CN104581145A - CCD performance parameter testing device and testing method - Google Patents
CCD performance parameter testing device and testing method Download PDFInfo
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- CN104581145A CN104581145A CN201510026625.XA CN201510026625A CN104581145A CN 104581145 A CN104581145 A CN 104581145A CN 201510026625 A CN201510026625 A CN 201510026625A CN 104581145 A CN104581145 A CN 104581145A
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Abstract
The invention relates to the field of light sensation device performance testing, in particular to a CCD performance parameter testing device and a testing method. The CCD performance parameter testing device comprises a PC control module, a main integrating sphere, an opaque chamber, a first illuminometer, a three-dimensional loading platform, stabilized power supply and auxiliary integrating spheres which are arranged on an hemisphere, at the side of a light output port, of the main integrating sphere; light sources of the CCD performance parameter testing device are provided by the multiple auxiliary integrating spheres arranged on the main integrating sphere and the light sources have a double-light-mixing effect so that light output by the main integrating sphere can be better in the homogeneity, light output ports of the auxiliary integrating spheres are provided with adjustable light bars so that a testing light source with continuously variable illuminance and a more stable color temperature can be provided; and meanwhile, illuminometers and the method from a CCD to be tested to the light output ports are automatically switched over in an alternating mode so that a measuring result can be more accurate.
Description
Technical field
The present invention relates to light sensitive device technical field of performance test, particularly a kind of CCD performance parameter testing device and method of testing.
Background technology
CCD (Charge Coupled Device, writes a Chinese character in simplified form CCD, has another name called ccd image sensor, image controller) is a kind of transform light energy device, and it uses the semi-conducting material of ISO to make, and light can be transformed into electric charge and store.CCD has been widely used in the fields such as shooting, IMAQ, scanner and commercial measurement.The performance parameter of CCD has noise, responsiveness (SiTF), saturated illumination, flux density threshold, dynamic range, uniformity, must detect before CCD dispatches from the factory to these performance parameters, has good performance with the CCD guaranteeing to dispatch from the factory.
The mode at present performance parameter of CCD detected be mostly at optics and photoelectricity test equipment basically by visual measurement, artificial interpretation and artificial data process, and most of integrating sphere only provides a mixed light, light mixing effect is not good, and illumination uniformity is not strong, can not meet actual needs.
Summary of the invention
The object of the invention is to overcome above-mentioned deficiency existing in prior art, provide the test macro of the better CCD performance parameter of a kind of light mixing effect, it comprises PC control module, main integrating sphere, camera bellows, the first illuminance meter, three-dimensional plummer, stabilized power supply; Described PC control module includes video frequency collection card; Described video frequency collection card is connected with CCD to be tested; Described first illuminance meter is fixed on described three-dimensional plummer, and described three-dimensional plummer is positioned at described camera bellows, and described first illuminance meter, three-dimensional plummer are connected with described PC control module respectively by control line.
Main integrating sphere light output mouth side hemisphere is provided with plural auxiliary integrating sphere, main integrating sphere light output mouth side hemisphere is provided with plural auxiliary integrating sphere, described plural auxiliary integrating sphere is evenly arranged on described main integrating sphere spherical shell and forms circumference, the center of circle and the main integrating sphere light output mouth center of circle of described circumference are positioned on same level axle, be provided with light source in described auxiliary integrating sphere, described light source is connected with described stabilized power supply.
Further, described auxiliary integrating sphere and described main integrating sphere interface are provided with adjustable stop, described adjustable stop comprise regulate light hurdle, with the logical light light hurdle regulating the stepping motor that links together of light hurdle and be fixed on described auxiliary integrating sphere light output mouth; Described stepping motor is connected with described PC control module, and staff is by PC control module control step motor, and what adjust adjustable stop opens closedown degree, thus controls the illuminance of described auxiliary integrating sphere output.
Preferably, in described CCD performance parameter testing device, the quantity of described auxiliary integrating sphere is four, also one, two, three or more can be set to as required, the increase of auxiliary integrating sphere quantity can increase the effect of mixed light, the light uniformity that winner's integrating sphere is exported is better, but the increase of auxiliary integrating sphere can increase the cost of equipment undoubtedly.
Further, described CCD performance parameter testing device also comprises the second illuminance meter, described second illuminance meter be arranged on described main integrating sphere side and with the Horizontal-shaft vertical of described main integrating sphere, it is for detecting the illuminance situation of described main integrating sphere inside in real time.
Preferably, described light source is the bromine tungsten filament lamp of 35W, 12V, bromine tungsten filament lamp have the visible spectrum of emergent ray continuously, stabilized intensity, low cost and other advantages.
The present invention is provided a kind of simultaneously and is controlled in real time by tester, adjusting intensity of illumination, and automatically measures the test macro CDD performance parameter test method of CCD performance parameter to be measured, adopts following steps to complete:
Step 1: according to the output current value of auxiliary integrating sphere inner light source setting parameter stabilized power supply.
Step 2: close adjustable stop, measures the main integrating sphere light output mouth illuminance in adjustable stop closedown situation; Described main integrating sphere light output mouth is adjusted to camera bellows entrance, close adjustable stop, described first illuminance meter in camera bellows is moved to main integrating sphere light output mouth center, measure the illuminance of current main integrating sphere light output mouth, when closing described adjustable stop in theory, the illuminance of described main integrating sphere light output mouth is 0, but in fact because the existence of veiling glare, astigmatism, its illuminance is not 0 usually.
Step 3: measure the current analog value of CCD to be measured, and revise according to the illuminance measured in step 2, draw the background response of CCD to be measured, and calculate the noise of CCD to be measured.
Its method is, the CCD to be measured be fixedly installed on equally on described three-dimensional plummer is moved to described main integrating sphere light output mouth center, the response of CCD to be measured under measuring current illumination, according to the brightness value measured in step S02 (in described adjustable stop all closedown situations, the illuminance value of described main integrating sphere light output mouth) response measured is revised, to obtain the background response of CCD to be measured, (local response is for when illuminance is 0 in theory, the response of CCD to be measured), the noise of CCD to be measured is calculated, described noise V according to described background response
ncomputing formula is:
and
Wherein, V
nfor the background noise of CCD to be measured, V
n(i, f) is the noise voltage of photosensitive unit effective in CCD,
for the mean value of each moment (interframe) noise voltage, F is the frame number gathering image, V
ni () is the noise voltage V of photosensitive unit effective in CCD
nthe root-mean-square value (1≤i≤N) of (i, f) fluctuation in time.
Step 4: described adjustable stop is opened in the setting stepping according to tester, the response of CCD to be measured under measuring different illumination; Its concrete grammar is, described adjustable stop is opened in setting stepping according to tester, alternately described first illuminance meter and CCD to be measured are moved to described main integrating sphere light output mouth center, when described first illuminance meter is positioned at described main integrating sphere light output mouth center, for measuring described main integrating sphere light output mouth current illumination value, when CCD to be measured is positioned at described main integrating sphere light output mouth, for the response of CCD to be measured under measuring current illumination value, and calculate the responsiveness of CCD to be measured according to described response.
Repeat step 4 until draw the signal transfer function SiTF of CCD to be measured, described signal transfer function SiTF is for reacting the response characteristic of CCD to be measured to object illumination, draw the corresponding relation of output characteristic (gray value or voltage) with target Input illumination characteristic variations of CCD to be measured, its computing formula is:
Wherein, Δ E is illumination (lx); Δ V=V
si-V
b, V
sifor signal when having illumination exports, V
bfor signal during unglazed photograph exports, unit is gray value or voltage (V).
Further, the saturated illumination E of CCD to be measured is calculated further by the signal transfer function SiTF of the CCD to be measured drawn in step 5
s, described saturated illumination E
srefer to minimum incoming illumination when ccd output signal reaches capacity, when CCD reception to be measured is greater than the illumination of saturated illumination, will not there is obvious change in its output signal.
Further, the flux density threshold E of CCD to be measured is calculated further by the signal transfer function SiTF of the CCD to be measured drawn in step 5
th, described flux density threshold E
threfer under light illumination, the magnitude of voltage that the effective photosensitive unit of CCD to be measured exports is 10V
ntime corresponding brightness value E
th; Its computing formula is: E
th=10V
n/ SiTF.
Further, the dynamic range D of CCD to be measured is calculated further
r, described dynamic range D
rrefer to saturated illumination E
swith flux density threshold E
thratio, symbol is D
r, it is for the relative Repeat of characterizing device detection light signal size, and its computing formula is: D
r=E
s/ E
th.
Compared with prior art, beneficial effect of the present invention: CCD performance parameter testing device light source provided by the invention is provided by the multiple auxiliary integrating spheres be arranged on main integrating sphere, there is twice light mixing effect, winner's integrating sphere is made to export light uniformity better, auxiliary integrating sphere light output mouth is provided with adjustable stop, illumination continuous variable can be provided and the more stable testing light source of colour temperature; Method of testing provided by the invention is by alternately switching illuminance meter and CCD to be measured, to the mode of light output mouth, make measurement result more accurate automatically simultaneously.
Accompanying drawing illustrates:
The CCD performance parameter testing device connection diagram that Fig. 1 provides for the embodiment of the present invention 1.
Fig. 2 a is main integrating sphere light exit side schematic diagram in the embodiment of the present invention 1.
Fig. 2 b is main integrating sphere end view in the embodiment of the present invention 1.
Fig. 3 is auxiliary integrating sphere light output mouth place adjustable stop structural representation in the embodiment of the present invention 1.
The CCD performance parameter test method step figure that Fig. 4 provides for the embodiment of the present invention 2.
Fig. 5 is CCD response curve figure to be measured in the embodiment of the present invention 2.
Mark in figure: the main integrating sphere of 1-PC control module, 2-, 21-main integrating sphere light output mouth, 3-second illuminance meter, 4-first illuminance meter, 5-three-dimensional plummer, 6-stabilized power supply, 7-auxiliary integrating sphere, 8-adjustable stop, 81-leads to light light hurdle, 82-regulates light hurdle, 821-baffle plate, 822-light hole, 83-stepping motor.
Embodiment
Below in conjunction with test example and embodiment, the present invention is described in further detail.But this should be interpreted as that the scope of the above-mentioned theme of the present invention is only limitted to following embodiment, all technology realized based on content of the present invention all belong to scope of the present invention.
Embodiment 1: as shown in Figure 1, the object of the present embodiment is to overcome above-mentioned deficiency existing in prior art, the test macro of the better CCD performance parameter of a kind of light mixing effect is provided, the test macro of CCD performance parameter, it comprises PC control module 1, main integrating sphere 2, camera bellows (not showing in figure), the first illuminance meter 4, three-dimensional plummer 5, stabilized power supply 6; Described PC control module 1 includes video frequency collection card (not showing in figure); Described video frequency collection card is connected with CCD to be tested; Described first illuminance meter 4 is fixed on described three-dimensional plummer 5, and described three-dimensional plummer 5 is positioned at described camera bellows, and described first illuminance meter 4, three-dimensional plummer 5 are connected with described PC control module respectively by control line.
As, Fig. 2 a, shown in Fig. 2 b, main integrating sphere 2 light output mouth side hemisphere is provided with four auxiliary integrating spheres 7, described four auxiliary integrating spheres 7 to be evenly arranged on described main integrating sphere 2 spherical shell and to form circumference, the center of circle and main integrating sphere light output mouth 21 center of circle of described circumference are positioned on same level axle, bromine tungsten filament lamp light source is provided with in described auxiliary integrating sphere 7, described bromine tungsten filament lamp light source is connected with described stabilized power supply 6, the visible spectrum that bromine tungsten filament lamp has emergent ray is continuous, stabilized intensity, low cost and other advantages, four symmetrically arranged auxiliary integrating spheres and the acting in conjunction of main integrating sphere spheroid, (light of bromine tungsten filament lamp light source irradiation realizes a mixed light in auxiliary integrating sphere inside to provide twice light mixing effect, this mixed light again realizes mixed light after auxiliary integrating sphere 7 and described main integrating sphere 2 interface inject main integrating sphere, penetrate from main integrating sphere light output mouth after reaching twice mixed light), make the light optical uniformity of winner's integrating sphere light output better.
Described CCD performance parameter testing device also comprises the second illuminance meter 3, described second illuminance meter 3 be arranged on described main integrating sphere 2 side and with the Horizontal-shaft vertical of described main integrating sphere 2, it is for detecting the illuminance situation of described main integrating sphere 2 inside in real time, to control the stability of described main integrating sphere 2 illuminance.
Further, described auxiliary integrating sphere 7 is provided with adjustable stop 8 with described main integrating sphere 2 interface, as shown in Figure 3, described adjustable stop 8 comprise regulate light hurdle 82, with the logical light light hurdle 81 regulating the stepping motor 83 that links together of light hurdle 82 and be fixed on described auxiliary integrating sphere light output mouth; Described stepping motor 83 is connected with described PC control module, staff is by PC control module control step motor, what adjust adjustable stop opens closedown degree, thus control the illuminance of described auxiliary integrating sphere output, exported by the light of adjustable stop step motion control auxiliary integrating sphere, the light colour temperature that winner's integrating sphere is exported is more stable.
Further, described adjustment light hurdle 82 comprises the light hole 822 consistent with described logical light light hurdle shape and baffle plate 821.
Embodiment 2: as shown in Figure 4, Figure 5, is provided a kind of and is controlled in real time by tester, adjusting intensity of illumination during the present embodiment, and automatically measures the test macro CDD performance parameter test method of CCD performance parameter to be measured, adopts following steps to complete:
Step S01: according to the output current value of auxiliary integrating sphere inner light source setting parameter stabilized power supply.
Step S02: close adjustable stop, measures the main integrating sphere light output mouth illuminance in adjustable stop closedown situation; Described main integrating sphere light output mouth is adjusted to camera bellows entrance, close adjustable stop, described first illuminance meter in camera bellows is moved to main integrating sphere light output mouth center, measure the illuminance of current main integrating sphere light output mouth, when closing described adjustable stop in theory, the illuminance of described main integrating sphere light output mouth is 0, but in fact because the existence of veiling glare, astigmatism, its illuminance is not 0 usually.
Step S03: measure the current analog value of CCD to be measured, and revise according to the illuminance measured in step S02, draw the background response of CCD to be measured, and calculate the noise of CCD to be measured.
Its method is, the CCD to be measured be fixedly installed on equally on described three-dimensional plummer is moved to described main integrating sphere light output mouth center, the response of CCD to be measured under measuring current illumination, according to the brightness value measured in step S02 (in described adjustable stop all closedown situations, the illuminance value of described main integrating sphere light output mouth) response measured is revised, to obtain the background response of CCD to be measured, (local response is for when illuminance is 0 in theory, the response of CCD to be measured), the noise of CCD to be measured is calculated, described noise V according to described background response
ncomputing formula is:
and
Wherein, V
nfor the background noise of CCD to be measured, V
n(i, f) is the noise voltage of photosensitive unit effective in CCD,
for the mean value of each moment (interframe) noise voltage, F is the frame number gathering image, V
ni () is the noise voltage V of photosensitive unit effective in CCD
nthe root-mean-square value (1≤i≤N) of (i, f) fluctuation in time.
Step S04: described adjustable stop is opened in the setting stepping according to tester, the response of CCD to be measured under measuring different illumination; Its concrete grammar is, described adjustable stop is opened in setting stepping according to tester, alternately described first illuminance meter and CCD to be measured are moved to described main integrating sphere light output mouth center, when described first illuminance meter is positioned at described main integrating sphere light output mouth center, for measuring described main integrating sphere light output mouth current illumination value, when CCD to be measured is positioned at described main integrating sphere light output mouth, for the response of CCD to be measured under measuring current illumination value, and calculate the responsiveness of CCD to be measured according to described response.
Step S05: repeat step S04 until draw the signal transfer function SiTF of CCD to be measured, described signal transfer function SiTF is for reacting the response characteristic of CCD to be measured to object illumination, draw the corresponding relation of output characteristic (gray value or voltage) with target Input illumination characteristic variations of CCD to be measured, its computing formula is:
Wherein, Δ E is illumination (lx); Δ V=V
si-V
b, V
sifor signal when having illumination exports, V
bfor signal during unglazed photograph exports, unit is gray value or voltage (V).
Further, the saturated illumination E of CCD to be measured is calculated further by the signal transfer function SiTF of the CCD to be measured drawn in step S05
s, described saturated illumination E
srefer to minimum incoming illumination when ccd output signal reaches capacity, when CCD reception to be measured is greater than the illumination of saturated illumination, will not there is obvious change in its output signal.
Further, the flux density threshold E of CCD to be measured is calculated further by the signal transfer function SiTF of the CCD to be measured drawn in step S05
th, described flux density threshold E
threfer under light illumination, the magnitude of voltage that the effective photosensitive unit of CCD to be measured exports is 10V
ntime corresponding brightness value E
th; Its computing formula is: E
th=10V
n/ SiTF.
Further, the dynamic range D of CCD to be measured is calculated further
r, described dynamic range D
rrefer to saturated illumination E
swith flux density threshold E
thratio, symbol is D
r, it is for the relative Repeat of characterizing device detection light signal size, and its computing formula is: D
r=E
s/ E
th.
All features disclosed in this specification, or the step in disclosed all methods or process, except mutually exclusive feature and/or step, all can combine by any way.
Arbitrary feature disclosed in this specification (comprising any accessory claim, summary and accompanying drawing), unless specifically stated otherwise, all can be replaced by other equivalences or the alternative features with similar object.That is, unless specifically stated otherwise, each feature is an example in a series of equivalence or similar characteristics.
Claims (9)
1. a CCD performance parameter testing device, is characterized in that, comprises PC control module, main integrating sphere, camera bellows, the first illuminance meter, three-dimensional plummer, stabilized power supply; Described PC control module includes video frequency collection card; Described video frequency collection card is connected with CCD to be tested; Described first illuminance meter is fixed on described three-dimensional plummer, and described three-dimensional plummer is positioned at described camera bellows, and described first illuminance meter, three-dimensional plummer are connected with described PC control module respectively by control line;
Described main integrating sphere light output mouth side hemisphere is provided with plural auxiliary integrating sphere, main integrating sphere light output mouth side hemisphere is provided with plural auxiliary integrating sphere, described plural auxiliary integrating sphere is evenly arranged on described main integrating sphere spherical shell and forms circumference, the center of circle and the main integrating sphere light output mouth center of circle of described circumference are positioned on same level axle, be provided with light source in described auxiliary integrating sphere, described light source is connected with described stabilized power supply.
2. CCD performance parameter testing device as claimed in claim 1, it is characterized in that, described auxiliary integrating sphere and described main integrating sphere interface are provided with adjustable stop, described adjustable stop comprise regulate light hurdle, with the logical light light hurdle regulating the stepping motor that links together of light hurdle and be fixed on described auxiliary integrating sphere light output mouth; Described stepping motor is connected with described PC control module, and described adjustable stop is used for the illuminance that described in step-by-step adjustment, auxiliary integrating sphere exports.
3. CCD performance parameter testing device as claimed in claim 2, it is characterized in that, in described CCD performance parameter testing device, the quantity of described auxiliary integrating sphere is four.
4. CCD performance parameter testing device as claimed in claim 1, it is characterized in that, described CCD performance parameter testing device also comprises the second illuminance meter, described second illuminance meter is arranged on the side of described main integrating sphere and passes through the Horizontal-shaft vertical of its light output mouth with main integrating sphere, and it is for detecting the illuminance situation of described main integrating sphere inside in real time.
5. the CCD performance parameter testing device as described in any one of Claims 1-4, is characterized in that, described light source is bromine tungsten filament lamp.
6. a CDD performance parameter test method, is characterized in that, adopts following steps to complete:
Step 1: according to the output current value of auxiliary integrating sphere inner light source setting parameter stabilized power supply;
Step 2: close adjustable stop, measures the main integrating sphere light output mouth illuminance in adjustable stop closedown situation;
Step 3: measure the current analog value of CCD to be measured, and revise according to the illuminance measured in step 2, draw the background response of CCD to be measured, and calculate the noise of CCD to be measured;
Step 4: described adjustable stop is opened in the setting stepping according to tester, the response of CCD to be measured under measuring different illumination;
Step 5: repeat step 4 until CCD to be measured reaches the response upper limit, draw the signal transfer function SiTF of CCD to be measured, described signal transfer function SiTF is for reacting the response characteristic of CCD to be measured to object illumination, and its computing formula is:
Wherein, Δ E is illumination (lx); Δ V=V
si-V
b, V
sifor signal when having illumination exports, V
bfor signal during unglazed photograph exports, unit is gray value or voltage (V).
7. CDD performance parameter test method as claimed in claim 6, be is characterized in that, calculated the saturated illumination E of CCD to be measured by the signal transfer function SiTF of the CCD to be measured drawn in step 5 further
s, described saturated illumination E
srefer to minimum incoming illumination when ccd output signal reaches capacity.
8. CDD performance parameter test method as claimed in claim 7, be is characterized in that, calculated the flux density threshold E of CCD to be measured by the signal transfer function SiTF of the CCD to be measured drawn in step 5 further
th, described flux density threshold E
threfer under light illumination, the magnitude of voltage that the effective photosensitive unit of CCD to be measured exports is 10V
ntime corresponding brightness value E
th; Its computing formula is: E
th=10V
n/ SiTF.
9. CDD performance parameter test method as claimed in claim 8, is characterized in that, calculate the dynamic range D of CCD to be measured further
r, described dynamic range D
rrefer to saturated illumination E
swith flux density threshold E
thratio, symbol is D
r, it is for the relative Repeat of characterizing device detection light signal size, and its computing formula is: D
r=E
s/ E
th.
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| WO2021115099A1 (en) * | 2019-12-10 | 2021-06-17 | 江苏南大五维电子科技有限公司 | Multispectral ultraviolet light sensitivity measurement system and method |
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| CN112492300A (en) * | 2020-11-26 | 2021-03-12 | 长春理工大学 | Polarization spectrum camera detector and detection method |
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Application publication date: 20150429 |