CN105279534A - RFID label location deployment test system - Google Patents
RFID label location deployment test system Download PDFInfo
- Publication number
- CN105279534A CN105279534A CN201510724031.6A CN201510724031A CN105279534A CN 105279534 A CN105279534 A CN 105279534A CN 201510724031 A CN201510724031 A CN 201510724031A CN 105279534 A CN105279534 A CN 105279534A
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- China
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- test
- rfid label
- read write
- write line
- label tag
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Abstract
The invention relates to an RFID label location deployment test system. The RFID label location deployment test system is used for testing the application situation of RFID label location deployment and is particular suitable for occasions requesting testing location deployment selection of RFID labels on the surface of an object to be tested, such as middle and small-sized enterprises of RFID system development and application, and scientific research institutes. The RFID label location deployment test system includes a test host, a reader-writer, a worktable, an antenna fixing bracket and an antenna; the antenna fixing bracket is arranged at one side of the worktable; the antenna is mounted on the antenna fixing bracket; according to the antenna fixing bracket, two slide rails are adopted, so that the antenna can move up and down through the slide rails; the reader-writer is connected with the test host through a network cable; the antenna is connected with the reader-writer through a feeder; the reader-writer is mounted at the bottom of the antenna fixing bracket; a PC is adopted as the test host; the test host reads label data information acquired by the reader-writer and completes RFID label position deployment testing.
Description
Technical field
What deployment test macro in RFID label tag position of the present invention related to is the test of a kind of RFID label tag position application deployment situation, and being particularly suitable for vast medium and small rfid system Application and Development enterprise, scientific research institutions etc. needs the surperficial RFID label tag position of carrying out of measuring targets to dispose the occasion of selecting to carry out testing.
Background technology
Along with the widespread use of RFID technique, enterprise or rfid system integrator, before carrying out rfid system field conduct, need to test worked out rfid system scheme, check the feasibility of scheme, reduce RFID project implementation risk.Whether the position of label is disposed appropriate, seems particularly important, not only can save time, greatly can also increase the success ratio of tag read in later stage production practices.Also do not have at present to carry out the system that label position disposes test, therefore the such deployment of system to label position of eager needs is tested and optimizes.
Summary of the invention
The object of the invention is to provide a kind of RFID label tag position to dispose test macro for above-mentioned weak point, utilize Test Host to carry out scene 3D modeling to article to be measured; By at object under test surface mobile RFID label position, the label data information of different test zone is gathered, analyzes, optimized, generates final test report; And experimentally data analysis goes out optimum label deployed position.
RFID label tag position is disposed test macro and is taked following technical scheme to realize:
RFID label tag position is disposed test macro and is comprised Test Host, read write line, worktable, antenna fixing stand and antenna, and antenna fixing stand is arranged on worktable side, and astronomical cycle is on antenna fixing stand; Described antenna fixing stand adopts double sided slider bar, and antenna can be moved up and down by slide rail; Read write line is connected with Test Host by netting twine, and antenna is connected with read write line by feeder line;
Read write line is arranged on bottom antenna fixing stand;
Described Test Host adopts PC, and Test Host reads the label data information that read write line collects, and completes RFID label tag position and disposes test;
Control module and test module are housed in Test Host, and control module is for controlling the operation of test module, and control module has RFID label tag deployment system control inerface;
Test module comprises:
Modeling submodule, for carrying out scene 3D modeling to article to be measured;
Read write line configuration submodule, at RFID label tag deployment system option and installment read write line;
Focus test submodule, for testing the average RF decay power of current label position.
Label position is disposed when test macro is tested and is comprised the steps:
1) by modeling submodule, scene 3D modeling is carried out to article to be measured;
1-1) on the RFID label tag deployment system control inerface of Test Host, click " object is set " button, launch " object is set " sub-panel;
1-2) use default parameters to create article basic configuration to be measured, in step 1-1) described in " object is set " sub-panel in complete establishment;
2) modeling submodule configuration read write line;
Option and installment read write line on the RFID label tag deployment system control inerface of Test Host; Through overtesting, each 10 milliseconds consuming time of read write line operation; The mortality of read write line operation is 0;
3) test submodule by focus and carry out focus test;
3-1) launch " test " sub-panel in RFID label tag deployment system control inerface; This panel is for controlling test process; Launch " power attenuation degree " sub-panel in RFID label tag deployment system control inerface simultaneously, observe the change of read write line radio-frequency power;
3-2) in RFID label tag deployment system control inerface, the upper surface of mouse right click casing, one piece of label placed by casing to be measured;
3-3) perform focus test;
3-4) click " record/movement " button in RFID label tag deployment system interface to record " the average RF decay power " of current label position, this performance number is recorded on the position of current label;
3-5) label moves to next test position, repeat step 3-4), until institute be hopeful test region all tested;
4) " stopping " button clicked in RFID label tag deployment system control inerface stops test, label position disposes the focus test report that test subsystems generates each test zone automatically, and on 3D model of place, demonstrate the test case of different test zone with different colours; The label position of green area is disposed reading performance and is better than red area.
Advantage of the present invention: label position is disposed test macro and utilized Test Host to carry out scene 3D modeling to article to be measured; Regional network can be completed on object under test surface to format, automatically divide and form different test zones; By at object under test surface mobile RFID label position, the label data information of different test zone is gathered, analyzes, optimized, generates final test report.Test process instructs test position by program and hardware, and experimentally data analysis goes out optimum label deployed position.Not only simple and practical, and analyze accurately, facilitate the tag operational of producing the later stage.
Accompanying drawing explanation
Below with reference to accompanying drawing, the invention will be further described:
Fig. 1 is the structural representation that label position of the present invention disposes test macro.
In figure: 1, Test Host, 2, read write line, 3, worktable, 4, antenna fixing stand, 5, antenna, 6, article to be measured.
Embodiment
With reference to accompanying drawing 1, RFID label tag position is disposed test macro and is comprised Test Host 1, read write line 2, worktable 3, antenna fixing stand 4 and antenna 5, and antenna fixing stand 4 is arranged on worktable 3 side, and antenna 5 is arranged on antenna fixing stand 4; Described antenna fixing stand 4 adopts double sided slider bar, and antenna 5 can be moved up and down by slide rail; Read write line 2 is connected with Test Host 1 by netting twine, and antenna 5 is connected with read write line 2 by feeder line;
Read write line 2 is arranged on bottom antenna fixing stand 4;
Described Test Host 1 adopts PC, and Test Host 1 reads the label data information that read write line 2 collects, and completes RFID label tag position and disposes test;
Test Host 1 li is equipped with control module and test module, and control module is for controlling the operation of test module, and control module has RFID label tag deployment system control inerface;
Test module comprises:
Modeling submodule, for carrying out scene 3D modeling to article to be measured;
Read write line configuration submodule, at RFID label tag deployment system option and installment read write line;
Focus test submodule, for testing the average RF decay power of current label position.
Label position is disposed when test macro is tested and is comprised the steps:
1) by modeling submodule, scene 3D modeling is carried out to article 6 to be measured;
1-1) on the RFID label tag deployment system control inerface of Test Host 1, click " object is set " button, launch " object is set " sub-panel;
1-2) use default parameters to create article basic configuration to be measured, in step 1-1) described in " object is set " sub-panel in complete establishment;
2) modeling submodule configuration read write line;
Option and installment read write line on the RFID label tag deployment system control inerface of Test Host 1; Through overtesting, each 10 milliseconds consuming time of read write line operation; The mortality of read write line operation is 0;
3) test submodule by focus and carry out focus test;
3-1) launch " test " sub-panel in RFID label tag deployment system control inerface; This panel is for controlling test process; Launch " power attenuation degree " sub-panel in RFID label tag deployment system control inerface simultaneously, observe the change of read write line radio-frequency power;
3-2) in RFID label tag deployment system control inerface, the upper surface of mouse right click casing, one piece of label placed by casing to be measured;
3-3) perform focus test;
3-4) click " record/movement " button in RFID label tag deployment system interface to record " the average RF decay power " of current label position, this performance number is recorded on the position of current label;
3-5) label moves to next test position, repeat step 3-4), until institute be hopeful test region all tested;
4) " stopping " button clicked in RFID label tag deployment system control inerface stops test, label position disposes the focus test report that test subsystems generates each test zone automatically, and on 3D model of place, demonstrate the test case of different test zone with different colours; The label position of green area is disposed reading performance and is better than red area.
Claims (3)
1. a test macro is disposed in RFID label tag position, and it is characterized in that: comprise Test Host, read write line, worktable, antenna fixing stand and antenna, antenna fixing stand is arranged on worktable side, and astronomical cycle is on antenna fixing stand; Described antenna fixing stand adopts double sided slider bar, and antenna can be moved up and down by slide rail; Read write line is connected with Test Host by netting twine, and antenna is connected with read write line by feeder line;
Read write line is arranged on bottom antenna fixing stand;
Described Test Host adopts PC, and Test Host reads the label data information that read write line collects, and completes RFID label tag position and disposes test.
2. test macro is disposed in RFID label tag position according to claim 1, it is characterized in that: control module and test module are housed in described Test Host, control module is for controlling the operation of test module, and control module has RFID label tag deployment system control inerface;
Test module comprises:
Modeling submodule, for carrying out scene 3D modeling to article to be measured;
Read write line configuration submodule, at RFID label tag deployment system option and installment read write line;
Focus test submodule, for testing the average RF decay power of current label position.
3. test macro is disposed in RFID label tag position according to claim 2, it is characterized in that, comprises the steps: when this system is tested
1) by modeling submodule, scene 3D modeling is carried out to article to be measured;
1-1) on the RFID label tag deployment system control inerface of Test Host, click " object is set " button, launch " object is set " sub-panel;
1-2) use default parameters to create article basic configuration to be measured, in step 1-1) described in " object is set " sub-panel in complete establishment;
2) modeling submodule configuration read write line;
Option and installment read write line on the RFID label tag deployment system control inerface of Test Host; Through overtesting, each 10 milliseconds consuming time of read write line operation; The mortality of read write line operation is 0;
3) test submodule by focus and carry out focus test;
3-1) launch " test " sub-panel in RFID label tag deployment system control inerface; This panel is for controlling test process; Launch " power attenuation degree " sub-panel in RFID label tag deployment system control inerface simultaneously, observe the change of read write line radio-frequency power;
3-2) in RFID label tag deployment system control inerface, the upper surface of mouse right click casing, one piece of label placed by casing to be measured;
3-3) perform focus test;
3-4) click " record/movement " button in RFID label tag deployment system interface to record " the average RF decay power " of current label position, this performance number is recorded on the position of current label;
3-5) label moves to next test position, repeat step 3-4), until institute be hopeful test region all tested;
4) " stopping " button clicked in RFID label tag deployment system control inerface stops test, label position disposes the focus test report that test subsystems generates each test zone automatically, and on 3D model of place, demonstrate the test case of different test zone with different colours; The label position of green area is disposed reading performance and is better than red area.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510724031.6A CN105279534B (en) | 2015-10-30 | 2015-10-30 | Test system is disposed in RFID label tag position |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510724031.6A CN105279534B (en) | 2015-10-30 | 2015-10-30 | Test system is disposed in RFID label tag position |
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| Publication Number | Publication Date |
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| CN105279534A true CN105279534A (en) | 2016-01-27 |
| CN105279534B CN105279534B (en) | 2017-12-08 |
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| CN201510724031.6A Active CN105279534B (en) | 2015-10-30 | 2015-10-30 | Test system is disposed in RFID label tag position |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110650221A (en) * | 2019-09-26 | 2020-01-03 | 环鸿电子（昆山）有限公司 | IP self-correcting test system |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110227748A1 (en) * | 2010-03-19 | 2011-09-22 | Marlex Engineering Inc. | Radio-frequency identification (rfid) safety system |
| CN203325012U (en) * | 2013-06-26 | 2013-12-04 | 南京三宝科技股份有限公司 | Multi-directional automatic reader-writer label test detection device |
| CN204116490U (en) * | 2014-09-26 | 2015-01-21 | 深圳市金瑞铭科技有限公司 | Ultrahigh frequency electronic tag testing apparatus |
-
2015
- 2015-10-30 CN CN201510724031.6A patent/CN105279534B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110227748A1 (en) * | 2010-03-19 | 2011-09-22 | Marlex Engineering Inc. | Radio-frequency identification (rfid) safety system |
| CN203325012U (en) * | 2013-06-26 | 2013-12-04 | 南京三宝科技股份有限公司 | Multi-directional automatic reader-writer label test detection device |
| CN204116490U (en) * | 2014-09-26 | 2015-01-21 | 深圳市金瑞铭科技有限公司 | Ultrahigh frequency electronic tag testing apparatus |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110650221A (en) * | 2019-09-26 | 2020-01-03 | 环鸿电子（昆山）有限公司 | IP self-correcting test system |
| CN110650221B (en) * | 2019-09-26 | 2022-04-15 | 环鸿电子（昆山）有限公司 | IP self-correcting test system |
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| Publication number | Publication date |
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| CN105279534B (en) | 2017-12-08 |
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