CN104422477A - Chip detection device - Google Patents
Chip detection device Download PDFInfo
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- CN104422477A CN104422477A CN201310366111.XA CN201310366111A CN104422477A CN 104422477 A CN104422477 A CN 104422477A CN 201310366111 A CN201310366111 A CN 201310366111A CN 104422477 A CN104422477 A CN 104422477A
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- chip
- testing agency
- detection
- performance
- detection device
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Abstract
The invention provides a chip detection device which mainly comprises a host machine, wires, a control mechanism, a detection mechanism, an analysis mechanism, and a display mechanism. The chip detection device is characterized in that the host machine, the control mechanism, the detection mechanism, the analysis mechanism and the display mechanism are connected by the wires; the detection mechanism is composed of an appearance detection device and a performance detection device; and the control mechanism is connected to the two ends of the detection mechanism and the analysis mechanism. The appearance characteristics and performance of a chip can be observed accurately through the display mechanism, and users can carry out operation in chip detection conveniently and accurately.
Description
Technical field
The present invention relates to electronic detecting device, especially relate to a kind of chip-detecting apparatus.
Background technology
At present, integrated circuit manufacturing industry develop rapidly, chip uses more and more extensive, so more and more important to the test sheets of chip performance.
Summary of the invention
The object of this invention is to provide a kind of external appearance characteristic and performance of observing out chip by indication mechanism like clockwork, the chip-detecting apparatus that operator can operate easily and accurately to chip detection.
Technical scheme of the present invention is: a kind of chip-detecting apparatus, mainly comprise main frame, wire, control gear, testing agency, analysis institution and indication mechanism, it is characterized in that: described main frame, control gear, testing agency, analysis institution are connected by wire with indication mechanism, described testing agency fills described appearance delection device by outward appearance detection and enough becomes with device for detecting performance for being connected in parallel to put with device for detecting performance, and described control gear is connected to testing agency and analysis institution two ends.
Further, described appearance delection device and device for detecting performance are for being connected in parallel.
The advantage that the present invention has and good effect are: the present invention observes out external appearance characteristic and the performance of chip like clockwork by indication mechanism, and operator can operate easily and accurately to chip detection.
Accompanying drawing explanation
Fig. 1 is configuration diagram of the present invention.
In figure:
1, main frame 2, testing agency 201, visual inspection machine structure
202, Performance Detection mechanism 3, control gear 4, analysis institution
5, indication mechanism 6, wire
Embodiment
Below in conjunction with the drawings and the specific embodiments, the invention will be further described.
As shown in Figure 1, the invention provides a kind of chip-detecting apparatus, mainly comprise main frame 1, wire 6, control gear 3, testing agency 2, analysis institution 4 and indication mechanism 5.Described main frame 1, control gear 3, testing agency 2, analysis institution 4 are connected by wire 6 with indication mechanism 5, described testing agency 2 is reached into device for detecting performance 202 by appearance delection device 201, and described control gear 3 is connected to testing agency 2 and analysis institution 4 two ends.
Further, described appearance delection device 201 and device for detecting performance 202 are for being connected in parallel.
The course of work of the present invention: chip under test is placed in testing agency 2, observes chip outward appearance and performance characteristic by indication mechanism 5.
The present invention observes out external appearance characteristic and the performance of chip like clockwork by indication mechanism, and operator can operate easily and accurately to chip detection.
Above embodiment is to invention has been detailed description, but described content is only preferred embodiment of the present invention, can not be considered to for limiting practical range of the present invention.All equalizations done according to the present patent application scope change and improve, and all should still belong within patent covering scope of the present invention.
Claims (2)
1. a chip-detecting apparatus, mainly comprise main frame, wire, control gear, testing agency, analysis institution and indication mechanism, it is characterized in that: described main frame, control gear, testing agency, analysis institution are connected by wire with indication mechanism, described testing agency is enough become with device for detecting performance by appearance delection device, and described control gear is connected to testing agency and analysis institution two ends.
2. a kind of chip-detecting apparatus according to claim 1, is characterized in that: described appearance delection device and device for detecting performance are for being connected in parallel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310366111.XA CN104422477A (en) | 2013-08-21 | 2013-08-21 | Chip detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310366111.XA CN104422477A (en) | 2013-08-21 | 2013-08-21 | Chip detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104422477A true CN104422477A (en) | 2015-03-18 |
Family
ID=52972133
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310366111.XA Pending CN104422477A (en) | 2013-08-21 | 2013-08-21 | Chip detection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104422477A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106918359A (en) * | 2015-12-28 | 2017-07-04 | 镇江坤泉电子科技有限公司 | A kind of electronic installation for detection chip |
| CN117571742A (en) * | 2024-01-12 | 2024-02-20 | 贵州大学 | Method and device for realizing chip quality inspection based on artificial intelligence |
-
2013
- 2013-08-21 CN CN201310366111.XA patent/CN104422477A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106918359A (en) * | 2015-12-28 | 2017-07-04 | 镇江坤泉电子科技有限公司 | A kind of electronic installation for detection chip |
| CN117571742A (en) * | 2024-01-12 | 2024-02-20 | 贵州大学 | Method and device for realizing chip quality inspection based on artificial intelligence |
| CN117571742B (en) * | 2024-01-12 | 2024-04-05 | 贵州大学 | Method and device for realizing chip quality inspection based on artificial intelligence |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20150318 |
|
| WD01 | Invention patent application deemed withdrawn after publication |