CN105066957A - Method for determining height consistency of multiple groups of micro switches in automobile combination switch - Google Patents
Method for determining height consistency of multiple groups of micro switches in automobile combination switch Download PDFInfo
- Publication number
- CN105066957A CN105066957A CN201510431702.XA CN201510431702A CN105066957A CN 105066957 A CN105066957 A CN 105066957A CN 201510431702 A CN201510431702 A CN 201510431702A CN 105066957 A CN105066957 A CN 105066957A
- Authority
- CN
- China
- Prior art keywords
- microswitch
- gauge block
- patrix
- height
- microswitches
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C5/00—Measuring height; Measuring distances transverse to line of sight; Levelling between separated points; Surveyors' levels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
Abstract
The invention discloses a method for determining the height consistency of multiple groups of micro switches in an automobile combination switch, and the method comprises the following steps: A. a microswitch part to be measured is placed in a lower die of a measuring apparatus; B. an upper die descends, a probe firstly contacts with a microswitch, a upper die continuously descends, till a detection block contacts a lower limit surface of a gauge block, and the upper die stops descending; if a LED laminates, the determination result is that the combination switch is qualified, and a next step is carried out, otherwise, the determination result is that the combination switch is not qualified; C. the upper die ascends, and the step is pushed to the upper part of the lower limit surface of the gauge block; the height of the step is a difference between the upper limit and the lower limit of the fluctuation permitted by a micro switch height; D. the upper die descends downwards to the upper limit surface of the gauge block, if the LED does not illuminates, the determination result is that the combination switch is qualified, and the test ends; otherwise, the determination result is that the combination switch is not qualified. According to the invention, defects including big measuring errors of the original height verniercalliper and low efficiency are avoided; the invention has the advantages of simple structure, saved labor and time, high measuring precision, etc., and actual production demands are met.
Description
Technical field
The present invention relates to the elevation carrection field of many group microswitches in automobile combined switch, particularly relate to the coherence measurement decision method of one group of microswitch height.
Background technology
In current automobile combined switch, one group of microswitch high consistency judges, adopts vernier height slide calliper rule to measure microswitch altitude information one by one, then judges consistance whether in the margin tolerance allowed.Namely on the worktable of a smooth level, put the locating piece of vernier height slide calliper rule and one piece of calibrated altitude, be placed on locating piece by there being the parts of one group of microswitch, then moving cursor height calipers, when measuring jaw of ruling contacts with one of them microswitch peak, read the calibration data on vernier height slide calliper rule, by that analogy, measure other microswitch peak data one by one, according to the data measured, calculate microswitch height fluctuation scope, then determine whether in the margin tolerance allowed.The structure of above-mentioned microswitch and microswitch parts is see Figure of description Fig. 1 to 2 part.Above-mentioned decision method efficiency is low, and measuring error is large, and wastes time and energy, and is difficult to meet large batch of Production requirement.
Summary of the invention
For overcoming above-mentioned technical matters, the invention provides many group microswitch high consistency decision methods in a kind of automobile combined switch, solving existing method of testing measuring error large, the problem wasted time and energy.
The technical solution adopted for the present invention to solve the technical problems is: the high consistency decision method of many group microswitches in a kind of automobile combined switch, comprises the steps:
A, microswitch parts to be measured are placed on the counterdie of measurement mechanism;
B, patrix are descending, and first probe contacts with microswitch, and patrix continues descending, until detection block contacts with gauge block smallest limit face, patrix stops moving down; If lumination of light emitting diode, then it is qualified to judge, continues next step, otherwise is defective;
C, patrix are up, then step are pushed into the top in gauge block smallest limit face; The height of this step is that microswitch height allows the limes superiors of fluctuation and the difference of smallest limit;
D, patrix are downwards until move to gauge block limes superiors face, if light emitting diode is not luminous, then it is qualified to be judged to be, terminate test; Otherwise be defective.
Adopt technique scheme, when detecting block and contact with gauge block smallest limit face, microswitch respectively with detect block, probes touch, form a conductive path, make the luminescence of one group of LEDs ON.When detecting block and contacting with gauge block limes superiors face, microswitch does not contact with detection block, but and probes touch, form the open circuit of a conduction, one group of light emitting diode cut-off is not luminous.Clearly can judge that tested microswitch parts are qualified fast by said method, otherwise be defective.
As a further improvement on the present invention, also comprise in steps A and counterdie is fixed on the horizontal table of erecting frame, and patrix is arranged on erecting frame, make it the step that can vertically be free to slide.
Further improve as of the present invention, above-mentioned measurement mechanism comprises upper die and lower die.
Wherein, patrix comprises die shank, the punch shank plate be connected with die shank, is fixed on the fixed head below punch shank plate, and the one group of electric conductivity be arranged on the downside of fixed head detects block and one group of electric conductivity probe.Above-mentioned detection block is connected with fixed head by one group of electric conductivity first screw, offers a groove, be mounted with lithium battery in groove above fixed head, and a pole of this lithium battery and wherein one piece of first screw are connected.The sidewall of fixed head is provided with light emitting diode, and this light emitting diode is connected respectively by another pole of wire and probe, lithium battery.
Counterdie comprises base plate, is fixed on for settling the locating piece of many group microswitches on base plate, and is arranged on the gauge block of locating piece side.Gauge block is provided with a step, and the height of this step is that microswitch height allows the limes superiors of fluctuation and the difference of smallest limit.The lower surface of described step is gauge block smallest limit face, and its upper surface corresponds to gauge block limes superiors face.
As concrete a kind of embodiment of the present invention, described detection block is L shape.The shape of certain detection block is not limited thereto, as long as can realize and the contacting of microswitch and gauge block on counterdie.
For ensureing that it is consistent for detecting block with the surface in contact height of microswitch and gauge block, and then improving measuring accuracy, after patrix assembling terminates, also needing to carry out disposable fine grinding to the surface of contact of detection block and microswitch and gauge block.
Further, punch shank plate and fixed head are made up of insulating material.First screw of detection block, probe and fastening detection block is made up of conductive material.
For convenience of mobile step, be also provided with the chute for the step that slides at gauge block upper surface.
The present invention is compared with prior art, and its advantage is:
The present invention is coordinated with gauge block by detection block and forms measuring height range of control, and by microswitch, probe, light emitting diode, lithium battery, the first screw and detection block composition decision circuit, when utilizing path, light emitting diode is bright, the principle that during open circuit, light emitting diode does not work, whether detection microswitch contacts with detection block, the high consistency achieving many group microswitches judges, solves original vernier height kind of calliper error large, inefficient problem.Structure of the present invention is simple, and time saving and energy saving, measuring accuracy is high, and piece installing, pickup are very convenient, the demand of realistic production.
Accompanying drawing explanation
Below with reference to drawings and Examples, the present invention is described in detail.
Fig. 1 is the structural representation of microswitch.
Fig. 2 is the stereographic map of microswitch parts to be measured.
Fig. 3 is cut-open view of the present invention, illustrates the matching relationship of detection block and gauge block in figure.
Fig. 4 is side view of the present invention.
Fig. 5 is the schematic diagram that the present invention is arranged on erecting frame.
In figure, 1, die shank, 2, holding screw, 3, erecting frame, 4, punch shank plate, 5, fixed head, the 6, first screw, 7, detection block, 8, gauge block, 9, base plate, 10, step, 11, locating piece, 12, probe, 13, light emitting diode, 14, lithium battery, 15, microswitch parts to be measured, the 16, first contact site, the 17, second contact site, 18, insulation shell, 19, gauge block limes superiors face, 20, gauge block smallest limit face.
Embodiment
Embodiment,
Refer to Fig. 1 to 2, illustrate the microswitch parts 15 to be measured of microswitch and multiple microswitch composition in figure, each microswitch comprises first contact site 16 that can contact with detection block 7, the second contact site 17 contacted with probe.Microswitch parts 15, except comprising multiple above-mentioned microswitch, also comprise insulation shell 18.
See also Fig. 3 to 4, in a kind of automobile combined switch, many group microswitch high consistency decision makers, are made up of upper die and lower die two parts.
Wherein, patrix comprises die shank 1, and die shank 1 is tightened on punch shank plate 4, and locks with holding screw 2, fixed head 5 by screw fastening below punch shank plate 4.One group of L shape electric conductivity detection block 7 and one group of electric conductivity probe 12 fixed head 5 be equipped with.Detection block 7 is set in fixed head 5 groove, and locks with two piece of first screw 6 respectively.Wherein one piece of screw 6 connects with lithium battery 14 positive pole be contained in fixed head 5, the negative pole of lithium battery 14 connects with light emitting diode 13 negative electrode be clipped between fixed head 5 with punch shank plate 4, light emitting diode 13 anode be arranged on probe 12 corresponding in fixed head 5 and connect.In addition, punch shank plate 4 and fixed head 5 are made up of insulating material.First screw 6 of detection block 7, probe 12 and fastening detection block is made up of conductive material.Detection block 7 has also carried out disposable fine grinding process with the first contact site 16 of microswitch and the surface of contact of gauge block 8, and then ensures that detection block surface in contact height is consistent.
Counterdie comprises base plate 9, locating piece 11 and gauge block 8, and above-mentioned locating piece 11 is fixed by screws on base plate 9, for settling microswitch 15.Gauge block 8 is arranged on the sidepiece of locating piece 11, and gauge block 8 is provided with a step 10, and the height of this step 10 is that microswitch height allows the limes superiors L+A of fluctuation and the difference of smallest limit L-A, i.e. 2A.The lower surface of step is gauge block smallest limit face 20, corresponding testing jiggle switch lower limit position; Its upper surface is gauge block limes superiors face 19, corresponding testing jiggle switch upper extreme position.Preferably, the chute (not shown) for the step that slides also is provided with at gauge block 8 upper surface place.
Refer to Fig. 5, during work, be arranged on erecting frame first respectively by upper die and lower die, ensure that patrix can vertically be free to slide, counterdie is fixed on the horizontal table of erecting frame, is then placed on the locating piece of counterdie by microswitch component level.Then by patrix slide downward, first probe contacts with the second contact site of microswitch, and patrix continues descending, and detection block contacts with gauge block smallest limit face, and patrix stops moving down.Now microswitch respectively with detection block, probes touch, forms a conductive path, makes the luminescence of one group of LEDs ON.
Then moved up by patrix, the step on gauge block is pushed into the bottom at detection block, patrix is downwards until move to gauge block limes superiors face, now microswitch does not contact with detection block, but with probes touch, form the open circuit of a conduction, one group of light emitting diode cut-off is not luminous.
Clearly can judge that tested microswitch parts are qualified fast by said method, otherwise be defective.
The above is only to preferred embodiment of the present invention; not scope of the present invention is limited; therefore under not departing from the present invention and designing the prerequisite of spirit; those of ordinary skill in the art change or decoration the equivalence that structure of the present invention, feature and principle are done; as driven patrix to move up and down etc. by the driver part such as cylinder or gear, all should fall within the scope of protection of the present invention.
Claims (7)
1. the high consistency decision method organizing microswitch in automobile combined switch, is characterized in that, comprise the steps: more
A, microswitch parts to be measured are placed on the counterdie of measurement mechanism;
B, patrix are descending, and first probe contacts with microswitch, and patrix continues descending, until detection block contacts with gauge block smallest limit face, patrix stops moving down; If lumination of light emitting diode, then it is qualified to judge, continues next step, otherwise is defective;
C, patrix are up, then step are pushed into the top in gauge block smallest limit face; The height of this step is that microswitch height allows the limes superiors of fluctuation and the difference of smallest limit;
D, patrix are downwards until move to gauge block limes superiors face, if light emitting diode is not luminous, then it is qualified to be judged to be, terminate test; Otherwise be defective.
2. the high consistency decision method of many group microswitches in automobile combined switch as claimed in claim 1, it is characterized in that: also comprise in described steps A and counterdie is fixed on the horizontal table of erecting frame, and patrix is arranged on erecting frame, make it the step that can vertically be free to slide.
3. the high consistency decision method of many group microswitches in automobile combined switch as claimed in claim 1 or 2, is characterized in that: in described steps A, measurement mechanism comprises upper die and lower die;
Described patrix comprises die shank, the punch shank plate be connected with die shank, and is fixed on the fixed head below punch shank plate; One group of electric conductivity detection block and one group of electric conductivity probe is also provided with on the downside of fixed head, this detection block is connected with fixed head by one group of electric conductivity first screw, a groove is offered above fixed head, be mounted with lithium battery in groove, a pole of this lithium battery and wherein one piece of first screw are connected; The sidewall of described fixed head is provided with light emitting diode, and this light emitting diode is connected respectively by another pole of wire and probe, lithium battery;
Described counterdie comprises base plate, is fixed on for settling the locating piece of many group microswitches on base plate, and is arranged on the gauge block of locating piece side; This gauge block is provided with a step, and the height of this step is that microswitch height allows the limes superiors of fluctuation and the difference of smallest limit.
4. the high consistency decision method of many group microswitches in automobile combined switch as claimed in claim 3, is characterized in that: described detection block is L shape.
5. the high consistency decision method of many group microswitches in automobile combined switch as claimed in claim 3, is characterized in that: the surface of contact of described detection block and microswitch and gauge block is the surface of contact processed through disposable fine grinding.
6. the high consistency decision method of many group microswitches in automobile combined switch as claimed in claim 3, is characterized in that: described punch shank plate and fixed head are made up of insulating material.
7. the high consistency decision method of many group microswitches in automobile combined switch as claimed in claim 3, is characterized in that: described gauge block upper surface is also provided with the chute for the step that slides.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510431702.XA CN105066957B (en) | 2015-07-20 | 2015-07-20 | Method for determining height consistency of multiple groups of micro switches in automobile combination switch |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510431702.XA CN105066957B (en) | 2015-07-20 | 2015-07-20 | Method for determining height consistency of multiple groups of micro switches in automobile combination switch |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105066957A true CN105066957A (en) | 2015-11-18 |
| CN105066957B CN105066957B (en) | 2017-04-12 |
Family
ID=54496384
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510431702.XA Active CN105066957B (en) | 2015-07-20 | 2015-07-20 | Method for determining height consistency of multiple groups of micro switches in automobile combination switch |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105066957B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108918116A (en) * | 2018-06-22 | 2018-11-30 | 格力电器（武汉）有限公司 | A kind of jogging switches measurement fixture and jogging switches measurement device |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5713374A (en) * | 1980-06-30 | 1982-01-23 | Meidensha Electric Mfg Co Ltd | Measuring method for consumed amount of contact point in vacuum switch |
| JPS58206984A (en) * | 1982-05-28 | 1983-12-02 | Showa Electric Wire & Cable Co Ltd | Withstand voltage testing device of gas insulating switchgear |
| US20120319692A1 (en) * | 2010-02-24 | 2012-12-20 | Lalonge Patrick | Mobile system for measuring abnormality detection parameters of a switch in a high voltage electrical substation |
| CN103529383A (en) * | 2012-02-29 | 2014-01-22 | 温州奔龙自动化科技有限公司 | Automatic testing device |
| CN104076276A (en) * | 2014-06-30 | 2014-10-01 | 苏州固基电子科技有限公司 | Device for detecting rolling wheel type microswitch |
-
2015
- 2015-07-20 CN CN201510431702.XA patent/CN105066957B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5713374A (en) * | 1980-06-30 | 1982-01-23 | Meidensha Electric Mfg Co Ltd | Measuring method for consumed amount of contact point in vacuum switch |
| JPS58206984A (en) * | 1982-05-28 | 1983-12-02 | Showa Electric Wire & Cable Co Ltd | Withstand voltage testing device of gas insulating switchgear |
| US20120319692A1 (en) * | 2010-02-24 | 2012-12-20 | Lalonge Patrick | Mobile system for measuring abnormality detection parameters of a switch in a high voltage electrical substation |
| CN103529383A (en) * | 2012-02-29 | 2014-01-22 | 温州奔龙自动化科技有限公司 | Automatic testing device |
| CN104076276A (en) * | 2014-06-30 | 2014-10-01 | 苏州固基电子科技有限公司 | Device for detecting rolling wheel type microswitch |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108918116A (en) * | 2018-06-22 | 2018-11-30 | 格力电器（武汉）有限公司 | A kind of jogging switches measurement fixture and jogging switches measurement device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105066957B (en) | 2017-04-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN205228374U (en) | Device of metalwork size defect is examined to quick sieve | |
| CN205217402U (en) | Device of high defect in metalwork groove / hole is examined to quick sieve | |
| CN205228430U (en) | Device of metalwork plane degree defect is examined to quick sieve | |
| CN105423888A (en) | Metal piece size defect rapid screening method and device | |
| CN204788230U (en) | Multiunit micro -gap switch highly uniform nature decision maker among automotive combined switch | |
| CN104535916A (en) | Circuit board testing tool | |
| CN203837683U (en) | Full-automatic inner diameter, outer chamfer and height detection device for deep groove ball bearing | |
| CN204461331U (en) | A kind of cross plate deformation Simple measurement device | |
| CN105066957A (en) | Method for determining height consistency of multiple groups of micro switches in automobile combination switch | |
| CN210664256U (en) | Precision gear machining detection device | |
| CN104501699A (en) | Automobile rear tail lamp assembly detector | |
| CN202149732U (en) | On-line rapid size detection device | |
| CN200942472Y (en) | Workpiece measuring device | |
| CN204359251U (en) | A kind of automobile back tail lamp assembly checking tool | |
| CN204347201U (en) | Circuit board testing frock | |
| CN203824508U (en) | Product dimension measuring tool | |
| CN105066858A (en) | Device for judging height consistency of multiple groups of microswitches in automobile combination switch | |
| CN206387822U (en) | Press formula fixture on-line testing two-pass test structure | |
| CN211824254U (en) | Flatness detection device | |
| CN210718894U (en) | Rapid measurement tool based on virtual reference plane | |
| CN210198309U (en) | Verticality detection device for metal workpiece | |
| CN211426698U (en) | Floating jig and testing device for FCT (circuit board test) | |
| CN210108164U (en) | Quick replacement device and test tool for testing digital detonator module | |
| CN102798336A (en) | Rapid detection fixture for punched products | |
| CN203672706U (en) | Flexural strength tester |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |