CN104634456B - Scan-type infrared temperature measurement system deviates the autonomous calibration method of preset monitoring point - Google Patents
Scan-type infrared temperature measurement system deviates the autonomous calibration method of preset monitoring point Download PDFInfo
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- CN104634456B CN104634456B CN201510087102.6A CN201510087102A CN104634456B CN 104634456 B CN104634456 B CN 104634456B CN 201510087102 A CN201510087102 A CN 201510087102A CN 104634456 B CN104634456 B CN 104634456B
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Abstract
The present invention relates to the autonomous calibration method that a kind of scan-type infrared temperature measurement system deviates preset monitoring point, the characteristics of can reflecting target surface key point temperature using infrared point temperature instrument, the minimum range for making scanning head do specified path is moved, and infrared temperature measurement apparatus will measure the temperature of a small range corresponding points near monitoring point.By comparing, the corresponding head displacement point of maximum temperature is determined, head is moved to the point, and reset presetting bit, realize the autonomous calibration for deviateing scan-type infrared temperature measurement system preset monitoring point.This method is not added with other hardware devices, using system Function Extension in itself, realizes monitoring point calibration.Compared with conventional manual calibration, avoid the consuming of manpower and materials, can be much sooner be calibrated to head skew, improves the efficiency and accuracy of calibration, solves the problems, such as that scan-type infrared temperature measurement system deviates preset monitoring point due to the infrared temperature measurement apparatus that head mechanically deform is caused.
Description
Technical field
The present invention relates to a kind of infrared measurement of temperature monitoring point calibration method, more particularly to a kind of scan-type infrared temperature measurement system is inclined
From the autonomous calibration method of preset monitoring point.
Background technology
At present, infrared temperature-test technology is widely applied in power equipment state monitoring.Due to hand-held infrared measurement of temperature equipment,
Labor intensive material resources, and limited by insulation conditions etc., online infrared temperature measurement system has obtained extensive development.Especially
The scan-type infrared temperature measurement system that to be infrared point temperature instrument be combined with scanning head, is monitored by periodically scanning, is expanded
The measurement range of infrared point temperature instrument, makes a point temperature instrument play many effects of point Wen Yi, greatly reduces system cost.So
And, although head has preset bit function, being reset to the position of setting, but position can be still produced by prolonged operating
Deviation.Even if using reset self-check program, still suffering from fixing end mechanical deformation（Such as expand with heat and contract with cold）The short distance displacement for causing.By
In factors such as insulation of electrical installation conditions, infrared point temperature instrument need to be placed in outside safe distance.Even if between head and presetting bit
Only there is short-range skew, but influenceed by measurement distance, its infrared point temperature instrument for carrying enters pupil, will largely
The preset monitoring point of deviation, the accuracy of temperature-measuring results will be affected, and cause the failure of equipment to be difficult to find, increase safety
Hidden danger.
The content of the invention
After scan-type infrared temperature measurement system long-play, the point temperature instrument that head mechanical deformation is caused is inclined
From the problem that preset monitoring point, temperature measurement accuracy decline, it is proposed that a kind of scan-type infrared temperature measurement system deviates preset monitoring point
Autonomous calibration method, the characteristics of can reflect target surface key point temperature using infrared point temperature instrument, do scanning head and refer to
Determine the minimum range movement in path, infrared temperature measurement apparatus will measure the temperature of a small range corresponding points near monitoring point.By than
Compared with, determine the corresponding head displacement point of maximum temperature, head is moved to the point, and presetting bit is reset, realize to scan-type
Infrared temperature measurement system deviates the autonomous calibration of preset monitoring point.
The technical scheme is that：A kind of scan-type infrared temperature measurement system deviates the autonomous calibration side of preset monitoring point
Method, specifically includes following steps：
1）Scan-type infrared temperature measurement system is made up of infrared temperature measurement apparatus and scanning head two parts, scan-type infrared measurement of temperature
System detected by action control module control, and cradle head control module includes action control module, presetting bit module and autonomous
The part of calibration module three, wherein, autonomous calibration module includes calibrating mode selecting module, calibration cycle setup module, temperature ratio
Compared with module, position logging modle and presetting bit reset module；
2）The autonomous calibration cycle of system is set by calibration cycle setup module, is defaulted as scanning system and often runs 10 sweeping
After retouching the cycle, independently calibrated, while setting head by calibrating mode selecting module acts alignment path, to monitoring point certainly
The head path of motion of main calibration is selected；
3）After reaching autonomous calibration cycle, head is reset to presetting bit by presetting bit module, i.e. infrared point temperature instrument enters pupil
The position being aligned with preset monitoring point；
4）Infrared temperature measurement apparatus carry out temperature survey to each the corresponding target of head displacement point in alignment path；
5）Position logging modle is numbered to head transfer point, according to the path of selection, determines the position of head；
6）The temperature value for measuring is compared by temperature comparison module, determines maximum temperature value and its corresponding head
Displacement point is numbered；
7）Presetting bit resets module according to the Position Number information of the corresponding head displacement point of maximum temperature, and head is moved
To the point, the pupil that enters of the infrared point temperature instrument of now head carrying is aligned with target temperature peak, resets cradle head preset positions, and
The point is set to new monitoring point, autonomous calibration is completed once.
The head acts alignment path with head least displacement distance as minimum unit, action control module control head
Based on elemental motion mode, two kinds of alignment paths are set, one kind is one times of head least displacement distance range alignment path, separately
One kind is two times of head least displacement distance range alignment paths.
The beneficial effects of the present invention are：Scan-type infrared temperature measurement system of the present invention deviates the autonomous calibration of preset monitoring point
Method, this method is not added with other hardware devices, using system Function Extension in itself, realizes monitoring point calibration.With it is conventional
Manual calibration compare, it is to avoid the consuming of manpower and materials, can be much sooner be calibrated to head skew, improve calibration
Efficiency and accuracy, solve the infrared temperature measurement apparatus that scan-type infrared temperature measurement system caused due to head mechanically deform and deviate
The problem of preset monitoring point.
Brief description of the drawings
Fig. 1 is scan-type infrared temperature measurement system structured flowchart of the present invention；
Fig. 2 is that scan-type infrared temperature measurement system deviates preset monitoring point schematic diagram；
Fig. 3 is the autonomous calibration flow chart that scan-type infrared temperature measurement system of the present invention deviates preset monitoring point；
Fig. 4 is one times of autonomous alignment path figure of head least displacement distance range of the invention；
Fig. 5 is two times of autonomous alignment path figures of head least displacement distance range of the invention.
Specific embodiment
Scan-type infrared temperature measurement system structured flowchart as shown in Figure 1, described scan-type infrared temperature measurement system is by infrared survey
Warm device 1 and scanning head 2 two parts composition.Cradle head control module 3 is by action control module 4, presetting bit module 5 and autonomous school
Quasi-mode block 6 is constituted.Wherein, autonomous calibration module 6 is by calibrating mode selecting module 7, calibration cycle setup module 8, and temperature compares
Module 9, position logging modle 10, presetting bit resets module 11 and constitutes.
Head after long-play, fixing end mechanical deformation（Such as expand with heat and contract with cold）To cause short between head and presetting bit
Apart from the deviation of low-angle.However, due to factors such as insulation of electrical installation conditions, infrared point temperature instrument need to be placed in safe distance it
Outward, even if head skew is small, influenceed by measurement distance, the infrared point temperature instrument that head is carried enters pupil also by larger journey
The deviation monitoring point of degree, the accuracy of temperature-measuring results will be affected, and cause the failure of equipment to be difficult to find, increase safety hidden
Suffer from.Fig. 2 is that scan-type infrared temperature measurement system deviates preset monitoring point schematic diagram, and the position at figure midpoint 1 represents head fixing end position
Put, point 2 represents the position of monitoring point, point 3 represents the position that head occurs corresponding monitoring point after the short-range skew of low-angle
Put.
A kind of scan-type infrared temperature measurement system deviates the autonomous calibration method of preset monitoring point, will be red using head 2 is scanned
Outer thermometric system reset is to being directed at preset monitoring point（In the presence of the possibility for deviateing）.Scanning head 2 is set to do the most narrow spacing of specified path
From movement, using the corresponding target temperature of each head displacement point in the measuring route of infrared temperature measurement apparatus 1 for scanning the carrying of head 2
The temperature of the point of a small range near degree, i.e. monitoring point.Be compared by target temperature value, determine maximum temperature value and its
Corresponding head displacement point.Scanning head 2 is moved to the point according to the positional information of the point by specified path, and resets preset
Position, using the impact point of infrared temperature measurement apparatus alignment at the point as the monitoring point after calibration, realizes to scan-type infrared measurement of temperature
System deviates the autonomous calibration of preset monitoring point.Fig. 3 is the autonomous calibration that scan-type infrared temperature measurement system deviates preset monitoring point
Flow chart.
Described infrared temperature measurement apparatus 1 are infrared point temperature instrument, and due to the measurement of infrared point temperature instrument is target object certain point
Temperature value, therefore determine monitoring point in order to autonomous, the temperature of monitoring point necessarily be greater than the temperature of other objects of a small range
Degree（Such as power switch cabinet contact etc.）.
Specific aligning step is as follows：
1）After reaching autonomous calibration cycle, using cradle head preset positions module 5, head is reset to presetting bit, i.e. infrared point
Wen Yi enters the position that pupil is aligned with preset monitoring point.（Minor shifts may be had occurred and that）
2）By calibrating mode selecting module 7, the head path of motion to the autonomous calibration in monitoring point is selected.There are two kinds
Path is available, respectively two times of heads as shown in mono- times of autonomous alignment path figure of head least displacement distance range of Fig. 4 and Fig. 5
The autonomous alignment path figure of least displacement distance range.In Fig. 4 and Fig. 5, the distance of arrow represents head least displacement distance, arrow
The direction of head represents the direction of action of head.Two ways can be selected according to different demands, and the path shown in Fig. 5 has more
It is more long the time required to big correcting range, but calibration.It is determined that after autonomous alignment path, head is pressed infrared temperature measurement apparatus 1 are carried
Moved according to specified path shown in Fig. 4 and Fig. 5.Above-mentioned head move mode using action control module 4 provide " on "
Four kinds of head elemental motion modes of D score " left side " " right side ".It should be noted that patent of the present invention is not limited by fixed route, utilize
The autonomous calibration method in infrared measurement of temperature monitoring point of other small path movements of principle of uniformity belongs to the protection of patent of the present invention
Scope.
3）Infrared temperature measurement apparatus 1 carry out temperature survey to each the corresponding target of head displacement point in alignment path.
4）Head transfer point is numbered using position logging modle 10, according to the path of selection, determines the position of head
Put.
5）The temperature value that step 3 is measured is compared by temperature comparison module 9, determines maximum temperature value and its correspondence
Head displacement point numbering.If mobile route shown in selection Fig. 4, the temperature to 9 displacement points is compared；Selection Fig. 5 institutes
Show mobile route, the temperature to 25 displacement points is compared.
6）Presetting bit resets module 11 according to the Position Number information of the corresponding head displacement point of maximum temperature, and head is moved
Move to the point, the pupil that enters of the infrared point temperature instrument of now head carrying is aligned with target temperature peak, resets cradle head preset positions,
And the point is set to new monitoring point.
7）The autonomous calibration cycle of system is set by calibration cycle setup module 8, scanning system is defaulted as and is often run 10
After scan period, independently calibrated, can according to actual needs be changed calibration cycle.
The autonomous calibration that scan-type infrared temperature measurement system deviates preset monitoring point is realized by above step.This method with
Conventional manual calibration is compared, it is to avoid the consuming of manpower and materials, can be much sooner be calibrated to head skew, is improved
The efficiency and accuracy of calibration, solve the infrared temperature measurement apparatus that scan-type infrared temperature measurement system is caused due to head mechanically deform
Deviate the problem of preset monitoring point.
Claims (2)
1. a kind of scan-type infrared temperature measurement system deviates the autonomous calibration method of preset monitoring point, it is characterised in that specifically include
Following steps：
1）Scan-type infrared temperature measurement system is made up of infrared temperature measurement apparatus and scanning head two parts, scan-type infrared temperature measurement system
Detected by action control module control, cradle head control module includes action control module, presetting bit module and autonomous calibration
The part of module three, wherein, autonomous calibration module includes calibrating mode selecting module, and calibration cycle setup module, temperature compares mould
Block, position logging modle and presetting bit reset module；
2）The autonomous calibration cycle of system is set by calibration cycle setup module, scanning system is defaulted as and is often run 10 scanning weeks
After phase, independently calibrated, while setting head by calibrating mode selecting module acts alignment path, to the autonomous school in monitoring point
Accurate head path of motion is selected；
3）After reaching autonomous calibration cycle, presetting bit module by head be reset to presetting bit, i.e. infrared point temperature instrument enter pupil with it is pre-
Put the position of monitoring point alignment；
4）Infrared temperature measurement apparatus carry out temperature survey to each the corresponding target of head displacement point in alignment path；
5）Position logging modle is numbered to head transfer point, according to the path of selection, determines the position of head；
6）The temperature value for measuring is compared by temperature comparison module, determines maximum temperature value and its corresponding head displacement
Point numbering；
7）Presetting bit resets module according to the Position Number information of the corresponding head displacement point of maximum temperature, and head is moved into this
Point, the pupil that enters of the infrared point temperature instrument of now head carrying is aligned with target temperature peak, resets cradle head preset positions, and should
Point is set to new monitoring point, completes once autonomous calibration.
2. scan-type infrared temperature measurement system deviates the autonomous calibration method of preset monitoring point, its feature according to claim 1
It is that the head acts alignment path with head least displacement distance as minimum unit, and head move mode is controlled using action
The head elemental motion mode that molding block is provided, sets two kinds of alignment paths, and one kind is one times of head least displacement distance range
Alignment path, another kind is two times of head least displacement distance range alignment paths.
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1847822A1 (en) * | 2006-04-20 | 2007-10-24 | IQ Group SDN BHD | A passive infrared detector with internal masking means |
| CN102567983A (en) * | 2010-12-26 | 2012-07-11 | 浙江大立科技股份有限公司 | Determining method for positions of monitored targets in instant infrared chart and application |
| CN102706457A (en) * | 2012-05-24 | 2012-10-03 | 上海电力学院 | Infrared temperature measuring device based on ultrasound ranging temperature compensation |
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| US7862188B2 (en) * | 2005-07-01 | 2011-01-04 | Flir Systems, Inc. | Image detection improvement via compensatory high frequency motions of an undedicated mirror |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1847822A1 (en) * | 2006-04-20 | 2007-10-24 | IQ Group SDN BHD | A passive infrared detector with internal masking means |
| CN102567983A (en) * | 2010-12-26 | 2012-07-11 | 浙江大立科技股份有限公司 | Determining method for positions of monitored targets in instant infrared chart and application |
| CN102706457A (en) * | 2012-05-24 | 2012-10-03 | 上海电力学院 | Infrared temperature measuring device based on ultrasound ranging temperature compensation |
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