CN104423375A - Method and device for testing vehicle-mounted unit - Google Patents
Method and device for testing vehicle-mounted unit Download PDFInfo
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- CN104423375A CN104423375A CN201310395611.6A CN201310395611A CN104423375A CN 104423375 A CN104423375 A CN 104423375A CN 201310395611 A CN201310395611 A CN 201310395611A CN 104423375 A CN104423375 A CN 104423375A
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
- G05B23/021—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system adopting a different treatment of each operating region or a different mode of the monitored system, e.g. transient modes; different operating configurations of monitored system
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Abstract
The invention provides a method and a device for testing a vehicle-mounted unit. The method mainly comprises the following steps that a test circuit board is connected with the vehicle-mounted unit through a plurality of data lines; the data lines comprise data transmission lines and test state setting lines; the test circuit board transmits test data to the vehicle-mounted unit through the vehicle-mounted unit; the vehicle-mounted unit is enabled to be in a given test state by adjusting the level value of the test state setting lines, and the vehicle-mounted unit acquires a testing program corresponding to the given test state from the testing data and executes the testing program. The vehicle-mounted unit is matched with a single chip computer by adjusting the level value of the test state setting lines, and the vehicle-mounted unit is enabled to be in different test states by the test circuit board by downloading a program at one time.
Description
Technical field
The present invention relates to testing for electrical equipment field, particularly to the method and apparatus that the board units in electronic charging system without parking is tested.
Background technology
Board units in electronic charging system without parking adopts single-chip microcomputer as main control chip, will carry out a large amount of debugging before product export, and usually also needs to do a large amount of tests in the middle of production run.And general existing test process is all download different test procedures for different test events, such as, Physical layer be surveyed, then download Physical layer test procedure; Survey self-inspection, then descend self-check program; Test cross is easy, then descend transaction program.Such test process can allow tester carry out a lot of repetitive work, reduces the work efficiency of tester, causes very large waste to the human resources of enterprise.Therefore, designing a download circuit that can improve testing efficiency is the research direction of this area.
Summary of the invention
Fundamental purpose of the present invention is to provide a kind of method and apparatus tested board units, to achieve the above object, the invention provides
To the method that board units is tested, it is characterized in that, comprising:
Be connected with board units by a plurality of data lines by testing circuit board, described a plurality of data lines comprises data line and test mode arranges line;
Test data is transferred to described board units by described data line by described testing circuit board;
Make described board units enter the test mode of specifying by the level value regulating described test mode to arrange line, described board units obtains test procedure corresponding to described test mode of specifying from described test data, and performs described test procedure.
Described testing circuit board also comprises before by described data line test data being transferred to described board units:
Be connected with host computer by USB interface by described testing circuit board, described test data is transferred to described testing circuit board by USB interface by described host computer.
The described level value by regulating described test mode to arrange line makes described board units enter the test mode of specifying, and comprising:
The quantity that described test mode arranges line is many, and often kind of combination that described many test modes arrange the level value of line is uniquely corresponding with a kind of test mode of board units respectively;
Obtain the given combination needing the test mode of specifying of the board units of test unique many corresponding test modes that the level value of line is set, regulate described many test modes that the level value of line is set according to described given combination.
Often kind of combination that described many test modes arrange the level value of line is uniquely corresponding with a kind of test mode of board units respectively, comprising:
The quantity that described test mode arranges line is 2, be respectively the first test mode and arrange line and the second test mode arranges line, described first test mode arranges line and described second test mode and arranges line and regulate level value to be high or low by the switch be arranged on described testing circuit board;
The level value that described first test mode arranges line is set to level value that high and described second test mode arranges line when being set to high, and board units enters and wakes test mode up;
The level value that described first test mode arranges line is set to level value that high and described second test mode arranges line when being set to low, and board units enters Physical layer test mode;
The level value that described first test mode arranges line is set to level value that low and described second test mode arranges line when being set to high, and board units enters Autonomous test state;
The level value that described first test mode arranges line is set to level value that low and described second test mode arranges line when being set to low, and board units enters stateful transaction.
5, method of testing board units according to claim 4, is characterized in that, the stateful transaction of described board units is the acquiescence original state of described board units, and described acquiescence original state is the normal operating condition of described board units.
Described board units obtains test procedure corresponding to described test mode of specifying from described test data, and performs described test procedure, comprising:
After described board units receives the test data that described testing circuit board transmits, extract the test procedure that the multiple test mode of the board units comprised in described test data is corresponding respectively, by test mode and corresponding test procedure association store in storage medium;
After described board units enters the test mode of specifying, inquire about described storage medium according to described test mode of specifying, obtain the test procedure that described test mode of specifying is corresponding, and perform described test procedure.
To the device that board units is tested, comprising: board units, testing circuit board,
Described testing circuit board, for being connected with described board units by a plurality of data lines, described a plurality of data lines comprises data line and test mode arranges line, by described data line, test data is transferred to described board units; Described board units is made to enter the test mode of specifying by the level value regulating described test mode to arrange line;
Described board units, for obtaining test procedure corresponding to described test mode of specifying from described test data, and performs described test procedure.
Described device also comprises:
Host computer, for being connected with described testing circuit board by USB interface, is transferred to described testing circuit board by USB interface by described test data.
Described testing circuit board, when being many specifically for arranging the quantity of line when described test mode, arranging described many test modes, to arrange often kind of combination of the level value of line uniquely corresponding with a kind of test mode of board units respectively; Obtain the given combination needing the test mode of specifying of the board units of test unique many corresponding test modes that the level value of line is set, regulate described many test modes that the level value of line is set according to described given combination.
Described testing circuit board, the quantity arranging line specifically for working as described test mode is 2, be respectively the first test mode and line and the second test mode are set when arranging line, described first test mode arranged the level value that line and described second test mode arrange line be adjusted to high or low by being arranged on switch on described testing circuit board;
The level value that described first test mode arranges line is set to level value that high and described second test mode arranges line when being set to high, board units enters and wakes test mode up;
The level value that described first test mode arranges line level value is set to level value that high and described second test mode arranges line when being set to low, board units enters Physical layer test mode;
The level value that described first test mode arranges line is set to level value that low and described second test mode arranges line when being set to high, board units enters Autonomous test state;
Low and described second test mode that is set to described first test mode being arranged line level value arranges line level value when being set to low, and board units enters stateful transaction.
Described board units, after receiving test data that described testing circuit board transmits, extract the test procedure that the multiple test mode of the board units comprised in described test data is corresponding respectively, by test mode and corresponding test procedure association store in storage medium;
After described board units enters the test mode of specifying, inquire about described storage medium according to described test mode of specifying, obtain the test procedure that described test mode of specifying is corresponding, and perform described test procedure.
Fundamental purpose of the present invention is to provide a kind of method and apparatus tested board units, by the level value regulating test mode to arrange line, coordinate with board units, realize a download program, just board units can be made to enter into different test modes by testing circuit board, improve the work efficiency of tester, also save the human resources of enterprise.
Accompanying drawing explanation
A kind of method processing flow chart that board units is tested that Fig. 1 provides for the embodiment of the present invention;
A kind of apparatus structure block diagram that board units is tested that Fig. 2 provides for the embodiment of the present invention.In figure: 10 be board units, 20 be testing circuit board, 30 for host computer, 211 be the first test mode arrange line, 212 be the second test mode arrange line, 213 be USB interface, 214 for data line;
Embodiment
For ease of the understanding to the embodiment of the present invention, be further explained explanation below in conjunction with accompanying drawing for several specific embodiment, and each embodiment does not form the restriction to the embodiment of the present invention.
Embodiment one
This embodiment offers a kind of processing flow chart to the method that board units is tested, as shown in Figure 1, comprise following treatment step:
Step S110, host computer by USB(Universal Serial Bus, USB (universal serial bus)) interface is connected with testing circuit board; Described testing circuit board is the circuit board that the common sheet material of FR-4 is made, can designed enclosures to described testing circuit board, and wire-jumper type switch can be changed into the switch of button form, the function of realization is the same.Also can increase chip microcontroller programmed control on described testing circuit board, carry out the operation of gauge tap.
Step S120, test data is transferred to testing circuit board by host computer;
Be connected with host computer by USB interface by testing circuit board, test data is transferred to testing circuit board by USB interface by host computer.
Step S130, test data is transferred to board units by data line by testing circuit board;
A plurality of data lines comprises data line and test mode arranges line;
The quantity that test mode arranges line is many, and often kind of combination that many test modes arrange the level value of line is uniquely corresponding with a kind of test mode of board units respectively;
Obtain the given combination needing the test mode of specifying of the board units of test unique many corresponding test modes that the level value of line is set, regulate many test modes that the level value of line is set according to given combination.
Step S140, the test mode that the level value regulating test mode to arrange line makes board units enter to specify;
The quantity that test mode arranges line is 2, be respectively the first test mode and arrange line and the second test mode arranges line, the first test mode arranges line and the second test mode and arranges line to carry out adjustment level value by the switch be arranged on testing circuit board be high or low; Automatically regulated by keeper's manual shift or program
First test mode arrange line for high and the second test mode arrange line level value be set to high time, board units enters and wakes test mode up; First test mode is arranged line and arrange after line level value is set to height for high and the second test mode, that clicks host computer test procedure wakes button up, board units hummer rings a sound, enters wake-up states, board units wait-receiving mode 14K square wave (the 14K square wave where sent).Once receive 14K square wave, hummer Chang Xiang.The object arranging this state is to test the clever lightness waken up, to determine whether this board units meets Standard.
First test mode arranges line level value and is set to high and the second test mode and arranges line level value when being set to low, and board units enters Physical layer test mode; Physical layer test mode comprises launches 5.79G carrier wave, transmitting 5.80G carrier wave, transmitting 5.79G PN9 waveform, transmitting 5.80G PN9 waveform, accepting state.Host computer procedure is clicked by different buttons and is arranged.The object arranging these states is in order to whether testing and launching power, transmission frequency, transmitted bandwidth, the index of modulation, receiving sensitivity meet Standard.Level value height is 3.6v, and level value is low is 0V.
First test mode arranges line level value and is set to low and the second test mode and arranges line level value when being set to high, and board units enters Autonomous test state; First test mode is arranged line level value to be set to low and the second test mode and to arrange after line level value is set to height, board units enters self-inspection state.Now, in board units, insert test subscriber's card, self-inspection starts.Board units automatically detects after test completes and returns error code, 000 represents that test is passed through, represent the read-write of ESAM (Embedded Secure AccessModule, embedded safety module) card Card Reader, non-contact card Card Reader chip register, non-contact card chip Card Reader from left to right respectively; When return code in place is 1, represent that this functional test is not passed through.Namely 000: test is passed through; 001:ESAM card Card Reader mistake; 010: non-contact card does not weld, please again weld; 100: non-contact card Card Reader mistake.Level value height is 3.6v, and level value is low is 0V.
First test mode arranges line level value and is set to low and the second test mode and arranges line level value when being set to low, and board units enters stateful transaction.Under stateful transaction, board units function is identical with actual service condition, can communicate with roadside unit, completes ETC (Electronic Toll Collection, electronic charging system without parking) process of exchange.
Suppose that the first test mode arranges line, to arrange line be STAG and LINK to the second test mode, when TXD data line is connected with board units with RXD data line one end, the other end is connected with host computer by USB interface; STAG with LINK one end is connected with board units, and the other end can arrange state voluntarily on testing circuit board.
Those skilled in the art will be understood that the application type of the test mode that level value that above-mentioned test mode arranges line makes board units enter to specify is only citing; other different test modes that are existing or that may occur from now on arrange test mode application type that line makes board units enter to specify as being applicable to the embodiment of the present invention; also within scope should being included in, and this is contained at this with way of reference.
Step S150, board units obtains test procedure corresponding to the test mode of specifying from test data;
After board units receives the test data that testing circuit board transmits, extract the test procedure that the multiple test mode of the board units comprised in test data is corresponding respectively, by test mode and corresponding test procedure association store in storage medium;
After board units enters the test mode of specifying, according to the test mode inquiry storage medium of specifying, obtain the test procedure that the test mode of specifying is corresponding.
Step S160, performs test procedure.
In practical application, software engineer writes a program, comprises and wake test mode, Physical layer test mode, Autonomous test state and stateful transaction up in program.When downloading, the first test mode arrange line level value be set to low or. the second test mode arranges line level value when being set to low, and board units is in acquiescence original state, and acquiescence original state is. board units normal operating condition.After download program completes, board units is defaulted as stateful transaction, directly can pay user and use.If desired test, then connecting test circuit board, arranging the level value switch that line and the second test mode arrange line by regulating the first test mode on connecting test circuit board makes their level value be in high or low state, thus the test procedure making the multiple test mode of board units corresponding respectively, different test functions can be realized.
Described as can be seen from above, by the level value regulating test mode to arrange line, coordinate with board units, realize a download program, just board units can be made to enter into different test modes by testing circuit board, improve the work efficiency of tester, also save the human resources of enterprise.
Embodiment two
This embodiment offers a kind of the apparatus structure block diagram tested board units, its specific implementation structure as shown in Figure 2, specifically can comprise: testing circuit board 20, board units 10 and host computer 30.
Described testing circuit board 20, for being connected with described board units 10 by a plurality of data lines, described a plurality of data lines comprises data line 214 and test mode arranges line, and test data is transferred to described board units 10 by described data line 214 by host computer 30; Described board units 10 is made to enter the test mode of specifying by the level value regulating described test mode to arrange line;
Described board units 10, for obtaining test procedure corresponding to described test mode of specifying from described test data, and performs described test procedure.
Described host computer 30, for being connected with described testing circuit board 20 by USB interface 213, is transferred to described testing circuit board 20 by USB interface 213 by described test data.
Described testing circuit board 20, when being many specifically for arranging the quantity of line when described test mode, arranging described many test modes, to arrange often kind of combination of the level value of line uniquely corresponding with a kind of test mode of board units 10 respectively; Obtain the given combination needing the test mode of specifying of the board units 10 of test unique many corresponding test modes that the level value of line is set, regulate described many test modes that the level value of line is set according to described given combination.
Described testing circuit board 20, the quantity arranging line specifically for working as described test mode is 2, be respectively the first test mode and line 211 and the second test mode are set when arranging line 212, described first test mode arranged the level value that line 211 and described second test mode arrange line 212 be adjusted to high or low by being arranged on switch on described testing circuit board 20;
The level value that described first test mode arranges line 211 is set to level value that high and described second test mode arranges line 212 when being set to high, board units 10 enters and wakes test mode up;
The level value described first test mode being arranged line 211 level value is set to level value that high and described second test mode arranges line 212 when being set to low, and board units 10 enters Physical layer test mode;
The level value that described first test mode arranges line 211 is set to level value that low and described second test mode arranges line 212 when being set to high, board units 10 enters Autonomous test state;
Low and described second test mode that is set to described first test mode being arranged line 211 level value arranges line 212 level value when being set to low, and board units 10 enters stateful transaction.
Described board units 10, after receiving test data that described testing circuit board 20 transmits, extract the test procedure that the multiple test mode of the board units 10 comprised in described test data is corresponding respectively, by test mode and corresponding test procedure association store in storage medium;
After described board units 10 enters the test mode of specifying, inquire about described storage medium according to described test mode of specifying, obtain the test procedure that described test mode of specifying is corresponding, and perform described test procedure.
In actual applications, the quantity that above-mentioned test mode arranges line can be 2, as shown in Figure 2, is respectively the first test mode and arranges line 211 and the second test mode arranges line 212, in fig. 2, also comprise USB interface 213, data line 214.Wherein the first test mode line is set, the second test mode arrange line be used for regulate level value, board units 10 is made to enter into different test modes, data line can be divided into TXD data line and RXD data line to be data transmission media between host computer 30 and board units 10, suppose that the first test mode arranges line, to arrange line be STAG and LINK to the second test mode, when TXD data line is connected with board units 10 with RXD data line one end, the other end is connected with host computer 30 by USB interface; STAG with LINK one end is connected with board units 10, and the other end can arrange state voluntarily on testing circuit board 20.
In described testing circuit board 20, STAG and LINK input level value can be selected to be high with switch on testing circuit board 20 or level value is low, and can be combined into four kinds of states like this, namely STAG current potential is high, and LINK current potential is high; STAG current potential is high, and LINK current potential is low; STAG current potential is low, and LINK current potential is high; STAG current potential is low, and LINK current potential is low.Board units 10, by detecting the different state of this STAG and LINK tetra-kinds, realizes controlling to program.Only need program next time, just can be downloaded by the USB described in connection and enter into different test modes from test circuit.
In sum, the level value of the embodiment of the present invention by regulating test mode to arrange line, coordinate with board units 10, realize a download program, just board units 10 can be made to enter into different test modes by testing circuit board 20, improve the work efficiency of tester, also save the human resources of enterprise.
One of ordinary skill in the art will appreciate that: accompanying drawing is the schematic diagram of an embodiment, the module in accompanying drawing or flow process might not be that enforcement the present invention is necessary.
As seen through the above description of the embodiments, those skilled in the art can be well understood to the mode that the present invention can add required general hardware platform by software and realizes.Based on such understanding, technical scheme of the present invention can embody with the form of software product the part that prior art contributes in essence in other words, this computer software product can be stored in storage medium, as ROM/RAM, magnetic disc, CD etc., comprising some instructions in order to make a computer equipment (can be personal computer, server, or the network equipment etc.) perform the method described in some part of each embodiment of the present invention or embodiment.
Each embodiment in this instructions all adopts the mode of going forward one by one to describe, between each embodiment identical similar part mutually see, what each embodiment stressed is the difference with other embodiments.Especially, for device or system embodiment, because it is substantially similar to embodiment of the method, so describe fairly simple, relevant part illustrates see the part of embodiment of the method.Apparatus and system embodiment described above is only schematic, the wherein said unit illustrated as separating component or can may not be and physically separates, parts as unit display can be or may not be physical location, namely can be positioned at a place, or also can be distributed in multiple network element.Some or all of module wherein can be selected according to the actual needs to realize the object of the present embodiment scheme.Those of ordinary skill in the art, when not paying creative work, are namely appreciated that and implement.
The above; be only the present invention's preferably embodiment, but protection scope of the present invention is not limited thereto, is anyly familiar with those skilled in the art in the technical scope that the present invention discloses; the change that can expect easily or replacement, all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of claim.
Claims (11)
1. to the method that board units is tested, it is characterized in that, comprising:
Be connected with board units by a plurality of data lines by testing circuit board, described a plurality of data lines comprises data line and test mode arranges line;
Test data is transferred to described board units by described data line by described testing circuit board;
Make described board units enter the test mode of specifying by the level value regulating described test mode to arrange line, described board units obtains test procedure corresponding to described test mode of specifying from described test data, and performs described test procedure.
2. method of testing board units according to claim 1, is characterized in that, described testing circuit board also comprises before by described data line test data being transferred to described board units:
Be connected with host computer by USB interface by described testing circuit board, described test data is transferred to described testing circuit board by USB interface by described host computer.
3. method of testing board units according to claim 1, is characterized in that, the described level value by regulating described test mode to arrange line makes described board units enter the test mode of specifying, and comprising:
The quantity that described test mode arranges line is many, and often kind of combination that described many test modes arrange the level value of line is uniquely corresponding with a kind of test mode of board units respectively;
Obtain the given combination needing the test mode of specifying of the board units of test unique many corresponding test modes that the level value of line is set, regulate described many test modes that the level value of line is set according to described given combination.
4. method of testing board units according to claim 3, is characterized in that, often kind of combination that described many test modes arrange the level value of line is uniquely corresponding with a kind of test mode of board units respectively, comprising:
The quantity that described test mode arranges line is 2, be respectively the first test mode and arrange line and the second test mode arranges line, described first test mode arranges line and described second test mode and arranges line and regulate level value to be high or low by the switch be arranged on described testing circuit board;
The level value that described first test mode arranges line is set to level value that high and described second test mode arranges line when being set to high, and board units enters and wakes test mode up;
The level value that described first test mode arranges line is set to level value that high and described second test mode arranges line when being set to low, and board units enters Physical layer test mode;
The level value that described first test mode arranges line is set to level value that low and described second test mode arranges line when being set to high, and board units enters Autonomous test state;
The level value that described first test mode arranges line is set to level value that low and described second test mode arranges line when being set to low, and board units enters stateful transaction.
5. method of testing board units according to claim 4, is characterized in that, the stateful transaction of described board units is the acquiescence original state of described board units, and described acquiescence original state is the normal operating condition of described board units.
6. the method for testing board units according to any one of claim 1 to 5, is characterized in that, described board units obtains test procedure corresponding to described test mode of specifying from described test data, and performs described test procedure, comprising:
After described board units receives the test data that described testing circuit board transmits, extract the test procedure that the multiple test mode of the board units comprised in described test data is corresponding respectively, by test mode and corresponding test procedure association store in storage medium;
After described board units enters the test mode of specifying, inquire about described storage medium according to described test mode of specifying, obtain the test procedure that described test mode of specifying is corresponding, and perform described test procedure.
7. to the device that board units is tested, it is characterized in that, comprising: board units, testing circuit board,
Described testing circuit board, for being connected with described board units by a plurality of data lines, described a plurality of data lines comprises data line and test mode arranges line, by described data line, test data is transferred to described board units; Described board units is made to enter the test mode of specifying by the level value regulating described test mode to arrange line;
Described board units, for obtaining test procedure corresponding to described test mode of specifying from described test data, and performs described test procedure.
8. the device tested board units according to claim 7, is characterized in that, described device also comprises:
Host computer, for being connected with described testing circuit board by USB interface, is transferred to described testing circuit board by USB interface by described test data.
9. the device tested board units according to claim 7, is characterized in that:
Described testing circuit board, when being many specifically for arranging the quantity of line when described test mode, arranging described many test modes, to arrange often kind of combination of the level value of line uniquely corresponding with a kind of test mode of board units respectively; Obtain the given combination needing the test mode of specifying of the board units of test unique many corresponding test modes that the level value of line is set, regulate described many test modes that the level value of line is set according to described given combination.
10. the device tested board units according to claim 9, is characterized in that:
Described testing circuit board, the quantity arranging line specifically for working as described test mode is 2, be respectively the first test mode and line and the second test mode are set when arranging line, described first test mode arranged the level value that line and described second test mode arrange line be adjusted to high or low by being arranged on switch on described testing circuit board;
The level value that described first test mode arranges line is set to level value that high and described second test mode arranges line when being set to high, board units enters and wakes test mode up;
The level value that described first test mode arranges line level value is set to level value that high and described second test mode arranges line when being set to low, board units enters Physical layer test mode;
The level value that described first test mode arranges line is set to level value that low and described second test mode arranges line when being set to high, board units enters Autonomous test state;
Low and described second test mode that is set to described first test mode being arranged line level value arranges line level value when being set to low, and board units enters stateful transaction.
11. devices tested board units according to any one of claim 7 to 10, is characterized in that:
Described board units, after receiving test data that described testing circuit board transmits, extract the test procedure that the multiple test mode of the board units comprised in described test data is corresponding respectively, by test mode and corresponding test procedure association store in storage medium;
After described board units enters the test mode of specifying, inquire about described storage medium according to described test mode of specifying, obtain the test procedure that described test mode of specifying is corresponding, and perform described test procedure.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105652859A (en) * | 2016-03-31 | 2016-06-08 | 北京经纬恒润科技有限公司 | Early production containment system for controller products |
| CN110648425A (en) * | 2019-09-20 | 2020-01-03 | 天地融科技股份有限公司 | Detection method and system for vehicle-mounted unit |
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| CN104423375B (en) | 2017-07-04 |
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