CN104865050A - Focusing performance analysis method for grazing incidence optical system based on X-ray optical simulation - Google Patents
Focusing performance analysis method for grazing incidence optical system based on X-ray optical simulation Download PDFInfo
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Abstract
The invention provides a focusing performance analysis method for a grazing incidence optical system based on X-ray optical simulation. The method fully considers characteristic information of X-ray photon energy and reflectivity, irons out a defect in the prior art that only single-energy X-ray photons are considered and the reflectivity is not considered, can achieve engineering actual condition closer to X-ray pulsar navigation apparatus, and improves the efficiency of X-ray optical simulation and analysis. The method can achieve the analysis of the focusing performance of an optical system under the conditions of thermal deformation, structural deformation or thermal-structural coupling deformation, and obtains the mean square root radiuses of a disc of confusion of the optical system, 100% energy concentration ratio and 50% energy concentration ratio under different conditions, thereby achieving the quantification of impact degree on the focusing performance of the optical system from different deformations, and providing support for the reliability design and optimization of a product.
Description
Technical Field
The invention relates to the technical field of spacecraft product design, in particular to a grazing incidence optical system focusing performance analysis method based on X-ray optical simulation.
Background
With the driving of military requirements, the requirements of resource detection and scientific exploration, the X-ray pulsar navigation technology is developed at a rapid pace. The X-ray pulsar navigator serves as a core load in the field, performance indexes such as spatial resolution, time resolution, navigation accuracy and the like are continuously improved, and the improvement of the performance requirement of the navigator also determines that more rigorous requirements are provided for the stability and the size of an optical system and a supporting structure of the whole device. Meanwhile, with the development of small satellite technology, the demand for the light weight of the X-ray pulsar navigator continues to increase. The design of the X-ray pulsar navigator relates to multiple disciplines of light, machine and heat, and is a multi-discipline interaction and comprehensive balancing process. Therefore, how to perform optical simulation analysis and focusing performance evaluation on the X-ray pulsar navigation device is the basis for developing high-performance instruments.
The grazing incidence type X-ray optical system has the following differences compared with the conventional optical system: (1) the grazing incidence total reflection critical angle is nonlinearly reduced along with the increase of energy; (2) x-rays of a specific energy, the reflectivity decreasing nonlinearly with increasing incidence angle; (3) when the grazing incidence angle is fixed, the reflectivity is nonlinearly and sharply reduced along with the increase of energy; (4) the requirement on the surface roughness of the optical lens is strict, and the total reflection can be generated only when the surface roughness of the optical lens is less than 1nm, so the requirement on the surface shape of the lens is high.
Most of the existing X-ray optical simulation and evaluation methods still adopt the traditional optical simulation and evaluation methods for other wavelength bands (such as visible light, infrared, ultraviolet and the like). The X-ray reflectivity is not considered in relation to the incident angle and X-ray energy, which leads to two problems: (1) the existing optical simulation method or commercial software can only analyze X-rays with certain single energy at each time, and can not consider reflectivity information, and for a Wolter-I type X-ray telescope with a wide energy range of 0.1-10keV, the workload is huge, and the application in aerospace engineering is seriously hindered. (2) The traditional optical evaluation method cannot really reflect the focusing performance of the X-ray, because for the X-ray with a wide waveband, due to the continuity of the X-ray, a discrete simulation method is not beneficial to engineering realization, and secondly, because the relation between energy and reflectivity is not considered, the focusing evaluation method cannot really reflect the actual situation.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a method for analyzing the focusing performance of a grazing incidence optical system based on X-ray optical simulation. The method fully considers the characteristic information of the X-ray photon energy and the reflectivity, avoids the defect that only single-energy X-ray photons are considered but the reflectivity is not considered in the prior art, can realize the engineering practical situation closer to the X-ray pulsar navigation device, and improves the efficiency of X-ray optical simulation.
The above object of the present invention is achieved by the following technical solutions:
the method for analyzing the focusing performance of the grazing incidence optical system based on X-ray optical simulation comprises the following steps:
(1) setting the incident position, photon energy and grazing incidence angle of P X-ray photons on the inner surface of the optical lens, wherein the incident position coordinates of the P-th photons are X respectivelyp、yp、zpThe origin of the coordinate system is set as the center of the detector, and the Z axis is set as the central axis of the optical lens; photon energy of the p-th photon is Ep,EpIn a set energy range Emin~EmaxInternal random distribution; the grazing incidence angle of the p-th photon is thetap,θpWithin a set angular range thetamin~θmaxInternal random distribution; p is 1, 2, … and P, wherein P is the set X-ray photon sample size;
(2) calculating the lens curvature radius of each photon at the incident point of the inner surface of the optical lens and the distance from the incident point to the central axis of the optical lens according to the X-ray photon incident position coordinate set in the step (1); wherein, γpThe radius of curvature of the lens at the p-th photon incidence point; dpThe distance from the incident point of the p-th photon on the inner surface of the optical lens to the central axis of the optical lens; p is 1, 2, …, P; the specific calculation formula is as follows:
(3) the lens curvature radius and incidence of the X-ray photons at the incidence point of the inner surface of the optical lens are calculated according to the step (2)Calculating the actual grazing incidence angle of each X-ray photon according to the distance between the point and the central axis of the optical lens; wherein the actual grazing incidence angle of the p-th X-ray photon is calculated asp=1、2、…、P;
(4) Calculating the critical incident angle of each X-ray photon according to the photon energy of the photon, wherein the critical incident angle of the p-th X-ray photon is calculated to be phip,p=1、2、…、P;
(5) Comparing the critical incidence angle of each X-ray photon with the actual grazing incidence angle of the photon to determine whether the photon is totally emitted, and counting the totally emitted photons to obtain the total number N of the photons reaching the detectortotal;
(6) Obtaining N by counting in the step (5)totalAnd (3) performing the following calculation on the X-ray photons subjected to total reflection to obtain the reflection angle of each photon on the inner surface of the lens:
wherein alpha isqThe angle of reflection of the qth totally reflected X-ray photon on the inner surface of the lens,for the actual grazing incidence angle, θ, of the qth totally reflected X-ray photonq' is the grazing incidence angle of the qth totally reflected X-ray photon; wherein q is 1, 2, …, Ntotal;
(7) Calculating the component velocity of each photon in the radial direction and the axial direction according to the reflection angle of each photon on the inner surface of the lens calculated in the step (6); then, according to the axial component velocity, the focal length and the Z coordinate value of the photon, each photon is obtained by calculationTime of flight to the detector focal plane; calculating according to a motion equation to obtain a coordinate value of each photon which is subjected to total reflection after reaching a focal plane of the detector; wherein, the calculated X coordinate and Y coordinate of the qth total reflection X-ray photon reaching the detector focal plane are respectivelyq=1,2,…,Ntotal;
(8) And calculating the X-ray optical focusing performance parameters, wherein the specific calculation formula is as follows:
wherein RMS is the diffuse speckle root mean square radius of the X-ray optical focusing performance parameter; r isqIs the distance between the position of the qth totally reflected X-ray photon after reaching the focal plane of the detector and the center of the detector, i.e.
In the method for analyzing the focusing performance of the grazing incidence optical system based on the X-ray optical simulation, in step (3), the actual grazing incidence angle of the p-th X-ray photonThe calculation formula of (a) is as follows:
in the method for analyzing the focusing performance of the grazing incidence optical system based on the X-ray optical simulation, in step (4), the critical incident angle phi of the p-th X-ray photonpThe calculation formula of (a) is as follows:
wherein f is1Is the scattering factor of the optical lens material set.
In the method for analyzing the focusing performance of the grazing incidence optical system based on the X-ray optical simulation, in step (5), whether the X-ray photons are totally reflected or not is determined and counted by the following method: if the actual grazing incidence angle of the p-th X-ray photon is greater than the critical incidence angle of said photon, i.e. theThen the total reflection of the photons is judged and the photons reach the detector, and then the total number of the photons reaching the detector is determinedNumber NtotalPlus 1, i.e. Ntotal=Ntotal+ 1; wherein N is settotalThe initial value of (a) is 0; p is 1, 2, … and P.
In the step (7), the component velocity of each photon in the radial and axial directions is calculated according to the reflection angle of each photon on the inner surface of the lens calculated in the step (6); then calculating the flight time of each photon reaching the focal plane of the detector according to the axial component velocity, the focal length and the Z coordinate value of the photon; calculating according to a motion equation to obtain a coordinate value of each photon which is subjected to total reflection after reaching a focal plane of the detector; the specific calculation process is as follows:
(7a) calculating the component velocity of the X-ray photon along the optical axis direction and the radial direction, wherein the specific calculation formula is as follows:
Vq,1=V0*cos(αq);
Vq,2=V0*sin(αq);
wherein, Vq,1The component velocity, V, of the q-th totally reflected X-ray photon in the direction of the optical axisq,2The component velocity, V, of the qth totally reflected X-ray photon in the radial direction0Is the set speed of light; wherein q is 1, 2, …, Ntotal;
(7b) Calculating the flight time of each X-ray photon which is subjected to total reflection and reaches a focal plane of the detector:
wherein, TqF is the set focal length of the optical system for the flight time of the q-th X-ray photon with total reflection reaching the focal plane of the detector; z is a radical ofq' is the Z coordinate of the q-th X-ray photon upon initial incidence; wherein q is 1, 2, …, Ntotal;
(7c) And calculating the position coordinate of each X-ray photon which is subjected to total reflection when reaching the focal plane of the detector, wherein the specific calculation formula is as follows:
wherein,respectively an X coordinate and a Y coordinate of the qth totally reflected X-ray photon after reaching the focal plane of the detector; x is the number ofq' and yq' X coordinate and Y coordinate of q-th X-ray photon with total reflection at initial incidence are respectively; wherein q is 1, 2, …, Ntotal。
The method for analyzing the focusing performance of the grazing incidence optical system based on the X-ray optical simulation is based on the number N of photons subjected to total reflectiontotalThe ratio of the sample quantity P of the X-ray photons to the set X-ray photon sample quantity is calculated to obtain the 100 percent energy concentration ratio of the X-ray photons
According to the method for analyzing the focusing performance of the grazing incidence optical system based on the X-ray optical simulation, after the X coordinate and the Y coordinate of the X-ray photon with total reflection after reaching the focal plane of the detector are obtained through calculation in the step (7), the center of the detector is taken as the circle center, and the center of the detector is taken as the circle centerDetermining a circle on the focal plane of the detector for the radius, counting the number of photons entering said circleNamely theThe distance between the position of each X-ray photon after reaching the focal plane of the detector and the center of the detector is less than or equal to
The method for analyzing the focusing performance of the grazing incidence optical system based on the X-ray optical simulation is characterized in that the distance between the position after the position reaches the focal plane of the detector and the center of the detector is less than or equal toNumber of photonsThe ratio of the sample size P to the X-ray photon is calculated to obtain the 50% energy concentration ratio of the X-ray photon <math>
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Compared with the prior art, the invention has the following advantages:
(1) the invention fully considers the characteristic information of the X-ray photon energy and the reflectivity, avoids the defect that only single-energy X-ray photons are considered in the prior art and the reflectivity is not considered, can realize the engineering practical situation closer to the X-ray pulsar navigation device, and improves the efficiency of X-ray optical simulation.
(2) The invention carries out ray tracing on all X-ray photons which are randomly produced based on the specific total reflection theory of X-rays and the Monte Carlo method, and judges the position of the X-ray photons on the focal plane of the detector in real time according to the flight time and the component velocity of the X-ray photons in the X, Y direction in the plane of the detector, thereby realizing the whole process tracing of the grazing incidence of the X-ray;
(3) aiming at the whole process ray tracing of the X-ray photons of the large sample, the invention counts the number of the X-ray photons reaching the focal plane of the detector and the reaching positions thereof based on the statistical idea, and performs focusing performance evaluation on the X-ray photons by adopting the root-mean-square radius of the scattered spot, thereby quantifying the influence degree of thermal deformation, structural deformation and coupling deformation on the focusing performance of the X-ray pulsar navigation device and providing theoretical support for the subsequent complete machine optimization design.
Drawings
FIG. 1 is a flow chart of the method for analyzing the focusing performance of a grazing incidence optical system based on X-ray optical simulation.
Detailed Description
The invention is described in further detail below with reference to the following figures and specific examples:
in the simulation analysis of the X-ray pulsar navigation device, the reflectivity of X-ray photons is closely related to the energy of the X-ray photons because the X-ray photons are different from photons in other wave bands, and the two characteristics of the energy and the reflectivity of the X-ray are not considered in the traditional simulation method. Therefore, in order to be closer to the engineering practical situation of the X-ray pulsar navigation device, the invention provides a grazing incidence optical system focusing performance analysis method based on X-ray optical simulation.
As shown in an analysis flowchart of fig. 1, the method for analyzing the focusing performance of a grazing incidence optical system based on X-ray optical simulation of the present invention includes the following steps:
(1) setting the incident position, photon energy and grazing incidence angle of P X-ray photons on the inner surface of the optical lens, wherein the incident position coordinates of the P-th photons are X respectivelyp、yp、zpThe origin of the coordinate system is set as the center of the detector, and the Z axis is set as the central axis of the optical lens; photon energy of the p-th photon is Ep,EpIn a set energy range Emin~EmaxInternal random distribution; the grazing incidence angle of the p-th photon is thetap,θpWithin a set angular range thetamin~θmaxInternal random distribution; p is 1, 2, … and P, wherein P is the set X-ray photon sample size;
(2) according to the X-ray photon incidence position coordinates set in the step (1)Calculating the curvature radius of the lens of each photon at the incident point of the inner surface of the optical lens and the distance from the incident point to the central axis of the optical lens; wherein, γpThe radius of curvature of the lens at the p-th photon incidence point; dpThe distance from the incident point of the p-th photon on the inner surface of the optical lens to the central axis of the optical lens; p is 1, 2, …, P; the formula of the optical lens surface shape is as follows:therefore, the formula for calculating the curvature radius in the present invention is set as:and set up
(3) Calculating the actual grazing incidence angle of each X-ray photon according to the lens curvature radius of the X-ray photon at the incidence point on the inner surface of the optical lens obtained by calculation in the step (2) and the distance from the incidence point to the central axis of the optical lens; the specific calculation formula is as follows:
wherein,the actual grazing incidence angle for the pth X-ray photon, P ═ 1, 2, …, P;
(4) calculating the critical incident angle of each X-ray photon according to the photon energy of the photon, wherein the specific calculation formula is as follows:
wherein phi ispCritical angle of incidence for the p-th X-ray photon; f. of1Is the scattering factor of the optical lens material set.
(5) Comparing the critical incidence angle of each X-ray photon with the actual grazing incidence angle of the photon to determine whether the photon is totally emitted, and counting the totally emitted photons to obtain the total number N of the photons reaching the detectortotal(ii) a The specific implementation process is as follows: if the actual grazing incidence angle of the p-th X-ray photon is greater than the critical incidence angle of said photon, i.e. theJudging that the photons are totally reflected and reach the detector, and then counting the total number N of the photons reaching the detectortotalPlus 1, i.e. Ntotal=Ntotal+ 1; wherein N is settotalThe initial value of (a) is 0; p is 1, 2, … and P.
(6) Obtaining N by counting in the step (5)totalAnd (3) performing the following calculation on the X-ray photons subjected to total reflection to obtain the reflection angle of each photon on the inner surface of the lens:
wherein alpha isqThe angle of reflection of the qth totally reflected X-ray photon on the inner surface of the lens,for the actual grazing incidence angle, θ, of the qth totally reflected X-ray photonq' is the grazing incidence angle of the qth totally reflected X-ray photon; wherein q is 1, 2, …, Ntotal;
(7) Calculating the component velocity of each photon in the radial direction and the axial direction according to the reflection angle of each photon on the inner surface of the lens calculated in the step (6); then calculating the flight time of each photon reaching the focal plane of the detector according to the axial component velocity, the focal length and the Z coordinate value of the photon; calculating according to a motion equation to obtain a coordinate value of each photon which is subjected to total reflection after reaching a focal plane of the detector; wherein, the calculated X coordinate and Y coordinate of the qth total reflection X-ray photon reaching the detector focal plane are respectivelyq=1,2,…,Ntotal;
The specific calculation process is as follows:
(7a) calculating the component velocity of the X-ray photon along the optical axis direction and the radial direction, wherein the specific calculation formula is as follows:
Vq,1=V0*cos(αq);
Vq,2=V0*sin(αq);
wherein, Vq,1The component velocity, V, of the q-th totally reflected X-ray photon in the direction of the optical axisq,2The component velocity, V, of the qth totally reflected X-ray photon in the radial direction0Is the set speed of light; wherein q is 1, 2, …, Ntotal;
(7b) Calculating the flight time of each X-ray photon which is subjected to total reflection and reaches a focal plane of the detector:
wherein, TqF is the set focal length of the optical system for the flight time of the q-th X-ray photon with total reflection reaching the focal plane of the detector; z is a radical ofq' is the Z coordinate of the q-th X-ray photon upon initial incidence; wherein q is 1, 2, …, Ntotal;
(7c) And calculating the position coordinate of each X-ray photon which is subjected to total reflection when reaching the focal plane of the detector, wherein the specific calculation formula is as follows:
wherein,respectively an X coordinate and a Y coordinate of the qth totally reflected X-ray photon after reaching the focal plane of the detector; x is the number ofq' and yq' X coordinate and Y coordinate of q-th X-ray photon with total reflection at initial incidence are respectively; wherein q is 1, 2, …, Ntotal。
(8) And calculating the X-ray optical focusing performance parameters, wherein the specific calculation formula is as follows:
wherein RMS is the diffuse spot root mean square radius as an X-ray optical focusing performance parameter; r isqIs the distance between the position of the qth totally reflected X-ray photon after reaching the focal plane of the detector and the center of the detector, i.e.
(9) According to the number of photons N which are totally reflectedtotalThe ratio of the sample quantity P of the X-ray photons to the set X-ray photon sample quantity is calculated to obtain the 100 percent energy concentration ratio of the X-ray photons
(10) The center of the detector is taken as the center of a circle, anddetermining a circle on the focal plane of the detector for the radius, counting the number of photons entering said circleNamely theThe distance between the position of each X-ray photon after reaching the focal plane of the detector and the center of the detector is less than or equal to
(11) According to the distance between the position after reaching the focal plane of the detector and the center of the detector is less than or equal toNumber of photonsThe ratio of the sample size P to the X-ray photon is calculated to obtain the 50% energy concentration ratio of the X-ray photon
By adopting the method for analyzing the focusing performance of the grazing incidence optical system, the focusing performance of the optical system under the conditions of thermal deformation, structural deformation or thermal-structural coupling deformation can be respectively analyzed to obtain the root-mean-square radius of the scattered spots, the 100% energy concentration and the 50% energy concentration of the optical system under different conditions, so that the influence degree of different deformations on the focusing performance of the optical system is quantized, and theoretical support is provided for the reliability design and optimization of products.
The above description is only one embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention.
Those skilled in the art will appreciate that the invention may be practiced without these specific details.
Claims (8)
1. The method for analyzing the focusing performance of the grazing incidence optical system based on X-ray optical simulation is characterized by comprising the following steps of:
(1) setting the incident position, photon energy and grazing incidence angle of P X-ray photons on the inner surface of the optical lens, wherein the incident position coordinates of the P-th photons are X respectivelyp、yp、zpThe origin of the coordinate system is set as the center of the detector, and the Z axis is set as the central axis of the optical lens; photon energy of the p-th photon is Ep,EpIn a set energy range Emin~EmaxInternal random distribution; the grazing incidence angle of the p-th photon is thetap,θpWithin a set angular range thetamin~θmaxInternal random distribution; p is 1, 2, … and P, wherein P is the set X-ray photon sample size;
(2) calculating the lens curvature radius of each photon at the incident point of the inner surface of the optical lens and the distance from the incident point to the central axis of the optical lens according to the X-ray photon incident position coordinate set in the step (1); wherein,the radius of curvature of the lens at the p-th photon incidence point; dpThe distance from the incident point of the p-th photon on the inner surface of the optical lens to the central axis of the optical lens; p is 1, 2, …, P; the specific calculation formula is as follows:
(3) calculating the actual grazing incidence angle of each X-ray photon according to the lens curvature radius of the X-ray photon at the incidence point on the inner surface of the optical lens obtained by calculation in the step (2) and the distance from the incidence point to the central axis of the optical lens; wherein the actual grazing incidence angle of the p-th X-ray photon is calculated asp=1、2、…、P;
(4) Calculating the critical incident angle of each X-ray photon according to the photon energy of the photon, wherein the calculation results inThe critical angle of incidence of the p-th X-ray photon is phip,p=1、2、…、P;
(5) Comparing the critical incidence angle of each X-ray photon with the actual grazing incidence angle of the photon to determine whether the photon is totally emitted, and counting the totally emitted photons to obtain the total number N of the photons reaching the detectortotal;
(6) Obtaining N by counting in the step (5)totalAnd (3) performing the following calculation on the X-ray photons subjected to total reflection to obtain the reflection angle of each photon on the inner surface of the lens:
wherein alpha isqThe angle of reflection of the qth totally reflected X-ray photon on the inner surface of the lens,for the actual grazing incidence angle, θ, of the qth totally reflected X-ray photonq' is the grazing incidence angle of the qth totally reflected X-ray photon; wherein q is 1, 2, …, Ntotal;
(7) Calculating the component velocity of each photon in the radial direction and the axial direction according to the reflection angle of each photon on the inner surface of the lens calculated in the step (6); then calculating the flight time of each photon reaching the focal plane of the detector according to the axial component velocity, the focal length and the Z coordinate value of the photon; calculating according to a motion equation to obtain a coordinate value of each photon which is subjected to total reflection after reaching a focal plane of the detector; wherein, the calculated X coordinate and Y coordinate of the qth total reflection X-ray photon reaching the detector focal plane are respectively q=1,2,…,Ntotal;
(8) And calculating the X-ray optical focusing performance parameters, wherein the specific calculation formula is as follows:
wherein RMS is the diffuse speckle root mean square radius of the X-ray optical focusing performance parameter; r isqIs the distance between the position of the qth totally reflected X-ray photon after reaching the focal plane of the detector and the center of the detector, i.e.
2. The grazing incidence optical system focusing performance analysis method based on X-ray optical simulation according to claim 1, characterized in that: in step (3), the actual grazing incidence angle of the p-th X-ray photonThe calculation formula of (a) is as follows:
p=1、2、…、P。
3. the grazing incidence optical system focusing performance analysis method based on X-ray optical simulation according to claim 1, characterized in that: in step (4), the critical angle of incidence φ for the pth X-ray photonpThe calculation formula of (a) is as follows:
wherein f is1Is the scattering factor of the optical lens material set.
4. The grazing incidence optical system focusing performance analysis method based on X-ray optical simulation according to claim 1, characterized in that: in step (5), whether the X-ray photons are totally reflected is determined and counted by: if the actual grazing incidence angle of the p-th X-ray photon is greater than the critical incidence angle of said photon, i.e. theJudging that the photons are totally reflected and reach the detector, and then counting the total number N of the photons reaching the detectortotalPlus 1, i.e. Ntotal=Ntotal+ 1; wherein N is settotalThe initial value of (a) is 0; p is 1, 2, … and P.
5. The grazing incidence optical system focusing performance analysis method based on X-ray optical simulation according to claim 1, characterized in that: in step (7), calculating the component velocity of each photon in the radial direction and the axial direction according to the reflection angle of each photon on the inner surface of the lens calculated in step (6); then calculating the flight time of each photon reaching the focal plane of the detector according to the axial component velocity, the focal length and the Z coordinate value of the photon; calculating according to a motion equation to obtain a coordinate value of each photon which is subjected to total reflection after reaching a focal plane of the detector; the specific calculation process is as follows:
(7a) calculating the component velocity of the X-ray photon along the optical axis direction and the radial direction, wherein the specific calculation formula is as follows:
Vq,1=V0*cos(αq);
Vq,2=V0*sin(αq);
wherein, Vq,1The component velocity, V, of the q-th totally reflected X-ray photon in the direction of the optical axisq,2The component velocity, V, of the qth totally reflected X-ray photon in the radial direction0Is the set speed of light; wherein q is 1, 2, …, Ntotal;
(7b) Calculating the flight time of each X-ray photon which is subjected to total reflection and reaches a focal plane of the detector:
wherein, TqF is the set focal length of the optical system for the flight time of the q-th X-ray photon with total reflection reaching the focal plane of the detector; z is a radical ofq' is the initial incidence of the q-th totally reflected X-ray photonZ coordinate of (a); wherein q is 1, 2, …, Ntotal;
(7c) And calculating the position coordinate of each X-ray photon which is subjected to total reflection when reaching the focal plane of the detector, wherein the specific calculation formula is as follows:
wherein, respectively an X coordinate and a Y coordinate of the qth totally reflected X-ray photon after reaching the focal plane of the detector; x is the number ofq' and yq' X coordinate and Y coordinate of q-th X-ray photon with total reflection at initial incidence are respectively; wherein q is 1, 2, …, Ntotal。
6. The grazing incidence optical system focusing performance analysis method based on X-ray optical simulation according to claim 1, characterized in that: according to the number N of photons undergoing total reflectiontotalThe ratio of the sample quantity P of the X-ray photons to the set X-ray photon sample quantity is calculated to obtain the 100 percent energy concentration ratio of the X-ray photons
7. The grazing incidence optical system focusing performance analysis method based on X-ray optical simulation according to claim 1, characterized in that: after the X coordinate and the Y coordinate of the X-ray photon with total reflection after reaching the focal plane of the detector are obtained by calculation in the step (7), the center of the detector is taken as the center of a circle, and the center of the detector is taken as the center of the circleDetermining a circle on the focal plane of the detector for the radius, counting the number of photons entering said circleNamely theThe distance between the position of each X-ray photon after reaching the focal plane of the detector and the center of the detector is less than or equal to
8. The grazing incidence optical system focusing performance analysis method based on X-ray optical simulation according to claim 7, characterized in that: according to the distance between the position after reaching the focal plane of the detector and the center of the detector being less than or equal toNumber of photonsThe ratio of the sample size P to the X-ray photon is calculated to obtain the 50% energy concentration ratio of the X-ray photon
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