CN104198779A - Probe short-circuit signal detection device and signal generating method thereof - Google Patents
Probe short-circuit signal detection device and signal generating method thereof Download PDFInfo
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- CN104198779A CN104198779A CN201410398789.0A CN201410398789A CN104198779A CN 104198779 A CN104198779 A CN 104198779A CN 201410398789 A CN201410398789 A CN 201410398789A CN 104198779 A CN104198779 A CN 104198779A
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Abstract
The invention discloses a probe short-circuit signal detection device and a signal generating method thereof. According to the probe short-circuit signal detection device, a signal output end of a digital processing unit is connected with a signal input end of a digital analog converter, a signal output end of the digital analog converter is connected with a signal input end of a current-to-voltage converter, a signal output end of the current-to-voltage converter is connected with a signal input end of a bipolar voltage converter, a first signal output end of a datum reference source module is connected with a datum reference voltage input end of the digital analog converter, and a second signal output end of a datum reference source module is connected with a datum reference voltage input end of the bipolar voltage converter. According to the probe short-circuit signal detection device and the signal generating method thereof, complicated multiple order test waveforms can be conveniently produced, and the design of a complicated organic light emitting diode (OLED) panel is facilitated.
Description
Technical field
The present invention relates to OLED (Organic Light-Emitting Diode, Organic Light Emitting Diode) relevant device detection technique field, refer to particularly the signal generating method of a kind of probe short connection type signal detection apparatus and this equipment.
Background technology
Structure and the mode signal output of existing probe short connection type signal detection apparatus (Shortingbar) are comparatively simple, its structure as described in Figure 1, comprise two programmable voltage sources, multi-way switch and power amplifier, its course of work is: first use two programmable voltage sources, two rank of needs output are set, now can simply regard two voltage sources as, be voltage V1 and voltage V2, use subsequently and enter 1 multi-way switch going out for one 2 and switch in voltage source V 1 and voltage source V 2, be switched voltage in the past by after rear class power amplification, may be output as subscriber signal.Existing above-mentioned probe short connection type signal detection apparatus, with the comparatively simple single order test waveform of output, this simple single order test waveform can be applicable to the design of simple small-sized oled panel only.Yet oled panel technology is reformed at present, large complicated oled panel is the direction of design.Above-mentioned existing probe short connection type signal detection apparatus cannot be made corresponding multistage test waveform, is difficult to meet the needs of large complicated oled panel design.
Summary of the invention
Object of the present invention is exactly the signal generating method that a kind of probe short connection type signal detection apparatus and this equipment will be provided, and this equipment and method can easily produce complicated multistage test waveform, have facilitated the design of complicated oled panel.
For realizing this object, the probe short connection type signal detection apparatus that the present invention is designed, it is characterized in that: it comprises digital processing unit, digital to analog converter, electric current is to voltage changer, bipolar voltage transducer and reference source module, the signal input part of the signal output part linking number weighted-voltage D/A converter of described digital processing unit, the signal output part of digital to analog converter connects electric current to the signal input part of voltage changer, electric current connects the signal input part of bipolar voltage transducer to the signal output part of voltage changer, the reference voltage input end of the first signal output terminal linking number weighted-voltage D/A converter of described reference source module, the secondary signal output terminal of reference source module connects the reference voltage input end of bipolar voltage transducer.
A signal generating method for above-mentioned probe short connection type signal detection apparatus, it comprises the steps:
Step 1: the test waveform that digital processing unit generates as required and the change frequency of this test waveform, the magnitude of voltage of each change point of difference wave recording and the duration of each change point, simultaneously, design point tables of data and the redirect chained list corresponding with the above-mentioned test waveform that need to generate in digital processing unit, wherein, point tables of data is for describing the every rank voltage magnitude corresponding with the test waveform of needs generation and the duration of answering in contrast, and some tables of data comprises magnitude of voltage and current value corresponding under each dot address and each dot address;
Described redirect chained list needs the test waveform generating how to generate for controlling, in this redirect chained list, write different values, can realize the redirect of any-mode carries out with circulation, this redirect chained list comprises chain table address, jump address, jump on count and some table address, wherein, the address number that chain table address is self, linearity increases progressively one by one, immobilize, do not repeat;
When described jump address is used for recording test waveform variation, point to the lower corresponding chain table address of single order;
Described jump on count is for when jump address is less than chain table address, record the number of times that the circulation of redirect chained list is carried out, arrive after count value, in order, carry out downwards, when jump address is greater than chain table address, it is invalid now to count, when jump address equals chain table address, whole skip chain end of list (EOL), last data voltage is constant, and the time is continued until the end of circulation performance period;
Described some table address is for the dot address in measuring point tables of data;
Chain table address in described redirect chained list is mutually corresponding with the dot address in some tables of data;
In digital processing unit, by above-mentioned some tables of data and redirect chained list, the above-mentioned test waveform generating that needs is quantified as to digital value, and this digital value is converted to corresponding binary coding, then above-mentioned binary coding is stored in the internal register of digital processing unit;
Step 2: digital processing unit is transferred to digital to analog converter by the binary coding being stored in internal register, digital to analog converter receives the reference voltage that reference source module sends simultaneously, digital to analog converter under the effect of reference voltage, is converted to analog current waveform signal by binary coding;
Step 3: digital to analog converter sends to electric current to voltage changer above-mentioned analog current waveform signal, electric current to voltage changer converts the analog current waveform signal receiving to analog voltage waveform signal;
Step 4: described electric current to voltage changer is transferred to bipolar voltage transducer by analog voltage waveform signal, bipolar voltage transducer receives the reference voltage that reference source module sends simultaneously, bipolar voltage transducer by analog voltage waveform signal under the effect of reference voltage, be converted to and carry out 2 times after bipolar voltage signal and amplify and export, can obtain needing the test waveform generating.
Beneficial effect of the present invention:
The probe short connection type signal detection apparatus that the present invention is comprised of digital processing unit, digital to analog converter, electric current to voltage changer, bipolar voltage transducer and reference source module design, and in digital processing unit, design some tables of data and the redirect chained list corresponding with the test waveform that needs to generate, make the present invention can export the bipolar voltage test signal waveform of any exponent number.Meanwhile, the present invention can tackle different applied environments flexibly, can adjust flexibly the polarity of output voltage.In addition, the present invention adopts above-mentioned digital processing technology, can generate the various test waveforms that large complicated oled panel design is wanted.
Accompanying drawing explanation
Fig. 1 is the structural representation of existing probe short connection type signal detection apparatus;
Fig. 2 is structural representation of the present invention;
Fig. 3 is waveform generting machanism logical diagram of the present invention.
Wherein, 1-digital processing unit, 2-digital to analog converter, 3-electric current are to voltage changer, 4-bipolar voltage transducer, 5-reference source module.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is described in further detail:
Probe short connection type signal detection apparatus as shown in Figure 1, it comprises digital processing unit 1, digital to analog converter 2, electric current is to voltage changer 3, bipolar voltage transducer 4 and reference source module 5, the signal input part of the signal output part linking number weighted-voltage D/A converter 2 of described digital processing unit 1, the signal output part of digital to analog converter 2 connects electric current to the signal input part of voltage changer 3, electric current connects the signal input part of bipolar voltage transducer 4 to the signal output part of voltage changer 3, the reference voltage input end of the first signal output terminal linking number weighted-voltage D/A converter 2 of described reference source module 5, the secondary signal output terminal of reference source module 5 connects the reference voltage input end of bipolar voltage transducer 4, above-mentioned digital processing unit 1 has internal register.
A signal generating method for above-mentioned probe short connection type signal detection apparatus, it comprises the steps:
Step 1: the test waveform that digital processing unit 1 generates as required and the change frequency of this test waveform, the magnitude of voltage of each change point of difference wave recording and the duration of each change point, simultaneously, design point tables of data (specifically in Table 1) and the redirect chained list (specifically in Table 2) corresponding with the above-mentioned test waveform that need to generate in digital processing unit 1, wherein, point tables of data is for describing the every rank voltage magnitude corresponding with the test waveform of needs generation and the duration of answering in contrast, point tables of data comprises magnitude of voltage and current value corresponding under each dot address and each dot address,
Described redirect chained list needs the test waveform generating how to generate for controlling, in this redirect chained list, write different values, can realize the redirect of any-mode carries out with circulation, this redirect chained list comprises chain table address, jump address, jump on count and some table address, wherein, and the address number that chain table address is self, linearity increases progressively one by one, immobilize, do not repeat, as ID (identify label number) number, use;
When described jump address is used for recording test waveform variation, point to the lower corresponding chain table address of single order, can realize turn function;
Described jump on count is for when jump address is less than chain table address, record the number of times that the circulation of redirect chained list is carried out, arrive after count value, in order, carry out downwards, when jump address is greater than chain table address, it is invalid now to count, when jump address equals chain table address, whole skip chain end of list (EOL), last data voltage is constant, and the time is continued until the end of circulation performance period;
Described some table address, for the dot address in measuring point tables of data, is equivalent to indexed addressing;
Chain table address in described redirect chained list is mutually corresponding with the dot address in some tables of data;
In digital processing unit 1, by above-mentioned some tables of data and redirect chained list, the above-mentioned test waveform generating that needs is quantified as to digital value, and this digital value is converted to corresponding binary coding, then above-mentioned binary coding is stored in the internal register of digital processing unit 1;
Step 2: digital processing unit 1 is transferred to digital to analog converter 2 by the binary coding being stored in internal register, digital to analog converter 2 receives the reference voltage that reference source module 5 sends simultaneously, digital to analog converter 2 under the effect of reference voltage, is converted to analog current waveform signal by binary coding; Digital to analog converter 2 is received after digital quantity, by inner switching network, coordinates inner timeticks, can produce corresponding variable-current amount, and now waveform is that form with the magnitude of current is present in digital to analog converter 2;
Step 3: digital to analog converter 2 sends to electric current to voltage changer 3 above-mentioned analog current waveform signal, electric current to voltage changer 3 converts the analog current waveform signal receiving to analog voltage waveform signal;
Step 4: described electric current to voltage changer 3 is transferred to bipolar voltage transducer 4 by analog voltage waveform signal, bipolar voltage transducer 4 receives the reference voltage that reference source module 5 sends simultaneously, bipolar voltage transducer 4 by analog voltage waveform signal under the effect of reference voltage, (cut apart with fiducial reference source voltage, do subtraction with reference voltage), be converted to and carry out 2 times after bipolar voltage signal and amplify and export, can obtain needing the test waveform generating.
In technique scheme, described electric current converts the analog current waveform signal of the 0～20mA receiving to voltage changer 3 the analog voltage waveform signal of 0～3.3V.
In technique scheme, the output of the bipolar voltage signal of the described bipolar voltage transducer 4 analog voltage waveform signal of 0～3.3V, under the effect of reference voltage, is converted to-3.3V～+ 3.3V.
In technique scheme, the chain table address in described redirect chained list for to be incremented to one by one 256 since 1 linearity in 1～256 scope.
In the step 1 of technique scheme, any test waveform generating as required, the mode of employing time, voltage, generates the data of a point, by chained list redirect, controls, and reaches the output of any test waveform.Multistage voltage waveform be can generate, redirect, circulation supported simultaneously.
Said method, for oled panel checkout equipment, has significantly promoted system specification index, and Waveform output method and flexibility ratio.
In above-mentioned steps 1, waveform generting machanism in digital processing unit 1 as described in Figure 3, first the length of an execution cycle time is set, then, performance period, take out redirect chained list article one linked list data (the data of the first row in table 2, comprise chain table address, jump address, jump on count and dot address), now, when the jump address of these data equals chain table address, magnitude of voltage to the current period maintaining in these data point tables of data pointed finishes; When jump address is greater than chain table address, in redirect chained list, take out a linked list data in turn;
Then the relation between jump address and chain table address in more current linked list data, when jump address equals chain table address, magnitude of voltage to the current performance period maintaining in these data point tables of data pointed finishes; When jump address is greater than chain table address, take out magnitude of voltage and time value in these data point tables of data pointed, and order is carried out every linked list data downwards, until redirect chained list the last item data have been performed, the current performance period finishes; When jump address is less than chain table address, jump on count starts, and carries out a jump on count linked list data pointed;
After the current performance period finishes, enter the next performance period, the logic flow in each cycle is all identical.
Table 1: some tables of data
| Dot address | Voltage | Time |
| 1 | -5V | 20uS |
| 2 | -2V | 8uS |
| 3 | +1V | 10uS |
| 4 | -3V | 22uS |
| 5 | +5V | 5uS |
| 6 | -7V | 5uS |
| 7 | -5.5V | 20uS |
| 8 | -0.3V | 15uS |
| … | 0V | 0uS |
| 64 | 0V | 0uS |
Table 2: redirect chained list
| Chain table address | Jump address | Jump on count | Dot address |
| 1 | 2 | 0 | 1 |
| 2 | 3 | 0 | 2 |
| 3 | 4 | 0 | 3 |
| 4 | 5 | 0 | 4 |
| 5 | 6 | 0 | 5 |
| 6 | 7 | 0 | 6 |
| 7 | 8 | 0 | 7 |
| 8 | 8 | 0 | 8 |
| 9 | 1 | 0 | 9 |
| 256 | … | … | … |
Owing to not relating to the waveform that needs jump on count in the present embodiment, so the jump on count of table 2 is 0.
The content that this instructions is not described in detail belongs to the known prior art of professional and technical personnel in the field.
Claims (6)
1. a probe short connection type signal detection apparatus, it is characterized in that: it comprises digital processing unit (1), digital to analog converter (2), electric current is to voltage changer (3), bipolar voltage transducer (4) and reference source module (5), the signal input part of the signal output part linking number weighted-voltage D/A converter (2) of described digital processing unit (1), the signal output part of digital to analog converter (2) connects electric current to the signal input part of voltage changer (3), electric current connects the signal input part of bipolar voltage transducer (4) to the signal output part of voltage changer (3), the reference voltage input end of the first signal output terminal linking number weighted-voltage D/A converter (2) of described reference source module (5), the secondary signal output terminal of reference source module (5) connects the reference voltage input end of bipolar voltage transducer (4).
2. a signal generating method for probe short connection type signal detection apparatus described in claim 1, is characterized in that, it comprises the steps:
Step 1: the test waveform that digital processing unit (1) generates as required and the change frequency of this test waveform, the magnitude of voltage of each change point of difference wave recording and the duration of each change point, simultaneously, design point tables of data and the redirect chained list corresponding with the above-mentioned test waveform that need to generate in digital processing unit (1), wherein, point tables of data is for describing the every rank voltage magnitude corresponding with the test waveform of needs generation and the duration of answering in contrast, and some tables of data comprises magnitude of voltage and current value corresponding under each dot address and each dot address;
Described redirect chained list needs the test waveform generating how to generate for controlling, in this redirect chained list, write different values, can realize the redirect of any-mode carries out with circulation, this redirect chained list comprises chain table address, jump address, jump on count and some table address, wherein, the address number that chain table address is self, linearity increases progressively one by one, immobilize, do not repeat;
When described jump address is used for recording test waveform variation, point to the lower corresponding chain table address of single order;
Described jump on count is for when jump address is less than chain table address, record the number of times that the circulation of redirect chained list is carried out, arrive after count value, in order, carry out downwards, when jump address is greater than chain table address, it is invalid now to count, when jump address equals chain table address, whole skip chain end of list (EOL), last data voltage is constant, and the time is continued until the end of circulation performance period;
Described some table address is for the dot address in measuring point tables of data;
Chain table address in described redirect chained list is mutually corresponding with the dot address in some tables of data;
The test waveform by above-mentioned some tables of data and redirect chained list, needs being generated in digital processing unit (1) is quantified as digital value, and this digital value is converted to corresponding binary coding, then above-mentioned binary coding is stored in the internal register of digital processing unit (1);
Step 2: digital processing unit (1) is transferred to digital to analog converter (2) by the binary coding being stored in internal register, digital to analog converter (2) receives the reference voltage that reference source module (5) sends simultaneously, digital to analog converter (2) under the effect of reference voltage, is converted to analog current waveform signal by binary coding;
Step 3: digital to analog converter (2) sends to electric current to voltage changer (3) above-mentioned analog current waveform signal, electric current to voltage changer (3) converts the analog current waveform signal receiving to analog voltage waveform signal;
Step 4: described electric current to voltage changer (3) is transferred to bipolar voltage transducer (4) by analog voltage waveform signal, bipolar voltage transducer (4) receives the reference voltage that reference source module (5) sends simultaneously, bipolar voltage transducer (4) by analog voltage waveform signal under the effect of reference voltage, be converted to bipolar voltage signal output, can obtain needing the test waveform of generation.
3. the signal generating method of probe short connection type signal detection apparatus according to claim 2, is characterized in that: described electric current converts the analog current waveform signal of the 0～20mA receiving to voltage changer (3) the analog voltage waveform signal of 0～3.3V.
4. the signal generating method of probe short connection type signal detection apparatus according to claim 3, it is characterized in that: the bipolar voltage signal output of described bipolar voltage transducer (4) the analog voltage waveform signal of 0～3.3V, under the effect of reference voltage, is converted to-3.3V～+ 3.3V.
5. the signal generating method of probe short connection type signal detection apparatus according to claim 2, is characterized in that: the chain table address in described redirect chained list for to be incremented to one by one 256 since 1 linearity in 1～256 scope.
6. the signal generating method of probe short connection type signal detection apparatus according to claim 2, is characterized in that: in described step 4, bipolar voltage transducer (4) carries out bipolar voltage signal to export after 2 times of amplifications again.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105468550A (en) * | 2015-11-19 | 2016-04-06 | 深圳国微技术有限公司 | System and method capable of achieving linked list cycle |
| CN115685811A (en) * | 2022-09-28 | 2023-02-03 | 苏州精智达智能装备技术有限公司 | Signal generator structure capable of generating polar signal waveform and instruction system |
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Address after: 430070 Hubei City, Hongshan Province, South Lake Road, No. 53, Hongshan Venture Center, building on the 4 floor, No. Patentee after: Wuhan fine test electronics group Limited by Share Ltd Address before: 430070 Hubei City, Hongshan Province, South Lake Road, No. 53, Hongshan Venture Center, building on the 4 floor, No. Patentee before: Wuhan Jingce Electronic Technology Co., Ltd. |