CN104880677B - Test system and method - Google Patents

Test system and method Download PDF

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Publication number
CN104880677B
CN104880677B CN201510296175.6A CN201510296175A CN104880677B CN 104880677 B CN104880677 B CN 104880677B CN 201510296175 A CN201510296175 A CN 201510296175A CN 104880677 B CN104880677 B CN 104880677B
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China
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measured
lamps
lanterns
light source
power
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CN104880677A (en
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李伟
丁屹峰
于华
陈壬贤
唐宇
韩帅
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State Grid Corp of China SGCC
State Grid Beijing Electric Power Co Ltd
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State Grid Corp of China SGCC
State Grid Beijing Electric Power Co Ltd
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Abstract

The invention discloses a kind of test system and method.Wherein, which includes:Power supply, power measuring and illumination photometer, wherein, power supply is electrically connected with lamps and lanterns to be measured, for providing electric energy for test system;Power measuring is electrically connected between power supply and lamps and lanterns to be measured, for measuring the electrical parameter of lamps and lanterns to be measured;Illumination photometer, for measuring the optical parameter of lamps and lanterns to be measured.The present invention is solved since the parameter for being used for lighting system assessment is imperfect, and the technical issues of cause lighting system assessment result inaccurate.

Description

Test system and method
Technical field
The present invention relates to technical field of measurement and test, in particular to a kind of test system and method.
Background technology
As lighting system is widely used in the places such as road, highway, airport, harbour, station, city illumination pipe Reason center needs to grasp the operating condition of lighting system comprehensively, investigates the security risk of lighting system, promotes lighting system safety Reliability and lighting quality.However, correlation technique be illuminated working condition detection when, due to be used for lighting system assessment Parameter is imperfect, and the problem of cause lighting system assessment result inaccurate, currently no effective solution has been proposed.
The content of the invention
An embodiment of the present invention provides a kind of test system and method, at least to solve due to being used for lighting system assessment Parameter is imperfect, and the technical issues of cause lighting system assessment result inaccurate.
One side according to embodiments of the present invention, provides a kind of test system, which includes:Power supply, power are surveyed Instrument and illumination photometer are tried, wherein, power supply is electrically connected with lamps and lanterns to be measured, for providing electric energy for test system;Power measuring, electricity It is connected between power supply and lamps and lanterns to be measured, for measuring the electrical parameter of lamps and lanterns to be measured;Illumination photometer, for measuring lamps and lanterns to be measured Optical parameter.
Further, the power supply for testing system is regulated power supply.
Further, lamps and lanterns to be measured include:Trigger, ballast, light source and compensating electric capacity, wherein, trigger is parallel to The both ends of light source shine for triggering light source startup;Ballast, the two poles of the earth being followed by into lamp power of connecting with light source, for steady The operating current of fixed lamps and lanterns to be measured;Compensating electric capacity is parallel to the two poles of the earth of lamp power, for adjust the power of lamps and lanterns to be measured because Number.
Further, lamps and lanterns to be measured include the first kind light source and the second class light source of each model, wherein, first kind light source Usage time be less than the second class light source usage time;Wherein, the model of compensating electric capacity corresponds to the model of lamps and lanterns to be measured.
Further, illumination photometer is used to measure the optical parameter of lamps and lanterns to be measured in predeterminated position.
Further, electrical parameter includes at least:Primary voltage, inlet wire current, into linear heat generation rate, power factor, lamp to be measured The light source voltage of tool, lamps and lanterns to be measured source current and/or, at least two combination in the light source power of lamps and lanterns to be measured.
Further, optical parameter includes at least:The colour temperature of lamps and lanterns to be measured, lamps and lanterns to be measured colour rendering index and/or, treat Survey at least two combination in the illumination of lamps and lanterns.
Another aspect according to embodiments of the present invention, additionally provides a kind of test method, and this method includes:It is surveyed by power It tries instrument and measures lamps and lanterns to be measured, obtain the electrical parameter of lamps and lanterns to be measured;The first kind of lamps and lanterns to be measured is compared according to the first preset condition The electrical parameter of light source and the second class light source, the energy consumption variation for obtaining the first kind light source and the second class light source of lamps and lanterns to be measured are closed System;Lamps and lanterns to be measured are measured by illumination photometer, obtain the optical parameter of lamps and lanterns to be measured;Lamps and lanterns to be measured are compared according to the second preset condition First kind light source and the second class light source optical parameter, obtain the first kind light source of lamps and lanterns to be measured and the light decay of the second class light source Variation relation;By the first kind light of the energy consumption variation relation and lamps and lanterns to be measured of the first kind light source of lamps and lanterns to be measured and the second class light source The light decay variation relation of source and the second class light source is counted, and obtains the survey of the first kind light source and the second class light source of lamps and lanterns to be measured Try tables of data.
Further, the step of measuring lamps and lanterns to be measured by power measuring, obtaining the electrical parameter of lamps and lanterns to be measured includes: In default follow-on test time T, data sampling is performed to lamps and lanterns to be measured according to default sampling number N, obtains lamps and lanterns to be measured Electrical parameter, wherein, electrical parameter is in the arithmetic mean of instantaneous value of default sampling number n times, and N is integer;Wherein, electrical parameter It includes at least:Primary voltage, inlet wire current, into linear heat generation rate, power factor, the light source voltage of lamps and lanterns to be measured, lamps and lanterns to be measured light Ource electric current and/or, at least two combination in the light source power of lamps and lanterns to be measured.
Further, the step of measuring lamps and lanterns to be measured by illumination photometer, obtaining the optical parameter of lamps and lanterns to be measured includes:Pre- If follow-on test time T in, data sampling is performed to lamps and lanterns to be measured according to default sampling number N, obtains the light of lamps and lanterns to be measured Parameter is learned, wherein, optical parameter is in the arithmetic mean of instantaneous value of default sampling number n times, and N is integer;Wherein, optical parameter is at least Including:The colour temperature of lamps and lanterns to be measured, lamps and lanterns to be measured colour rendering index and/or, at least two group in the illumination of lamps and lanterns to be measured It closes.
In embodiments of the present invention, using the test system having following structure:Power supply, power measuring and illumination photometer, Wherein, power supply is electrically connected with lamps and lanterns to be measured, for providing electric energy for test system;Power measuring is electrically connected to power supply and treats It surveys between lamps and lanterns, for measuring the electrical parameter of lamps and lanterns to be measured;Illumination photometer for measuring the optical parameter of lamps and lanterns to be measured, solves Since the parameter for being used for lighting system assessment is imperfect, and the problem of cause lighting system assessment result inaccurate, realize The effect of accurate evaluation illumination system performance, and city illumination administrative center is supplied to refer to acquired results.
Description of the drawings
Attached drawing described herein is used for providing a further understanding of the present invention, forms the part of the application, this hair Bright schematic description and description does not constitute improper limitations of the present invention for explaining the present invention.In the accompanying drawings:
Fig. 1 is the schematic diagram of according to embodiments of the present invention one test system;
Fig. 2 is a kind of back panel wiring schematic diagram of according to embodiments of the present invention one optional lamps and lanterns to be measured;And
Fig. 3 is a kind of flow chart of according to embodiments of the present invention two optional test method.
Specific embodiment
In order to which those skilled in the art is made to more fully understand the present invention program, below in conjunction in the embodiment of the present invention The technical solution in the embodiment of the present invention is clearly and completely described in attached drawing, it is clear that described embodiment is only The embodiment of a part of the invention, instead of all the embodiments.Based on the embodiments of the present invention, ordinary skill people Member's all other embodiments obtained without making creative work should all belong to the model that the present invention protects It encloses.
It should be noted that term " first " in description and claims of this specification and above-mentioned attached drawing, " Two " etc. be the object for distinguishing similar, without being used to describe specific order or precedence.It should be appreciated that it so uses Data can exchange in the appropriate case, so as to the embodiment of the present invention described herein can with except illustrating herein or Order beyond those of description is implemented.In addition, term " comprising " and " having " and their any deformation, it is intended that cover Cover it is non-exclusive include, be not necessarily limited to for example, containing the process of series of steps or unit, method, system, product or equipment Those steps or unit clearly listed, but may include not list clearly or for these processes, method, product Or the intrinsic other steps of equipment or unit.
Embodiment one
According to embodiments of the present invention, provide a kind of for implementing the test method that the method for the present invention embodiment is provided Test system, i.e. the test system is mainly used for performing the test method that the method for the present invention embodiment part is provided, right below The test system that the embodiment of the present invention is provided does specific introduction:
Fig. 1 is the schematic diagram of according to embodiments of the present invention one test system, as shown in Figure 1, the test system is mainly wrapped Power supply 10, power measuring 20 and illumination photometer 30 are included, wherein:
Power supply 10 is electrically connected with lamps and lanterns to be measured, for providing electric energy for test system.
Power measuring 20 is electrically connected between power supply 10 and lamps and lanterns to be measured, for measuring the electrical parameter of lamps and lanterns to be measured.
Illumination photometer 30, for measuring the optical parameter of lamps and lanterns to be measured.
The test system that the embodiment of the present invention is provided by power supply 10, is electrically connected with lamps and lanterns to be measured, is carried for test system For electric energy, power measuring 20 is electrically connected between power supply and lamps and lanterns to be measured, measures the electrical parameter of lamps and lanterns to be measured, illumination photometer 30 The optical parameter of lamps and lanterns to be measured is measured, is solved since the parameter for being used for lighting system assessment is imperfect, and causes lighting system The problem of assessment result is inaccurate realizes the effect of accurate evaluation illumination system performance, and acquired results is supplied to city Illumination supervision center reference.
Fig. 2 is a kind of back panel wiring schematic diagram of according to embodiments of the present invention one optional lamps and lanterns to be measured, such as Fig. 2 institutes Show, which includes:Trigger 200, ballast 204, light source 206 and compensating electric capacity 208.
Wherein, trigger 200 are parallel to the both ends of light source 206, shine for triggering the startup of light source 206.Specifically, exist When light source 206 is not actuated, trigger 200 generates instantaneous high pressure with the cooperation of inductance type ballast 204 makes the startup of light source 206 shine, Light source 206 start after, inductance type ballast 204 limit electric current for 206 matched electric current of light source to prevent overtension when burn Light source is ruined, after the startup of light source 206, trigger 200 will no longer function.
Wherein, the two poles of the earth of lamp power are accessed, for stablizing the work of lamps and lanterns to be measured in ballast 204 after connecting with light source 206 Make electric current.Optionally, the lamps and lanterns to be measured in test system of the invention can be high-pressure sodium lamp, the ballast of high-voltage gas discharging light There are two types of devices:One kind is electronic ballast;Another kind is inductance type ballast.The present invention considers high-pressure sodium lamp with other gas Body discharging lamp bubble is the same, and work is arc discharge state, and E-I characteristic is negative slope, i.e., lamp current rises, and light bulb Voltage but declines.Under the conditions of stabilized power source, in order to ensure the work of light bulb stabilization, must connect in circuit one has positive resistance The circuit element of characteristic balances this negative resistance charactertistic, steady operation electric current, wherein, in embodiments of the present invention, select ballast Device realizes the effect for balancing this negative resistance charactertistic, wherein, above-mentioned ballast can be inductance type ballast.
Wherein, compensating electric capacity 208 are parallel to the two poles of the earth of lamp power 206, for adjusting the power factor of lamps and lanterns to be measured. Specifically, inductance rectifying high-pressure discharge light source is inductive load, after installing compensating electric capacity additional, can reduce supply line Operating current improves line load ability.Optionally, the lamps and lanterns to be measured in test system of the invention can be that high-pressure sodium lamp should For roadway lighting system, wherein, the mode that shunt capacitor improves power factor can have the following two kinds:First way is Using centralized compensation.Compensating electric capacity is installed in lamp power control cabinet, simply, conveniently, utilization rate is high for this compensation installation, But the operating current on control cabinet outlet line cannot be reduced, it is impossible to reduce line drop, electric energy loss cannot be reduced, it can only be right Power supply grid carries out reactive-load compensation.The second way is the parallel connection one that is, on every street lamp using single lamp dispersion compensation mode Capacitance compensates, and to reduce the operating current of illuminating line, reduces the reactive power of illuminating line, reduces the voltage on circuit Loss and electric energy loss.
Optionally, in embodiments of the present invention, lamps and lanterns to be measured include the first kind light source and the second class light source of each model, Wherein, the usage time of first kind light source is less than the usage time of the second class light source, wherein, the model of compensating electric capacity corresponds to be measured The model of lamps and lanterns.
Specifically, in embodiments of the present invention, the lamps and lanterns to be measured in test system can select 70W, 150W, 250W and The high-pressure sodium lamp of tetra- kinds of models of 400W, when the usage time for the first kind light source that when test selects is less than the use of the second class light source Between.In addition, the design of the compensation capacitor capacity for an inductance type high-pressure discharge light source, it can be by using to town Device both end voltage is flowed, the actual measurement of light source both sides voltage and input voltage after actually calculating, designs shunt compensation The capacity of capacitor.Optionally, in the embodiment of the present invention, the compensating electric capacity of the 12 μ F of high-pressure sodium lamp parallel connection of 70W, the high pressure of 150W The compensating electric capacity of 18 μ F of sodium vapor lamp parallel connection, the compensating electric capacity of the 32 μ F of high-pressure sodium lamp parallel connection of 250W, 50 μ of high-pressure sodium lamp parallel connection of 400W The compensating electric capacity of F to reach the power factor for improving inductance type high-pressure discharge power supply, improves the effect of the utilization rate of circuit Fruit.
Optionally, in embodiments of the present invention, illumination photometer is used to measure the optical parameter of lamps and lanterns to be measured in predeterminated position.
Specifically, in embodiments of the present invention, the illumination photometer in lamps and lanterns to be measured can a certain fixation below tested lamps and lanterns Point, it is horizontal positioned, select the measurement that measurement gear is suitble to carry out illumination.During illumination photometry, if display screen left end Only display " 1 " represents illumination excessively, it is necessary to press range key, and adjustment measurement multiple, illumination photometer is started to work, and in display screen Upper display illumination.Display data constantly changes on display screen, and when display data is more stable, locking data reads and remembers The observation shown in record reader, observation are equal to the product that number and range value are shown in reader.
Optionally, in embodiments of the present invention, electrical parameter includes at least:Primary voltage, inlet wire current, into linear heat generation rate, Power factor, the light source voltage of lamps and lanterns to be measured, lamps and lanterns to be measured source current and/or, in the light source power of lamps and lanterns to be measured extremely Combination two kinds few.
Optionally, in embodiments of the present invention, optical parameter includes at least:The colour temperature of lamps and lanterns to be measured, lamps and lanterns to be measured it is aobvious Colour index and/or, at least two combination in the illumination of lamps and lanterns to be measured.Further, first kind light illumination photometer measured The illumination in source and the illumination of the second class light source (wherein, the usage time of first kind light source is less than the usage time of the second class light source) It is compared, the light decay rate of tested lamps and lanterns can be calculated.
The test system that the embodiment of the present invention is provided by power supply, is electrically connected with lamps and lanterns to be measured, is provided for test system Electric energy, power measuring are electrically connected between power supply and lamps and lanterns to be measured, measure the electrical parameter of lamps and lanterns to be measured, and illumination photometer measurement is treated The optical parameter of lamps and lanterns is surveyed, obtains the power consumption of new and old light source and luminous situation in the case where there is capacitance compensation normal operating conditions, is solved Since the parameter for being used for lighting system assessment is imperfect, and the problem of cause lighting system assessment result inaccurate, realize The effect of accurate evaluation illumination system performance, and city illumination administrative center is supplied to refer to acquired results.
Embodiment two
According to embodiments of the present invention, provide a kind of can be held by the test system that the above embodiment of the present invention is provided Capable embodiment of the method, i.e. the test method that the embodiment of the present invention is provided can be provided by the above embodiment of the present invention Test system performs., it is necessary to explanation, step shown in the flowchart of the accompanying drawings can be held in such as one group of computer It is performed in the computer system of row instruction, although also, show logical order in flow charts, in some cases, It can be with the steps shown or described are performed in an order that is different from the one herein.
According to embodiments of the present invention, a kind of test method, the test side provided below the embodiment of the present invention are provided Method does specific introduction:
Fig. 3 is a kind of flow chart of according to embodiments of the present invention two optional test method, as shown in figure 3, the test Method mainly includes the following steps S102 to step S110:
S102:Lamps and lanterns to be measured are measured by power measuring, obtain the electrical parameter of lamps and lanterns to be measured.
S104:The first kind light source of lamps and lanterns to be measured and the electrical parameter of the second class light source are compared according to the first preset condition, Obtain the first kind light source of lamps and lanterns to be measured and the energy consumption variation relation of the second class light source.
S106:Lamps and lanterns to be measured are measured by illumination photometer, obtain the optical parameter of lamps and lanterns to be measured.
S108:The first kind light source of lamps and lanterns to be measured and the optical parameter of the second class light source are compared according to the second preset condition, Obtain the first kind light source of lamps and lanterns to be measured and the light decay variation relation of the second class light source.
S110:By the first of the energy consumption variation relation and lamps and lanterns to be measured of the first kind light source of lamps and lanterns to be measured and the second class light source The light decay variation relation of class light source and the second class light source is counted, and obtains the first kind light source and the second class light source of lamps and lanterns to be measured Test data table.
Explanation is needed exist for, in embodiments of the present invention, the first preset condition can be predetermined power factor, be used for Luminaire efficiency height to be measured is weighed, first kind light source is obtained through measuring obtained power factor with the second class light source through measurement Power factor is compared, and power factor is lower, illustrates that reactive power of the circuit for alternating magnetic field conversion is big, lamps and lanterns to be measured Utilization rate is lower, adds the loss of supply of circuit.In practical applications, preset when the power factor of lamps and lanterns to be measured is less than first During condition, that is, predetermined power factor, lighting system will no longer select the light source.
In embodiments of the present invention, the second preset condition can be default light decay rate, for weighing the light intensity of lamps and lanterns to be measured, First kind light source is compared through measuring obtained light decay rate with the second class light source through measuring obtained light decay rate, light decay rate is got over It is low, illustrate after lighting after a while, the light intensity under beam intensity ratio nominal condition is much lower.In practical applications, when treating It is when presetting light decay rate that the light decay rate of survey lamps and lanterns, which is less than the second preset condition, and lighting system will no longer select the light source.
The test method that the embodiment of the present invention is provided measures lamps and lanterns to be measured by power measuring, obtains lamps and lanterns to be measured Electrical parameter, and then the first kind light source of lamps and lanterns to be measured and the electricity ginseng of the second class light source are compared according to the first preset condition Number, obtains the first kind light source of lamps and lanterns to be measured and the energy consumption variation relation of the second class light source;Lamps and lanterns to be measured are measured by illumination photometer, The optical parameter of lamps and lanterns to be measured is obtained, and then the first kind light source and the second class light of lamps and lanterns to be measured are compared according to the second preset condition The optical parameter in source obtains the first kind light source of lamps and lanterns to be measured and the light decay variation relation of the second class light source;Again by lamps and lanterns to be measured First kind light source and the energy consumption variation relation of the second class light source and the light of the first kind light source of lamps and lanterns to be measured and the second class light source The variation relation that declines is counted, and obtains the first kind light source of lamps and lanterns to be measured and the test data table of the second class light source, solve by It is imperfect in the parameter assessed for lighting system, and the problem of cause lighting system assessment result inaccurate, it is accurate to realize The effect of illumination system performance is assessed, and city illumination administrative center is supplied to refer to acquired results.
Optionally, in embodiments of the present invention, lamps and lanterns to be measured are measured by power measuring, obtains the electricity of lamps and lanterns to be measured The step of parameter, can include:In default follow-on test time T, number is performed to lamps and lanterns to be measured according to default sampling number N According to sampling, the electrical parameter of lamps and lanterns to be measured is obtained, wherein, electrical parameter is to preset the arithmetic mean of instantaneous value of sampling number n times, N For integer, wherein, electrical parameter includes at least:Primary voltage, inlet wire current, into linear heat generation rate, power factor, lamps and lanterns to be measured light Source voltage, lamps and lanterns to be measured source current and/or, at least two combination in the light source power of lamps and lanterns to be measured.
Optionally, in embodiments of the present invention, lamps and lanterns to be measured are measured by illumination photometer, obtains the optical parameter of lamps and lanterns to be measured The step of can include:In default follow-on test time T, data are performed to lamps and lanterns to be measured according to default sampling number N and are adopted Sample obtains the optical parameter of lamps and lanterns to be measured, wherein, optical parameter is the arithmetic mean of instantaneous value in default sampling number n times, and N is whole Number, wherein, optical parameter includes at least:The colour temperature of lamps and lanterns to be measured, lamps and lanterns to be measured colour rendering index and/or, the photograph of lamps and lanterns to be measured At least two combination in degree.
Explanation is needed exist for, in embodiments of the present invention, supply voltage of the test system in test can be selected For 220V, test environment when testing the light source of lamps and lanterns to be measured every time, treats light source igniting 10 minutes without other light sources and daylight impression Start to measure after into stable state, follow-on test 10 minutes, data sampling 10 times, test data takes arithmetic mean of instantaneous value.Test In the process, respectively by old 150W Ou Silang light sources, 250W Asias are bright, three pleasures, magnificent radiant, 400W Ou Silang light sources are packed into definition Model Philip lamps and lanterns can be lighted normally.
In embodiments of the present invention, by the energy consumption and light decay situation of the first kind light source of lamps and lanterns to be measured and the second class light source into Row statistics, can obtain following test data table:
70W high-pressure sodium lamp test datas table (12 μ F of compensating electric capacity)
150W high-pressure sodium lamp test datas table (18 μ F of compensating electric capacity)
250W high-pressure sodium lamp test datas table (32 μ F of compensating electric capacity)
400W high-pressure sodium lamp test datas table (50 μ F of compensating electric capacity)
Data in test table, which are compared, can draw following variation relation:
1st, energy consumption comparison:According to test data, the new and old light source work(of tri- kinds of high-pressure sodium lamps of Philip 70W, 150W, 400W is compared Rate finds that for old light source power generally less than new light sources, power consumption difference is less than the 10% of nominal power.In addition, during the test, Old 400W Philips light source appearance energization is lighted rear power and is raised rapidly, higher than nominal power, is then gradually decrease to stablize, Less than the process of nominal power.
2nd, pipe pressure comparison:The old light source tube of Philip 70W, 150W is forced down in new light sources, and pipe pressure difference is respectively nominal value 22%th, 10%, but the old light source tube pressures of 400W, apparently higher than new light sources, pipe pressure difference is the 44% of nominal value.
3rd, light decay compares:Light decay situation is by comparing with the new and old high-pressure sodium lamp light source of power Philip below by test agent The brightness value of fixed point is drawn, according to test data, in the case where power is slightly below new light sources, (power consumption difference exists old light source Within 10%), illumination reduces 21%, 23% and 37% respectively, and light decay is apparent.
It should be noted that for foregoing each method embodiment, in order to be briefly described, therefore it is all expressed as a series of Combination of actions, but those skilled in the art should know, the present invention and from the limitation of described sequence of movement because According to the present invention, some steps may be employed other orders or be carried out at the same time.Secondly, those skilled in the art should also know It knows, embodiment described in this description belongs to preferred embodiment, and involved action and module are not necessarily of the invention It is necessary.
Through the above description of the embodiments, those skilled in the art can be understood that according to above-mentioned implementation The method of example can add the mode of required general hardware platform to realize by software, naturally it is also possible to by hardware, but it is very much In the case of the former be more preferably embodiment.Based on such understanding, technical scheme is substantially in other words to existing The part that technology contributes can be embodied in the form of software product, which is stored in a storage In medium (such as ROM/RAM, magnetic disc, CD), used including some instructions so that a station terminal equipment (can be mobile phone, calculate Machine, server or network equipment etc.) method that performs each embodiment of the present invention.
The embodiments of the present invention are for illustration only, do not represent the quality of embodiment.
If the integrated unit in above-described embodiment is realized in the form of SFU software functional unit and is independent product Sale or in use, the storage medium that above computer can be read can be stored in.Based on such understanding, skill of the invention The part or all or part of the technical solution that art scheme substantially in other words contributes to the prior art can be with soft The form of part product embodies, which is stored in storage medium, is used including some instructions so that one Platform or multiple stage computers equipment (can be personal computer, server or network equipment etc.) perform each embodiment side of the present invention The all or part of step of method.
In the above embodiment of the present invention, all emphasize particularly on different fields to the description of each embodiment, do not have in some embodiment The part of detailed description may refer to the associated description of other embodiment.
In several embodiments provided herein, it should be understood that disclosed client, it can be by others side Formula is realized.Wherein, the apparatus embodiments described above are merely exemplary, such as the division of unit, is only that one kind is patrolled The division of volume function, can there is an other dividing mode in actual implementation, such as multiple units or component can combine or can be with It is integrated into another system or some features can be ignored or does not perform.It is another, it is shown or discussed mutual Coupling, direct-coupling or communication connection can be by some interfaces, the INDIRECT COUPLING or communication connection of unit or module, can By be it is electrical or other in the form of.
The unit illustrated as separating component may or may not be physically separate, be shown as unit Component may or may not be physical location, you can be located at a place or can also be distributed to multiple networks On unit.Some or all of unit therein can be selected to realize the purpose of this embodiment scheme according to the actual needs.
In addition, each functional unit in each embodiment of the present invention can be integrated in a processing unit, it can also That unit is individually physically present, can also two or more units integrate in a unit.Above-mentioned integrated list The form that hardware had both may be employed in member is realized, can also be realized in the form of SFU software functional unit.
It the above is only the preferred embodiment of the present invention, it is noted that come for those skilled in the art It says, various improvements and modifications may be made without departing from the principle of the present invention, these improvements and modifications also should be regarded as Protection scope of the present invention.

Claims (8)

1. a kind of test system, which is characterized in that including:Power supply, power measuring and illumination photometer, wherein,
The power supply is electrically connected with lamps and lanterns to be measured, for providing electric energy for the test system;
The power measuring is electrically connected between the power supply and the lamps and lanterns to be measured, for measuring the lamps and lanterns to be measured Electrical parameter;
The illumination photometer, for measuring the optical parameter of the lamps and lanterns to be measured;
Wherein, the lamps and lanterns to be measured include the first kind light source and the second class light source of each model, wherein, the first kind light source Usage time be less than the second class light source usage time;
Wherein, the model of compensating electric capacity corresponds to the model of the lamps and lanterns to be measured;
Wherein, the power supply is regulated power supply;
The compensating electric capacity is parallel to the two poles of the earth of lamp power, for adjusting the power factor of the lamps and lanterns to be measured.
2. test system according to claim 1, which is characterized in that the lamps and lanterns to be measured include:Trigger, ballast, Light source and the compensating electric capacity, wherein,
The trigger is parallel to the both ends of the light source, shines for triggering the light source startup;
The ballast, the two poles of the earth being followed by into lamp power of connecting with the light source, for stablizing the work of the lamps and lanterns to be measured Electric current.
3. test system according to claim 1, which is characterized in that the illumination photometer is used for described in predeterminated position measurement The optical parameter of lamps and lanterns to be measured.
4. the test system according to any one in claim 1-3, which is characterized in that the electrical parameter at least wraps It includes:Primary voltage, inlet wire current, into linear heat generation rate, power factor, the light source voltages of the lamps and lanterns to be measured, the lamps and lanterns to be measured Source current and/or, at least two combination in the light source power of the lamps and lanterns to be measured.
5. the test system according to any one in claim 1-3, which is characterized in that the optical parameter at least wraps It includes:The colour temperature of the lamps and lanterns to be measured, the lamps and lanterns to be measured colour rendering index and/or, in the illumination of the lamps and lanterns to be measured at least Two kinds of combination.
6. a kind of test method, which is characterized in that applied to test system described in any one of claim 1 to 5, the method Including:
The lamps and lanterns to be measured are measured by the power measuring, obtain the electrical parameter of the lamps and lanterns to be measured;
The first kind light source of the lamps and lanterns to be measured and the electrical parameter of the second class light source are compared according to the first preset condition, obtains institute State the first kind light source of lamps and lanterns to be measured and the energy consumption variation relation of the second class light source;
The lamps and lanterns to be measured are measured by the illumination photometer, obtain the optical parameter of the lamps and lanterns to be measured;
The first kind light source of the lamps and lanterns to be measured and the optical parameter of the second class light source are compared according to the second preset condition, obtains institute State the first kind light source of lamps and lanterns to be measured and the light decay variation relation of the second class light source;
By the first of the energy consumption variation relation and the lamps and lanterns to be measured of the first kind light source of the lamps and lanterns to be measured and the second class light source The light decay variation relation of class light source and the second class light source is counted, and obtains the first kind light source and the second class of the lamps and lanterns to be measured The test data table of light source.
7. according to the method described in claim 6, it is characterized in that, described measure the lamp to be measured by the power measuring The step of having, obtaining the electrical parameter of the lamps and lanterns to be measured includes:
In default follow-on test time T, data sampling is performed to the lamps and lanterns to be measured according to default sampling number N, is obtained The electrical parameter of the lamps and lanterns to be measured, wherein, the electrical parameter is in the arithmetic mean of instantaneous value of the default sampling number n times, N For integer;
Wherein, the electrical parameter includes at least:Primary voltage, inlet wire current, into linear heat generation rate, power factor, the lamp to be measured The light source voltage of tool, the lamps and lanterns to be measured source current and/or, at least two in the light source power of the lamps and lanterns to be measured Combination.
8. according to the method described in claim 6, it is characterized in that, described measure the lamps and lanterns to be measured by the illumination photometer, The step of obtaining the optical parameter of the lamps and lanterns to be measured includes:
In default follow-on test time T, data sampling is performed to the lamps and lanterns to be measured according to default sampling number N, is obtained The optical parameter of the lamps and lanterns to be measured, wherein, the optical parameter is in the arithmetic mean of instantaneous value of the default sampling number n times, N For integer;
Wherein, the optical parameter includes at least:The colour temperature of the lamps and lanterns to be measured, the lamps and lanterns to be measured colour rendering index and/ Or, at least two combination in the illumination of the lamps and lanterns to be measured.
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Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2155072Y (en) * 1992-12-25 1994-02-02 徐盘祥 Lighting device
CN101694401A (en) * 2009-10-28 2010-04-14 东莞勤上光电股份有限公司 Method for testing optical attenuation of LED light source
CN202002725U (en) * 2010-09-21 2011-10-05 江苏宏康节能服务有限公司 Equipment for measuring light source parameters
CN102455417A (en) * 2010-10-14 2012-05-16 泰金宝光电(苏州)有限公司 Testing system of LED (Light Emitting Diode) lamp
CN102901938A (en) * 2012-10-10 2013-01-30 上海普天邮通科技股份有限公司 Method for measuring integral light decay property of LED (light emitting diode) lamp
CN203117405U (en) * 2013-03-26 2013-08-07 深圳市逐瑞科技有限公司 Lamp measurement device
CN103424718A (en) * 2013-08-08 2013-12-04 广州市光机电技术研究院 Multi-lamp on-line automatic integrated test system and method
CN204116579U (en) * 2014-09-19 2015-01-21 厦门市永福森照明科技有限公司 A kind of light fixture test board
CN104407306A (en) * 2014-12-11 2015-03-11 彭依彧 Initial and final tester for LED lamps and test method
CN204649943U (en) * 2015-06-02 2015-09-16 国家电网公司 Test macro

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2155072Y (en) * 1992-12-25 1994-02-02 徐盘祥 Lighting device
CN101694401A (en) * 2009-10-28 2010-04-14 东莞勤上光电股份有限公司 Method for testing optical attenuation of LED light source
CN202002725U (en) * 2010-09-21 2011-10-05 江苏宏康节能服务有限公司 Equipment for measuring light source parameters
CN102455417A (en) * 2010-10-14 2012-05-16 泰金宝光电(苏州)有限公司 Testing system of LED (Light Emitting Diode) lamp
CN102901938A (en) * 2012-10-10 2013-01-30 上海普天邮通科技股份有限公司 Method for measuring integral light decay property of LED (light emitting diode) lamp
CN203117405U (en) * 2013-03-26 2013-08-07 深圳市逐瑞科技有限公司 Lamp measurement device
CN103424718A (en) * 2013-08-08 2013-12-04 广州市光机电技术研究院 Multi-lamp on-line automatic integrated test system and method
CN204116579U (en) * 2014-09-19 2015-01-21 厦门市永福森照明科技有限公司 A kind of light fixture test board
CN104407306A (en) * 2014-12-11 2015-03-11 彭依彧 Initial and final tester for LED lamps and test method
CN204649943U (en) * 2015-06-02 2015-09-16 国家电网公司 Test macro

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