CN105069179B - The emulation mode and device of interface circuit - Google Patents
The emulation mode and device of interface circuit Download PDFInfo
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Abstract
The invention discloses a kind of emulation mode of interface circuit and devices, belong to circuit simulation field.Method includes：Obtain interface circuit to be tested；The replacement electronic device of micro-control unit in equivalence replacement interface circuit to be tested is obtained, and the micro-control unit in interface circuit to be tested is replaced using electronic device is replaced；Obtain the input parameter for interface circuit to be tested；According to the interface circuit to be tested after equivalence replacement, preset input switch and input parameter generate simulation model, and obtain the monitoring point in simulation model；Simulation model is input in simulated environment and carries out emulation testing, and acquires the circuit parameter of monitoring point during emulation testing.The present invention is replaced micro-control unit by way of equivalence replacement, reduces actual circuit so that simulation result is closer to the truth, improves the accuracy of emulation；By the way that malfunction is arranged, more true simulation actual use situation improves the efficiency of emulation.
Description
Technical field
The present invention relates to circuit simulation field, more particularly to the emulation mode and device of a kind of interface circuit.
Background technology
With the fast development of automobile industry, the electric function in automobile is more and more, and electric function is required for being related to
Need the progress circuit before normal production imitative in order to avoid the unreasonable caused problem of circuit design to circuit design
Whether very designed with test circuit reasonable.
In the prior art when being emulated to circuit, the corresponding interface circuit of various functions tested as needed generates
The simulation model and circuit parameter are input in simulated environment and test by simulation model, will pass through continuous debugging,
To reach more rational circuit design.
The inventor finds that the existing technology has at least the following problems：
In each interface circuit can there are micro-control units, directly the interface circuit with micro-control unit is carried out
Emulation testing can cause simulation result inaccurate；In addition, various faults situation can be encountered during true use, and imitate at present
Various failures can not be simulated during true, simulated effect is caused to cannot be satisfied test request.
Invention content
In order to solve problems in the prior art, an embodiment of the present invention provides a kind of emulation mode of interface circuit and dresses
It sets.The technical solution is as follows：
On the one hand, a kind of emulation mode of interface circuit is provided, the method includes：
Interface circuit to be tested is obtained, the interface circuit to be tested is one or more；
The replacement electronic device of micro-control unit in interface circuit to be tested described in equivalence replacement is obtained, and described in use
It replaces electronic device and replaces the micro-control unit in the interface circuit to be tested；
Obtain the input parameter for the interface circuit to be tested；The input parameter includes：Circuit parameter and/or
Malfunction parameter；
According to the interface circuit to be tested after equivalence replacement, preset input switch and input parameter life
At simulation model, and obtain the monitoring point in the simulation model；The monitoring point is one or more；
The simulation model is input in simulated environment and carries out emulation testing, and is acquired during the emulation testing
The circuit parameter of the monitoring point.
Wherein, acquisition interface circuit to be tested, including：
It obtains user and chooses functional item to be tested, the functional item to be tested is one or more；
In the correspondence of preset functional item and interface circuit, it is corresponding to choose the functional item to be tested
Interface circuit to be tested.
Wherein, the interface circuit to be tested according to after equivalence replacement, preset input switch and described
Input parameter generates simulation model, including：
According to preset connection type by the interface circuit to be tested and the preset input switch after equivalence replacement
It is connected and generates simulation model, and is input to the input parameter as the state of emulation in the simulation model.
Wherein, after the circuit parameter that the monitoring point is acquired during the emulation testing, the method is also
Including：
When the circuit parameter of the collected monitoring point reaches preset alarm threshold, warning message is generated and by institute
Warning message is stated to be shown in screen by prompting frame.
Wherein, the malfunction parameter includes：Short trouble, open circuit fault, input nonlinearities signal and reverse power connection
In it is one or more.
On the other hand, a kind of simulator of interface circuit is provided, described device includes：
First acquisition module, for obtaining interface circuit to be tested, the interface circuit to be tested is one or more
It is a；
Second acquisition module, the replacement electricity for obtaining micro-control unit in interface circuit to be tested described in equivalence replacement
Sub- device, and replace the micro-control unit in the interface circuit to be tested using the replacement electronic device；
Third acquisition module, for obtaining the input parameter for the interface circuit to be tested；The input parameter
Including：Circuit parameter and/or malfunction parameter；
Generation module, for according to the interface circuit to be tested after equivalence replacement, preset input switch and
The input parameter generates simulation model, and obtains the monitoring point in the simulation model；The monitoring point is one or more；
Test module carries out emulation testing for the simulation model to be input in simulated environment, and in the emulation
The circuit parameter of the monitoring point is acquired in test process.
Wherein, first acquisition module, including：
Acquiring unit chooses functional item to be tested for obtaining user, and the functional item to be tested is one
Or it is multiple；
Selection unit, in the correspondence of preset functional item and interface circuit, choosing described to be tested
The corresponding interface circuit to be tested of functional item.
Wherein, the generation module is used for：
According to preset connection type by the interface circuit to be tested and the preset input switch after equivalence replacement
It is connected and generates simulation model, and is input to the input parameter as the state of emulation in the simulation model.
Wherein, described device further includes：
Reminding module, for when the circuit parameter of the collected monitoring point reaches preset alarm threshold, generating
The warning message is simultaneously shown in by prompting frame in screen by warning message.
Wherein, the malfunction parameter includes：Short trouble, open circuit fault, input nonlinearities signal and reverse power connection
In it is one or more.
The advantageous effect that technical solution provided in an embodiment of the present invention is brought is：
The micro-control unit in interface circuit to be tested is replaced by using electronic device is replaced, obtains circuit parameter
And/or malfunction parameter, according to the interface circuit to be tested and preset input switch and circuit after equivalence replacement
Parameter and/or malfunction parameter generate simulation model, and monitoring point is arranged in simulation model, simulation model is input to emulation
Emulation testing is carried out in environment, and the circuit parameter of monitoring point is acquired during emulation testing.By way of equivalence replacement
Micro-control unit is replaced, actual circuit is reduced so that simulation result is closer to the truth, improves emulation
Accuracy；In addition, by the way that malfunction is arranged, actual use situation can be more really simulated, the effect of emulation is improved
Rate.
Description of the drawings
To describe the technical solutions in the embodiments of the present invention more clearly, make required in being described below to embodiment
Attached drawing is briefly described, it should be apparent that, drawings in the following description are only some embodiments of the invention, for
For those of ordinary skill in the art, without creative efforts, other are can also be obtained according to these attached drawings
Attached drawing.
Fig. 1 is the emulation mode flow chart for the interface circuit that the embodiment of the present invention one provides；
Fig. 2 be the embodiment of the present invention one provide interface circuit emulation mode in an interface circuit circuit diagram；
Fig. 3 be the embodiment of the present invention one provide interface circuit emulation mode in another interface circuit circuit diagram；
Fig. 4 be the embodiment of the present invention one provide interface circuit emulation mode in another interface circuit circuit diagram；
Fig. 5 is the emulation mode flow chart of interface circuit provided by Embodiment 2 of the present invention；
Fig. 6 be interface circuit provided by Embodiment 2 of the present invention emulation mode in a simulation model circuit diagram；
Fig. 7 is the simulator structural schematic diagram for the interface circuit that the embodiment of the present invention three provides.
Specific implementation mode
To make the object, technical solutions and advantages of the present invention clearer, below in conjunction with attached drawing to embodiment party of the present invention
Formula is described in further detail.
Embodiment one
An embodiment of the present invention provides a kind of emulation modes of interface circuit, and referring to Fig. 1, method flow includes：
101：Interface circuit to be tested is obtained, interface circuit to be tested is one or more；
102：The replacement electronic device of micro-control unit in equivalence replacement interface circuit to be tested is obtained, and uses replacement
Electronic device replaces the micro-control unit in interface circuit to be tested；
103：Obtain the input parameter for interface circuit to be tested；Input parameter includes：Circuit parameter and/or failure
State parameter；
104：According to the interface circuit to be tested after equivalence replacement, preset input switch and input parameter are generated and are imitated
True mode, and obtain the monitoring point in simulation model；Monitoring point is one or more；
105：Simulation model is input in simulated environment and carries out emulation testing, and acquires monitoring during emulation testing
The circuit parameter of point.
Wherein, the correspondence that functional item and interface circuit are pre-established before execution of the embodiment of the present invention, passes through
Each functional item that the correspondence can be chosen according to tester during the test, obtains corresponding interface circuit,
To generate simulation model.
Wherein, in the correspondence of functional item and interface circuit, there may be multiple functional items correspond to it is same
Interface circuit.When establishing the correspondence of functional item and interface circuit, combed respectively by controller first each PIN and
The hardware interface demand inventory for the electrical part being mated with, and confirm interface circuit figure and circuit parameter requirement, as low and high level,
The information such as input and output voltage, electric current.Demand inventory is illustrated by taking table 1 as an example.
Table 1
Secondly according to the inventory and physical circuit parameter definition of combing, interface circuit type is classified.Common
Interface circuit signal type has digital signal (including high level and low level), analog signal, low level, PWM (Pulse
Width Modulation, pulse width modulating technology), pulse signal and network interface (CAN, LIN, K) etc..For each
Class interface circuit combs out typical interface circuit structure, common function, input parameter and particular technique requirement, determines function items
The corresponding interface circuit of each functional item in the correspondence of mesh and interface circuit.Such as：Circuit types is number electricity
Road (low effective), corresponding functional item includes：Machine oil compresses switch；Safety belt lock catch switchs；Reverse gear switch；Parking brake switchs；
Clutch bottom switch；Its corresponding technology requires to include：Low level voltage range defines；Current margin defines；Reversed polarity
Protect circuit；ESD (Electro-Static discharge, Electro-static Driven Comb) protects circuit, corresponding interface circuit such as Fig. 2
It is shown；Circuit types is digital circuit (high effectively), and corresponding functional item includes：Instrument gear is shown；Its corresponding skill
Art requires to include：High level voltage range defines；Current margin defines；Reversed polarity protection circuit；Esd protection circuit,
Corresponding interface circuit is as shown in Figure 3；Circuit types is digital combined signal, and corresponding functional item includes：Windscreen wiper is washed
It washs；Its corresponding technology requires to include：Analog signal voltage range defines；Current margin defines；Reversed polarity protection circuit；
Esd protection circuit, corresponding interface circuit are as shown in Figure 4.
The embodiment of the present invention replaces the micro-control unit in interface circuit to be tested by using electronic device is replaced, and obtains
Sense circuit parameter and/or malfunction parameter, according to after equivalence replacement interface circuit to be tested and preset input open
Pass and circuit parameter and/or malfunction parameter generate simulation model, monitoring point are arranged in simulation model, by simulation model
It is input in simulated environment and carries out emulation testing, and acquire the circuit parameter of monitoring point during emulation testing.By equivalent
The mode of replacement is replaced micro-control unit, reduces actual circuit so that and simulation result is closer to the truth,
Improve the accuracy of emulation；In addition, by the way that malfunction is arranged, actual use situation can be more really simulated, is improved
The efficiency of emulation.
Embodiment two
An embodiment of the present invention provides a kind of emulation modes of interface circuit, and referring to Fig. 5, method flow includes：
501：Interface circuit to be tested is obtained, interface circuit to be tested is one or more.
Wherein, step 501 can be realized by following steps：
5011：It obtains user and chooses functional item to be tested, functional item to be tested is one or more.
In emulation test system, tester can be chosen to be tested by the functional item list that analogue system provides
Functional item.
5012：In the correspondence of preset functional item and interface circuit, chooses functional item to be tested and correspond to
Interface circuit to be tested.
Wherein, interface circuit to be tested includes the connection relation of each electronic component and each electronic component.
502：The replacement electronic device of micro-control unit in equivalence replacement interface circuit to be tested is obtained, and uses replacement
Electronic device replaces the micro-control unit in interface circuit to be tested.
Wherein, the mode of acquisition can be：
The circuit identifier of interface circuit to be tested is obtained, and the corresponding replacement electricity of circuit identifier is obtained according to circuit identifier
Sub- device identification；
According to electronic device mark is replaced, the replacement electricity of micro-control unit in equivalence replacement interface circuit to be tested is determined
Sub- device.
The replacement electronic device of selection is determined by the chip in micro-control unit in each interface circuit.By using for
Electronic device is changed by after micro-control unit is replaced in interface circuit to be tested, the interface circuit to be tested and practical electricity
Road is consistent, and can improve the accuracy of test.
Wherein, it can be the electronic components such as resistance to replace electrical part generally.
503：Obtain the input parameter for interface circuit to be tested；Input parameter includes：Circuit parameter and/or failure
State parameter.
Wherein, circuit parameter includes：Voltage parameter, current parameters；Malfunction parameter includes：Short trouble, open circuit event
Hinder, it is one or more in input nonlinearities signal and reverse power connection.
If getting circuit parameter, current test belongs to routine test, i.e., at nominal conditions to simulation model
Test.
Such as：Limiting condition is simulated, such as：Supply voltage near upper and lower bound (the case where 9V and 16V).
If also having got malfunction parameter, simulation model can be carried out according to the type of malfunction parameter
Robustness is tested.
Such as：When malfunction parameter is short trouble, when open circuit fault, it is (open circuit, short that different loads failure can be simulated
Road) influence to simulation model.
When malfunction parameter is input nonlinearities signal, shadow of the external interference signals input to simulation model can be simulated
It rings.
When malfunction parameter is reverse power connection, influence that can be with analog power reversal connection to simulation model.
Wherein, different types of interface circuit should require content according to its technology, simulate the various special works being likely to occur
Condition is emulated, so as to deeper into discovery potential risk problem.
504：According to the interface circuit to be tested after equivalence replacement, preset input switch and input parameter are generated and are imitated
True mode, and obtain the monitoring point in simulation model；Monitoring point is one or more.
Wherein, step 504 can be realized by following steps：
The interface circuit to be tested after equivalence replacement is connected with preset input switch according to preset connection type
Simulation model is generated, and is input to input parameter as the state of emulation in simulation model.
When complete simulation model foundation after, according to design requirement to each electronic component electrical parameter in simulation model into
Row assignment, and the monitoring point of tester's setting is obtained, so that the circuit data to each monitoring point is acquired.
505：Simulation model is input in simulated environment and carries out emulation testing, and acquires monitoring during emulation testing
The circuit parameter of point.
During circuit simulation, the voltage and current of emphasis acquisition monitoring point is needed, each monitoring point can be recorded
Voltage curve and current curve, and judge whether voltage curve and current curve fall within scope of design, by adjusting
Circuit parameter size meets different emulation demands.
506：When the circuit parameter of collected monitoring point reaches preset alarm threshold, generates warning message and will report
Alert information is shown in by prompting frame in screen.
The corresponding alarm threshold of circuit parameter can be pre-set, and reaches opposite in the collected circuit parameter in monitoring point
It is given a warning when the alarm threshold answered to notify tester.
It is modeled and is illustrated with astern signal (digital signal) circuit：Wherein, the functional item that user chooses is back-up lamp；Driving
Computer；Radar for backing car.The corresponding interface circuit of above three functional item is obtained respectively, and carries out equivalence replacement.Wherein, it drives a vehicle
Micro-control unit in computer obtains replacing electronic device being million grades of large capacity resistance by inquiry；Microcontroller in radar for backing car
Unit obtains replacing electronic device being million grades of large capacity resistance by inquiry.Simulation model is generated after replacement, as shown in fig. 6, should
Show that the circuit diagram of simulation model, the wherein micro-control unit in car running computer and radar for backing car have been replaced with electricity in figure
Resistance.Wherein, tetra- points of A, B, C, D are the monitoring point of tester's setting.
The embodiment of the present invention replaces the micro-control unit in interface circuit to be tested by using electronic device is replaced, and obtains
Sense circuit parameter and/or malfunction parameter, according to after equivalence replacement interface circuit to be tested and preset input open
Pass and circuit parameter and/or malfunction parameter generate simulation model, monitoring point are arranged in simulation model, by simulation model
It is input in simulated environment and carries out emulation testing, and acquire the circuit parameter of monitoring point during emulation testing.By equivalent
The mode of replacement is replaced micro-control unit, reduces actual circuit so that and simulation result is closer to the truth,
Improve the accuracy of emulation；In addition, by the way that malfunction is arranged, actual use situation can be more really simulated, is improved
The efficiency of emulation.
Embodiment three
An embodiment of the present invention provides a kind of simulators of interface circuit, and referring to Fig. 7, which includes：
First acquisition module 701, for obtaining interface circuit to be tested, interface circuit to be tested is one or more
It is a；
Second acquisition module 702, the replacement electricity of micro-control unit in the interface circuit to be tested for obtaining equivalence replacement
Sub- device, and replace the micro-control unit in interface circuit to be tested using electronic device is replaced；
Third acquisition module 703, for obtaining the input parameter for interface circuit to be tested；Input parameter includes：
Circuit parameter and/or malfunction parameter；
Generation module 704, for according to the interface circuit to be tested after equivalence replacement, preset input switch and defeated
Enter parameter and generate simulation model, and obtains the monitoring point in simulation model；Monitoring point is one or more；
Test module 705 carries out emulation testing for simulation model to be input in simulated environment, and in emulation testing
The circuit parameter of monitoring point is acquired in journey.
Wherein, the first acquisition module 701, including：
Acquiring unit chooses functional item to be tested for obtaining user, and functional item to be tested is one or more
It is a；
Selection unit, in the correspondence of preset functional item and interface circuit, choosing function to be tested
The corresponding interface circuit to be tested of project.
Wherein, generation module 704 is used for：
The interface circuit to be tested after equivalence replacement is connected with preset input switch according to preset connection type
Simulation model is generated, and is input to input parameter as the state of emulation in simulation model.
Wherein, device further includes：
Reminding module 706, for when the circuit parameter of collected monitoring point reaches preset alarm threshold, generating report
Warning message is simultaneously shown in by prompting frame in screen by alert information.
Wherein, malfunction parameter includes：Short trouble, open circuit fault, in input nonlinearities signal and reverse power connection
It is one or more.
The embodiment of the present invention replaces the micro-control unit in interface circuit to be tested by using electronic device is replaced, and obtains
Sense circuit parameter and/or malfunction parameter, according to after equivalence replacement interface circuit to be tested and preset input open
Pass and circuit parameter and/or malfunction parameter generate simulation model, monitoring point are arranged in simulation model, by simulation model
It is input in simulated environment and carries out emulation testing, and acquire the circuit parameter of monitoring point during emulation testing.By equivalent
The mode of replacement is replaced micro-control unit, reduces actual circuit so that and simulation result is closer to the truth,
Improve the accuracy of emulation；In addition, by the way that malfunction is arranged, actual use situation can be more really simulated, is improved
The efficiency of emulation.
The embodiments of the present invention are for illustration only, can not represent the quality of embodiment.
One of ordinary skill in the art will appreciate that realizing that all or part of step of above-described embodiment can pass through hardware
It completes, relevant hardware can also be instructed to complete by program, the program can be stored in a kind of computer-readable
In storage medium, storage medium mentioned above can be read-only memory, disk or CD etc..
The foregoing is merely presently preferred embodiments of the present invention, is not intended to limit the invention, it is all the present invention spirit and
Within principle, any modification, equivalent replacement, improvement and so on should all be included in the protection scope of the present invention.
Claims (10)
1. a kind of emulation mode of interface circuit, which is characterized in that the method includes：
Interface circuit to be tested is obtained, the interface circuit to be tested is one or more；
The replacement electronic device of micro-control unit in interface circuit to be tested described in equivalence replacement is obtained, and uses the replacement
Electronic device replaces the micro-control unit in the interface circuit to be tested；
Obtain the input parameter for the interface circuit to be tested；The input parameter includes：Circuit parameter and/or failure
State parameter；
According to the interface circuit to be tested after equivalence replacement, preset input switch and the input parameter are generated and are imitated
True mode, and obtain the monitoring point in the simulation model；The monitoring point is one or more；
The simulation model is input in simulated environment and carries out emulation testing, and during the emulation testing described in acquisition
The circuit parameter of monitoring point.
2. according to the method described in claim 1, it is characterized in that, described obtain interface circuit to be tested, including：
The functional item to be tested that user chooses is obtained, the functional item to be tested is one or more；
According to the correspondence of preset functional item and interface circuit, it is corresponding to be measured to choose the functional item to be tested
The interface circuit of examination.
3. according to the method described in claim 1, it is characterized in that, the interface to be tested according to after equivalence replacement
Circuit, preset input switch and the input parameter generate simulation model, including：
The interface circuit to be tested after equivalence replacement is connected with preset input switch according to preset connection type
Simulation model is generated, and is input to the input parameter as the state of emulation in the simulation model.
4. according to the method described in claim 1, it is characterized in that, described acquire the monitoring during emulation testing
After the circuit parameter of point, the method further includes：
When the circuit parameter of the collected monitoring point reaches preset alarm threshold, warning message is generated and by the report
Alert information is shown in by prompting frame in screen.
5. according to the method described in claim 1, it is characterized in that, the malfunction parameter includes：Short trouble, open circuit event
Hinder, it is one or more in input nonlinearities signal and reverse power connection.
6. a kind of simulator of interface circuit, which is characterized in that described device includes：
First acquisition module, for obtaining interface circuit to be tested, the interface circuit to be tested is one or more；
Second acquisition module, the replacement electronics device for obtaining micro-control unit in interface circuit to be tested described in equivalence replacement
Part, and replace the micro-control unit in the interface circuit to be tested using the replacement electronic device；
Third acquisition module, for obtaining the input parameter for the interface circuit to be tested；The input parameter includes：
Circuit parameter and/or malfunction parameter；
Generation module, for according to the interface circuit to be tested after equivalence replacement, preset input switch and described
Input parameter generates simulation model, and obtains the monitoring point in the simulation model；The monitoring point is one or more；
Test module carries out emulation testing for the simulation model to be input in simulated environment, and in the emulation testing
The circuit parameter of the monitoring point is acquired in the process.
7. device according to claim 6, which is characterized in that first acquisition module, including：
Acquiring unit, for obtain user selection functional item to be tested, the functional item to be tested be one or
It is multiple；
Selection unit chooses the function to be tested for the correspondence according to preset functional item and interface circuit
The corresponding interface circuit to be tested of project.
8. device according to claim 6, which is characterized in that the generation module is used for：
The interface circuit to be tested after equivalence replacement is connected with preset input switch according to preset connection type
Simulation model is generated, and is input to the input parameter as the state of emulation in the simulation model.
9. device according to claim 6, which is characterized in that described device further includes：
Reminding module, for when the circuit parameter of the collected monitoring point reaches preset alarm threshold, generating alarm
The warning message is simultaneously shown in by prompting frame in screen by information.
10. device according to claim 6, which is characterized in that the malfunction parameter includes：Short trouble, open circuit
Failure, it is one or more in input nonlinearities signal and reverse power connection.
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| CN111044826B (en) * | 2019-12-30 | 2022-07-19 | 上海科梁信息科技股份有限公司 | Detection method and detection system |
| CN113279962B (en) * | 2021-07-01 | 2023-01-13 | 华能国际电力股份有限公司上安电厂 | Air compressor controller modification method |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2985827B1 (en) * | 2012-01-17 | 2014-01-31 | St Microelectronics Sa | METHOD FOR TESTING AN INTEGRATED CIRCUIT |
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| CN2909315Y (en) * | 2006-05-31 | 2007-06-06 | 比亚迪股份有限公司 | Liquid crystal module test platform for mixed voltage system |
| US8543368B1 (en) * | 2008-08-05 | 2013-09-24 | Marvell Israel (M.I.S.L.) Ltd. | Method and system for testing |
| CN101504692A (en) * | 2009-03-25 | 2009-08-12 | 炬力集成电路设计有限公司 | System and method for validating and testing on-chip system |
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