The content of the invention
The technical problem to be solved in the present invention is:Overcome the defect of prior art, propose a kind of using micro-force measurement bullet
The intelligence system of piece height.Have many advantages, such as that high accuracy, high efficiency, certainty of measurement uniformity are good.
In order to solve the above problems, the present invention proposes following technical scheme:A kind of intelligence of micro-force measurement shell fragment height
System, it includes a board and a measuring table, and the board includes measurement head, an operating system of user and a net
Network communication interface;
Shell fragment is measured with the intelligence system highly to comprise the following steps:
Step 1:Activation system, sets up communication;
When measuring first, program enters following step 1-1:Start measuring system first, opened to electricity on board
System, then setting measurement parameter, after systematic parameter is initialized, starts TCP/IP communications;
Then, program circulation performs following step 1-2:Data are received by network or control instruction is sent and is stored in data
Buffer storage, is then back to the program entry of step 1-2, and after TCP/IP communications are started, software connects all the time by TCP/IP
Receive data;
Step 2:The initial value of school high parameter A is set, and the control instruction communicated by TCP/IP is set to school high parameter A
0;
Step 3:Perform school it is high/survey main body process high;
First, program judges whether school high parameter A is 0;
As school high parameter A=0, program enters step 3-1 and performs height calibration process, and it is high to send calibration by communications protocol
Degree instructs to control board;
Next, program performs following step 3-1-1:Read buffer data, then draw force-displacement curve figure, program
Judge whether board reaches micro- power of setting and whether board returns to original position;
When micro- power and board that board is not up to setting are not returned to original position, then step 3-1-1 is repeated;
When micro- power and board that board reaches setting return to original position, program performs following step 3-1-2:Calculate
Go out the zero point of measuring table, be stored in data storage area, school high parameter A is set to 1, now complete the school of measuring table height
It is accurate;
Now, step 3-1 is completed, the program entry of step 3 is then back to, judges whether school high parameter A is 0 again;
When school high parameter A=1, then enter following step 3-2 and perform height measurement program, sent by communications protocol and survey high
Instruct to control board;
Next, performing following step 3-2-1:Read buffer data, then read the zero point of data storage area measuring table,
Force-displacement curve figure is drawn again, and program judges whether board reaches micro- power of setting and whether board returns to original position;
When micro- power and board that board is not up to setting are not returned to original position, then step 3-2-1 is repeated;
When micro- power and board that board reaches setting return to original position, program performs following step 3-2-2:Calculate
Go out the height of tested shell fragment, be then stored in data storage area, generation word report;
Then, program performs the following steps 3-2-3:Judge once school it is high/whether each school high parameter B be 0;
When once school it is high/each school high parameter B=0 when, it is high to be both needed to school before each sample measurement, then school high parameter A is set
It is 0, completes step 3-2, the entrance of program return to step 3 rejudges whether school high parameter A is 0;
When once school it is high/each school high parameter B=1 when, only need to carry out one-shot measurement platform before the sample measurement of same specification
School is high, the entrance of the direct return to step 3 of program, rejudges whether school high parameter A is 0.
The further restriction of above-mentioned technical proposal is, and above-mentioned once school is high/and each school high parameter B is meant that:B=0,
It is both needed to that school is high before each sample measurement, only needs the school for carrying out one-shot measurement platform 2 high before the sample measurement of B=1 same specifications.Can root
Selection setting is carried out according to user's request.
Compared with prior art, the present invention has the advantages that:
1st, high accuracy:The intelligence system of utilization micro-force measurement shell fragment height of the invention, shell fragment is forced by micro-, can with gram
The gap that shell fragment is placed on measuring table is taken, while the measurement for also overcoming survey crew's power operating process difference and causing is inclined
Difference, thus certainty of measurement is high.
2nd, the precision of measurement data has uniformity high:The intelligence system of utilization micro-force measurement shell fragment height of the invention,
Control board is set by micro- power, while collect the data of power and displacement, micro- makes every effort to corresponding height by what is pre-set
Degree, whole measurement can in high degree exclude influence of the external factor to measurement process and measurement result very much so that measurement data
Precision has uniformity high.
3rd, measurement process has repeatability high, high efficiency:Measurement process does not depend on the operation of survey crew excessively
Experience, reduces influence of the operating personnel to measurement result so that measurement process has repeatability higher, while reducing
The process that personnel judge, improves efficiency.
4th, user can according to demand, and school is high or each school is high to select setting measurement platform to carry out once, can meet diversification
Customer demand.
5th, it is easy to operate:Measuring table has operating system and network communication so that measurement procedure and data transfer
It is more simple and convenient.
Specific embodiment
The present invention proposes a kind of intelligence system of micro-force measurement shell fragment height, and it includes that a board 1 and a measurement are flat
Platform 2.
Wherein, the board 1 includes measurement head, an operating system of user and a network communication interface.
The intelligence system of micro-force measurement shell fragment height of the present invention, the main part of the method for its measurement shell fragment height is divided into two
Individual link:
1st, calibration measurement platform 2:When the power that the measurement head of board 1 touches measuring table 2 reaches micro- power of setting, machine
Platform 1 returns to original position, while gather the data of power and displacement, calculates the height of measuring table 2, and this highly as
The zero displacement point of testing sample height;
2nd, the height of shell fragment is measured:Set when the power that the measurement head of board 1 touches the shell fragment being placed on measuring table 2 reaches
During fixed micro- power, board 1 returns to original position, while gathering the data of power and displacement, calculates the height of testing sample shell fragment.
As shown in figure 1, measure shell fragment using above-mentioned intelligence system highly comprising the following steps:
Step 1:Activation system, sets up communication;
When measuring first, program enters following step 1-1:Start measuring system first, opened to electricity on board 1
System, then setting measurement parameter, after systematic parameter is initialized, starts TCP/IP communications;
Then, program circulation performs following step 1-2:Data are received by network or control instruction is sent and is stored in data
Buffer storage, is then back to the program entry of step 1-2, and after TCP/IP communications are started, software connects all the time by TCP/IP
Receive data.
Step 2:The initial value of school high parameter A is set, and the control instruction communicated by TCP/IP is set to school high parameter A
0。
Step 3:Perform school it is high/survey main body process high;
First, program judges whether school high parameter A is 0;
As school high parameter A=0(Y)When, program enters step 3-1 and performs height calibration process, is sent by communications protocol and calibrated
Highly instruct to control board 1;
Next, program performs following step 3-1-1:Read buffer data, then draw force-displacement curve figure, program
Judge whether board 1 reaches micro- power of setting and whether board 1 returns to original position;
When board 1 is not up to micro- power of setting, board 1 is not returned to original position, then step 3-1-1 is repeated;
When board 1 reaches micro- power of setting, board 1 returns to original position, program performs following step 3-1-2:Meter
The zero point of measuring table 2 is calculated, data storage area is stored in, school high parameter A is set to 1, now complete the height of measuring table 2
Calibration;
Now, step 3-1 is completed, the program entry of step 3 is then back to, judges whether school high parameter A is 0 again;
When school high parameter A=1(N)When, then enter following step 3-2 and perform height measurement program, sent by communications protocol
Instruction high is surveyed to control board 1;
Next, performing following step 3-2-1:Read buffer data, then read the zero of data storage area measuring table 2
Point, then force-displacement curve figure is drawn, program judges whether board 1 reaches micro- power of setting and whether board 1 returns to original position
Put;
When micro- power and board 1 that board 1 is not up to setting are not returned to original position, then step 3-2-1 is repeated;
When micro- power and board 1 that board 1 reaches setting return to original position, program performs following step 3-2-2:Meter
The height of tested shell fragment is calculated, data storage area, generation word report is then stored in;
Then, program performs the following steps 3-2-3:Judge once school it is high/whether each school high parameter B be 0;
When once school it is high/each school high parameter B=0(Y)When, it is high to be both needed to school before the measurement of each sample, then school high parameter A
0 is set to, step 3-2 is completed, the entrance of program return to step 3 rejudges whether school high parameter A is 0.So far, program is complete
It is high into once complete school and survey process high.Once school it is high/each school high parameter B be set to 0 application in, each sample
Measurement is carried out that first school is high to survey measurement process high again.
When once school it is high/each school high parameter B=1(N)When, only need to carry out one-shot measurement before the sample measurement of same specification flat
The school of platform 2 is high, the entrance of the direct return to step 3 of program.Rejudge whether school high parameter A is 0.So far, program completes one
Secondary complete school is high and surveys process high.Due to now parameter A=1(N)State be not eliminated, so program will be directed into
Step 3-2, performs the height measurement program of sample.In the application that parameter B is set to 1, before the sample measurement of same specification, it is only necessary to
The school for carrying out one-shot measurement platform 2 is high, until completing the measurement of this specification piece, program only carries out survey process high.
Above-mentioned once school is high/and each school high parameter B is meant that:B=0, it is high to be both needed to school before the measurement of each sample, and B=1 is with advising
Only need the school for carrying out one-shot measurement platform 2 high before the sample measurement of lattice.Selection setting can be carried out according to user's request.
In the prior art, micro-force measurement instrument minimum force at present on the market can only achieve 50g, and resolving power is 10g, this
Micro- power that kind instrument is used is still excessive, and the shape quantitative change of measured shell fragment will necessarily be caused excessive, so as to cause measurement to tie
It is really inaccurate.
The intelligence system of micro-force measurement shell fragment height of the present invention, the micro- power minimum force applied can reach 0.5g, resolution ratio
As little as 0.01g, the shape quantitative change that so small micro- power does not result in measured shell fragment is excessive, therefore the result of measurement is very accurate
Truly.
Here is one group of experimental data micro- power different to illustrate applying, for the influence of the measured value of shell fragment height:
As can be seen from the above table, from first row to the 5th row, micro- power of applying is bigger, and the height of shell fragment is just more and more lower,
Applied strength is illustrated, the deformation of shell fragment 1 is increasing, is increasing to the error that the elevation carrection of shell fragment 1 brings.
In addition, the 4th row and the 5th row micro- power difference 40g when, shell fragment 1 height value difference 0.016mm, the 3rd row and
During micro- power difference 5g of the 4th row, the height value difference 0.004mm of shell fragment 1, when secondary series and tertial micro- power difference 4g,
During micro- power difference 0.5g of the height value difference 0.005mm of shell fragment 1, first row and secondary series, the height value difference of shell fragment 1
0.001mm, illustrates that applied strength is smaller, is less and less to the error that the elevation carrection of shell fragment 1 brings.
Present invention measurement height repeatable accuracy ± 1um.
Above-mentioned micro- power is realized by outside high-speed, high precision synchronous signal acquisition card, the capture card key property
Parameter is as follows:Sample rate and the minimum 10kHz of bandwidth, the errorless code distinguishability in 10kHz to effort signal reach ± 1/5000,
Resolution ratio is processed up to 0.01g using software algorithm.To sum up, mechanics apparatus Synchronization Control capture card of the present invention has and has as follows
Beneficial technique effect:
1st, high accuracy:The intelligence system of utilization micro-force measurement shell fragment height of the invention, shell fragment is forced by micro-, can with gram
The gap that shell fragment is placed on measuring table 2 is taken, while the measured deviation for also overcoming survey crew's operating process difference and causing,
Thus certainty of measurement is high.
2nd, the precision of measurement data has uniformity high:The intelligence system of utilization micro-force measurement shell fragment height of the invention,
The board 1 of control is set by micro- power, while collect the data of power and displacement, by pre-set it is micro- make every effort to it is corresponding
Highly, entirely measure more scientific reasonable, can in high degree exclude very much the outside influence to measurement process and measurement result;In system
Start before being measured with each sample(Each school user high may be selected)The school for measuring platform 2 is high, and measurement process is strict,
So that the precision of measurement data has uniformity high.
3rd, measurement process has repeatability high, high efficiency:Measurement process does not depend on the operation of survey crew excessively
Experience, reduces influence of the operating personnel to measurement result so that measurement process has repeatability higher, while reducing
The process that personnel judge, improves efficiency.
4th, user can according to demand, and school is high or each school is high to select setting measurement platform 2 to carry out once, can meet diversification
Customer demand.
5th, it is easy to operate:Measuring table 2 has operating system and network communication so that measurement procedure and data transfer
It is more simple and convenient, using more flexible.
Presently preferred embodiments of the present invention is the foregoing is only, is not intended to limit the invention.It is all in essence of the invention
Any modification, equivalent and improvement made within god and principle etc., should be included within the scope of the present invention.