CN105043300A - Three-dimensional measurement system capable of projecting to measured object simultaneously from multiple directions - Google Patents

Three-dimensional measurement system capable of projecting to measured object simultaneously from multiple directions Download PDF

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Publication number
CN105043300A
CN105043300A CN201510280361.0A CN201510280361A CN105043300A CN 105043300 A CN105043300 A CN 105043300A CN 201510280361 A CN201510280361 A CN 201510280361A CN 105043300 A CN105043300 A CN 105043300A
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China
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lcos projector
lcos
projector
measured object
sine streak
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CN201510280361.0A
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Chinese (zh)
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陈昌科
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DONGGUAN MENTO PHOTOELECTRIC TECHNOLOGY Co Ltd
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DONGGUAN MENTO PHOTOELECTRIC TECHNOLOGY Co Ltd
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Priority to CN201510280361.0A priority Critical patent/CN105043300A/en
Publication of CN105043300A publication Critical patent/CN105043300A/en
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Abstract

The invention relates to the technical field of three-dimensional measurement, and particularly relates to a three-dimensional measurement system capable of projecting to a measured object simultaneously from multiple directions. According to the invention, four LCOS projectors are utilized to project the same sinusoidal fringes to the measured object simultaneously from the front, the back, the left and the right of the measured object, the sinusoidal fringes projected by the two LCOS projectors at the left and the right of the measured object are enabled to be overlapped through appropriately configuring the four LCOS projectors, the sinusoidal fringes projected by the two projectors at the front and the back of the measured object are also enabled to be overlapped, and the sinusoidal fringes projected by the two projectors at the front and the back of the measured objected and the sinusoidal fringes projected by the two LCOS projectors at the left and the right of the measured object are vertically crossed and overlapped. A common overlapped area of the four pieces of sinusoidal fringes is extracted in one time, and the four pieces of sinusoidal fringes in the common overlapped area can be separated according to an overlapping and orthogonality relation among the four pieces of sinusoidal fringes, thereby greatly shortening the three-dimensional imaging time, and improving the three-dimensional measurement efficiency.

Description

Can from the multi-faceted three-dimension measuring system projected to measured object simultaneously
Technical field
The present invention relates to three-dimensional measurement technical field, particularly relate to a kind of can from the multi-faceted three-dimension measuring system projected to measured object simultaneously.
Background technology
The micro-measuring system of 3D of current employing structured light, no matter be Moire fringe or digital stripe, its striped all adopts phase shifts to modulate, and uses sine wave, and a waveform moves several times and completes.According to measurement range and accuracy requirement, general phase shifts 3 times, 4 times or 6 times.Meanwhile, for there being shade position (produce and measure blind area) when solving the measured object measuring height change, the micro-measuring system of 3D of all employing structured lights all can at different orientation projection striped light.If left and right is with 2, use 4 all around, even use 8.
Below for adopting Moire fringe and the citing of digital stripe imaging process:
Moire fringe is that physically moving grating (namely having the glass plate of etching line) reaches mobile sinusoidal wave object.For first Moire fringe generator: when first time is imaged on 0 degree of phase place, light source luminescent forms Moire fringe through optical grating diffraction, projects on measured object, then camera capture; When second time is imaged on 90 degree of phase places, grating horizontal mechanical moves 1/4 wavelength distance, if a sinusoidal wavelength is 32 pixels, then uses Sensor motor to make glass plate move the distance of 8 pixels, then presses preceding method imaging; Third time and the 4th imaging respectively in 180 degree of phase places and 270 degree of phase places, imaging process and in like manner aforementioned.Second, the 3rd and the 4th Moire fringe generator according to the method imaging identical with first Moire fringe generator, meanwhile, camera capture.
Digital stripe is produced by digital stripe generator, as LCOS or DLP (Digital Light Processor of Texas Instruments).The digital stripe of each phase place has been deposited in flash memory, work hours brief note line read in working storage (RAM) from flash memory, then imaging.For first digit striped generator: when first time is imaged on 0 degree of phase place, read 0 degree of phase place digital stripe in flash memory, and project digital stripe on measured object, then camera capture; When second time is imaged on 90 degree of phase places, reads the digital stripe pattern of 90 degree in flash memory, and project digital stripe on measured object, then camera capture; Third time imaging and the 4th imaging respectively in 180 degree of phase places and 270 degree of phase places, imaging process and in like manner aforementioned.Second, the 3rd and fourth digit striped generator according to the method imaging identical with first Moire fringe generator, meanwhile, camera capture.
From above-mentioned imaging process, no matter be for Moire fringe generator or digital stripe generator, its imaging process is each striped generator and carries out fringe projection in order.Namely last striped generator project after each phase fringes image by phase sequence, and a rear striped generator projects by the method same with last striped generator again, until all striped generators project complete.Like this, complete the time overhead of streaky imaging be several times that adopt an independent striped generator, greatly restrict the application of this technology.
Summary of the invention
Technical matters to be solved by this invention is, there is provided a kind of can from the multi-faceted three-dimension measuring system projected to measured object simultaneously, project to this visual field in four orientation all around of visual field by four LCOS projectors the striped light of same phase simultaneously, only need carry out in each phase place the candy strip that a capture just can obtain this phase place that each LCOS projector projects respectively.The present invention is achieved in that
A kind of three-dimension measuring system, for carrying out three-dimensional measurement to the measured object placed on the first plane, comprises graphical analysis and control system, camera, a LCOS projector, the 2nd LCOS projector, the 3rd LCOS projector and the 4th LCOS projector;
A described LCOS projector, the 2nd LCOS projector, the 3rd LCOS projector and the 4th LCOS projector are identical, be arranged, respectively the front, rear, left and right four direction of described measured object, and the light-emitting area of respective LCOS chip is parallel with described first plane and be all positioned at in described first parallel plane second plane;
Described graphical analysis and control system to project same width sine streak to described measured object for controlling a described LCOS projector, the 2nd LCOS projector, the 3rd LCOS projector and the 4th LCOS projector simultaneously;
The sine streak that a described LCOS projector, the 2nd LCOS projector, the 3rd LCOS projector and the 4th LCOS projector are configured to a described LCOS projector and the projection of the 2nd LCOS projector overlaps, the sine streak of described 3rd LCOS projector and the projection of the 4th LCOS projector overlaps, and overlapping with the sine streak square crossing that a described LCOS projector and the 2nd LCOS projector project;
Described graphical analysis and control system also for by the common overlapping region of all sine streaks of described collected by camera, and extract the sine streak of a described LCOS projector, the 2nd LCOS projector, the 3rd LCOS projector and the projection of the 4th LCOS projector respectively from this common overlapping region.
Further, the camera lens front end of a described LCOS projector, the 2nd LCOS projector, the 3rd LCOS projector and the 4th LCOS projector is all provided with the optical lens group for optically focused.
Further, the camera lens of described camera is telecentric lens.
Further, a described LCOS projector, the 2nd LCOS projector, the 3rd LCOS projector and the 4th LCOS projector are connected with described camera, also for while the sine streak identical to described plane projection, trigger described camera synchronization by synchronizing signal to expose described measured object, to gather the common overlapping region of all sine streaks.
Further, described sine streak comprises four phase places, is respectively 0 degree of phase place, 90 degree of phase places, 180 degree of phase places and 270 degree of phase places; The sine streak figure of a LCOS projector described in synchronization, the 2nd LCOS projector, the 3rd LCOS projector and the 4th LCOS projector projection same phase place wherein.
Further, the resolution of described LCOS chip is 1280*1080.
Further, described sine streak is the sine streak pattern of rectangle at the figure that described plane is formed.
Compared with prior art, the present invention utilizes four LCOS projectors to project same width sine streak from the front, rear, left and right four direction of measured object to measured object simultaneously, by appropriately configuring four LCOS projectors, the sine streak of the Liang Tai LCOS projector projection about measured object is overlapped, the sine streak of the Liang Tai projector projection before and after measured object also overlaps, and overlapping with the sine streak square crossing that the Liang Tai LCOS projector about measured object projects.Behind the common overlapping region of disposable extraction four width sine streak, four width sine streaks in this common overlapping region can be separated by the coincidence between four width sine streaks and orthogonality relation, thus substantially reduce the three-dimensional imaging time, improve three-dimensional measurement efficiency.
Accompanying drawing explanation
Fig. 1: the three-dimension measuring system composition structural representation that the embodiment of the present invention provides;
Fig. 2: the relative position relation schematic diagram of each LCOS projector and the first plane 1 and the second plane 2;
Fig. 3: the sine streak schematic diagram of LCOS projector projection in the embodiment of the present invention;
Fig. 4: when not controlling crevice projection angle, the common overlapping region coincidence effect schematic diagram of four width sine streaks;
Fig. 5: during conservative control crevice projection angle, the common overlapping region coincidence effect schematic diagram of four width sine streaks.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the present invention is further elaborated.
Provided by the invention can from the multi-faceted three-dimension measuring system projected to measured object simultaneously for carrying out three-dimensional measurement to the measured object placed on the first plane.As shown in Figure 1, this system comprises graphical analysis and control system 9, camera 6, a LCOS projector 4, the 2nd LCOS projector 5, the 3rd LCOS projector (accompanying drawing is not shown) and the 4th LCOS projector (accompanying drawing is not shown).Wherein, a LCOS projector 4, the 2nd LCOS projector 5, the 3rd LCOS projector and the 4th LCOS projector are identical, and are arranged, respectively the front, rear, left and right four direction of measured object 7.Fig. 1 only illustrates the LCOS projector 4 and the 2nd LCOS projector 5 that are configured in measured object about 7, is not shownly configured in the 3rd LCOS projector before and after measured object 7 and the 4th LCOS projector.
Fig. 2 diagrammatically illustrates the relative position relation of each LCOS projector and the first plane 1 and the second plane 2, and the mounting means of each LCOS projector makes the light-emitting area of respective LCOS chip parallel with the first plane 1 and is all positioned in the second plane 2 parallel with the first plane 1.In fig. 2, first plane 1 and the second plane 2 are parallel to each other, 3 is the wherein light-emitting area of LCOS chip of in four LCOS projectors, this light-emitting area 3 is in the second plane 2, the light-emitting area (not shown) of the LCOS chip of all the other 3 LCOS projectors is the same with light-emitting area 3, also in the second plane 2.
Graphical analysis and control system 9 control a LCOS projector 4, the 2nd LCOS projector 5, the 3rd LCOS projector and the 4th LCOS projector and to project same width sine streak 8 to the first plane 1 simultaneously.Here the same width sine streak 8 of indication refers to, the striped of each LCOS projector projection is the striped of the same phase place of identical sine streak 8, if although the projection of each LCOS projector is identical sine streak 8, but phase place is different, then what can not think that each LCOS projector projects is same width sine streak 8.
The resolution of the LCOS chip of each LCOS projector that the present embodiment adopts is 1280*1080, and in chip, each pel spacing is 0.25 micron, and fill factor, curve factor is 96%, and Pixel size is 13.62 microns, can produce the sine streak 8 of high definition resolution.As shown in Figure 3, in figure 3, X-axis is the 0 to 1279 pixel to its sine streak 8 produced, and represents row; Y-axis is the 0 to 1023 pixel, represents row.The coordinate of each pixel represents with (x, y), and wherein x represents capable, and y represents row, and as can be seen from Figure 3, each pixel grey scale on each row of the sine streak 8 of LCOS projector projection is equal, and the gray scale of each row is with sinusoidal variation.
The sine streak 8 that one LCOS projector 4, the 2nd LCOS projector 5, the 3rd LCOS projector and the 4th LCOS projector are configured to a LCOS projector 4 and the projection of the 2nd LCOS projector 5 overlaps, the sine streak 8 of the 3rd LCOS projector and the projection of the 4th LCOS projector overlaps, and overlapping with sine streak 8 square crossing that a LCOS projector 4 and the 2nd LCOS projector 5 project.Four width sine streaks 8 are by formation common overlapping region, and this common overlapping region is square.Measured object 7 should be placed in this common overlapping region as far as possible completely.Because two width sine streaks 8 are just the same, after two width sine streaks 8 overlap, in the candy strip overlapped, the gray scale of each pixel will be original twice, after its essence is that two width sine streaks 8 overlap, new sine streak will be formed, new sine streak is compared with two width sine streaks 8, and phase place is identical, the cycle is identical, but amplitude becomes original twice.The new sine streak formed after the new sine streak formed after the sine streak 8 projected due to the 3rd LCOS projector and the 4th LCOS projector again overlaps overlaps with the sine streak 8 that a LCOS projector 4 and the 2nd LCOS projector 5 project intersects vertically, the sine streak being equivalent to two width new is orthogonal, therefore, in the common overlapping region of four width sine streaks 8, the gray scale of each pixel is the gray scale sum of this pixel in four width sine streaks 8, according to the orthogonality relation between the sine streak that two width are new, the left and right coincidence relation of two width sine streaks 8 and the coincidence relation of front and back two width sine streak 8 can obtain the gray scale of each pixel in four width sine streaks 8.Graphical analysis and control system 9 can the common overlapping regions of disposable extraction four width sine streak 8, and according to above-mentioned each relation, four width sine streaks in this common overlapping region are separated, from this common overlapping region, namely extract the sine streak 8 that a LCOS projector 4, the 2nd LCOS projector 5, the 3rd LCOS projector and the 4th LCOS projector project respectively.
The camera lens front end of the one LCOS projector 4, the 2nd LCOS projector 5, the 3rd LCOS projector and the 4th LCOS projector is all provided with the optical lens group for optically focused, can the striped that each LCOS projector produces be polymerized clear, allow each pixel on projecting on measured object 7 striped accurately locate.The camera lens of camera 6 can adopt telecentric lens, to eliminate because pixel each on measured object 7 is inconsistent from the distance of distance of camera lens, causes the different problem of enlargement ratio.
For making four, front, rear, left and right LCOS projector project simultaneously, and graphical analysis and control system 9 can calculate according to above-mentioned principle, require that the sine streak 8 of four LCOS projector projections wants pixel to join, without pixel clutch.Because four LCOS projectors project from the front, rear, left and right four direction of measured object 7 to measured object 7, oblique projection mode must be adopted.The striped of oblique projection can form nearly little long-range situation in view field, therefore, need the parameter of reasonable disposition crevice projection angle and configuration LCOS projector lens group to correct the shape of the sine streak projected in the first plane 1, be the sine streak figure of rectangle of rule, the sine streak of what namely sine streak 8 was formed in the first plane 1 is rectangle.The sine streak 8 of a LCOS projector 4 and the projection of the 2nd LCOS projector 5 so just can be made to overlap, the sine streak 8 of the 3rd LCOS projector and the projection of the 4th LCOS projector overlaps, and overlapping with sine streak 8 square crossing that a LCOS projector 4 and the 2nd LCOS projector 5 project.Fig. 4 and Fig. 5 is respectively the effect schematic diagram that to overlap with the common overlapping region of four width sine streaks 8 during conservative control crevice projection angle when not controlling crevice projection angle.As can be seen from Figure 4, when not controlling crevice projection angle, each striped of projection can out of focus and distortion, can not overlap very well.In Fig. 5, by the crevice projection angle of conservative control LCOS projector, when each LCOS crevice projection angle is all 30 degree (projecting direction of Ji Ge LCOS projector becomes 30 degree of angles with the direction perpendicular to the first plane 1), the each candy strip obtained does not have out of focus and distortion, can accurately overlap.
One LCOS projector 4, the 2nd LCOS projector 5, the 3rd LCOS projector and the 4th LCOS projector are connected with camera 6, can while the sine streak 8 identical to plane projection, trigger camera 6 by synchronizing signal synchronously to expose measured object 7, to gather the common overlapping region of all sine streaks 8.
The sine streak 8 only gathering a phase place can not obtain three-dimensional measuring result accurately, therefore, needs the phase place of mobile sine streak 8, repeatedly projects and capture to measured object 7.In the present embodiment, sine streak 8 comprises four phase places, is respectively 0 degree of phase place, 90 degree of phase places, 180 degree of phase places and 270 degree of phase places.The sine streak 8 of synchronization the one LCOS projector 4, the 2nd LCOS projector 5, the 3rd LCOS projector and the 4th LCOS projector projection same phase place wherein, until the sine streak 8 of all four phase places has projected.For the sine streak 8 of each phase place, graphical analysis and control system 9 are all according to the common overlapping region of aforementioned principles disposable extraction four width sine streak 8, and from this common overlapping region, the sine streak 8 of a LCOS projector 4, the 2nd LCOS projector 5, the 3rd LCOS projector and the projection of the 4th LCOS projector is extracted respectively according to above-mentioned each relation, the three-dimensional measuring result of this measured object 7 is finally drawn again according to the sine streak 8 of each phase place of a LCOS projector 4, the 2nd LCOS projector 5, the 3rd LCOS projector and the projection of the 4th LCOS projector.
The foregoing is only preferred embodiment of the present invention, not in order to limit the present invention, all any amendments done within the spirit and principles in the present invention, equivalent replacement and improvement etc., all should be included within protection scope of the present invention.

Claims (7)

1. one kind can from the multi-faceted three-dimension measuring system projected to measured object simultaneously, for carrying out three-dimensional measurement to the measured object placed on the first plane, it is characterized in that, comprise graphical analysis and control system, camera, a LCOS projector, the 2nd LCOS projector, the 3rd LCOS projector and the 4th LCOS projector;
A described LCOS projector, the 2nd LCOS projector, the 3rd LCOS projector and the 4th LCOS projector are identical, be arranged, respectively the front, rear, left and right four direction of described measured object, and the light-emitting area of respective LCOS chip is parallel with described first plane and be all positioned at in described first parallel plane second plane;
Described graphical analysis and control system to project same width sine streak to described measured object for controlling a described LCOS projector, the 2nd LCOS projector, the 3rd LCOS projector and the 4th LCOS projector simultaneously;
The sine streak that a described LCOS projector, the 2nd LCOS projector, the 3rd LCOS projector and the 4th LCOS projector are configured to a described LCOS projector and the projection of the 2nd LCOS projector overlaps, the sine streak of described 3rd LCOS projector and the projection of the 4th LCOS projector overlaps, and overlapping with the sine streak square crossing that a described LCOS projector and the 2nd LCOS projector project;
Described graphical analysis and control system also for by the common overlapping region of all sine streaks of described collected by camera, and extract the sine streak of a described LCOS projector, the 2nd LCOS projector, the 3rd LCOS projector and the projection of the 4th LCOS projector respectively from this common overlapping region.
2. three-dimension measuring system as claimed in claim 1, is characterized in that, the camera lens front end of a described LCOS projector, the 2nd LCOS projector, the 3rd LCOS projector and the 4th LCOS projector is all provided with the optical lens group for optically focused.
3. three-dimension measuring system as claimed in claim 1, it is characterized in that, the camera lens of described camera is telecentric lens.
4. three-dimension measuring system as claimed in claim 1, it is characterized in that, a described LCOS projector, the 2nd LCOS projector, the 3rd LCOS projector and the 4th LCOS projector are connected with described camera, also for while the sine streak identical to described plane projection, trigger described camera synchronization by synchronizing signal to expose described measured object, to gather the common overlapping region of all sine streaks.
5. three-dimension measuring system as claimed in claim 1, it is characterized in that, described sine streak comprises four phase places, is respectively 0 degree of phase place, 90 degree of phase places, 180 degree of phase places and 270 degree of phase places; The sine streak figure of a LCOS projector described in synchronization, the 2nd LCOS projector, the 3rd LCOS projector and the 4th LCOS projector projection same phase place wherein.
6. three-dimension measuring system as claimed in claim 1, it is characterized in that, the resolution of described LCOS chip is 1280*1080.
7. three-dimension measuring system as claimed in claim 1, it is characterized in that, described sine streak is the sine streak pattern of rectangle at the figure that described plane is formed.
CN201510280361.0A 2015-05-27 2015-05-27 Three-dimensional measurement system capable of projecting to measured object simultaneously from multiple directions Pending CN105043300A (en)

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CN110044854A (en) * 2018-01-16 2019-07-23 伊鲁米那股份有限公司 Pattern angular region selects structured illumination imaging
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