CN104569513A - Insertion frame protection structure for probe of lattice structure body testing machine - Google Patents

Insertion frame protection structure for probe of lattice structure body testing machine Download PDF

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Publication number
CN104569513A
CN104569513A CN201510003411.0A CN201510003411A CN104569513A CN 104569513 A CN104569513 A CN 104569513A CN 201510003411 A CN201510003411 A CN 201510003411A CN 104569513 A CN104569513 A CN 104569513A
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CN
China
Prior art keywords
probe
bay
lattice structure
insertion frame
structure body
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201510003411.0A
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Chinese (zh)
Inventor
陈巧云
征建高
征茂德
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Suzhou Zhengzhihun Patent Technology Service Co Ltd
Original Assignee
Suzhou Zhengzhihun Patent Technology Service Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Suzhou Zhengzhihun Patent Technology Service Co Ltd filed Critical Suzhou Zhengzhihun Patent Technology Service Co Ltd
Priority to CN201510003411.0A priority Critical patent/CN104569513A/en
Publication of CN104569513A publication Critical patent/CN104569513A/en
Pending legal-status Critical Current

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Abstract

The invention discloses an insertion frame protection structure for a probe of a lattice structure body testing machine. The insertion frame protection structure comprises an insertion frame body. The insertion frame body comprises an insertion frame insertion tank, a body installation part and a cable winding and hanging part. The insertion frame insertion tank is located in the middle of the insertion frame body and formed by an insertion frame guide frustum tank at the upper portion, a probe head receding tank in the middle and a metal lantern ring at the lower portion in a sequentially-connected mode, the testing probe of the lattice structure body testing machine is inserted into the insertion frame insertion tank, and a cable or a lead of the testing probe can be wound around or hung on the cable winding and hanging part. By means of the insertion frame protection structure, the fragile probe of the lattice structure body testing machine can be protected in an all-directional mode, mechanical damage such as impacting, colliding, scratching and inserting can be prevented, the cable of the probe can be prevented from being damaged, the probe can be prevented from being chemically corroded and electrochemically corroded, the shape of the probe is well maintained, and the service life of the probe is greatly prolonged.

Description

Lattice structure body examination test-run a machine probe bay operator guards
Technical field
The present invention relates to a kind of fireworks testing tool, be specifically related to lattice structure body examination test-run a machine probe bay operator guards.
Background technology
Lattice structure body is the key components and parts realizing figure line fireworks, the display determining fireworks can accomplish the effect of user's request, also be that decision figure line fireworks can miniaturization, the critical component of integration, the volume of lattice structure body, dot matrix dense degree, shaping efficiency, the step of production cost and aft-loaded airfoil process all seriously constrains the holistic cost of figure line fireworks, security, reliability and production efficiency, lattice structure body needs precision die, precise forming, a large amount of accurate aftertreatment machining tool, quality testing instrument, shaping tool, tools for loading and anti-error, blast protection measure etc., the core component of figure line fireworks needs a large amount of inter-trade new and high technology supports across technical field and original daring to blaze new trails, the spirit that dare to test, existing every profession and trade lacks corresponding technical support, the data that particularly industry fireworks technical field can be for reference is so tragic that one cannot bear to look at it, need oneself to go developing everywhere.
The wire harness loop checkout equipment of fireworks lattice structure body production and application carries out the conducting quality testing of lattice structure body, the probe of wire harness testing authentication is had above the checkout equipment of wire harness loop, frequently probe is used in proper testing process, in swapping process frequently, probe is often careless because plugging, collided by other article after insertion, produce damage, distortion, bending, the defects such as fracture, or probe patchhole non through hole, bottom easily remains or is adsorbed with disintegrating slag, the materials such as waste liquid, chemical corrosion or couple corrosion is produced with end of probe, significantly shorten life-span and the sensitivity of probe.
Summary of the invention
The object of the invention is to the above problem overcoming prior art existence; lattice structure body examination test-run a machine probe bay operator guards is provided; the present invention can the probe of omnibearing protection good dot matrix structure test machine fragility; comprise and prevent from touching, hit, wipe, the mechanical type damage such as to insert; prevent probe cable from damaging; prevent probe chemical corrosion, prevent probe couple corrosion, significantly maintain shape and the serviceable life of probe.
For realizing above-mentioned technical purpose, reach above-mentioned technique effect, the present invention is achieved through the following technical solutions:
Lattice structure body examination test-run a machine probe bay operator guards, comprise bay body (1), described bay body (1) comprises bay insertion groove (2), body installation portion (3) and cable are around extension portion (4), described bay insertion groove (2) is positioned at bay body (1) middle part, described bay insertion groove (2) comprises bay guiding vertebra platform groove (5) on top, the end of probe escape groove (7) at middle part and the metal collar (8) of bottom are connected in sequence, the test probe (12) of lattice structure body examination test-run a machine is just inserted in bay insertion groove (2), cable or the lead-in wire of test probe can be wound around or put on a suit of armour at cable around extension portion (4).
Further, described body installation portion (3) is provided with connecting screw hole post (9) and reinforcement group.
Further, the both sides, top of described bay body (1) are respectively arranged with U-shaped open window (11) and closed through hole window (10).
Further, be provided with probe saddle (6) between described bay guiding vertebra platform groove (5) and end of probe escape groove (7), the described bus on bay guiding vertebra platform groove (5) surface and the angle of turning axle are 15-35 °.
Further, described end of probe escape groove (7) and test probe (12) are clearance fit, and gap size is 0.25-2mm.
Further, described metal collar (8) electroplate, silver-plated thickness is 12-25 μm.The invention has the beneficial effects as follows:
Can the probe of omnibearing protection good dot matrix structure test machine fragility, comprise and prevent from touching, hit, wipe, the mechanical type damage such as to insert, prevent probe cable from damaging, prevent probe chemical corrosion, prevent probe couple corrosion, significantly maintain shape and the serviceable life of probe.
Above-mentioned explanation is only the general introduction of technical solution of the present invention, in order to better understand technological means of the present invention, and can be implemented according to the content of instructions, coordinates accompanying drawing to be described in detail as follows below with preferred embodiment of the present invention.The specific embodiment of the present invention is provided in detail by following examples and accompanying drawing thereof.
Accompanying drawing explanation
Accompanying drawing described herein is used to provide a further understanding of the present invention, and form a application's part, schematic description and description of the present invention, for explaining the present invention, does not form inappropriate limitation of the present invention.In the accompanying drawings:
Fig. 1 is that master of the present invention looks cross-sectional schematic;
Fig. 2 is side schematic view of the present invention;
Fig. 3 is schematic top view of the present invention;
Fig. 4 is test probe schematic diagram of the present invention;
Fig. 5 is the front sectional view after test probe of the present invention and bay main body are assembled;
Fig. 6 is that test probe of the present invention and bay main body assemble rear axle side observation figure.
Number in the figure illustrates: 1, bay body, 2, bay insertion groove, 3, body installation portion, 4, cable is around extension portion, 5, bay guiding vertebra platform groove, 6, probe saddle, 7, end of probe escape groove, 8, metal collar, 9, connecting screw hole post, 10, closed through hole window, 11, U-shaped open window, 12, test probe.
Embodiment
Below with reference to the accompanying drawings and in conjunction with the embodiments, describe the present invention in detail.
Shown in Fig. 1-Fig. 6, lattice structure body examination test-run a machine probe bay operator guards, comprise bay body 1, described bay body 1 comprises bay insertion groove 2, body installation portion 3 and cable are around extension portion 4, described bay insertion groove 2 is positioned in the middle part of bay body 1, described bay insertion groove 2 comprises the bay guiding vertebra platform groove 5 on top, the end of probe escape groove 7 at middle part and the metal collar 8 of bottom are connected in sequence, the test probe 12 of lattice structure body examination test-run a machine is just inserted in bay insertion groove 2, cable or the lead-in wire of test probe can be wound around or put on a suit of armour at cable around extension portion 4.
Further, described body installation portion 3 is provided with connecting screw hole post 9 and reinforcement group.
Further, the both sides, top of described bay body 1 are respectively arranged with U-shaped open window 11 and closed through hole window 10.
Further, be provided with probe saddle 6 between described bay guiding vertebra platform groove 5 and end of probe escape groove 7, the described bay guiding bus on vertebra platform groove 5 surface and the angle of turning axle are 15-35 °.
Further, described end of probe escape groove 7 is clearance fit with test probe 12, and gap size is 0.25-2mm.
Further, described metal collar 8 electroplate, silver-plated thickness is 12-25 μm.The principle of work of the present embodiment is as follows:
Test probe 12 is inserted in the bay insertion groove 2 of bay body 1, because the bay guiding bus on vertebra platform groove 5 surface and the angle of turning axle are 15-35 °, be easy to directly be inserted into bottom, limit by probe saddle 6, test probe 12 local is fixed, but other positions are unsettled, because end of probe escape groove 7 and metal collar 8 are through hole, raffinate can not be taken in, and metal collar 8 has silver coating, self is not easy corrosion, and do not adsorb the material that can damage test probe 12, test probe 12 head receives good protection, after being plugged test probe 12, make test probe 12 connection cable below again in order, with U-shaped open window 11, closed through hole window 10 and cable are protected around extension portion 4 and are fixedly connected with cable, prevent connection cable from producing unnecessary damage.
The foregoing is only the preferred embodiments of the present invention, be not limited to the present invention, for a person skilled in the art, the present invention can have various modifications and variations.Within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.

Claims (6)

1. lattice structure body examination test-run a machine probe bay operator guards, it is characterized in that, comprise bay body (1), described bay body (1) comprises bay insertion groove (2), body installation portion (3) and cable are around extension portion (4), described bay insertion groove (2) is positioned at bay body (1) middle part, described bay insertion groove (2) comprises bay guiding vertebra platform groove (5) on top, the end of probe escape groove (7) at middle part and the metal collar (8) of bottom are connected in sequence, the test probe (12) of lattice structure body examination test-run a machine is just inserted in bay insertion groove (2), cable or the lead-in wire of test probe can be wound around or put on a suit of armour at cable around extension portion (4).
2. lattice structure body examination test-run a machine probe bay operator guards according to claim 1, is characterized in that: described body installation portion (3) is provided with connecting screw hole post (9) and reinforcement group.
3. lattice structure body examination test-run a machine probe bay operator guards according to claim 1, is characterized in that: the both sides, top of described bay body (1) are respectively arranged with U-shaped open window (11) and closed through hole window (10).
4. lattice structure body examination test-run a machine probe bay operator guards according to claim 1; it is characterized in that: be provided with probe saddle (6) between described bay guiding vertebra platform groove (5) and end of probe escape groove (7), the described bus on bay guiding vertebra platform groove (5) surface and the angle of turning axle are 15-35 °.
5. lattice structure body examination test-run a machine probe bay operator guards according to claim 4, is characterized in that: described end of probe escape groove (7) and test probe (12) are clearance fit, and gap size is 0.25-2mm.
6. lattice structure body examination test-run a machine probe bay operator guards according to claim 1, it is characterized in that: described metal collar (8) electroplate, silver-plated thickness is 12-25 μm.
CN201510003411.0A 2015-01-05 2015-01-05 Insertion frame protection structure for probe of lattice structure body testing machine Pending CN104569513A (en)

Priority Applications (1)

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CN201510003411.0A CN104569513A (en) 2015-01-05 2015-01-05 Insertion frame protection structure for probe of lattice structure body testing machine

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Application Number Priority Date Filing Date Title
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104856762A (en) * 2015-05-04 2015-08-26 邹中宝 Cochlea probe storage device

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103234398A (en) * 2013-05-07 2013-08-07 苏州征之魂专利技术服务有限公司 Manufacturing method for secondary excitation secondary display image-text firework
CN103234394A (en) * 2013-05-07 2013-08-07 苏州征之魂专利技术服务有限公司 Production method of partitioned independent powder-charged post-dyed graphic fireworks
CN103234397A (en) * 2013-05-07 2013-08-07 苏州征之魂专利技术服务有限公司 Production method for partitioned unit glued lattice structural bodies of graphic fireworks
DE102013102564A1 (en) * 2013-03-13 2014-09-18 Dtg International Gmbh Truss unit for a tester for printed circuit boards, as well as tester with it
US20140306729A1 (en) * 2013-04-16 2014-10-16 Mpi Corporation Position adjustable probing device and probe card assembly using the same
CN104597292A (en) * 2014-12-31 2015-05-06 苏州征之魂专利技术服务有限公司 Lattice structure tester probe bay protection structure

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013102564A1 (en) * 2013-03-13 2014-09-18 Dtg International Gmbh Truss unit for a tester for printed circuit boards, as well as tester with it
US20140306729A1 (en) * 2013-04-16 2014-10-16 Mpi Corporation Position adjustable probing device and probe card assembly using the same
CN103234398A (en) * 2013-05-07 2013-08-07 苏州征之魂专利技术服务有限公司 Manufacturing method for secondary excitation secondary display image-text firework
CN103234394A (en) * 2013-05-07 2013-08-07 苏州征之魂专利技术服务有限公司 Production method of partitioned independent powder-charged post-dyed graphic fireworks
CN103234397A (en) * 2013-05-07 2013-08-07 苏州征之魂专利技术服务有限公司 Production method for partitioned unit glued lattice structural bodies of graphic fireworks
CN104597292A (en) * 2014-12-31 2015-05-06 苏州征之魂专利技术服务有限公司 Lattice structure tester probe bay protection structure

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104856762A (en) * 2015-05-04 2015-08-26 邹中宝 Cochlea probe storage device

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Application publication date: 20150429