CN104483612A - Harmonic analysis anti-interference method - Google Patents

Harmonic analysis anti-interference method Download PDF

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Publication number
CN104483612A
CN104483612A CN201410773875.5A CN201410773875A CN104483612A CN 104483612 A CN104483612 A CN 104483612A CN 201410773875 A CN201410773875 A CN 201410773875A CN 104483612 A CN104483612 A CN 104483612A
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China
Prior art keywords
characteristic quantity
fault
judge
characteristic
lag
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CN201410773875.5A
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牟伟
吴龙
刘为群
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NR Electric Co Ltd
NR Engineering Co Ltd
Nanjing NARI Group Corp
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NR Electric Co Ltd
NR Engineering Co Ltd
Nanjing NARI Group Corp
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Priority to CN201410773875.5A priority Critical patent/CN104483612A/en
Publication of CN104483612A publication Critical patent/CN104483612A/en
Pending legal-status Critical Current

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Abstract

The invention discloses a harmonic analysis anti-interference method. The anti-jamming method is characterized by comprising the following steps: calculating and obtaining main characteristic quantity and auxiliary characteristic quantity according to harmonic analysis; judging main characteristic quantity adopted short circuit characteristic value and auxiliary characteristic quantity adopted open circuit characteristic value of rotary diode short trouble; judging main characteristic quantity adopted open circuit characteristic value and auxiliary characteristic quantity adopted short circuit characteristic value of rotary diode open circuit fault; starting composite delaying counting when the main characteristic quantity and the auxiliary characteristic quantity meet fault characteristic indexes simultaneously; confirming the rotary diode is in certain fault state when the main characteristic quantity and the auxiliary characteristic quantity still meet fault characteristic indexes simultaneously after the composite delaying counting is fulfilled. The anti-interference method eliminates adverse effect of an interference signal on judging result through spectrum formation and continuing stability of the harmonic analysis, effectively avoids misjudgment of the external interference signal to the working state of the rotary diode, and can improve fault detection reliability of the rotary diode.

Description

A kind of frequency analysis anti-interference method
Technical field
The present invention relates to technical field of generators, particularly a kind of frequency analysis anti-interference method, be applied to the rotating diode fault detect of brushless exciting generating set.
Background technology
In brushless excitation generator, the power conversion section of core is exactly rotating diode rectifier, and its main devices is rotating diode.Once the diode of rotating rectifier breaks down; as branch road fuse blows, diode open circuit or short circuit, method or technology should be had rapidly by fault detect out, and accurately can to judge fault type; make protection act quick and precisely, avoid whole electricity generation system failure propagation.Therefore to the correct judgement of rotating diode fault in brushless excitation generator, for generator and rotating diode safe operation extremely important.
" modern synchronous generator excitation system design and application " (second edition) refer to two kinds of method for detecting fault of rotating diode, as internal detection coil and excitation current waveform judge.Internal detection coil method judges rotating diode fault by installing detecting coil measurement induced potential waveform on exciter interior permanent magnet or between magnetic pole additional, but the method needs additionally to install interpole coil in exciter inside, and the installation location of interpole coil, operational reliability and maintenance convenience are a great problems.Excitation current waveform determining method, detects the waveform of exciting current in real time by mimic channel, judge rotating diode fault when distortion occurs excitation current waveform.The method only can judge rotating diode whether fault, can not judge concrete fault type; And because the wave form distortion degree of heterogeneous (being greater than three-phase) rotating diode fault is little, the judgement insufficient sensitivity of the method.
Some prior aries propose to adopt carries out frequency analysis to exciting current of exciter, to judge in rotating diode commutation system one or many rotating diode open circuits and short trouble.The method adopts exciter stator field copper itself as detecting coil, without the need at the inner extra installation additional probe coil of exciter, solves the installation difficult problem of fault-signal detecting coil in exciter inside and an operational reliability difficult problem.And by the signature analysis to exciting current harmonic wave, the different faults type of rotating diode rectifier can be judged.
But because the DC component in exciting current of exciter is very large, harmonic content is less, especially under rotating diode open circuit fault the ratio of the relative DC component of high-frequency harmonic content even lower than 0.5%.Current harmonics component faint is like this gathered and calculates corresponding fault characteristic value and then judge rotating diode malfunction, need to take corresponding anti-interference method or measure, avoid that the content due to current harmonics component is faint makes characteristic quantity calculated distortion, thus cause the situation judging rotating diode state by accident to occur.
In addition, gather and analyze exciting current of exciter harmonic content due to needs, actual detection system or device are generally placed on the energizing apparatus side of generator or are integrated in generator excitation equipment when generating plant in-site installation.Not only there are forceful electric power alterating and direct current hydraulic circuit, alternating current loop around, and be subject to the magnetic interference that the electromagnetic interference (EMI) of exciter excitation system silicon controlled rectifier work, the electromagnetic interference (EMI) of rectifying installation commutation and excitation export big current, electromagnetic environment is complicated and severe, even if take the measures such as shielding on pick-up unit hardware (comprising signals collecting loop), yet need to take corresponding anti-interference method in frequency analysis, avoid because external interference signal causes the situation judging rotating diode duty by accident to occur.
Prior art does not relate to anti-interference method during frequency analysis, therefore in order to better adopt the fault detect of method realization to rotating diode based on exciting current of exciter frequency analysis, prevent the generation to the erroneous judgement of rotating diode duty, be necessary to take anti-interference method in frequency analysis, the current operating state judging rotating diode ensured correctness, ensures the safe and reliable operation of generating set.
Summary of the invention
Object of the present invention, be to propose a kind of frequency analysis anti-interference method, the characteristic quantity that frequency analysis calculates is screened and filtered, guarantee to adopt and meet fault signature index and stable characteristic quantity carries out breakdown judge, effectively prevent the erroneous judgement to rotating diode duty, improve the reliability to rotating diode fault detect.
In order to reach above-mentioned purpose, the invention provides a kind of frequency analysis anti-interference method, it is characterized in that: calculate main characteristic quantity and supplemental characteristic amount according to frequency analysis; Judge that the main characteristic quantity of rotating diode short trouble adopts short-circuit characteristic value, supplemental characteristic amount adopts open circuit feature value; Judge that the main characteristic quantity of rotating diode open fault adopts open circuit feature value, supplemental characteristic amount adopts short-circuit characteristic value; Start compound time delay counting when major-minor double characteristic amount meets fault signature index simultaneously, when compound time delay has counted, main auxiliary characteristic quantity still meets fault signature index simultaneously, then judge that rotating diode is in certain malfunction.
In such scheme: judge that the condition of short trouble is: main characteristic quantity is greater than Ksc (short trouble setting valve, 50-100) and supplemental characteristic amount is greater than Kpc (open fault setting valve, 0.1-10); Judge that the condition of open fault is: main characteristic quantity is greater than Kpc and supplemental characteristic amount is less than Ksc.
In such scheme: described compound time delay counting method is made up of a specified time time delay and a class inverse time-lag, first carry out specified time time delay when major-minor double characteristic amount meets fault signature index simultaneously, at the end of specified time time delay, fault signature index is still satisfied then carries out class inverse time-lag; When class inverse time-lag has counted, main auxiliary characteristic quantity has still met fault signature index simultaneously, then judge that rotating diode is in certain malfunction.
In such scheme: class inverse time-lag counting step-length is determined by the ratio of main characteristic quantity and fault setting valve, the faults order of severity; Judge that the class inverse time lag counting step-length of short trouble is calculated by formula (1), judge that the class inverse time lag counting step-length of open fault is calculated by formula (2):
ks = Tsc K SC Formula (1)
ko = Toc K PC Formula (2)
Wherein, Tsc is the short-circuit characteristic value calculated, and Toc is open circuit feature value, and ks is the class inverse time lag counting step-length judging short trouble, and ko is the class inverse time lag counting step-length judging open fault.
The determination methods combined by major-minor characteristic quantity that the present invention proposes, determine the compound time delay method of counting that the inverse time lag combines; can exclude the interference signal to the adverse effect of judged result from the frequency spectrum formation of frequency analysis and continuous stability; effectively avoid external interference signal to the erroneous judgement of rotating diode duty; improve the reliability of rotating diode fault detect; and can automatically shorten fault delay time according to fault degree, be conducive to taking safeguard measure in advance.The method is that the frequency analysis being applied to rotating diode fault detect provides effective anti-interference method, is a kind of effective, feasible antijamming measure.
Accompanying drawing explanation
Fig. 1 is decision flow chart of the present invention;
Fig. 2 is compound time delay logical diagram of the present invention.
Embodiment
The invention provides a kind of frequency analysis anti-interference method, it is characterized in that: calculate main characteristic quantity and supplemental characteristic amount according to frequency analysis; Start compound time delay counting when major-minor double characteristic amount meets fault signature index simultaneously, when compound time delay has counted, main auxiliary characteristic quantity still meets fault signature index simultaneously, then judge that rotating diode is in certain malfunction.The method comprises:
1) a main characteristic quantity and a supplemental characteristic amount are set to judge rotating diode malfunction, the malfunction of rotating diode could be judged when major-minor double characteristic amount meets fault signature index simultaneously.As shown in Fig. 1 decision flow chart.Main characteristic quantity when judging short trouble adopts short-circuit characteristic value, and supplemental characteristic amount adopts open circuit feature value.。Main characteristic quantity when judging open fault adopts open circuit feature value, and supplemental characteristic amount adopts short-circuit characteristic value.Judge that the condition of open fault is: main characteristic quantity is greater than Kpc and supplemental characteristic amount is less than Ksc.
2) judge that the condition of short trouble is: main characteristic quantity is greater than Ksc (short trouble setting valve, 50-100) and supplemental characteristic amount is greater than Kpc (open fault setting valve, 0.1-10).Judge that the condition of open fault is: main characteristic quantity is greater than Kpc and supplemental characteristic amount is less than Ksc.
By above-mentioned a main characteristic quantity and a supplemental characteristic amount are set and the two meets characteristic index simultaneously time can carry out judgement rotating diode malfunction, external interference signal obviously can be avoided for the interference of frequency analysis characteristic results, avoid the erroneous judgement to rotating diode duty.The electromagnetic interference signal produced by peripheral electrical equipment operating, switching or electromagnetic environmental impact, because interference source is different, mechanism of production is different, the generation moment is fixing, delivering path varies, thus its harmonic components forms relatively random, generally can not have relatively-stationary frequency spectrum.Even if having undesired signal to enter when carrying out frequency analysis, because needs calculate main characteristic quantity and supplemental characteristic amount and the two meets and can judge rotating diode state simultaneously simultaneously, so entering of undesired signal is difficult to meet above-mentioned major-minor characteristic quantity Rule of judgment simultaneously, thus form from the frequency spectrum of frequency analysis and eliminate the impact of undesired signal on judged result, be conducive to the reliability improving rotating diode fault detect.
3) the compound time delay counting method be made up of a specified time time delay and a class inverse time-lag is set, first carry out specified time time delay when major-minor double characteristic amount meets fault signature index simultaneously, at the end of specified time time delay, fault signature index is still satisfied then carries out class inverse time-lag.When class inverse time-lag has counted, main auxiliary characteristic quantity has still met fault signature index simultaneously, then judge that rotating diode is in certain malfunction.
4) the class inverse time-lag counting step-length in compound time delay counting is determined by the ratio of main characteristic quantity and fault setting valve, the faults order of severity.Judge that the class inverse time lag counting step-length of short trouble is calculated by formula (1), judge that the class inverse time lag counting step-length of open fault is calculated by formula (2).
ks = Tsc K SC Formula (1)
ko = Toc K PC Formula (2)
Wherein, Tsc is the short-circuit characteristic value calculated, and Toc is open circuit feature value, and ks is the class inverse time lag counting step-length judging short trouble, and ko is the class inverse time lag counting step-length judging open fault.
Adopt the compound time delay method of counting that above-mentioned specified time time delay and class inverse time-lag are formed; both outer signals interference can have been got rid of; can shorten delay time when rotating diode fault degree is more serious again, prior notice operations staff and protective device are taken measures as far as possible in good time.The electromagnetic interference signal produced by peripheral electrical equipment operating, switching or electromagnetic environmental impact generally presents the feature of short-time characteristic and non-standing, even if undesired signal enters frequency analysis and meet characteristic index, when in specified time time delay process, undesired signal disappearance or change no longer meet characteristic index, then counting process returns.Class inverse time-lag process has Anti-Jamming equally, and shortens delay time when the real malfunction of rotating diode according to the order of severity, as far as possible fast notification controllers or proterctive equipment.
Below with reference to accompanying drawing 1 and accompanying drawing 2, technical scheme of the present invention is described in detail.
Rotating diode rectifier, under normal and different faults state, is understood in exciting current of exciter, be induced two rahmonics.One class is basic harmonic wave, when referring to that rotating diode rectifier normally runs, responds to the harmonic components that unique content of existence is maximum in exciting current of exciter; When rotating diode rectifier fault runs, basic harmonic wave also exists, but amplitude diminishes.
Using armature of exciter rated frequency as fundamental frequency f1, the armature of exciter winding number of phases is N phase, then basic overtone order is generally 2*N time of first-harmonic, and namely basic humorous wave frequency is 2*N*f1.Basic harmonic wave such as 3 phase rotating diode rectifiers is 6 times, and the basic harmonic wave of 5 phase rotating diode rectifiers is 10 times, and the basic harmonic wave of 11 phase rotating diode rectifiers is 22 times.
Another kind of is fault harmonic wave, refers to when rotating diode rectifier is in failure operation state, just can respond to the harmonic components of appearance in exciting current of exciter; The malfunction that corresponding rotation diode is different, composition and the size of fault harmonic wave are all had any different; When rotating diode normally runs, fault harmonic components does not exist substantially, only has basic harmonic components.
Short-circuit characteristic value and open circuit feature value are by carrying out various faults harmonic wave that frequency analysis obtains and basic Harmonics Calculation obtains.
Short-circuit characteristic value calculates and adopts the effective value sum of odd-times fault harmonic wave and the ratio of basic harmonic wave effective value to obtain.
Tsc = I 1 + I 3 + I 5 + I 7 I base Formula (3)
Wherein Tsc is the short-circuit characteristic value calculated; I1-I7 is the effective value of 1,3,5,7 inferior typical odd-times fault harmonic waves; I basebased on the effective value of harmonic wave, if 3 phase rotating diode rectifiers are I 6, the basic harmonic wave of 5 phase rotating diode rectifiers is I 10, the basic harmonic wave of 11 phase rotating diode rectifiers is I 22.
Open circuit feature value calculates and adopts the effective value of even-times fault harmonic wave to obtain with the product of the ratio of basic harmonic wave effective value respectively.
Toc = I 2 * I 4 I base * I base Formula (4)
Wherein Toc is the open circuit feature value calculated; I 2, I 4it is the effective value of 2,4 inferior typical even-times fault harmonic waves; I basebased on the effective value of harmonic wave, if 3 phase rotating diode rectifiers are I 6, the basic harmonic wave of 5 phase rotating diode rectifiers is I 10, the basic harmonic wave of 11 phase rotating diode rectifiers is I 22.
The invention provides a kind of frequency analysis anti-interference method, main judgement flow process as shown in Figure 1, comprises the steps:
(1) step 1: the effective value sum of each fault harmonic wave and the ratio of basic harmonic wave effective value are greater than abnormal setting valve Kabn, start to start rotating diode breakdown judge.
(2) step 2: first judge whether rotating diode fault meets short-circuit characteristic index.Main characteristic quantity when judging short trouble adopts short-circuit characteristic value, and supplemental characteristic amount adopts open circuit feature value.Judge that the condition that short trouble is set up is: main characteristic quantity is greater than Ksc and supplemental characteristic amount is greater than Kpc.If major-minor double characteristic amount meets short trouble characteristic index simultaneously, then start the compound time delay counting of short trouble, otherwise carry out open fault judgement.
(3) step 3: start the compound time delay counting carrying out short trouble when main characteristic quantity and supplemental characteristic amount meet short trouble characteristic index simultaneously.As shown in Figure 2, compound time delay counting is divided into two steps.
The first step, first carries out the time delay counting of definiting time-lag.Delay time is converted to objective count value Ts1.If major-minor characteristic quantity meets in specified time time delay counting process no longer simultaneously, then specified time counting zero, returns and rejudges.If (count value reaches Ts1) major-minor characteristic quantity still meets short trouble characteristic index when specified time time delay has counted simultaneously, then start the time delay counting of second step class inverse time lag;
Second step, carries out the time delay counting of class inverse time lag.Delay time is converted to objective count value Ts2.Class inverse time-lag is that the fault signature order of severity reflected according to main characteristic quantity is determined to count step-length, and counting step-length adopts formula (1) to calculate:
Namely judge that the class inverse time lag counting step-length ks of short trouble is obtained by the ratio of main characterizing magnitudes and short trouble setting valve.
ks = Tsc K SC Formula (1)
If main characterizing magnitudes larger (namely fault severity level is larger), counting step-length is larger, and time delay process is shorter.If major-minor characteristic quantity meets in class inverse time-lag counting process no longer simultaneously, then class inverse time lag counting zero, returns and rejudges; If (count value reaches Ts2) major-minor characteristic quantity still meets short trouble characteristic index when class inverse time-lag has counted simultaneously, then enter step 4 and judge that short trouble is set up.
(4) step 4: judge that rotating diode short trouble is set up, send alerting signal or trip signal.
(5) step 5: if in step 2 or step 3, major-minor characteristic quantity meets short trouble characteristic index no longer simultaneously, then carry out open fault judgement.Main characteristic quantity when judging open fault adopts open circuit feature value, and supplemental characteristic amount adopts short-circuit characteristic value.Judge that the condition that open fault is set up is: main characteristic quantity is greater than Kpc and supplemental characteristic amount is less than Ksc.
Wherein, if judge that heterogeneous (2 phases and more than) open fault is set up, Kpc=10;
If judge that single-phase open fault is set up, Kpc=1;
If judge that single armed open fault is set up, Kpc=0.1;
If major-minor double characteristic amount meets open fault characteristic index simultaneously, then start the compound time delay counting of open fault, otherwise return and rejudge.
(6) step 6: start the compound time delay counting carrying out open fault when main characteristic quantity and supplemental characteristic amount meet open fault characteristic index simultaneously.As shown in Figure 2, compound time delay counting is divided into two steps.
The first step, first carries out the time delay counting of definiting time-lag.Delay time is converted to objective count value To1.If major-minor characteristic quantity meets in specified time time delay counting process no longer simultaneously, then specified time counting zero, returns and rejudges.If (count value reaches To1) major-minor characteristic quantity still meets open fault characteristic index when specified time time delay has counted simultaneously, then start the time delay counting of the class inverse time lag of second step;
Second step, carries out the time delay counting of class inverse time lag.Delay time is converted to objective count value To2.Class inverse time-lag is that the fault signature order of severity reflected according to main characteristic quantity is determined to count step-length, and counting step-length adopts formula (2) to calculate:
Namely judge that the class inverse time lag counting step-length ko of open fault is obtained by the ratio of main characterizing magnitudes and open fault setting valve.
ko = Toc K PC Formula (2)
If main characterizing magnitudes larger (namely fault severity level is larger), counting step-length is larger, and time delay process is shorter.If major-minor characteristic quantity meets in class inverse time-lag counting process no longer simultaneously, then class inverse time lag counting zero, returns and rejudges; If (count value reaches To2) major-minor characteristic quantity still meets a certain open fault characteristic index when class inverse time-lag has counted simultaneously, then enter step 7 and judge that a certain open fault is set up.
(7) step 7: judge that a certain open fault of rotating diode is set up, send alerting signal or trip signal
Above embodiment is only and technological thought of the present invention is described, can not limit protection scope of the present invention with this, and every technological thought proposed according to the present invention, any change that technical scheme basis is done, all falls within scope.

Claims (4)

1. a frequency analysis anti-interference method, is characterized in that: calculate main characteristic quantity and supplemental characteristic amount according to frequency analysis; Judge that the main characteristic quantity of rotating diode short trouble adopts short-circuit characteristic value, supplemental characteristic amount adopts open circuit feature value; Judge that the main characteristic quantity of rotating diode open fault adopts open circuit feature value, supplemental characteristic amount adopts short-circuit characteristic value; Start compound time delay counting when major-minor double characteristic amount meets fault signature index simultaneously, when compound time delay has counted, main auxiliary characteristic quantity still meets fault signature index simultaneously, then judge that rotating diode is in certain malfunction.
2. a kind of frequency analysis anti-interference method as claimed in claim 1, is characterized in that: judge that the condition of short trouble is: main characteristic quantity is greater than Ksc and supplemental characteristic amount is greater than Kpc; Judge that the condition of open fault is: main characteristic quantity is greater than Kpc and supplemental characteristic amount is less than Ksc.
3. a kind of frequency analysis anti-interference method as claimed in claim 1, it is characterized in that: described compound time delay counting method is made up of a specified time time delay and a class inverse time-lag, first carry out specified time time delay when major-minor double characteristic amount meets fault signature index simultaneously, at the end of specified time time delay, fault signature index is still satisfied then carries out class inverse time-lag; When class inverse time-lag has counted, main auxiliary characteristic quantity has still met fault signature index simultaneously, then judge that rotating diode is in certain malfunction.
4. a kind of frequency analysis anti-interference method as claimed in claim 3, is characterized in that: class inverse time-lag counting step-length is determined by the ratio of main characteristic quantity and fault setting valve, the faults order of severity; Judge that the class inverse time lag counting step-length of short trouble is calculated by formula (1), judge that the class inverse time lag counting step-length of open fault is calculated by formula (2):
ks = Tsc K SC Formula (1)
ko = Toc K PC Formula (2)
Wherein, Tsc is the short-circuit characteristic value calculated, and Toc is open circuit feature value, and ks is the class inverse time lag counting step-length judging short trouble, and ko is the class inverse time lag counting step-length judging open fault.
CN201410773875.5A 2014-12-15 2014-12-15 Harmonic analysis anti-interference method Pending CN104483612A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105548856A (en) * 2015-12-28 2016-05-04 国电南瑞科技股份有限公司 Brushless excitation-type generator set rotation diode detection system and method thereof
CN109541425A (en) * 2018-11-03 2019-03-29 陕西航空电气有限责任公司 A kind of generator rotary diodes fault detection method
CN112098838A (en) * 2020-08-25 2020-12-18 阳江核电有限公司 Fault detection method and device for open circuit of diodes of multiphase angular brushless excitation system

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Publication number Priority date Publication date Assignee Title
CN105548856A (en) * 2015-12-28 2016-05-04 国电南瑞科技股份有限公司 Brushless excitation-type generator set rotation diode detection system and method thereof
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CN109541425A (en) * 2018-11-03 2019-03-29 陕西航空电气有限责任公司 A kind of generator rotary diodes fault detection method
CN112098838A (en) * 2020-08-25 2020-12-18 阳江核电有限公司 Fault detection method and device for open circuit of diodes of multiphase angular brushless excitation system
CN112098838B (en) * 2020-08-25 2023-05-02 阳江核电有限公司 Method and device for detecting faults of diode open circuit of multiphase angular brushless excitation system

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Application publication date: 20150401