CN104143187B - A kind of many alignment moveout scan extension sampling subpixel image method for registering - Google Patents

A kind of many alignment moveout scan extension sampling subpixel image method for registering Download PDF

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CN104143187B
CN104143187B CN201410319202.2A CN201410319202A CN104143187B CN 104143187 B CN104143187 B CN 104143187B CN 201410319202 A CN201410319202 A CN 201410319202A CN 104143187 B CN104143187 B CN 104143187B
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subpixel
width
images
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CN104143187A (en
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宋鹏飞
王世涛
金挺
董小萌
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China Academy of Space Technology CAST
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Abstract

A kind of many alignment moveout scan extension sampling subpixel image method for registering, (1) constructs many alignment moveout scan detection devices;(2) multiple detector array are successively imaged to same position scene in visual field, proceed to step (3) after imaging immediately;Each detector array is scanned imaging according to the sampling number corresponding sampling interval is arranged in step (1) in scanning direction, and imaging every time respectively obtains NtGroup view data, proceeds to step (3) immediately;(3) respectively by the N of each detector arraytGroup view data forms a frame detection image after being processed;(4) the frame detection image splicing for correspondingly obtaining each detector array obtains two width subpixel images;(5) Nonuniformity Correction is carried out to two width subpixel images respectively;(6) on the basis of the subpixel image being formerly imaged, the subpixel image of rear imaging is moved forward L in scanning directionpOK;(7) the affine transformation coefficient of two width images is asked for, the coupling for completing two width images using the coefficient.

Description

A kind of many alignment moveout scan extension sampling subpixel image method for registering
Technical field
The invention belongs to image processing field, is related to a kind of many alignment moveout scan extension sampling subpixel image registration sides Method.
Background technology
At present, the existing mode for improving image resolution ratio is varied, specifically has following several ways:To image-receptive Device CCD is improved, reduce picture dot size, reduce inter-pixel away from, improve picture dot number etc., but have due to existing improving technology Limit and the impact of quantum efficiency, it is difficult to break through;Difference is directly carried out using software, and it is poor that the method does not increase to single image The quantity of information of value image, so, inherently do not improve the resolution of image;Using micro lens technology and pupil resolving power The drawbacks of technology can then cause system bulk excessive;In general, prior art is difficult to that the cost that overcomes is high, volume is big, implements Difficulty is big to wait deficiency, cannot meet the needs for further developing in some cases.And for interframe registration technique, due to detection Device is affected across picture dot and noise etc., even if registration technique is very ripe, can be affected by single-frame imagess resolution is low, and makes Registration accuracy is not enough, final cause that detection aimed at precision is relatively low, difficulty is larger, so, seek a kind of single-frame imagess that improve and differentiate Rate simultaneously coordinates suitable method for registering, so that the technology that late detection aimed at precision makes moderate progress is very necessary.
Content of the invention
The present invention technology solve problem be:Overcome the deficiencies in the prior art, propose a kind of many alignment moveout scan extensions Sampling subpixel image method for registering, solution have the registration problems of two width detection images of time difference.
One of technical solution of the present invention is:A kind of many alignment moveout scan extension sampling subpixel image registration sides Method, step are as follows:
(1) many alignment moveout scans are constructed and extends Sample acquisition devices, the device includes optical system, sweep mechanism and many Detector array;Described sweep mechanism includes putting mirror and its drive shaft;Described many detector array are two-wire row detection Device, detector array adopt NtIndividual detection array composition, the corresponding instantaneous field of view of pixel is IFOV, and two neighboring detection array is put down Row arrangement, staggers 1/N successively in vertical scanning directiontIndividual pixel, and detection array is set in scanning direction, in a sampling length Sampling S in degreetSecondary;The sampling length is the corresponding instantaneous field of view of pixel;Described NtIt is more than or equal to 2;The StSpan For St≥2;
(2) scene in visual field is imaged in focal plane by optical system and sweep mechanism together, and drive shaft drives pendulum mirror rotation Turn, the scene imaging in linear field is with tandem two detector array on the inswept focal plane of certain speed, two lines Row detector is successively imaged to same position scene in visual field, imaging time intervalEach detector array is adopted It is imaged with extension sample mode, i.e. N in each detector arraytIndividual detection array is imaged simultaneously, obtains NtGroup picture number According to;Step (3) is proceeded to afterwards immediately;Each detector array is according to the setting sampling number corresponding sampling interval in step (1) Imaging is scanned in scanning direction, imaging every time respectively obtains NtGroup view data, proceeds to step immediately after obtaining data (3);
Above-mentioned, apart from d between two detector array, optical system focal length f, the angular scanning speed of sweep mechanism is ω;
(3) respectively by the N of two detector arraytGroup view data forms a frame detection figure after carrying out alignment splicing Picture;
(4), after completing default sampling number in a scanning direction, the frame that each detector array is correspondingly obtained is detected Image carries out splicing according to the time and obtains two width subpixel images;
(5) Nonuniformity Correction is carried out to two width subpixel images;
(6) on the basis of the corresponding subpixel image of the detector array being formerly imaged, by the detector array of rear imaging Corresponding subpixel image is moved forward in scanning directionOK, LpRound several rows, detector array array pixel chi Very little for a × a;
(7) selected characteristic point on the two width subpixel images from after process, and characteristic matching is carried out, according to matching characteristic point To asking for the affine transformation coefficient of two width images, the coupling that completes two width images using the coefficient.
By the way of nonuniformity correction in step (5) synthesizes correction using many alignment moveout scan images, concrete mistake Journey is as follows:
(5.1) two width subpixel images are carried out intersection splicing by row, forms the new stitching image I of a widthp1
(5.2) to stitching image Ip1Every string image carry out Nonuniformity Correction, arranged after the completion of all column processing To the image I after nonuniformity correctionp2
(5.3) row according to two width images in step (5.1) intersect the order of splicing, from Ip2Middle extraction respectively arranges accordingly Image, rebuilds two width and completes to arrange the subpixel image to Nonuniformity Correction;
(5.4) row will be completed to be rotated by 90 ° respectively to two width subpixel images after nonuniformity correction at same direction, is repeated Step (5.1)~(5.3), image I after being correctedp3
(5.5) row according to two width images in step (5.1) intersect the order of splicing, from Ip3Middle extraction respectively arranges accordingly Image, rebuilds two width and completes subpixel image of the row to nonuniformity correction;
(5.6) row will be completed to rotate to two width subpixel images of nonuniformity correction by the opposite direction that step (5.4) rotates 90 °, obtain the two width subpixel images for completing row, column both direction nonuniformity correction.
Step (7) can also be substituted using following step, i.e., carried out using sub-pix image registration techniques Match somebody with somebody.
The angular scanning speed of described many alignment moveout scan detector scanning mechanisms isWherein detect Target minimum movement speed vmin, the ground sampled distance GSD of detector array.
Present invention advantage compared with prior art is:
1st, the present invention utilizes NtThe detection array composition detector array of individual Heterogeneous Permutation, is realized by extending sample mode Two-dimensional expansion of the target context in long cross direction, is conducive to the precision for improving coupling.
2nd, as the explorer response of many detector array is inconsistent, two alignments are caused to there is overall intensity into image Difference, the present invention can effectively reduce the gray scale between alignment image by the way of the synthesis correction of many alignment moveout scan images Difference so that many alignment images can improve the precision of sub-pix coupling in same tonal range.
3rd, the present invention makes full use of the imaging mode of detector array arrangement feature and setting, is visited with the alignment being formerly imaged On the basis of surveying the corresponding subpixel image of device, by corresponding for the detector array of rear imaging subpixel image in scanning direction forward Mobile LpOK, two width Rapid Image Registrations are carried out, is mated using sub-pix method for registering again on this basis, reduce two Width images match scope, improves matching efficiency, reduces matching error, improves matching precision.
4th, the present invention can be used for the Rapid matching for solving any two alignment image in multi-thread column scan detection system, after being Continuous data processing, background suppression, target detection etc. provide basis.
Description of the drawings
Fig. 1,2 extend Sample acquisition device two ways schematic diagram for many alignment moveout scans of the invention;
Fig. 3 is the detector array two field picture splicing schematic diagram of the present invention;
Fig. 4 is many alignment moveout scan subpixel image registration flow charts of the present invention;
Specific embodiment
Below in conjunction with the accompanying drawings and example elaborates to the present invention.A kind of many alignment moveout scan extension sampling sub-pixed mappings Method for registering images, step are as follows:
(1) many alignment moveout scans are constructed and extends Sample acquisition device, the device includes optical system 1,2 and of sweep mechanism Many detector array 3;Described Scan Architecture includes putting mirror and its drive shaft;Described many detector array are visited for two alignments Device is surveyed, detector array adopts NtIndividual detection array composition, the corresponding instantaneous field of view of pixel is IFOV, two neighboring detection array Arranged in parallel, stagger successively 1/N in vertical scanning directiontIndividual pixel, and detection array is set in scanning direction, in a sampling Sampling S in lengthtSecondary;The sampling length is the corresponding instantaneous field of view of pixel;Many alignment moveout scan detection devices are swept The scanning speed for retouching mechanism isApart from d between two of which detector array, the target of detection is minimum to transport Dynamic speed vmin, optical system focal length f, the ground sampled distance GSD of detector array;Described NtIt is more than or equal to 2;The StTake Value scope is St≥2;Below with NtIllustrate as a example by=2.
What Fig. 1 was given is front end scanning probe device;Incident illumination comprising target and the emittance information of background is through pendulum Focal plane is converged to through optical system 1 after mirror reflection, the picture of scenery is formed, drive shaft drives pendulum mirror according to default angular speed Rotation, makes the picture of scenery each detector array inswept successively.When the picture of scenery is with the inswept one of line of certain speed During row detector, detector is sampled to the picture of scenery.What Fig. 2 was given is rear-end scanning detection device.Comprising target and the back of the body The incident illumination of the emittance information of scape converges to pendulum mirror through optical system 1, reflexes to focal plane through putting mirror, forms scenery Picture.Drive shaft drives pendulum mirror to rotate according to default angular speed, makes the picture of scenery each detector array inswept successively.Work as scape During the picture of thing is inswept with certain speed one of detector array, detector is sampled to the picture of scenery.
In this example, optical system 1 is the optical system of typical Cassegrain form, is made up of primary mirror and secondary mirror, incident illumination Line is incided on detector array after primary mirror and secondary mirror reflecting focal.
(2) scene in visual field is imaged in focal plane by optical system 1 and sweep mechanism 2 together, and drive shaft drives pendulum mirror Rotation, the scene imaging in linear field with tandem two-wire row detector on the inswept focal plane of certain speed, two Detector array is successively imaged to same position scene in visual field, imaging time intervalEach detector array It is imaged using extension sample mode, i.e. N in each detector arraytIndividual detection array is imaged simultaneously, obtains NtGroup image Data;Step (3) is immediately entered after obtaining view data;Simultaneously, each detector array is still according to setting in step (1) Put in the sampling length sampling number, be scanned imaging in scanning direction, imaging every time respectively obtains NtGroup image Data, proceed to step (3) immediately after being similarly obtained view data;For example, S can be sett>=2, then can achieve detector array and exist More than 2 times over-samplings on scanning direction;
(3) respectively by the N of two detector arraytGroup view data forms a frame detection figure after carrying out alignment splicing Picture, splicing is as shown in figure 3, by NtGroup pattern intersects splicing.Sub-pixed mapping frame detection image is obtained by splicing, Realize stretching of the target in vertical scanning direction.
(4) after default sampling number, the frame detection image that each detector array is correspondingly obtained entered according to the time Row splicing obtains two width subpixel images;Default sampling number can use 200~300 rows, and increasing default sampling number can increase Scanogram details, improves the precision that successive image is processed;The efficiency that default sampling number can improve data processing is reduced, because This default sampling number can be adjusted according to practical situation
(5) Nonuniformity Correction is carried out to two width subpixel images respectively;This step is non-homogeneous using conventional image at present Property bearing calibration, is not excessively described.
(6) on the basis of the corresponding subpixel image of the detector array being formerly imaged, by the detector array of rear imaging Corresponding subpixel image is moved forward in scanning directionOK, LpRound several rows, detector array array pixel chi Very little for a × a;
(7) selected characteristic point on the two width subpixel images from after process, and characteristic matching is carried out, according to matching characteristic point To asking for the affine transformation coefficient of two width images, the coupling that completes two width images using the coefficient.Two width subpixel images registration Flow process is as shown in figure 4, specific as follows:
(7.11) with the corresponding subpixel image of the detector array being first imaged as reference picture, the alignment being imaged afterwards is detected The corresponding subpixel image of device is image subject to registration;
(7.12) characteristic point, characteristic point are extracted according to the characteristic point threshold value for setting respectively to reference picture and image subject to registration Extraction algorithm can adopt general feature point extraction algorithm, such as Harris angle points etc.;
(7.13) differentiate the feature point number that extracts in reference picture and image subject to registration, step is proceeded to more than 3 (7.14) step poly- (7.12), is otherwise proceeded to, characteristic point threshold value is adjusted, characteristic point is extracted again;
(7.14) Feature Points Matching is carried out to the characteristic point that reference picture and image subject to registration are extracted respectively, matching range takes The δ neighborhoods of reference picture feature point coordinates, 0≤δ≤4;
(7.15) whether the feature point pairs for having mated are judged more than 3, be to proceed to frequency suddenly (7.16), otherwise proceed to step poly- (7.12) characteristic point threshold value, is adjusted, characteristic point is extracted again;
(7.16) feature point pairs obtained according to step (7.15), ask for affine transformation coefficient with method of least square;
(7.17) registration parameter calculated according to (7.16), carries out image conversion to image subject to registration, after obtaining registration Image;
Step (7) can also be substituted using following step, i.e., mated using sub-pix image registration algorithm, tool Body is as follows:
(7.21) with the corresponding subpixel image of the detector array being first imaged as reference picture, the alignment being imaged afterwards is detected The corresponding subpixel image of device is image subject to registration;
(7.22) gradient largest block is searched in reference picture;The definition of gradient largest block is:Calculate reference frame image Gradient image, the corresponding pixel logic value of gradient that will be greater than image gradient maximum 4/5 are labeled as 1, are otherwise labeled as 0, shape Into image be referred to as logical value image.Appropriately sized window is selected in logical value image slide, corresponding containing 1 most windows Block is referred to as gradient largest block.The position of gradient largest block is determined by comparing the maximum in sliding window.Window size is built Stand and adopt 50x50;
(7.23) it is to picture to the gradient largest block in (7.22), using based on the related image matching algorithm of gray scale, enters Row reference picture is mated with the sub-pix of image subject to registration.By reference picture is entered row interpolation obtain more intensive grid come Search for for target image, obtain the registration accuracy of sub-pixel;
(7.24) registration parameter calculated according to (7.23), carries out image conversion to image subject to registration, after obtaining registration Image.
Unspecified part of the present invention belongs to general knowledge as well known to those skilled in the art.

Claims (4)

1. a kind of many alignment moveout scans extend sampling subpixel image method for registering, it is characterised in that step is as follows:
(1) many alignment moveout scans are constructed and extends Sample acquisition device, the device includes optical system, sweep mechanism and many alignments Detector;Described sweep mechanism includes putting mirror and its drive shaft;Described many detector array be two detector array, line Row detector adopts NtIndividual detection array composition, the corresponding instantaneous field of view of pixel is IFOV, two neighboring detection array parallel Row, stagger 1/N successively in vertical scanning directiontIndividual pixel, and detection array is set in scanning direction, in a sampling length Sampling StSecondary;The sampling length is the corresponding instantaneous field of view of pixel;Described NtIt is more than or equal to 2;The StSpan is St ≥2;
(2) scene in visual field is imaged in focal plane by optical system and sweep mechanism together, and drive shaft drives pendulum mirror rotation, line Scene imaging in visual field is visited with tandem two detector array on the inswept focal plane of certain speed, two alignments Survey device to be successively imaged same position scene in visual field, imaging time intervalEach detector array is using expansion Exhibition sample mode is imaged, i.e. N in each detector arraytIndividual detection array is imaged simultaneously, obtains NtGroup view data; Step (3) is proceeded to afterwards immediately;Each detector array is being swept according to the sampling number corresponding sampling interval is arranged in step (1) Retouch direction and be scanned imaging, imaging every time respectively obtains NtGroup view data, proceeds to step (3) immediately after obtaining data;
Above-mentioned, d is distance between two detector array, and f is optical system focal length, and ω is the angular scanning speed of sweep mechanism;
(3) respectively by the N of two detector arraytGroup view data forms a frame detection image after carrying out alignment splicing;
(4) after completing default sampling number in a scanning direction, frame detection image that each detector array is correspondingly obtained Splicing is carried out according to the time and obtains two width subpixel images;
(5) Nonuniformity Correction is carried out to two width subpixel images;
(6) on the basis of the corresponding subpixel image of the detector array being formerly imaged, the detector array of rear imaging is corresponding Subpixel image scanning direction move forwardOK, LpSeveral rows are rounded, detector array array pixel dimension is a×a;
(7) selected characteristic point on the two width subpixel images from after process, and characteristic matching is carried out, according to matching characteristic point to asking The affine transformation coefficient of two width images is taken, the coupling for two width images being completed using the coefficient.
2. a kind of many alignment moveout scans according to claim 1 extend sampling subpixel image method for registering, its feature It is:, by the way of the synthesis correction of many alignment moveout scan images, detailed process is such as nonuniformity correction in step (5) Under:
(5.1) two width subpixel images are carried out intersection splicing by row, forms the new stitching image I of a widthp1
(5.2) to stitching image Ip1Every string image carry out Nonuniformity Correction, obtain arranging after the completion of all column processing to non- Image I after uniformity correctionp2
(5.3) row according to two width images in step (5.1) intersect the order of splicing, from Ip2The middle row accordingly that extract respectively are schemed Picture, rebuilds two width and completes to arrange the subpixel image to Nonuniformity Correction;
(5.4) row will be completed to be rotated by 90 ° respectively to two width subpixel images after nonuniformity correction at same direction, repeat step (5.1)~(5.3), image I after being correctedp3
(5.5) row according to two width images in step (5.1) intersect the order of splicing, from Ip3The middle row accordingly that extract respectively are schemed Picture, rebuilds two width and completes subpixel image of the row to nonuniformity correction;
(5.6) row will be completed to be rotated by 90 ° to two width subpixel images of nonuniformity correction by the opposite direction that step (5.4) rotates, Obtain the two width subpixel images for completing row, column both direction nonuniformity correction.
3. a kind of many alignment moveout scans according to claim 1 extend sampling subpixel image method for registering, its feature It is:Step (7) are substituted using following step, i.e., mated using sub-pix image registration techniques.
4. a kind of many alignment moveout scans according to claim 1 extend sampling subpixel image method for registering, its feature It is:Described many alignment moveout scans extend the angular scanning speed of Sample acquisition device sweep mechanisms Wherein, vminFor the target minimum movement speed for detecting, ground sampled distances of the GSD for detector array.
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