CN105241867A - Detection method of content of ruthenium element in electronic materials - Google Patents

Detection method of content of ruthenium element in electronic materials Download PDF

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Publication number
CN105241867A
CN105241867A CN201410325314.9A CN201410325314A CN105241867A CN 105241867 A CN105241867 A CN 105241867A CN 201410325314 A CN201410325314 A CN 201410325314A CN 105241867 A CN105241867 A CN 105241867A
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CN
China
Prior art keywords
content
ruthenium element
detection method
electronic material
electronic materials
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201410325314.9A
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Chinese (zh)
Inventor
费沁妮
赵杰
周杰
闫敏
肖利军
朱强
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SUZHOU ELECTRICAL APPLIANCE SCIENCE RESEARCH INSTITUTE Co Ltd
Original Assignee
SUZHOU ELECTRICAL APPLIANCE SCIENCE RESEARCH INSTITUTE Co Ltd
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Priority to CN201410325314.9A priority Critical patent/CN105241867A/en
Publication of CN105241867A publication Critical patent/CN105241867A/en
Pending legal-status Critical Current

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Abstract

The invention provides a method which can effectively detect the content of ruthenium element in electronic materials, wherein inductive coupling plasma atomic emission spectroscopy (ICP-OES) is employed in the method to analyze and test the content of ruthenium element. A to-be-tested electronic material sample, during pre-treatment, needs to be subjected to acid-adding digestion with a microwave digestion system provided with a high-pressure digestion pot.

Description

The detection method of ruthenium element content in a kind of electronic material
Technical field
The present invention relates to the detection method of ruthenium element content in a kind of electronic material, belong to poisonous and harmful substance detection technique field in electronic and electrical equipment.
Background technology
Ruthenium element is the one in platinum group, can be used to manufacture alloy as electric contact material and hard grind wimet etc., is how many, needs a kind of detection method to detect for the content that whether there is ruthenium element and ruthenium element in electronic material.
Summary of the invention
Detect the content of ruthenium element for needing in electronic material, the invention provides a kind of can the quantitative method of ruthenium element content in detected electrons material.
The present invention includes and use inductively coupled plasma atomic emission spectrum (ICP-OES) test the content of ruthenium element in electronic material and clear up carrying out acid adding with the microwave digestion system being furnished with high-pressure digestion tank during the pre-treatment of associated electrical material sample.
Accompanying drawing explanation
Accompanying drawing is the operational flowchart of the embodiment of the present invention.
Embodiment
By specific instantiation, embodiments of the present invention are described once, the content that those skilled in the art can be disclosed by instructions understands advantage of the present invention and effect easily.The present invention is also implemented by other different instantiations or is applied, and the every details in this instructions also can based on different viewpoints and application, carries out various modification and change not deviating under spirit of the present invention.
The operational flowchart of the embodiment of the present invention, as shown in Figure 1, take 0.2g sample in counteracting tank, be accurate to 0.1mg, the hydrofluorite of the red fuming nitric acid (RFNA) and about 3ml that slowly add about 9ml is respectively as digestion agent, seal and counteracting tank is put into microwave system and heat with suitable heating schedule, clear up completely and be cooled to room temperature, filtration goes in 100ml volumetric flask, deionized water is settled to scale, shake up to be measured, adopt identical reagent, carry out blank assay at identical conditions, configure standard solution again, with inductively coupled plasma atomic emission spectrum (ICP-OES) quantitative test, after Criterion curve, measure blank, sample solution, according to the signal reading of each sample, corresponding concentration is checked in by typical curve.
In sample pre-treatments of the present invention, the digestion agent added also can the needing to select respectively and add other reagent and (as add the dense HCl of 2 ± 2ml in the potpourri of nitric acid and hydrochloric acid of degree of oxidation per sample; Add the hydrogen peroxide of 0.1 ~ 2ml30%; Add the secondary deionized water of 0 ~ 5m1), clear up in the process of cooling, appropriate boric acid and fluorine ion complexing need have been added, to protect quartzy plasma torch.
Above-described embodiment is only exemplary illustration principle of the present invention and effect thereof, but not for limiting the present invention.Any those skilled in the art all without prejudice under spirit of the present invention and category, can carry out modifying to above-mentioned enforcement and change.Therefore, the scope of the present invention, should with the scope of claims for foundation.

Claims (2)

1. the detection method of ruthenium element content in electronic material, is characterized in that using inductively coupled plasma atomic emission spectrum (ICP-OES) to test the content of ruthenium element in electronic material.
2. the detection method of ruthenium element content in a kind of electronic material according to claim 1, is characterized in that associated electrical material sample carries out acid adding when pre-treatment with the microwave digestion system being furnished with high-pressure digestion tank and clears up.
CN201410325314.9A 2014-07-07 2014-07-07 Detection method of content of ruthenium element in electronic materials Pending CN105241867A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201410325314.9A CN105241867A (en) 2014-07-07 2014-07-07 Detection method of content of ruthenium element in electronic materials

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410325314.9A CN105241867A (en) 2014-07-07 2014-07-07 Detection method of content of ruthenium element in electronic materials

Publications (1)

Publication Number Publication Date
CN105241867A true CN105241867A (en) 2016-01-13

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Family Applications (1)

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CN201410325314.9A Pending CN105241867A (en) 2014-07-07 2014-07-07 Detection method of content of ruthenium element in electronic materials

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CN (1) CN105241867A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105606392A (en) * 2016-02-16 2016-05-25 上海屹尧仪器科技发展有限公司 Full-automatic microwave pretreatment method
CN108152270A (en) * 2017-11-23 2018-06-12 中国航发北京航空材料研究院 A kind of method of ruthenium element content in Digestion high temperature alloy
CN108254364A (en) * 2016-12-28 2018-07-06 苏州电器科学研究院股份有限公司 The detection method of gold dollar cellulose content in a kind of electronic material
CN110146490A (en) * 2019-06-14 2019-08-20 北京北达智汇微构分析测试中心有限公司 A method of with micro ruthenium element in ICP-OES measurement drug

Citations (3)

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Publication number Priority date Publication date Assignee Title
CN101082546A (en) * 2007-06-29 2007-12-05 天津师范大学 Compounds used for element forming volatile matter
CN102877033A (en) * 2011-07-14 2013-01-16 北京有色金属研究总院 Manganese alloy target material and its manufacturing method
CN103721709A (en) * 2013-12-23 2014-04-16 浙江大学 Preparation method for preparing cyclohexene catalyst by employing selective hydrogenation of benzene

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101082546A (en) * 2007-06-29 2007-12-05 天津师范大学 Compounds used for element forming volatile matter
CN102877033A (en) * 2011-07-14 2013-01-16 北京有色金属研究总院 Manganese alloy target material and its manufacturing method
CN103721709A (en) * 2013-12-23 2014-04-16 浙江大学 Preparation method for preparing cyclohexene catalyst by employing selective hydrogenation of benzene

Non-Patent Citations (2)

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Title
周恺等: "ICP-AES测定钯钌合金中的钌", 《光谱实验室》 *
杨红艳等: "ICP-AES 测定复杂二次资源物料中钌含量干扰情况研究", 《贵金属》 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105606392A (en) * 2016-02-16 2016-05-25 上海屹尧仪器科技发展有限公司 Full-automatic microwave pretreatment method
CN108254364A (en) * 2016-12-28 2018-07-06 苏州电器科学研究院股份有限公司 The detection method of gold dollar cellulose content in a kind of electronic material
CN108152270A (en) * 2017-11-23 2018-06-12 中国航发北京航空材料研究院 A kind of method of ruthenium element content in Digestion high temperature alloy
CN110146490A (en) * 2019-06-14 2019-08-20 北京北达智汇微构分析测试中心有限公司 A method of with micro ruthenium element in ICP-OES measurement drug

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Application publication date: 20160113