CN104330340A - Method and device for testing sample by virtue of small angle scattering of X-ray diffractometer - Google Patents
Method and device for testing sample by virtue of small angle scattering of X-ray diffractometer Download PDFInfo
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- CN104330340A CN104330340A CN201410635282.2A CN201410635282A CN104330340A CN 104330340 A CN104330340 A CN 104330340A CN 201410635282 A CN201410635282 A CN 201410635282A CN 104330340 A CN104330340 A CN 104330340A
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- ray diffractometer
- small angle
- angle scattering
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- testing
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Abstract
The invention discloses a method for testing a sample by virtue of the small angle scattering of an X-ray diffractometer. A nanopowder sample is fixed by use of a transparent adhesive tape and then is put in the testing optical path of the X-ray diffractometer. The invention also discloses a device for realizing the testing method. According to the method for testing the sample by virtue of the small angle scattering of the X-ray diffractometer, the transparent adhesive tape is adopted instead of collodion which is controlled and is toxic and harmful, and therefore, the shortcomings of the material and the preparation of a collodion method are overcome, and the application range of the small angle scattering of the X-ray diffractometer in measuring of the granularity of the nanopowder samples can be greatly expanded.
Description
Technical field
The present invention relates to a kind of X-ray diffractometer small angle scattering sample test method, especially for laboratory without the small angle scattering method of testing in collodion situation.
The invention still further relates to a kind of device for realizing above-mentioned method of testing.
Background technology
X-ray diffractometer small angle scattering be analyze granularity the size of tens nanometer following superfines particles (or the ultra-fine hole in solid matter), shape and distribution important method, compare scanning electron microscope and TEM (transmission electron microscope) analysis grain size has more statistical significance.But the way that in its application process, sample preparation is general is now with import collodion and acetone mixing, adds nano material and makes suspension, then flash to the more uniform laminar sample of Granular composite, then test with specific fixed station.Its sample preparation is more loaded down with trivial details, and collodion belongs to controlled commodity, harmful and inflammable, sells, to buy and storage has high requirement, bring very large difficulty to its application.
Summary of the invention
The object of this invention is to provide a kind of X-ray diffractometer small angle scattering sample test method.
Another object of the present invention is to provide a kind of device for realizing above-mentioned method of testing.
For achieving the above object, X-ray diffractometer small angle scattering sample test method provided by the invention, fixes samples of nanopowders with adhesive tape and is placed on the optical system for testing of X-ray diffractometer.
In described X-ray diffractometer small angle scattering sample test method, samples of nanopowders is entrained in two-layer adhesive tape.
Device for X-ray diffractometer small angle scattering sample test provided by the invention, it comprises:
One sample loop, for settling the adhesive tape being fixed with samples of nanopowders;
The fixed station of one semi-circular shape, sample loop is placed in the semicircular ring on fixed station;
One end of this fixed station is provided with a fixed handle, and this fixed handle is fixed on X-ray diffractometer, and samples of nanopowders is placed on the optical system for testing of X-ray diffractometer.
In described device, sample loop is made up of two rings that can be set-located, and the external diameter of one of them ring is less than the internal diameter of another ring.
The present invention is compared with known technology, and the beneficial effect had is:
Abandon the dependence to collodion in sample making course, accomplish the nontoxic safety of sample preparation in early stage, and sample preparation is simply convenient to laboratory operation.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of sample loop and fixed station in X-ray diffractometer small angle scattering Sample testing device of the present invention.
Fig. 2 is the pictorial diagram that fixed station is connected with X-ray diffractometer.
Symbol description in accompanying drawing:
1 sample loop, 2 adhesive tapes being attached with sample, 3 fixed stations, 4 fixed handles.
Embodiment
In order to the deficiency of the material and preparation that overcome collodion method, the invention provides a kind of New Type X-Ray Diffractometer small angle scattering sample preparation method of testing, the restriction of laboratory applications collodion can not only be broken away from, greatly can simplify sample making course simultaneously.
The scheme that its technical matters of solution of the present invention is taked is:
1) collodion is substituted with adhesive tape:
The effect of collodion is abundant dispersing nanometer sample, and it is relatively little to the scattering of X ray.According to its function, the adhesive tape that market is easy to obtain is utilized to carry samples of nanopowders secretly, due to finally all will background be cut in its test process, so adhesive tape can be ignored the scattering of X ray.
2) adhesive tape fixing on X-ray diffractometer:
By being attached with adhesive tape 2 stretch-bonded of samples of nanopowders on sample loop 1, sample loop 1 is fixed on the fixed station 3 of a semi-circular shape.One end of this fixed station 3 is provided with a fixed handle 4, and be positioned on X-ray diffractometer by this fixed handle 4, the light path making sample be placed in X-ray diffractometer is tested.
For strengthening the fixed effect to adhesive tape, sample loop 1 can be made large ring and little ring respectively, and the external diameter of little ring is slightly less than the internal diameter of large ring.In use, first the adhesive tape 2 being entrained with samples of nanopowders is stretched and be fixed on little ring, then cyclotella sleeve is established and is fixed in large ring, then large ring is placed in fixed station 3.
Claims (4)
1. an X-ray diffractometer small angle scattering sample test method, fixes samples of nanopowders with adhesive tape and is placed on the optical system for testing of X-ray diffractometer.
2. X-ray diffractometer small angle scattering sample test method according to claim 1, wherein, samples of nanopowders is entrained in two-layer adhesive tape.
3., for the device of X-ray diffractometer small angle scattering sample test, it comprises:
One sample loop, for settling the adhesive tape being fixed with samples of nanopowders;
The fixed station of one semi-circular shape, sample loop is placed in the semicircular ring on fixed station;
One end of this fixed station is provided with a fixed handle, and this fixed handle, for being fixed on X-ray diffractometer, makes samples of nanopowders be placed on the optical system for testing of X-ray diffractometer.
4. device according to claim 3, wherein, sample loop is made up of two rings that can be set-located, and the external diameter of one of them ring is less than the internal diameter of another ring.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410635282.2A CN104330340A (en) | 2014-11-05 | 2014-11-05 | Method and device for testing sample by virtue of small angle scattering of X-ray diffractometer |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410635282.2A CN104330340A (en) | 2014-11-05 | 2014-11-05 | Method and device for testing sample by virtue of small angle scattering of X-ray diffractometer |
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| CN104330340A true CN104330340A (en) | 2015-02-04 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201410635282.2A Pending CN104330340A (en) | 2014-11-05 | 2014-11-05 | Method and device for testing sample by virtue of small angle scattering of X-ray diffractometer |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105181724A (en) * | 2015-10-21 | 2015-12-23 | 吉林大学 | In-situ rotary fiber sample platform based on X-ray small-angle scatterometer |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105181724A (en) * | 2015-10-21 | 2015-12-23 | 吉林大学 | In-situ rotary fiber sample platform based on X-ray small-angle scatterometer |
| CN105181724B (en) * | 2015-10-21 | 2017-11-21 | 吉林大学 | Fiber based on low-angle scattering of X-rays instrument specimen rotating holder in situ |
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Application publication date: 20150204 |