CN104198823A - System for acquiring trap parameters of solid dielectric material - Google Patents
System for acquiring trap parameters of solid dielectric material Download PDFInfo
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- CN104198823A CN104198823A CN201410458790.8A CN201410458790A CN104198823A CN 104198823 A CN104198823 A CN 104198823A CN 201410458790 A CN201410458790 A CN 201410458790A CN 104198823 A CN104198823 A CN 104198823A
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- 239000007787 solid Substances 0.000 title claims abstract description 32
- 239000003989 dielectric material Substances 0.000 title claims abstract description 25
- 239000000523 sample Substances 0.000 claims abstract description 62
- 229910052751 metal Inorganic materials 0.000 claims abstract description 41
- 239000002184 metal Substances 0.000 claims abstract description 41
- 238000010438 heat treatment Methods 0.000 claims abstract description 34
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 27
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 27
- 238000005259 measurement Methods 0.000 claims abstract description 20
- 230000003068 static effect Effects 0.000 claims abstract description 17
- 230000007246 mechanism Effects 0.000 claims description 20
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 18
- 229910052802 copper Inorganic materials 0.000 claims description 18
- 239000010949 copper Substances 0.000 claims description 18
- 238000009413 insulation Methods 0.000 claims description 17
- 239000004411 aluminium Substances 0.000 claims description 15
- 239000007924 injection Substances 0.000 claims description 14
- 238000002347 injection Methods 0.000 claims description 14
- 230000003750 conditioning effect Effects 0.000 claims description 4
- 239000004519 grease Substances 0.000 claims description 4
- 229920001296 polysiloxane Polymers 0.000 claims description 4
- 230000003247 decreasing effect Effects 0.000 claims description 3
- 238000011160 research Methods 0.000 abstract description 5
- 238000003949 trap density measurement Methods 0.000 abstract description 5
- 238000004458 analytical method Methods 0.000 abstract description 4
- 235000012054 meals Nutrition 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 11
- 239000011810 insulating material Substances 0.000 description 10
- 239000000463 material Substances 0.000 description 9
- PNEYBMLMFCGWSK-UHFFFAOYSA-N Alumina Chemical compound [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 6
- 230000005684 electric field Effects 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 239000000126 substance Substances 0.000 description 6
- 238000012360 testing method Methods 0.000 description 6
- 238000002474 experimental method Methods 0.000 description 5
- 229920000642 polymer Polymers 0.000 description 5
- 230000008569 process Effects 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 150000002500 ions Chemical class 0.000 description 3
- 238000005070 sampling Methods 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 230000032683 aging Effects 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000018109 developmental process Effects 0.000 description 2
- 238000004643 material aging Methods 0.000 description 2
- 230000001052 transient effect Effects 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000003570 air Substances 0.000 description 1
- 239000005030 aluminium foil Substances 0.000 description 1
- 239000012080 ambient air Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000005516 deep trap Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 239000002274 desiccant Substances 0.000 description 1
- 238000003795 desorption Methods 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 239000000741 silica gel Substances 0.000 description 1
- 229910002027 silica gel Inorganic materials 0.000 description 1
- 230000032258 transport Effects 0.000 description 1
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Abstract
The invention discloses a system for acquiring trap parameters of solid dielectric material. The system comprises a constant temperature box, a three-electrode corona charging system, a surface potential measurement system, a rotary support system and a temperature control system; the three-electrode corona charging system, the surface potential measurement system, the rotary support system and the temperature control system are arranged within the constant temperature box. The three-electrode corona charging system comprises a plurality of needle electrodes and a meal disc electrode; the needle electrodes are coaxially arranged from top to bottom; the metal disc electrode is grounded. The surface potential measurement system comprises a capacitive static probe disposed on an adjustable insulating holder. The rotary support system comprises an insulating support; a metal turnplate and a metal heating box are arranged on the upper surface of an aluminum plate. The temperature control system comprises a first heater and a second heater. The system is applicable to the acquisition of parameters, such as trap level and trap density, of the solid dielectric material and has the advantages of wide range of application, high measurement precision and simplicity and convenience in operation, and an effective analysis method is provided for the research on surface electrification of the solid dielectric material, surface flashover and the like.
Description
Technical field
The present invention relates to a kind of insulating material dielectric properties proving installation, relate in particular to a kind of solid dielectric material trap parameters acquisition system.
Background technology
At present, insulating material of polymer and oil immersion insulation is used widely in electric insulation field because of its good dielectric properties.But along with the raising of voltage class of electric power system and the development of HVDC Transmission Technology, the space charge effect problem of polymer insulation is outstanding day by day, cause thus the distortion of polymeric material internal electric field, cause shelf depreciation and electric branch development, thereby cause material aging and failure of insulation problem, how to suppress and the space charge eliminated in insulation has become the study hotspot in domestic and international electric insulation field.
At present a lot of about the research of polymkeric substance agine mechaism, wherein more representational is the thermoelectron initiated polymerization thing degraded theory that the people such as Tu Demin of Canadian Gao Guanzhi (Kwan-Chi Kao) and domestic Xi'an Communications University proposes.Under high electric field action, electrons is by during Schottky effect (Schottky effect) or Fowler-Nordheim effect (Fowler-Nordheim effect) are from electrode injection to polymkeric substance, owing to having a large amount of trap states in the energy gap of material forbidden band, the mean free path of electrons is short, is therefore captured by trap very soon and forms space charge.Entering of space charge sunken/recombination process in, in the time that electric charge moves to low-energy state by high-energy state, unnecessary energy is transferred to another electronics by non-radiative form, makes the latter become thermoelectron.The thermoelectron with enough energy will cause molecular degradation and forms a large amount of macromolecular radicals, will further cause free chain reaction, causes the further degraded of polymkeric substance.Thermionic generation and thermionic energy are decided by density and the degree of depth of trap, change trap depth or the density of polymkeric substance, just can change thermionic formation probability and energy.Therefore measure and the Trap Characteristics of analysis of material as energy level, density etc., form and the ageing state that suppresses mechanism and polymeric material characterizes and assesses tool and is of great significance for the space charge of material.
On the other hand, in embedded-type electric electrode systems, near trapped charge electrode injects, transports, compound and desorption process also can be to edge flashing phenomenon generation material impact.Dielectric Trap Characteristics and surface charging characteristic are subject to extensive concern for a long time always, think that the surface flashover characteristics of medium is closely related under itself and vacuum condition.
Based on above-mentioned analysis, Trap Characteristics affects dielectric and the flash-over characteristic of solid dielectric material very significantly, and may become a kind of solid dielectric material property characterization parameter of more intrinsic, the trap parameters tool of therefore measuring and analyze solid insulating material is of great significance.Current domestic researchist generally obtains decay current by measuring isothermal surface potential decay, and then obtains the trap information of material surface.But most measuring systems all exist, system charging effect is inhomogeneous, charge injection is insufficient, survey record needs the problems such as manual operation, thereby has caused that measurement result is dispersed large, the result such as poor repeatability, precision are low.
About surface potential measurement and record, mostly adopt uniformly-spaced time manual type record at present, expend time in, record not accurate enough.Most measuring systems complete after corona charging, need manually needle point to be replaced by current potential probe measurement surface potential decay, the time that this process need is grown, are difficult to measure the transient potential information after having charged.
Charge injection is the key of Measurement accuracy material Trap Characteristics fully, and solid dielectric material require could obtain charge injection comparatively fully under higher temperature (different because of material, to be generally 60～80 DEG C).Existing test macro does not have heating condition, is difficult to realize the preheating of solid dielectric material, has a strong impact on experiment effect.
Summary of the invention
The object of this invention is to provide a kind of solid dielectric material trap parameters acquisition system, can carry out the trap level of solid dielectric material and the collection of trap density parameter in ground, there is feature applied widely, measuring accuracy is high, simple to operation.
The present invention adopts following technical proposals:
A kind of solid dielectric material trap parameters acquisition system, comprises constant temperature oven and is arranged on three electrode corona charging systems, surface potential measurement system, rotary support system and the temperature control system in constant temperature oven;
Three described electrode corona charging systems comprise the multistylus electrode of coaxial setting from top to bottom and the rosette electrode of ground connection, multistylus electrode connects DC charging power supply, the upper surface of rosette electrode is used for placing sample to be tested, and rosette electrode comprises copper electrode and the aluminium electrode of contact up and down and eccentric setting;
Described surface potential measurement system comprises the condenser type static probe being arranged on adjusting insulation fixed mount, and the output terminal of condenser type static probe connects signal conditioning circuit and the signal acquisition circuit outside constant temperature oven successively;
Described rotary support system comprises the insulating carriage that the upper surface that is arranged in constant temperature oven is metal aluminum sheet, the upper surface of metal aluminum sheet is provided with metal rotary disk, the upper surface of metal rotary disk is provided with METAL HEATING PROCESS box, and rosette electrode is placed on METAL HEATING PROCESS box upper surface; In the time carrying out sample to be tested charge injection, sample to be tested is positioned at multistylus electrode below; In the time carrying out surface potential decay measurement, sample to be tested is positioned at condenser type static probe below;
Described temperature control system comprises the first heater being arranged in METAL HEATING PROCESS box, and be arranged on the secondary heating mechanism on the insulating carriage of metal aluminum sheet below, temperature controller control linkage first heater and secondary heating mechanism outside constant temperature oven.
Described multistylus electrode adopts stainless pin, needle point radius-of-curvature 5 μ m; In multistylus electrode, outermost many pin electrodes are that regular hexagon distributes, and the mid point on each summit of regular hexagon and each limit is provided with pin electrode, and the length of outermost many pin electrodes is 9mm; In multistylus electrode, time outer field many pin electrodes are that regular hexagon distributes, and the mid point on each summit of regular hexagon and each limit is provided with pin electrode, and the length of inferior outer field many pin electrodes is 11mm; In multistylus electrode, many pin electrodes of inner side are that regular hexagon distributes, and each summit of regular hexagon and orthohexagonal center be provided with pin electrode, and the length of many pin electrodes of inner side is 12mm, and many pin electrodes of inner side are apart from sample to be tested upper surface 40mm; Many pin electrodes of outermost many pin electrodes, inferior outer field many pin electrodes and inner side form the regular hexagon that same center and the length of side are successively decreased.
Copper electrode diameter 120mm in described rosette electrode, thickness 10mm; Aluminium electrode diameter 250mm, thickness 10mm; The eccentric distance of copper electrode and aluminium electrode is 60mm, and copper electrode and aluminium electrode are bolted.
Described adjusting insulation fixed mount comprises insulation fixed mount and position adjusting mechanism, and condenser type static probe is fixed on position adjusting mechanism.
Aluminium electrode in described metal rotary disk, METAL HEATING PROCESS box and rosette electrode arranges from bottom to up and is bolted.
After described first heater and secondary heating mechanism parallel connection, by the temperature controller control outside constant temperature oven, first heater comprises two thermopairs of series connection, and secondary heating mechanism adopts quartzy infrared heating pipe.
In described constant temperature oven, be also provided with humidity conditioner, humidity conditioner adopts solid drier.
Between described copper electrode and sample to be tested, be provided with conduction silicone grease.
The present invention has following beneficial effect:
The present invention can measure trap level and the trap density parameter of solid dielectric material, and can distinguish electron type and two kinds of traps of cavity type, easy to operate.Applicability is extensive, and the present invention had both been applicable to inorganic insulating material, as the test of the insulating material such as aluminium oxide, processable ceramic Trap Characteristics, is also applicable to the test of insulating material of polymer and oil-impregnated paper insulation Trap Characteristics simultaneously.
The present invention is designed with double heater, double heater heating in parallel, and carry out temperature controller regulation and control by external temperature controller; One of them heating arrangement is placed in in the METAL HEATING PROCESS box being fixedly connected with rosette electrode, realizes the direct preheating to sample to be tested; Another heating arrangement is fixed on the insulating carriage of metal aluminum sheet below, by heated with ambient air being realized to the control to environment temperature.The design of double heater can realize the direct preheating to sample to be tested, makes dielectric substance obtain more sufficient charge injection, ensures that in constant temperature oven, Temperature Distribution is more even simultaneously, has improved the control accuracy of constant temperature the temperature inside the box.
Metal rotary disk is placed on a metal aluminum sheet supporting with insulating carriage, and the position angle that the design of metal rotary disk can realize sample to be tested regulates, and can realize at sample to be tested charge injection and surface potential decay and measure free quick switching under two states.
The present invention adopts multistylus electrode, the distance on the distributing position of each pin, the length of pin and needle point and sample to be tested surface can calculate by finite element method, make spininess electric field reach the state of being uniformly distributed, reach the effect to abundant, the even iunjected charge of specimen surface.
Brief description of the drawings
Fig. 1 is the structural representation of three electrode corona charging systems in the present invention;
Fig. 2 is the schematic diagram of surface potential limnograph system in the present invention;
Fig. 3 is the schematic diagram of metal rotary disk in the present invention;
Fig. 4 is rotary support system schematic in the present invention;
Fig. 5 is the distribution schematic diagram of multistylus electrode in the present invention.
Embodiment
As shown in Figures 1 to 5, solid dielectric material trap parameters acquisition system of the present invention, comprises constant temperature oven 11 and is arranged on three electrode corona charging systems, surface potential measurement system, rotary support system and the temperature control system in constant temperature oven 11.Three electrode corona charging systems are for carrying out charge injection to sample to be tested 3, surface potential measurement system is for adopting cordless to carry out the test of surface potential decay to sample to be tested 3, rotary support system is used for realizing sample to be tested 3 to be switched fast under charge injection pattern and surface potential decay measurement, the transient potential information after having charged with Measurement accuracy; Temperature control system, for realizing the adjustment of experimental situation temperature, to obtain charge injection comparatively fully, ensures experiment effect.
In the present invention, three electrode corona charging systems comprise the multistylus electrode 1 of coaxial setting from top to bottom and the rosette electrode 2 of ground connection, and multistylus electrode 1 connects DC charging power supply, and multistylus electrode 1 adopts stainless pin, needle point radius-of-curvature 5 μ m; In multistylus electrode 1, outermost many pin electrodes are that regular hexagon distributes, and the mid point on each summit of regular hexagon and each limit is provided with pin electrode, and the length of outermost many pin electrodes is 9mm; In multistylus electrode 1, time outer field many pin electrodes are that regular hexagon distributes, and the mid point on each summit of regular hexagon and each limit is provided with pin electrode, and the length of inferior outer field many pin electrodes is 11mm; In multistylus electrode 1, many pin electrodes of inner side are that regular hexagon distributes, and each summit of regular hexagon and orthohexagonal center are provided with pin electrode, the length of many pin electrodes of inner side is 12mm, and many pin electrodes of inner side are apart from sample to be tested 3 upper surface 40mm; Many pin electrodes of outermost many pin electrodes, inferior outer field many pin electrodes and inner side form the regular hexagon that same center and the length of side are successively decreased.Owing to adopting multistylus electrode 1, in multistylus electrode 1, the distance of the length of the distributing position of each pin, pin and needle point and specimen surface can calculate by finite element method, make spininess electric field reach the state of being uniformly distributed, reach the effect to sample to be tested 3 abundant, the even iunjected charges in surface.
The upper surface of rosette electrode 2 is used for placing sample to be tested 3, and rosette electrode 2 comprises copper electrode and the aluminium electrode of contact up and down and eccentric setting.Copper electrode diameter 120mm in rosette electrode 2, thickness 10mm; Aluminium electrode diameter 250mm, thickness 10mm; The eccentric distance of copper electrode and aluminium electrode is 60mm, and copper electrode and aluminium electrode are bolted.The electrically contacting property of copper electrode surface fine polishing to ensure that sample to be tested 3 and copper electrode are good, and be provided with conduction silicone grease between copper electrode and sample to be tested 3.
Described surface potential measurement system comprises the condenser type static probe 4 being arranged on adjusting insulation fixed mount 5, adjusting insulation fixed mount 5 comprises insulation fixed mount 5 and position adjusting mechanism 6, condenser type static probe 4 is fixed on position adjusting mechanism 6, and the distance of condenser type static probe 4 and sample to be tested 3 upper surfaces is by carrying out accurate adjustment by position adjusting mechanism 6.The output terminal of condenser type static probe 4 connects signal conditioning circuit 7 and the signal acquisition circuit 8 outside constant temperature oven 11 successively, signal is sent to computing machine by signal acquisition circuit 8, by existing software processing, computing machine can carry out uninterrupted sampling and record automatically to sample to be tested 3 surface potential decays that record.
Described rotary support system comprises that the upper surface being arranged in constant temperature oven 11 is the insulating carriage 13 of metal aluminum sheet 12, and the upper surface of metal aluminum sheet 12 is provided with metal rotary disk 9.The upper surface of metal rotary disk 9 is provided with METAL HEATING PROCESS box 10, and METAL HEATING PROCESS box 10 is of a size of 250mm × 250mm × 20mm, and rosette electrode 2 is placed on METAL HEATING PROCESS box 10 upper surfaces.Aluminium electrode in metal rotary disk 9, METAL HEATING PROCESS box 10 and rosette electrode 2 arranges from bottom to up and is bolted.The position angle that metal rotary disk 9 can realize sample to be tested 3 regulates, and can realize at sample to be tested 3 and freely switching under charge injection and surface potential decay measurement two states.In the time carrying out sample to be tested 3 charge injection, sample to be tested 3 is positioned at multistylus electrode 1 below; When carrying out surface potential decay while measuring, can pass through rotating metallic rotating disk 9, make sample to be tested 3 be positioned at condenser type static 4 belows of popping one's head in.
Described temperature control system comprises the first heater 14 being arranged in METAL HEATING PROCESS box 10, and be arranged on the secondary heating mechanism 15 on metal aluminum sheet 12 below insulating carriages 13, temperature controller control linkage first heater 14 and secondary heating mechanism 15 outside constant temperature oven 11.After first heater 14 and secondary heating mechanism 15 parallel connections, by the temperature controller control outside constant temperature oven 11, ensure that temperature control precision is ± 0.1 DEG C.First heater 14 comprises two thermopairs of series connection, and secondary heating mechanism 15 adopts quartzy infrared heating pipe.
In constant temperature oven 11, be also provided with humidity conditioner, humidity conditioner adopts solid drier.In the present embodiment, solid drier can adopt transformer drying agent silica gel, ensures that humidity is controlled at below 40%, to meet requirement of experiment.
The present invention is using, first with conduction silicone grease, sample to be tested 3 is attached to the copper electrode upper surface in rosette electrode 2, multistylus electrode 1 remains 40mm with sample to be tested 3 distances, then by apply+10kV of multistylus electrode 1 or-charging voltage of 10kV, each iunjected charge time is 10～30min.When charging, utilize temperature control system to heat rosette electrode 2, make it remain on 70 DEG C, to ensure abundant iunjected charge.Applying under High Pressure, corona discharge occurs at the needle point place of multistylus electrode 1, thereby air is ionized and produces a large amount of charging points, the needle point of multistylus electrode 1 forms ionized region around.To apply reverse voltage as example, under electric field action, negative ion is to sample to be tested 3 surface drifts, because the Electric Field Distribution between multistylus electrode 1 and the rosette electrode 2 below multistylus electrode 1 is more even, negative ion can form uniform charge shift district between multistylus electrode 1 and sample to be tested 3, electronics in negative ion will be captured by the trap states on sample to be tested 3 surfaces, thereby obtains uniform surface charging effect.
In experimentation, after sample charge injection, remove DC charging voltage, at sample to be tested 3 surface coverage aluminium foil short circuit dischanges, keep short circuit approximately 1～5s to remove the free charge (non-trapped charge) of sample to be tested 3 surface depositions.After short circuit dischange, by rotating metallic rotating disk 9, drive rosette electrode 2 that sample to be tested 3 surface charging regions are moved to condenser type static probe 4 times, adopt the surface potential decay of non-contact mode measuring sample to be tested 3, keeping condenser type static probe 4 and the distance on sample to be tested 3 surfaces is 2mm.The signal of condenser type static probe 4 outputs in the signal acquisition circuit 8 that access is connected with computing machine, can carry out continuous sampling to the surface potential of sample to be tested 3 by computing machine after being nursed one's health by signal conditioning circuit 7.In experiment, sampling should be carried out generally signal acquisition circuit 8 to be set as to every 1s.Because the attenuation characteristic of surface potential is affected by environment very big, therefore whole experiment must be carried out in constant temperature oven 11, keeps temperature strictly constant in experimentation, and by placing solid drier control constant temperature oven 11 internal relative humidities lower than 40%.According to Isothermal Current attenuation theory, in surface potential Isothermal Decay process, the electric charge in shallow trap in medium first discharges, and discharges after electric charge in deep trap.Hot release current time to time change under steady temperature, the variation of this electric current has reflected the regularity of distribution of trap level.
By specimen surface potential decay characteristic under isothermy, can calculate Isothermal Decay electric current, and and then calculate trap level and the trap density parameter of sample.
The present invention can measure trap level and the trap density parameter of solid dielectric material, and can distinguish electron type and two kinds of traps of cavity type, easy to operate.The present invention had both been applicable to inorganic insulating material, as the test of the insulating material such as aluminium oxide, processable ceramic Trap Characteristics, was also applicable to the test of insulating material of polymer and oil-impregnated paper insulation Trap Characteristics simultaneously.The present invention provides theory and technology support for the Trap Characteristics of research solid dielectric material, can be the aging rule research of trap parameters characterize polymers insulating material aging performance and polymkeric substance, and Solid Dielectric Surface electrification phenomenon and provide a kind of effectively analysis means to the research of the aspects such as edge flashing performance impact.
Claims (8)
1. a solid dielectric material trap parameters acquisition system, is characterized in that: comprise constant temperature oven and be arranged on three electrode corona charging systems, surface potential measurement system, rotary support system and the temperature control system in constant temperature oven;
Three described electrode corona charging systems comprise the multistylus electrode of coaxial setting from top to bottom and the rosette electrode of ground connection, multistylus electrode connects DC charging power supply, the upper surface of rosette electrode is used for placing sample to be tested, and rosette electrode comprises copper electrode and the aluminium electrode of contact up and down and eccentric setting;
Described surface potential measurement system comprises the condenser type static probe being arranged on adjusting insulation fixed mount, and the output terminal of condenser type static probe connects signal conditioning circuit and the signal acquisition circuit outside constant temperature oven successively;
Described rotary support system comprises the insulating carriage that the upper surface that is arranged in constant temperature oven is metal aluminum sheet, the upper surface of metal aluminum sheet is provided with metal rotary disk, the upper surface of metal rotary disk is provided with METAL HEATING PROCESS box, and rosette electrode is placed on METAL HEATING PROCESS box upper surface; In the time carrying out sample to be tested charge injection, sample to be tested is positioned at multistylus electrode below; In the time carrying out surface potential decay measurement, sample to be tested is positioned at condenser type static probe below;
Described temperature control system comprises the first heater being arranged in METAL HEATING PROCESS box, and be arranged on the secondary heating mechanism on the insulating carriage of metal aluminum sheet below, temperature controller control linkage first heater and secondary heating mechanism outside constant temperature oven.
2. solid dielectric material trap parameters acquisition system according to claim 1, is characterized in that: described multistylus electrode adopts stainless pin, needle point radius-of-curvature 5 μ m; In multistylus electrode, outermost many pin electrodes are that regular hexagon distributes, and the mid point on each summit of regular hexagon and each limit is provided with pin electrode, and the length of outermost many pin electrodes is 9mm; In multistylus electrode, time outer field many pin electrodes are that regular hexagon distributes, and the mid point on each summit of regular hexagon and each limit is provided with pin electrode, and the length of inferior outer field many pin electrodes is 11mm; In multistylus electrode, many pin electrodes of inner side are that regular hexagon distributes, and each summit of regular hexagon and orthohexagonal center be provided with pin electrode, and the length of many pin electrodes of inner side is 12mm, and many pin electrodes of inner side are apart from sample to be tested upper surface 40mm; Many pin electrodes of outermost many pin electrodes, inferior outer field many pin electrodes and inner side form the regular hexagon that same center and the length of side are successively decreased.
3. solid dielectric material trap parameters acquisition system according to claim 2, is characterized in that: copper electrode diameter 120mm in described rosette electrode, thickness 10mm; Aluminium electrode diameter 250mm, thickness 10mm; The eccentric distance of copper electrode and aluminium electrode is 60mm, and copper electrode and aluminium electrode are bolted.
4. solid dielectric material trap parameters acquisition system according to claim 3, is characterized in that: described adjusting insulation fixed mount comprises insulation fixed mount and position adjusting mechanism, and condenser type static probe is fixed on position adjusting mechanism.
5. solid dielectric material trap parameters acquisition system according to claim 4, is characterized in that: the aluminium electrode in described metal rotary disk, METAL HEATING PROCESS box and rosette electrode arranges from bottom to up and is bolted.
6. solid dielectric material trap parameters acquisition system according to claim 5, it is characterized in that: after described first heater and secondary heating mechanism parallel connection by the temperature controller control outside constant temperature oven, first heater comprises two thermopairs of series connection, and secondary heating mechanism adopts quartzy infrared heating pipe.
7. solid dielectric material trap parameters acquisition system according to claim 6, is characterized in that: in described constant temperature oven, be also provided with humidity conditioner, humidity conditioner adopts solid drier.
8. solid dielectric material trap parameters acquisition system according to claim 7, is characterized in that: between described copper electrode and sample to be tested, be provided with conduction silicone grease.
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| CN108196178A (en) * | 2017-12-28 | 2018-06-22 | 电子科技大学 | The measuring device and photoconductive analysis method of a kind of surface trap energy level distribution |
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| CN106771685A (en) * | 2017-03-07 | 2017-05-31 | 天津大学 | A kind of measurement apparatus and method of GIL epoxy resin surfaces electric charge |
| CN107045096A (en) * | 2017-03-07 | 2017-08-15 | 天津大学 | GIS epoxy resin surfaces charge characteristic and trap level distribution characterize device and method |
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