CN104516816B - Primary Component test method in a kind of quantum key distribution system - Google Patents

Primary Component test method in a kind of quantum key distribution system Download PDF

Info

Publication number
CN104516816B
CN104516816B CN201310468678.8A CN201310468678A CN104516816B CN 104516816 B CN104516816 B CN 104516816B CN 201310468678 A CN201310468678 A CN 201310468678A CN 104516816 B CN104516816 B CN 104516816B
Authority
CN
China
Prior art keywords
test
parameter
primary component
main transformer
crucial
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201310468678.8A
Other languages
Chinese (zh)
Other versions
CN104516816A (en
Inventor
不公告发明人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anhui Quantum Communication Technology Co Ltd
Original Assignee
Anhui Quantum Communication Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anhui Quantum Communication Technology Co Ltd filed Critical Anhui Quantum Communication Technology Co Ltd
Priority to CN201310468678.8A priority Critical patent/CN104516816B/en
Publication of CN104516816A publication Critical patent/CN104516816A/en
Application granted granted Critical
Publication of CN104516816B publication Critical patent/CN104516816B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Abstract

The invention belongs to Quantum Secure Communication fields, it proposes Primary Component test method in a kind of quantum key distribution system, comprising the following steps: step 1: determining the crucial test parameter for needing Primary Component and each Primary Component in quantum key distribution system to be tested;Step 2: selecting main transformer parameter in crucial test parameter, remaining parameter is used as from variable element;Step 3: the value of each main transformer parameter being arranged by Human-machine Control interface, tests from variable element;Step 4: database is written into test data;Step 5: test data in analytical database, display analysis result;Step 6: return step three, which continues to test, if necessary is judged to analysis result;Step 7: it is for statistical analysis to all test datas in database, obtain test result.The present invention is based on the analysis to test data as a result, to control crucial test parameter, the blindness in test is eliminated to a certain extent, testing efficiency is improved, reduces testing cost.

Description

Primary Component test method in a kind of quantum key distribution system
Technical field
The invention belongs to Quantum Secure Communication fields, and in particular to Primary Component in a kind of quantum key distribution system Test method.
Background technique
Quantum communications are the new interdisciplinary that recent two decades grow up, and are quantum theory and that information theory combines is new Research field.This recent subject gradually from theory to experiment, and develops to functionization, and the information of highly effective and safe transmits day Benefit is concerned by people.
Physically, quantum communications are construed as under the physical limit, the high performance communication realized using quantum effect. In informatics, we then think that quantum communications are to utilize quantum-mechanical basic principle (the unclonable principle of such as quantum state and amount The measurement of sub- state is collapsed property etc.) or utilize the quantized systems particular attributes such as quantum state Teleportation and quantum measurement Method is transmitted to complete the information between two places.
Quanta cryptology technique based on quantum key distribution (QKD) agreement is the most important reality of quantum communications at this stage One of border application.Traditional cryptography is the cipher system based on mathematics, and quantum cryptography is based on quantum mechanics, it Safety be built upon uncertainty principle, on the physical characteristics such as unclonable and quantum coherence of quantum, be proved to It is perfectly safe.
QKD system is a kind of quantum communication system based on QKD agreement, due to wherein generating, transmitting and received quantum The not reproducible measurement of information determines that QKD system test is different from the particularity of classical communication system testing.
On the one hand, QKD system operation result is between each Primary Component in QKD system and each skill of Primary Component The result influence each other between art index, mutually restricted.For example detectivity is abnormal, it is likely to optical source wavelength exception, bottom width Caused by increasing or the effective gate-width of detector reduce, it is therefore desirable to these indexs be monitored in real time and be tested, by survey The statistical analysis of examination data finds and verifies the correlation between each Primary Component and between each technical indicator of Primary Component Property, to find system defect, debugging system performance and improve system effectiveness.
On the other hand, since the difficulty of quantum signal preparation at this stage makes quantum signal preparation cost far more than classics letter Number preparation cost, which dictates that the testing cost of QKD system is far longer than the testing cost of classical communication system.
The test of current QKD system ignores above-mentioned particularity, and method is mostly the classical communication system for continuing to continue to use The test step by step method of system, i.e., gradually individual equipment is tested, after the completion of testing respectively, after forming quantum key distribution system It also needs to carry out each device unified test.Due to the particularity of QKD system, this test step by step method will cause as follows Consequence:
First is that making it due to ignoring influence of the correlation in system between each Primary Component to the results of running Test process lacks systematicness, and test result lacks network analysis, so that the test result obtained be made often to have one-sidedness.
Second is that considerably increasing the number of retest, the time is wasted, considerably increases testing cost.
Therefore, to those skilled in the art, finding Primary Component test method in a kind of suitable QKD system becomes Urgent problem to be solved.
Summary of the invention
In view of the above-mentioned problems, the present invention proposes Primary Component test method in a kind of quantum key distribution system, including with Lower step:
Step 1: determine that the crucial of the Primary Component and each Primary Component that need in quantum key distribution system to be tested is surveyed Try parameter;
Step 2: selecting main transformer parameter in crucial test parameter, remaining parameter is used as from variable element;
Step 3: the value of each main transformer parameter being arranged by Human-machine Control interface, tests from variable element;
Step 4: database is written into test data;
Step 5: test data in analytical database, display analysis result;
Step 6: return step three, which continues to test, if necessary is judged to analysis result;
Step 7: it is for statistical analysis to all test datas in database, obtain test result.
The Primary Component in need quantum key distribution system to be tested in the step 1 includes at least following one Kind is several: single-photon detector inveigles state light source, optical module, key negotiation module;It needs crucial test parameter to be tested Including at least following one or more: effective gate-width, dark counting, the detectivity of single-photon detector inveigle the bottom of state light source Width, halfwidth, wavelength, the light loss of optical module and key negotiation module at code rate, error rate and feedback efficiency.
The method of main transformer parameter is selected in the step 2 are as follows: if the crucial test parameter of a Primary Component is more than one It is a, then at least using a test parameter as main transformer parameter in the parameter with correlation;If a Primary Component only has One crucial test parameter, then this Primary Component does not set main transformer parameter.
The method from variable element is tested in the step 3 are as follows: establish the test platform for having Human-machine Control interface, pass through The value of the Human-machine Control interface setting main transformer parameter of test platform, so that the main transformer parameter of Primary Component is controlled, in each pass In the case that the main transformer parameter of key device determines, test from variable element.
Test data in the step 4 is the value of corresponding main transformer parameter and from variable element in test each time Test value.
The method of test data is analyzed in the step 5 are as follows: by the correlation of analysis of key test parameter, especially Correlation between functional key test parameter and the crucial test parameter that quantum key distribution system performance can be represented, analysis Statistical property of each key test parameter in each value interval.
Further, method analysis result judged in the step 6 are as follows: according to the pass obtained in step 5 The correlation of key test parameter and each crucial test parameter judge to test number in database in the statistical property of each value interval According to integrality, referring to test purpose, if it find that the main transformer parameter value of test also in need combines, then return step three after Continuous test.
Preferably, the test result according to obtained in test target and the step 7, if necessary to further test, then Return step two changes main transformer parameter, continues to test.
The beneficial effects of the present invention are:
1. main transformer parameter is arranged by Human-machine Control interface, only test is from variable element, and it reduce the complexity of test process Property;
2. being eliminated in test to a certain extent based on the analysis to test data as a result, to control crucial test parameter Blindness, improve testing efficiency, reduce testing cost;
3. analyzing the correlation between each Primary Component and same Primary Component by the test data recorded in database Each crucial test parameter between correlation, which increase the reliability of test result and credibilities.
Detailed description of the invention
Fig. 1 QKD system human-computer interactive control test platform architecture figure.
Primary Component test method flow chart in Fig. 2 quantum key distribution system.
Specific embodiment
The embodiment of the present invention is described in detail with reference to the accompanying drawing.
To realize this patent scheme, QKD system human-computer interactive control as shown in Fig. 1 is established in this patent embodiment Test platform.This test platform is built in QKD network in the corresponding QKD terminal for realizing quantum key distribution, mainly group Mould is analyzed at including QKD equipment, key negotiation module, classical gateway, human-computer interactive control interface, test database and data Block.QKD equipment, key negotiation module and the classical gateway module intrinsic for QKD terminal.Human-computer interactive control interface is used for Pass through the value of the related test parameters of each Primary Component of human-computer interactive control QKD equipment in test process;Test database note Record the value and test value of corresponding test parameter in test process;Data analysis module carries out the test data in database Data analysis and statistics, provide reference for the value of related test parameters in test process, and pass through the analysis to test data Test result is obtained with statistics.
Attached drawing 2 is Primary Component test method flow chart in the present embodiment quantum key distribution system.In conjunction with attached drawing 2 we By the specific implementation step of Primary Component test method in the present embodiment quantum key distribution system, details are as follows:
1. determining the crucial test parameter for needing Primary Component and each Primary Component in QKD system to be tested;
Need the Primary Component in QKD system to be tested to include at least following one or more: single-photon detector lures Deceive state light source, optical module, key negotiation module;It needs crucial test parameter to be tested to include at least following one kind or several Kind: effective gate-width, dark counting, the detectivity of single-photon detector inveigle bottom width, the halfwidth, wavelength of state light source, optical module Light loss and key negotiation module at code rate, error rate and feedback efficiency.
In the present embodiment, needing Primary Component to be tested is single-photon detector and key negotiation module, key test ginseng Number be single-photon detector effective gate-width, dark counting and detectivity and key negotiation module at code rate and error rate.
2. selecting main transformer parameter in crucial test parameter, remaining parameter is used as from variable element;
In the present embodiment, using effective gate-width of single-photon detector in above-mentioned crucial test parameter as main transformer parameter, Remaining parameter is used as from variable element.
3. the value of each main transformer parameter is arranged by Human-machine Control interface, test from variable element;
Different effective gate-widths is set for the single-photon detector in QKD system by human-computer interactive control interface, is run System tests remaining from variable element.
4. database is written in test data;
Corresponding database table is established, the setting value of main transformer parameter and its corresponding be written from the test value of variable element are surveyed Try database.
5. test data in analytical database, display analysis result;
According to the test data recorded in test database, the correlation of the above-mentioned each crucial test parameter value of analysis is calculated Property, the correlation between especially functional crucial test parameter and the crucial test parameter that QKD system performance can be represented, analysis Statistical property of each key test parameter in each value interval.
In the present embodiment, effective gate-width, dark counting and the detectivity of weight analysis single-photon detector these three are functional Crucial test parameter is with the key negotiation module that can represent QKD system performance at the correlation between code rate.If it find that having Imitate the value and, then statistical property according to test data analysis between the two stronger at code rate dependence on parameter of gate-width parameter.
6. a pair analysis result judges that return step three continues to test if necessary;
During being analyzed and counted to test data, if it find that key test parameter obtained is (especially Main transformer parameter) value interval test data it is imperfect, referring to test purpose, if it find that the main transformer parameter of test also in need Valued combinations, then return step 3 continues to test.
7. all test datas in pair database are for statistical analysis, test result is obtained.
All test datas in database are carried out with whole analysis statistics, according to test target, obtains test result;Such as Fruit needs further test, then return step 2, changes main transformer parameter, continues to test.
It should be noted that above-mentioned specific embodiment is exemplary, and under above-mentioned introduction of the invention, art technology Personnel can carry out various improvement and deformations on the basis of the above embodiments, and these are improved or deformation fall in it is of the invention In protection scope.
It will be understood by those skilled in the art that specific descriptions above are intended merely to explain the purpose of the present invention, not use In the limitation present invention.Protection scope of the present invention is defined by the claims and their equivalents.

Claims (5)

1. Primary Component test method in a kind of quantum key distribution system, which comprises the following steps:
Step 1: the crucial test ginseng of the Primary Component and each Primary Component needed in quantum key distribution system to be tested is determined Number;
Step 2: selecting main transformer parameter in crucial test parameter, remaining parameter is used as from variable element;
Step 3: the value of each main transformer parameter being arranged by Human-machine Control interface, tests from variable element;
Step 4: database is written into test data;
Step 5: test data in analytical database, display analysis result;
Step 6: return step three, which continues to test, if necessary is judged to analysis result;
Step 7: it is for statistical analysis to all test datas in database, obtain test result;
The Primary Component in need quantum key distribution system to be tested in the step 1 include at least following one kind or Several: single-photon detector inveigles state light source, optical module, key negotiation module;It needs crucial test parameter to be tested at least Including following one or more: effective gate-width, dark counting, the detectivity of single-photon detector, the bottom width of trick state light source, half Gao Kuan, wavelength, the light loss of optical module and key negotiation module at code rate, error rate and feedback efficiency;
The method of test data is analyzed in the step 5 are as follows: functional crucial by the correlation of analysis of key test parameter Correlation between test parameter and the crucial test parameter that can represent quantum key distribution system performance analyzes each crucial test Statistical property of the parameter in each value interval;
The method that analysis result is judged in the step 6 are as follows: according to the phase of the crucial test parameter obtained in step 5 Closing property and each crucial test parameter judge the integrality of test data in database, join in the statistical property of each value interval According to test purpose, if it find that the main transformer parameter value of test also in need combines, then return step three continues to test.
2. Primary Component test method in a kind of quantum key distribution system as described in claim 1, which is characterized in that described The method of main transformer parameter is selected in step 2 are as follows: if the crucial test parameter of a Primary Component is more than one, have At least using a test parameter as main transformer parameter in the parameter of correlation;If only one the key test of Primary Component Parameter, then this Primary Component does not set main transformer parameter.
3. Primary Component test method in a kind of quantum key distribution system as described in claim 1, which is characterized in that described The method from variable element is tested in step 3 are as follows: establish the test platform for having Human-machine Control interface, pass through the people of test platform Machine control interface sets the value of main transformer parameter, so that the main transformer parameter of Primary Component is controlled, in the main transformer of each Primary Component In the case that parameter determines, test from variable element.
4. Primary Component test method in a kind of quantum key distribution system as described in claim 1, which is characterized in that described Test data in step 4 is the value of corresponding main transformer parameter and the test value from variable element in test each time.
5. Primary Component test method in a kind of quantum key distribution system as described in claim 1, it is characterised in that: according to Test result obtained in test target and the step 7, if necessary to further test, then return step two, change main transformer Parameter continues to test.
CN201310468678.8A 2013-09-28 2013-09-28 Primary Component test method in a kind of quantum key distribution system Active CN104516816B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201310468678.8A CN104516816B (en) 2013-09-28 2013-09-28 Primary Component test method in a kind of quantum key distribution system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310468678.8A CN104516816B (en) 2013-09-28 2013-09-28 Primary Component test method in a kind of quantum key distribution system

Publications (2)

Publication Number Publication Date
CN104516816A CN104516816A (en) 2015-04-15
CN104516816B true CN104516816B (en) 2019-03-15

Family

ID=52792159

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201310468678.8A Active CN104516816B (en) 2013-09-28 2013-09-28 Primary Component test method in a kind of quantum key distribution system

Country Status (1)

Country Link
CN (1) CN104516816B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106789036B (en) * 2017-01-18 2020-01-24 中国人民解放军国防科学技术大学 Quantum key distribution system physical modeling method oriented to security analysis

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102608464A (en) * 2012-03-21 2012-07-25 山东电力集团公司济南供电公司 Modularized automatic test assembly system of rely protection device and test method of modularized automatic test assembly system

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008505590A (en) * 2004-07-02 2008-02-21 マジック テクノロジーズ,インコーポレーテッド QKD cascade network with loopback function
US20100241912A1 (en) * 2006-04-04 2010-09-23 Magiq Technologies, Inc. Fast bit-error rate calculation mode for QKD systems
CN102185254B (en) * 2011-03-15 2012-10-03 中国科学技术大学 Single photon source device manufacturing method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102608464A (en) * 2012-03-21 2012-07-25 山东电力集团公司济南供电公司 Modularized automatic test assembly system of rely protection device and test method of modularized automatic test assembly system

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
QKD系统中密钥协商算法和探测技术的研究;吴张斌;《中国优秀硕士学位论文全文数据库信息科技辑》;20110315(第3期);第34-39页
相位编码量子密钥分发系统的电子学设计;杨阳,王永纲等;《电子学报》;20111130(第11期);第2608-2609页

Also Published As

Publication number Publication date
CN104516816A (en) 2015-04-15

Similar Documents

Publication Publication Date Title
CN110414242A (en) For detecting the method, apparatus, equipment and medium of service logic loophole
CN105357063B (en) A kind of cyberspace security postures real-time detection method
US20130191052A1 (en) Real-time simulation of power grid disruption
US20080222068A1 (en) Inferring Candidates that are Potentially Responsible for User-Perceptible Network Problems
CN106537443B (en) System and method for classifying in situ sensor response data patterns indicative of grid anomaly severity
CN110519128A (en) A kind of operating system recognition methods based on random forest
Lin et al. A general framework for quantitative modeling of dependability in cyber-physical systems: A proposal for doctoral research
CN105279196B (en) The generation method and device of test script
CN103530347A (en) Internet resource quality assessment method and system based on big data mining
CN106537356A (en) Systems and methods for maximizing expected utility of signal injection test patterns in utility grids
CN111174370A (en) Fault detection method and device, storage medium and electronic device
Fortes et al. Signatures of quantum chaos transition in short spin chains
CN106199267B (en) A kind of electrical equipment fault characteristic analysis method
CN104518869B (en) Primary Component test verifying device in a kind of QKD system
CN110138786A (en) Web method for detecting abnormality and system based on SMOTETomek and LightGBM
Ali et al. Configuration-based IDS for advanced metering infrastructure
CN108924102A (en) Efficient industry control agreement fuzz testing method
CN105227689A (en) Based on the Target IP location algorithm of local time delay distribution similarity tolerance
CN106780108A (en) A kind of distribution transformer state evaluating method based on improvement evidential reasoning fusion
CN105243017B (en) The test method and system of debarkation authentication are carried out based on SSH agreements
CN106302412A (en) A kind of intelligent checking system for the test of information system crushing resistance and detection method
US11657148B2 (en) Event analysis in an electric power system
Poh et al. Probing the quantum–classical boundary with compression software
CN104516816B (en) Primary Component test method in a kind of quantum key distribution system
Hu et al. CT-IoT: a combinatorial testing-based path selection framework for effective IoT testing

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
CB02 Change of applicant information

Address after: 230088 D3, Hefei Innovation Industrial Park, No. 800 Wangjiang West Road, hi tech Zone, Anhui, China

Applicant after: QUANTUM COMMUNICATION TECHNOLOGY CO., LTD.

Address before: 230088 D3, Hefei Innovation Industrial Park, No. 800 Wangjiang West Road, hi tech Zone, Anhui, China

Applicant before: Anhui Liangzi Communication Technology Co., Ltd.

COR Change of bibliographic data
DD01 Delivery of document by public notice

Addressee: Gao Hui

Document name: Notification of Passing Examination on Formalities

C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant