CN104614635A - Method for configuring parameters of microcomputer testing process of intelligent wire harness tester - Google Patents
Method for configuring parameters of microcomputer testing process of intelligent wire harness tester Download PDFInfo
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- CN104614635A CN104614635A CN201510090451.3A CN201510090451A CN104614635A CN 104614635 A CN104614635 A CN 104614635A CN 201510090451 A CN201510090451 A CN 201510090451A CN 104614635 A CN104614635 A CN 104614635A
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Abstract
The invention discloses a method for configuring parameters of the microcomputer testing process of an intelligent wire harness tester. The method includes an intelligent wire harness tester body and a microcomputer testing process parameter configuration method; the microcomputer testing process parameter configuration method comprises the steps of building a testing process parameter configuration interface and configuring the process parameters; the step of building the testing process parameter configuration interface includes selecting a dialog box and a editing window for a testing pile; the step of configuring the process parameters includes starting the function of configuring the testing process parameters, and displaying the testing process parameter configuration progress; the function of configuring the testing process parameters is able to position to some row and some rank and select the content as well as changing the selected content by the simple input method. With the adoption of the method, a user of the intelligent wire harness tester can intuitively, clearly and portably configure self-learning files and general production files; the automatic naming is supported, which facilitates production and process management.
Description
Technical field
The present invention relates to a kind of wire harness conducting instrument, be specifically related to wire harness intelligent testing machine micro computer test technology method for parameter configuration.
Background technology
The wire harness loop checkout equipment that wire harness manufacturer uses carries out the detection of wire harness conducting, and can detect the open circuit of wire harness and wrong road by wire harness conducting instrument, we usually become wire harness loop monitor station.Manual contrast drawing uses homemade instrument, and we are called conduction device, can change a social system, taken away by doorbell switch with doorbell.One end is positive pole, and one end is negative pole, as long as or the multiple spot welding wiring whether conducting in the shield bore position of specifying, just can judge the open circuit of wire harness or wrong road at two of wire harness.This method is usually the manual inspection that trial production of new products is carried out.Existing wire harness conducting instrument versatility is low, and testing efficiency, testing cost is high, and intelligence degree is also low.
Summary of the invention
The object of the invention is to the above problem overcoming prior art existence, wire harness intelligent testing machine micro computer test technology method for parameter configuration is provided, what the present invention can allow wire harness intelligent testing machine that user can be allowed intuitive, clear, portable carries out real-time editor to self study file and conventional production file, support name automatically, be convenient to produce and workflow management.
For realizing above-mentioned technical purpose, reach above-mentioned technique effect, the present invention is achieved through the following technical solutions:
Wire harness intelligent testing machine micro computer test technology method for parameter configuration, comprise wire harness intelligent testing machine main body and micro computer test technology method for parameter configuration, wire harness conducting machine software function carrier module is established in described wire harness intelligent testing machine main body, described micro computer test technology method for parameter configuration comprises test technology parameter configuration interface and test technology parameter configuration operation steps, described test technology parameter configuration interface comprises 4 Shipping Options Pages, be respectively: communications setting Shipping Options Page, test setting Shipping Options Page, Operation system setting Shipping Options Page, set of time Shipping Options Page, described test technology parameter configuration operation steps comprises the following steps:
Step 1) selects test file dialog box on wire harness intelligent testing machine main body screen, filesselected path drop-down list;
Step 2) open test technology parameter configuration icon, enable the software function module of test technology parameter configuration, wire harness intelligent testing machine main body screen shows test technology parameter configuration interface;
Step 3) presses roller key, switch labels page;
Step 4) is by pressing upwards button, and toggle control focus, presses downward button, and select the different option of drop down list control, swing roller, carries out simple input method input;
Step 5) is short presses confirming button, preserves configuration, and length presses confirming button, recovers default value, or presses cancel key cancellation configuration;
Step 6) completes configuration, presses " exiting " button, exits technological parameter configuration interface.
Further, described communications setting Shipping Options Page mainly arranges host address, extension address, radio channel and MAC Address parameter.
Further, described host address: represent radio communication host computer address, span 0 ~ 255; Described extension address: represent radio communication extension address, span 0 ~ 65535; Described radio channel: represent the channel that extension set and main-machine communication adopt, span 0 ~ 16; Described MAC Address: unique identification during indication equipment communication, the MAC Address of any equipment can not be identical.MAC Address cannot be revised, unified setting when equipment dispatches from the factory; At communications setting interface, control focus can be switched by upwards button, navigate to different input point.Turn clockwise roller, and numerical value adds 1.Be rotated counterclockwise roller, numerical value subtracts 1.Downward button can change input cursor position from left to right back and forth.
Further, described test setting Shipping Options Page can arrange automatically, manually, and timing Three models; Conduction threshold span: 100 Ω, 500 Ω, 1K Ω, 10K Ω; High resistant threshold value span: 100 Ω, 500 Ω, 1K Ω, 10K Ω; At test setting interface, control focus can be switched by upwards button, navigate to different input point.Downward button can circulate selective listing content.
Further, described Operation system setting Shipping Options Page mainly arranges screen intensity, horn volume, voice selecting, described brightness: can adjusting screen brightness, uses Slider control regulating parameter; Described volume: regulate horn volume, uses Slider control regulating parameter; Described voice: support Chinese and English selection, use drop-down list Selection parameter; At Operation system setting interface, control focus can be switched by upwards button, navigate to different input point.Downward button can circulate selective listing content.
Further, described set of time interface mainly arranges system time and date; Parameters is, year: default value 2014; Month: span 1 ~ 12; Day: span 1 ~ 31; Time: span 0 ~ 23; Point: span 0 ~ 59; Second: span 0 ~ 59.
The invention has the beneficial effects as follows:
What the present invention can allow wire harness intelligent testing machine that user can be allowed intuitive, clear, portable carries out real-time editor to self study file and conventional production file, supports automatically to name, and is convenient to produce and workflow management.
Above-mentioned explanation is only the general introduction of technical solution of the present invention, in order to better understand technological means of the present invention, and can be implemented according to the content of instructions, coordinates accompanying drawing to be described in detail as follows below with preferred embodiment of the present invention.The specific embodiment of the present invention is provided in detail by following examples and accompanying drawing thereof.
Accompanying drawing illustrates:
Accompanying drawing described herein is used to provide a further understanding of the present invention, and form a application's part, schematic description and description of the present invention, for explaining the present invention, does not form inappropriate limitation of the present invention.In the accompanying drawings:
Fig. 1 is the wire harness intelligent testing machine main body schematic diagram of a kind of embodiment of the present invention;
Fig. 2 is the schematic flow sheet of the test technology parameter configuration operation steps of a kind of embodiment of the present invention.
Embodiment:
Below with reference to the accompanying drawings and in conjunction with the embodiments, describe the present invention in detail.
Shown in seeing figures.1.and.2, wire harness intelligent testing machine micro computer test technology method for parameter configuration, comprise wire harness intelligent testing machine main body and micro computer test technology method for parameter configuration, wire harness conducting machine software function carrier module is established in described wire harness intelligent testing machine main body, described micro computer test technology method for parameter configuration comprises test technology parameter configuration interface and test technology parameter configuration operation steps, described test technology parameter configuration interface comprises 4 Shipping Options Pages, be respectively: communications setting Shipping Options Page, test setting Shipping Options Page, Operation system setting Shipping Options Page, set of time Shipping Options Page, described test technology parameter configuration operation steps comprises the following steps:
Step 1) selects test file dialog box on wire harness intelligent testing machine main body screen, filesselected path drop-down list;
Step 2) open test technology parameter configuration icon, enable the software function module of test technology parameter configuration, wire harness intelligent testing machine main body screen shows test technology parameter configuration interface;
Step 3) presses roller key, switch labels page;
Step 4) is by pressing upwards button, and toggle control focus, presses downward button, and select the different option of drop down list control, swing roller, carries out simple input method input;
Step 5) is short presses confirming button, preserves configuration, and length presses confirming button, recovers default value, or presses cancel key cancellation configuration;
Step 6) completes configuration, presses " exiting " button, exits technological parameter configuration interface.
Further, described communications setting Shipping Options Page mainly arranges host address, extension address, radio channel and MAC Address parameter.
Further, described host address: represent radio communication host computer address, span 0 ~ 255; Described extension address: represent radio communication extension address, span 0 ~ 65535; Described radio channel: represent the channel that extension set and main-machine communication adopt, span 0 ~ 16; Described MAC Address: unique identification during indication equipment communication, the MAC Address of any equipment can not be identical.MAC Address cannot be revised, unified setting when equipment dispatches from the factory; At communications setting interface, control focus can be switched by upwards button, navigate to different input point.Turn clockwise roller, and numerical value adds 1.Be rotated counterclockwise roller, numerical value subtracts 1.Downward button can change input cursor position from left to right back and forth.
Further, described test setting Shipping Options Page can arrange automatically, manually, and timing Three models; Conduction threshold span: 100 Ω, 500 Ω, 1K Ω, 10K Ω; High resistant threshold value span: 100 Ω, 500 Ω, 1K Ω, 10K Ω; At test setting interface, control focus can be switched by upwards button, navigate to different input point.Downward button can circulate selective listing content.
Further, described Operation system setting Shipping Options Page mainly arranges screen intensity, horn volume, voice selecting, described brightness: can adjusting screen brightness, uses Slider control regulating parameter; Described volume: regulate horn volume, uses Slider control regulating parameter; Described voice: support Chinese and English selection, use drop-down list Selection parameter; At Operation system setting interface, control focus can be switched by upwards button, navigate to different input point.Downward button can circulate selective listing content.
Further, described set of time interface mainly arranges system time and date; Parameters is, year: default value 2014; Month: span 1 ~ 12; Day: span 1 ~ 31; Time: span 0 ~ 23; Point: span 0 ~ 59; Second: span 0 ~ 59.
The foregoing is only the preferred embodiments of the present invention, be not limited to the present invention, for a person skilled in the art, the present invention can have various modifications and variations.Within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (6)
1. wire harness intelligent testing machine micro computer test technology method for parameter configuration comprises wire harness intelligent testing machine main body and micro computer test technology method for parameter configuration, wire harness conducting machine software function carrier module is established in described wire harness intelligent testing machine main body, it is characterized in that: described micro computer test technology method for parameter configuration comprises test technology parameter configuration interface and test technology parameter configuration operation steps, described test technology parameter configuration interface comprises 4 Shipping Options Pages, be respectively: communications setting Shipping Options Page, test setting Shipping Options Page, Operation system setting Shipping Options Page, set of time Shipping Options Page, described test technology parameter configuration operation steps comprises the following steps:
Step 1) selects test file dialog box on wire harness intelligent testing machine main body screen, filesselected path drop-down list;
Step 2) open test technology parameter configuration icon, enable the software function module of test technology parameter configuration, wire harness intelligent testing machine main body screen shows test technology parameter configuration interface;
Step 3) presses roller key, switch labels page;
Step 4) is by pressing upwards button, and toggle control focus, presses downward button, and select the different option of drop down list control, swing roller, carries out simple input method input;
Step 5) is short presses confirming button, preserves configuration, and length presses confirming button, recovers default value, or presses cancel key cancellation configuration;
Step 6) completes configuration, presses " exiting " button, exits technological parameter configuration interface.
2. wire harness intelligent testing machine micro computer test technology method for parameter configuration according to claim 1, is characterized in that: described communications setting Shipping Options Page mainly arranges host address, extension address, radio channel and MAC Address parameter.
3. wire harness intelligent testing machine micro computer test technology method for parameter configuration according to claim 2, is characterized in that: described host address: represent radio communication host computer address, span 0 ~ 255; Described extension address: represent radio communication extension address, span 0 ~ 65535; Described radio channel: represent the channel that extension set and main-machine communication adopt, span 0 ~ 16; Described MAC Address: unique identification during indication equipment communication, the MAC Address of any equipment can not be identical; MAC Address cannot be revised, unified setting when equipment dispatches from the factory; At communications setting interface, can switch control focus by upwards button, navigate to different input point, turn clockwise roller, and numerical value adds 1, is rotated counterclockwise roller, and numerical value subtracts 1, and downward button can change input cursor position from left to right back and forth.
4. the wire harness intelligent testing machine micro computer test technology method for parameter configuration according to claim 1 step 4, is characterized in that: described test setting Shipping Options Page can arrange automatically, manually, and timing Three models; Conduction threshold span: 100 Ω, 500 Ω, 1K Ω, 10K Ω; High resistant threshold value span: 100 Ω, 500 Ω, 1K Ω, 10K Ω; At test setting interface, can switch control focus, navigate to different input point by upwards button, downward button can circulate selective listing content.
5. wire harness intelligent testing machine micro computer test technology method for parameter configuration according to claim 1, it is characterized in that: described Operation system setting Shipping Options Page mainly arranges screen intensity, horn volume, voice selecting, described brightness: can adjusting screen brightness, uses Slider control regulating parameter; Described volume: regulate horn volume, uses Slider control regulating parameter; Described voice: support Chinese and English selection, use drop-down list Selection parameter; At Operation system setting interface, can switch control focus, navigate to different input point by upwards button, downward button can circulate selective listing content.
6. the wire harness intelligent testing machine micro computer test technology method for parameter configuration according to claim 1 step 5, is characterized in that: described set of time interface mainly arranges system time and date; Parameters is, year: default value 2014; Month: span 1 ~ 12; Day: span 1 ~ 31; Time: span 0 ~ 23; Point: span 0 ~ 59; Second: span 0 ~ 59.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105170487A (en) * | 2015-06-05 | 2015-12-23 | 中山市利光电子有限公司 | Automatic control system for LED sorting machine |
| CN107992995A (en) * | 2017-11-20 | 2018-05-04 | 上海华力微电子有限公司 | A kind of method and system for creating technological process title |
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| CN102514768A (en) * | 2011-12-19 | 2012-06-27 | 南通大地电气有限公司 | Wire harness quality detection method |
| US20130221982A1 (en) * | 2012-02-29 | 2013-08-29 | GM Global Technology Operations LLC | Modular wiring harness testing systems and apparatus |
| CN103424650A (en) * | 2013-07-12 | 2013-12-04 | 昆山艾博机器人系统工程有限公司 | Wiring harness test device |
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2015
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| CN201449431U (en) * | 2009-04-27 | 2010-05-05 | 中国人民解放军第二炮兵工程学院 | Wireless tester for cable path |
| CN102514768A (en) * | 2011-12-19 | 2012-06-27 | 南通大地电气有限公司 | Wire harness quality detection method |
| US20130221982A1 (en) * | 2012-02-29 | 2013-08-29 | GM Global Technology Operations LLC | Modular wiring harness testing systems and apparatus |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105170487A (en) * | 2015-06-05 | 2015-12-23 | 中山市利光电子有限公司 | Automatic control system for LED sorting machine |
| CN105170487B (en) * | 2015-06-05 | 2018-07-24 | 中山市利光电子有限公司 | A kind of automatic control system of LED light splitting machines |
| CN107992995A (en) * | 2017-11-20 | 2018-05-04 | 上海华力微电子有限公司 | A kind of method and system for creating technological process title |
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Address after: Suzhou City, Jiangsu province 215153 city of science and technology of Suzhou high tech Zone Yandang Road No. 88 Applicant after: Suzhou LZY Technology Ltd. Address before: 215011 No. 55 Xiangyang Road, hi tech Zone, Jiangsu, Suzhou Applicant before: Suzhou LZY Technology Ltd. |
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Application publication date: 20150513 |