CN104866280B - 一种利用存储器单元实现随机数发生的方法 - Google Patents

一种利用存储器单元实现随机数发生的方法 Download PDF

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CN104866280B
CN104866280B CN201410066304.8A CN201410066304A CN104866280B CN 104866280 B CN104866280 B CN 104866280B CN 201410066304 A CN201410066304 A CN 201410066304A CN 104866280 B CN104866280 B CN 104866280B
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CN104866280A (zh
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刘静
王国兵
肖金磊
王生鹏
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Purple Light Co Core Microelectronics Co Ltd
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Abstract

本发明提供了一种利用存储器单元实现随机数生成的方法,涉及硬件设计技术领域。本发明方法包括使用两组存储器单元,其方法步骤为:1)存储器单元一进行擦写测试,存储器单元二不进行操作而用于电流参考;2)定义两组存储器单元输出1和0的方式:定义存储器单元一和存储器单元二的漏源电流比值,当实时测试的漏源电流比值高于所定义的漏源电流比值时输出1,低于所定义的漏源电流比值时输出0;3)当存储器单元一和存储器单元二的实时测试的漏源电流比值处于所定义的漏源电流比值边界时,两组存储器单元输出无法确定为1还是为0,这时就会产生随机数序列。同现有技术相比,本发明能使随机数的产生具有易实现且占用硬件资源少的特点。

Description

一种利用存储器单元实现随机数发生的方法
技术领域
本发明涉及硬件设计领域,特别是利用存储器单元实现随机数生成的方法。
背景技术
真随机数发生器的研究是信息安全的需要,随着计算机和互联网技术的发展, 信息系统建设发展也很快,在信息安全方面也就给我们提出了巨大的挑战, 一般这种信息的安全传输通常釆用信息加密来实现。随机数发生器是安全信息系统中的一个非常重要的部分, 其产生的随机、不可以预测的随机数是信息加密的重要组成部分。
现有技术中,随机数产生方法普遍存在占用硬件资源大,实现方式复杂的不足,是硬件设计领域目前亟待解决的问题之一。
发明内容
针对上述现有技术中存在的不足,本发明的目的是提供一种利用存储器单元实现随机数生成的方法。它能使随机数的产生具有易实现且占用硬件资源少的特点。
为了达到上述发明目的,本发明的技术方案以如下方式实现:
一种利用存储器单元实现随机数生成的方法,所述方法使用包括两组存储器单元,其具体步骤为:
1)存储器单元一进行擦写测试,存储器单元二不进行操作而用于电流参考;
2)定义两组存储器单元输出1 和0 的方式:定义存储器单元一和存储器单元二的漏源电流比值,当实时测试的漏源电流比值高于所定义的漏源电流比值时输出1,低于所定义的漏源电流比值时输出0;
3)当存储器单元一和存储器单元二的实时测试的漏源电流比值处于所定义的漏源电流比值边界时,两组存储器单元输出无法确定为1 还是为0,这时就会产生随机数序列。
本发明由于采用了上述方法,仅使用了两组存储器单元和定义的漏源电流比值就实现了随机数的产生,具有方法简单易实现且占用硬件资源少的特点。
下面结合附图和具体实施方式对本发明作进一步详细的说明。
附图说明
图1为本发明实施例中的随机数发生示意图。
具体实施方式
本发明利用存储器单元实现随机数生成的方法,所述方法使用包括两组存储器单元,其具体步骤为:
1)存储器单元一进行擦写测试,存储器单元二不进行操作而用于电流参考。
2)定义两组存储器单元输出1 和0 的方式:定义存储器单元一和存储器单元二的漏源电流比值,当实时测试的漏源电流比值高于所定义的漏源电流比值时输出1,低于所定义的漏源电流比值时输出0,如图1中存储器输出波形所示。
3)当存储器单元一和存储器单元二的实时测试的漏源电流比值处于所定义的漏源电流比值边界时,两组存储器单元输出无法确定为1 还是为0,这时就会产生随机数序列。如图1 中,采样时钟上升沿时采样,采样时钟处于0 和1 的边界位置,无法判断是1 还是0 时,这时就会产生随机数序列。
本发明并不限于上文讨论的实施方式,以上对具体实施方式的描述旨在于为了描述和说明本发明涉及的技术方案。基于本发明启示的显而易见的变换或替代也应当被认为落入本发明的保护范围;以上的具体实施方式用来揭示本发明的最佳实施方法,以使得本领域的普通技术人员能够应用本发明的多种实施方式以及多种替代方式来达到本发明的目的。

Claims (1)

1.一种利用存储器单元实现随机数生成的方法,其特征在于,所述方法使用包括两组存储器单元,其具体步骤为:
1)存储器单元一进行擦写测试,存储器单元二不进行操作而用于电流参考;
2)定义两组存储器单元输出1 和0 的方式:定义存储器单元一和存储器单元二的漏源电流比值,当实时测试的漏源电流比值高于所定义的漏源电流比值时输出1,低于所定义的漏源电流比值时输出0;
3)当存储器单元一和存储器单元二的实时测试的漏源电流比值处于所定义的漏源电流比值边界时,两组存储器单元输出无法确定为1 还是为0,这时就会产生随机数序列。
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JP3604674B2 (ja) * 2001-09-26 2004-12-22 株式会社東芝 乱数生成回路
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CN102073476A (zh) * 2009-11-24 2011-05-25 索尼公司 随机数生成装置、随机数生成方法以及安全芯片
CN103593160A (zh) * 2013-11-04 2014-02-19 上海新储集成电路有限公司 一种基于相变存储单元的随机数字发生器

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