CN104614609A - Test method of super capacitor - Google Patents

Test method of super capacitor Download PDF

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Publication number
CN104614609A
CN104614609A CN201510041980.4A CN201510041980A CN104614609A CN 104614609 A CN104614609 A CN 104614609A CN 201510041980 A CN201510041980 A CN 201510041980A CN 104614609 A CN104614609 A CN 104614609A
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capacitor
microprocessor
testing
voltage
capacity
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CN201510041980.4A
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CN104614609B (en
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王晓澎
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Inspur Electronic Information Industry Co Ltd
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Inspur Electronic Information Industry Co Ltd
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  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention discloses a test method of a super capacitor, which comprises a test circuit, wherein the test circuit comprises a control circuit, a feedback circuit, a microprocessor and an LED display lamp; when the capacitor to be measured is charged, calculating the capacity of the capacitor to be measured according to the voltage, time and capacity functional relation in the charging and discharging process of the capacitor to be measured, controlling the measuring process by a microcontroller, and storing and displaying the calculation result in the microcontroller; after the capacitor to be measured is charged, the microcontroller controls the relay to discharge the capacitor to be measured, the voltage of the capacitor to be measured is extracted at certain time intervals, the data is stored in the microprocessor, the capacity of the capacitor to be measured is calculated, the capacity is stored in the microprocessor, and the measurement result is displayed. Compared with the prior art, the test method of the super capacitor can be used for servers, storage and other electronic products, realizes the electrical property test of the super capacitor, provides reliable data, and is high in practicability and easy to popularize.

Description

A kind of method of testing of super capacitor
Technical field
The present invention relates to the technical field of measurement and test of super capacitor, specifically a kind of method of testing of practical, super capacitor.
Background technology
Farad capacitor is also referred to as capacitor with super capacity, ultracapacitor, double layer capacitor, EDLCs etc., farad capacitor utilizes the capacitor being formed between electronic conductor activated charcoal and ion conductor organic or inorganic electrolytic solution and respond to electrical double layer principle and make, and volume is little, and capacity is large, voltage memory characteristic is good, and reliability is high.On energy storage mechnism, it is high reversible, life-span is very long, can ten million repeated charge, and (10 to 1000 amperes) can fast charging and discharging under very large electric current, these features make electrochemical capacitor have wide market outlook in the application of power in electric automobile, communication, consumption and the field such as recreation electronic, signal monitoring.And for the development of electrical double layer capacitor with super capacity, the measurement of its electric parameter is very important link.The electric parameter of electrical double layer capacitor with super capacity mainly comprises electric capacity and equivalent series resistance.But the so large capacitor of traditional bridge measurement is infeasible.Based on this, the invention provides a kind of method of testing of super capacitor.
Summary of the invention
Technical assignment of the present invention is for above weak point, provides a kind of method of testing of practical, super capacitor.
A kind of method of testing of super capacitor, comprise test circuit, this test circuit comprises the LED display lamp of the control circuit connecting testing capacitance, the feedback circuit be connected with control circuit and microprocessor, connection microprocessor, and described feedback circuit connects above-mentioned microprocessor; Described control circuit is the charge-discharge circuit of testing capacitance, when charging to testing capacitance, according in testing capacitance charge and discharge process, voltage, time, capacity function relation calculate this testing capacitance capacity, measuring process is by microprocessor controls, and result of calculation to be stored in microcontroller and to show; After to capacitor charging to be measured, microprocessor controls relay and discharging to testing capacitance, extracts the voltage of testing capacitance by certain hour interval, these data are stored in microprocessor, calculate the capacity of testing capacitance, be stored in microprocessor, and demonstrate measurement result.
Described charge-discharge circuit specifically comprises:
Connect the relay of testing capacitance input end, the display diode in parallel with this relay, the output terminal of described relay, parallel diode all connects the collector of same triode, and grounded emitter, the base stage of this triode connect 5V voltage input end by resistance R3; Described relay is contact resistance R2, sample resistance R1 also, and this sample resistance R1 series voltage stabilizing power supply, the output terminal of gauge tap S, this gauge tap S, the output terminal of sample resistance R1, the output terminal of resistance R2 all connect the output terminal of testing capacitance.
Described voltage, time, capacity function relation are as follows:
-t/RC
Vc=VCC (1-e), wherein Vc is the voltage on capacitor, and VCC is supply voltage, and e is constant, and R is sample resistance, and C is measured capacitance.
The method of testing of a kind of super capacitor of the present invention, has the following advantages:
The method of testing of a kind of super capacitor of this invention effectively solves the problem of super capacitor testing electrical property difficulty, can be used for server, storage and other electronic products, realizes the test that super capacitor is electrical, provide reliable data, practical, is easy to promote.
Accompanying drawing explanation
Accompanying drawing 1 is one-piece construction schematic block diagram of the present invention.
Accompanying drawing 2 is control circuit figure of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments, the invention will be further described.
The present invention proposes a kind of method of testing of super capacitor, as shown in accompanying drawing 1, Fig. 2, its concrete structure comprises test circuit, this test circuit comprises the LED display lamp of the control circuit connecting testing capacitance, the feedback circuit be connected with control circuit and microprocessor, connection microprocessor, and described feedback circuit connects above-mentioned microprocessor; Described control circuit is the charge-discharge circuit of testing capacitance, and this charge-discharge circuit specifically comprises:
Connect the relay of testing capacitance input end, the display diode in parallel with this relay, the output terminal of described relay, parallel diode all connects the collector of same triode, and grounded emitter, the base stage of this triode connect 5V voltage input end by resistance R3; Described relay is contact resistance R2, sample resistance R1 also, and this sample resistance R1 series voltage stabilizing power supply, the output terminal of gauge tap S, this gauge tap S, the output terminal of sample resistance R1, the output terminal of resistance R2 all connect the output terminal of testing capacitance.
Drive relay by NPN type triode in the present invention, i.e. dotted portion in accompanying drawing 2, relay coil is received between collector and positive supply as collector load.When being input as 0V, triode ends, and relay coil no current flows through, then relay release; On the contrary, when being input as+VCC, triode is saturated, and relay coil has suitable electric current to flow through, then relay adhesive.
When charging to testing capacitance, stabilized voltage supply is charged to farad capacitor by sample resistance, according in capacitor charge and discharge process, voltage, time, capacity function relation calculate capacitance, measuring process is all by Single-chip Controlling, and single-chip microcomputer calculates, and calculates accurately, result of calculation is stored in single-chip microcomputer, by function button display measurement result.
Described voltage, time, capacity function relation are as follows: Vc=VCC (1-e -t/RC), wherein Vc is the voltage on capacitor, and VCC is supply voltage, and e is constant, and R is sample resistance, and C is measured capacitance.
After farad capacitor charging, Single-chip Controlling relay switch, thus farad capacitor is discharged, the voltage of farad capacitor is extracted by certain hour interval, data are stored in single-chip microcomputer, calculated the capacity of electric capacity C by above-mentioned formula by single-chip microcomputer coding, and be stored in single-chip microcomputer, by function button display measurement result.
Above-mentioned embodiment is only concrete case of the present invention; scope of patent protection of the present invention includes but not limited to above-mentioned embodiment; claims of the method for testing of any a kind of super capacitor according to the invention and the those of ordinary skill of any described technical field to its suitable change done or replacement, all should fall into scope of patent protection of the present invention.

Claims (3)

1. the method for testing of a super capacitor, it is characterized in that, comprise test circuit, this test circuit comprises the LED display lamp of the control circuit connecting testing capacitance, the feedback circuit be connected with control circuit and microprocessor, connection microprocessor, and described feedback circuit connects above-mentioned microprocessor; Described control circuit is the charge-discharge circuit of testing capacitance, when charging to testing capacitance, according in testing capacitance charge and discharge process, voltage, time, capacity function relation calculate this testing capacitance capacity, measuring process is by microprocessor controls, and result of calculation to be stored in microcontroller and to show; After to capacitor charging to be measured, microprocessor controls relay and discharging to testing capacitance, extracts the voltage of testing capacitance by certain hour interval, these data are stored in microprocessor, calculate the capacity of testing capacitance, be stored in microprocessor, and demonstrate measurement result.
2. the method for testing of a kind of super capacitor according to claim 1, is characterized in that, described charge-discharge circuit specifically comprises:
Connect the relay of testing capacitance input end, the display diode in parallel with this relay, the output terminal of described relay, parallel diode all connects the collector of same triode, and grounded emitter, the base stage of this triode connect 5V voltage input end by resistance R3; Described relay is contact resistance R2, sample resistance R1 also, and this sample resistance R1 series voltage stabilizing power supply, the output terminal of gauge tap S, this gauge tap S, the output terminal of sample resistance R1, the output terminal of resistance R2 all connect the output terminal of testing capacitance.
3. the method for testing of a kind of super capacitor according to claim 1 and 2, is characterized in that, described voltage, time, capacity function relation are as follows: Vc=VCC (1-e -t/RC), wherein Vc is the voltage on capacitor, and VCC is supply voltage, and e is constant, and R is sample resistance, and C is measured capacitance.
CN201510041980.4A 2015-01-27 2015-01-27 Test method of super capacitor Active CN104614609B (en)

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Cited By (5)

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Publication number Priority date Publication date Assignee Title
CN105158581A (en) * 2015-09-28 2015-12-16 国网甘肃省电力公司 High-capacity capacitor capacity measurement circuit
CN106646054A (en) * 2016-12-28 2017-05-10 天津瑞能电气有限公司 Detection method of double-fed frequency converter direct current bus capacitor damaging
CN107961992A (en) * 2017-11-24 2018-04-27 西安力能新能源科技有限公司 A kind of test method of ultracapacitor
CN108761289A (en) * 2018-06-07 2018-11-06 哈尔滨理工大学 A kind of high density capacitors quality and Withstand test device
CN110824259A (en) * 2019-12-10 2020-02-21 南京绿索电子科技有限公司 Super capacitor module capacity testing device and testing method thereof

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105158581A (en) * 2015-09-28 2015-12-16 国网甘肃省电力公司 High-capacity capacitor capacity measurement circuit
CN105158581B (en) * 2015-09-28 2018-01-16 国网甘肃省电力公司 Large bulk capacitance cubic content measurement circuit
CN106646054A (en) * 2016-12-28 2017-05-10 天津瑞能电气有限公司 Detection method of double-fed frequency converter direct current bus capacitor damaging
CN107961992A (en) * 2017-11-24 2018-04-27 西安力能新能源科技有限公司 A kind of test method of ultracapacitor
CN108761289A (en) * 2018-06-07 2018-11-06 哈尔滨理工大学 A kind of high density capacitors quality and Withstand test device
CN110824259A (en) * 2019-12-10 2020-02-21 南京绿索电子科技有限公司 Super capacitor module capacity testing device and testing method thereof

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