CN105088159B - 一种磁控溅射装置 - Google Patents

一种磁控溅射装置 Download PDF

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CN105088159B
CN105088159B CN201510493704.1A CN201510493704A CN105088159B CN 105088159 B CN105088159 B CN 105088159B CN 201510493704 A CN201510493704 A CN 201510493704A CN 105088159 B CN105088159 B CN 105088159B
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孙建明
牛犇
王治
周翔
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BOE Technology Group Co Ltd
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    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
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Abstract

本发明提供一种磁控溅射装置,属于磁控溅射技术领域,其可解决现有的磁控溅射装置无法连续、均匀、任意比例掺杂元素的问题。本发明的磁控溅射装置,包括至少两个靶,分别用于放置向同一基板的成膜区进行溅射的靶材;与每个靶分别对应的磁场产生装置,用于控制靶溅射的粒子的方向。本发明的磁控溅射装置包括至少两个靶,每个靶分别对应磁场产生装置,通过使用至少两个靶溅射,每个靶的靶材都是掺杂了不同的元素的透明导电氧化物,调整两种靶材的比例,实现均匀掺杂不同的元素的目的,通过控制磁场产生装置调节靶材的磁场,从而控制靶材的溅射速度,进而实现靶材任意比例掺杂的目的。本发明的磁控溅射装置适用于制备各种透明导电氧化物薄膜。

Description

一种磁控溅射装置
技术领域
本发明属于磁控溅射技术领域,具体涉及一种磁控溅射装置。
背景技术
透明导电氧化物(transparent conducting oxides简称TCO)薄膜主要包括In(铟)、Sn(锡)、Zn(锌)和Cd(镉)的氧化物及其复合多元氧化物薄膜,其具有禁带宽、可见光谱区光透射率高和电阻率低等光电特性,IGZO(铟镓锌氧化物),ZnO(氧化锌)作为TFT的有缘层,以应用于显示领域。实际工业生产中,透明导电氧化物薄膜的特性需要在薄膜中掺杂一定的元素来实现,例如,Zr(锆)掺杂ITO(氧化铟锡)薄膜可以具有更好的光电性能和良好的稳定性,其中,金属元素Zr的掺杂量对ITO薄膜性能的影响最为重要。
现有技术中掺杂的透明导电氧化物薄膜主要采用磁控溅射装置来实现,具体是将掺杂了一定的元素的透明导电氧化物的靶材溅射至基板上,得到掺杂透明导电氧化物薄膜,显然,此时得到的透明导电氧化物薄膜的成分与靶材成分相同。
发明人发现现有技术中至少存在如下问题:由于不同薄膜需要掺杂不同比例的元素,这就要求制备出一系列不同掺杂元素含量的靶材,因此导致资源的大量浪费,且现有的磁控溅射装置无法实现连续、均匀的、任意比例掺杂透明导电氧化物薄膜。
发明内容
本发明所要解决的技术问题包括,针对现有的磁控溅射装置无法连续、均匀、任意比例掺杂元素的问题,提供一种磁控溅射装置。
解决本发明技术问题所采用的技术方案是:
一种磁控溅射装置,包括:
至少两个靶,分别用于放置向同一基板的成膜区进行溅射的靶材;
与每个靶分别对应的磁场产生装置,用于控制靶溅射粒子的方向。
优选的,所述磁控溅射装置还包括与至少一个靶对应的旋转装置,用于驱动该靶所在的面在成膜区和非成膜区方向之间旋转。
优选的,所述磁控溅射装置还包括真空腔室,所述每个靶和磁场产生装置均设于真空腔室内,所述旋转装置固定于真空腔室的内侧的腔壁上。
优选的,至少一个所述磁场产生装置包括磁铁和磁铁控制单元,所述磁铁控制单元用于控制磁铁相对靶运动。
优选的,所述磁铁控制单元包括固定架,所述固定架上设有滑轨、第一电机以及第二电机,所述滑轨的两端固定设置,磁铁设于滑轨上,所述滑轨的轨道方向与磁铁的长度方向垂直,所述第一电机用于驱动磁铁沿滑轨移动以控制磁铁的扫描速度,所述第二电机用于控制固定架以控制磁铁远离或者靠近靶。
优选的,所述磁铁和磁铁控制单元固定设于靶远离成膜区的一侧。
优选的,所述靶为长条状,在与靶的长度方向平行的方向上,所述靶的长度大于基板的成膜区的长度。
优选的,所述磁控溅射装置还包括传送装置,所述传送装置用于带动基板匀速运动。
优选的,所述基板上的非成膜区设有屏蔽罩。
本发明的磁控溅射装置包括至少两个靶,每个靶分别对应磁场产生装置,通过使用至少两个靶溅射,每个靶的靶材都是掺杂了不同的元素的透明导电氧化物,调整两种靶材的比例,实现均匀掺杂不同的元素的目的,通过控制磁场产生装置调节靶材的磁场,从而控制靶材的溅射速度,进而实现靶材任意比例掺杂的目的。本发明的磁控溅射装置适用于制备各种透明导电氧化物薄膜。
附图说明
图1为本发明的实施例2的磁控溅射装置的结构示意图;
图2为本发明的实施例2的磁控溅射装置的靶的结构示意图;
其中附图标记为:1、靶;10、成膜区;2、磁场产生装置;21、磁铁;22、磁铁控制单元;221、固定架;222、滑轨;223、第一电机;224、第二电机;3、旋转装置;4、基板;5、传送装置;51、屏蔽罩。
具体实施方式
为使本领域技术人员更好地理解本发明的技术方案,下面结合附图和具体实施方式对本发明作进一步详细描述。
实施例1:
本实施例提供一种磁控溅射装置,包括:
至少两个靶,分别用于放置向同一基板的成膜区进行溅射的靶材;
与每个靶分别对应的磁场产生装置,用于控制靶溅射粒子的方向。
本发明的磁控溅射装置包括至少两个靶,每个靶分别对应磁场产生装置,通过使用至少两个靶溅射,每个靶的靶材都是掺杂了不同的元素的透明导电氧化物,调整两种靶材的比例,实现均匀掺杂不同的元素的目的,通过控制磁场产生装置调节靶材的磁场,从而控制靶材的溅射速度,进而实现靶材任意比例掺杂的目的。本发明的磁控溅射装置适用于制备各种透明导电氧化物薄膜。
实施例2:
如图1-2所示,本实施例提供一种磁控溅射装置,包括:
至少两个靶1,分别用于放置向同一基板4的成膜区10进行溅射的靶材;
与每个靶1分别对应的磁场产生装置2,用于控制靶溅射粒子的方向。
优选的,磁控溅射装置还包括与至少一个靶1对应的旋转装置3,用于驱动该靶1所在的面在成膜区10和非成膜区方向之间旋转。
也就是说,通过旋转装置3控制靶1溅射的方向实现各种元素的掺杂。例如,将其中一个靶1的溅射方向转向成膜区10,可以实现单靶溅射,当两个靶1均转向正对成膜区10可以实现双靶溅射的功能,即当两靶旋转到成一定度时,可以实现双靶溅射的功能。
优选的,磁控溅射装置还包括真空腔室(图中未示出),每个靶1和磁场产生装置2均设于真空腔室内,旋转装置3固定于真空腔室内的腔壁上。
优选的,至少一个磁场产生装置2包括磁铁21和磁铁控制单元22,磁铁控制单元22用于控制磁铁21相对靶1运动。
也就是说,可以通过控制磁铁21的前后距离调整磁场的大小,以实现控制沉积速率,从而控制掺杂比例的目的。
优选的,磁铁控制单元22包括固定架221,固定架221上设有滑轨222、第一电机223以及第二电机224,滑轨222的两端固定设置,磁铁21设于滑轨222上,滑轨222的轨道方向与磁铁21的长度方向垂直,第一电机223用于驱动磁铁21沿滑轨222移动以调节磁铁21扫描速度,第二电机224控制固定架221以达到控制磁铁21远离靶1或是靠近靶1。
更具体的,第一电机223通过驱动螺杆,从而使螺杆带动磁铁沿着滑轨运动。
优选的,磁铁21和磁铁控制单元22固定设于靶1远离成膜区10的一侧。
优选的,靶1为长条状,在与靶1的长度方向平行的方向上,靶1的长度大于基板4的成膜区10的长度。
优选的,磁控溅射装置还包括传送装置5,用于带动基板4匀速运动。
也就是说,现有技术中靶1的面积一般要大于基板4的面积,以保证基板4上均能溅射到靶材。本实施例中靶1是长条状,窄条状,其面积远远小于基板4的面积,通过传送装置5带动基板4匀速运动,使基板4上均匀溅射形成薄膜,通常靶的长度大于基板4的宽度即可。这样不仅可以节省靶材,还可以连续的溅射得到沉积均匀的薄膜。由于本实施例的磁控溅射装置可以节省靶材,因此其尤其适用于大面积掺杂共溅射,连续的均匀成膜。其制备的薄膜更适用于大尺寸的显示装置。
优选的,可以在基板上的非成膜区加上屏蔽罩51。
也就是说,如图1所示,实线部分为实际可溅射到的区域,选取虚线部分作为成膜区,为了不必要的溅射,将其它非成膜区加上屏蔽罩51,以防止不必要的溅射导致掺杂不均匀。
可以理解的是,以上实施方式仅仅是为了说明本发明的原理而采用的示例性实施方式,然而本发明并不局限于此。对于本领域内的普通技术人员而言,在不脱离本发明的精神和实质的情况下,可以做出各种变型和改进,这些变型和改进也视为本发明的保护范围。

Claims (5)

1.一种磁控溅射装置,其特征在于,包括:
至少两个靶,分别用于放置向同一基板的成膜区进行溅射的靶材;
与每个所述靶分别对应的磁场产生装置,用于控制靶溅射粒子的方向;至少一个所述磁场产生装置包括磁铁和磁铁控制单元,所述磁铁控制单元用于控制所述磁铁相对所述靶运动;所述磁铁控制单元包括固定架,所述固定架上设有滑轨、第一电机以及第二电机,所述滑轨的两端固定设置,磁铁设于所述滑轨上,所述滑轨的轨道方向与所述磁铁的长度方向垂直,所述第一电机用于驱动所述磁铁沿所述滑轨移动以控制所述磁铁的扫描速度,所述第二电机用于控制所述固定架以控制所述磁铁远离或者靠近所述靶;
所述磁控溅射装置还包括传送装置,所述传送装置用于带动基板匀速运动;
所述基板上的非成膜区设有屏蔽罩。
2.根据权利要求1所述的磁控溅射装置,其特征在于,所述磁控溅射装置还包括与至少一个所述靶对应的旋转装置,用于驱动所述靶所在的面在成膜区和非成膜区方向之间旋转。
3.根据权利要求2所述的磁控溅射装置,其特征在于,所述磁控溅射装置还包括真空腔室,所述每个靶和所述磁场产生装置均设于所述真空腔室内,所述旋转装置固定于所述真空腔室的内侧的腔壁上。
4.根据权利要求1所述的磁控溅射装置,其特征在于,所述磁铁和所述磁铁控制单元固定设于所述靶远离成膜区的一侧。
5.根据权利要求1所述的磁控溅射装置,其特征在于,所述靶为长条状,在与所述靶的长度方向平行的方向上,所述靶的长度大于基板的成膜区的长度。
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