CN105095581B - A kind of casting shrinking hole defect image generation method - Google Patents

A kind of casting shrinking hole defect image generation method Download PDF

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CN105095581B
CN105095581B CN201510437966.6A CN201510437966A CN105095581B CN 105095581 B CN105095581 B CN 105095581B CN 201510437966 A CN201510437966 A CN 201510437966A CN 105095581 B CN105095581 B CN 105095581B
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defect image
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defect
image
dimensional array
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CN105095581A (en
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梁兆敏
黄茜
颜伟鑫
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Deep sea precision technology (Shenzhen) Co., Ltd.
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South China University of Technology SCUT
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Abstract

A kind of casting shrinking hole defect image generation method based on diamond square algorithms disclosed by the invention, including defect image generation, defect image conversion process, fusion product structural context three phases, the defect image generation phase includes the structure of two-dimensional array, the generation and storage of altitude data, the normalized of altitude data;The defect image conversion process stage includes the histogram equalization processing of defect image, thresholding processing, gaussian filtering, gray scale stretching;The fusion product structural context stage includes the normalized of defect image, the dot product of background image and defect image.There is the method for the present invention good randomness and simulation quality, the defect of generation can be used for teaching, increase sample and test defect detection algorithm during generating casting shrinking hole defect image.

Description

A kind of casting shrinking hole defect image generation method
Technical field
The present invention relates to Computer Image Processing field, more particularly to a kind of casting shrinking hole defect image generation method.
Background technology
Teaching either in casting flaw training process, or the automatic detection defective system of design and test defect Detection algorithm is required for a large amount of defect sample.It is ideal that defect sample is acquired from actual production, but foundry engieering is horizontal Raising substantially reduced defect rate or even the defect of some types is more rare so that it is very tired largely to obtain similar sample It is difficult.
The method of computer generated image mainly has CAD methods based on parameter and is based on non-parametric image superposition at present Method.
Defect image method of formation and the defect addition method based on CAD model have become two kinds of main sides for generating casting flaw Method.Ray trace and X-ray attenuation are the bases that CAD model generates 3-D casting flaws.Its process is imagined from x-ray source Emit one group of ray towards detector, there is intersection point on the surface of X-ray detection workpiece and the surface of defect of ray and imagination, lead to It crosses ray attenuation formula and calculates the ray energy intensity for reaching each pixel of detector, generate defect image, friendship is drafted in transformation The position of point is to get to different images.This method deficiency is:1) it due to needing the workpiece that hand-designed is imagined first, determines The spatial form of defect, thus manual drawing process significantly limits the diversity and randomness that defect is presented naturally;2) three The expression of dimension data and ray attenuation calculate, and operand is very big, are unfavorable for a large amount of defect and generate.
The defect addition method is another casting flaw technology.The difference of it and CAD methods is that defect uses during creating Casting defect is added on true ray image by 2-D image techniques.It had not both needed complicated three-dimensional software packet, did not needed yet Survey cast model.However, the result of study of early stage shows the method used difference, the defect type of generation is totally different, some sides Method can not make the defect of generation close to the feature of real defect, and practical purpose is not achieved.
Invention content
The shortcomings that it is an object of the invention to overcome the prior art and deficiency provide a kind of casting shrinking hole defect image generation Method, this method is based on diamond-square algorithms, for generating shrinkage cavity rarefaction defect image common in casting.Wherein, Diamond-square algorithms are also square-square close classification, be by Method of Random Mid-point Displacement for square-shaped planar and The terrain surface specifications of generation.
The purpose of the present invention is realized by the following technical solution:
A kind of casting shrinking hole defect image generation method, including defect image generation, defect image conversion process, fusion production Product structural context three phases, specially:
S1. defect image generation phase:
S101. one (2 is builtn+1)×(2n+ 1) two-dimensional array, the two-dimensional array are empty two-dimensional array, the value model of n It encloses for (1,10);
S102. diamond-square algorithms are utilized to generate (2n+1)×(2n+ 1) altitude data of size, and corresponded to Ground is stored in the two-dimensional array that step S101 is established;
S103. the altitude data in two-dimensional array is normalized;
S104. the altitude data after normalized is multiplied with the maximum gradation value of 8 gray-value images i.e. 255, and As the defect image generated;
S2. the defect image conversion process stage:
S201. histogram equalization is carried out to the defect image obtained through step S104 processing;
S202. corresponding thresholding is carried out to the defect image obtained through step S201 processing;
S203. gaussian filtering is carried out to the image obtained through step S202 processing;
S204. gray scale stretching is carried out to the image obtained through step S203 processing;
S205. step S201~S204 is repeated, the defect image after conversion process is obtained;
S3. the fusion product structural context stage:
S301. the image with defect in the true casting in interception part;
S302. after textures synthesis is handled, background image I is used as after the image of step S301 is removed defect;
S303. its maximum gradation value I is detected to background image I calculatingmax, minimum gradation value Imin, calculate H=255/ ImaxValue;
S304. it using the H values in step S303 as the normalization upper limit of defect image, and is lacked to what is obtained by step S205 Sunken image is normalized to obtain defect image D;
S305. background image I and defect image D are subjected to dot product, obtain final defect image M=I*D.
The step S102 includes the following steps:
S102-1. (the 2 of step S101 generationsn+1)×(2n+ 1) two-dimensional array is (2n+1)×(2n+ 1) a pixel is being just It is rectangular, the i.e. square iterative fractal schematic diagram using the square of 5*5 as diamond-square algorithms, with range (- 1,1) Random value initializes the height value of square four angle points A, B, C, D, is respectively set as hA、hB、hC、hD, and according to hA、hB、hC、 hDRandom value of the average value of summation plus a range in (- 1,1)Determine the height value of square center point M, then in The height value of heart point M is
S102-2. square is divided into 4 son squares, and according to hA、hB、hC、hDWith hMThe average value of summation adds One range determines the height value of this 4 son square boundaries midpoint E, F, G, H in the random value of (- 1,1), then its height value point It is not
S102-3. step S102-2 is repeated, recurrence divides each son square, the height until determining all elevational points of square Journey value, and it is stored correspondingly in the two-dimensional array that step S101 is established.
The step S103 includes the following steps:
S103-1. the minimum value of altitude data in two-dimensional array is found out, and takes its absolute value, is set as hmin
S103-2., the altitude data of all the points in two-dimensional array is added to the absolute value that step S103-1 is obtained respectively, i.e., h'A=hA+hmin、h'B=hB+hmin..., and as new altitude data, that is, h'A、h'B... it is stored in two-dimensional array;
S103-3. the maximum value h of altitude data in the two-dimensional array that step S103-2 is obtained is found outmax
S103-4. the maximum value obtained altitude data all in two-dimensional array divided by step S103-3 is completed to height The normalized of number of passes evidence.
The step S202 includes the following steps:
S202-1. according to Ostu maximum variance between clusters, the segmentation of the defect image obtained through step S201 processing is found out Threshold value;
S202-2. the point that all gray values in defect image are less than segmentation threshold is selected, and the gray value of these points is set It is set to the average value of defect image gray value;
S202-3. the gray value of the defect image obtained through step S202-2 processing is mapped to one by one between (0,255) Gray value on.
The step S204 following steps:
S204-1. the size and wave band number of the defect image obtained through step S203 processing are obtained;
S204-2. gray scale stretching is carried out successively to each wave band of defect image with gray scale stretching formula;
S204-3. gray scale stretching result is preserved.
The step S304 following steps:
S304-1. the mode of defect image gray value is obtained, i.e., the frequency of occurrences is highest a certain in image grey level histogram Gray value is set as gm
S304-2. all gray values in defect image are selected and are less than gmPoint, and by these point gray values be set as gm
S304-3. according to normalization upper limit H and normalization lower limit 1, to the defect map obtained through step S304-2 processing As being normalized, the defect image obtained after normalized
D=1+ ((I-Imin)/(Imax-Imin))*(H-1)。
Compared with prior art, the present invention having the following advantages that and advantageous effect:
1, by changing (the 2 of structure in the range of (1,10)n+1)×(2n+ 1) size of n can give birth in two-dimensional array At various sizes of defect image.
2, due to hA、hB、hCAnd hDIt is random number, therefore the defect image shape generated every time has randomness, meets scarce The uncertain feature of sunken shape, to reach sense of reality effect.
3, it is efficient to generate defect sample by the present invention.
Description of the drawings
Fig. 1 is a kind of flow chart of casting shrinking hole defect image generation method of the present invention;
Fig. 2 is the diamond-square algorithm flow charts of the present invention;
Fig. 3 is the diamond-square algorithm iteration point shape schematic diagrames of the present invention;
Fig. 4 a, 4b, 4c are respectively the first, second, third sample for surveying defect;
Fig. 5 a, 5b, 5c are respectively that the first, second, third sample of actual measurement defect is flawless after textures synthesis is handled Product background image;
Fig. 6 a, 6b, 6c are respectively the first, second, third defect image generated based on diamond-square algorithms;
Fig. 7 a, 7b, 7c are respectively the first, second, third emulation defect sample, wherein the first emulation defect sample is actual measurement The first sample of defect flawless product background image after textures synthesis is handled is given birth to based on diamond-square algorithms At the first defect image synthesis emulation defect sample, second emulation defect sample be actual measurement defect the second sample through texture Flawless product background image is synthesized with based on the second defect image that diamond-square algorithms generate after synthesis processing Emulation defect sample, third emulation defect sample be actual measurement defect the flawless production after textures synthesis is handled of third sample The emulation defect sample that product background image is synthesized with the third defect image generated based on diamond-square algorithms.
Specific implementation mode
Present invention will now be described in further detail with reference to the embodiments and the accompanying drawings, but embodiments of the present invention are unlimited In this.
As shown in Figure 1, a kind of casting shrinking hole defect image generation method based on diamond-square algorithms, including lack Image generation, defect image conversion process, fusion product structural context three phases are fallen into, the defect image generation phase includes Following steps:
S1. one (2 is builtn+1)×(2n+ 1) two-dimensional array, the two-dimensional array are empty two-dimensional array, the value range of n For (1,10);
S2. diamond-square algorithms are utilized to generate (2n+1)×(2n+ 1) altitude data of size, and accordingly by it It is stored in the two-dimensional array that step S1 is established;
S3. the altitude data in two-dimensional array is normalized;
S4. the altitude data after normalized is multiplied with the maximum gradation value of 8 gray-value images i.e. 255, and will It is as the defect image generated;
The defect image conversion process stage includes the following steps:
S5. histogram equalization is carried out to the defect image obtained through step S4 processing;
S6. corresponding thresholding is carried out to the defect image obtained through step S5 processing;
S7. gaussian filtering is carried out to the image obtained through step S6 processing;
S8. gray scale stretching is carried out to the image obtained through step S7 processing;
S9. step S5~S8 is repeated, the defect image after conversion process is obtained;
The fusion product structural context stage includes the following steps:
S10. the image with defect in the true casting in interception part;
S11. after textures synthesis is handled, background image I is used as after the image of step S10 is removed defect;
S12. its maximum gradation value I is detected to background image I calculatingmax, minimum gradation value Imin, calculate H=255/Imax Value;
S13. using the H values in step S12 as the normalization upper limit of defect image, and the defect map to being obtained by step S9 As being normalized;
S14. background image I and defect image D are subjected to dot product, obtain final defect image M=I*D.
Specifically, as shown in Fig. 2, the step S2 includes the following steps:
S2-1. (the 2 of step S1 generationsn+1)×(2n+ 1) two-dimensional array is (2n+1)×(2n+ 1) square of a pixel, In the present invention, as shown in figure 3, the i.e. square iterative fractal signal using the square of 5*5 as diamond-square algorithms Figure is respectively set as h with the height value of random value initialization square four angle points A, B, C, D of range (- 1,1)A、hB、hC、 hD, and according to hA、hB、hC、hDRandom value of the average value of summation plus a range in (- 1,1)To determine the square center The height value of point M, then the height value of central point M be
S2-2. square is divided into 4 son squares, and according to hA、hB、hC、hDWith hMThe average value of summation adds one Range determines the height value of this 4 son square boundaries midpoint E, F, G, H in the random value of (- 1,1), then its height value is distinguished For
S2-3. step S2-2 is repeated, recurrence divides each son square, the elevation until determining all elevational points of square Value, and it is stored correspondingly in the two-dimensional array that step S1 is established.
The step S3 includes the following steps:
S3-1. the minimum value of altitude data in two-dimensional array is found out, and takes its absolute value, is set as hmin
S3-2., the altitude data of all the points in two-dimensional array is added to the absolute value that step S3-1 is obtained, i.e. h' respectivelyA= hA+hmin、h'B=hB+hmin..., and as new altitude data, that is, h'A、h'B... it is stored in two-dimensional array;
S3-3. the maximum value h of altitude data in the two-dimensional array that step S3-2 is obtained is found outmax
S3-4. the maximum value obtained altitude data all in two-dimensional array divided by step S3-3 is completed to high number of passes According to normalized.
The step S6 includes the following steps:
S6-1. according to Ostu maximum variance between clusters, the segmentation threshold of the defect image obtained through step S6 processing is found out;
S6-2. the point that all gray values in defect image are less than segmentation threshold is selected, and the gray value of these points is arranged For the average value of defect image gray value;
S6-3. the ash gray value of the defect image obtained through step S6-2 processing being mapped to one by one between (0,255) In angle value.
The step S8 following steps:
S8-1. the size and wave band number of the defect image obtained through step S7 processing are obtained;
S8-2. gray scale stretching is carried out successively to each wave band of defect image with gray scale stretching formula;
S8-3. gray scale stretching result is preserved.
The step S13 following steps:
S13-1. the mode of defect image gray value, i.e., the highest a certain ash of the frequency of occurrences in image grey level histogram are obtained Angle value is set as gm
S13-2. all gray values in defect image are selected and are less than gmPoint, and by these point gray values be set as gm
S13-3. according to normalization upper limit H and normalization lower limit 1, to the defect image obtained through step S13-2 processing It is normalized, the defect image obtained after normalized
D=1+ ((I-Imin)/(Imax-Imin))*(H-1)。
Fig. 4 a, Fig. 4 b, the real defect sample that Fig. 4 c are actual acquisition;Fig. 5 a, Fig. 5 b, Fig. 5 c are by above-mentioned real defect Sample carries out textures synthesis processing, makes flawless background image, this step is to preferably compare actual measurement defect Sample and the effect after emulation defect image and real background image co-registration;Fig. 6 a, Fig. 6 b, Fig. 6 c are shown based on diamond- The defect image that square algorithms generate, the defect image shape generated every time as seen from the figure have randomness, meet defect The uncertain feature of shape;Fig. 7 a, Fig. 7 b, Fig. 7 c are shown defect image and the conjunction of casting background image in the embodiment of the present invention At defect sample, evaluated and tested by subjective vision, the effect of synthesis have compared with surveying defect sample in terms of the sense of reality compared with High recognition rate.
The above embodiment is a preferred embodiment of the present invention, but embodiments of the present invention are not by above-described embodiment Limitation, it is other it is any without departing from the spirit and principles of the present invention made by changes, modifications, substitutions, combinations, simplifications, Equivalent substitute mode is should be, is included within the scope of the present invention.

Claims (5)

1. a kind of casting shrinking hole defect image generation method, which is characterized in that generated including defect image, at defect image transformation Reason, fusion product structural context three phases, specially:
S1. defect image generation phase:
S101. one (2 is builtn+1)×(2n+ 1) two-dimensional array, the two-dimensional array are empty two-dimensional array, and the value range of n is (1,10);
S102. diamond-square algorithms are utilized to generate (2n+1)×(2n+ 1) altitude data of size, and it is accordingly deposited It stores up in the two-dimensional array that step S101 is established;
Specifically include following steps:
S102-1. (the 2 of step S101 generationsn+1)×(2n+ 1) two-dimensional array is (2n+1)×(2n+ 1) square of a pixel, The i.e. square iterative fractal schematic diagram using the square of 5*5 as diamond-square algorithms, it is random with range (- 1,1) The height value of value initialization square four angle points A, B, C, D, are respectively set as hA、hB、hC、hD, and according to hA、hB、hC、hDAlways Random value of the average value of sum plus a range in (- 1,1)Determine the height value of square center point M, then central point The height value of M is
S102-2. square is divided into 4 son squares, and according to the elevation of the height value of angle point A, B, C, D and central point M The random value of value and range (- 1,1) determines the height value of this 4 son square boundaries midpoint E, F, G, H respectively, then its height value Respectively
S102-3. step S102-2 is repeated, recurrence divides each son square, the elevation until determining all elevational points of square Value, and it is stored correspondingly in the two-dimensional array that step S101 is established;
S103. the altitude data in two-dimensional array is normalized;
S104. the altitude data after normalized is multiplied with the maximum gradation value of 8 gray-value images i.e. 255, and by its As the defect image generated;
S2. the defect image conversion process stage:
S201. histogram equalization is carried out to the defect image obtained through step S104 processing;
S202. corresponding thresholding is carried out to the defect image obtained through step S201 processing;
S203. gaussian filtering is carried out to the image obtained through step S202 processing;
S204. gray scale stretching is carried out to the image obtained through step S203 processing;
S205. step S201~S204 is repeated, the defect image after conversion process is obtained;
S3. the fusion product structural context stage:
S301. the image with defect in the true casting in interception part;
S302. after textures synthesis is handled, background image I is used as after the image of step S301 is removed defect;
S303. its maximum gradation value I is detected to background image I calculatingmax, minimum gradation value Imin, calculate H=255/Imax's Value;
S304. using the H values in step S303 as the normalization upper limit of defect image, and the defect map to being obtained by step S205 As being normalized to obtain defect image D;
S305. background image I and defect image D are subjected to dot product, obtain final defect image M=I*D.
2. casting shrinking hole defect image generation method according to claim 1, which is characterized in that the step S103 includes Following steps:
S103-1. the minimum value of altitude data in two-dimensional array is found out, and takes its absolute value, is set as hmin
S103-2., the altitude data of all the points in two-dimensional array is added to the absolute value that step S103-1 is obtained, i.e. h' respectivelyA= hA+hmin、h'B=hB+hmin..., and as new altitude data, that is, h'A、h'B... it is stored in two-dimensional array;
S103-3. the maximum value h of altitude data in the two-dimensional array that step S103-2 is obtained is found outmax
S103-4. the maximum value obtained altitude data all in two-dimensional array divided by step S103-3 is completed to high number of passes According to normalized.
3. casting shrinking hole defect image generation method according to claim 1, which is characterized in that the step S202 includes Following steps:
S202-1. according to Ostu maximum variance between clusters, the segmentation threshold of the defect image obtained through step S201 processing is found out;
S202-2. the point that all gray values in defect image are less than segmentation threshold is selected, and sets the gray value of these points to The average value of defect image gray value;
S202-3. the ash gray value of the defect image obtained through step S202-2 processing being mapped to one by one between (0,255) In angle value.
4. casting shrinking hole defect image generation method according to claim 1, which is characterized in that the step S204 or less Step:
S204-1. the size and wave band number of the defect image obtained through step S203 processing are obtained;
S204-2. gray scale stretching is carried out successively to each wave band of defect image with gray scale stretching formula;
S204-3. gray scale stretching result is preserved.
5. casting shrinking hole defect image generation method according to claim 1, which is characterized in that the step S304 or less Step:
S304-1. the mode of defect image gray value, i.e., the highest a certain gray scale of the frequency of occurrences in image grey level histogram are obtained Value, is set as gm
S304-2. all gray values in defect image are selected and are less than gmPoint, and by these point gray values be set as gm
S304-3. according to normalization upper limit H and normalization lower limit 1, to the defect image that is obtained through step S304-2 processing into Row normalized, the defect image obtained after normalized
D=1+ ((I-Imin)/(Imax-Imin))*(H-1)。
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