CN104897375A - 精确测量高能紫外激光系统中光学镜片透过率的装置和方法 - Google Patents
精确测量高能紫外激光系统中光学镜片透过率的装置和方法 Download PDFInfo
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105547650A (zh) * | 2015-12-09 | 2016-05-04 | 中国科学院长春光学精密机械与物理研究所 | 一种用于确定非正入射条件下光学原件透过率的方法 |
CN113188767A (zh) * | 2021-04-25 | 2021-07-30 | 中国科学院西安光学精密机械研究所 | 紫外镜片反、透射率测试及紫外成像系统定标装置及方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5653439A (en) * | 1979-10-09 | 1981-05-13 | Nippon Telegr & Teleph Corp <Ntt> | Measuring device for characteristic of wavelength of optical loss |
CN101504364A (zh) * | 2009-03-13 | 2009-08-12 | 重庆大学 | 基于mems光栅光调制器线阵的红外光谱监测系统 |
CN102252828A (zh) * | 2011-04-19 | 2011-11-23 | 中国科学院光电技术研究所 | 一种监测高反射光学元件在激光辐照下反射率实时变化的方法 |
CN102519593A (zh) * | 2011-12-27 | 2012-06-27 | 中国科学院长春光学精密机械与物理研究所 | 一种超广角短波红外推扫超光谱成像仪的光学系统 |
CN102944518A (zh) * | 2012-11-20 | 2013-02-27 | 合肥知常光电科技有限公司 | 基于驻波激发瞬态体光栅效应的材料特性检测方法及装置 |
CN103018012A (zh) * | 2012-12-07 | 2013-04-03 | 中国科学院光电研究院 | 一种光学元件透过率的测量方法及装置 |
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Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5653439A (en) * | 1979-10-09 | 1981-05-13 | Nippon Telegr & Teleph Corp <Ntt> | Measuring device for characteristic of wavelength of optical loss |
CN101504364A (zh) * | 2009-03-13 | 2009-08-12 | 重庆大学 | 基于mems光栅光调制器线阵的红外光谱监测系统 |
CN102252828A (zh) * | 2011-04-19 | 2011-11-23 | 中国科学院光电技术研究所 | 一种监测高反射光学元件在激光辐照下反射率实时变化的方法 |
CN102519593A (zh) * | 2011-12-27 | 2012-06-27 | 中国科学院长春光学精密机械与物理研究所 | 一种超广角短波红外推扫超光谱成像仪的光学系统 |
CN102944518A (zh) * | 2012-11-20 | 2013-02-27 | 合肥知常光电科技有限公司 | 基于驻波激发瞬态体光栅效应的材料特性检测方法及装置 |
CN103018012A (zh) * | 2012-12-07 | 2013-04-03 | 中国科学院光电研究院 | 一种光学元件透过率的测量方法及装置 |
Non-Patent Citations (1)
Title |
---|
黄永楷,庄大奎,徐根传: "光栅绝对衍射率的测量", 《光学学报》 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105547650A (zh) * | 2015-12-09 | 2016-05-04 | 中国科学院长春光学精密机械与物理研究所 | 一种用于确定非正入射条件下光学原件透过率的方法 |
CN105547650B (zh) * | 2015-12-09 | 2017-10-31 | 中国科学院长春光学精密机械与物理研究所 | 一种用于确定非正入射条件下光学元件透过率的方法 |
CN113188767A (zh) * | 2021-04-25 | 2021-07-30 | 中国科学院西安光学精密机械研究所 | 紫外镜片反、透射率测试及紫外成像系统定标装置及方法 |
CN113188767B (zh) * | 2021-04-25 | 2023-12-08 | 中国科学院西安光学精密机械研究所 | 紫外镜片反、透射率测试及紫外成像系统定标装置及方法 |
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