CN104458047A - Temperature sensor insertion state detecting circuit and temperature detecting circuit - Google Patents
Temperature sensor insertion state detecting circuit and temperature detecting circuit Download PDFInfo
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- CN104458047A CN104458047A CN201410734385.4A CN201410734385A CN104458047A CN 104458047 A CN104458047 A CN 104458047A CN 201410734385 A CN201410734385 A CN 201410734385A CN 104458047 A CN104458047 A CN 104458047A
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Abstract
The invention discloses a temperature sensor insertion state detecting circuit. The temperature sensor insertion state detecting circuit comprises a microcontroller and a processor, wherein the microcontroller is used for acquiring a first signal obtained by a first insertion port of a temperature sensor and a second signal obtained by a second insertion port of the temperature sensor, judging whether both the first signal and the second signal are high-level signals, outputting an abnormal signal representing that the temperature sensor is not inserted if yes and outputting a normal signal if not, and the processor is used for outputting a first prompt signal to control a warning device to output a warning signal after obtaining the abnormal signal. In this way, the temperature sensor insertion state detecting circuit judges whether the temperature sensor is in an abnormal insertion state by means of the signals obtained by the first insertion port and second insertion port of the temperature sensor, the warning signal is output when the temperature sensor is in the abnormal insertion state, and then working staff is reminded and warned.
Description
Technical field
The application relates to temperature testing equipment technical field, more particularly, relates to a kind of temperature sensor insert state testing circuit and temperature sensing circuit.
Background technology
In prior art, normally used platinum resistance temperature sensor includes PT100 temperature sensor, described PT100 temperature sensor generally have two-wire system and three-wire system point, described two-wire system PT100 temperature sensor has two and inserts port, described three-wire system PT100 temperature sensor has three and inserts port, the temperature-coefficient of electrical resistance of this temperature sensor is 3.9 × 10-3/ DEG C, when 0 DEG C, resistance value is 100 Ω, resistance change rate be 0.3851 Ω/DEG C.Platinum resistance temperature sensor precision is high, good stability, and temperature limit is wide, is the most frequently used a kind of temperature detector in middle low-temperature space (-200 DEG C ~ 650 DEG C), is not only widely used in industrial thermometric, and is made into various standard thermometer.
But; when using said temperature sensor to insert detected equipment or after inserting; the situation causing described temperature sensor normally not insert due to operated by personnel's error or vibration equipment happens occasionally; now this temperature sensor can not play timely detection to equipment, protective effect is (as abnormal in inserted because of PT100; cause during the real excess temperature of equipment and do not detect in time; thus conservation treatment can not be carried out in time to equipment), there is potential safety hazard in the now operation of equipment.
Therefore, how the insert state of detected temperatures sensor, becomes one of those skilled in the art's technical matters urgently to be resolved hurrily.
Summary of the invention
In view of this; the application provides a kind of temperature sensor insert state testing circuit and temperature sensor; when causing described temperature sensor not insert due to operated by personnel's error for solving in prior art; temperature sensor can not play timely detection, protective effect to equipment, causes the operation of equipment to there is the problem of potential safety hazard.
To achieve these goals, the existing scheme proposed is as follows:
A kind of temperature sensor insert state testing circuit, comprising:
Decision circuitry, for obtain and judge by temperature sensor first insert port obtain the first signal and described by temperature sensor second insert port obtain secondary signal whether all as low level signal, if so, the normal signal normally inserted for characterizing described temperature sensor is exported; Otherwise, export the abnormal signal characterizing described temperature sensor and do not insert.
Preferably, said temperature sensor insert state testing circuit, also comprises:
The control chip be connected with described decision circuitry, for when get described decision circuitry export abnormal signal after, outputting alarm signal.
Preferably, in said temperature sensor insert state testing circuit, described decision circuitry, comprising:
Be made up of logic gates, for exporting the logic judging circuit of the control signal matched with the signal type of the first and second signals got.
Preferably, in said temperature sensor insert state testing circuit, described decision circuitry, also comprises:
The negate circuit be connected with the output terminal of described logic judging circuit, described negate circuit is for obtaining and exporting the status signal that the control signal that exports with logic judging circuit matches.
Preferably, in said temperature sensor insert state testing circuit, described negate circuit, comprising:
Base stage is connected with described logic judging circuit output terminal by the 13 resistance, the triode of source ground;
One end is connected with the common port of described triode with described 13 resistance, the 7th electric capacity of other end ground connection;
The 14 resistance that one end is connected with the collector of described triode, the other end is connected with the first voltage source;
One end is connected with the collector of described triode, the 8th electric capacity of other end ground connection;
The collector of described triode as the output terminal of described negate circuit, for being connected with control chip.
Preferably, in said temperature sensor insert state testing circuit, described logic judging circuit, comprising:
Input end and first of described temperature sensor insert the first phase inverter that port is connected;
Input end and second of described temperature sensor insert the second phase inverter that port is connected;
First input end is connected with described first inverter output, the second input end is connected with described second inverter output, output terminal is as the Sheffer stroke gate of the output terminal of logic judging circuit.
Preferably, in said temperature sensor insert state testing circuit, described logic judging circuit, comprising:
First input end and the second input end insert port and second and insert with described first of temperature sensor of stating the rejection gate that port one_to_one corresponding is connected respectively.
A kind of temperature sensing circuit, comprising:
Benchmark source generating circuit, the bridge detection circuit be connected with described benchmark source generating circuit, the temperature sensor asked poor amplifying circuit and be connected with described bridge detection circuit signal input part be connected with described bridge detection circuit output terminal, also comprise the temperature sensor insert state testing circuit described in above-mentioned any one.
Preferably, in said temperature testing circuit, described benchmark source generating circuit comprises:
One end is connected with described first voltage source, the first electric capacity of other end ground connection;
The input resistance that first end is connected with the ungrounded end of described first electric capacity;
Negative electrode is connected with the second end of described input resistance, the voltage stabilizing diode of plus earth;
The first resistance that one end is connected with the second end of described input resistance, the other end is connected with described voltage stabilizing diode reference edge;
One end is connected with described voltage stabilizing diode negative electrode, the second electric capacity of other end ground connection;
The negative electrode of described voltage stabilizing diode is as the output terminal of described benchmark source generating circuit.
Preferably, in said temperature testing circuit, described bridge detection circuit comprises:
Second and the 3rd resistance that first end is connected with the output terminal of described benchmark source generating circuit;
The anti-interference rejector be connected with the 3rd resistance with described second resistance;
Described anti-interference rejector comprises:
First Motor Winding Same Name of Ends is by second end be connected, second Motor Winding Same Name of Ends with second end of described second resistance be connected the common mode inductance of the 16 resistance with described 3rd resistance;
One end is connected with described first winding different name end, the tenth electric capacity of other end ground connection;
One end is connected with described second winding different name end, the 11 electric capacity of other end ground connection;
The different name end of described first winding and first of described temperature sensor inserts port and is connected;
The different name end of described second winding and second of described temperature sensor inserts port and is connected;
Second end of described second resistance is as the first output terminal of described bridge detection circuit;
Second end of described 3rd resistance is as the second output terminal of described bridge detection circuit.
Preferably, in said temperature testing circuit, described in ask poor amplifying circuit to comprise:
The first transport and placing device that in-phase input end is connected with described bridge detection circuit first output terminal by the 4th resistance, inverting input is connected with described bridge detection circuit second output terminal by the 5th resistance;
One end is connected with described first transport and placing device in-phase input end, the 6th resistance of other end ground connection and the 3rd electric capacity;
One end is connected with described first transport and placing device inverting input, the 12 electric capacity of other end ground connection;
The 7th resistance that one end is connected with described first transport and placing device inverting input, be connected with described first transport and placing device output terminal and the 4th electric capacity;
In-phase input end is connected with described first transport and placing device output terminal by the 8th resistance, inverting input is by the second transport and placing device of the 9th resistance eutral grounding;
One end is connected with described second transport and placing device in-phase input end, the 15 resistance of other end ground connection and the 9th electric capacity;
One end is connected with described second transport and placing device inverting input, the 5th electric capacity of other end ground connection;
The tenth resistance that one end is connected with described second transport and placing device inverting input, be connected with described second transport and placing device output terminal and the 6th electric capacity;
The 11 resistance that first end is connected with described second transport and placing device output terminal;
One end and described 11 the 12 resistance that resistance second end is connected, the other end is connected with the second voltage source;
With the first diode of described 12 resistor coupled in parallel, the negative electrode of described first diode is connected with described second voltage source;
Negative electrode is connected with described 11 resistance second end, the second diode of plus earth;
Second end of described 11 resistance is as the described output terminal asking poor amplifying circuit.
Preferably, in said temperature sensor, the voltage source of described first voltage source to be output voltage be 3.3V; The voltage source of described second voltage source to be output voltage be 3.0V.
As can be seen from above-mentioned technical scheme; temperature sensor insert state testing circuit disclosed in the present application; by being inserted the signal that port obtains by first and second of described temperature sensor; judge whether described temperature sensor is in insertion abnormality; when described temperature sensor is in insertion abnormality; can outputting alarm signal, remind staff to note, to keep in repair or detected equipment carries out conservation treatment.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only embodiments of the invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to the accompanying drawing provided.
The structural drawing of Fig. 1 a kind of temperature sensor insert state testing circuit disclosed in the embodiment of the present application;
The structural drawing of Fig. 2 temperature sensor insert state testing circuit disclosed in another embodiment of the application;
The structural drawing of Fig. 3 temperature sensor insert state testing circuit disclosed in the another embodiment of the application;
The structural drawing of Fig. 4 a kind of temperature sensing circuit disclosed in the embodiment of the present application.
Embodiment
Be directed to due to operated by personnel error and cause described temperature sensor not insert time; temperature sensor can not play timely protective effect to equipment; cause the operation of equipment to there is the problem of potential safety hazard, this application discloses a kind of temperature sensor insert state testing circuit and temperature sensor.
Below in conjunction with the accompanying drawing in the embodiment of the present invention, be clearly and completely described the technical scheme in the embodiment of the present invention, obviously, described embodiment is only the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
The structural drawing of Fig. 1 a kind of temperature sensor insert state testing circuit disclosed in the embodiment of the present application.
See Fig. 1, described temperature sensor insert state testing circuit disclosed in the present application comprises decision circuitry 1;
Described decision circuitry 1 for obtain and judge by temperature sensor 0 first insert port obtain the first signal and described by temperature sensor second insert port obtain secondary signal whether all as low level signal, if so, the normal signal normally inserted for characterizing described temperature sensor is exported; Otherwise, export the abnormal signal characterizing described temperature sensor and do not insert.
Described temperature sensor can be platinum resistance temperature sensor, in the embodiment of the present application, is preferably two-wire system or three-wire system PT100 platinum resistance temperature sensor, and described first insertion port is PTA, and described second insertion port is PTB or PTC.
Visible see technical scheme disclosed in the above embodiments of the present application; in technical scheme disclosed in the above embodiments of the present application; by being inserted the signal that port obtains by first and second of described temperature sensor; judge whether described temperature sensor is in insertion abnormality; when described temperature sensor is in insertion abnormality; output abnormality signal, prompting staff notes, keep in repair or detected equipment carries out conservation treatment (such as control chip opertaing device carries out stoppage protection etc.).
See Fig. 2, remind to make alarm to user in time, said temperature sensor insert state testing circuit, also comprises a control chip 2 be connected with described decision circuitry 1, described control chip 2 for, after getting abnormal signal, outputting alarm signal is to alarm device.
The structural drawing of Fig. 3 temperature sensor insert state testing circuit disclosed in another embodiment of the application.
Be understandable that, see Fig. 3, described decision circuitry 1 disclosed in the above embodiments of the present application can comprise be made up of logic gates, for exporting the logic judging circuit 101 of the control signal matched with the signal type of the first and second signals got.
The negate circuit 102 be connected with the output terminal of described logic judging circuit 101 can also be comprised, described negate circuit 102 is for obtaining and exporting the status signal that the control signal that exports with logic judging circuit 101 matches, such as described negate circuit 102 is for obtaining and exporting the level signal contrary with the level signal that logic judging circuit 101 exports, the common I/O interface that this contrary level signal accesses described control chip 2 by PT-ER structure is carried out electrical level judging, the object of wherein said circnit NOT 102 to the level signal negate that described logic judging circuit 101 exports is the software protocol in level signal and described control chip is matched, software is facilitated to judge.
Be understandable that, because described negate circuit 102 is for obtaining and exporting the level signal that the level signal that exports with logic judging circuit 101 matches, therefore, the circuit structure of the described negate circuit 102 in the above embodiments of the present application can be polytype, as long as can ensure that the level signal that described negate circuit can export according to described logic judging circuit 101 exports the level signal matched.
Such as, the negate circuit 102 in the above embodiments of the present application can be that phase inverter also can as shown in Figure 3, comprise:
Base stage is connected with the output terminal of described logic judging circuit 102 by the 13 resistance R13, the triode Q1 of source ground;
One end is connected with the common port of described triode Q1 with described 13 resistance R131, the 7th electric capacity C7 of other end ground connection;
The 14 resistance R14 that one end is connected with the collector of described triode Q1, the other end is connected with the first voltage source;
One end is connected with the collector of described triode Q1, the 8th electric capacity C8 of other end ground connection;
The collector of described triode Q1 as the output terminal of described negate circuit 102, for being connected with control chip 2.
Below the course of work of above-mentioned negate circuit is introduced:
When the level signal that the base stage of described triode Q1 gets is high level, the voltage of described triode Q1 collector is base voltage, is 0, and therefore the output voltage of described negate circuit is 0; When the base voltage of described triode Q1 is low level, described triode Q1 is in off state, the voltage of described transistor collector is the voltage at described 7th electric capacity C7 two ends, and therefore, described negate circuit output voltage is the voltage at described 7th electric capacity C7 two ends.
Be understandable that and itself ask the structure type of the described logic judging circuit 101 in above-described embodiment also can be varied, such as, see Fig. 3, disclosed in the above embodiments of the present application, logic judging circuit 101 can comprise:
Input end and first of described temperature sensor insert the first phase inverter A1 that port PTA is connected;
Input end and second of described temperature sensor insert the second phase inverter A2 that port PTB is connected;
The Sheffer stroke gate A3 that first input end is connected with described first phase inverter A1 output terminal, the second input end is connected with described second phase inverter A2 output terminal, output terminal goes out to hold as described logic judging circuit defeated 101.
Wherein said first and second phase inverters can, for realizing the circuit of not gate function, such as, can be the circuit be built into by not gate or door, AND circuit etc.
When first of described temperature sensor inserts port and/or the second insertion port does not normally insert, one is had at least for high level signal in the signal got by the first and second insertion ports of described temperature sensor, described at least one output low level of first and second phase inverters, described Sheffer stroke gate exports high level, control described triode ON, PT-ER holds output low level, represents and inserts extremely; When first of described temperature sensor inserts port and the second insertion port all normally inserts, the signal got by the first and second insertion ports of described temperature sensor is low level signal, described first and second phase inverters all export high level, described Sheffer stroke gate output low level, control described triode to turn off, PT-ER end exports high level, represents and inserts normally.
Certainly, the described phase inverter in the above embodiments of the present application also can adopt Sheffer stroke gate to replace.
Be understandable that, in order to simplify circuit structure, the application appeals described logic judging circuit in embodiment and also can only be inserted port and second and insert logical AND gate that port one_to_one corresponding is connected or rejection gate forms with described first of temperature sensor of stating by first input end and the second input end respectively.
The structural drawing of Fig. 4 a kind of temperature sensing circuit disclosed in the embodiment of the present application.
Be understandable that, see Fig. 4, corresponding to temperature sensor insert state testing circuit disclosed in the above embodiments of the present application, disclosed herein as well is a kind of temperature sensing circuit, described temperature sensing circuit comprises:
Benchmark source generating circuit 3, the bridge detection circuit 4 be connected with described benchmark source generating circuit 3, the temperature sensor asked poor amplifying circuit 5 and be connected with the signal input part of described bridge detection circuit 4 be connected with described bridge detection circuit 4 output terminal, also comprise temperature sensor insert state testing circuit 6 disclosed in the above-mentioned any embodiment of the application, wherein, described benchmark source generating circuit 3 is as the power supply of bridge detection circuit.
Be understandable that, the circuit structure of the described benchmark source generating circuit 3 in temperature sensor disclosed in the above embodiments of the present application can for the benchmark source generating circuit arranged based on TL431 circuit, and see Fig. 4, described benchmark source generating circuit 3 can comprise:
One end is connected with described first voltage source the first electric capacity C1 of other end ground connection;
The input resistance R0 that first end is connected with the ungrounded end of described first electric capacity C1;
Negative electrode is connected with second end of described input resistance R0, the voltage stabilizing diode D3 of plus earth;
The first resistance R1 that one end is connected with second end of described input resistance R0, the other end is connected with described voltage stabilizing diode D3 reference edge;
One end is connected with described voltage stabilizing diode D3 negative electrode, the second electric capacity C3 of other end ground connection;
The negative electrode of described voltage stabilizing diode D3 is as the output terminal of described benchmark source generating circuit 3.
See Fig. 4, described bridge detection circuit 4 can comprise:
The second resistance R2 that first end is connected with the output terminal of described benchmark source generating circuit and the 3rd resistance R3;
The anti-interference rejector be connected with the 3rd resistance R3 with described second resistance R2;
Described anti-interference rejector comprises:
The common mode inductance L7 that first Motor Winding Same Name of Ends is connected with second end of described 3rd resistance R3 by the 16 resistance R16, the second Motor Winding Same Name of Ends is connected with second end of described second resistance R2;
One end is connected with described first winding different name end, the tenth electric capacity C10 of other end ground connection;
One end is connected with described second winding different name end, the 11 electric capacity C11 of other end ground connection;
The different name end of described first winding and first of described temperature sensor inserts port PTB and is connected;
The different name end of described second winding and second of described temperature sensor inserts port PTA and is connected;
Second end of described second resistance R2 is as the first output terminal of described bridge detection circuit;
Second end of described 3rd resistance R3 is as the second output terminal of described bridge detection circuit.
Be understandable that, owing to being provided with anti-interference rejector in the bridge detection circuit in the above embodiments of the present application, it comprises common mode inductance L7 and described tenth electric capacity C10 and described 11 electric capacity C11, common and different mode can be suppressed to disturb, enhance the anti-interference of described bridge detection circuit, guarantee stability and the reliability of temperature detection.
See Fig. 4, poor amplifying circuit 5 described in the above embodiments of the present application, is asked to comprise:
The first transport and placing device U1 that in-phase input end is connected with the first output terminal of described bridge detection circuit 4 by the 4th resistance R4, inverting input is connected with described bridge detection circuit 4 second output terminal by the 5th resistance R5;
One end is connected with described first transport and placing device U1 in-phase input end, the 6th resistance R6 of other end ground connection and the 3rd electric capacity C3;
One end is connected with described first transport and placing device U1 inverting input, the 12 electric capacity C12 of other end ground connection;
The 7th resistance R7 that one end is connected with described first transport and placing device U1 inverting input, be connected with described first transport and placing device U1 output terminal and the 4th electric capacity R4;
In-phase input end is connected with described first transport and placing device U1 output terminal by the 8th resistance R8, inverting input is by the second transport and placing device U2 of the 9th resistance R9 ground connection;
One end is connected with described second transport and placing device U2 in-phase input end, the 15 resistance R15 of other end ground connection and the 9th electric capacity C9;
One end is connected with described second transport and placing device U2 inverting input, the 5th electric capacity C5 of other end ground connection;
The tenth resistance R10 that one end is connected with described second transport and placing device U2 inverting input, be connected with described second transport and placing device U2 output terminal and the 6th electric capacity C6;
The 11 resistance R11 that first end is connected with described second transport and placing device U2 output terminal;
One end and described 11 the 12 resistance R12 that resistance R11 second end is connected, the other end is connected with the second voltage source;
The first diode D1 in parallel with described 12 resistance R12, the negative electrode of described first diode D1 is connected with described second voltage source;
Negative electrode is connected with described 11 resistance R11 second end, the second diode D2 of plus earth;
Second end of described 11 resistance R11, as the described output terminal asking poor amplifying circuit, carries out sample detecting for the AD mouth being linked into control chip.
Wherein, described first voltage source in the above embodiments of the present application and the output voltage of the second voltage source can set according to user's request.Such as, the voltage source of described first voltage source to be output voltage be 3.3V; The voltage source of described second voltage source to be output voltage be 3.0V.
In this instructions, each embodiment adopts the mode of going forward one by one to describe, and what each embodiment stressed is the difference with other embodiments, between each embodiment identical similar portion mutually see.
To the above-mentioned explanation of the disclosed embodiments, professional and technical personnel in the field are realized or uses the present invention.To be apparent for those skilled in the art to the multiple amendment of these embodiments, General Principle as defined herein can without departing from the spirit or scope of the present invention, realize in other embodiments.Therefore, the present invention can not be restricted to these embodiments shown in this article, but will meet the widest scope consistent with principle disclosed herein and features of novelty.
Claims (11)
1. a temperature sensor insert state testing circuit, is characterized in that, comprising:
Decision circuitry, for obtain and judge by temperature sensor first insert port obtain the first signal and described by temperature sensor second insert port obtain secondary signal whether all as low level signal, if so, the normal signal normally inserted for characterizing described temperature sensor is exported; Otherwise, export the abnormal signal characterizing described temperature sensor and do not insert.
2. temperature sensor insert state testing circuit according to claim 1, is characterized in that, also comprise:
The control chip be connected with described decision circuitry, for when get described decision circuitry export abnormal signal after, outputting alarm signal.
3. temperature sensor insert state testing circuit according to claim 1, it is characterized in that, described decision circuitry, comprising:
Be made up of logic gates, for exporting the logic judging circuit of the control signal matched with the signal type of the first and second signals got.
4. temperature sensor insert state testing circuit according to claim 3, it is characterized in that, described decision circuitry, also comprises:
The negate circuit be connected with the output terminal of described logic judging circuit, described negate circuit is for obtaining and exporting the status signal that the control signal that exports with logic judging circuit matches.
5. temperature sensor insert state testing circuit according to claim 4, is characterized in that, described negate circuit, comprising:
Base stage is connected with described logic judging circuit output terminal by the 13 resistance, the triode of source ground;
One end is connected with the common port of described triode with described 13 resistance, the 7th electric capacity of other end ground connection;
The 14 resistance that one end is connected with the collector of described triode, the other end is connected with the first voltage source;
One end is connected with the collector of described triode, the 8th electric capacity of other end ground connection;
The collector of described triode as the output terminal of described negate circuit, for being connected with control chip.
6. temperature sensor insert state testing circuit according to claim 3, it is characterized in that, described logic judging circuit, comprising:
Input end and first of described temperature sensor insert the first phase inverter that port is connected;
Input end and second of described temperature sensor insert the second phase inverter that port is connected;
First input end is connected with described first inverter output, the second input end is connected with described second inverter output, output terminal is as the Sheffer stroke gate of the output terminal of logic judging circuit.
7. temperature sensor insert state testing circuit according to claim 3, it is characterized in that, described logic judging circuit, comprising:
First input end and the second input end insert port and second and insert with described first of temperature sensor of stating the rejection gate that port one_to_one corresponding is connected respectively.
8. a temperature sensing circuit, is characterized in that, comprising:
Benchmark source generating circuit, the bridge detection circuit be connected with described benchmark source generating circuit, the temperature sensor asked poor amplifying circuit and be connected with described bridge detection circuit signal input part be connected with described bridge detection circuit output terminal, also comprise the temperature sensor insert state testing circuit described in claim 1-7 any one.
9. temperature sensing circuit according to claim 8, is characterized in that, described benchmark source generating circuit comprises:
One end is connected with described first voltage source, the first electric capacity of other end ground connection;
The input resistance that first end is connected with the ungrounded end of described first electric capacity;
Negative electrode is connected with the second end of described input resistance, the voltage stabilizing diode of plus earth;
The first resistance that one end is connected with the second end of described input resistance, the other end is connected with described voltage stabilizing diode reference edge;
One end is connected with described voltage stabilizing diode negative electrode, the second electric capacity of other end ground connection;
The negative electrode of described voltage stabilizing diode is as the output terminal of described benchmark source generating circuit.
10. temperature sensing circuit according to claim 8, is characterized in that, described bridge detection circuit comprises:
Second and the 3rd resistance that first end is connected with the output terminal of described benchmark source generating circuit;
The anti-interference rejector be connected with the 3rd resistance with described second resistance;
Described anti-interference rejector comprises:
First Motor Winding Same Name of Ends is by second end be connected, second Motor Winding Same Name of Ends with second end of described second resistance be connected the common mode inductance of the 16 resistance with described 3rd resistance;
One end is connected with described first winding different name end, the tenth electric capacity of other end ground connection;
One end is connected with described second winding different name end, the 11 electric capacity of other end ground connection;
The different name end of described first winding and first of described temperature sensor inserts port and is connected;
The different name end of described second winding and second of described temperature sensor inserts port and is connected;
Second end of described second resistance is as the first output terminal of described bridge detection circuit;
Second end of described 3rd resistance is as the second output terminal of described bridge detection circuit.
11. temperature sensors according to claim 8, is characterized in that, described in ask poor amplifying circuit to comprise:
The first transport and placing device that in-phase input end is connected with described bridge detection circuit first output terminal by the 4th resistance, inverting input is connected with described bridge detection circuit second output terminal by the 5th resistance;
One end is connected with described first transport and placing device in-phase input end, the 6th resistance of other end ground connection and the 3rd electric capacity;
One end is connected with described first transport and placing device inverting input, the 12 electric capacity of other end ground connection;
The 7th resistance that one end is connected with described first transport and placing device inverting input, be connected with described first transport and placing device output terminal and the 4th electric capacity;
In-phase input end is connected with described first transport and placing device output terminal by the 8th resistance, inverting input is by the second transport and placing device of the 9th resistance eutral grounding;
One end is connected with described second transport and placing device in-phase input end, the 15 resistance of other end ground connection and the 9th electric capacity;
One end is connected with described second transport and placing device inverting input, the 5th electric capacity of other end ground connection;
The tenth resistance that one end is connected with described second transport and placing device inverting input, be connected with described second transport and placing device output terminal and the 6th electric capacity;
The 11 resistance that first end is connected with described second transport and placing device output terminal;
One end and described 11 the 12 resistance that resistance second end is connected, the other end is connected with the second voltage source;
With the first diode of described 12 resistor coupled in parallel, the negative electrode of described first diode is connected with described second voltage source;
Negative electrode is connected with described 11 resistance second end, the second diode of plus earth;
Second end of described 11 resistance is as the described output terminal asking poor amplifying circuit.
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| CN201410734385.4A CN104458047A (en) | 2014-12-04 | 2014-12-04 | Temperature sensor insertion state detecting circuit and temperature detecting circuit |
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| CN201410734385.4A CN104458047A (en) | 2014-12-04 | 2014-12-04 | Temperature sensor insertion state detecting circuit and temperature detecting circuit |
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| CN105183615A (en) * | 2015-07-23 | 2015-12-23 | 英业达科技有限公司 | Server zero temperature judgment method |
| CN109239514A (en) * | 2018-08-03 | 2019-01-18 | 重庆川仪自动化股份有限公司 | A kind of liquidometer short circuit sensor, open detection circuit |
| CN110428597A (en) * | 2019-07-11 | 2019-11-08 | 大唐国际发电股份有限公司张家口发电厂 | The disconnected coal signalling alarm equipment of dynamic based on piezoelectric ceramics and its logical design |
| CN111811670A (en) * | 2020-07-07 | 2020-10-23 | 九阳股份有限公司 | Temperature detection circuit of plug-in type sensor and cooking utensil |
| CN111964809A (en) * | 2020-08-14 | 2020-11-20 | 苏州浪潮智能科技有限公司 | Temperature sensor, server, and method and system for detecting abnormality of temperature sensor |
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| CN109239514B (en) * | 2018-08-03 | 2021-02-09 | 重庆川仪自动化股份有限公司 | Short circuit and open circuit detection circuit of liquid level meter sensor |
| CN110428597A (en) * | 2019-07-11 | 2019-11-08 | 大唐国际发电股份有限公司张家口发电厂 | The disconnected coal signalling alarm equipment of dynamic based on piezoelectric ceramics and its logical design |
| CN111811670A (en) * | 2020-07-07 | 2020-10-23 | 九阳股份有限公司 | Temperature detection circuit of plug-in type sensor and cooking utensil |
| CN111964809A (en) * | 2020-08-14 | 2020-11-20 | 苏州浪潮智能科技有限公司 | Temperature sensor, server, and method and system for detecting abnormality of temperature sensor |
| CN111964809B (en) * | 2020-08-14 | 2022-12-27 | 苏州浪潮智能科技有限公司 | Temperature sensor, server, and method and system for detecting abnormality of temperature sensor |
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Application publication date: 20150325 |