CN104575621A - Memory device testing method and system - Google Patents
Memory device testing method and system Download PDFInfo
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- CN104575621A CN104575621A CN201310494768.4A CN201310494768A CN104575621A CN 104575621 A CN104575621 A CN 104575621A CN 201310494768 A CN201310494768 A CN 201310494768A CN 104575621 A CN104575621 A CN 104575621A
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Abstract
The invention discloses a memory device testing method and system. The memory device testing method comprises the following steps: numbering blocks of a to-be-tested memory device; randomly selecting a number as a binary tree root node; calculating a probability that nodes in each layer of a binary tree are all built according to a preset random algorithm; building a binary tree by using numbers of the blocks as numbers of nodes in each layer of the binary tree according to the probability that the nodes in each layer are all built; testing a block corresponding to the number of each node newly built by the binary tree; when a failure of one block of the to-be-tested memory device is tested, reminding that the test fails, and stopping building the binary tree; when the blocks corresponding to the numbers of the newly built nodes all pass through the test, reminding that the test succeeds. According to the memory device testing method, the binary tree is built by using the numbers of the blocks as the nodes, and the blocks corresponding to the nodes are tested, so that the blocks of the memory device are uniformly sampled for being tested, and thus a manner that a plenty time needs to be consumed for testing the memory device conventionally is changed.
Description
Technical field
The present invention relates to a kind of memory storage method of testing and system.
Background technology
Current memory storage, as storer and hard disk, all need to test when manufacturer's shipment, such as, if a server has the storer of 16GB, the general time test needing 25 minutes, if a plant produced 1,000 servers, the time of about 139 days is then needed to do memory test, the at substantial time.
Summary of the invention
In view of above content, be necessary to provide a kind of memory storage method of testing and system.
Described memory storage method of testing comprises: be numbered the block of memory storage to be measured; From above-mentioned numbering, random choose one numbering is as the root node of binary tree; Calculate the every node layer of above-mentioned binary tree by the probability of all building according to default random algorithm, described default random algorithm makes this every node layer be reduced with the dark increase of this layer of tree by the probability of all building; According to the every node layer calculated by the probability of all building, the numbering of the every node layer using the numbering of above-mentioned block as binary tree, builds binary tree; The block of the memory storage to be measured that the newly-built each node serial number of dynamic test binary tree is corresponding; When occurring that a block of memory storage to be measured is tested and making mistake, prompting test crash, and the above-mentioned binary tree of stop building; When the memory storage block to be measured that newly-built each node serial number is corresponding passes through test, prompting is tested successfully.
Described memory storage test macro comprises: numbering module, for being numbered the block of memory storage to be measured; Choosing module, for the root node of random choose from above-mentioned numbering one numbering as binary tree; Computing module, for calculating the every node layer of above-mentioned binary tree by the probability of all building according to presetting random algorithm, described default random algorithm makes every node layer be reduced with the dark increase of this layer of tree by the probability of all building; Build module, for according to every node layer of calculating by the probability of all building, the numbering of the every node layer using the numbering of above-mentioned block as binary tree, builds binary tree; Test module, for the block of memory storage to be measured corresponding to each node serial number that dynamic test binary tree is newly-built; Described test module, also for when occurring that a block of memory storage to be measured is tested and making mistake, prompting test crash, and the above-mentioned binary tree of stop building; Described test module, when also passing through test for the memory storage block to be measured corresponding when newly-built each node serial number, prompting is tested successfully.
The present invention with the block number of memory storage to be measured for node serial number, binary tree is set up according to default random algorithm, and the to be measured memory storage block corresponding to each node serial number of binary tree is tested, the block of memory storage is tested by uniform sampling, changes and test memory storage to be measured in the past and need the at substantial time.
Accompanying drawing explanation
Fig. 1 is the running environment figure of the better embodiment of memory storage test macro of the present invention.
Fig. 2 is the functional block diagram of the better embodiment of memory storage test macro of the present invention.
Fig. 3 is the process flow diagram of the better embodiment being invention memory storage method of testing.
Fig. 4 is the schematic diagram building described binary tree.
Main element symbol description
| Electronic installation | 1 |
| Memory storage to be measured | 2 |
| Memory storage test macro | 10 |
| Storer | 12 |
| Processor | 14 |
| Numbering module | 100 |
| Choosing module | 102 |
| Computing module | 104 |
| Build module | 106 |
| Test module | 108 |
| Judge module | 110 |
Following embodiment will further illustrate the present invention in conjunction with above-mentioned accompanying drawing.
Embodiment
Consulting shown in Fig. 1, is the running environment figure of memory storage test macro of the present invention preferred embodiment.This memory storage test macro 10 operates on an electronic installation 1, for testing memory storage 2 to be measured.This electronic installation 1 can be flat computer, server etc.This electronic installation 1 comprises storer 12, processor 14 etc.
Described storer 12 is for the data such as source program code of store storage device test system 10.
In the present embodiment, described memory storage test macro 10 can be divided into one or more module, and described one or more module is configured to be performed by one or more processor (the present embodiment is processor 14), to complete the present invention.Such as, consult shown in Fig. 2, described memory storage test macro 10 is divided into numbering module 100, Choosing module 102, computing module 104, builds module 106, test module 108 and judge module 110.Module alleged by the present invention has been the program segment of a specific function, and be more suitable for describing software implementation in the electronic apparatus 1 than program, the function about each module consults the description of Fig. 3.
Consulting shown in Fig. 3, is the process flow diagram of the better embodiment of memory storage method of testing of the present invention.
Step S10, the block of numbering module 100 to memory storage 2 to be measured is numbered.
Step S11, Choosing module 102 random choose one from above-mentioned numbering numbers the root node as binary tree.Such as, can select in above-mentioned numbering the root node of numbering as binary tree being positioned at centre position, the child node quantity of described root node can respectively account for half (when numbering quantity is the odd number being more than or equal to 3) in left and right.Consult shown in 4, using numbering 4 as root node, its child node is numbering 2 and numbering 6, and the child node of numbering 6 is numbering 5 and numbering 7.Therefore, in the process of building binary tree, above-mentioned numbering is evenly selected, to ensure that the block of the memory storage to be measured 2 that each numbering is corresponding is tested by uniform sampling.
Step S12, computing module 104 calculates the every node layer of above-mentioned binary tree by the probability of all building according to default random algorithm, and described default random algorithm makes every node layer be set dark increase by the probability of all building with this node layer and reduce.In present embodiment, described default random algorithm is: every node layer is dark by the probability=1-0.04* every layer tree of all building.Calculate ground floor node by the probability of all building be 1-0.04*0=100%, second layer node by the probability of all building be 1-0.04*1=96%, third layer node is 1-0.04*2=92% by the probability of all building.In present embodiment, above-mentioned default random algorithm is the empirical value obtained through many experiments.
Step S13, builds module 106 according to the every node layer calculated by the probability of all building, the numbering of the every node layer using the numbering of above-mentioned block as binary tree, builds binary tree.Consult shown in Fig. 4, ground floor node is 100% by the probability of all building, and numbering 4 is added into binary tree.Second layer node is 96% by the probability of all building, and numbering 2 and numbering 6 take in binary tree.Third layer node is 92% by the probability of all building, the child node numbering 5 of numbering 6 and numbering 7, and the child node of numbering 2 should be numbering 1 and numbering 3, supposes that node 3 is not incorporated into binary tree.Because above-mentioned probability is not 100% just can suppose have node not to be incorporated into binary tree, Fig. 4 is that hypothesis second layer node is all built, and third layer node 3 is not incorporated into binary tree.
Step S14, the block of the memory storage to be measured 2 that the newly-built each node serial number of test module 108 dynamic test binary tree is corresponding.
Step S15, judge module 110 judges that whether the block of the memory storage to be measured 2 that newly-built each node serial number is corresponding is by test.
Step S16, described test module 108 when occurring that a block of memory storage 2 to be measured is tested and making mistake, prompting test crash, and the above-mentioned binary tree of stop building.
Step S17, described test module 108 is when the block of memory storage to be measured 2 corresponding to newly-built each node serial number is by test, and prompting is tested successfully.
Described step S10 to step S17 with the block number of memory storage 2 to be measured for node serial number, binary tree is set up according to default random algorithm, and the block of memory storage to be measured 2 corresponding to each node serial number of binary tree is tested, the block of memory storage 2 to be measured is tested by uniform sampling, changes and test memory storage 2 to be measured in the past and need the at substantial time.
Above embodiment is only in order to illustrate technical scheme of the present invention and unrestricted, although with reference to preferred embodiment to invention has been detailed description, those of ordinary skill in the art is to be understood that, can modify to technical scheme of the present invention or equivalent replacement, and not depart from the spirit and scope of technical solution of the present invention.
Claims (6)
1. a memory storage method of testing, is characterized in that, the method comprises:
The block of memory storage to be measured is numbered;
From above-mentioned numbering, random choose one numbering is as the root node of binary tree;
Calculate the every node layer of above-mentioned binary tree by the probability of all building according to default random algorithm, described default random algorithm makes this every node layer be reduced with the dark increase of this layer of tree by the probability of all building;
According to the every node layer calculated by the probability of all building, the numbering of the every node layer using the numbering of above-mentioned block as binary tree, builds binary tree; The block of the memory storage to be measured that the newly-built each node serial number of dynamic test binary tree is corresponding;
When occurring that a block of memory storage to be measured is tested and making mistake, prompting test crash, and the above-mentioned binary tree of stop building;
When the memory storage block to be measured that newly-built each node serial number is corresponding passes through test, prompting is tested successfully.
2. memory storage method of testing according to claim 1, is characterized in that, described root node is the numbering being positioned at centre position in above-mentioned numbering.
3. memory storage method of testing according to claim 1, is characterized in that, described default random algorithm is:
Every node layer is dark by the probability=1-0.04* every layer tree of all building.
4. a memory storage test macro, is characterized in that, this system comprises:
Numbering module, for being numbered the block of memory storage to be measured;
Choosing module, for the root node of random choose from above-mentioned numbering one numbering as binary tree;
Computing module, for calculating the every node layer of above-mentioned binary tree by the probability of all building according to presetting random algorithm, described default random algorithm makes every node layer be reduced with the dark increase of this layer of tree by the probability of all building;
Build module, for according to every node layer of calculating by the probability of all building, the numbering of the every node layer using the numbering of above-mentioned block as binary tree, builds binary tree;
Test module, for the block of memory storage to be measured corresponding to each node serial number that dynamic test binary tree is newly-built;
Described test module, also for when occurring that a block of memory storage to be measured is tested and making mistake, prompting test crash, and the above-mentioned binary tree of stop building;
Described test module, when also passing through test for the memory storage block to be measured corresponding when newly-built each node serial number, prompting is tested successfully.
5. memory storage test macro according to claim 4, is characterized in that, described root node is the numbering being positioned at centre position in above-mentioned numbering.
6. memory storage test macro according to claim 4, is characterized in that, described default random algorithm is:
Every node layer is dark by the probability=1-0.04* every layer tree of all building.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105281977A (en) * | 2015-10-21 | 2016-01-27 | 北京软件产品质量检测检验中心 | Method and system for testing intelligent performance based on binary-tree algorithm |
| CN107480020A (en) * | 2017-08-10 | 2017-12-15 | 郑州云海信息技术有限公司 | A kind of method to the virtual volume test of storage system |
| CN109426592A (en) * | 2017-08-24 | 2019-03-05 | 上海交通大学 | A kind of disk detection method |
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- 2013-10-21 CN CN201310494768.4A patent/CN104575621A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105281977A (en) * | 2015-10-21 | 2016-01-27 | 北京软件产品质量检测检验中心 | Method and system for testing intelligent performance based on binary-tree algorithm |
| CN105281977B (en) * | 2015-10-21 | 2018-04-03 | 北京软件产品质量检测检验中心 | A kind of intelligent behaviour method of testing and system based on binary tree algorithm |
| CN107480020A (en) * | 2017-08-10 | 2017-12-15 | 郑州云海信息技术有限公司 | A kind of method to the virtual volume test of storage system |
| CN109426592A (en) * | 2017-08-24 | 2019-03-05 | 上海交通大学 | A kind of disk detection method |
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Application publication date: 20150429 |