CN104766281B - The bearing calibration of uneven DC component in a kind of interference image - Google Patents
The bearing calibration of uneven DC component in a kind of interference image Download PDFInfo
- Publication number
- CN104766281B CN104766281B CN201510146081.0A CN201510146081A CN104766281B CN 104766281 B CN104766281 B CN 104766281B CN 201510146081 A CN201510146081 A CN 201510146081A CN 104766281 B CN104766281 B CN 104766281B
- Authority
- CN
- China
- Prior art keywords
- data
- interference
- component
- sampling interferogram
- bilateral
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Abstract
The bearing calibration of uneven DC component in a kind of interference image, segment processing is carried out to interference data according to interference type imaging spectrometer data characteristicses first；Then bilateral sampling interferogram data are handled using averaging method is slided with reference to symmetrical average, obtains interference data DC component data and curves, interference data DC component data and curves are solved using averaging method is slided to unilateral sampling interferogram data；It is poor that finally original interference data and whole DC component data and curves are made, and obtains new interference information.The inventive method is compared with prior art, strict correction can be carried out to DC component uneven in interference image, ensure the precision of whole interference image processing, simple operation, stably, efficiently meets the operation efficiency and accuracy requirement of interference-type imager data processing well.
Description
Technical field
The present invention relates to a kind of bearing calibration of uneven DC component in interference image, more particularly to environment disaster reduction satellite
The bearing calibration of uneven DC component in the interference image of interference-type hyperspectral imager.
Background technology
Interference type spectral Detection Techniques are established on the basis of interference data and spectroscopic data meet Fourier transform relation, i.e.,
Object spectrum information obtains interference information by interference type imaging spectrometer, by carrying out Fourier transform inverting to interference information
It can obtain object spectrum information.Interference type imaging spectrometer has nano level spectral resolution, is typically arrived with more than tens
Thousand wave bands, the spectral cube information of atural object spatial information and spectral information composition can be obtained, can be with careful, effective knowledge
Other atural object, there is great application value and wide application prospect.But interference-type hyperspectral imager interference image direct current
Component problem of non-uniform is to need to capture one of technical barrier in interference data processing procedure.In order to improve interference type imaging spectrum
The spectral resolution of instrument, larger maximum optical path difference is obtained, interference data zero optical path difference position is typically arranged on CCD device
Left side is close to the position at edge, and because the illumination of zero optical path difference position is relatively by force and than more uniform, and peripheral field points illumination is then
It is weaker, cause on the left of interference data that visual field illumination is relatively strong, right side visual field illumination is successively decreased, form obvious interference data illumination not
Uniform phenomenon, this is decreased obviously final recovery spectral accuracy.Therefore must be to DC component uneven in interference image
Strict correction is carried out, to ensure the precision of whole hyperspectral data processing.
Interference data DC component nonuniform response and interference information phase in interference-type hyperspectral imager initial data
Mutually superposition, using in general inhomogeneity correction Processing Algorithm, can lose interference information, so as to reduce final spectral accuracy, this
So that the difficulty of interference image DC component inhomogeneity correction greatly increases.
The content of the invention
Present invention solves the technical problem that it is：Overcome the deficiencies in the prior art, there is provided a kind of not only to ensure to interfere
Image procossing precision, and it is uneven straight in the interference image that can be corrected to DC component uneven in interference image
The bearing calibration of flow component.
The present invention technical solution be：The bearing calibration of uneven DC component in a kind of interference image, including such as
Lower step：
(1) obtain each frame interference data to interference type imaging spectrometer measurement to be segmented, obtain bilateral sampling interferogram
Data and unilateral sampling interferogram data；
(2) the sliding window width of bilateral sampling interferogram data is set, and according to the sliding window of bilateral sampling interferogram data
Before mouthful width calculation symmetrical treatment in bilateral sampling interferogram data m data point DC component data value TjFor
Work as j<During=0.5n,
Work as 0.5n<j<During m-0.5n,
Work as m>=j>During=m-0.5n,
Wherein, n is the sliding window width of bilateral sampling interferogram data, and j=1,2 ... m, m are bilateral sampling interferogram data
Points, XiFor the interference data value of i-th of data point in interference data, i=1,2 ... m；
(3) the DC component data value of m data point in bilateral sampling interferogram data is handled, obtains bilateral sampling
The DC component data value of m data point is in interference dataWherein, Tj0For j-th of data point phase
For the DC component data value of zero optical path difference positional symmetry point；
(4) the sliding window width n ' of unilateral sampling interferogram data is set, and according to the slip of unilateral sampling interferogram data
Window width n ' calculates the DC component data value T of the individual data points of m ' in unilateral sampling interferogram datajFor
Work as m<j<During=m+0.5n',
Work as m+0.5n'<j<During m+m'-0.5n',
Work as j>During=m+m'-0.5n',
Wherein, n ' be unilateral interference data sliding window width, j=m+1, m+2 ... m+m '；M ' is that unilateral sampling is done
Relate to data points, XiFor the interference data value of i-th of data point in interference data, i=m+1, m+2 ... m+m '；
(5) it is bilateral to adopt using the interference data value of data point in bilateral sampling interferogram data value, unilateral sampling interferogram data
After j-th point of processing is calculated in the DC component data value of data point in sample interference data value, unilateral sampling interferogram data
Interference data is
Ij=Xj-Trj,
Wherein j=1,2 ... k, k=m+m ' are that interference data is counted in a frame interference data.
Described bilateral sampling interferogram data sliding window width span is 5-11 and is odd number, unilateral sampling is done
Relate to the sliding window width n ' of data span 3-7 and be odd number.
The present invention compared with prior art the advantages of be：
(1) the inventive method carries out packet transaction according to interference data characteristic to data, compared with prior art, can be right
Uneven DC component carries out strict correction in interference image, ensures the precision of whole interference image processing；
(2) the inventive method compared with prior art, realizes the interference data DC component based on sliding window width
Inhomogeneity correction, it is uneven that interference data DC component can be effectively removes by adaptive modification sliding window width
Response, improve the accuracy that interference type imaging spectrometer restores spectrum；
(3) the inventive method compared with prior art, simple operation, stably, efficiently, and processing accuracy is high, well
Meet the operation efficiency and accuracy requirement of interference-type imager data processing.
Brief description of the drawings
Fig. 1 is the inventive method principle flow chart.
Embodiment
Two parts information is included in the interference data that interference type imaging spectrometer collects, first, effectively interference data
Information, second, DC component information, if DC component is constant, will not have an impact to restoring spectroscopic data precision, and
DC component is changed with sampling point position in actual interference data, it is therefore desirable to the DC component of interference data is solved, and
Remove it in data handling.Traditional inhomogeneity correction Processing Algorithm can lose interference information, reduce spectral accuracy, separately
Outer traditional data handling procedure needs to carry out interference image DC component inhomogeneity correction frame by frame, therefore amount of calculation is excessive, and
Data processing operation efficiency can be caused to substantially reduce.The present invention is using slip average to DC component uneven in interference image
Be corrected, can it is intact remain interference information on the basis of, correct interference image DC component nonuniform response,
The consistent interference signal of baseline has been obtained, has achieved good calibration result, and the high spectrum intervention data after correction are passed through
The spectral accuracy that spectrum recovering handles to obtain significantly improves.The inventive method simple operation, stably, efficiently, meets well
The operation efficiency and accuracy requirement of interference-type imager data processing.
The bearing calibration of uneven DC component in a kind of interference image of the present invention, it is including step as shown in Figure 1：
The first step：Interference data segment processing；Interference type imaging spectrometer in order to improve spectral resolution, adopt by interference data
When sample, symmetric sampling is not often used, and uses small bilateral sample mode, partial data is on zero in whole interference data
Optical path difference position is symmetrical, and another part is then unilateral sampling.Larger maximum optical path difference so can be both obtained,
Spectral resolution is improved, can effectively reduce influence of the asymmetric sampling to spectrum recovering processing accuracy again.Therefore, in interference number
During DC component inhomogeneity correction, it is necessary first to according to interference type imaging spectrometer data characteristicses (by the type of interference-type
Number determine) each frame interference data is segmented, interference data can be divided into bilateral sampling interferogram data and unilateral sampling
Interference data, specific segmented mode are as follows：
(1) bilateral interference data signal to noise ratio is higher in interference data, and illumination is more uniform, is bilateral sampling interferogram data；
(2) unilateral sampled data in interference data, signal to noise ratio reduces, and illumination variation is larger, is unilateral sampling interferogram
Data.
Second step：Solve bilateral sampling interferogram data DC component curve；Bilateral sampling interferogram data are with respect to zero order fringe
With good symmetry, therefore Data processing solves bilateral sampling interferogram using averaging method combination symmetric data average is slided
Data DC component curve.Due to this segment data, its signal to noise ratio is higher, and illumination variation is smaller, sliding window width can with larger,
5-11 can be typically set to, while to ensure the symmetry of window, window width needs to be arranged to odd number.
(1) bilateral sampling interferogram data DC component curve before calculating symmetrical treatment；According to bilateral sampling interferogram data
Sliding window width, calculate the DC component data value T of m data point in bilateral sampling interferogram data before symmetrical treatmentj
Work as j<During=0.5n,
Work as 0.5n<j<During m-0.5n,
Work as m>=j>During=m-0.5n,
Wherein, n is the sliding window width of bilateral sampling interferogram data, and j=1,2 ... m, m are bilateral sampling interferogram data
Points, XiFor the interference data value of i-th of data point in interference data, i=1,2 ... m, interference data is done including bilateral sampling
Relate to data and unilateral sampling interferogram data.
(2) bilateral sampling interferogram data DC component curve after symmetrical treatment；Symmetric position is taken out in zero optical path difference both sides
DC component data value Tj, calculate bilateral sampling interferogram data DC component curve (m number in i.e. bilateral sampling interferogram data
The set at strong point).This section small bilateral interference data, has good symmetry on zero optical path difference, by DC component data value
TjAveraged for zero optical path difference symmetric position as DC component curve, the accuracy of DC component curve can be improved, counted
Calculation method is as follows
Wherein, Tj0DC component data value for j-th of data point relative to zero optical path difference positional symmetry point；
3rd step：Unilateral sampling interferogram data DC component curve；For unilateral interference data, its signal to noise ratio is relatively low, light
According to changing greatly, but illumination variation is shallower on the whole, no mutation, and interference data can be equally accurately obtained by sliding averaging method
DC component curve.Now sliding window width is smaller, is typically designed as 3-7, is similarly the symmetry for ensureing window, and window is wide
Degree needs to be arranged to odd number.
According to the sliding window width n ' of unilateral sampling interferogram data, the individual data points of m ' in unilateral sampling interferogram data are calculated
DC component data value TjFor
Work as m<j<During=m+0.5n',
Work as m+0.5n'<j<During m+m'-0.5n',
Work as j>During=m+m'-0.5n',
Wherein, n ' be unilateral interference data sliding window width, j=m+1, m+2 ... m+m '；M ' is that unilateral sampling is done
Relate to data points, XiFor the interference data value of i-th of data point in interference data, i=m+1, m+2 ... m+m ', interference data bag
Include bilateral sampling interferogram data and unilateral sampling interferogram data；
4th step：It is poor that original interference data is made with DC component curve；Use bilateral sampling interferogram data value, unilateral sampling
The DC component data of interference data value and each data point are worth to the interference data after j-th point of processing.
Ij=Xj-Trj
Wherein j=1,2 ... k, m+m '=k are that interference data is counted in a frame interference data.After inhomogeneity correction
Interference data is intact original interference information that remains, while also effectively goes interference data DC component nonuniform response
Remove so that the spectroscopic data precision finally restored significantly improves.
The content not being described in detail in description of the invention belongs to the known technology of those skilled in the art.
Claims (2)
1. the bearing calibration of uneven DC component in a kind of interference image, it is characterised in that comprise the following steps：
(1) obtain each frame interference data to interference type imaging spectrometer measurement to be segmented, obtain bilateral sampling interferogram data
With unilateral sampling interferogram data；
(2) the sliding window width of bilateral sampling interferogram data is set, and it is wide according to the sliding window of bilateral sampling interferogram data
Degree calculates the DC component data value T of m data point in bilateral sampling interferogram data before symmetrical treatmentjFor
Work as j<During=0.5n,
Work as 0.5n<j<During m-0.5n,
Work as m>=j>During=m-0.5n,
Wherein, n is the sliding window width of bilateral sampling interferogram data, and j=1,2 ... m, m are bilateral sampling interferogram data point
Number, XiFor the interference data value of i-th of data point in interference data, i=1,2 ... m；
(3) the DC component data value of m data point in bilateral sampling interferogram data is handled, obtains bilateral sampling interferogram
The DC component data value of m data point is in dataWherein, Tj0For j-th of data point relative to
The DC component data value of zero optical path difference positional symmetry point；
(4) the sliding window width n ' of unilateral sampling interferogram data is set, and according to the sliding window of unilateral sampling interferogram data
Width n ' calculates the DC component data value Tr of the individual data points of m ' in unilateral sampling interferogram datajFor
Work as m<j<During=m+0.5n',
Work as m+0.5n'<j<During m+m'-0.5n',
Work as j>During=m+m'-0.5n',
Wherein, n ' be unilateral interference data sliding window width, j=m+1, m+2 ... m+m '；M ' is unilateral sampling interferogram number
Strong point number, XiFor the interference data value of i-th of data point in interference data, i=m+1, m+2 ... m+m '；
(5) interference data after j-th point of processing, which is calculated, is
Ij=Xj-Trj,
Wherein, j=1,2 ... k, k=m+m ' they are that interference data is counted in a frame interference data, work as j=1, during 2 ... m, XjTo be double
The interference data value of j-th of data point, Tr in the sampling interferogram data of sidejFor in bilateral sampling interferogram data m data point it is straight
Flow component data value, works as j=m+1, during m+2 ... m+m ', XjFor the interference number of j-th of data point in unilateral sampling interferogram data
According to value, TrjFor the DC component data value of the individual data points of m ' in unilateral sampling interferogram data.
2. the bearing calibration of uneven DC component in a kind of interference image according to claim 1, it is characterised in that：Institute
The sliding window width span for the bilateral sampling interferogram data stated is 5-11 and is odd number, the cunning of unilateral sampling interferogram data
Dynamic window width n ' span 3-7 and be odd number.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510146081.0A CN104766281B (en) | 2015-03-30 | 2015-03-30 | The bearing calibration of uneven DC component in a kind of interference image |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510146081.0A CN104766281B (en) | 2015-03-30 | 2015-03-30 | The bearing calibration of uneven DC component in a kind of interference image |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104766281A CN104766281A (en) | 2015-07-08 |
| CN104766281B true CN104766281B (en) | 2018-01-16 |
Family
ID=53648093
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510146081.0A Active CN104766281B (en) | 2015-03-30 | 2015-03-30 | The bearing calibration of uneven DC component in a kind of interference image |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104766281B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106839972B (en) * | 2017-01-11 | 2019-05-10 | 天津大学 | A kind of interference signal processing method of full light fiber white light interference instrument |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1858253A1 (en) * | 2006-05-16 | 2007-11-21 | Sony Corporation | Image correction circuit, image correction method and image display |
| CN101598798A (en) * | 2008-12-31 | 2009-12-09 | 中国资源卫星应用中心 | A kind of system and method to rebuilding spectrum of high spectrum intervention data |
-
2015
- 2015-03-30 CN CN201510146081.0A patent/CN104766281B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1858253A1 (en) * | 2006-05-16 | 2007-11-21 | Sony Corporation | Image correction circuit, image correction method and image display |
| CN101598798A (en) * | 2008-12-31 | 2009-12-09 | 中国资源卫星应用中心 | A kind of system and method to rebuilding spectrum of high spectrum intervention data |
Non-Patent Citations (4)
| Title |
|---|
| 《一种新的过零单边干涉图切趾加权函数》;张鹏等;《光子学报》;20120731;第41卷(第7期);全文 * |
| 《单边干涉图的数据处理方法研究》;相里斌等;《光子学报》;20061231;第35卷(第12期);全文 * |
| 《基于CUDA的干涉型高光谱实时光谱复原处理技术》;杨仁忠等;《遥感技术与应用》;20110831;第26卷(第4期);全文 * |
| 《干涉图采样和数据处理的仿真研究》;吴娜等;《微计算机信息》;20081031;第24卷(第4-1期);全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104766281A (en) | 2015-07-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US9185382B2 (en) | Stereo image processor and stereo image processing method | |
| Bhattacharya et al. | Stereo-particle image velocimetry uncertainty quantification | |
| Guo et al. | De-noising of digital image correlation based on stationary wavelet transform | |
| Wang et al. | Improved scheme of estimating motion blur parameters for image restoration | |
| CN104537646B (en) | The automatic MTF methods of estimation of multi-angle of remote sensing images | |
| CN102779333B (en) | Optical image restoration method based on Kalman filter | |
| CN105550694B (en) | Method for measuring fuzzy degree of face image | |
| JPWO2012001982A1 (en) | Stereo image processing apparatus and stereo image processing method | |
| KR20110049383A (en) | Image processing apparatus and method | |
| Jeong et al. | Frame-based Poisson image restoration using a proximal linearized alternating direction method | |
| CN105225243B (en) | One kind can antimierophonic method for detecting image edge | |
| Zhu et al. | Spectral semi-blind deconvolution methods based on modified φHS regularizations | |
| Zhang et al. | A destriping algorithm based on TV-Stokes and unidirectional total variation model | |
| CN104766281B (en) | The bearing calibration of uneven DC component in a kind of interference image | |
| CN100563295C (en) | A kind of image magnification method based on estimation error in the linear interpolation arithmetic | |
| CN102768756A (en) | Universal recovery method for target detection multi-spectrum images | |
| CN106296591A (en) | Non local uniform numeral image de-noising method based on mahalanobis distance | |
| Zhu et al. | Spectral restoration using semi-blind deconvolution method with detail-preserving regularization | |
| CN108537810B (en) | Improved Zernike moment sub-pixel edge detection method | |
| CN104504700B (en) | A kind of method and system for obtaining image sensor noise level curve | |
| CN104463800B (en) | A kind of gradation of image Enhancement Method | |
| Djafer et al. | Identification of sunspots on full-disk solar images using wavelet analysis | |
| Gong et al. | Linear approximation of mean curvature | |
| CN103679648A (en) | Moment matching satellite image stripe noise removing method based on spatial segmentation | |
| Jin et al. | An evaluation method based on absolute difference to validate the performance of SBNUC algorithms |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| EXSB | Decision made by sipo to initiate substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |