CN104931375A - Device for high and low temperature shock tests - Google Patents
Device for high and low temperature shock tests Download PDFInfo
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- CN104931375A CN104931375A CN201510386396.2A CN201510386396A CN104931375A CN 104931375 A CN104931375 A CN 104931375A CN 201510386396 A CN201510386396 A CN 201510386396A CN 104931375 A CN104931375 A CN 104931375A
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Abstract
The invention provides a device for high and low temperature shock tests. The device comprises a shell and partition plates arranged in the shell. The shell is divided by the partition plates into a first cavity, a second cavity and a third cavity, wherein the first cavity is used for conducting a high-temperature test on a product to be tested, the second cavity is used for conducting a low-temperature test on a product to be tested, and the third cavity is used for stopping heat exchange between the first cavity and the second cavity. By the adoption of the technical scheme, rapid testing of the product to be tested is achieved, the investment cost can be reduced, and the electricity consumption of a test device can be reduced.
Description
Technical field
The present invention relates to product test technical field, in particular to a kind of device for high/low-temperature impact test.
Background technology
In the test process of properties of product, in order to verify the reliability of product, a lot of product all will stand harsh high/low-temperature impact in the scope of-50 ~+70 degree, reciprocal 10 times even test of more times number.
Room between traditional testing laboratory is all single, in order to complete a high and low temperature impact test, need to be equipped with powerful refrigeration and firing equipment, not only investment is large, and power consumption is large, operating cost is high, cycle required for a room alternating temperature is long, and the cycle of test is also very long, is unfavorable for completing testing inspection fast.
Particularly, as shown in Figure 1, traditional testing laboratory is that between one, indoor are provided with refrigeration plant 1 ' and firing equipment 2 ', owing to repeatedly will carry out the Cyclic test of high temperature → low temperature → high temperature simultaneously, in order to quick changeable temperature, often need to join powerful refrigeration and heating unit, investment and operating cost all very high, and, due to the time of heating up and cooling needs are longer, cause a test to need to expend the time of several weeks.
Therefore, how can realize carrying out on the basis of test fast to product, the power consumption reducing cost of investment and equipment becomes technical matters urgently to be resolved hurrily.
Summary of the invention
The present invention just based on above-mentioned technical matters one of at least, proposes a kind of device for high/low-temperature impact test newly, achieves the quick test treating test products, and can reduce the power consumption of cost of investment and testing apparatus.
In view of this, the present invention proposes a kind of device for high/low-temperature impact test, comprising: housing; And dividing plate, be arranged in described housing, described dividing plate described housing is divided into carry out high temperature test for treating test products the first chamber, be used for treating test products and carry out the second chamber of low-temperature test and be used for stopping the 3rd chamber of the heat interchange between described first chamber and described second chamber.
The device of high/low-temperature impact test according to an embodiment of the invention, by arranging dividing plate in housing, housing to be divided into the first chamber (high-temperature region), second chamber (low-temperature space) and the 3rd chamber, make product to be tested can by carrying out moving the shock-testing realizing high/low temperature between two chambers, substantially reduce the time that product is tested, it also avoid the demand that when employing chamber is tested, needs are rapidly heated or lower the temperature simultaneously, reduce cost of investment and the need for electricity to electric power system, and the impact reduced electrical network and power consumption.
According to one embodiment of present invention, also comprise: heating arrangement, be arranged in described first chamber, for being raised the temperature in described first chamber by heating.
According to one embodiment of present invention, described heating arrangement comprises: heating blower.
According to one embodiment of present invention, also comprise: refrigerating plant, for being reduced the temperature in described second chamber by refrigeration.
According to one embodiment of present invention, described refrigerating plant comprises: air-cooler, is arranged on the madial wall of described second chamber; Refrigeration unit, is arranged on the outside of described second chamber, and is connected with described air-cooler.
According to one embodiment of present invention, described dividing plate is provided with insulated door, described product to be tested moves between described first chamber and described second chamber by described insulated door.
According to one embodiment of present invention, also comprise: transmitting device, for the mobile described position of product to be tested in described housing.
According to an embodiment of the invention for the device of high/low-temperature impact test, by arranging transmitting device, product to be tested can be moved easily in high-temperature region and low-temperature space, so that treat test products to carry out high/low-temperature impact test.
According to one embodiment of present invention, described transmitting device comprises: boom hoisting, is arranged on the roof of described housing.
According to one embodiment of present invention, described transmitting device comprises: guide rail, is arranged on the bottom of described housing.
According to one embodiment of present invention, described guide rail comprises rolling guide.
Additional aspect of the present invention and advantage will part provide in the following description, and part will become obvious from the following description, or be recognized by practice of the present invention.
Accompanying drawing explanation
Fig. 1 shows the structural representation of the testing laboratory for high/low-temperature impact test proposed in correlation technique;
Fig. 2 show according to an embodiment of the invention for high/low-temperature impact test device face structural representation;
Fig. 3 shows according to an embodiment of the invention for the plan structure schematic diagram of the device of high/low-temperature impact test;
Fig. 4 A shows on the architecture basics of testing laboratory in the related, the relation schematic diagram between detection time and experimental prototype temperature;
Fig. 4 B shows the architecture basics of the testing laboratory for high/low-temperature impact test proposed in the present invention, the relation schematic diagram between detection time and experimental prototype temperature.
Embodiment
In order to more clearly understand above-mentioned purpose of the present invention, feature and advantage, below in conjunction with the drawings and specific embodiments, the present invention is further described in detail.It should be noted that, when not conflicting, the feature in the embodiment of the application and embodiment can combine mutually.
Set forth a lot of detail in the following description so that fully understand the present invention; but; the present invention can also adopt other to be different from other modes described here and implement, and therefore, protection scope of the present invention is not by the restriction of following public specific embodiment.
As shown in Figures 2 and 3, according to an embodiment of the invention for the device of high/low-temperature impact test, comprising: housing 1; And dividing plate 2, be arranged in described housing 1, described dividing plate 2 described housing 1 is divided into carry out high temperature test for treating test products the first chamber 3, be used for treating test products and carry out the second chamber 4 of low-temperature test and be used for the 3rd chamber 5 of the heat interchange stopped between described first chamber 3 and described second chamber 4.
By arranging dividing plate 2 in housing 1, housing 1 to be divided into the first chamber 3 (high-temperature region), the second chamber 4 (low-temperature space) and the 3rd chamber 5, make product to be tested can by carrying out moving the shock-testing realizing high/low temperature between two chambers, substantially reduce the time that product is tested, it also avoid the demand that when employing chamber is tested, needs are rapidly heated or lower the temperature simultaneously, reduce cost of investment and the need for electricity to electric power system, and the impact reduced electrical network and power consumption.
According to one embodiment of present invention, also comprise: heating arrangement 6, be arranged in described first chamber 3, for being raised the temperature in described first chamber 3 by heating.
According to one embodiment of present invention, described heating arrangement 6 comprises: heating blower.
According to one embodiment of present invention, also comprise: refrigerating plant, for being reduced the temperature in described second chamber 4 by refrigeration.
According to one embodiment of present invention, described refrigerating plant comprises: air-cooler 7, is arranged on the madial wall of described second chamber 4; Refrigeration unit 8, is arranged on the outside of described second chamber 4, and is connected with described air-cooler 7.
According to one embodiment of present invention, described dividing plate 2 is provided with insulated door 8, described product to be tested moves between described first chamber 3 and described second chamber 4 by described insulated door 8.
According to one embodiment of present invention, also comprise: transmitting device, for the mobile position of described product to be tested in described housing 1.
By arranging transmitting device, product to be tested can be moved easily in high-temperature region and low-temperature space, so that treat test products to carry out high/low-temperature impact test.
According to one embodiment of present invention, described transmitting device comprises: boom hoisting 91, is arranged on the roof of described housing 1.
According to one embodiment of present invention, described transmitting device comprises: guide rail 92, is arranged on the bottom of described housing 1.
According to one embodiment of present invention, described guide rail 92 comprises rolling guide.
By using the device of the high/low-temperature impact test described in above-described embodiment, not only operating cost can reduce, and about also can reducing half detection time, effectively improves the utilization factor of proving installation, accelerate test progress, reduce further energy resource consumption.Concrete as shown in Figure 4 A and 4 B shown in FIG., Fig. 4 A is the relation in prior art between detection time t and experimental prototype temperature T; Fig. 4 B is the relation of detection time between t and experimental prototype temperature T of the proving installation that the present invention proposes, and as can be seen from Fig. 4 A and Fig. 4 B, the detection time of the proving installation that the present invention proposes obviously reduces.
Preferably, the device of the high/low-temperature impact test that the present invention is above-mentioned can be testing laboratory, namely by two adjacent between room composition, room between room, a low temperature between a high temperature, centre is provided with an insulated door, during unlatching, by being arranged on the advance ball on ground or being arranged on the boom hoisting at top, can nigration model machine easily, the model machine of hot room and low temperature chamber is exchanged, completes the high and low temperature impact test needed for test.
This composite test room utilizes the temperature that between two, room is different to carry out reciprocating impact test, eliminate the requirement that compartment temperature needs to raise fast or reduce, therefore do not need to be equipped with jumbo refrigeration or firing equipment, eliminate the demand of the large load electricity consumption of electric power system, reduce the impact to electrical network and power consumption; Meanwhile, owing to eliminating the needs that testing laboratory heats up and lowers the temperature, test period also shortens greatly, will obtain very large interests for the enterprise having high and low temperature impact test.
More than be described with reference to the accompanying drawings technical scheme of the present invention, consider traditional testing laboratory all single between room, in order to complete a high and low temperature impact test, need to be equipped with powerful refrigeration and firing equipment, not only investment is large, and power consumption is large, operating cost is high, and the cycle required for a room alternating temperature is long, the cycle of test is also very long, is unfavorable for completing testing inspection fast.Therefore, the present invention proposes a kind of device for high/low-temperature impact test newly, achieve the quick test treating test products, and the power consumption of cost of investment and testing apparatus can be reduced.
The foregoing is only the preferred embodiments of the present invention, be not limited to the present invention, for a person skilled in the art, the present invention can have various modifications and variations.Within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (10)
1., for a device for high/low-temperature impact test, it is characterized in that, comprising:
Housing; And
Dividing plate, be arranged in described housing, described dividing plate described housing is divided into carry out high temperature test for treating test products the first chamber, be used for treating test products and carry out the second chamber of low-temperature test and be used for stopping the 3rd chamber of the heat interchange between described first chamber and described second chamber.
2. the device for high/low-temperature impact test according to claim 1, is characterized in that, also comprise:
Heating arrangement, is arranged in described first chamber, for being raised the temperature in described first chamber by heating.
3. the device for high/low-temperature impact test according to claim 2, it is characterized in that, described heating arrangement comprises: heating blower.
4. the device for high/low-temperature impact test according to claim 1, is characterized in that, also comprise:
Refrigerating plant, for reducing the temperature in described second chamber by refrigeration.
5. the device for high/low-temperature impact test according to claim 4, it is characterized in that, described refrigerating plant comprises:
Air-cooler, is arranged on the madial wall of described second chamber;
Refrigeration unit, is arranged on the outside of described second chamber, and is connected with described air-cooler.
6. the device for high/low-temperature impact test according to claim 1, it is characterized in that, described dividing plate is provided with insulated door, described product to be tested moves between described first chamber and described second chamber by described insulated door.
7. the device for high/low-temperature impact test according to any one of claim 1 to 6, is characterized in that, also comprise:
Transmitting device, for the mobile described position of product to be tested in described housing.
8. the device for high/low-temperature impact test according to claim 7, it is characterized in that, described transmitting device comprises:
Boom hoisting, is arranged on the roof of described housing.
9. the device for high/low-temperature impact test according to claim 7, it is characterized in that, described transmitting device comprises:
Guide rail, is arranged on the bottom of described housing.
10. the device for high/low-temperature impact test according to claim 9, it is characterized in that, described guide rail comprises rolling guide.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510386396.2A CN104931375A (en) | 2015-06-29 | 2015-06-29 | Device for high and low temperature shock tests |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510386396.2A CN104931375A (en) | 2015-06-29 | 2015-06-29 | Device for high and low temperature shock tests |
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| CN104931375A true CN104931375A (en) | 2015-09-23 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201510386396.2A Pending CN104931375A (en) | 2015-06-29 | 2015-06-29 | Device for high and low temperature shock tests |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105352536A (en) * | 2015-10-21 | 2016-02-24 | 杜光明 | Rail-type continuous cycle multiple-temperature zone testing box and method |
| CN106355978A (en) * | 2016-11-25 | 2017-01-25 | 防城港市质量技术监督局 | Experiment box for temperature difference testing |
| CN106644801A (en) * | 2016-12-30 | 2017-05-10 | 中国电子科技集团公司第十八研究所 | Dual-working-condition high-low temperature impact testing equipment for aerospace solar cell |
| CN108020410A (en) * | 2017-12-22 | 2018-05-11 | 丰业迪睦斯（芜湖）汽车部件有限公司 | Door hinge high-low temperature test chamber |
| CN109141948A (en) * | 2018-07-25 | 2019-01-04 | 河南东润电子有限公司 | A kind of door and window thermal insulation property testing equipment |
| CN113447748A (en) * | 2021-06-29 | 2021-09-28 | 贵州航天电子科技有限公司 | Device for high and low temperature test of electronic product |
| CN114018597A (en) * | 2022-01-05 | 2022-02-08 | 南通超达装备股份有限公司 | High temperature resistance performance detection equipment for automobile instrument desk |
| CN116224032A (en) * | 2023-03-16 | 2023-06-06 | 上海聚跃检测技术有限公司 | Chip reliability test method and device |
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| JPH05215658A (en) * | 1992-02-04 | 1993-08-24 | Thermo Electron Kk | Environment testing device |
| CN102331435A (en) * | 2011-07-06 | 2012-01-25 | 上海林频仪器股份有限公司 | Three-box type temperature impact test box |
| CN202136989U (en) * | 2011-07-06 | 2012-02-08 | 上海林频仪器股份有限公司 | High-low temperature shock test chamber |
| CN103335908A (en) * | 2013-06-17 | 2013-10-02 | 广州赛宝仪器设备有限公司 | Two-box type impact testing box |
| KR20130117579A (en) * | 2012-04-18 | 2013-10-28 | 임영곤 | Thermal shock testing chamber capable of constant speed test and method for testing thermal shock |
| CN103454958A (en) * | 2013-09-02 | 2013-12-18 | 重庆哈丁科技有限公司 | Multifunctional high and low temperature impulse testing box |
| CN204101427U (en) * | 2014-08-25 | 2015-01-14 | 中科科隆光电仪器设备无锡有限公司 | A kind of two-box type hanging basket thermal shock test chamber |
| CN204718909U (en) * | 2015-06-29 | 2015-10-21 | 合肥华凌股份有限公司 | For the device of high/low-temperature impact test |
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| JPH05215658A (en) * | 1992-02-04 | 1993-08-24 | Thermo Electron Kk | Environment testing device |
| CN102331435A (en) * | 2011-07-06 | 2012-01-25 | 上海林频仪器股份有限公司 | Three-box type temperature impact test box |
| CN202136989U (en) * | 2011-07-06 | 2012-02-08 | 上海林频仪器股份有限公司 | High-low temperature shock test chamber |
| KR20130117579A (en) * | 2012-04-18 | 2013-10-28 | 임영곤 | Thermal shock testing chamber capable of constant speed test and method for testing thermal shock |
| CN103335908A (en) * | 2013-06-17 | 2013-10-02 | 广州赛宝仪器设备有限公司 | Two-box type impact testing box |
| CN103454958A (en) * | 2013-09-02 | 2013-12-18 | 重庆哈丁科技有限公司 | Multifunctional high and low temperature impulse testing box |
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Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105352536A (en) * | 2015-10-21 | 2016-02-24 | 杜光明 | Rail-type continuous cycle multiple-temperature zone testing box and method |
| CN105352536B (en) * | 2015-10-21 | 2019-05-24 | 杜光明 | A kind of rail mounted continuously recycles multi-temperature zone chamber and test method |
| CN106355978A (en) * | 2016-11-25 | 2017-01-25 | 防城港市质量技术监督局 | Experiment box for temperature difference testing |
| CN106644801A (en) * | 2016-12-30 | 2017-05-10 | 中国电子科技集团公司第十八研究所 | Dual-working-condition high-low temperature impact testing equipment for aerospace solar cell |
| CN108020410A (en) * | 2017-12-22 | 2018-05-11 | 丰业迪睦斯（芜湖）汽车部件有限公司 | Door hinge high-low temperature test chamber |
| CN109141948A (en) * | 2018-07-25 | 2019-01-04 | 河南东润电子有限公司 | A kind of door and window thermal insulation property testing equipment |
| CN109141948B (en) * | 2018-07-25 | 2020-06-02 | 威海威派建材有限公司 | Door and window thermal insulation performance detection equipment |
| CN113447748A (en) * | 2021-06-29 | 2021-09-28 | 贵州航天电子科技有限公司 | Device for high and low temperature test of electronic product |
| CN114018597A (en) * | 2022-01-05 | 2022-02-08 | 南通超达装备股份有限公司 | High temperature resistance performance detection equipment for automobile instrument desk |
| CN116224032A (en) * | 2023-03-16 | 2023-06-06 | 上海聚跃检测技术有限公司 | Chip reliability test method and device |
| CN116224032B (en) * | 2023-03-16 | 2023-09-05 | 上海聚跃检测技术有限公司 | Chip reliability test method and device |
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Application publication date: 20150923 |