CN104614682B - A kind of cell degradation tester and cell degradation test method - Google Patents
A kind of cell degradation tester and cell degradation test method Download PDFInfo
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- CN104614682B CN104614682B CN201510057772.3A CN201510057772A CN104614682B CN 104614682 B CN104614682 B CN 104614682B CN 201510057772 A CN201510057772 A CN 201510057772A CN 104614682 B CN104614682 B CN 104614682B
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Abstract
The present invention relates to a kind of cell degradation tester and test method, which includes by the independently-powered CPU of independent adapter and the LCD display circuit being connect with the CPU, key circuit, DEBUG serial ports/USB debug circuits, LED indicating circuit and 12 road charge-discharge circuits being made of MP2615 chips；The 12 road charge-discharge circuits, one 9V adapters power supply of every four routing, the output end of 12 road charge-discharge circuits of Qie Gai are respectively connected with cement resistor load discharge.The present invention can realize that one piece of mainboard can drive 12 pieces of batteries to be carried out at the same time aging, and 12 belong to independent operating, have no effect on any operation between each other, greatly improve production efficiency.
Description
Technical field
The present invention relates to battery detecting technical field, especially a kind of cell degradation tester and cell degradation test side
Method can be used for the tooling of quick aging battery and the bad battery of screening.
Background technology
With being widely used for the products such as digital product such as mobile phone, laptop, lithium ion battery is with excellent performance
It is used widely in this kind of product, and is gradually developing to other product applications, lithium ion battery has become
Mainstream.The battery for the numerous species being full of in the market, because battery manufacturer qualification is different, the battery quality of production be also the good and the bad not
Together.So there is an urgent need to whether a kind of equipment detection battery is qualified.Cell degradation equipment currently on the market is to be directed to
Large-sized battery factory uses, and every cell degradation equipment volume is huge and expensive, high to the demand of specialty of operating personnel, behaviour
The left-hand seat time needs for making personnel are long, directly affect production efficiency.Therefore the cell degradation tester of the present invention and survey
Method for testing can be improved these disadvantages.
Invention content
The object of the present invention is to provide a kind of cell degradation tester, it can realize that one piece of mainboard can drive 12 pieces of batteries same
Shi Jinhang agings, and 12 belong to independent operating, have no effect on any operation between each other, greatly improve production efficiency.
The present invention is realized using following scheme：A kind of cell degradation tester, it is characterised in that：It is shown including CPU, LCD
Circuit, key circuit, DEBUG serial ports/USB debug circuits, LED indicating circuit and 12 tunnel charge and discharges being made of MP2615 chips
Circuit, the CPU is independently-powered by independent adapter, the LCD display circuit, key circuit, DEBUG serial ports/USB debugging
Circuit, LED indicating circuit and 12 road charge-discharge circuits are connect with the CPU respectively；The 12 road charge-discharge circuits every four
One 9V adapters power supply of routing, the output end of 12 road charge-discharge circuits of Qie Gai are respectively connected with cement resistor load discharge.
In an embodiment of the present invention, the CPU is also associated with reserved charging circuit, No. 12 charging circuits
Charging current is equal 0.5A, and the charging current of the reserved charging circuit is 1A.
In an embodiment of the present invention, the charging circuit of the charge-discharge circuit includes a MP2615 chips, described
The ends EN of MP2615 chips are connect with the CPU, and the SW output ends of the MP2615 chips are sequentially connected inductance L1, resistance R1
It is connect respectively with the anode of the input terminal of the discharge circuit of the charge-discharge circuit and mesuring battary afterwards.BST input terminals receive SW
The output end signal through resistance R15, capacitance C5 successively, is adjusted output waveform.The ends CSP and BATT are separately connected resistance R1 two
Cell voltage is detected at end.
In an embodiment of the present invention, the discharge circuit includes a metal-oxide-semiconductor and a triode, the metal-oxide-semiconductor
Grid is connect with the input terminal of source electrode and the discharge circuit respectively through resistance R10；The collector of the triode with it is described
Grid connects；The emitter of the triode is grounded, and base stage is connect with one end of one end of resistance R11, resistance R12 respectively；Institute
The other end for stating resistance R11 is connect with the one end capacitance C10 and the CPU respectively；The other end, the capacitance C10 of the resistance R12
The other end be grounded；The drain electrode of the metal-oxide-semiconductor is connect and with the cathode of a diode D6 as discharge end；The diode D6
Plus earth.
In an embodiment of the present invention, the charge-discharge circuit is arranged as subplate independently of the CPU.
In an embodiment of the present invention, the mesuring battary is disposed in the battery case of the subplate；The battery case
Including the battery placing groove being set on a subplate, an inner wall of the battery placing groove is provided with electrode contact, the battery
It is provided with battery flexible fastening piece in the lower wall of placing groove, the region setting on the subplate and above battery placing groove
There are indicator light and lead slot.
In an embodiment of the present invention, the battery places trench bottom and offers thermal vias.
Cell degradation test is carried out using above-mentioned cell degradation tester it is a further object of the present invention to provide a kind of
Method, it is characterised in that：Including charging measurement and discharge test, the height of charging circuit EN pin levels control charging and
Electric discharge, when EN pins are in high level, the MP2615 chips stop charging to battery, while the metal-oxide-semiconductor is opened, battery
Start constant-resistance discharge；When EN pins are in low level, the MP2615 chips start to charge to battery, while the MOS is closed
It closes, battery stops electric discharge；The charging measurement includes following judgment mode：
1) when battery charging time-out, the CHGOK pins of the MP2615 chips are in high level, red light is always on, and is judged not
It is qualified；
2) when charging temperature is more than hardware setting temperature, the CHGOK pins of the MP2615 chips are in high level, red light
It is always on, judges unqualified；
The discharge test includes following judgment mode：
1) at the end of discharge time, the voltage value of AD sampling modules and the threshold voltage of setting on mainboard are compared,
If being less than the threshold voltage, red light is always on, judges unqualified.
In an embodiment of the present invention, further include following judgment mode：
1) when battery accesses, when leading to poor contact, the CHGOK pin levels of charging chip will be drawn high, to judge
Poor contact, buzzer can give a warning, and prompt have battery poor contact, battery to will be unable to charge；
2) after accessing battery, if the pin of CHGOK is high level, red light is always on, and is opened charging and is enabled, aging is lost
It loses, alarm module buzzer sounds, misregistration information；
3) after accessing battery, when CHGOK is low level, open that charging is enabled, and into charging flow, green light goes out, red light with
Lower frequency scintillation, timing detect CHGOK signals, judge whether to be full of, CHGOK is in high level, if battery voltage value
Less than 8.3V, then it is determined as unqualified, red light is always on, and opens that charging is enabled, and aging failure, alarm module buzzer sounds, and remembers
Record error message；
4) when CHGOK is in high level, and battery voltage value is more than 8.3V, charge closing is enabled, into high power discharge
Flow；Red light is flickered with upper frequency, discharges into the stipulated time, and whether detection battery voltage value is more than electric discharge threshold values；When electric discharge
Between the less than stipulated time, be determined as off-capacity, battery is unqualified, and red light is always on, and it is enabled to open charging, aging failure, alarm
Module buzzer sounds, misregistration information；
5) upon discharging between when meeting threshold values, it is enabled to open charging, is again full of battery, red light is dodged with lower frequency
Bright, timing detects CHGOK signals, judges whether to be full of, and CHGOK is in high level, if battery voltage value is higher than 8.3V, this sentences
It is set to qualification, aging passes through, and green light is always on, and knocks out red light.
Circuit structure of the present invention is simple, by special chip, can realize 12 pieces of batteries burn-in test simultaneously, and between each other
Influence is not constituted, overcomes the problems such as existing battery detecting time is long, equipment is complicated, and there is preferable practical value.
Description of the drawings
Fig. 1 is hardware principle schematic diagram of the present invention.
Fig. 2 is present invention charging local circuit schematic diagram.
Fig. 3 is present invention electric discharge local circuit schematic diagram.
Fig. 4 is testing process schematic diagram of the present invention.
Fig. 5 is subplate structural schematic diagram of the present invention.
Specific implementation mode
To make the above purposes, features and advantages of the invention more obvious and understandable, below in conjunction with the accompanying drawings to the present invention
Specific implementation mode be described in detail.
Detail is elaborated in the following description in order to fully understand the present invention.But the present invention can with it is a variety of not
Other manner described here is same as to implement, those skilled in the art can do class without violating the connotation of the present invention
Like popularization.Therefore the present invention is not limited by following public specific implementation mode.
As shown in Figure 1, the present embodiment provides a kind of cell degradation testers, it is characterised in that：Electricity is shown including CPU, LCD
Road, key circuit, DEBUG serial ports/USB debug circuits, LED indicating circuit and 12 tunnel charge and discharge being made of MP2615 chips
Circuit, the CPU is independently-powered by independent adapter, the LCD display circuit, key circuit, DEBUG serial ports/USB debugging electricity
Road, LED indicating circuit and 12 road charge-discharge circuits are connect with the CPU respectively；Every four tunnel of 12 road charge-discharge circuits
It is powered by a 9V adapter, the output end of 12 road charge-discharge circuits of Qie Gai is respectively connected with cement resistor load discharge.In this hair
In a bright embodiment, the CPU is also associated with reserved charging circuit, and the charging current of No. 12 charging circuits is equal
The charging current of 0.5A, the reserved charging circuit are 1A.
Fig. 2 is referred to, in an embodiment of the present invention, the charging circuit of the charge-discharge circuit includes a MP2615 cores
The ends EN of piece, the MP2615 chips are connect with the CPU, and the SW output ends of the MP2615 chips are sequentially connected inductance
It is connect respectively with the anode of the input terminal of the discharge circuit of the charge-discharge circuit and mesuring battary after L1, resistance R1.BST is inputted
End receives the SW output ends signal through resistance R15, capacitance C5 successively, and output waveform is adjusted.The ends CSP and BATT are separately connected
Cell voltage is detected at the both ends resistance R1.In figure, the ends LiTemp are used to be connected to the temperature data output end of battery, the conduct of the ends TP1
The anode connection terminal of mesuring battary.
Fig. 3 is referred to, in an embodiment of the present invention, the discharge circuit includes a metal-oxide-semiconductor and a triode, described
The grid of metal-oxide-semiconductor connect respectively with the input terminal of source electrode and the discharge circuit through resistance R10；The current collection of the triode
Pole is connect with the grid；The emitter of the triode is grounded, base stage respectively with one end of resistance R11, one end of resistance R12
Connection；The other end of the resistance R11 is connect with the one end capacitance C10 and the CPU respectively；The other end of the resistance R12,
The other end of capacitance C10 is grounded；The drain electrode of the metal-oxide-semiconductor is connect and with the cathode of a diode D6 as discharge end；It is described
The plus earth of diode D6.
It is noted that charge-discharge circuit of the present invention is arranged as subplate independently of the CPU.Refer to figure
5, the mesuring battary is disposed in the battery case of the subplate 1；The battery case includes the battery being set on a subplate
One inner wall of placing groove 2, the battery placing groove is provided with electrode contact 3, is provided in the lower wall of the battery placing groove
Battery flexible fastening piece, the region on the subplate and above battery placing groove are provided with indicator light and lead slot.
In the present embodiment, which includes a fixed link 5, and Flexible Reset bar 4 is provided in the fixed link 5；The instruction
Lamp includes red light 10 and green light 11, and the lead slot includes two five core slots and a ten core slots, which makees
To be used for testing other kinds of battery incoming end；The ten cores slot is used for the data communication between subplate and mainboard and power supply
Connection.In an embodiment of the present invention, the battery places trench bottom and offers thermal vias 6.
In one embodiment of the invention, a kind of side carrying out cell degradation test using above-mentioned cell degradation tester is provided
Method, it is characterised in that：Including charging measurement and discharge test, the height control of the charging circuit EN pin levels is charged and is put
Electricity, when EN pins are in high level, the MP2615 chips stop charging to battery, while the metal-oxide-semiconductor is opened, and battery is opened
Beginning constant-resistance discharge；When EN pins are in low level, the MP2615 chips start to charge to battery, while the MOS is closed,
Battery stops electric discharge；The charging measurement includes following judgment mode：
1) when battery charging time-out, the CHGOK pins of the MP2615 chips are in high level, red light is always on, and is judged not
It is qualified；
2) when charging temperature is more than hardware setting temperature, the CHGOK pins of the MP2615 chips are in high level, red light
It is always on, judges unqualified；
The discharge test includes following judgment mode：
1) at the end of discharge time, the voltage value of AD sampling modules and the threshold voltage of setting on mainboard are compared,
If being less than the threshold voltage, red light is always on, judges unqualified.
The principle of the invention is charged to lithium battery using charging special chip, in conjunction with battery voltage detection and charging
Flag bit of the mode bit as identification failure controls the ends EN of special chip by CPU and electric discharge MOS puts lithium battery
Electricity and performance detection, and testing result is shown by LED.
The state description of lamp：
Table 1
The present invention judges flow as shown in figure 4, battery is directly put into battery tray, you can starts whole flow process (hardware
And software), overall process can be unattended.
(1) when battery is inserted into, when leading to poor contact, the CHGOK pin levels of charging chip will be drawn high, to judge
Poor contact, buzzer can give a warning, and prompt have battery poor contact, battery to will be unable to charge.
(2) after being inserted into battery, if the pin of CHGOK is that (pull-up, chip interior are high-impedance state shape to high level inside CPU
State) when, red light is always on, and is opened charging and is enabled, and aging failure, alarm module buzzer sounds, misregistration information.
(3) after being inserted into battery, when CHGOK is low level (pull-up, chip interior are open-drain state inside CPU), unlatching is filled
Electricity is enabled, and into charging flow, green light goes out, and red light is detected CHGOK signals, judged whether to fill with lower frequency scintillation, timing
Full, CHGOK be in high level, but battery voltage value is less than 8.3V, then is determined as unqualified, and red light is always on, and opening to charge makes
Can, aging failure, alarm module buzzer sounds, misregistration information.
(4) when CHGOK is in high level, and battery voltage value is more than 8.3V, charge closing is enabled, into high power discharge
Flow.Red light is flickered with upper frequency, discharges into the stipulated time (binodal battery is 1600 seconds at present), and detection battery voltage value is
It is no to be more than electric discharge threshold values (7.14V).Less than 1600 seconds of discharge time, it is determined as off-capacity, battery is unqualified, and red light is always on,
It is enabled to open charging, aging failure, alarm module buzzer sounds, misregistration information.
(5) the distinctive discharge technology of the present invention, is fixed against the flash-over characteristic of battery itself.The electric discharge of each battery is from completely filling
To completely putting, voltage value and corresponding time are recorded, it is according to characteristic song that each battery, which has the characteristic curve of oneself, the present invention,
Line determines that 1600 seconds discharge times, different battery discharge times need to do corresponding change, and one is determined according to discharge curve
A place value is to meet the most basic feature of battery.
(6) upon discharging between when meeting threshold values (1600 seconds), it is enabled to open charging, is again full of battery, red light with compared with
Low frequency flickers, and timing detects CHGOK signals, judges whether to be full of, and CHGOK is in high level, but voltage value is higher than 8.3V,
This is determined as that qualification, aging pass through, and green light is always on, and knocks out red light.
(7) if in charging process, more than 6 hours, (capacitance of C6 and C7, adjusted hardware and fills in hardware design such as Fig. 1
Electric time-out time), still underfill, CHGOK is in high level, and battery voltage value is less than 8.3V, then is determined as unqualified, and red light is normal
It is bright, it opens charging and enables, aging failure, alarm module buzzer sounds, misregistration information.
Although the invention has been described by way of example and in terms of the preferred embodiments, but it is not for limiting the present invention, any this field
Technical staff without departing from the spirit and scope of the present invention, may be by the methods and technical content of the disclosure above to this hair
Bright technical solution makes possible variation and modification, therefore, every content without departing from technical solution of the present invention, and according to the present invention
Technical spirit to any simple modifications, equivalents, and modifications made by above example, belong to technical solution of the present invention
Protection domain.The foregoing is merely presently preferred embodiments of the present invention, all impartial changes done according to scope of the present invention patent
Change and modify, should all belong to the covering scope of the present invention.
Claims (3)
1. a kind of cell degradation tester, it is characterised in that：Including CPU, LCD display circuit, key circuit, DEBUG serial ports/
USB debug circuits, LED indicating circuit and the 12 road charge-discharge circuits being simultaneously operable being made of MP2615 chips, it is described
CPU is independently-powered by independent adapter, and the LCD display circuit, key circuit, DEBUG serial ports/USB debug circuits, LED refer to
Show that circuit and 12 road charge-discharge circuits are connect with the CPU respectively；One 9V of every four routing of the 12 road charge-discharge circuits
Adapter is powered, and the output end of 12 road charge-discharge circuits of Qie Gai is respectively connected with cement resistor load discharge；
The charging circuit of the charge-discharge circuit includes a MP2615 chips, the ends EN of the MP2615 chips and the CPU
Connection, the SW output ends of the MP2615 chips are sequentially connected inductance L1, after resistance R1 respectively with the charge-discharge circuit
The anode connection of the input terminal and mesuring battary of discharge circuit；BST input terminals receive SW output ends successively through resistance R15, capacitance
The signal of C5, is adjusted output waveform；The ends CSP and BATT are separately connected the both ends resistance R1, detect cell voltage；
The discharge circuit includes a metal-oxide-semiconductor and a triode, the grid of the metal-oxide-semiconductor through resistance R10 respectively with source electrode
It is connected with the input terminal of the discharge circuit；The collector of the triode is connect with the grid；The hair of the triode
Emitter grounding, base stage are connect with one end of one end of resistance R11, resistance R12 respectively；The other end of the resistance R11 respectively with
The one end capacitance C10 and CPU connections；The other end of the resistance R12, the other end of capacitance C10 are grounded；The MOS
The drain electrode of pipe is connect and with the cathode of a diode D6 as discharge end；The plus earth of the diode D6；
The charge-discharge circuit is arranged as subplate independently of the CPU；The mesuring battary is disposed on the subplate
In battery case；The battery case includes the battery placing groove being set on a subplate, the inner wall setting of the battery placing groove
There is electrode contact, be provided with battery flexible fastening piece in the lower wall of the battery placing groove, on the subplate and is located at battery
Region above placing groove is provided with indicator light and lead slot；The flexible fastening piece includes a fixed link, the fixation
Flexible Reset bar is provided in bar；The battery places trench bottom and offers thermal vias.
2. cell degradation tester according to claim 1, it is characterised in that：The CPU is also associated with reserved charging
The charging current of circuit, No. 12 charging circuits is 0.5A, and the charging current of the reserved charging circuit is 1A.
3. a kind of method carrying out cell degradation test using cell degradation tester described in claim 1, it is characterised in that：
Including charging measurement and discharge test, the height control of the EN pin levels of MP2615 chips is charged and discharged, at EN pins
When high level, the MP2615 chips stop charging to battery, while the metal-oxide-semiconductor is opened, and battery starts constant-resistance discharge；When
When EN pins are in low level, the MP2615 chips start to charge to battery, while the MOS is closed, and battery stops electric discharge；
The charging measurement includes following judgment mode：
1) when battery charging time-out, the CHGOK pins of the MP2615 chips are in high level, red light is always on, and is judged unqualified；
2) when charging temperature is more than hardware setting temperature, the CHGOK pins of the MP2615 chips are in high level, and red light is normal
It is bright, judge unqualified；
The discharge test includes following judgment mode：
1) at the end of discharge time, the battery voltage value of AD sampling modules on mainboard acquisition and the threshold voltage of setting carry out pair
Than if being less than the threshold voltage, red light is always on, judges unqualified；
It further include following judgment mode：
1) when battery accesses, when leading to poor contact, the CHGOK pin levels of the MP2615 chips will be drawn high, to sentence
Determine poor contact, buzzer can give a warning, and prompt have battery poor contact, battery to will be unable to charge；
2) after accessing battery, if the pin of CHGOK is high level, red light is always on, and is opened charging and is enabled, and aging failure is accused
Alert module buzzer sounds, misregistration information；
3) it after accessing battery, when CHGOK is low level, opens charging and enables, into charging flow, green light goes out, and red light is with relatively low
Frequency scintillation, timing detect CHGOK signals, judge whether to be full of, CHGOK is in high level, if battery voltage value is less than
8.3V, then be determined as unqualified, and red light is always on, and opens that charging is enabled, and aging failure, alarm module buzzer sounds, and record is wrong
False information；
4) when CHGOK is in high level, and battery voltage value is more than 8.3V, charge closing is enabled, into high power discharge flow；
Red light is flickered with upper frequency, discharges into the stipulated time, and whether detection battery voltage value is more than electric discharge threshold values；Discharge time is less than
Stipulated time is determined as off-capacity, and battery is unqualified, and red light is always on, and opens charging and enables, aging failure, alarm module bee
Ring device sounds, misregistration information；
5) upon discharging between when meeting threshold values, it is enabled to open charging, is again full of battery, red light is flickered with lower frequency, fixed
When detect CHGOK signals, judge whether to be full of, CHGOK be in high level, if battery voltage value higher than 8.3V, is determined as
Qualification, aging pass through, and green light is always on, and knock out red light.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201510057772.3A CN104614682B (en) | 2015-02-04 | 2015-02-04 | A kind of cell degradation tester and cell degradation test method |
| CN201810831416.6A CN109061489B (en) | 2015-02-04 | 2015-02-04 | Device for rapidly aging batch batteries and battery aging characteristic testing method |
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| CN201510057772.3A CN104614682B (en) | 2015-02-04 | 2015-02-04 | A kind of cell degradation tester and cell degradation test method |
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| CN105891594A (en) * | 2016-05-16 | 2016-08-24 | 上海市共进通信技术有限公司 | Cement resistor-based USB test load and test load construction method |
| CN106405441B (en) * | 2016-11-13 | 2023-08-04 | 深圳市迅特通信技术股份有限公司 | Aging test device of optical module |
| CN110007234B (en) * | 2019-03-12 | 2020-02-07 | 清华大学 | Performance test method and system of power battery/battery pack and electric automobile |
| CN114285290B (en) * | 2021-12-24 | 2023-03-31 | 青岛瑰宝电子科技有限公司 | Bidirectional DC/DC energy storage type power supply aging method, system and device |
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| CN201506583U (en) * | 2009-06-25 | 2010-06-16 | 上海市杨浦区控江二村小学 | Used batteries collecting box |
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| CN100458461C (en) * | 2004-04-16 | 2009-02-04 | 美国凹凸微系有限公司 | Method for monitoring battery electricity,electronic device and circuit for said method |
| AT503204B1 (en) * | 2006-02-02 | 2008-05-15 | Wieger Martin Dipl Ing | METHOD AND ARRANGEMENT FOR CHANGING THE CHARGING AND HEALTH CONDITION (SOC, SOH) OF AN ACCUMULATOR |
| CN100559205C (en) * | 2006-09-07 | 2009-11-11 | 长安大学 | Concentration/distribution formula accumulator of electric car group system for inspecting operation parameter |
| CN100460890C (en) * | 2007-06-04 | 2009-02-11 | 中南大学 | Multichannel precision secondary batteries testing system |
| CN201689161U (en) * | 2009-12-25 | 2010-12-29 | 厦门敏讯信息技术股份有限公司 | Battery performance detector |
| CN201765314U (en) * | 2010-07-30 | 2011-03-16 | 广州蓝奇电子实业有限公司 | Battery detection device |
| CN102680905A (en) * | 2012-05-29 | 2012-09-19 | 东莞市海拓伟电子科技有限公司 | Novel multifunctional laptop battery testing system |
| CN204536508U (en) * | 2015-02-04 | 2015-08-05 | 福建实达电脑设备有限公司 | A kind of cell degradation tester |
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| CN201506583U (en) * | 2009-06-25 | 2010-06-16 | 上海市杨浦区控江二村小学 | Used batteries collecting box |
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| CN109061489A (en) | 2018-12-21 |
| CN109061489B (en) | 2020-08-14 |
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