CN105092560A - Device and method for detecting signal intensity of frequency-shift excitation raman spectrum based on tunable laser - Google Patents

Device and method for detecting signal intensity of frequency-shift excitation raman spectrum based on tunable laser Download PDF

Info

Publication number
CN105092560A
CN105092560A CN201510582530.6A CN201510582530A CN105092560A CN 105092560 A CN105092560 A CN 105092560A CN 201510582530 A CN201510582530 A CN 201510582530A CN 105092560 A CN105092560 A CN 105092560A
Authority
CN
China
Prior art keywords
raman spectrum
grating
signal intensity
raman
spectral
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201510582530.6A
Other languages
Chinese (zh)
Inventor
赵晓荣
娄秀涛
哈斯乌力吉
巴德欣
吕志伟
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Harbin Institute of Technology
Original Assignee
Harbin Institute of Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Harbin Institute of Technology filed Critical Harbin Institute of Technology
Priority to CN201510582530.6A priority Critical patent/CN105092560A/en
Publication of CN105092560A publication Critical patent/CN105092560A/en
Pending legal-status Critical Current

Links

Abstract

The invention discloses a device and a method for detecting signal intensity of a frequency-shift excitation raman spectrum based on tunable laser, relates to the technical field of signal intensity detection of raman spectrums, and aims at solving the problems that a frequency-shift excitation device is complicated in structure and poor in real-time performance and cannot detect a wide spectrum material, the process of inverting an original raman spectrum signal according to a differential raman spectrum signal is large in calculated quantity, and an error is introduced. Deflection and pitch attitudes of a grating are controlled by a grating controller; the outgoing wavelength of a semiconductor laser device is changed by changing the deflection angle of the grating; the level of excitation light power is adjusted by controlling the efficiency of coupling a light beam to an excitation fiber; obtained initial differential raman spectrum signals are integrated and normalized to obtain a normalized differential raman spectrum signal; N data points are uniformly extracted and absolute values are taken for summation, so as to obtain a raman spectrum signal intensity value. The device and the method can be used for obtaining the signal intensity of the raman spectrum.

Description

A kind of shift frequency based on tunable laser excites the signal strength detection device and method of Raman spectrum
Technical field
The present invention relates to the signal strength detection technical field of Raman spectrum.
Background technology
Raman spectrum be a kind of detection speed fast, without the need to pre-service, to measured matter not damaged and can the detection technique of the intactly significant advantage such as reaction molecular internal structural information, be widely used in the fields such as food security, chemical analysis and material analysis.But can along with the generation of fluorescence signal in most of Raman detection process, hypofluorescence signal meeting severe jamming is to the identification of weak Raman signal, hyperfluorescenceZeng Yongminggaoyingguang signal even can flood Raman signal, so remove fluorescence interference effectively can improve detection efficiency in Raman detection process.
The method of the effective Fluorophotometry be widely adopted at present mainly contains fluorescence quenching method, time resolution method, numerical value facture and shift frequency excitation method.Fluorescence quenching method reduces fluorescent yield by adding specific fluorescent quencher or increase time shutter of sample in testing sample, and the method can only for minority specific sample and the extra condition that measuring process is introduced brings very large uncertainty to measurement result.Time resolution method make use of the characteristic that the Raman light life-span is far smaller than fluorescence lifetime, by adopting ultrashort pulse light or high frequency modulated light source the two to be separated in time domain, but significantly improve cost based on the Raman system that the method builds because needs adopt high-speed response device.Numerical value facture utilizes the different spectral characteristic of Raman signal and fluorescence signal, extracts faint Raman signal by the mode such as Fourier transform and curve from fluorescence background, but the method is comparatively large by the impact of software algorithm, and measurement result consistance is poor.
Shift frequency excitation method is based on fluorescence and the incoherent characteristic of excitation wavelength, under identical collection condition, when having the laser excitation sample of minute differences with two bundle wavelength, in two spectrum of acquisition, fluorescence signal changes hardly, and all Raman signals all can produce minor shifts.Namely the signal subtraction of twice collection can be obtained the difference raman spectral signal removing fluorescence interference, be finally inversed by original raman spectral signal again, and then the analysis realized testing sample, the process computation amount of the original raman spectral signal of inverting is large, and can introduce error.The key that shift frequency excitation method can realize to guarantee to have at least two stable, to have different wave length exciting lights.In existing technology, the laser instrument that employing two different wave lengths export mostly, the wavelength of laser instrument needs to do high-precision Current Control and temperature controls to guarantee the stability that optical maser wavelength exports, and uses branched laser instrument to be unfavorable for the system integration, and adds cost.The another kind of technology widely adopted is the laser instrument adopting single Wavelength tunable, by regulating the working temperature of laser, electric current or being realized the change of excitation wavelength by external cavity feedback, the advantage of this technology only uses a lasing light emitter to reduce system bulk, reduce cost.But the wavelength shift that Current adjustment realizes can only reach 0.5nm usually, can not meet the detection with wide range material; Temperature adjusting wavelength speed is slow, and stable regulation 1nm required time is greater than 30s, causes whole system poor real; External cavity feedback regulates high for mechanical hook-up precision class requirement, and needs strict temperature to control to guarantee Wavelength stabilized output, substantially increases complexity and the cost of system.
The wavelength shift realized by Current adjustment in prior art can only reach 0.5nm usually, and the wavelength tuning range of present embodiment is greater than 10nm, can realize the detection of wide range material.
Summary of the invention
The present invention is to solve shift frequency excitation apparatus complex structure, poor real and wide range material cannot be detected, large according to the method calculated amount of the original raman spectral signal of difference raman spectral signal inverting, and the problem of error can be introduced, thus a kind of shift frequency based on tunable laser is provided to excite the signal strength detection device and method of Raman spectrum.
A kind of shift frequency based on tunable laser of the present invention excites the signal strength detection device of Raman spectrum, comprises current driver, semiconductor laser, grating, grid controller, catoptron, bandpass filter, the first convex lens, excitation fiber, the second convex lens, sampling receptacle, high-pass filter, coupled lens group, collects optical fiber, spectrometer and spectral analysis module;
The control signal output terminal of current driver connects the control signal input end of semiconductor laser, the collimated light beam that semiconductor laser sends is incident to grating, grating is fixed on grid controller, zero order beam after optical grating diffraction is incident to catoptron, light beam after catoptron reflection is incident to bandpass filter, the light beam of bandpass filter outgoing is incident to the first convex lens, first convex lens are by beams converge and be coupled into one end of excitation fiber, the second convex lens are incident to from the light beam of the other end outgoing of excitation fiber, second convex lens by beams converge to sampling receptacle, in sampling receptacle, the Raman diffused light of sample is incident to coupled lens group after high-pass filter, coupled lens group is by beams converge one end to collection optical fiber, the other end collecting optical fiber connects the optical interface of spectrometer, the signal output part of spectrometer connects the signal input part of spectral analysis module.
The luminous power of above-mentioned zero order beam after optical grating diffraction is greater than 100mW, and live width is less than 0.5nm, and wavelength tuning range is greater than 10nm.
The distance range of above-mentioned first convex lens and excitation fiber is (f 1-5mm) ~ (f 1+ 5mm), f 1it is the focal length of the first convex lens.
The scope that the light beam that above-mentioned semiconductor laser sends is incident to the incidence angle θ of grating is: 10 ° of < θ <80 °, and the space structure cycle d of the output wavelength λ of θ and semiconductor laser and grating meets relational expression: λ=2dsin θ.
Above-mentioned grating pendulum inclination angle variable quantity wherein △ λ is test substance Raman spectrum live width.
The scope of the luminous power of above-mentioned zero order beam after optical grating diffraction is 100mW ~ 300mW.
Based on the detection method of above-mentioned detection device, comprise signal intensity gatherer process and the analytic process of Raman spectrum:
The signal intensity gatherer process of Raman spectrum comprises the following steps:
Testing sample one by one, is placed in sampling receptacle by step, firing current driver, and wavelength is λ 1laser be radiated on sample;
Step one two, spectrometer collection initial spectrum is also delivered to spectral analysis module, and spectral analysis module does initial analysis to the spectrum received, and judges time degree of stability and the fluorescence background level of spectrum;
Step one three, according to the spectral temporal degree of stability in step one two and fluorescence background level, judge that whether laser power is suitable and namely neither destroy sample molecule structure, the fluorescence excited can not cause again the photo detecting unit of spectrometer saturated, if judged result is yes, then perform step one four, if judged result is no, distance between the incident end face then adjusting the first convex lens and excitation fiber, and return step one two;
Step one four, spectral analysis module acquisition and recording excitation wavelength is λ 1time spectral signal intensity R 1;
The step First Five-Year Plan, by the deflection angle of grating feedback controller adjustment grating, excitation wavelength is made to be λ 2, spectral analysis module acquisition and recording excitation wavelength is λ 2time spectral signal intensity R 2;
The signal strength analysis process of Raman spectrum comprises the following steps:
Step 2 one, by the spectral signal intensity R under two of spectral analysis module acquisition and recording different excitation wavelengths 1and R 2do difference, obtain initial differential raman spectral signal intensity D 0, D 0=R 2-R 1;
Step 2 two, obtains initial differential raman spectral signal intensity D 0the center wave number of the differential signal that middle intensity is maximum respectively to spectral signal intensity R 1and R 2? wave-number range in do integration, obtain respectively and characterize the value I of excitation light power 1and I 2;
Step 2 three, to spectral signal intensity R 1and R 2carry out power normalization respectively, then the two is done difference and obtain normalized difference raman spectral signal intensity D, D=R 2/ I 2-R 1/ I 1;
Step 2 four, evenly normalized difference raman spectral signal intensity is extracted in scope amount to N number of data point, for test substance Raman spectrum live width, i=1 ~ N, N be greater than 1 integer;
Step 2 five is right the N number of data point extracted in scope divides pointwise to take absolute value summation, acquisition raman spectral signal intensity level A,
A kind of shift frequency based on tunable laser of the present invention excites the signal strength detection device of Raman spectrum, utilizes single, without temperature control, without the need to precision optical machinery device and the laser instrument of tunable wave length realize pick-up unit and the method for the Raman signal intensity of hyperfluorescenceZeng Yongminggaoyingguang material in conjunction with spectral signal strength analysis method of the present invention.With a Wavelength tunable laser can make whole shift frequency activating system structure become more simplify and compact, be conducive to miniaturization and the portability of system.Make use of external-cavity semiconductor laser output wavelength and depend on grating feedback angle, to the insensitive physical characteristics of temperature change, and the spectral characteristic that difference spectrum signal amplitude and wavelength difference have nothing to do under excitation wavelength difference is greater than test substance Raman spectrum live width situation, in conjunction with spectroscopic analysis methods of the present invention, laser instrument is without the need to temperature control, real-time is good, the accuracy of measuring can be ensured, reduce system complexity, reduce system bulk and cost, improve level of integrated system and stability, laser output wavelength is regulated by changing grating feedback angle, wavelength tuning range is large, the detection of wide range material can be realized.The adjustment of excitation light power size is that the efficiency by controlling freely to be optically coupled to excitation fiber realizes, and change output power by changing laser Injection Current in nontraditional technology, the output spectrum characteristic not changing exciting light can be guaranteed like this, realize pure optical power adjustment.Device of the present invention and existing commercial miniature spectrometer have good compatibility, are easy to be employed to build novel Raman spectrum detection system.
A kind of shift frequency based on tunable laser of the present invention excites the signal strength detection method of Raman spectrum, to obtain initial differential raman spectral signal integration and normalization, obtain normalized difference raman spectral signal, the N number of data point of even extraction the summation that takes absolute value, obtain raman spectral signal intensity level, and then realize the analysis to testing sample.Need not the original raman spectral signal of inverting, just can realize the analysis to testing sample, calculated amount is little, and result of calculation is accurate.
Accompanying drawing explanation
Fig. 1 is the structural representation that a kind of shift frequency based on tunable laser described in embodiment one excites the signal strength detection device of Raman spectrum.
Fig. 2 is the former medicine of industry of germifuge tricyclazole in embodiment seven excites lower acquisition normalized Raman spectrogram at two kinds of different wave lengths.
Fig. 3 is the normalized difference Raman spectrogram of the former medicine of industry of germifuge tricyclazole in embodiment seven.
Embodiment
Embodiment one: composition graphs 1 illustrates present embodiment, a kind of shift frequency based on tunable laser described in present embodiment excites the signal strength detection device of Raman spectrum, comprises current driver 1, semiconductor laser 2, grating 3, grid controller 4, catoptron 5, bandpass filter 6, first convex lens 7, excitation fiber 8, second convex lens 9, sampling receptacle 10, high-pass filter 11, coupled lens group 12, collects optical fiber 13, spectrometer 14 and spectral analysis module 15;
The control signal output terminal of current driver 1 connects the control signal input end of semiconductor laser 2, the collimated light beam that semiconductor laser 2 sends is incident to grating 3, grating 3 is fixed on grid controller 4, zero order beam after grating 3 diffraction is incident to catoptron 5, light beam after catoptron 5 reflects is incident to bandpass filter 6, the light beam of bandpass filter 6 outgoing is incident to the first convex lens 7, first convex lens 7 are by beams converge and be coupled into one end of excitation fiber 8, the second convex lens 9 are incident to from the light beam of the other end outgoing of excitation fiber 8, second convex lens 9 by beams converge to sampling receptacle 10, in sampling receptacle 10, the Raman diffused light of sample is incident to coupled lens group 12 after high-pass filter 11, coupled lens group 12 is by beams converge one end to collection optical fiber 13, the other end collecting optical fiber 13 connects the optical interface of spectrometer 14, the signal output part of spectrometer 14 connects the signal input part of spectral analysis module 15.
The control signal output terminal of current driver 1 connects the control signal input end of semiconductor laser 2, for semiconductor laser 2 provides current excitation, for the gain media in semiconductor laser 2 chip provides energy, makes its outgoing optimum output power.Be incident to grating 3 after the collimating mirror collimation that the laser that semiconductor laser 2 is launched is carried by it, grating 3 is arranged on grid controller 4.The beat of grating 3 and pitch attitude is controlled to ad-hoc location by grid controller 4, the first order light beam of grating 3 diffraction can be fed back to the resonator cavity of semiconductor laser 2, thus realize the effect of longitudinal mode selection and linewidth compression, the outgoing wavelength of semiconductor laser 2 is changed by the deflection angle changing grating 3.The relation met between the deflection angle θ of the grating 3 and space structure cycle d of semiconductor laser 2 output wavelength λ and grating 3 is determined by grating equation: λ=2dsin θ.Zero order beam after grating 3 diffraction is incident to catoptron 5, and catoptron 5 and grating are arranged on same base, can guarantee that the direction of propagation of laser beam does not change because of the adjustment of grating 3 deflection angle.Light beam after catoptron 5 reflects is incident to bandpass filter 6, bandpass filter 6 allows the light of about 10nm wavelength coverage near optical maser wavelength to pass through, the transmitance of its all band is less than per mille, effectively suppresses the spontaneous radiation fluorescence of semiconductor laser 2 to the interference of measuring.Light beam through bandpass filter 6 is incident to the first convex lens 7, the one end being coupled into excitation fiber 8 is converged through the first convex lens 7, after the outgoing of excitation fiber 8 other end, be incident to the second convex lens 9 again, the light beam after the second convex lens 9 converge is incident to sampling receptacle 10.Sampling receptacle can hold solid matter also can hold fluent meterial, can realize the detection of solid-liquid two kinds of form materials.In sampling receptacle 10, the Raman diffused light of sample is incident to coupled lens group 12 after high-pass filter 11, high-pass filter 11 is cut-off type optical filter, the transmitance being less than the light of excitation wavelength is less than per mille, and the spontaneous radiation fluorescence of semiconductor laser 2 and other bias lights can be suppressed further to the interference of measuring.Sample scattering light is incident to the one end of collecting optical fiber 13 after being converged by coupled lens group 12, the other end collecting optical fiber 13 is connected to the optical interface of spectrometer 14, and the signal output part of spectrometer 14 is connected to the signal input part of spectral analysis module 15.Spectrometer 14 is the common microgratings spectrometer in market.
Embodiment two: present embodiment excites the signal strength detection device of Raman spectrum to be described further to a kind of shift frequency based on tunable laser described in embodiment one, in present embodiment, the luminous power of the zero order beam after grating 3 diffraction is greater than 100mW, live width is less than 0.5nm, and wavelength tuning range is greater than 10nm.
Embodiment three: present embodiment excites the signal strength detection device of Raman spectrum to be described further to a kind of shift frequency based on tunable laser described in embodiment one, in present embodiment, the distance range of the first convex lens 7 and excitation fiber 8 is (f 1-5mm) ~ (f 1+ 5mm), f 1it is the focal length of the first convex lens 7.
The distance of the first convex lens 7 and excitation fiber 8 is at (f 1-5mm) ~ (f 1+ 5mm) in scope time light beam just can be coupled into excitation fiber 8, almost do not have light beam coupling to enter optical fiber when distance exceedes this scope.
Embodiment four: present embodiment excites the signal strength detection device of Raman spectrum to be described further to a kind of shift frequency based on tunable laser described in embodiment one, in present embodiment, the scope that the light beam that semiconductor laser 2 sends is incident to the incidence angle θ of grating 3 is: 10 ° of < θ <80 °, and the space structure cycle d of the output wavelength λ of θ and semiconductor laser 2 and grating 3 meets relational expression: λ=2dsin θ.
Embodiment five: present embodiment excites the signal strength detection device of Raman spectrum to be described further to a kind of shift frequency based on tunable laser described in embodiment one, and in present embodiment, grating 3 puts inclination angle variable quantity wherein △ λ is test substance Raman spectrum live width.
Embodiment six: present embodiment excites the signal strength detection device of Raman spectrum to be described further to a kind of shift frequency based on tunable laser described in embodiment two, in present embodiment, the scope of the luminous power of the zero order beam after grating 3 diffraction is 100mW ~ 300mW.
Embodiment seven: composition graphs 2 and Fig. 3 illustrate present embodiment, present embodiment is the detection method exciting the signal strength detection device of Raman spectrum based on a kind of shift frequency based on tunable laser described in embodiment one, comprises signal intensity gatherer process and the analytic process of Raman spectrum:
The signal intensity gatherer process of Raman spectrum comprises the following steps:
Testing sample one by one, is placed in sampling receptacle 10, firing current driver 1 by step, and wavelength is λ 1laser be radiated on sample;
Step one two, spectrometer 14 gathers initial spectrum and is delivered to spectral analysis module 15, and spectral analysis module 15 does initial analysis to the spectrum received, and judges time degree of stability and the fluorescence background level of spectrum;
Step one three, according to the spectral temporal degree of stability in step one two and fluorescence background level, judge that whether laser power is suitable and namely neither destroy sample molecule structure, the fluorescence excited can not cause again the photo detecting unit of spectrometer 14 saturated, if judged result is yes, then perform step one four, if judged result is no, distance between the incident end face then adjusting the first convex lens 7 and excitation fiber 8, and return step one two;
Step one four, spectral analysis module 15 acquisition and recording excitation wavelength is λ 1time spectral signal intensity R 1;
The step First Five-Year Plan, adjusted the deflection angle of grating 3 by grating feedback controller 4, make excitation wavelength be λ 2, spectral analysis module 15 acquisition and recording excitation wavelength is λ 2time spectral signal intensity R 2;
The signal strength analysis process of Raman spectrum comprises the following steps:
Step 2 one, by the spectral signal intensity R under two different excitation wavelengths of spectral analysis module 15 acquisition and recording 1and R 2do difference, obtain initial differential raman spectral signal intensity D 0, D 0=R 2-R 1;
Step 2 two, obtains initial differential raman spectral signal intensity D 0the center wave number of the differential signal that middle intensity is maximum respectively to spectral signal intensity R 1and R 2? wave-number range in do integration, obtain respectively and characterize the value I of excitation light power 1and I 2;
Step 2 three, to spectral signal intensity R 1and R 2carry out power normalization respectively, then the two is done difference and obtain normalized difference raman spectral signal intensity D, D=R 2/ I 2-R 1/ I 1;
Step 2 four, evenly normalized difference raman spectral signal intensity is extracted in scope amount to N number of data point, for test substance Raman spectrum live width, i=1 ~ N, N be greater than 1 integer;
Step 2 five is right the N number of data point extracted in scope divides pointwise to take absolute value summation, acquisition raman spectral signal intensity level A,
Raman spectral signal intensity characterizes the concentration of testing sample, and raman spectral signal intensity can be used for implementing quantitative test to testing concentration.The Raman spectrum analysis method of spectral analysis module 15 is based on 2 points: 1) output wavelength of semiconductor laser 2 depends on the deflection angle of grating 3, and insensitive to temperature change; 2) under excitation wavelength difference is greater than test substance Raman spectrum live width situation, difference spectrum signal amplitude and wavelength difference have nothing to do.Therefore, as long as ensure that excitation wavelength difference is greater than test substance Raman spectrum live width, even if optical maser wavelength has floating of nm rank, under the guarantee of the novel Raman spectrum analysis method in spectral analysis module 15, noise spectra of semiconductor lasers 2 also controls without the need to implementing temperature.Fig. 2 is the former medicine of industry of germifuge tricyclazole excites lower acquisition normalized Raman spectrogram at two kinds of different wave lengths, visible under two kinds of wavelength normalized Raman spectrogram almost overlap, by poor for spectral signal intensity under two kinds of wavelength, obtain normalized difference Raman spectrogram, as shown in Figure 3.

Claims (7)

1. the shift frequency based on tunable laser excites the signal strength detection device of Raman spectrum, it is characterized in that, it comprises current driver (1), semiconductor laser (2), grating (3), grid controller (4), catoptron (5), bandpass filter (6), first convex lens (7), excitation fiber (8), second convex lens (9), sampling receptacle (10), high-pass filter (11), coupled lens group (12), collect optical fiber (13), spectrometer (14) and spectral analysis module (15),
The control signal output terminal of current driver (1) connects the control signal input end of semiconductor laser (2), the collimated light beam that semiconductor laser (2) sends is incident to grating (3), grating (3) is fixed on grid controller (4), zero order beam after grating (3) diffraction is incident to catoptron (5), light beam after catoptron (5) reflection is incident to bandpass filter (6), the light beam of bandpass filter (6) outgoing is incident to the first convex lens (7), first convex lens (7) are by beams converge and be coupled into one end of excitation fiber (8), the second convex lens (9) are incident to from the light beam of the other end outgoing of excitation fiber (8), second convex lens (9) by beams converge to sampling receptacle (10), in sampling receptacle (10), the Raman diffused light of sample is incident to coupled lens group (12) after high-pass filter (11), coupled lens group (12) is by beams converge one end to collection optical fiber (13), the other end collecting optical fiber (13) connects the optical interface of spectrometer (14), the signal output part of spectrometer (14) connects the signal input part of spectral analysis module (15).
2. a kind of shift frequency based on tunable laser according to claim 1 excites the signal strength detection device of Raman spectrum, it is characterized in that, the luminous power of described zero order beam after grating (3) diffraction is greater than 100mW, live width is less than 0.5nm, and wavelength tuning range is greater than 10nm.
3. a kind of shift frequency based on tunable laser according to claim 1 excites the signal strength detection device of Raman spectrum, it is characterized in that, the distance range of described first convex lens (7) and excitation fiber (8) is (f 1-5mm) ~ (f 1+ 5mm), f 1it is the focal length of the first convex lens (7).
4. a kind of shift frequency based on tunable laser according to claim 1 excites the signal strength detection device of Raman spectrum, it is characterized in that, the scope that the light beam that semiconductor laser (2) sends is incident to the incidence angle θ of grating (3) is: 10 ° of < θ <80 °, and the space structure cycle d of the output wavelength λ of θ and semiconductor laser (2) and grating (3) meets relational expression: λ=2dsin θ.
5. a kind of shift frequency based on tunable laser according to claim 1 excites the signal strength detection device of Raman spectrum, it is characterized in that, grating (3) pendulum inclination angle variable quantity wherein △ λ is test substance Raman spectrum live width.
6. a kind of shift frequency based on tunable laser according to claim 2 excites the signal strength detection device of Raman spectrum, it is characterized in that, the scope of the luminous power of the zero order beam after grating (3) diffraction is 100mW ~ 300mW.
7. excite the detection method of the signal strength detection device of Raman spectrum based on a kind of shift frequency based on tunable laser according to claim 1, it is characterized in that, comprise signal intensity gatherer process and the analytic process of Raman spectrum:
The signal intensity gatherer process of Raman spectrum comprises the following steps:
One by one, be placed on by testing sample in sampling receptacle (10), firing current driver (1), wavelength is λ to step 1laser be radiated on sample;
Step one two, spectrometer (14) gathers initial spectrum and is delivered to spectral analysis module (15), spectral analysis module (15) does initial analysis to the spectrum received, and judges time degree of stability and the fluorescence background level of spectrum;
Step one three, according to the spectral temporal degree of stability in step one two and fluorescence background level, judge that whether laser power is suitable and namely neither destroy sample molecule structure, the fluorescence excited can not cause again the photo detecting unit of spectrometer (14) saturated, if judged result is yes, then perform step one four, if judged result is no, distance between the incident end face then adjusting the first convex lens (7) and excitation fiber (8), and return step one two;
Step one four, spectral analysis module (15) acquisition and recording excitation wavelength is λ 1time spectral signal intensity R 1;
The step First Five-Year Plan, by the deflection angle of grating feedback controller (4) adjustment grating (3), excitation wavelength is made to be λ 2, spectral analysis module (15) acquisition and recording excitation wavelength is λ 2time spectral signal intensity R 2;
The signal strength analysis process of Raman spectrum comprises the following steps:
Step 2 one, by the spectral signal intensity R under two different excitation wavelengths of spectral analysis module (15) acquisition and recording 1and R 2do difference, obtain initial differential raman spectral signal intensity D 0, D 0=R 2-R 1;
Step 2 two, obtains initial differential raman spectral signal intensity D 0the center wave number of the differential signal that middle intensity is maximum respectively to spectral signal intensity R 1and R 2? wave-number range in do integration, obtain respectively and characterize the value I of excitation light power 1and I 2;
Step 2 three, to spectral signal intensity R 1and R 2carry out power normalization respectively, then the two is done difference and obtain normalized difference raman spectral signal intensity D, D=R 2/ I 2-R 1/ I 1;
Step 2 four, evenly normalized difference raman spectral signal intensity is extracted in scope amount to N number of data point, for test substance Raman spectrum live width, i=1 ~ N, N be greater than 1 integer;
Step 2 five is right the N number of data point extracted in scope divides pointwise to take absolute value summation, acquisition raman spectral signal intensity level A,
CN201510582530.6A 2015-09-14 2015-09-14 Device and method for detecting signal intensity of frequency-shift excitation raman spectrum based on tunable laser Pending CN105092560A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510582530.6A CN105092560A (en) 2015-09-14 2015-09-14 Device and method for detecting signal intensity of frequency-shift excitation raman spectrum based on tunable laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510582530.6A CN105092560A (en) 2015-09-14 2015-09-14 Device and method for detecting signal intensity of frequency-shift excitation raman spectrum based on tunable laser

Publications (1)

Publication Number Publication Date
CN105092560A true CN105092560A (en) 2015-11-25

Family

ID=54573475

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510582530.6A Pending CN105092560A (en) 2015-09-14 2015-09-14 Device and method for detecting signal intensity of frequency-shift excitation raman spectrum based on tunable laser

Country Status (1)

Country Link
CN (1) CN105092560A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107389652A (en) * 2017-01-06 2017-11-24 中国科学院上海技术物理研究所 A kind of dual-wavelength laser Raman spectra detection process
CN107643275A (en) * 2016-08-19 2018-01-30 北京杏林睿光科技有限公司 A kind of integral type Raman optical-mechanical system
WO2019126619A1 (en) * 2017-12-22 2019-06-27 Massachusetts Institute Of Technology Swept-source raman spectroscopy systems and methods
CN110687097A (en) * 2019-10-25 2020-01-14 北京华泰诺安探测技术有限公司 Raman spectrum system with tunable excitation light frequency and detection method thereof
CN111257851A (en) * 2020-04-03 2020-06-09 厦门大学 Spectrum measurement method based on wide-spectrum light source and spectrum scanning laser radar
CN111562252A (en) * 2020-06-30 2020-08-21 普识和康(杭州)科技有限公司 Raman detection system based on coaxial dual-wavelength fluorescence elimination
CN113639860A (en) * 2021-07-19 2021-11-12 中国科学院上海光学精密机械研究所 Measuring device and measuring method for chirp volume grating frequency spectrum diffraction curve

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3669632B2 (en) * 2003-07-07 2005-07-13 独立行政法人理化学研究所 Spectroscopic measurement method and spectroscopic measurement apparatus
CN102576971A (en) * 2009-10-02 2012-07-11 Imra美国公司 Optical signal processing with modelocked lasers
CN102590097A (en) * 2012-03-05 2012-07-18 哈尔滨工业大学 Mercury vapor continuous monitoring device and monitoring method based on diode laser
CN103217409A (en) * 2013-03-22 2013-07-24 重庆绿色智能技术研究院 Raman spectral preprocessing method
CN103292903A (en) * 2013-06-09 2013-09-11 哈尔滨工业大学 Spectrum analytical device and spectrum analytical method based on Brillouin dynamic grating
CN103983631A (en) * 2014-06-06 2014-08-13 清华大学 Detection and extraction system of Raman signal based on synchronous multi-wavelength excitation
CN104597034A (en) * 2015-02-04 2015-05-06 厦门大学 Raman spectra measuring device for multi-wavelength laser frequency shift excitation
CN204630935U (en) * 2015-02-04 2015-09-09 厦门大学 The Raman spectrum measurement system that a kind of multi-wavelength shift frequency excites

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3669632B2 (en) * 2003-07-07 2005-07-13 独立行政法人理化学研究所 Spectroscopic measurement method and spectroscopic measurement apparatus
CN102576971A (en) * 2009-10-02 2012-07-11 Imra美国公司 Optical signal processing with modelocked lasers
CN102590097A (en) * 2012-03-05 2012-07-18 哈尔滨工业大学 Mercury vapor continuous monitoring device and monitoring method based on diode laser
CN103217409A (en) * 2013-03-22 2013-07-24 重庆绿色智能技术研究院 Raman spectral preprocessing method
CN103292903A (en) * 2013-06-09 2013-09-11 哈尔滨工业大学 Spectrum analytical device and spectrum analytical method based on Brillouin dynamic grating
CN103983631A (en) * 2014-06-06 2014-08-13 清华大学 Detection and extraction system of Raman signal based on synchronous multi-wavelength excitation
CN104597034A (en) * 2015-02-04 2015-05-06 厦门大学 Raman spectra measuring device for multi-wavelength laser frequency shift excitation
CN204630935U (en) * 2015-02-04 2015-09-09 厦门大学 The Raman spectrum measurement system that a kind of multi-wavelength shift frequency excites

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
周红武等: "非食品添加剂拉曼检测中的荧光抑制", 《中国激光》 *

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107643275A (en) * 2016-08-19 2018-01-30 北京杏林睿光科技有限公司 A kind of integral type Raman optical-mechanical system
CN107389652A (en) * 2017-01-06 2017-11-24 中国科学院上海技术物理研究所 A kind of dual-wavelength laser Raman spectra detection process
WO2019126619A1 (en) * 2017-12-22 2019-06-27 Massachusetts Institute Of Technology Swept-source raman spectroscopy systems and methods
US10656012B2 (en) 2017-12-22 2020-05-19 Massachusetts Institute Of Technology Swept-source Raman spectroscopy systems and methods
US11307092B2 (en) 2017-12-22 2022-04-19 Massachusetts Institute Of Technology Swept-source Raman spectroscopy systems and methods
CN110687097A (en) * 2019-10-25 2020-01-14 北京华泰诺安探测技术有限公司 Raman spectrum system with tunable excitation light frequency and detection method thereof
CN111257851A (en) * 2020-04-03 2020-06-09 厦门大学 Spectrum measurement method based on wide-spectrum light source and spectrum scanning laser radar
CN111257851B (en) * 2020-04-03 2022-04-05 厦门大学 Spectrum measurement method based on wide-spectrum light source and spectrum scanning laser radar
CN111562252A (en) * 2020-06-30 2020-08-21 普识和康(杭州)科技有限公司 Raman detection system based on coaxial dual-wavelength fluorescence elimination
CN113639860A (en) * 2021-07-19 2021-11-12 中国科学院上海光学精密机械研究所 Measuring device and measuring method for chirp volume grating frequency spectrum diffraction curve

Similar Documents

Publication Publication Date Title
CN105092560A (en) Device and method for detecting signal intensity of frequency-shift excitation raman spectrum based on tunable laser
CN101949688B (en) Cavity ring-down spectroscopy-based tunable laser line width measurement method
US7245369B2 (en) Spectroscopic apparatus using spectrum narrowed and stabilized laser with Bragg grating
CN103344623B (en) One carries high-precision coherent anti-stokes raman scattering light comb optical spectrum detecting method
CN106772438A (en) A kind of round-the-clock accurately measures the laser radar system of atmospheric temperature and aerosol parameters
US20220268629A1 (en) Spectral measurement method, spectral measurement system, and broadband pulsed light source unit
US8049885B1 (en) Method and apparatus for large spectral coverage measurement of volume holographic gratings
US20120002212A1 (en) Dual-etalon cavity ring-down frequency-comb spectroscopy
EP3485254A1 (en) Photothermal interferometry apparatus and method
CN110068548B (en) Wavelength locking device and method for laser in off-axis integral cavity system
CN102183308B (en) A measuring method of wavelength variation of a tunable laser
CN102128715B (en) Method for measuring reflectivity of dual-wavelength high reflecting mirror
FR2778244A1 (en) METHOD FOR EXCITTING AN OPTICAL CAVITY FOR THE DETECTION OF GAS IN THE TRACE STATE
CN104406955B (en) A kind of substance detecting method based on Raman spectrum
CN109029740A (en) A kind of device and method measuring atomic hyperfine
CN102967566A (en) High-precision and high-speed trace analysis device
CN103674497A (en) High accuracy measurement system of line width of narrow line width laser
US9128059B2 (en) Coherent anti-stokes raman spectroscopy
CN103091283A (en) Super-high spectral resolution gas medium wave infrared spectrum measurement system
JP2006138734A (en) Optical spectrum analyzer
US8599373B1 (en) Microcavity Raman sensor and method of use
CN211262667U (en) Optical system for high-precision detection of depolarization performance of depolarizer
Dehring et al. Performance and comparison of 532-nm and 355-nm groundwinds lidars
CN115356279A (en) Intermediate infrared single photon spectrum detection method based on time stretching time-frequency correlation
CN212031304U (en) Novel Raman spectrometer based on optical field coupling device

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
CB03 Change of inventor or designer information

Inventor after: Lou Xiutao

Inventor after: Zhao Xiaorong

Inventor after: Hasiwuliji

Inventor after: Ba Dexin

Inventor after: Lv Zhiwei

Inventor before: Zhao Xiaorong

Inventor before: Lou Xiutao

Inventor before: Hasiwuliji

Inventor before: Ba Dexin

Inventor before: Lv Zhiwei

COR Change of bibliographic data
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20151125

WD01 Invention patent application deemed withdrawn after publication