CN104571718A - Touch panel and detection method thereof - Google Patents
Touch panel and detection method thereof Download PDFInfo
- Publication number
- CN104571718A CN104571718A CN201510063307.0A CN201510063307A CN104571718A CN 104571718 A CN104571718 A CN 104571718A CN 201510063307 A CN201510063307 A CN 201510063307A CN 104571718 A CN104571718 A CN 104571718A
- Authority
- CN
- China
- Prior art keywords
- those
- clock signal
- signal
- detecting unit
- order
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 75
- 230000008859 change Effects 0.000 claims abstract description 7
- 238000012360 testing method Methods 0.000 claims description 56
- 230000005611 electricity Effects 0.000 claims description 18
- 230000005540 biological transmission Effects 0.000 claims description 8
- 238000010586 diagram Methods 0.000 description 20
- 238000000034 method Methods 0.000 description 13
- 230000006698 induction Effects 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 9
- 230000004913 activation Effects 0.000 description 8
- 230000008569 process Effects 0.000 description 6
- 108010076504 Protein Sorting Signals Proteins 0.000 description 4
- 101150096245 SRL1 gene Proteins 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 101100136628 Arabidopsis thaliana PIF4 gene Proteins 0.000 description 1
- 101150032106 SRL2 gene Proteins 0.000 description 1
- 101150004071 SRR1 gene Proteins 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0412—Digitisers structurally integrated in a display
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0416—Control or interface arrangements specially adapted for digitisers
- G06F3/04166—Details of scanning methods, e.g. sampling time, grouping of sub areas or time sharing with display driving
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2203/00—Indexing scheme relating to G06F3/00 - G06F3/048
- G06F2203/041—Indexing scheme relating to G06F3/041 - G06F3/045
- G06F2203/04103—Manufacturing, i.e. details related to manufacturing processes specially suited for touch sensitive devices
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Human Computer Interaction (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Position Input By Displaying (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
A touch panel comprises electrode wires and a detection circuit, wherein the detection circuit comprises a driving unit and a detection unit. The driving unit sequentially outputs driving signals to the electrode lines according to the first clock signal to change the voltage level of the electrode lines. The two ends of the electrode wire are respectively coupled with the driving unit and the corresponding detection unit. The detecting unit sequentially scans the voltage level of the electrode lines according to a second clock signal and outputs a scanning signal, wherein the frequency of the first clock signal is different from the frequency of the second clock signal. The detection circuit generates a detection signal according to the scanning signal.
Description
Technical field
The invention relates to a kind of contact panel, and relate to a kind of contact panel with testing circuit especially.
Background technology
Recent years, the contact panel being used as input media has been installed in display device.After display device is equipped with contact panel, user can carry out touch control operation by finger or pen, and by this to display device input information.Therefore, contact panel is used in mobile phone, panel computer widely and utilizes other electronic installation of touch control operation.
Contact panel is generally volume production manufacture.But in manufacture process, the processing procedure due to contact panel has multiple step, when one of them step is made mistakes, the defect that contact panel may produce because of step for this reason and cannot operating, making to produce complete touch panel must scrap.That is, if the defective contact panel of tool continues to carry out successive process in product line, then the assembly assembled in successive process also must and then be scrapped, and manufacturing cost is increased.
Summary of the invention
One embodiment of this disclosure provides a kind of contact panel, comprises electrode wires and testing circuit.Testing circuit passes through the circuit of touch control electrode (Tx) both sides in contact panel as driver element and detecting unit, and in order to detect the connection status of the electrode wires in touch control electrode.Such as circuit connecting relation is normal, short circuit or open circuit.In addition, due to contact panel detected by testing circuit time, do not need collocation induction electrode (Rx), therefore can first detect touch control electrode.When induction electrode is assembled in after on contact panel, again carry out detecting the connection status that can confirm induction electrode.
One embodiment of the present invention provides a kind of contact panel, comprises electrode wires and testing circuit.Testing circuit comprises driver element and detecting unit.Driver element in order to according to the first clock signal sequentially output drive signal to electrode wires, to change the voltage quasi position of electrode wires.The two ends Fen Do of electrode wires couples driver element and corresponding detecting unit, detecting unit in order to according to the second clock signal sequentially scanning electrode wire voltage quasi position and export sweep signal, wherein the frequency of the first clock signal is different from the frequency of the second clock signal.Testing circuit produces detection signal according to sweep signal.
In some embodiments, the N level driver element of driver element is in order to export (N+1) level driver element of shift signal to driver element, and N is positive integer.N level driver element comprises the first shift scratch circuit and the first level converting unit.First shift scratch circuit in order to receive the shift signal of the first clock signal and the output of (N-1) level driver element, and produces the first control signal after reception shift signal.First level converting unit is in order to according to the first control signal output drive signal.
In some embodiments, the N level detecting unit of detecting unit is in order to export (N+1) level detecting unit of shift signal to detecting unit, and N is a positive integer.N level detecting unit comprises the second shift scratch circuit and the second level converting unit.Second shift scratch circuit in order to receive the shift signal of the second clock signal and the output of (N-1) level detecting unit, and produces one second control signal after reception shift signal.Second level converting unit is in order to scan the voltage quasi position of the one of corresponding electrode wires to export sweep signal according to the second control signal.
In some embodiments, contact panel more comprises the first end points and the second end points.First end points divides Do to be electrically connected to driver element and tool.A 2nd end point minute Do is electrically connected to detecting unit and tool.Tool via the first endpoint transmission first clock signal to driver element and via the second endpoint transmission second clock signal to detecting unit.
In some embodiments, contact panel more comprises driving chip.Driving chip is electrically connected to driver element, detecting unit and tool, and the first clock signal provided in order to Fen Do transmission tool and the second clock signal are to driver element and detecting unit.
In some embodiments, contact panel more comprises driving chip and flexible circuit board.Driving chip is electrically connected to driver element and detecting unit, in order to export the first clock signal to driver element and export the second clock signal to detecting unit.Flexible circuit board is electrically connected to driving chip and tool, in order to transmit the first clock signal and the second clock signal that tool provides to driving chip.
In some embodiments, contact panel more comprises driving chip, flexible circuit board, induced electricity polar curve, touch-control circuit plate and touch chip.Driving chip is electrically connected to driver element and detecting unit, in order to export the first clock signal to driver element and export the second clock signal to detecting unit.Flexible circuit board is electrically connected to driving chip and tool, in order to transmit the first clock signal and the second clock signal that tool provides to driving chip.Induced electricity polar curve is arranged in electrode wires, and wherein induced electricity polar curve becomes latticed with electrode wires.Touch-control circuit plate is electrically connected driving chip and induced electricity polar curve.Touch chip is electrically connected touch-control circuit plate, in order to scan the voltage quasi position of induced electricity polar curve.
One embodiment of this disclosure provides a kind of detection method of contact panel, comprises the following step.By driver element according to the first clock signal sequentially output drive signal to electrode wires, to change the voltage quasi position of electrode wires.By the voltage quasi position of detecting unit according to the second clock signal sequentially scanning electrode wire, to export sweep signal, wherein the frequency of the first clock signal is different from the frequency of the second clock signal.Detection signal is produced, to judge the connection status of each in electrode wires according to sweep signal.
In some embodiments, the frequency of the first clock signal is less than the frequency of the second clock signal, and the frequency of the second clock signal is between A times to 2A times of the frequency of the first clock signal, and wherein A is the quantity of driver element.
In some embodiments, detection method more comprises the first order detecting unit of input enabling signal to detecting unit, wherein inputs enabling signal equal with the quantity of driver element to the number of times of first order detecting unit.
In some embodiments, detection method more comprises the following step.Input the first order driver element of the first enabling signal to driver element.Input the first order detecting unit of the second enabling signal to detecting unit.The number of times inputting the first enabling signal is 1:X with the ratio of input the second enabling signal, and wherein X is the quantity of driver element.
Accompanying drawing explanation
Fig. 1 is the configuration schematic diagram according to contact panel first embodiment of the present invention;
Fig. 2 is the configuration schematic diagram according to driver element in contact panel of the present invention;
Fig. 3 is the configuration schematic diagram according to detecting unit in contact panel of the present invention;
Fig. 4 is the configuration schematic diagram according to contact panel second embodiment of the present invention;
Fig. 5 is the signal sequence schematic diagram of contact panel in time detecting of Fig. 4;
Fig. 6 is the signal sequence schematic diagram of electrode wires when different connection status of the contact panel of Fig. 4;
Fig. 7 is the upper schematic diagram according to contact panel of the present invention 3rd embodiment;
Fig. 8 is the upper schematic diagram according to contact panel of the present invention 4th embodiment;
Fig. 9 is the upper schematic diagram according to contact panel of the present invention 5th embodiment;
Figure 10 is the upper schematic diagram according to contact panel of the present invention 6th embodiment.
Wherein, Reference numeral:
100 contact panels
102 tools
110,110a-110e electrode wires
120 testing circuits
130,130a-130e driver element
132 first shift scratch circuits
134 first level converting units
140,140a-140e detecting unit
142 second shift scratch circuits
144 second level converting units
150 first end points
152 second end points
160 driving chip
162 flexible circuit boards
170 touch-control circuit plates
172 touch chip
180 induced electricity polar curves
190,190a, 190b pulse
SCAN_L1-SCAN_L5, SCAN_LN drive singal
SCAN_R1-SCAN_R5, SCAN_RN sweep signal
SCAN_out detection signal
CLK_L first clock signal
CLK_R second clock signal
CLK_L1, CLK_L2, CLK_R1, CLK_R2 clock signal
SRL [N], SRL [N+1], SRL1-SRL4, SRLN, SRR [N], SRL [N+1], SRR1-SRR4, SRRN shift signal
CTRL_L first control signal
CTRL_R, CTRL_R1-CTRL_R5 second control signal
V1 first current potential
V2 second current potential
V3 the 3rd current potential
STV_L first enabling signal
STV_R second enabling signal
T1, t2, t3, t4, t5 period
Embodiment
Hereafter institute's accompanying drawings is coordinated to elaborate for embodiment, but the embodiment provided also is not used to limit the scope that contains of the present invention, and the description of structure operation is not used to limit its order performed, any structure reconfigured by assembly, produce the device with impartial effect, be all the scope that the present invention is contained.In addition, graphic only for the purpose of description, do not map according to life size.For making to be convenient to understand, in following explanation, same components illustrates with identical symbology.
About " first " used herein, " second " ... Deng, the not special meaning of censuring order or cis-position, is also not used to limit the present invention, and it is only used to distinguish the assembly or operation that describe with constructed term.
Within " about " used herein, " approximately " or " roughly " the commonly error of exponential quantity or scope 20 about percent, being within about 10 preferably, is then more preferably about within percentage five.Wen Zhongruo is without clearly stating, and the numerical value mentioned by it all regards as approximate value, namely as " about ", " approximately " or the error represented by " roughly " or scope.
In addition, about " coupling " used herein or " connection ", all can refer to two or multiple assembly mutually directly make entity or in electrical contact, or mutually indirectly put into effect body or in electrical contact, also can refer to two or multiple assembly mutual operation or action.
General contact panel includes the touch-control circuit that drive electrode (Tx) and induction electrode (Rx) are formed, and user carries out touch-control by this touch-control circuit.After the electric capacity of touch-control circuit changes because of touch-control, controller calculates position of touch by capacitance variations value again.But when touch-control circuit cannot operate in there is the situation of not expecting, such as, when touch-control circuit is short-circuited or open a way, this situation of not expecting also cannot judge it is occur in drive electrode in touch-control circuit or induction electrode.Moreover this situation of not expecting also cannot analyzedly go out caused due to short circuit or open circuit.
In view of this, contact panel of the present invention comprises electrode wires and testing circuit, and wherein electrode wires and testing circuit are the drive electrode part in contact panel.In the manufacture process of contact panel, after drive electrode is formed, contact panel namely by electrode wires and testing circuit testing circuit connection status whether normal.Therefore, contact panel can detect that circuit connection state is with or without the connection state occurring not expect early, such as short circuit or open circuit.In addition, in each production phase follow-up, contact panel also can continue to carry out detecting circuit connection state, to guarantee that the contact panel carrying out follow-up assembling processing procedure is flawless contact panel by tool.
Please refer to Fig. 1, Fig. 1 is the configuration schematic diagram according to contact panel 100 first embodiment of the present invention.Contact panel 100 comprises electrode wires 110 and testing circuit 120.Testing circuit 120 comprises driver element 130 and detecting unit 140.Driver element 130 in order to according to the first clock signal CLK_L sequentially output drive signal SCAN_L1-SCAN_LN to electrode wires 110, to change the voltage quasi position of electrode wires 110.The two ends Fen Do of electrode wires 100 couples driver element 130 and corresponding detecting unit 140.Detecting unit 140 in order to according to the second clock signal CLK_R sequentially scanning electrode wire 140 voltage quasi position and export sweep signal SCAN_R1-SCAN_RN, wherein the frequency of the first clock signal CLK_L is different from the frequency of the second clock signal CLK_R.Testing circuit 120 produces detection signal SCAN_out according to sweep signal SCAN_R1-SCAN_RN.Testing circuit 120 is connected to tool 102, and wherein tool 102 provides testing circuit 120 first clock signal CLK_L, the second clock signal CLK_R and voltage source, and in order to detection signal SCAN_out that receiving test circuit 120 sends.
In Fig. 1, after tool 102 receives the detection signal SCAN_out that testing circuit 120 sends, in contact panel 100, the connection status of electrode wires 110 can be judged by the waveform of detection signal SCAN_out, wherein the connection status of electrode wires 110 comprise normally, short circuit or open circuit.That is, by detection signal SCAN_out, whether contact panel 100 can be detected has defect.
In contact panel 100, testing circuit 120 and electrode wires 110 are a part of drive electrode (Tx), that is contact panel 100 does not need to form testing circuit 120 and electrode wires 110 by additional process.Moreover after the drive electrode of contact panel 100 is formed, testing circuit 120 induction electrode (Rx) of need not arranging in pairs or groups can start to detect.In addition, because the frequency of the first clock signal CLK_L is different from the frequency of the second clock signal CLK_R, testing circuit 120 detects one by one for the voltage quasi position of each electrode wires 110.
For example, the frequency of the first clock signal CLK_L in some embodiments is less than the frequency of the second clock signal CLK_R.As driver element 130a output drive signal SCAN_L1 to electrode wires 110a, electrode wires 110a is defined as noble potential, and the voltage quasi position of other electrode wires 110 is defined as electronegative potential.Then, detecting unit 140 starts the voltage quasi position of sequentially scanning electrode wire 110, be less than the condition of the frequency of the second clock signal CLK_R in the frequency of the first clock signal CLK_L under, detecting unit 140 will complete the scanning of many strip electrodes line 110 during driver element 130a output drive signal SCAN_L1, and wherein each electrode wires 110 is all scanned by connected detecting unit 140.
During driver element 130a output drive signal SCAN_L1, and under electrode wires 110 connection state is all normal situation, the scanning result corresponding to electrode wires 110a due to detecting unit 140a is noble potential, and therefore its sweep signal SCAN_R1 exported also is noble potential.And be electronegative potential because detecting unit 140b and 140c corresponds to the scanning result of electrode wires 110b and 110c, therefore its sweep signal SCAN_R2 exported and SCAN_R3 is electronegative potential.
Therefore, when normal connection state, the detection signal SCAN_out produced according to sweep signal SCAN_R1-SCAN_RN has a pulse of corresponding sweep signal SCAN_R1.On the other hand, when connection state for not expecting, detection signal SCAN_out differs from the waveform of normal connection state by having.
That is, by sequentially detecting one by one electrode wires 110, when detection signal SCAN_out has the waveform differing from normal connection state, electrode wires 110 can be judged as the connection state that generation is not expected.Moreover by the waveform of detection signal SCAN_out, electrode wires 110 further analyzed occurred again can not expect that connection state is short circuit or open circuit.
In addition, because testing circuit 120 is that sequentially output drive signal SCAN_L1-SCAN_LN is to electrode wires 110 one by one, the driver element 130 therefore in testing circuit 120 is also be sequential start.In some embodiments, the N level driver element 130 of driver element 130 is in order to export (N+1) level driver element 130 of shift signal SRLN to driver element 130, and wherein N is positive integer.Such as, driver element 130a exports shift signal SRL1 to driver element 130b, and drives driver element 130b by this.Then, driver element 130b exports shift signal SRL2 again to driver element 130c, and drives driver element 130c by this, to complete the sequential start of driver element 130.
But should be appreciated that, above lifted detection signal SCAN_out outbound course is only illustration, and be not used to limit the present invention.Due to the circuit that the driver element 130 in testing circuit 120 and detecting unit 140 are symmetrical, persond having ordinary knowledge in the technical field of the present invention, can according to actual needs, and elasticity selects the transmission direction of drive singal SCAN_L1-SCAN_LN.In present embodiment, drive singal SCAN_L1-SCAN_LN is that the left side of self-detection circuit 120 is sent to right side, and then testing circuit 120 scans with the circuit on right side again.In some embodiments, drive singal SCAN_L1-SCAN_LN is that the right side of self-detection circuit 120 is sent to left side, and then testing circuit 120 scans with the circuit in left side again.
Please see Fig. 2, Fig. 2 is the configuration schematic diagram according to driver element 130 in contact panel 100 of the present invention.Fig. 2 represents and one of them of Fig. 1 driver element 130 represents at this with N level driver element 130.N level driver element 130 comprises the first shift scratch circuit 132 and the first level converting unit 134.First shift scratch circuit 132 in order to receive the shift signal SRL [N-1] of the first clock signal CLK_L and the output of (N-1) level driver element 130, and produces the first control signal CTRL_L afterwards in reception shift signal SRL [N-1].First level converting unit 134 is in order to according to the first control signal CTRL_L output drive signal SCAN_LN.
Described in the same, the driver element 130 in testing circuit 120 (asking for an interview Fig. 1) is sequential start, and therefore the first shift scratch circuit 132 is also in order to export shift signal SRL [N] to (N+1) level driver element 130.Specifically, after N level driver element 130 receives shift signal SRL [N-1], N level driver element 130 output drive signal SCAN_LN.After N level driver element 130 completes output drive signal SCAN_LN, N level driver element 130 exports shift signal SRL [N] again to (N+1 level) driver element 130.
In addition, in some embodiments, the first level converting unit 134 is connected to the first current potential V1 and the second current potential V2, and wherein the first current potential V1 and the second current potential V2 can be provided by tool 102 (asking for an interview Fig. 1).First current potential V1 is greater than the second current potential V2, and the second current potential V2 can be such as earthing potential, but not as limit.
After the first level converting unit 134 receives the first control signal CTRL_L, the drive singal SCAN_LN exported has the current potential identical with the first current potential V1.Otherwise when the first level converting unit 134 not yet receives the first control signal CTRL_L, the drive singal SCAN_LN exported has the current potential identical with the second current potential V2.
Further, not yet receiving shift signal SRL, [under N-1] Qing Condition, the drive singal SCAN_LN that the first level converting unit 134 exports has the current potential identical with the second current potential V2 to N level driver element 130.Moreover because the first current potential V1 is greater than the second current potential V2, the drive singal SCAN_LN that therefore N level driver element 130 exports has pulse.
Go back to Fig. 1.Similarly, because testing circuit 120 is voltage quasi positions of sequentially scanning electrode wire 110, the detecting unit 140 therefore in testing circuit 120 is also all sequential start.In some embodiments, the N level detecting unit 140 of detecting unit 140 is in order to export (N+1) level detecting unit 140 of shift signal SRRN to detecting unit 140, and wherein N is positive integer.Such as, detecting unit 140a exports shift signal SRR1 to detecting unit 140b, and drives detecting unit 140b by this.Then, detecting unit 140b exports shift signal SRR2 again to detecting unit 140c, and drives detecting unit 140c by this, to complete the sequential start of detecting unit 140.
Please see Fig. 3, Fig. 3 is the configuration schematic diagram according to detecting unit 140 in contact panel 100 of the present invention.Fig. 3 represents and one of them of Fig. 1 detecting unit 140 represents at this with N level detecting unit 140.N level detecting unit 140 comprises the second shift scratch circuit 142 and the second level converting unit 144.Second shift scratch circuit 142 in order to receive the shift signal SRR [N-1] of the second clock signal CLK_R and the output of (N-1) level detecting unit 140, and produces the second control signal CTRL_R afterwards in reception shift signal SRR [N-1].Second level converting unit 144 is in order to scan the voltage quasi position of the one of corresponding electrode wires 110 (asking for an interview Fig. 1) to export sweep signal SCAN_RN according to the second control signal CTRL_R.Further, to produce the frequency of the second control signal CTRL_R identical with the frequency of the second clock signal CLK_R for the second shift scratch circuit 142.Therefore, to scan the frequency of frequency also with the second clock signal CLK_R of the voltage quasi position of counter electrode line 100 identical for the second level converting unit 144.
Described in the same, the detecting unit 140 in testing circuit 120 (asking for an interview Fig. 1) is sequential start, and therefore the second shift scratch circuit 142 is also in order to export shift signal SRR [N] to (N+1) level detecting unit 140.Specifically, after N level detecting unit 140 receives shift signal SRR [N-1], N level detecting unit 140 starts the voltage quasi position scanning corresponding electrode wires 110 (asking for an interview Fig. 1).After N level detecting unit 140 is scanned, N level detecting unit 140 exports shift signal SRR [N] again to (N+1) level detecting unit 140.
In addition, in some embodiments, the second level converting unit 144 is connected to the 3rd current potential V3, and wherein the 3rd current potential V3 can be provided by tool 102 (asking for an interview Fig. 1).3rd current potential V3 can be such as earthing potential, or identical with the second current potential V2 (asking for an interview Fig. 2), but not as limit.
When the first level converting unit 144 carries out the scanning of electrode wires 110 (asking for an interview Fig. 1), receive corresponding drive singal SCAN_LN (that is corresponding pressure-wire is noble potential) if having, then output voltage level is equal to the sweep signal SCAN_RN of SCAN_LN.Otherwise, when the first level converting unit 144 carries out the scanning of electrode wires, if do not receive corresponding drive singal SCAN_LN (that is corresponding electrode wires is electronegative potential), then the sweep signal SCAN_RN of the equivalent second current potential V2 (asking for an interview Fig. 2) of output voltage level.Therefore, between detection period, when N level detecting unit 140 scans sweep signal SCAN_RN (or scanning noble potential), the sweep signal SCAN_RN that N level detecting unit 140 exports has pulse.
Below describe and the relation of signal each when detecting contact panel is further described.
Referring to Fig. 4 and Fig. 5.Fig. 4 is the configuration schematic diagram according to contact panel 100 second embodiment of the present invention, and Fig. 5 is the signal sequence schematic diagram of contact panel 100 in time detecting of Fig. 4.The difference of the present embodiment and the first embodiment is that the contact panel 100 of the present embodiment has five strip electrode line 110a-110e, and testing circuit 120 has five driver element 130a-130e and five scanning element 140a-140e.
In the present embodiment, the detection method of contact panel 100 comprises the following step.First, by driver element 130a-130e according to the first clock signal CLK_L sequentially output drive signal SCAN_L1-SCAN_L5 to electrode wires 110a-110e, to change the voltage quasi position of electrode wires 110a-110e.Then, by the voltage quasi position of detecting unit 140a-140e according to the second clock signal CLK_R sequentially scanning electrode wire 110a-110e, to export sweep signal SCAN_R1-SCAN_R5, wherein the frequency of the first clock signal CLK_L is different from the frequency of the second clock signal CLK_R.Finally, produce detection signal SCAN_out according to sweep signal SCAN_R1-SCAN_R5, to judge the connection status of each in electrode wires 110a-110e.
In some embodiments, the frequency of the first clock signal CLK_L is less than the frequency of the second clock signal CLK_R, wherein the frequency of the second clock signal CLK_L is between A times to 2A times of the frequency of the first clock signal CLK_R, and wherein A is the quantity of driver element 130a-130e.In the present embodiment, driver element 130a-130e quantity is 5, and therefore the frequency of the second clock signal CLK_L is between 5 times to 10 times of the frequency of the first clock signal CLK_R.
In Fig. 5, the frequency of the second clock signal CLK_R is roughly 6 times of the first clock signal CLK_L.Under this frequency ratio, in during each driver element 130a-130e output drive signal SCAN_L1-SCAN_L5, detecting unit 140a-140e can sequentially and complete scanning to electrode wires 110a-110e one by one.
In addition, the clock signal that the clock signal that receives of driver element 130a, 130c, 130e and driver element 130b and 130d receive is set to anti-phase.Such as, as shown in Figure 5, the first clock signal CLK_L comprises clock signal CLK_L1 in Fig. 5 and clock signal CLK_L2.In section Example, driver element 130a, 130c, 130e are configured to receive clock signal CLK_L1, and driver element 130b and 130d is configured to receive clock signal CLK_L2.Or in another part embodiment, driver element 130a, 130c, 130e are configured to receive clock signal CLK_L2, and driver element 130b and 130d is configured to receive clock signal CLK_L1.
Similarly, the second clock signal CLK_R comprises clock signal CLK_R1 in Fig. 5 and clock signal CLK_R2.The clock signal that detecting unit 140a, 140c, 140e and detecting unit 140b and 140d are received is set to anti-phase, does not repeat them here.
Below describe under taking the connection status of electrode wires 110a-110e as normal situation, each step is illustrated further.For convenience of description, in Fig. 5, driver element 130a-130e will divide into 5 period t1-t5 according to the drive singal SCAN_L1-SCAN_L5 that the first clock signal CLK_L sequentially exports.Such as, driver element 130a sends drive singal SCAN_L1 during period t1, and making electrode wires 110a during period t1 is noble potential.
In time detecting beginning, tool 102 provides driver element 130a first enabling signal STV_L.After driver element 130a receives the first enabling signal STV_L, driver element 130a sends drive singal SCAN_L1 to electrode wires 110a.In addition, during driver element 130a receives the first enabling signal STV_L, tool 102 also provides detecting unit 140a second enabling signal STV_R.
Detecting unit 140a-140e Fen Do sequentially scans electrode wires 110a-110e.Described in the same, when producing the second control signal CTRL_R1-CTRL_R5 in detecting unit 140a-140e, detecting unit 140a-140e just can scan corresponding electrode wires 110a-110e, and wherein the frequency of the second control signal CTRL_R1-CTRL_R5 is identical with the frequency of the second clock signal CLK_R.Therefore, detecting unit 140a-140e Shi Fen Do scans during the activation of the second control signal CTRL_R1-CTRL_R5.Then, detecting unit 140a-140e exports sweep signal SCAN_R1-SCAN_R5 according to scanning result Fen Do again, produces detection signal SCAN_out with superposition.
In period t1, electrode wires 110a is noble potential, and electrode wires 110b-110e is electronegative potential.That is, time during detecting unit 140a corresponds to the activation of the second control signal CTRL_R1, the scanning result of detecting unit 140a is the noble potential corresponding to electrode wires 110a.Similarly, time during detecting unit 140b-140e corresponds to the activation of the second control signal CTRL_R2-CTRL_R5 respectively, the scanning result of detecting unit 140b-140e is the electronegative potential corresponding to electrode wires 110b-110e.
Therefore, in during period t1, the sweep signal SCAN_R1 that detecting unit 140a sends is noble potential (being same as the current potential of electrode wires 110a), and the sweep signal SCAN_R2-SCAN_R5 that detecting unit 140b-140e sends is electronegative potential (being same as the current potential of electrode wires 110b-110e).Also therefore, according to the result of the sweep signal SCAN_R1-SCAN_R5 in period t1, the detection signal SCAN_out that testing circuit 120 exports in period t1 has the pulse (or during the activation of the second control signal CTRL_R1 in corresponding detecting unit 140a) of a corresponding sweep signal SCAN_R1.
At the end of period t1, driver element 130a exports shift signal SRL1 to driver element 130b, and uses driving driver element 130b output drive signal SCAN_L2.In addition, because detecting unit 140a-140e sequentially scanned one takes turns, therefore tool 120 inputs the second enabling signal STV_R to detecting unit 140a, again to start to carry out the scanning of detecting unit 140a-140e to electrode wires 110a-110e.
Similarly, in period t2, driver element 130b sends drive singal SCAN_L2 to electrode wires 110b, make electrode wires 110b be noble potential, and electrode wires 110a and 110c-110e is electronegative potential.Therefore, time during detecting unit 140b corresponds to the activation of the second control signal CTRL_R2, the scanning result of detecting unit 140b is the noble potential corresponding to electrode wires 110b.Otherwise, time during detecting unit 140a and 140c-140e corresponds to the activation of the second control signal CTRL_R1 and CTRL_R3-CTRL_R5 respectively, the scanning result of detecting unit 140a and 140c-140e is the electronegative potential corresponding to electrode wires 110a and 110c-110e.
Therefore, in during period t2, the sweep signal SCAN_R2 that detecting unit 140b sends is noble potential (being same as the current potential of electrode wires 110b), and the sweep signal SCAN_R1 that detecting unit 140a and 140c-140e sends and SCAN_R3-SCAN_R5 is electronegative potential (being same as the current potential of electrode wires 110b-110e).Similarly, according to the result of the sweep signal SCAN_R1-SCAN_R5 in period t2, the detection signal SCAN_out that testing circuit 120 exports has the pulse (or during the activation corresponding to the second control signal CTRL_R2 in detecting unit 140b) of a corresponding sweep signal SCAN_R2.
After the period, t2 terminated, testing circuit 120 sequentially carries out the detection of following sessions t3-t5 again with same steps, to complete the connection status judging each in electrode wires 110a-110e.After the period, t5 terminated, be a complete scan to contact panel 100.And when electrode wires 110a-110e is normal connection status, detection signal SCAN_out has 5 pulses, and these 5 pulses are during detecting unit 140a-140e scans the activation of electrode wires 110a-110e noble potential in corresponding period t1-t5 respectively.
In addition, at the beginning of the scanning of each period t1-t5, detecting unit 140a-140e first receives by detecting unit 140a the second enabling signal STV_R that tool 102 exports, again by shift signal SRR1-SRR4 sequential start, to start to carry out the sequentially scanning of detecting unit 140a-140e to electrode wires 110a-110e.In the present embodiment, testing circuit 120 has 5 driver element 130a-130e, is therefore roughly divided into 5 period t1-t5 between detection period.That is, in detection period once, the detecting unit 140a in detecting unit 140a-140e amounts to the second enabling signal STV_R that reception exports from tool 102 for 5 times.
Furthermore, when the driver element quantity corresponding to detection method of the present invention is different, the enabling signal number of times that the institute of the first order detecting unit in detecting unit receives from tool output is also different.In some embodiments, detection method more comprises the first order detecting unit of input enabling signal to detecting unit, wherein inputs enabling signal equal with the quantity of driver element to the number of times of first order detecting unit.
Moreover provide the driver element 130a first enabling signal STV_L in driver element 130a-130e when tool 102 after, driver element 130b-130e is by shift signal SRL1-SRL4 sequential start.In detection period, the first order driver element 130a in tool 102 couples of driver element 130a-130e provides the number of times of the first enabling signal STV_L to be 1 time.On the other hand, between detection period, the first order detecting unit 140a in tool 102 couples of detecting unit 140a-140e provides the number of times of the second enabling signal STV_R to be 5 times.That is tool 102 Fen Do provides the ratio of first order driver element 130a and first order detecting unit 140a first enabling signal STV_L and the second enabling signal STV_R to be 1:X, and wherein X is the quantity of driver element 130a-130e.
Similarly, when the driver element quantity corresponding to detection method of the present invention is different, the ratio that first order driver element and first order detecting unit divide Do to receive the first enabling signal and the second enabling signal is also different.In some embodiments, detection method more comprises the following step.Input the first order driver element of the first enabling signal to driver element.Input the first order detecting unit of the second enabling signal to detecting unit.The number of times inputting the first enabling signal is 1:X with the ratio of input the second enabling signal, and wherein X is the quantity of driver element.
Be the signal sequence schematic diagram of electrode wires 110a-110e when different connection status of the contact panel 100 of Fig. 4 referring to Fig. 4 and Fig. 6, Fig. 6.In below describing, do normal, short circuit and open circuit three kinds of connection status explanations by dividing with the electrode wires 110a-110e of contact panel.
Described in the same, when the connection status of electrode wires 110a-110e is normal, namely contact panel 100 can normal operation time, the detection signal SCAN_out waveform that testing circuit 120 exports is by shown in the normal oscillogram in such as Fig. 6.In normal oscillogram, detection signal SCAN_out has 5 pulses 190, wherein has the identical time interval between pulse 190.
When the electrode wires 110a-110e in contact panel 100 is short-circuited, the detection signal SCAN_out waveform that testing circuit 120 exports will have continuous print pulse.Then, according to continuous print pulse in detection signal SCAN_out, the position that electrode wires 110a-110e is short-circuited can further be judged out.
For example, as the electrode wires 110b in Fig. 4 contact panel 100 and 110c short circuit, the detection signal SCAN_out that testing circuit 120 exports is by shown in the short circuit oscillogram in such as Fig. 6.In short circuit oscillogram, detection signal SCAN_out have 3 pulses 190 identical with normal oscillogram and 2 continue between relatively long pulse 190a and 190b.Pulse 190a and 190b drops on period t2 and t3 respectively, and corresponds to the result of scanning electrode wire 110b and 110c.
According to the result of short circuit oscillogram, because electrode wires 110b and 110c is short circuit, as driver element 130b output drive signal SCAN_L2, the voltage quasi position of electrode wires 110b and 110c is all noble potential.Similarly, as driver element 130c output drive signal SCAN_L3, the voltage quasi position of electrode wires 110b and 110c is also all noble potential.
Specifically, in period t2, the voltage quasi position of electrode wires 110b and 110c is all noble potential, and therefore the scanning result of detecting unit 140b and 140c is the noble potential corresponding to electrode wires 110b and 110c.Then, detecting unit 140b and 140c exports the sweep signal SCAN_R2-SCAN_R3 of counter electrode line 110b and 110c noble potential respectively.
In the same manner, in period t3, the voltage quasi position of electrode wires 110b and 110c is still all noble potential, and therefore the scanning result of detecting unit 140b and 140c is still for corresponding to the noble potential of electrode wires 110b and 110c.Then, detecting unit 140b and 140c again Fen Do export the sweep signal SCAN_R2-SCAN_R3 of the noble potential of counter electrode line 110b and 110c.
In addition, due to 2 in Fig. 6 continue between relatively long pulse 190a and 190b drop on period t2 and t3, and it is respectively the result of corresponding scanning electrode wire 110b and 110c.Therefore, according to the result of short circuit oscillogram, detection method of the present invention can judge that the short circuit of contact panel 100 occurs in electrode wires 110b and 110c.
But should be appreciated that, above lifted short circuit oscillogram is only illustration, and is not used to limit detection method of the present invention.In fact, the position difference that short circuit oscillogram may be short-circuited because of electrode wires or the resistance difference of electrode wires, and slightly different from the short circuit oscillogram of Fig. 6.
On the other hand, when the electrode wires 110a-110e connection status in contact panel 100 is for open circuit, the detection signal SCAN_out waveform that testing circuit 120 exports will be different from normal oscillogram and short circuit oscillogram.In addition, when the waveform of detection signal SCAN_out differs from normal oscillogram and short circuit oscillogram, in order to whether the electrode wires 110a-110e connection status detected in contact panel 100 is open circuit, can resistance circuit (not illustrating) be set in tool 102.Resistance circuit is in order to provide electrode wires 110a-110e voltage source, and the current potential that the person that makes, in electrode wires 110a-110e, open circuit occurs exports is provided by the voltage source of resistance circuit.
For example, the current potential of the voltage source provided when resistance circuit is identical with the second current potential V2 (asking for an interview Fig. 2) of driver element 130a-130e, and electrode wires 110d in contact panel 100 for open circuit time, the detection signal SCAN_out that testing circuit 120 exports is by shown in the first open circuit oscillogram in such as Fig. 6.Compared to normal oscillogram, the detection signal SCAN_out of the first open circuit oscillogram does not have pulse 190 in period t4.
When electrode wires 110d is open circuit, the electrode wires 110d be connected with detecting unit 140d cannot receive the drive singal SCAN_L4 that driver element 130d exports, and the current potential of sweep signal SCAN_R4 that therefore detecting unit 140d exports provided by the voltage source of resistance circuit.Moreover the current potential of the voltage source provided due to resistance circuit is identical with the second current potential V2 of driver element 130a-130e, therefore the position of the corresponding sweep signal SCAN_R4 of detection signal SCAN_out is all electronegative potential.
In addition, in section Example, the current potential that the voltage source of resistance circuit provides is less than the second current potential V2 of driver element 130a-130e.Under this configuration, when electrode wires 110d is for open circuit, the current potential of the position of the corresponding sweep signal SCAN_R4 of detection signal SCAN_out is all less than the electronegative potential in normal oscillogram, as shown in the second open circuit oscillogram in Fig. 6.
Specifically, when open circuit occurs electrode wires 110a-110d, corresponding detecting unit 140a-140d cannot receive the drive singal SCAN_L1-SCAN_L5 from driver element 130a-130e.Therefore, the current potential of the sweep signal SCAN_R1-SCAN_R5 that the detecting unit 140a-140d that corresponding generation is opened a way exports is defined by the voltage source of resistance circuit.Also therefore, persond having ordinary knowledge in the technical field of the present invention elasticity can select the current potential of voltage source of resistance circuit, using as the difference of the normal waveform of difference with open circuit waveform.
Similarly, above lifted open circuit oscillogram is only illustration, and is not used to limit detection method of the present invention.In fact, may there is the resistance difference of the different and electrode wires in the position of open circuit in open circuit oscillogram because of electrode wires, and slightly different from first and second of Fig. 6 oscillogram of opening a way.
In addition, ditto, the drive singal SCAN_L1-SCAN_L5 transmission direction in testing circuit 120 can by a left side from the right side or by left two kinds certainly, the right side.When electrode wires 110a-110e has the situation being short-circuited or opening a way, by carrying out this two kinds of transmission modes respectively, two detection signal SCAN_out that testing circuit 120 can be exported carry out intersection comparison, with the position being short-circuited or opening a way in further analyzing electrode line 110a-110e.
Comprehensively above-mentioned, contact panel of the present invention can after drive electrode be formed, and connection fixture is to start to detect.Because contact panel is mainly detected by testing circuit and electrode wires, the every one-phase therefore before the induction electrode of contact panel completes, detection method all can detect contact panel again.In following embodiment, explain carrying out detection to the contact panel in manufacture in different phase.
Please refer to Fig. 7, Fig. 7 is the upper schematic diagram according to contact panel 100 of the present invention 3rd embodiment.Contact panel 100 comprises electrode wires 110, testing circuit 120, first end points 150 and the second end points 152, and wherein testing circuit 120 comprises driver element 130 and detecting unit 140.First end points 150 is electrically connected to driver element 130 in testing circuit 120 and tool (not illustrating) respectively.Second end points 152 is electrically connected to detecting unit 140 in testing circuit 120 and tool respectively.Tool transmits the first clock signal CLK_L via the first end points 150 and transmits the second clock signal CLK_R to detecting unit 140 to driver element 130 and via the second end points 152.
In the present embodiment, tool exports the first clock signal CLK_L, the second clock signal CLK_R to electrode wires 110 and testing circuit 120, and as the voltage source of contact panel 100.In this stage, when by detection method find contact panel 100 have have do not expect connection state time, first can not expect that the contact panel 100 of connection state shifts out product line by having.That is, by the detection in this stage, can guarantee that the contact panel 100 entering next stage processing procedure has normal connection status, the bad product in processing procedure is removed early.In addition, in this stage, contact panel 100 is not yet assembled other assembly, such as chip or circuit board.Therefore, if contact panel 100 is detected the connection status having and do not expect, then because of being assembled with other assembly, and the waste on cost can not be caused.
Please refer to Fig. 8, Fig. 8 is the upper schematic diagram according to contact panel 100 of the present invention 4th embodiment.The difference of the present embodiment and the 3rd embodiment is that contact panel 100 more comprises driving chip 160.Driving chip 160 is electrically connected to driver element 130, detecting unit 140 and tool (not illustrating).Driving chip 160 transmits the first clock signal CLK_L of providing of tool and the second clock signal CLK_R to driver element 130 and detecting unit 140 in order to Fen Do.
In this stage, when driving chip 160 is assembled in after on contact panel 100, detection method is still by the connection state of tool detecting electrode line 110.After detection, then next stage processing procedure is carried out to the contact panel 100 with normal connection status.
Please refer to Fig. 9, Fig. 9 is the upper schematic diagram according to contact panel 100 of the present invention 5th embodiment.The difference of the present embodiment and the 3rd embodiment is that contact panel 100 more comprises driving chip 160 and flexible circuit board 162.Driving chip 160 is electrically connected to driver element 130 and detecting unit 140, in order to export the first clock signal CLK_L to driver element 130 and export the second clock signal CLK_R to detecting unit 140.Flexible circuit board 162 is electrically connected to driving chip 160 and tool (not illustrating), in order to transmit the first clock signal CLK_L and the second clock signal CLK_R that tool provides to driving chip 160.
In this stage, when driving chip 160 and flexible circuit board 162 are assembled in after on contact panel 100, detection method is still by the connection state of tool detecting electrode line 110.Similarly, after detection, then next stage processing procedure is carried out to the contact panel 100 with normal connection status.
Please refer to Figure 10, Figure 10 is the upper schematic diagram according to contact panel 100 of the present invention 6th embodiment.The difference of the present embodiment and the 3rd embodiment is that contact panel 100 more comprises driving chip 160, flexible circuit board 162, induced electricity polar curve 180, touch-control circuit plate 170 and touch chip 172.
Driving chip 172 is electrically connected to driver element 130 and detecting unit 140, in order to export the first clock signal CLK_L to driver element 130 and export the second clock signal CLK_R to detecting unit 140.Flexible circuit board 162 is electrically connected to driving chip 160 and tool (not illustrating), in order to transmit the first clock signal CLK_L and the second clock signal CLK_R that tool provides to driving chip 160.Induced electricity polar curve 180 is arranged in electrode wires 110, and induced electricity polar curve 180 is latticed with electrode wires 110 one-tenth.Touch-control circuit plate 170 is electrically connected driving chip 160 and induced electricity polar curve 180.Touch chip 172 is electrically connected touch-control circuit plate 170, in order to scan the voltage quasi position of induced electricity polar curve 180.
In this stage, when driving chip 160, flexible circuit board 162, induced electricity polar curve 180, touch-control circuit plate 170 and touch chip 172 are assembled in after on contact panel 100, detection method will detect the connection status of contact panel 100 by tool, the connection status of contact panel 100 comprises the connection status of electrode wires 110 and induced electricity polar curve 180.
In the manufacturing process of the contact panel 100 of previous stage (that is the contact panel 100 in Fig. 9), detection method first can confirm electrode wires 110 connection status in contact panel 100.Electrode wires 110 in previous stage is under normal connection status, if this stage contact panel 100 is detected when having the connection status of not expecting, then can judge that the connection status that this does not expect occurs on induced electricity polar curve 180.
In sum, contact panel of the present invention comprises electrode wires and testing circuit, and wherein testing circuit comprises driver element and detecting unit.Testing circuit is in order to the connection status by driver element and detecting unit detecting electrode line.Connection status such as comprises normally, short circuit and open circuit.Due to contact panel detected by testing circuit time, do not need arrange in pairs or groups induction electrode, therefore can first detect touch control electrode.When induction electrode is assembled in after on contact panel, again carry out detecting the connection status that can confirm induction electrode.
In addition, contact panel can detect in each production phase, and the annexation of therefore not expecting can be detected early.Moreover by detection method of the present invention, the contact panel can guaranteeing to enter successive process is normal connection status, and the bad product therefore in processing procedure is found early and shifts out product line.
Although the present invention discloses as above with embodiment; so itself and be not used to limit the present invention; any relevant technical staff in the field; without departing from the spirit and scope of the present invention; when being used for a variety of modifications and variations, therefore claims of the present invention is when being as the criterion depending on the accompanying application claims person of defining.
Claims (11)
1. a contact panel, is characterized in that, comprises:
Many strip electrodes line; And
One testing circuit, comprises:
Multiple driver element, in order to sequentially to export multiple drive singal to those electrode wires according to one first clock signal, to change the voltage quasi position of those electrode wires; And
Multiple detecting unit, wherein the two ends Fen Do of those electrode wires couples those driver elements and those corresponding detecting units, those detecting units are in order to sequentially to scan the voltage quasi position of those electrode wires according to one second clock signal and to export multiple sweep signal, and wherein the frequency of this first clock signal is different from the frequency of this second clock signal;
Wherein this testing circuit produces a detection signal according to this few sweep signal.
2. contact panel as claimed in claim 1, it is characterized in that, one N level driver element of those driver elements is in order to export one (N+1) level driver element of a shift signal to those driver elements, and N is a positive integer, and this N level driver element comprises:
One first shift scratch circuit, in order to receive this shift signal of this first clock signal and the output of this (N-1) level driver element, and produces one first control signal after this shift signal of reception; And
One first level converting unit, in order to export this drive singal according to this first control signal.
3. contact panel as claimed in claim 1, it is characterized in that, one N level detecting unit of those detecting units is in order to export one (N+1) level detecting unit of a shift signal to those detecting units, and N is a positive integer, and this N level detecting unit comprises:
One second shift scratch circuit, in order to receive this shift signal of this second clock signal and the output of this (N-1) level detecting unit, and produces one second control signal after this shift signal of reception; And
One second level converting unit, in order to scan the voltage quasi position of the one of those corresponding electrode wires to export this sweep signal according to this second control signal.
4. contact panel as claimed in claim 1, is characterized in that, more comprise:
Multiple first end points, a point Do is electrically connected to those driver elements and a tool; And
Multiple second end points ， Fen Do is electrically connected to those detecting units and this tool;
Wherein this tool via this first clock signal of this first endpoint transmission to those driver elements and via this second clock signal of this second endpoint transmission to those detecting units.
5. contact panel as claimed in claim 1, is characterized in that, more comprise:
One driving chip, is electrically connected to those driver elements, those detecting units and a tool, transmits this first clock signal and this second clock signal that this tool provides to those driver elements and those detecting units in order to Fen Do.
6. contact panel as claimed in claim 1, is characterized in that, more comprise:
One driving chip, is electrically connected to those driver elements and those detecting units, in order to export this first clock signal to those driver elements and export this second clock signal to those detecting units; And
One flexible circuit board, is electrically connected to this driving chip and a tool, in order to transmit this first clock signal and this second clock signal that this tool provides to this driving chip.
7. contact panel as claimed in claim 1, is characterized in that, more comprise:
One driving chip, is electrically connected to those driver elements and those detecting units, in order to export this first clock signal to those driver elements and export this second clock signal to those detecting units;
One flexible circuit board, is electrically connected to this driving chip and a tool, in order to transmit this first clock signal and this second clock signal that this tool provides to this driving chip;
Many induced electricity polar curves, are arranged in those electrode wires, and wherein those induced electricity polar curves become latticed with those electrode wires;
One touch-control circuit plate, is electrically connected this driving chip and those induced electricity polar curves; And
One touch chip, is electrically connected this touch-control circuit plate, in order to scan the voltage quasi position of those induced electricity polar curves.
8. a detection method for contact panel, is characterized in that, comprises:
Multiple drive singal strip electrode line at the most is sequentially exported, to change the voltage quasi position of those electrode wires according to one first clock signal by multiple driver element;
Sequentially scanned the voltage quasi position of those electrode wires according to one second clock signal by multiple detecting unit, to export multiple sweep signal, wherein the frequency of this first clock signal is different from the frequency of this second clock signal; And
A detection signal is produced, to judge the connection status of each in those electrode wires according to those sweep signals.
9. detection method as claimed in claim 8, it is characterized in that, the frequency of this first clock signal is less than the frequency of this second clock signal, and the frequency of this second clock signal is between A times to 2A times of the frequency of this first clock signal, and wherein A is the quantity of those driver elements.
10. detection method as claimed in claim 8, is characterized in that, more comprise:
Input the first order detecting unit of an enabling signal to those detecting units, wherein input this enabling signal equal with the quantity of those driver elements to the number of times of this first order detecting unit.
11. ask the detection method of 8 as claim, it is characterized in that, more comprise:
Input the first order driver element of one first enabling signal to those driver elements; And
Input the first order detecting unit of one second enabling signal to those detecting units, and the number of times inputting this first enabling signal is 1:X with the ratio of this second enabling signal of input, wherein X is the quantity of those driver elements.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW104100778A TWI560588B (en) | 2015-01-09 | 2015-01-09 | Touch panel and method for detecting the same |
| TW104100778 | 2015-01-09 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104571718A true CN104571718A (en) | 2015-04-29 |
| CN104571718B CN104571718B (en) | 2017-07-28 |
Family
ID=53087962
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510063307.0A Active CN104571718B (en) | 2015-01-09 | 2015-02-06 | Touch panel and detection method thereof |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US9612682B2 (en) |
| CN (1) | CN104571718B (en) |
| TW (1) | TWI560588B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105117713A (en) * | 2015-08-17 | 2015-12-02 | 友达光电股份有限公司 | Touch sensing circuit and control method thereof |
| CN105301431A (en) * | 2015-11-18 | 2016-02-03 | 蓝思科技（长沙）有限公司 | High-frequency shocking micro-circuit breaking test method and test system |
| CN107015702A (en) * | 2017-03-02 | 2017-08-04 | 南昌欧菲显示科技有限公司 | conductive module and touch screen |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111610872B (en) * | 2019-02-26 | 2023-07-07 | 敦泰电子有限公司 | Touch control method, circuit system and touch device |
| US11966525B2 (en) * | 2021-04-07 | 2024-04-23 | Novatek Microelectronics Corp. | Touch device with FPR function and operation method thereof |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5430460A (en) * | 1991-09-17 | 1995-07-04 | Hitachi, Ltd. | Method and apparatus for driving liquid crystal display unit |
| US6028577A (en) * | 1997-01-24 | 2000-02-22 | Nec Corporation | Active-matrix type liquid-crystal display |
| US6130654A (en) * | 1997-02-24 | 2000-10-10 | Kabushiki Kaisha Toshiba | Driving method of a liquid crystal display device |
| CN101308306A (en) * | 2008-07-15 | 2008-11-19 | 友达光电股份有限公司 | Liquid crystal display device possessing testing structure and related test method |
| TW201218632A (en) * | 2010-10-27 | 2012-05-01 | Au Optronics Corp | Shift register and touch device |
| TW201308148A (en) * | 2011-08-12 | 2013-02-16 | Zeitec Semiconductor Co Ltd | Test methods |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008020675A (en) | 2006-07-13 | 2008-01-31 | Mitsubishi Electric Corp | Image display apparatus |
| US7605793B2 (en) | 2006-08-29 | 2009-10-20 | Tpo Displays Corp. | Systems for display images including two gate drivers disposed on opposite sides of a pixel array |
| CN102859476B (en) * | 2010-11-11 | 2016-01-20 | 宸鸿科技(厦门)有限公司 | Uniaxially capacitance type multi-point touch-control system and touch control method thereof |
| TWI478018B (en) * | 2011-01-21 | 2015-03-21 | Egalax Empia Technology Inc | Method and device for inspecting the strips of a touch panel |
| US9122361B2 (en) * | 2011-05-19 | 2015-09-01 | Qualcomm Technologies, Inc. | Touch panel testing using mutual capacitor measurements |
| TW201335605A (en) * | 2012-02-24 | 2013-09-01 | Mirle Automation Corp | Detecting apparatus for detection lines of a touch panel and related method |
| KR101452097B1 (en) * | 2013-03-28 | 2014-10-16 | 삼성전기주식회사 | Touchscreen apparatus |
| US9714973B2 (en) * | 2014-11-21 | 2017-07-25 | Stmicroelectronics Asia Pacific Pte Ltd | Short circuit detection module |
-
2015
- 2015-01-09 TW TW104100778A patent/TWI560588B/en active
- 2015-02-06 CN CN201510063307.0A patent/CN104571718B/en active Active
- 2015-07-16 US US14/800,826 patent/US9612682B2/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5430460A (en) * | 1991-09-17 | 1995-07-04 | Hitachi, Ltd. | Method and apparatus for driving liquid crystal display unit |
| US6028577A (en) * | 1997-01-24 | 2000-02-22 | Nec Corporation | Active-matrix type liquid-crystal display |
| US6130654A (en) * | 1997-02-24 | 2000-10-10 | Kabushiki Kaisha Toshiba | Driving method of a liquid crystal display device |
| CN101308306A (en) * | 2008-07-15 | 2008-11-19 | 友达光电股份有限公司 | Liquid crystal display device possessing testing structure and related test method |
| TW201218632A (en) * | 2010-10-27 | 2012-05-01 | Au Optronics Corp | Shift register and touch device |
| TW201308148A (en) * | 2011-08-12 | 2013-02-16 | Zeitec Semiconductor Co Ltd | Test methods |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105117713A (en) * | 2015-08-17 | 2015-12-02 | 友达光电股份有限公司 | Touch sensing circuit and control method thereof |
| CN105117713B (en) * | 2015-08-17 | 2018-09-11 | 友达光电股份有限公司 | Touch sensing circuit and control method thereof |
| CN105301431A (en) * | 2015-11-18 | 2016-02-03 | 蓝思科技（长沙）有限公司 | High-frequency shocking micro-circuit breaking test method and test system |
| CN105301431B (en) * | 2015-11-18 | 2019-02-01 | 蓝思科技(东莞)有限公司 | A kind of micro- out of circuit test method of high-frequency percussion and test macro |
| CN107015702A (en) * | 2017-03-02 | 2017-08-04 | 南昌欧菲显示科技有限公司 | conductive module and touch screen |
Also Published As
| Publication number | Publication date |
|---|---|
| US9612682B2 (en) | 2017-04-04 |
| US20160202828A1 (en) | 2016-07-14 |
| TW201626183A (en) | 2016-07-16 |
| CN104571718B (en) | 2017-07-28 |
| TWI560588B (en) | 2016-12-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104571718A (en) | Touch panel and detection method thereof | |
| CN102221951B (en) | Operation method of capacitive touch panel and touch type naked-eye stereoscopic display | |
| CN103853408B (en) | Display device with touch detection function, drive method thereof, and electronic apparatus | |
| US9001080B2 (en) | Touch-panel device | |
| US8525798B2 (en) | Touch sensing | |
| CN103309495B (en) | There is the display device of integrated touch screen | |
| CN102693052B (en) | Touch sensing device and scanning method thereof | |
| CN102096509A (en) | Touch panel and method for reducing noise of common voltage coupling on touch panel | |
| US10627950B2 (en) | Touch control panel, terminal device and method for detecting touch point | |
| JP5160502B2 (en) | Capacitive touch panel | |
| CN104932134A (en) | Touch control display substrate | |
| CN102508105B (en) | Method for detecting capacitive touch screen by using near field | |
| CN102576271A (en) | Capacitive touch panel | |
| CN102346597A (en) | Method for judging touch position of touch panel | |
| CN102736774A (en) | Driving and sensing method of touch input device and module thereof | |
| US9354746B2 (en) | Capacitive touch panel | |
| CN104898907A (en) | Semiconductor device and electronic apparatus | |
| CN106462310B (en) | The method of the touch point of touch chip and touch chip detection touch screen | |
| US20130033445A1 (en) | Touch sensing apparatus and touch sensing method | |
| CN102609122B (en) | There is two contactor control device and the method for piezoelectricity touch-control and electromagnetic touch | |
| US20160188104A1 (en) | Position detecting device | |
| CN105117713A (en) | Touch sensing circuit and control method thereof | |
| CN109426401A (en) | For solving the multi-frequency scanning of the electric capacity panel of noise condition | |
| CN101989138A (en) | Touch panel device, sensing control device and control method of touch panel | |
| CN110082631B (en) | Test method and test device for touch panel |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |