CN104145072B - For measuring equipment and the method for the Internal periphery of hollow devices - Google Patents
For measuring equipment and the method for the Internal periphery of hollow devices Download PDFInfo
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- CN104145072B CN104145072B CN201380012103.3A CN201380012103A CN104145072B CN 104145072 B CN104145072 B CN 104145072B CN 201380012103 A CN201380012103 A CN 201380012103A CN 104145072 B CN104145072 B CN 104145072B
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- light beam
- deflecting
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Abstract
The invention provides the equipment of a kind of Internal periphery for measuring tested device, this equipment includes in one embodiment: housing, and this housing has first axle；Measurement apparatus, this measurement apparatus is configured to launch light beam along the second axis of deviation first axle；Arrangement for deflecting, this deflection device construction becomes will launch the light beam guiding inner surface to tested device；And driver, this driver constructions becomes to make measurement apparatus to rotate around first axle.
Description
Cross-Reference to Related Applications
This application claims in the U. S. application No.13/411333 that on March 2nd, 2012 submits to
Rights and interests, this United States Patent (USP) is integrally incorporated herein by quoting.
Technical field
The disclosure relates generally to be used in setting in the wellbore operations using progressive chamber power set
Standby.
Background technology
In order to obtain hydrocarbon (oil is gentle), by making the bit being connected to drill string end bore
Take well or pit shaft.Currently, substantial amounts of drilling activities includes drilling through the inclined shaft well produced for hydrocarbon
Eye or horizontal hole.Currently, the well system being used for drilling through this well is typically employed in bottom
Place has the drill string of drill bit, and this drill bit is by motor (commonly referred to as " MTR " or " brill
Well motor ") rotate.Typical MTR includes power section, and this power section includes turning
Son, rotor has the outer flap surface being placed in stator, and stator has the interior flap table matched
Face.Described power section is formed progressive between the flap surface and the flap surface of stator of rotor
Chamber (progressive cavities).Described motor is commonly referred to as progressive chamber motor or Mo Yinuo
(Moineau) motor.Some is also adopted by the power section of progressive chamber with pump in the oil industry.
Stator generally includes metal shell, be lined with inside this metal shell spiral abnormity or lobe
The elastomeric material of shape.The volumetric efficiency of MTR depends greatly on rotor fixed
The sealing formed between stator flap portion and rotor flap portion between the sub-inward turning refunding, this efficiency takes
The certainly cooperation between stator flap portion and rotor flap portion.Rotor flap portion, in outside, can adopt
Their size is accurately measured with multiple detection instrument.It is generally not capable of accurately measuring being positioned at and determines
Stator flap profile on the inner surface of son.Stator profile and desired size or designed
Deviation relatively small between size can cause: (i) MTR is inefficient, such as due to light
Learn gap and compare the excesssive gap between rotor flap portion and stator flap portion；(ii) motor is reduced
Working life, this is because the excessive contact between rotor flap portion and stator flap portion is (relatively
Little tolerance).The device that can be used in nondestructively detecting device Internal periphery is two-point measurement device,
The internal diameter of this two-point measurement measurement device stator, but do not measure whole section of stator Internal periphery
Face.
The disclosure there is provided herein for measurement apparatus (such as, progressive chamber pump, MTR
Stator and tubular part) the equipment of special-shaped Internal periphery and method.
Summary of the invention
In an aspect, disclose the equipment of a kind of Internal periphery for measuring hollow part,
This equipment includes in one embodiment: housing, and this housing has first axle；Measurement apparatus,
This measurement apparatus is positioned at housing and is configured to launch light beam, wherein first axle along the second axis
Deviate the second axis；Rotatable arrangement for deflecting, this rotatable deflection device construction becomes to launch light
Bundle guides the inner surface to hollow part；Driver, this driver constructions becomes to make measurement apparatus enclose
Rotate around first axle；And processor, this processor utilizes anti-from the Internal periphery of hollow part
The light beam penetrated is to measure the Internal periphery of hollow part.
In in other respects, disclose a kind of (tested for measuring the device with central axis
Device) the method for profile of special-shaped inner surface, in one embodiment, the method includes:
Light beam is directed to by rotating and excursion device at the select location in tested device the interior table of device
On face, wherein this select location off-center axis；Receive and reflect from the inner surface of tested device
Light；And utilize the distance between inner surface and the reflection position of reflection light measurement tested device.
Following to this equipment with the detailed description of method in order to be more fully understood that, the most total
Tie the example of the special characteristic of equipment herein disclosed and method.Certainly, also have with
Lower this disclosed equipment and the supplementary features of method, these supplementary features will form appended right
The theme required.
Accompanying drawing explanation
The disclosure can be best understood with reference to accompanying drawing, the most identical reference is often referred to
For identical element, wherein:
Figure 1A and 1B (prior art) shows the exemplary stator of the inner surface with flap
Cross section, equipment specifically described herein and method can be used to obtain the inner surface of this flap
Profile；
Fig. 2 can be used for the interior of determinator (the such as device shown in Figure 1A and 1B)
The profile on surface or the isometric view of the device of size；
Fig. 3 be Fig. 2 shown device and for operate the device of Fig. 2 control unit and according to
The computer based unit of the Internal periphery for determinator of one embodiment of the disclosure
Cross section；
Fig. 4 show each distance relative to from the arrangement for deflecting shown in Fig. 3 to exemplary fixed
The relation of the rotary light beam of the Internal periphery of son (the such as stator shown in Figure 1A and 1B)；
Fig. 5 shows the coaxial transmitting light beam of the embodiment corresponding to device shown in Fig. 3
Schematic diagram with reflection light beam；And
Fig. 6 shows rotation and launches light and from stator (the such as stator shown in Fig. 3)
Linear and the rotation relationship of the reflection light beam of inner surface reflection.
Detailed description of the invention
Figure 1A and 1B (prior art) shows progressive chamber device (such as MTR or pump)
The longitudinal section of typical stator 100 and cross section.It is multiple that shown stator 100 includes having band
The metal shell 110 of the inner surface 112 in flap portion 114.Inner surface 112 can be metal watch
Face or containing the layer that is made up of elastomeric material.Cutting of the stator 100 chosen at 1B-1B
Face illustrates as element 120 in fig. ib.
Fig. 2 is structured to measure hollow devices (being also referred to as " tested device " in this article)
Such as, the size of the Internal periphery of MTR or the stator of progressive chamber pump, pipe etc.
The isometric view of detection device 200.Device 200 includes the central axis 210 along device 200
Rotatable housing 202.Housing 202 surrounds Sensor section 220 (also referred to as measurement apparatus)
And arrangement for deflecting part 250.Sensor section 220 includes optical pickocff 222, and optics passes
Sensor 222 guides transmitting light along with the axis 251 of distance " a " off-center axis 210.
Part 250 includes the arrangement for deflecting 252 that the position being configured about on axis 251 rotates.
Therefore, the center of arrangement for deflecting and transmitting light beam are all with the center of distance " a " deviating device 200
Axis 210.Device 200 also includes the clamping device 230a of the end near Sensor section 220
And the clamping device 230b of the end near arrangement for deflecting part 250.When device 200 is put
When putting in form parts or device (the such as stator 100 shown in Figure 1A), clamping device
230a and clamping device 230b can activated, thus device 200 is positioned at tested device
In and device 200 is clamped in stator 100 so that the central axis of device 200 210 with
The central axis coaxial of stator.In many aspects, arrangement for deflecting 252 is centered around transmitting light beam
A position on axis 251 rotates, and housing 202 can be around central axis 210 at folder
Tight rotation between device 230a and clamping device 230b.Therefore, rotate housing 202 can make partially
Rotary device part 250 and Sensor section 220 rotate around central axis 210.Arrangement for deflecting
252 and Sensor section can rotate independently of each other with different rotary speeies.
Fig. 3 is the device 200 shown in Fig. 2 and for operating sensor 222 and arrangement for deflecting
The longitudinal cross-section of the control unit 370 of 252.Device 200 includes driver 350 (such as motor),
This driver 350 makes housing 202 with choosing between clamping device 230a and clamping device 230b
Fixed rotary speed rotates around device central axis 210.Deflector 250 includes deflection dress
Set driver 340, this arrangement for deflecting driver 340 structure makes arrangement for deflecting 252 be centered around biography
Fixed position 360 on sensor axis 254 rotates with selected rotary speed.In operation,
Light beam 312 is directed on arrangement for deflecting 252 by sensor 222 along beam axis 251.Light
Bundle 312 reflects from arrangement for deflecting 252, and is directed to if the inside of lower component is in this portion
In part, device 200 is clamped by clamping device 230a and clamping device 230b.In device 200
Side-play amount between mandrel line 210 and beam axis 251 is shown as " a ".In constructing at one,
Sensor 222 can be confocal Chromatic sensor.Sensors with auxiliary electrode is known in the prior art
, therefore it is not described here in detail.For purposes of this disclosure, any energy can be used to obtain
Confocal Chromatic sensor.In an aspect, control unit 370 can include sensor/motor
Controller or control unit 372 and for controlling computer or the process of the operation of controller 372
Device 374.For the Internal periphery of components of assays (such as there is the stator in flap portion in inside),
In device 200 is placed on stator and it is clamped in by clamping device 230a and clamping device 230b
In stator.Arrangement for deflecting 252 rotate around beam axis 251 and make housing 202 around
While central axis 210 rotates, computer 374 sensor/the motor controller 372 operated
Sensor 222 is caused to be guided to arrangement for deflecting 252 by light beam 312.In many aspects,
The independently controlled driver of instruction 340 and 350 that controller 372 sends in response to computer 374
Rotary speed.Received by sensor 222 from the light beam 314 of stator interior reflection.Reflection light
The axis 254 of bundle 314 is same axis with transmitting beam axis 251.
Fig. 4 shows the rotation of arrangement for deflecting and the rotation of device 200, launches light beam and anti-
The schematic diagram of the geometrical relationship between the side-play amount of irradiating light beam and arrangement for deflecting 252 (Fig. 2).
Line 400 limits the Internal periphery of stator 100.Point P1 represents the position of arrangement for deflecting；Distance " a "
Represent central axis 210 as described with reference to figure 2 and sensor or launch beam axis 251
Or reflect the side-play amount between beam axis 254 or " eccentric throw ".Distance " b " represents light beam
Initial surveying range, as being described more fully with reference to Fig. 5." P2 " is with distance " a "
(side-play amount) leaves the position at the center of the arrangement for deflecting of P1.Arrangement for deflecting rotates around P2,
Device 200 and arrangement for deflecting rotate around P1 simultaneously.Distance " c " represents actual known survey
Span from.β is the known system anglec of rotation, and γ is the known rotation of arrangement for deflecting angle
Gyration, as shown in Figure 5.In one embodiment, γ is 45 degree.
Fig. 5 shows the path of the light beam 510 inner surface 112 from sensor 222 to stator
Schematic diagram.Light beam 510 is from sensor 222 travel distance x1 and arrives arrangement for deflecting 252.
Light beam deflects from arrangement for deflecting 252, additional distance c of travel distance x2 and arriving in position
In stator interior 112 at P3.Light is reflected back arrangement for deflecting 252 from position P3, and is carried
It is fed to the sensor/motor controller 370 (Fig. 3) of signal for processing reception.Such as Fig. 4
Shown in 5, a is side-play amount, and b is the initial summation measuring apart from and be X1 and X2
(b=X1+X2), β is the angle between vertical curve and the zero vector of arrangement for deflecting, and γ is deflection
Angle between device zero vector and position P3.Distance d is unknown, will be come by system
Measure.
For the Internal periphery of determinator, detection device 200 is sandwiched in this device.Deflection dress
Put and all rotate around respective axis with sensor cluster.Light beam is from sensor (the most confocal color
Gap sensor) it is transmitted into rotating and excursion device (such as mirror), this arrangement for deflecting is with known
Side-play amount deviation sensor cluster.Light beam is reflect off arrangement for deflecting, and arrives the interior table of device
On face.Computer processes the light beam reflected from the inner surface of device, and measures from arrangement for deflecting
The heart or other suitable positions are to the distance of the inner surface of device.Due to arrangement for deflecting around it certainly
The axis of body rotates, and also around the axis rotation of measurement apparatus, therefore light-beam scanner
Whole Internal periphery, and from Internal periphery receive signal by the combined treatment of controller/computer,
To provide the whole Internal periphery of device.Profile can be generated as two dimensional form or three dimensional form.For
Obtain the profile at other interior locations of tested device, device 200 move to this position,
It is sandwiched in tested device, and repeats said process.
As Fig. 2 is to shown in 5, and the element of device 200 includes: measurement apparatus, this measurement apparatus
With transmitting light beam and the light path coaxial of reflection light beam；Rotating and excursion device, this rotating and excursion device
Guide the inner surface to tested device by launching light beam, and reflection light is guided from this inner surface
To measurement apparatus；Driver, this driver rotational deflection device；Driver, this driver makes
Measurement apparatus and arrangement for deflecting rotate around the central axis of device 200；Controller, this control
Device controls light beam and arrangement for deflecting and the rotation of measurement apparatus；Computer or processor, it is used for
Process reflected light beam signal to measure the Internal periphery of tested device.Device 200 is used for launching
Light beam and the coaxial light path of reflection light beam, computer is according to light beam, arrangement for deflecting and tested device
Internal periphery between geometrical relationship measure tested device Internal periphery.
In many aspects, measurement apparatus is likely to be of limited surveying range.Eccentric throw " a "
The surveying range of light beam is moved the proximal most position of the Internal periphery to tested device.Arrangement for deflecting will
Launch light and deflect into Internal periphery, and reflection light is deflected into measurement apparatus.Rotating and excursion device
With the combination of measurement apparatus and the side-play amount of off-center axis produce following effect: (a) light beam and
Angle between the Internal periphery surface of wide-angle side or back taper is reduced, and which increases measurement number
According to quantity and precision；B the rotation of the superposition of () measurement apparatus and arrangement for deflecting can reduce measurement institute
The time needed；C () can carry out multiple surface point measurement with different light beam-surface angle, to increase
The stability measured, thus increase the quality of measurement data.Described measurement system can be adapted to difference
Internal periphery, simultaneously do not damage circulation time, the quality of measurement data and precision.
Front with reference to as described in Fig. 2 and 3, in housing is clamped at measured tested device
Time, the central axis of housing (this housing surrounds measurement apparatus, arrangement for deflecting and driver) with
The central axis coaxial of tested device.Alternately, device 200 may be configured in tested device
Internal linear moves and rotates around central axis simultaneously.In such configuration, linear movement provides
The measurement of linear profile, the measurement providing circular contour the most in rotary moving.Therefore, pass through
Use linear mobile and in rotary moving, the three-dimensional wheel of device 200 energy generating means inner surface simultaneously
Wide.
Therefore, in many aspects, device 200 is to measure hollow devices (such as stator) to cut
The portable inner profile measurement device in face or system.In an aspect, device 200 includes containing
There is the measurement apparatus of sensor (such as, confocal Chromatic sensor).Reflected by tested device
Reflection light beam is coaxial with the transmitting light that sensor sends.Use described effect and by arrangement for deflecting
Light (light of transmitting and the light of reflection) is deflected to the inner surface of tested device.Big in order to obtain
Amount directly reflect light, system 200 uses: (1) sensor and arrangement for deflecting, this sensor and
Arrangement for deflecting is eccentrically located relative to the central axis of tested device, wherein launches light beam with anti-
Irradiating light beam is coaxial with each other；(2) driver, this sensor is for by the arrangement for deflecting in sensor front
Rotate；And (3) rotary system, this rotary system makes arrangement for deflecting around the inside of tested device
Rotate.Result is the rotation superposition of arrangement for deflecting and measurement system 200.Described system provides
Launching of sensor accurately measures angle between light beam and stator inner surface.This systematic survey quilt
Survey the distance of the side of device internal (the flap portion of such as stator), and flap portion is provided to
Side in the distance of each position (the most complete Internal periphery).
Fig. 6 show rotation in the device 200 being used in Fig. 3 launch light beam and reflection light beam it
Between linear and rotation relationship.The method measuring distance " d " according to the relation shown in Fig. 6 can be such as
Under.As it was previously stated, eccentric throw " a " is fixing given value.Initial surveying range " b " is also
It is fixing and known numerical value.Measured value " c " is measured value known to reality.β is to fix also
And known, γ is the known arrangement for deflecting anglec of rotation.Resultant vector " d " can be calculated as below:
X-component and the y-component of eccentric throw a can be obtained according to following relation.
ax=sin β * a
ay=cos β * a
X-component and the y-component of initial surveying range b can be calculated as follows:
bx=sin (β+γ) * b
by=cos (β+γ) * b
The x-component of measured value c and y-component can be calculated as follows:
cx=sin (β+γ) * c
cy=cos (β+γ) * c
The synthesis component (such as, the coordinate of P3) of d can be calculated as follows:
dx=ax±bx±cx
dx=ay±by±cy
The example of computed range d can be as follows: if a=6mm；B=13mm；C=12mm；
β=30 °；γ=290 °；ax/ay=3mm/5.19mm；bx/by=8.35mm/9.96mm；
cx/cy=-7.71mm/9.19mm, then dx/dy=13.06mm/25.06mm.
Although description above is directed to the specific exemplary embodiment of the disclosure, but
The most various modification all will be apparent from.It is intended that
All modification in scope of the following claims and spirit are included in description above
In.
Claims (17)
1. being used for an equipment for the Internal periphery of components of assays, this equipment includes:
Housing, this housing has the first axle being positioned at casing center；
Measurement apparatus, this measurement apparatus is configured to deviate described first axle along with distance " a "
Second axis launch light beam；
Arrangement for deflecting, this arrangement for deflecting is along the second axis location and can revolve around the second axis
Turning, this deflection device construction becomes the transmitting light beam guiding from the second axis to described parts
Inner surface and guiding along the second axis from the reflection light beam that the inner surface of described parts reflects
To measurement apparatus, to measure the Internal periphery of described parts；And
Driver, this driver constructions becomes to make described measurement apparatus rotate around described first axle.
Equipment the most according to claim 1, described equipment also includes that being positioned at described measurement fills
Putting interior sensor, this sensor is configured to guide extremely described transmitting light beam along the second axis
Described arrangement for deflecting.
Equipment the most according to claim 2, wherein said sensor is also configured to receive and leads to
Cross the light beam that described arrangement for deflecting reflects from the inner surface of described parts.
Equipment the most according to claim 1, it is described that described equipment also includes being configured to control
The controller of the rotation of arrangement for deflecting.
Equipment the most according to claim 4, wherein said controller be also configured to independent of
The rotation controlling described measurement apparatus rotatably of described arrangement for deflecting.
Equipment the most according to claim 1, described equipment also includes making described arrangement for deflecting
The device rotated around the position on described first axle.
Equipment the most according to claim 1, described equipment also includes processor, this process
Device is configured to process the light beam reflected from the inner surface of described parts, to provide one below: (i)
The two-dimentional Internal periphery of the inner surface of described parts；And the three-dimensional of the inner surface of (ii) described parts
Internal periphery.
Equipment the most according to claim 3, wherein said transmitting light beam and reflection light beam are
Coaxial.
Equipment the most according to claim 1, described equipment also includes clamping device, this folder
Tight device is configured to described measurement apparatus to be made to revolve around described first axle with described driver
Described equipment is joined to the inner surface of described parts by the mode ground turned.
10. the side of the profile of the inner surface of a tested device for mensuration with central axis
Method, the method includes:
Direct the light beam on arrangement for deflecting along the beam axis deviateing described central axis, institute
State arrangement for deflecting to be positioned on described beam axis and can rotate around described beam axis；
At described arrangement for deflecting, the light beam from beam axis is deflected to the interior table of tested device
On face；
Receive in response to deflect to described tested device inner surface described light beam and from tested dress
The light of the inner surface reflection put；And
According to the reflection light received from the inner surface of described tested device, measure the interior of tested device
The profile on surface.
11. methods according to claim 10, described method also includes making described deflection dress
Put and rotate to an angle around described central axis.
12. methods according to claim 10, are wherein deflected to described tested device
The light beam that the described light beam of inner surface and the inner surface from tested device reflect is coaxial.
13. methods according to claim 11, wherein said arrangement for deflecting is around described light
Rotating with described arrangement for deflecting around the described certain angle of rotation of described central axis of bundle axis
It is applied.
14. methods according to claim 10, described method also includes:
I () be mobile described arrangement for deflecting in described tested device；And
(ii) light beam reflected from the inner surface of described tested device is processed, to provide described tested
The three-dimensional Internal periphery of device.
15. methods according to claim 10, described method also includes:
I (), while rotating described arrangement for deflecting along both direction, moves in described tested device
Dynamic described arrangement for deflecting；And
(ii) light beam reflected from the inner surface of described tested device is processed, to provide described tested
The three-dimensional Internal periphery of device.
16. methods according to claim 10, described method also includes described deflection dress
Put and be fixed in described tested device.
17. methods according to claim 10, wherein guide light beam to include by being placed on
Sensor in tested device guides light beam, and this sensor is configured to enclose in described tested device
Rotate to an angle around described central axis.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/411,333 US8786866B2 (en) | 2012-03-02 | 2012-03-02 | Apparatus and method for determining inner profiles of hollow devices |
| US13/411,333 | 2012-03-02 | ||
| PCT/US2013/027912 WO2013130527A1 (en) | 2012-03-02 | 2013-02-27 | Apparatus and method for determining inner profiles of hollow devices |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104145072A CN104145072A (en) | 2014-11-12 |
| CN104145072B true CN104145072B (en) | 2016-11-30 |
Family
ID=
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4557598A (en) * | 1982-01-07 | 1985-12-10 | Sumitomo Electric Industries, Ltd. | Apparatus for checking the internal surface of a pipe or the like |
| US4865448A (en) * | 1986-01-14 | 1989-09-12 | Sanko Giken Kogyo Co., Ltd. | Method and aparatus for observing the internal surface of a small hole |
| US4967092A (en) * | 1988-05-17 | 1990-10-30 | Societe Anonyme Dite Hispano-Suiza | Apparatus for optically checking the inner profile of a tube or bore |
| CN102062738A (en) * | 2006-05-16 | 2011-05-18 | 麒麟工程技术系统公司 | Surface inspection apparatus and surface inspection head apparatus |
| US8049901B2 (en) * | 2006-12-13 | 2011-11-01 | Nikon Corporation | Measuring device and measuring method |
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4557598A (en) * | 1982-01-07 | 1985-12-10 | Sumitomo Electric Industries, Ltd. | Apparatus for checking the internal surface of a pipe or the like |
| US4865448A (en) * | 1986-01-14 | 1989-09-12 | Sanko Giken Kogyo Co., Ltd. | Method and aparatus for observing the internal surface of a small hole |
| US4967092A (en) * | 1988-05-17 | 1990-10-30 | Societe Anonyme Dite Hispano-Suiza | Apparatus for optically checking the inner profile of a tube or bore |
| CN102062738A (en) * | 2006-05-16 | 2011-05-18 | 麒麟工程技术系统公司 | Surface inspection apparatus and surface inspection head apparatus |
| US8049901B2 (en) * | 2006-12-13 | 2011-11-01 | Nikon Corporation | Measuring device and measuring method |
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Granted publication date: 20161130 |