CN105136633A - Pulsed infrared dust concentration detection circuit - Google Patents
Pulsed infrared dust concentration detection circuit Download PDFInfo
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- CN105136633A CN105136633A CN201510489396.5A CN201510489396A CN105136633A CN 105136633 A CN105136633 A CN 105136633A CN 201510489396 A CN201510489396 A CN 201510489396A CN 105136633 A CN105136633 A CN 105136633A
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Abstract
The invention discloses a pulsed infrared dust concentration detection circuit, which is composed of an analog circuit and a digital circuit. The analog circuit comprises four stages of operational amplifiers connected in order. The non-inverting end and inverting end of a first stage operational amplifier are connected by a phototube. The infrared luminous tube of the phototube is connected between the collector electrode and digital ground of a triode, an infrared receiving tube is connected between the non-inverting end and inverting end of the first stage operational amplifier. A capacitor C1 is connected between a power supply and the digital ground, a resistor R1 is connected between the power supply and the emitting electrode of the triode, a capacitor C2 is connected between the emitting electrode of the triode and the digital ground, and a resistor R3 is connected between the PWM port of the digit circuit and the base electrode of the triode. A single chip microcomputer emits PWM pulse to drive the triode by the resistor R3. Step-by-step amplification is employed to conduct signal processing, precisely control the effective signal amplitude, and maximumly reduce noise interference. The circuit is internally added with a charge storage and driving part circuit, can realize autonomous driving, and has no need for an additional external power supply.
Description
Technical field
The present invention relates to a kind of dust concentration detector device, testing circuit especially wherein.
Background technology
Dust concentration detector is primarily of the composition such as testing circuit, detect aperture, and the utilizing emitted light beam warp formed in light channel structure after the luminotron luminescence in testing circuit crosses detect aperture, and when not having dust in detect aperture, launching optical axis can linearly propagate; When there being dust in detect aperture, dust is to light generation scattering process, and through the light of detect aperture to surrounding scattering, such light just changes thus the signal of output is changed.The integrated chip that testing circuit adopts a level Four to amplify, amplifies the signal that luminotron receives, finally exports a simulating signal.The subject matter that this dust concentration testing circuit exists is:
1, this dust concentration testing circuit is only a passive detection circuit, does not possess the function of signal transacting and key message storage.
2, luminotron is a passive device, just can must work under external PWM signal drives, and drive the power supply of luminotron must be provided separately by external circuit, being equivalent to a detector product needed provides two-way power supply to work.
3, luminotron works under external PWM signal drives, and export the signal of a simulation, this simulating signal affects greatly by supply voltage and drive singal, and precision is low.
4, the precision that dust concentration detects is overly dependent upon the precision of integrated chip, and controllability is low.
Summary of the invention
Object of the present invention will solve above-mentioned prior art Problems existing exactly, proposes one and independently can drive the direct output digit signals of luminotron, energy without the need to outside additional power supply and control the infrared dust concentration testing circuit of accurate pulsed.
The present invention be solve the problem adopt technical scheme be: the present invention is made up of mimic channel and digital circuit, mimic channel comprises the level Four amplifier be connected successively, connect photoelectric tube, output terminal between the in-phase end of first order amplifier and end of oppisite phase and connect second level amplifier, third level amplifier and fourth stage amplifier successively, the output terminal of fourth stage amplifier connects digital circuit; Photoelectric tube is made up of infraluminescence pipe and infrared receiving tube, the collector that infraluminescence pipe is connected to triode is between digitally, between the in-phase end that infrared receiving tube is connected to first order amplifier and end of oppisite phase, contact resistance R4 between the end of oppisite phase and output terminal of first order amplifier; Electric capacity C1 connect power supply and digitally between, resistance R1 connects between power supply and the emitter of described triode, electric capacity C2 be connected to described triode emitter and digitally between, resistance R2 connects emitter and the base stage of described triode, and resistance R3 connects the base stage of PWM port to described triode of digital circuit; Digital circuit has a single-chip microcomputer, and single-chip microcomputer sends pwm pulse and drives described triode through resistance R3, and infraluminescence pipe sends pulsed infrared light.
The advantage that the present invention has after adopting technique scheme is:
1, the present invention adopts the mode of amplifying step by step to carry out signal transacting, is conducive to the parameter regulating amplifying circuit at different levels, accurately controls the amplitude of useful signal, at utmost reduces the interference of electrical noise.
2, inside circuit of the present invention adds charge storage and drive part circuit, can independently drive, and does not need outside to provide additional power supply.
3, circuit structure inside of the present invention adds microprocessing unit, independently can drive luminotron, and gathers useful signal according to proprietary logic.
4, the microprocessing unit of inside circuit of the present invention carries out a series of computing to the useful signal collected, and directly can export the digital signal that can receive for other single-chip microcomputer.
5, circuit structure entirety of the present invention has the closed-loop control mechanism such as driving, reception, amplification, collection, computing, feedback, substantially increases accuracy of detection.
6, the dust concentration detector adopting circuit structure of the present invention to make initiatively outwards can export dust concentration signal, facilitates the data acquisition of external circuit.
Accompanying drawing explanation
Fig. 1 is simulation part separation structure connection layout of the present invention;
Fig. 2 is numerical portion structural drawing of the present invention.
Embodiment
See Fig. 1 and Fig. 2, the present invention is made up of artificial circuit part and these two parts of digital circuits section, and wherein, digital circuits section provides drive singal, gathers the final output signal of artificial circuit part simultaneously.
Artificial circuit part comprises the level Four amplifier be connected successively, is connected between the output terminal of prime amplifier and the in-phase end of rear class amplifier by electric capacity.Wherein, connect photoelectric tube between the in-phase end of first order amplifier IC1_A and end of oppisite phase, the output terminal of first order amplifier IC1_A connects second level amplifier IC1_B, third level amplifier IC1_C, fourth stage amplifier IC1_D successively.The output terminal of fourth stage amplifier IC1_D connects digital circuits section.Photoelectric tube is made up of infraluminescence pipe SE and infrared receiving tube RE.Connect infrared receiving tube RE between the in-phase end of first order amplifier IC1_A and end of oppisite phase, infrared receiving tube RE receives the signal of infraluminescence pipe SE, and infraluminescence pipe SE connecting triode Q1, triode Q1 drive infraluminescence pipe SE to send pulsed infrared light.
Electric capacity C1 connects power supply VCC and digitally between GND, forms elementary filtering; Resistance R1 connects between power supply VCC and the emitter of triode Q1, electric capacity C2 be connected to triode Q1 emitter and digitally between GND, for storing electric charge.The emitter of resistance R2 connecting triode Q1 and base stage, resistance R3 connects the base stage of PWM port to triode Q1 of digital circuit, and pwm signal drives triode Q1 work.
Infraluminescence pipe SE is connected to the collector of triode Q1 to digitally between GND, luminous under the driving of triode Q1; Infrared receiving tube RE receives the signal of infraluminescence pipe SE, and between the in-phase end that receiving tube RE is connected to first order amplifier IC1_A and end of oppisite phase, the signal received is delivered to first order amplifier IC1_A by receiving tube RE.Contact resistance R4 between the end of oppisite phase and output terminal of first order amplifier IC1_A, forms feedback.
The output terminal of first order amplifier IC1_A is connected electric capacity C3, for signal coupling with between the amplifier IC1_B in-phase end of the second level.Contact resistance R8 between the in-phase end and reference voltage V REF of second level amplifier IC1_B, at the in-phase end of second level amplifier IC1_B to contact resistance R9 between AGND in analog.The end of oppisite phase of contact resistance R5 between the end of oppisite phase of second level amplifier IC1_B and output terminal, second level amplifier IC1_B is to contact resistance R10 between AGND in analog.
The output terminal of the second pole amplifier IC1_B to third level amplifier IC1_C in-phase end between connect electric capacity C4, for signal coupling.The in-phase end of contact resistance R11 between the in-phase end of third level amplifier IC1_C and reference voltage V ref, third level amplifier IC1_C is to contact resistance R12 between AGND in analog.Between the end of oppisite phase of third level amplifier IC1_C to output terminal, the end of oppisite phase of contact resistance R6, third level amplifier IC1_C is to contact resistance R13 between AGND in analog.
The output terminal of third level amplifier IC1_C to fourth stage amplifier in-phase end between connect electric capacity C5, for signal coupling.Contact resistance R14 between the in-phase end of fourth stage amplifier IC1_D to reference voltage V ref, the in-phase end of fourth stage amplifier IC1_D is to contact resistance R15 between AGND in analog, contact resistance R7 between the end of oppisite phase of fourth stage amplifier IC1_D to output terminal, the end of oppisite phase of fourth stage amplifier IC1_D is connected to the A/D port of digital circuit to the output terminal of contact resistance R16 between AGND, fourth stage amplifier IC1_D in analog.
Power supply VCC, after electric capacity C1 filtering, is charged to electric capacity C2 by resistance R1.The pwm pulse that digital circuit sends drives triode Q1 through resistance R3, the electric energy that electric capacity C2 stores discharges to infraluminescence pipe SE through resistance R2 under the conducting of triode Q1, make luminotron SE send pulsed infrared light, receiving tube RE is for the Infrared that receives luminotron SE and send and produce photocurrent.After receiving tube RE receives Infrared, under the effect of bias voltage, produce photocurrent.Photocurrent, through first order amplifier IC1_A, exports first order output voltage signal.First order output voltage signal enters the in-phase end of the second pole amplifier IC1_B, the 7th pin amplified at the second pole amplifier IC1_B after also filtering through amplifier exports effective voltage signal, this is the effective voltage signal amplified first, the effective voltage signal amplified first is coupled to the in-phase end of third level amplifier IC1_C through electric capacity C4, carry out second time to amplify, and carry out low-pass filtering, the effective voltage signal of second time amplification is exported at the 8th pin of third level amplifier IC1_C.The effective voltage signal that second time is amplified is coupled to the in-phase end of fourth stage amplifier through electric capacity C5, carry out third time to amplify, and carry out low-pass filtering, export A/D end at 14 pin of fourth stage amplifier IC1_D, export the effective voltage signal amplified for third time of single-chip microcomputer.
Digital circuits section see Fig. 2: digital circuits section has a single-chip microcomputer, single-chip microcomputer exports a pulse pwm signal by the 3rd pin, drives triode Q1 luminous.After photoelectric tube receives signal, amplify through amplifier, the A/D end being input to single-chip microcomputer is sampled, and the voltage signal of single-chip microcomputer to sampling processes, and through a series of normal operational, by UART serial ports, outwards sends detection signal with the form of standard serial port.Meanwhile, single-chip microcomputer also can receive the external command from UART serial ports, realizes low-power consumption standby function, idle function can be reduced to 30% of duty.Save electric energy on the one hand, significantly improve the life-span of electronic devices and components on the other hand.
Artificial circuit part amplifier of the present invention gain is very large, more than 3000 times, be easy to the interference being subject to outer signals, undesired signal can affect the peak value of useful signal, causes detected value to be forbidden, precision is low, therefore, AGND and digitally GND will divide open cabling in analog, finally be pooled to power supply ground again, prevent interference, effectively reduce the cross-interference issue between internal circuit.Circuit fully reduces interference, single-chip microcomputer in house software processes the signal detected, improves the stability of accuracy of detection and data further.
Whole testing circuit of the present invention is connected with applications by a 4PIN connector, and the 2PIN in this 4PIN connector provides power supply for whole circuit, the signal detected is outputted to applications circuit by other 2PIN simultaneously.
The present invention is when connecting up, adopt dual platen one side cabling, farthest reduce the cabling of bottom, bottom entirety covers copper, effective shielding is from the interference of bottom surface, metallic shield lid on fit structure, can be enclosed in the electromagnetic environment of a relative clean by whole testing circuit, farthest reduce the interference of extraneous electromagnetic signals.Ensure the pure of detection signal, fully improve accuracy of detection.
When the present invention works, single-chip microcomputer sends PWM drive singal and lights infraluminescence pipe SE, after infraluminescence pipe SE luminescence, formed in light channel structure and launch optical axis, through detect aperture, when not having dust in detect aperture, this transmitting optical axis linearly can propagate into end.When there being dust in detect aperture, dust has scattering process to light, can will launch the light of optical axis by detect aperture to surrounding scattering, wherein some light can converge on infrared receiving tube RE along detecting optical axis, after infrared receiving tube RE carries out opto-electronic conversion, signal is outputted to first order amplifier IC1_A, export first order output voltage signal.Then, first order output voltage signal is again after the amplification step by step of the second pole amplifier IC1_B, third level amplifier IC1_C, fourth stage amplifier IC1_D successively, and the A/D outputting to single-chip microcomputer detects interface.Single-chip microcomputer carries out a series of computing after collecting this signal, according to the corresponding relation of opto-electronic conversion, draws current dust concentration value, and finally, dust concentration value is exported by the UART serial ports of single-chip microcomputer, completes the detection of dust concentration.
Claims (6)
1. the infrared dust concentration testing circuit of pulsed, be made up of mimic channel and digital circuit, it is characterized in that: mimic channel comprises the level Four amplifier be connected successively, connect photoelectric tube, output terminal between the in-phase end of first order amplifier and end of oppisite phase and connect second level amplifier, third level amplifier and fourth stage amplifier successively, the output terminal of fourth stage amplifier connects digital circuit; Photoelectric tube is made up of infraluminescence pipe and infrared receiving tube, the collector that infraluminescence pipe is connected to triode is between digitally, between the in-phase end that infrared receiving tube is connected to first order amplifier and end of oppisite phase, contact resistance R4 between the end of oppisite phase and output terminal of first order amplifier; Electric capacity C1 connect power supply and digitally between, resistance R1 connects between power supply and the emitter of described triode, electric capacity C2 be connected to described triode emitter and digitally between, resistance R2 connects emitter and the base stage of described triode, and resistance R3 connects the base stage of PWM port to described triode of digital circuit; Digital circuit has a single-chip microcomputer, and single-chip microcomputer sends pwm pulse and drives described triode through resistance R3, and infraluminescence pipe sends pulsed infrared light.
2. the infrared dust concentration testing circuit of pulsed according to claim 1, it is characterized in that: the output terminal of first order amplifier is connected electric capacity C3 with between the amplifier in-phase end of the second level, contact resistance R8 between the in-phase end of second level amplifier and reference voltage, the in-phase end of second level amplifier is to contact resistance R9 between in analog, contact resistance R5 between the end of oppisite phase of second level amplifier and output terminal, the end of oppisite phase of second level amplifier is to contact resistance R10 between in analog.
3. the infrared dust concentration testing circuit of pulsed according to claim 2, it is characterized in that: the output terminal of the second pole amplifier to third level amplifier in-phase end between connect electric capacity C4, contact resistance R11 between the in-phase end of third level amplifier and reference voltage, the in-phase end of third level amplifier is to contact resistance between in analog, contact resistance R6 between the end of oppisite phase of third level amplifier to output terminal, the end of oppisite phase of third level amplifier is to contact resistance R13 between in analog.
4. the infrared dust concentration testing circuit of pulsed according to claim 3, it is characterized in that: the output terminal of third level amplifier to fourth stage amplifier in-phase end between connect electric capacity C5, contact resistance R14 between the in-phase end of fourth stage amplifier to reference voltage, the in-phase end of fourth stage amplifier is to contact resistance R15 between in analog, contact resistance R7 between the end of oppisite phase of fourth stage amplifier to output terminal, the end of oppisite phase of fourth stage amplifier is to contact resistance R16 between in analog, and the output terminal of fourth stage amplifier connects the A/D port of single-chip microcomputer.
5. the infrared dust concentration testing circuit of pulsed according to claim 4, is characterized in that: single-chip microcomputer gathers the signal that fourth stage amplifier exports, and draws current dust concentration value through computing.
6. the infrared dust concentration testing circuit of pulsed according to claim 1, it is characterized in that: infrared receiving tube produces photocurrent under the effect of bias voltage, photocurrent exports first order output voltage signal through first order amplifier, and first order output voltage signal enters the second pole amplifier and amplifies and export effective voltage signal in the second pole amplifier after filtering.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510489396.5A CN105136633A (en) | 2015-08-12 | 2015-08-12 | Pulsed infrared dust concentration detection circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510489396.5A CN105136633A (en) | 2015-08-12 | 2015-08-12 | Pulsed infrared dust concentration detection circuit |
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| CN105136633A true CN105136633A (en) | 2015-12-09 |
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| CN201510489396.5A Pending CN105136633A (en) | 2015-08-12 | 2015-08-12 | Pulsed infrared dust concentration detection circuit |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110579431A (en) * | 2019-09-17 | 2019-12-17 | 宁波科赛迪电子科技有限公司 | Self-adaptive dimmer and dimming measuring method thereof |
| CN113654962A (en) * | 2021-08-18 | 2021-11-16 | 青岛环瑞自动化科技有限公司 | High-precision two-wire system industrial dust detection device |
| CN114913658A (en) * | 2022-05-06 | 2022-08-16 | 上海腾盛智能安全科技股份有限公司 | Wireless infrared fire detection system and method and electronic equipment |
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| CN1869646A (en) * | 2006-06-08 | 2006-11-29 | 江苏技术师范学院 | Dust investigating and its working method |
| JP2012013539A (en) * | 2010-06-30 | 2012-01-19 | Sanyo Electric Co Ltd | Imaging device |
| CN202404002U (en) * | 2011-12-29 | 2012-08-29 | 金坛市亿通电子有限公司 | Microcomputer digital dust testing device |
| CN103701416A (en) * | 2013-12-31 | 2014-04-02 | 青岛歌尔声学科技有限公司 | Infrared signal amplifying circuit |
| CN104198349A (en) * | 2014-09-17 | 2014-12-10 | 深圳市信诚佳业电子有限公司 | Dust detection device and dust detection method |
| CN204882312U (en) * | 2015-08-12 | 2015-12-16 | 朱凌云 | Infrared dust concentration detection circuitry of pulsed |
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Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1869646A (en) * | 2006-06-08 | 2006-11-29 | 江苏技术师范学院 | Dust investigating and its working method |
| JP2012013539A (en) * | 2010-06-30 | 2012-01-19 | Sanyo Electric Co Ltd | Imaging device |
| CN202404002U (en) * | 2011-12-29 | 2012-08-29 | 金坛市亿通电子有限公司 | Microcomputer digital dust testing device |
| CN103701416A (en) * | 2013-12-31 | 2014-04-02 | 青岛歌尔声学科技有限公司 | Infrared signal amplifying circuit |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110579431A (en) * | 2019-09-17 | 2019-12-17 | 宁波科赛迪电子科技有限公司 | Self-adaptive dimmer and dimming measuring method thereof |
| CN113654962A (en) * | 2021-08-18 | 2021-11-16 | 青岛环瑞自动化科技有限公司 | High-precision two-wire system industrial dust detection device |
| CN114913658A (en) * | 2022-05-06 | 2022-08-16 | 上海腾盛智能安全科技股份有限公司 | Wireless infrared fire detection system and method and electronic equipment |
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Application publication date: 20151209 |
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