CN104729556B - sensor calibration device and method - Google Patents

sensor calibration device and method Download PDF

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Publication number
CN104729556B
CN104729556B CN201310722409.XA CN201310722409A CN104729556B CN 104729556 B CN104729556 B CN 104729556B CN 201310722409 A CN201310722409 A CN 201310722409A CN 104729556 B CN104729556 B CN 104729556B
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sensor
calibration
value
calibration value
sensors
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CN104729556A (en
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张波
蒋登峰
邓登峰
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Hangzhou Silan Microelectronics Co Ltd
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Hangzhou Silan Microelectronics Co Ltd
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Abstract

The invention provides a sensor calibration device and method. The device comprises an I2C interface connected to a sensor through an I2C signal line, and a calibration module in communication with the sensor through the I2C interface. The calibration module comprises a calibration kernel which can provide a calibration value for the sensor to calibrate the output of the sensor, an initial value register which is used for storing an initialized calibration value which is written into the sensor as the calibration value by the calibration kernel through the I2C interface, a target value register which is used for storing an expected output value of the sensor, and a tolerance register which is used for storing a tolerance value, wherein the calibration kernel reads the output value which is calibrated by the sensor based on the calibration value and judges whether the difference between the output value and the expected output value is within the tolerance value or not, the calibration of the sensor is completed if the difference between the output value and the expected output value is within the tolerance value, and otherwise the calibration value is modified and the new calibration value is written into the sensor till the difference between the output value and the expected output value is within the tolerance value.

Description

Calibrating device for sensors and method
Technical field
The present invention relates to the apparatus and method of a kind of calibrating installation and method, more particularly, to calibration sensor.
Background technology
In various fields, sensor is widely used in sensing various parameters, such as speed, acceleration, rotation, displacement, shape Change, pressure, temperature, gas, humidity etc., and various sensors are correspondingly there will be, for example, rate sensor, acceleration Degree meter, gyroscope, displacement transducer, changing sensor, pressure transducer, temperature sensor, gas sensor, humidity sensor Deng.Because the measurement result of sensor output is important processing parameter, it is desirable to the measurement result of sensor output reaches Designed and required pinpoint accuracy.However, sensor due to reasons such as foozles or is being used in process of production During due to the reason such as aging may cause sensor sensing export it is not accurate enough.For example, MEMS(MEMS)Pass Sensor is experienced in process of production after the steps such as flow, encapsulation, test, and its output is devious.
Therefore, in order to ensure the degree of accuracy of sensor, sensor after finalization of the manufacture or in use for some time may be used To be calibrated.For example, can in the sensor add some calibration registers, by changing these depositors biography can be calibrated Sensor is exported so that sensor output is more accurate.Accurate calibration purpose is reached, the series of calibration register is The more the better, By taking the mems accelerometer that output accuracy is 8 as an example, the calibration register of 8, i.e., equivalent calibration level are at least needed Number is necessary for 28 grades(I.e. 256 grades).Calibration series is more, and the calibration operation time of single MEMS sensor will be longer, therefore Calibration steps is one of key factor of impact MEMS sensor cost.Now industry is mostly using special calibrator (-ter) unit come same When calibrate multiple MEMS sensors, so as to improve calibration efficiency, reduce calibration cost.General MEMS sensor is connect using I2C Mouthful, each I2C interface uses two signal lines, and to calibrate 20 MEMS sensors simultaneously, then calibrator (-ter) unit needs 40 Holding wire.In addition, while calibration MEMS sensor number it is more, other resources required for calibrator (-ter) unit are also more, than Real parallel calibration purpose is such as reached, for the data obtained by MEMS sensor of sampling parallel calculating must also be possessed Being processed, the price of whole calibrator (-ter) unit will correspondingly be doubled and redoubled processing unit.
In order to meet the low price to sensor, the demand of high precision output, industry can efficiently school in the urgent need to one kind The apparatus and method of quasi- sensor.
The content of the invention
The technical problem to be solved in the present invention is to provide a kind of apparatus and method of calibration sensor.For existing sensor Calibration system complex structure, efficiency is too low and the shortcomings of selling at exorbitant prices, the invention provides a kind of efficiently calibration sensor Apparatus and method.In addition, present invention also offers being based on FPGA(Field programmable gate array)Calibrating installation and method, the school Standard apparatus and method can simultaneously calibrate multiple sensors, so as to shorten single sensing using the parallel processing advantage of FPGA The prover time of device, improves test production efficiency.
In one embodiment, there is provided a kind of calibrating device for sensors, including:I2C interfaces, it is via I2C holding wires It is connected to sensor;And calibration module, it is coupled to the I2C interfaces and leads to the sensor via the I2C interfaces Letter, the calibration module includes:Calibration kernel, it can provide calibration value to calibrate via the I2C interfaces to the sensor The output of the sensor;The initialization of calibration value is simultaneously supplied to institute by initial value register, its storing initial calibration value Calibration kernel is stated, the calibration kernel writes the biography via the I2C interfaces using the initialization of calibration value as calibration value Sensor;Target value register, the desired output of its storage sensor;And tolerance depositor, its storage tolerance, its Described in calibrate kernel and read output valve after the sensor is calibrated based on the calibration value, and judge the sensing Whether the difference of the output valve of device and the desired output is successful if within the tolerance within the tolerance Complete the calibration to the sensor, if not within the tolerance if change the calibration value and write new calibration value Enter the sensor, until the difference of the output valve of the sensor and desired output is within the tolerance.
In another embodiment, the calibration module also includes:Stepping value register, its described calibration value of storage is passed every time The step value of increasing, the calibration kernel adds up the calibration value with the step value to obtain new calibration value.
In another embodiment, the calibration module also includes:Maximum value register, its described sensor of storage to be reached The maximum calibration value for arriving, if wherein the new calibration value is not above the maximum calibration value, the calibration module will be described New calibration value writes the sensor, otherwise terminates the calibration to the sensor and the calibration is invalid.
In another embodiment, the calibration module also includes:Waiting time depositor, its storage time count value, its Described in calibrate kernel the time counting value is waited after calibration value to be write the sensor, the biography is then read again Sensor is based on the output valve after the calibration value is calibrated.
In another embodiment, the sensor includes calibration register to store the calibration write by the calibration module Value, and the sensor changed based on the calibration value it is actually detected to value to provide calibrated output.
In another embodiment, the initialization of calibration value be negative value and the step value be on the occasion of;Or it is described initial Change calibration value be on the occasion of and the step value is negative value.
In another embodiment, the I2C interfaces include:Read write command depositor, it receives and stores from the school Quasi-mode block reads or writes order;Adjustment depositor, it receives and stores the calibration value from the calibration module;In I2C interfaces Core, its write order in the read write command depositor via the I2C holding wires by it is described adjustment depositor in school The quasi- value write sensor.
In another embodiment, the I2C interfaces also include:Output register, wherein the I2C interfaces kernel is according to institute The read command stated in read write command depositor carries out school via the I2C holding wires reading sensor based on the calibration value Output valve after standard is simultaneously stored it in the output register, and the output valve is supplied to institute by the output register State calibration kernel.
In another embodiment, the sensor is MEMS sensor.
In another embodiment, the sensor includes rate sensor, accelerometer, gyroscope, displacement transducer, shape Become sensor, pressure transducer, temperature sensor, gas sensor or humidity sensor.
In another embodiment, the calibrating device for sensors is to be based on the calibrating device for sensors of FPGA and including many The individual I2C interfaces and the calibration module, to calibrate multiple sensors simultaneously.
Additionally provide a kind of sensor calibrating method, it is characterised in that include:Step one:Calibration value is write into sensor; Step 2:Read the output valve after the sensor is calibrated based on the calibration value;Step 3:Judge the sensor Output valve and desired output difference whether within tolerance, successfully complete to described if within the tolerance The calibration of sensor, if not within the tolerance if change the calibration value and repeating said steps one and arrive step 3.
In another embodiment, calibration value write sensor is included in the step one:By the write of initialization of calibration value The sensor.
In another embodiment, the calibration value is changed in the step 3 includes:By the calibration value and predetermined step Enter value cumulative to obtain new calibration value.
In another embodiment, the calibration value is changed in the step 3 to further include:Judge the new calibration Whether value exceedes the sensor maximum calibration value to be reached, if the new calibration value is not above the maximum calibration Then repeating said steps one arrive step 3 to value;Otherwise terminate the calibration to the sensor and the calibration is invalid.
In another embodiment, the output valve of the sensor is read in the step 2 to be included:Calibration value is being write The scheduled time counting value such as after the sensor, is then read again the sensor and is calibrated based on the calibration value Output valve afterwards.
In another embodiment, the sensor includes calibration register to store the calibration value, and the sensing Device changed based on the calibration value it is actually detected to value to provide calibrated output.
In another embodiment, the initialization of calibration value be negative value and the step value be on the occasion of;Or it is described initial Change calibration value be on the occasion of and the step value is negative value.
In another embodiment, the sensor is MEMS sensor.
In another embodiment, the sensor includes rate sensor, accelerometer, gyroscope, displacement transducer, shape Become sensor, pressure transducer, temperature sensor, gas sensor or humidity sensor.
Compared with prior art, the present invention has advantages below:
By from initialization of calibration value by step value change calibration value come calibration sensor, can efficiently and rapidly by The output adjustment of sensor is to reach predetermined degree of accuracy(Can allow in tolerance).In addition, sensor of the invention calibrating installation Can be realized using FPGA, FPGA inside includes multiple parallel calibration modules simultaneously to carry out at calibration multiple sensors All the sensors are concurrently carried out the purpose of separate calibrations process by reason so as to reach, and significantly improve the efficiency of calibration.
Description of the drawings
Fig. 1 is the schematic block diagram of the calibrating device for sensors of one embodiment of the invention.
Fig. 2 is the connection diagram of the calibrating device for sensors of one embodiment of the invention.
Fig. 3 is the workflow diagram of the sensor calibrating method of one embodiment of the invention.
Specific embodiment
In order that technical scheme, objects and advantages are clearer, with reference to specific embodiments and the drawings pair The present invention is described further, but should not be limited the scope of the invention with this.
Fig. 1 is the schematic block diagram of the calibrating device for sensors 10 of one embodiment of the invention.As illustrated, pick up calibration dress Putting 10 includes N number of I2C(Between integrated circuit)1~N of interface(Unification is labeled as 12)And corresponding N number of 1~N of calibration module(System One is labeled as 14), wherein N is positive integer.This N number of I2C interface 12 can be connected to N number of calibration by I2C holding wires respectively 1~N of sensor(Unification is labeled as 11), so as to calibrating device for sensors 10 can simultaneously calibrate this N number of sensor 11.I2C signals Line is twin wire universal serial bus, therefore every I2C holding wire uses 11 respective two IO of I2C interfaces 12 and sensor(Input Output)Pin.In this case, the value of N can be the half of the available I/O pin quantity that calibrating device for sensors 10 possesses.This Art personnel it will be appreciated that the sensor 11 of actual measurement can be less than it is N number of.According to one embodiment of present invention In, calibrating device for sensors 10 can adopt FPGA(Field programmable gate array)To realize.Due to FPGA I/O pin very It is many, can be many sensor parallels to FPGA, by taking a FPGA for possessing 282 I/O pins as an example, can be by up to 141 Sensor is all connected in parallel on FPGA.In addition, the parallel processing advantage possessed using FPGA, can greatly improve the effect of calibration Rate, it is also very simple in structure, and overall price is very cheap.In other embodiments, calibrating device for sensors 10 can also Realized using other hardware or software architecture.In one embodiment, sensor 11 can be MEMS(MEMS)Pass Sensor.In addition, sensor 11 can be rate sensor, accelerometer, gyroscope, displacement transducer, changing sensor, pressure What sensor, temperature sensor, gas sensor or humidity sensor etc., or known in the art or future developed Any sensor.
Fig. 2 is the connection diagram of the calibrating device for sensors 10 of one embodiment of the invention.For the sake of simplicity, in Fig. 2 only The calibration module 14 and an I2C interface 12 in calibrating device for sensors 10 is shown, but calibrating device for sensors 10 can Include N number of calibration module 14 and N number of I2C interfaces 12 as illustrated in fig. 1, wherein each calibration module 14 and I2C interface 12 has There is configuration as shown in Figure 2.The sensor 11 to be calibrated includes calibration register 112, the wherein final detection of sensor 11 Output be sensor 11 it is actually detected to value carry out being obtained after predetermined operation based on the calibration value in calibration register 112 Calibrated value, the wherein predetermined operation can be designed differently, such as linear plus and minus calculation, proportional zoom or other more Complicated algorithm, the invention is not restricted to this.During the calibration register 112 of sensor 11 is changed using calibrating device for sensors 10 Calibration value be just capable of the output of calibration sensor 11 so that the output of sensor 11 is more accurate.
As illustrated, sensor 11 is connected to the I2C interfaces 12 in calibrating device for sensors 10 via I2C holding wires, should I2C interfaces 12 are coupled to calibration module 14, so as to calibration module 14 can communicate via I2C interfaces 12 with sensor 11.Calibrating die Block 14 includes calibration kernel 142, and calibration kernel 142 is used to perform calibration process, and can be via I2C interfaces 12 to sensor 11 Calibration register 112 write calibration value, so as to the output of calibration sensor 11.
In one embodiment, I2C interfaces 12 include I2C interfaces kernel 122, read write command depositor 124, adjustment deposit Device 126 and output register 128, and these depositors are all connected with I2C interfaces kernel 122, wherein read write command deposit Device 124 is received and stored and carrys out reading or writing order and delivering this to I2C interfaces kernel 122 for self calibration kernel 142, to control I2C interfaces kernel 122 carries out read or write to sensor 11.Adjustment depositor 126 is received and stored from calibration module 14 Calibration value, output register 128 be used for storage sensor 11 calibrated based on calibration value after output valve.For example, when When calibration kernel 142 sends write order, calibration value is conveyed to adjustment depositor 126 by it simultaneously, then I2C interfaces kernel 122 the value in adjustment depositor 126 is write the calibration register 112 in sensor 11 by I2C holding wires.When calibration kernel 142 when send read command, and I2C interfaces kernel 122 is read sensor 11 and carried out based on the calibration value via I2C holding wires Output valve after calibration, and store it in output register 128, output register 128 is subsequently by the defeated of sensor 11 Go out value and pass to calibration kernel 142.
In one embodiment, calibration module 14 also includes multiple depositors 143~148, and these depositors 143~ 148 are all connected with calibration kernel 142, so as to be conveyed to register value in calibration in the operating process of calibration kernel 142 Core 142.For example, this multiple depositor 143~148 includes that target value register 143, tolerance depositor 144, waiting time are deposited Device 145, initial value register 146, maximum value register 147, stepping value register 148 etc..Specifically, initial value register 146 storages are applied to the initialization of calibration value of the calibration register 112 in sensor 11;The storage sensing of target value register 143 The desired output of device 11;Tolerance depositor 144 stores tolerance, represents the real output value and desired output of sensor 11 Difference(For example, absolute value)Can allowable error;The storage time count value of waiting time depositor 145, its alignment kernel 142 The time counting value is may wait for after calibration value is write into sensor 11, sensor 11 is then read again and is entered based on the calibration value Output valve after row calibration;The maximum to be reached of calibration register 112 in the storage sensor 11 of maximum value register 147 Calibration value;The storage calibration value of stepping value register 148 step value incremental every time, calibration kernel 142 can be by a upper calibration value With the cumulative calibration value new with acquisition of step value.The calibration operation of calibrating device for sensors 10 is described below in conjunction with Fig. 3.
Fig. 3 is the workflow diagram of the sensor calibrating method of one embodiment of the invention, and it can for example by shown in Fig. 2 Calibrating device for sensors 10 performing.With reference to Fig. 1 and 2, the function of each calibration module 14 can be consistent, each calibration The workflow that calibration kernel 142 inside module 14 is calibrated is also consistent, here only referring to one of calibrating die Block 14 and I2C interfaces 12 are being operated flow process description.
In step 302, upper electricity simultaneously enters init state.For example, electricity and entrance initialization on calibrating device for sensors 10 State.
In step 304, calibration value is write into sensor.For example, after power-up initializing, calibration kernel 142 is entered to be write Calibration register state, its alignment kernel 142 reads the initialization of calibration value in initial value register 146, and gives I2C interfaces 12 write orders, while initialization of calibration value is write the adjustment depositor 126 of I2C interfaces 12 as calibration value, then by I2C The calibration value adjusted in depositor 126 is write interface kernel 122 calibration register in sensor 11 by I2C holding wires 112。
In optional step 306, into waiting state.For example, after calibration value to be write sensor 11, in calibration Core 142 is into waiting state and is counted, when count value is not up to the count value of waiting time depositor 145, in calibration Core 142 is constantly in waiting state;After the count value of waiting time depositor 145 is reached, the method flow process proceeds to step 308。
In step 308, the output valve after sensor is calibrated based on calibration value is read.For example, calibrate kernel 142 to enter Enter to read output state and to 12 read commands of I2C interfaces, at this moment I2C interfaces kernel 122 is the sensing read from I2C holding wires The output valve of device 11 sends calibration kernel 142 to via output register 128.
In step 310, judge sensor output valve and desired output difference whether within tolerance.For example, school The desired output stored in the output valve of sensor 11 and target value register 143 is subtracted each other to obtain difference by quasi- kernel 142 (For example, it is also possible to take absolute value), then judge this difference(Or absolute value)The appearance for whether storing in tolerance depositor 144 Within difference.If the difference is within tolerance, the method flow process proceeds to step 312;Otherwise proceed to step 316.
In optional step 312, the current calibration value of fixation.For example, if the output valve of sensor 11 is defeated with expectation Go out the difference of value within tolerance, show that current calibration value has carried out accurate calibration to sensor 11, then calibrate kernel 142 to I2C interfaces 12 send the order of solidification calibration register value, by newest write-once to the calibration register 112 in sensor 11 Current calibration value solidification get up, so that the calibration value of its calibration register 112 after the power down of sensor 11 is not lost.In other realities In applying example, calibration register 112 can be nonvolatile memory, so as to also can without the need for the step of solidification calibration value 312 (For example, after a power failure)Keep current calibration value.
In optional step 312, it is determined that calibrating successfully, represent calibration module 14 successfully by the output valve of sensor 11 Acceptable degree is calibrated to, the method flow process terminates in step 322.
Step 310 is returned to, if the difference of the output valve of sensor and desired output is not in tolerance, into step 316.In step 316, calibration value is changed.For example, calibrate kernel 142 and the calibration value of last write sensor 11 is added into stepping The step value stored in value register 148 is forming new calibration value.
In step 318, judge whether new calibration value exceedes the sensor maximum calibration value to be reached.For example, calibrate Kernel 142 is compared new calibration value with the maximum calibration value of storage in maximum value register 147, if new calibration value More than maximum calibration value, then the method flow process is into step 320;Otherwise it is circulated back to step 304.
In step 320, it is determined that calibration is invalid, and the method flow process terminates in step 322.For example, if new calibration Value exceedes maximum calibration value, represents that the output valve of sensor 11 can not be calibrated to acceptable degree by calibration kernel 142, then really Surely the calibration operation that calibrating kernel 142 is carried out fails and terminates.
On the other hand, if new calibration value is less than maximum calibration value, the method is circulated back to step 304, by this New calibration value write sensor, and repeat the flow process, until calibrating successfully(Step 314)Or calibrate invalid(Step 320).
As described above, by reinstating step value from initialization of calibration value calibration value is changed come calibration sensor 11, can be by The output adjustment of sensor 11 is to reach predetermined degree of accuracy(Can allow in tolerance).It will be understood by those skilled in the art that can Reasonably to arrange the size of initialization of calibration value and step value so that calibration process as above is efficiently realized.For example, Initialization of calibration value can be negative value(For example, the sensor minimum calibration value to be reached)And step value is on the occasion of so as to school Quasi- value gradually increases;Or initialization of calibration value can be on the occasion of(For example, the sensor maximum calibration value to be reached)And walk It is negative value to enter value, so as to calibration value gradually increases.If initialization of calibration value be on the occasion of and step value is negative value, maximum is posted Storage 147 can be in storage sensor 11 the minimum calibration value to be reached of calibration register 112(Or absolute value).This area skill Art personnel are it will be appreciated that initialization of calibration value and step value can also be arranged by other reasonable manners.
In addition, calibrating device for sensors 10 can be realized using FPGA.FPGA each calibration module of inside is by above-mentioned Description to carry out calibration process to multiple sensors 11 simultaneously, and parallel separate calibrations are carried out to all the sensors 11 so as to reach The purpose of process, improves the efficiency of calibration.
Embodiments of the invention are described above in conjunction with accompanying drawing, but be the invention is not limited in above-mentioned concrete Embodiment, above-mentioned specific embodiment is only schematic, rather than restricted, one of ordinary skill in the art The present invention enlightenment under, the present invention can be carried out it is various change and modification without departing from the spirit and scope of the present invention, this A little change is belonged within protection scope of the present invention with modification and its equivalent technologies.

Claims (20)

1. a kind of calibrating device for sensors, it is characterised in that include:
I2C interfaces, it is connected to sensor via I2C holding wires;And
Calibration module, it is coupled to the I2C interfaces and communicates with the sensor via the I2C interfaces, the calibrating die Block includes:
Calibration kernel, it can provide calibration value to calibrate the output of the sensor via the I2C interfaces to the sensor;
The initialization of calibration value is simultaneously supplied to the calibration kernel, institute by initial value register, its storing initial calibration value State calibration kernel and write the sensor using the initialization of calibration value as calibration value via the I2C interfaces;
Target value register, the desired output of its storage sensor;And
Tolerance depositor, its storage tolerance, wherein the calibration kernel is read the sensor and carried out based on the calibration value Output valve after calibration, and judge the sensor output valve and the desired output difference whether in the tolerance Within, the calibration to the sensor is successfully completed if within the tolerance, if not within the tolerance Then change the calibration value and new calibration value is write into the sensor, until the output valve and desired output of the sensor The difference of value is within the tolerance.
2. calibrating device for sensors as claimed in claim 1, it is characterised in that the calibration module also includes:
Stepping value register, its described calibration value of storage step value incremental every time, the calibration kernel by the calibration value with The cumulative calibration value new with acquisition of the step value.
3. calibrating device for sensors as claimed in claim 2, it is characterised in that the calibration module also includes:
Maximum value register, its described sensor maximum calibration value to be reached of storage, if wherein the new calibration value does not have The maximum calibration value is had more than, the new calibration value is write the sensor, otherwise terminated to institute by the calibration module State the calibration of sensor and the calibration is invalid.
4. calibrating device for sensors as claimed in claim 1, it is characterised in that the calibration module also includes:
Waiting time depositor, its storage time count value, wherein calibration value is being write the sensor by the calibration kernel The time counting value is waited afterwards, and the output after the sensor is calibrated based on the calibration value is then read again Value.
5. calibrating device for sensors as claimed in claim 1, it is characterised in that the sensor includes calibration register to deposit The calibration value that storage is write by the calibration module, and the sensor changes the actually detected value for arriving based on the calibration value To provide calibrated output.
6. calibrating device for sensors as claimed in claim 2, it is characterised in that:
The initialization of calibration value be negative value and the step value be on the occasion of;Or
The initialization of calibration value be on the occasion of and the step value is negative value.
7. calibrating device for sensors as claimed in claim 1, it is characterised in that the I2C interfaces include:
Read write command depositor, it receives and stores and reads or writes order from the calibration module;
Adjustment depositor, it receives and stores the calibration value from the calibration module;
I2C interface kernels, its write order in the read write command depositor is via the I2C holding wires by the adjustment Calibration value in depositor writes the sensor.
8. calibrating device for sensors as claimed in claim 7, it is characterised in that the I2C interfaces also include:
Output register, wherein read command of the I2C interfaces kernel in the read write command depositor is via the I2C Holding wire reads the output valve after the sensor is calibrated based on the calibration value and stores it in the output and posts In storage, the output valve is supplied to the calibration kernel by the output register.
9. the calibrating device for sensors as any one of claim 1-8, it is characterised in that the sensor is that MEMS is passed Sensor.
10. the calibrating device for sensors as any one of claim 1-8, it is characterised in that the sensor includes speed Rate sensor, accelerometer, gyroscope, displacement transducer, changing sensor, pressure transducer, temperature sensor, gas sensing Device or humidity sensor.
11. calibrating device for sensors as any one of claim 1-8, it is characterised in that the pick up calibration dress It is to be based on the calibrating device for sensors of FPGA and including multiple I2C interfaces and the calibration module to put, to calibrate simultaneously Multiple sensors.
12. a kind of sensor calibrating methods, it is characterised in that include:
Step one:Calibration value is write into sensor;
Step 2:Read the output valve after the sensor is calibrated based on the calibration value;
Step 3:Judge the sensor output valve and desired output difference whether within tolerance, if described The calibration to the sensor is then successfully completed within tolerance, if not within the tolerance if change the calibration value And repeating said steps one arrive step 3.
13. sensor calibrating methods as claimed in claim 12, it is characterised in that pass calibration value write in the step one Sensor includes:
Initialization of calibration value is write into the sensor.
14. sensor calibrating methods as claimed in claim 13, it is characterised in that the calibration value is changed in the step 3 Including:
The calibration value is added up with predetermined step value to obtain new calibration value.
15. sensor calibrating methods as claimed in claim 14, it is characterised in that the calibration value is changed in the step 3 Further include:
Judge whether the new calibration value exceedes the sensor maximum calibration value to be reached, if the new calibration value Then repeating said steps one arrive step 3 to be not above the maximum calibration value;Otherwise terminate the calibration to the sensor and The calibration is invalid.
16. sensor calibrating methods as claimed in claim 12, it is characterised in that the sensor is read in the step 2 Output valve include:
The scheduled time counting value such as after calibration value to be write the sensor, then reads again the sensor and is based on The calibration value calibrated after output valve.
17. sensor calibrating methods as claimed in claim 12, it is characterised in that the sensor include calibration register with Store the calibration value, and the sensor changed based on the calibration value it is actually detected to value it is calibrated to provide Output.
18. sensor calibrating methods as claimed in claim 14, it is characterised in that:
The initialization of calibration value be negative value and the step value be on the occasion of;Or
The initialization of calibration value be on the occasion of and the step value is negative value.
19. sensor calibrating methods as any one of claim 12-18, it is characterised in that the sensor is MEMS sensor.
20. sensor calibrating methods as any one of claim 12-18, it is characterised in that the sensor includes Rate sensor, accelerometer, gyroscope, displacement transducer, changing sensor, pressure transducer, temperature sensor, gas are passed Sensor or humidity sensor.
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US20170097181A1 (en) * 2015-10-05 2017-04-06 Dunan Microstaq, Inc. Method and Apparatus For Calibrating And Testing Multiple Superheat Controllers
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DE102018102034A1 (en) * 2018-01-30 2019-08-01 Tdk Electronics Ag A method of testing a plurality of sensor devices, a plate for use in the method, and a sensor component made by the method

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1048931A2 (en) * 1999-04-26 2000-11-02 WABCO GmbH & CO. OHG Evaluation method for an inductive displacement sensor, in particular for a vehicle clutch
CN1333948A (en) * 1998-11-20 2002-01-30 艾利森电话股份有限公司 Method and system for calibrating analog-to-digital conversion
US6556934B2 (en) * 2000-07-27 2003-04-29 Advantest Corporation Timing calibration method and semiconductor device testing apparatus having timing calibration function
CN101594458A (en) * 2008-05-28 2009-12-02 联发科技(美国)股份有限公司 Digital black leveling apparatus and method
CN102062618A (en) * 2009-10-26 2011-05-18 福禄克公司 System and method for calibrating a high resolution data acquisition system with a low resolution digital to analog converter
CN203298898U (en) * 2013-05-30 2013-11-20 上海贝岭股份有限公司 Temperature calibration device for CMOS temperature sensors

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1333948A (en) * 1998-11-20 2002-01-30 艾利森电话股份有限公司 Method and system for calibrating analog-to-digital conversion
EP1048931A2 (en) * 1999-04-26 2000-11-02 WABCO GmbH & CO. OHG Evaluation method for an inductive displacement sensor, in particular for a vehicle clutch
US6556934B2 (en) * 2000-07-27 2003-04-29 Advantest Corporation Timing calibration method and semiconductor device testing apparatus having timing calibration function
CN101594458A (en) * 2008-05-28 2009-12-02 联发科技(美国)股份有限公司 Digital black leveling apparatus and method
CN102062618A (en) * 2009-10-26 2011-05-18 福禄克公司 System and method for calibrating a high resolution data acquisition system with a low resolution digital to analog converter
CN203298898U (en) * 2013-05-30 2013-11-20 上海贝岭股份有限公司 Temperature calibration device for CMOS temperature sensors

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