claims description 4
- 238000005457 optimization Methods 0.000 abstract description 3
- 230000006870 function Effects 0.000 description 19
- 238000004088 simulation Methods 0.000 description 5
- 238000009825 accumulation Methods 0.000 description 2
- 230000001186 cumulative effect Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000013618 particulate matter Substances 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
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Abstract
The invention discloses a kind of data processing method of infrared dust sensor, this method includes at least following steps: step 1: changing the dust concentration in experimental situation air in proof cabinet and dust concentration is made to stablize a period of time.Step 2: acquiring the voltage value of the infrared dust sensor under different stabilization dust concentrations and with the high-precision dust detector institute indicating value under environment.Step 3: the collection value that step 2 obtains being fitted analysis with software, obtains function expression.Step 4: confirmatory experiment result.The present invention by the precision that the optimization of algorithm improves infrared dust sensor reach with the substantially approximate function of dust detector, and replace the method for dust detector to reduce costs by allowing infrared sensor in product.
Description
Technical field
The present invention relates to the voltage characteristic value acquisition technique field of infrared dust sensor more particularly to a kind of infrared dust
The data processing method of sensor.
Background technique
The technology of existing high-precision dust detector is substantially used in light irradiation air and is generated on suspended particulate substance
Scattering, while scattering light is collected in a certain special angle, obtain the curve that scattered light intensity changes over time, and then microprocessor benefit
With related algorithm, the particulate matter quantity of different-grain diameter in the equivalent grain size and unit volume of particulate matter is obtained thus to obtain dust
Concentration value.And the principle of the infrared dust sensor of p is also approximate with dust detector, but since the infrared ray depth of parallelism is not high,
The disadvantages of energy is not concentrated, so precision will be weaker than dust detector with reaction speed.But simultaneously dust detector at
This is also higher than infrared sensor, and infrared sensor results in it accurately due to the defect of itself itself and the not careful of algorithm
Degree can be poorer than dust sensor.
Summary of the invention
The purpose of the present invention: a kind of data processing method of infrared dust sensor is provided, can solve the prior art red
Because of the technical problem of algorithm precision inaccuracy caused by not perfect in outer dust sensor detection system, to reach in phase
Close replaces high-precision dust detector to reduce cost under the requirement of certain precision in application product with infrared sensor
Purpose.
To achieve the goals above, the technical scheme is that
A kind of data processing method of infrared dust sensor, this method include at least following steps:
Step 1: when changing the dust concentration in experimental situation air in proof cabinet and dust concentration being made to stablize one section
Between.
Step 2: acquiring the voltage value of the infrared dust sensor under different stabilization dust concentrations and under environment
High-precision dust detector institute indicating value.
Step 3: the collection value that step 2 obtains being fitted analysis with software, obtains function expression.
Step 4: confirmatory experiment result.
The data processing method of above-mentioned infrared dust sensor, wherein the step 1 include it is following step by step:
Step 1.1: in proof cabinet, while being put into dust detector, infrared dust sensor and air purifier, lead to
Burning facial tissue obtains dust and enters in proof cabinet, closes proof cabinet.
Step 1.2: opening air purifier, until allowing the registration of dust detector to stablize near nominative testing value, so
Closing air purifier waiting afterwards allows numerical value to be stablized near nominative testing value for 5 minutes.
The data processing method of above-mentioned infrared dust sensor, wherein in the step 1.2, described is specified
Test value nearby refers to nominative testing value ± 10ug/l.
The data processing method of above-mentioned infrared dust sensor, wherein the step 2 include it is following step by step:
Step 2.1: after numerical stability 5 minutes or so, in 5 ~ 6min, recording in one minute, all infrared powder
0.22ms, 0.24ms, 0.26ms, 0.28ms, 0.30ms, 0.32ms and 0.34ms in the period each time of dust sensor
Output voltage group；
Step 2.2: seeking average value X1_ave, X2_ave, X3_ of the output voltage group in step 2.1 within this minute
Ave, X4_ave, X5_ave, X6_ave, X7_ave, and saved with text mode.
The data processing method of above-mentioned infrared dust sensor, wherein in the step 3, the function table
Up to formula are as follows:
①、X4_ave≤660mv
Y=1.25*X7_ave-0.092*X1_ave-655.899；
②、660mv≤X4_ave≤938mv
Y=0.26*X7_ave+0.221*X1_ave-265.485；
③、938mv≤X4_ave≤1200mv
Y=0.665*X7_ave-0.297*X1_ave-150.579；
④、1200mv≤X4_ave≤1655mv
Y=0.247X7_ave-37.821；
⑤、1655mv≤X4_ave≤2000mv
Y=0.165*X7_ave+192.35；
⑥、X4_ave≥2000mv
Y=0.792*X1_ave-0.692*X7_ave+225.071；
Wherein, Y is dust concentration actual value, X1_ave, X2_ave, X3_ave, X4_ave, X5_ave, X6_ave, X7_
Ave is 0.22ms, 0.24ms, 0.26ms, 0.28ms, 0.30ms, 0.32ms and the 0.34ms in each period in one minute
Average output voltage class value.
The data processing method of above-mentioned infrared dust sensor, wherein the step 4 include it is following step by step:
Step 4.1: by the function expression write-in single-chip microcontroller in step 3, obtaining identical environment by testing again
Under the dust value that is shown with high-precision dust detector of the dust numerical value that shows of infrared dust sensor compare.
Step 4.2: if the actual deviation value compared not within the allowable range, re-starts test data of experiment.
Step 4.3: if the actual deviation value compared is within the allowable range, the result being considered as is reasonable；Pass through
Multiple test and validation obtains final function expression.
The data processing method of above-mentioned infrared dust sensor, wherein in the step 4.2 and step 4.3, institute
The allowed band for the actual deviation value that the comparison stated obtains is ± 20ug/l.
The present invention is reached and dust detector base by the precision that the optimization of algorithm improves infrared dust sensor
This approximate function, and replace the method for dust detector to reduce costs by allowing infrared sensor in product.
Detailed description of the invention
Fig. 1 is a kind of flow chart of the data processing method of infrared dust sensor of the present invention.
Fig. 2 is that a kind of prediction data accumulation of dust concentration of the data processing method of infrared dust sensor of the present invention is general
The relational graph of rate and observation data cumulative probability, wherein horizontal axis is observation data cumulative probability, and the longitudinal axis is that prediction data accumulation is general
Rate.
Specific embodiment
The following is further explained with reference to the attached drawings the embodiment of the present invention.
It refers to shown in attached drawing 1 and attached drawing 2, a kind of data processing method of infrared dust sensor, this method is at least wrapped
Include following steps:
Step 1: when changing the dust concentration in experimental situation air in proof cabinet and dust concentration being made to stablize one section
Between.
Step 2: acquiring the voltage value of the infrared dust sensor under different stabilization dust concentrations and under environment
High-precision dust detector institute indicating value.
Step 3: the collection value that step 2 obtains being fitted analysis with software, obtains function expression.
Step 4: confirmatory experiment result.
The step 1 include it is following step by step:
Step 1.1: in proof cabinet, while being put into dust detector, infrared dust sensor and air purifier, lead to
The methods of burning facial tissue obtains dust and enters in proof cabinet, closes proof cabinet.
Step 1.2: opening air purifier, until allowing the registration of dust detector to stablize near nominative testing value, so
Closing air purifier waiting afterwards allows numerical value to be stablized near nominative testing value for 5 minutes or so.
In the step 1.2, the nominative testing value nearby refers to nominative testing value ± 10ug/l.
The step 2 include it is following step by step:
Step 2.1: after numerical stability 5 minutes or so, in 5 ~ 6min, recording in one minute, all infrared powder
0.22ms, 0.24ms, 0.26ms, 0.28ms, 0.30ms, 0.32ms and 0.34ms in the period each time of dust sensor
Output voltage group.
Step 2.2: seeking average value X1_ave, X2_ave, X3_ of the output voltage group in step 2.1 within this minute
Ave, X4_ave, X5_ave, X6_ave, X7_ave, and saved with text mode.
In the step 3, the function expression are as follows:
①、X4_ave≤660mv
Y=1.25*X7_ave-0.092*X1_ave-655.899；
②、660mv≤X4_ave≤938mv
Y=0.26*X7_ave+0.221*X1_ave-265.485；
③、938mv≤X4_ave≤1200mv
Y=0.665*X7_ave-0.297*X1_ave-150.579；
④、1200mv≤X4_ave≤1655mv
Y=0.247X7_ave-37.821；
⑤、1655mv≤X4_ave≤2000mv
Y=0.165*X7_ave+192.35；
⑥、X4_ave≥2000mv
Y=0.792*X1_ave-0.692*X7_ave+225.071；
Wherein, Y is dust concentration actual value, X1_ave, X2_ave, X3_ave, X4_ave, X5_ave, X6_ave, X7_
Ave is 0.22ms, 0.24ms, 0.26ms, 0.28ms, 0.30ms, 0.32ms and the 0.34ms in each period in one minute
Average output voltage class value.
The step 4 include it is following step by step:
Step 4.1: by the function expression write-in single-chip microcontroller in step 3, obtaining identical environment by testing again
Under the dust value that is shown with high-precision dust detector of the dust numerical value that shows of infrared dust sensor compare.
Step 4.2: if the actual deviation value compared not within the allowable range, re-starts test data of experiment.
Step 4.3: if the actual deviation value compared is within the allowable range, the result being considered as is reasonable.It carries out
Continuous test and validation, available final function expression.
In the step 4.2 and step 4.3, the allowed band of the actual deviation value that the comparison obtains is ±
20ug/l。
In the case where air-borne dust concentration is stablized, by the single-chip microcontroller infrared dust sensor of STM-8 connection in primary week
30 A/D values are acquired every 0.02ms in phase (0.1s), and corresponding voltage value is converted by software, concurrently set dust
The numerical value that detector is shown under same environment be prevailing circumstances dust true value so as to be used to demarcate.Since each dust is dense
Angle value is corresponding with 30 A/D values i.e. 30 groups of voltages, but 30 groups of data of processing are too big for single-chip microcontroller memory burden, based on infrared
The principle of dust sensor when the 0.28ms of every subpulse is that its voltage reaches maximum value, therefore is selected with the 0.28th
First three and rear three (including 0.28ms) of millisecond have 7 voltage values altogether and are one group to be formed with practical dust concentration value
Corresponding relationship.In order to reduce error, every 160 data sliding window of progress is taken to the average value of this 7 voltage values, sliding
Stepping is 0.1 second.By changing dust concentration, the voltage group of available multiple groups dust concentration numerical value and infrared dust sensor
Corresponding relationship, since the voltage swing and dust concentration of the infrared dust sensor are approximately linearly related substantially.Then will
Test data is input to software and carries out linear fit to which quantitative obtains the relational expression of dust concentration size and voltage.
Gained expression formula is written in single-chip microcontroller, is shown by testing to obtain infrared dust sensor under identical environment again
The dust value that is shown with high-precision dust detector of dust numerical value compare, be considered as into if in allowed limits if difference
Function is met the requirements if gap is larger by correction factor.
Embodiment 1:
Since the congenital precision of transient response infrared sensor is not just high, present invention primarily contemplates be stable state respective party
The approximation in face.And the selection of environment is to facilitate change dust concentration in the closed subenvironment (moisture-resistant cabinet) of strong operability
Value measures.By taking 2 collection process as an example, the concentration of 2 PM2.5 is respectively 500ug/l, 480ug/l.
Step 1: in proof cabinet, while it being put into dust detector and infrared dust sensor and air purifier,
Smog is obtained by burning facial tissue and is entered in proof cabinet, proof cabinet is closed, opens air purifier, until allowing dust detector
Registration is stablized near nominative testing value 500ug/l (± 10ug/l), closes air purifier, then allows numerical value near the value
Stablize 5 minutes or so.It when 5 ~ 6min, records in one minute, then all infrared output voltage groups ask this
Average value X1_ave, X2_ave, X3_ave, X4_ave, X5_ave, X6_ave, the X7_ave of one group of voltage in minute, and with
Text mode saves.
Open air purifier, until allow dust detector registration stablize near nominative testing value 480ug/l (±
10ug/l), air purifier is closed, numerical value is then allowed to be stablized near the value 5 minutes or so.When 5 ~ 6min, note
It records in next minute, then all infrared output voltage groups seek the average value X1_ave, X2_ of one group of voltage in this minute
Ave, X3_ave, X4_ave, X5_ave, X6_ave, X7_ave, and saved with text mode.
Step 2: and so on, the gradient every about 20ug/l or so measures the dust concentration from 500ug/l to 0ug/l
The corresponding relationship of value and voltage.It is into due to having been described above concentration value in the specification of the infrared dust sensor with voltage approximate
Linear relationship, this reason it is assumed that dust concentration value is Y, voltage array X is X1_ave, X2_ave, X3_ave, X4_ave, X5_
Ave, X6_ave, X7_ave, i.e. expression formula are as follows:
Y=A*X1_ave+B*X2_ave+C*X3_ave+D*X4_ave+E*X5_ave+F*X6_ave+G*X7_ave+Z
Wherein, A, B, C, D, E, F, G are respectively voltage array X1_ave, X2_ave, X3_ave, X4_ave, X5_ave,
Proportionality coefficient before X6_ave, X7_ave, Z are constant coefficient.
By SPSS software to the linear analogue of data, available A, B, C, D, E, F, the value of G and Z are to the side of obtaining
Journey expression formula.
By constantly to the training of data and verifying, and the feature of infrared dust sensor self character curve is combined,
Function is divided into 6 sections to construct, the standard of segmentation is the average voltage level i.e. X4_ave at the 0.28th millisecond, constructed fuction
As follows (X1 ~ X7 be one group of voltage value, Y be the corresponding dust concentration value actual value of this group of voltage, PRE_1 be using function after
Dust concentration predicted value):
①、X4_ave≤660mv
Y=1.25*X7_ave-0.092*X1_ave-655.899；
②、660mv≤X4_ave≤938mv
Y=0.26*X7_ave+0.221*X1_ave-265.485；
③、938mv≤X4_ave≤1200mv
Y=0.665*X7_ave-0.297*X1_ave-150.579；
④、1200mv≤X4_ave≤1655mv
Y=0.247X7_ave-37.821；
⑤、1655mv≤X4_ave≤2000mv
Y=0.165*X7_ave+192.35；
⑥、X4_ave≥2000mv
Y=0.792*X1_ave-0.692*X7_ave+225.071。
Subordinate list 1 is experiment institute's measured data and software simulation as a result, X1 ~ X7 be one group of voltage value, and Y is this group of voltage pair
The dust concentration value actual value answered, PRE_1 are using the dust concentration simulation and forecast value after function.
Subordinate list 1:
| X1_ave | X2_ave | X3_ave | X4_ave | X5_ave | X6_ave | X7_ave | Actual concentrations value | Simulation and forecast value |
| 2872.13 | 3015.57 | 3088.47 | 3098.29 | 3057.31 | 2976.11 | 2857.83 | 499 | 499.5 |
| 2491.00 | 2617.92 | 2682.41 | 2692.50 | 2654.52 | 2584.38 | 2483.53 | 460 | 458.4 |
| 2388.15 | 2508.19 | 2571.68 | 2581.98 | 2547.94 | 2480.57 | 2383.91 | 447 | 446.3 |
| 2294.50 | 2411.49 | 2474.46 | 2484.18 | 2451.09 | 2386.19 | 2293.47 | 433 | 435.1 |
| 2190.64 | 2303.61 | 2365.14 | 2375.85 | 2346.64 | 2285.68 | 2200.34 | 418 | 417.8 |
| 2074.83 | 2183.80 | 2241.19 | 2253.79 | 2226.71 | 2172.15 | 2090.14 | 403 | 402.8 |
| 1786.33 | 1880.04 | 1931.58 | 1942.36 | 1919.99 | 1873.1 | 1805.66 | 390 | 389.5 |
| 1742.72 | 1834.69 | 1886.11 | 1897.14 | 1876.22 | 1829.76 | 1762.76 | 382 | 382.5 |
| 1668.13 | 1757.04 | 1806.13 | 1816.50 | 1796.20 | 1752.84 | 1687.81 | 370 | 370.1 |
| 1516.61 | 1598.18 | 1643.89 | 1655.45 | 1637.87 | 1598.51 | 1540.22 | 346 | 341.5 |
| 1449.50 | 1526.88 | 1571.14 | 1582.15 | 1566.13 | 1530.86 | 1474.81 | 325 | 325.6 |
| 1405.77 | 1481.99 | 1524.23 | 1535.84 | 1521.25 | 1485.52 | 1432.89 | 310 | 315.4 |
| 1330.85 | 1404.46 | 1446.46 | 1457.43 | 1444.23 | 1410.56 | 1359.73 | 298 | 297.6 |
| 1272.30 | 1341.36 | 1381.89 | 1392.85 | 1380.15 | 1348.91 | 1302.68 | 283 | 283.8 |
| 1179.49 | 1243.69 | 1282.58 | 1292.44 | 1280.29 | 1252.16 | 1209.50 | 262 | 261.1 |
| 1135.9 | 1199.30 | 1235.82 | 1247.11 | 1236.98 | 1208.72 | 1168.01 | 251 | 251.1 |
| 1095.89 | 1155.07 | 1190.84 | 1200.49 | 1191.05 | 1164.44 | 1125.85 | 242 | 242.1 |
| 1061.37 | 1121.06 | 1154.72 | 1165.25 | 1156.21 | 1132.01 | 1094.23 | 228 | 228.5 |
| 1020.26 | 1078.14 | 1111.7 | 1121.92 | 1113.29 | 1089.51 | 1052.90 | 214 | 213.4 |
| 901.315 | 953.364 | 982.471 | 992.327 | 985.623 | 964.976 | 932.260 | 170 | 170.1 |
| 867.996 | 918.465 | 946.739 | 956.254 | 948.732 | 929.342 | 898.940 | 159 | 157.8 |
| 852.722 | 900.545 | 930.242 | 938.78 | 932.603 | 913.527 | 883.764 | 151 | 152.9 |
| 828.644 | 875.456 | 903.162 | 911.970 | 905.636 | 886.108 | 859.104 | 142 | 141.2 |
| 803.830 | 850.169 | 877.132 | 885.617 | 879.466 | 860.950 | 832.756 | 130 | 128.9 |
| 785.850 | 831.302 | 857.872 | 864.721 | 858.677 | 841.335 | 814.579 | 121 | 120.2 |
| 764.730 | 807.995 | 834.606 | 842.157 | 836.595 | 818.193 | 791.011 | 110 | 109.3 |
| 745.322 | 789.907 | 814.541 | 822.604 | 816.441 | 799.957 | 774.384 | 100 | 100.9 |
| 727.288 | 769.655 | 793.481 | 801.951 | 796.810 | 778.984 | 754.508 | 91 | 91.6 |
| 691.269 | 733.054 | 757.721 | 764.632 | 760.664 | 745.809 | 722.028 | 77 | 75.6 |
| 672.433 | 712.115 | 734.500 | 743.595 | 738.412 | 722.679 | 700.325 | 65 | 65.6 |
| 653.181 | 689.197 | 711.492 | 719.182 | 713.669 | 698.592 | 676.706 | 55 | 54.9 |
| 631.994 | 668.570 | 690.008 | 698.111 | 693.249 | 678.906 | 659 | 45 | 46.1 |
| 608.239 | 644.144 | 665.101 | 671.513 | 668.347 | 655.652 | 635.027 | 35 | 34.5 |
| 590.234 | 622.765 | 643.300 | 649.172 | 643.477 | 630.549 | 609.974 | 24 | 24.1 |
| 579.679 | 613.171 | 632.993 | 639.411 | 635.747 | 622.879 | 602.531 | 16 | 16.3 |
| 571.640 | 605.035 | 624.470 | 630.221 | 624.861 | 611.508 | 592.791 | 5 | 4.9 |
The knot that is simulated it can be seen from subordinate list 1 and the absolute value of actual value difference it is basic≤10ug/l, that is, think to obtain
Functional relation be correct effective.
Subordinate list 2 is the corresponding analog result of different functions section after the simulation of SPSS software.
Subordinate list 2:
| Function segment | It is adjusted | Standard error | Residual sum of squares (RSS) | Significance test | |
| ① | 1.000 | / | / | 0.000 | 0.000 |
| ② | 0.999 | 0.999 | 1.140 | 11.702 | 0.000 |
| ③ | 1.000 | 0.999 | 1.057 | 3.351 | 0.000 |
| ④ | 0.997 | 0.993 | 2.969 | 52.885 | 0.000 |
| ⑤ | 1.000 | 0.999 | 0.507 | 0.514 | 0.000 |
| ⑥ | 0.999 | 0.999 | 1.637 | 8.038 | 0.000 |
By subordinate list 2 it is found that the significance test of 6 sections of functions is all 0.000≤0.05, it is believed that 6 established return
It is effective for returning equation all.The related coefficient between the independent variable and dependent variable of measured data is indicated, closer to 1 table
Show that correlation is better, 6 sections of functions it can be seen from tableIt is all in close proximity to 1, illustrates that the correlation of measurement data is very
Good.It is adjustedIt is then the relationship of the predicted value and independent variable after functional simulation, the display of subordinate list 2 is also close
Illustrate that the predicted value after simulation is also accurately in 1.
Then gained expression formula is written in single-chip microcontroller, by testing to obtain infrared dust sensor under identical environment again
The dust value that the dust numerical value of display is shown with high-precision dust detector compares, and by continuous test and validation, discovery exists
Infrared dust sensor steady-state value and the show value of high-precision dust measurement are substantially approximate under same environment, percentage error
Error_percentage≤10% meets actual it can be considered that function is rationally to can be used.
In conclusion the present invention is reached by the precision that the optimization of algorithm improves infrared dust sensor and dust
The substantially approximate function of detector, and replace the method for dust detector to reduce by allowing infrared sensor in product
Cost.
The above description is only a preferred embodiment of the present invention, is not intended to limit the scope of the invention, all utilizations
Equivalent structure transformation made by present specification, directly or indirectly with the technology neck for being attached to other Related products
Domain is included within the scope of the present invention.
Claims (6)
1. a kind of data processing method of infrared dust sensor, it is characterised in that: this method includes at least following steps:
Step 1: changing the dust concentration in experimental situation air in proof cabinet and dust concentration is made to stablize a period of time；
Step 2: acquiring the voltage value of the infrared dust sensor under different stabilization dust concentrations and with high-precision under environment
Spend dust detector institute indicating value；
Step 3: the collection value that step 2 obtains being fitted analysis with software, obtains function expression；In the step 3
In, the function expression are as follows:
①、X4_ave≤660mv
Y=1.25*X7_ave-0.092*X1_ave-655.899；
②、660mv≤X4_ave≤938mv
Y=0.26*X7_ave+0.221*X1_ave-265.485；
③、938mv≤X4_ave≤1200mv
Y=0.665*X7_ave-0.297*X1_ave-150.579；
④、1200mv≤X4_ave≤1655mv
Y=0.247X7_ave-37.821；
⑤、1655mv≤X4_ave≤2000mv
Y=0.165*X7_ave+192.35；
⑥、X4_ave≥2000mv
Y=0.792*X1_ave-0.692*X7_ave+225.071；
Wherein, Y is dust concentration actual value, and X1_ave, X2_ave, X3_ave, X4_ave, X5_ave, X6_ave, X7_ave is
0.22ms, 0.24ms, 0.26ms, 0.28ms, 0.30ms, 0.32ms and the 0.34ms's in each period is averaged in one minute
Output voltage class value；
Step 4: confirmatory experiment result.
2. the data processing method of infrared dust sensor according to claim 1, it is characterised in that: the step 1
Including as follows step by step:
Step 1.1: in proof cabinet, while being put into dust detector, infrared dust sensor and air purifier, pass through burning
Facial tissue obtains dust and enters in proof cabinet, closes proof cabinet；
Step 1.2: opening air purifier, until allowing the registration of dust detector to stablize near nominative testing value, then close
Closing air purifier waiting allows numerical value to be stablized near nominative testing value for 5 minutes.
3. the data processing method of infrared dust sensor according to claim 2, it is characterised in that: in the step
In 1.2, the nominative testing value nearby refers to nominative testing value ± 10ug/l.
4. the data processing method of infrared dust sensor according to claim 1, it is characterised in that: the step 2
Including as follows step by step:
Step 2.1: after numerical stability 5 minutes or so, in 5~6min, recording in one minute, all infrared dust pass
0.22ms, 0.24ms, 0.26ms, 0.28ms, 0.30ms, 0.32ms and 0.34ms's in the period each time of sensor is defeated
Voltage group out；
Step 2.2: average value X1_ave, X2_ave, X3_ave of the output voltage group in step 2.1 within this minute are sought,
X4_ave, X5_ave, X6_ave, X7_ave, and saved with text mode.
5. the data processing method of infrared dust sensor according to claim 1, it is characterised in that: the step 4
Including as follows step by step:
Step 4.1: the function expression in step 3 is written in single-chip microcontroller, it is red under identical environment by testing to obtain again
The dust value that the dust numerical value that outer dust sensor is shown is shown with high-precision dust detector compares；
Step 4.2: if the actual deviation value compared not within the allowable range, re-starts test data of experiment；
Step 4.3: if the actual deviation value compared is within the allowable range, the result being considered as is reasonable；By multiple
Test and validation obtains final function expression.
6. the data processing method of infrared dust sensor according to claim 5, it is characterised in that: in the step
4.2 and step 4.3 in, the allowed band of the actual deviation value that the comparison obtains is ± 20ug/l.
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