CN105067848A - Flip up-and-down-type probe module - Google Patents
Flip up-and-down-type probe module Download PDFInfo
- Publication number
- CN105067848A CN105067848A CN201510485854.8A CN201510485854A CN105067848A CN 105067848 A CN105067848 A CN 105067848A CN 201510485854 A CN201510485854 A CN 201510485854A CN 105067848 A CN105067848 A CN 105067848A
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- China
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- plate
- type probe
- positioning
- probe module
- rotating shaft
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Abstract
The invention relates to a flip up-and-down-type probe module which comprises a cover plate, a rotating shaft plate, a flexible board, a probe plate, linear bearings, guide rods, support plates, positioning pins, a product carrier plate and guiding shafts. The flip up-and-down-type probe module can update the positioning mode of the product carrier plate and the avoiding mode of the guide rods as needed and can update the number of the probes on the probe plate according to the number of pins of a connector; and through the arrangement of the plurality of guiding bearings, accurate positioning can be ensured when the probe plate on the cover plate moves up and down. When the cover plate and the probe plate are pressed down to a test position, the cover plate can be locked tightly through an assisting structure, such as buckles and the like, and thus stability of the test is ensured. Besides, the support plates are made of elastic materials, so that the functions of buffering and positioning of the internal positioning pins can be achieved. The flip up-and-down-type probe module is high in positioning precision, is high in product position repeated accuracy, ensures accurate positioning of the probes when the connector is on the upward surface of the product, is small in size and saves space, and is high in operability.
Description
Technical field
The present invention relates to mechanical manufacturing field, specifically renovate vertical type probe module.
Background technology
Electronic technology is late nineteenth century, earlier 1900s starts the emerging technology that grows up, and twentieth century development is the rapidest, most widely used general, becomes an important symbol of modern science technical development.
First generation electronic product take electron tube as core.Be born first transistor in the world at the forties end, and it, with features such as small and exquisite, light, power saving, life-span length, should be used by various countries soon, in very large range instead of electron tube.The fifties latter stage, occurred first piece of integrated circuit in the world, it on one piece of silicon, makes electronic product to more miniaturization the electronic component integrations such as many transistors.Integrated circuit develops large scale integrated circuit and VLSI (very large scale integrated circuit) rapidly from small scale integration, thus makes electronic product towards high-effect low consumption, high precision, high stable, intelligentized future development.
Along with the development of society, human cost by liter, the rise of robotization industry, widely using of automation equipment, cannot replace, and wideling popularize of this important instrument of automation equipment, can save a large amount of man power and materials to every profession and trade.Improve the quality of product, increase Economic returns.
In the product of connector class, when needs are tested connector switching performance, often there is product orientation and forbidden, the problem that test period is long, also do not have at present a kind of structure simple, easy to use renovate vertical type probe module for connector series products test development.
Summary of the invention
The present invention, just for above technical matters, provides a kind of structure simple, easy to use renovates vertical type probe module for connector series products test development.
The present invention is achieved through the following technical solutions:
Renovate vertical type probe module, comprise cover plate, rotating shaft plate, soft board, needle plate, linear bearing, guide rod, supporting plate, register pin, product support plate, the axis of guide, it is characterized in that below soft board, being provided with multiple guide rod, needle plate is arranged on middle part below soft board, soft board is arranged on rotating shaft plate by cover plate, multiple linear bearing is provided with below rotating shaft plate, the axis of guide is provided with below linear bearing, product support plate is provided with in the middle part of rotating shaft plate, multiple register pin is provided with around product support plate, rotating shaft plate corner is provided with supporting plate, and plate thickness is higher than product support plate.Linear bearing is four.Guide rod is four.Supporting plate is made up of resilient material.
The present invention can dodge mode according to the location of demand upgrading products support plate and guide rod, the quantity of probe on needle plate can be upgraded according to the quantity of connector feet, and by the multiple guide bearing of design, thus accurate location can be guaranteed when the needle plate on cover plate is moved up and down.When cover plate and needle plate are pressed down to test position, can be locked by cover plate by supplementary structures such as buckles, guarantee the stability of testing.In addition, by supporting plate is designed to resilient material, the positioning action of buffering and positioned internal pin can be played.
Positioning precision of the present invention is high, and product space repeatable accuracy is high, ensure connector product upward time, probe can accurately be located, volume trifle save space, strong operability.
Accompanying drawing explanation
In accompanying drawing, Fig. 1 is structural representation of the present invention, wherein:
1-cover plate, 2-rotating shaft plate, 3-soft board, 4-needle plate, 5-linear bearing, 6-guide rod, 7-supporting plate, 8-register pin, 9-product support plate, 10-axis of guide.
Embodiment
Below in conjunction with accompanying drawing, the invention will be further described.
Renovate vertical type probe module, comprise cover plate 1, rotating shaft plate 2, soft board 3, needle plate 4, linear bearing 5, guide rod 6, supporting plate 7, register pin 8, product support plate 9, the axis of guide 10, it is characterized in that below soft board 3, being provided with multiple guide rod 6, needle plate 4 is arranged on middle part below soft board 3, soft board 3 is arranged on rotating shaft plate 2 by cover plate 1, multiple linear bearing 5 is provided with below rotating shaft plate 2, the axis of guide 10 is provided with below linear bearing 5, product support plate 9 is provided with in the middle part of rotating shaft plate 2, multiple register pin 8 is provided with around product support plate 9, rotating shaft plate 2 four jiaos is provided with supporting plate 7, supporting plate 7 thickness is higher than product support plate 9.Linear bearing 5 is four.Guide rod 6 is four.Supporting plate 7 is made up of resilient material.
The present invention can dodge mode according to the location of demand upgrading products support plate 9 and guide rod 6, the quantity of probe on needle plate 4 can be upgraded according to the quantity of connector feet, and held by the multiple axis of guide 10 of design, thus accurate location can be guaranteed when the needle plate 4 on cover plate 1 is moved up and down.When cover plate 1 and needle plate 4 are pressed down to test position, by supplementary structures such as buckles by locked for cover plate 1, the stability of testing can be guaranteed.In addition, by supporting plate 7 is designed to resilient material, the positioning action of buffering and positioned internal pin 8 can be played.
Positioning precision of the present invention is high, and product space repeatable accuracy is high, ensure connector product upward time, probe can accurately be located, volume trifle save space, strong operability.
Above-mentioned technical conceive and the feature merely illustrating invention, its objective is and be one of ordinary skilled in the art can be understood the content of invention and implement according to this, can not limit the scope of the invention.The change of every equivalence done by the essence of content of the present invention or modification, all should be encompassed in protection scope of the present invention.
Claims (4)
1. renovate vertical type probe module, comprise cover plate, rotating shaft plate, soft board, needle plate, linear bearing, guide rod, supporting plate, register pin, product support plate, the axis of guide, it is characterized in that below soft board, being provided with multiple guide rod, needle plate is arranged on middle part below soft board, soft board is arranged on rotating shaft plate by cover plate, multiple linear bearing is provided with below rotating shaft plate, the axis of guide is provided with below linear bearing, product support plate is provided with in the middle part of rotating shaft plate, multiple register pin is provided with around product support plate, rotating shaft plate corner is provided with supporting plate, and plate thickness is higher than product support plate.
2. renovate vertical type probe module according to claim 1, it is characterized in that described linear bearing is four.
3. renovate vertical type probe module according to claim 1, it is characterized in that described guide rod is four.
4. renovate vertical type probe module according to claim 1, it is characterized in that described supporting plate is made up of resilient material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510485854.8A CN105067848A (en) | 2015-08-10 | 2015-08-10 | Flip up-and-down-type probe module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510485854.8A CN105067848A (en) | 2015-08-10 | 2015-08-10 | Flip up-and-down-type probe module |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN105067848A true CN105067848A (en) | 2015-11-18 |
Family
ID=54497267
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510485854.8A Pending CN105067848A (en) | 2015-08-10 | 2015-08-10 | Flip up-and-down-type probe module |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105067848A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108802444A (en) * | 2018-08-16 | 2018-11-13 | 苏州市运泰利自动化设备有限公司 | Cover-lifting type test structure |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201110879Y (en) * | 2007-10-26 | 2008-09-03 | 比亚迪股份有限公司 | Connector testing device |
| JP2012229923A (en) * | 2011-04-25 | 2012-11-22 | Micronics Japan Co Ltd | Electrical connection device |
| CN103760389A (en) * | 2014-01-06 | 2014-04-30 | 东莞市沃德精密机械有限公司 | Turning and downward pressing positioning mechanism |
| CN204945192U (en) * | 2015-08-10 | 2016-01-06 | 苏州赛腾精密电子股份有限公司 | Renovate vertical type probe module |
-
2015
- 2015-08-10 CN CN201510485854.8A patent/CN105067848A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201110879Y (en) * | 2007-10-26 | 2008-09-03 | 比亚迪股份有限公司 | Connector testing device |
| JP2012229923A (en) * | 2011-04-25 | 2012-11-22 | Micronics Japan Co Ltd | Electrical connection device |
| CN103760389A (en) * | 2014-01-06 | 2014-04-30 | 东莞市沃德精密机械有限公司 | Turning and downward pressing positioning mechanism |
| CN204945192U (en) * | 2015-08-10 | 2016-01-06 | 苏州赛腾精密电子股份有限公司 | Renovate vertical type probe module |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108802444A (en) * | 2018-08-16 | 2018-11-13 | 苏州市运泰利自动化设备有限公司 | Cover-lifting type test structure |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20151118 |
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| RJ01 | Rejection of invention patent application after publication |