CN104125420B - fixed pattern noise removal method - Google Patents
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Abstract
The present invention discloses a kind of fixed pattern noise removal method, in an image sensor, which to include to calculate each offset of corresponding each column pixel according to multiple compensated pixel value in each column pixel；And each offset according to each column pixel, it is compensated when sampling multiple photosensitive area pixel values of a photosensitive area, to generate multiple compensation photosensitive area pixel values；Wherein, multiple photosensitive area pixels are photosensitive in the photosensitive area generates multiple photosensitive area pixel value.
Description
Technical field
The present invention relates to a kind of fixed pattern noise removal methods, espespecially a kind of in image sensor, it is only necessary to calculate
Each offset of corresponding each column pixel compensates, and can save storage space and reduce the fixation pattern of computational complexity
Noise removal method.
Background technique
In general, in image sensor (image sensor), due to the pixel for sensing image size,
It is not consistent away from, efficiency, and with a column sampler, be such as associated with double samplers (correlation double sampling,
CDS), sample photosensitive pixel value by column and have error；That is, a specific assignment sampling device corresponds to particular bar pixel, therefore
When for sampler when processing procedure and design are upper uneven, the pixel value of captured column pixel can be because of sampler unevenness in a column sampler
Even to cause error and have noise in image vertical mode, the image for causing image sensor to be captured can be because of hardware structure
It is existing missing and have nonrandom fixation pattern noise (fixed pattern noise, FPN).
For example, Figure 1A and Figure 1B is please referred to, Figure 1A and Figure 1B are respectively a real image IMG and there is column to fix sample
The schematic diagram of one noise image NIMG of formula noise.As illustrated in figures 1A and ib, since specific assignment sampling device corresponds to particular bar picture
Sampler is upper uneven with design in processing procedure in element and a column sampler, therefore the pixel value of captured column pixel can be because of sampler
Unevenly there is steady noise (vertical bar line as shown in Figure 1B) in image vertical mode.
In the case, well-known technique is by the shading photograph (black picture) of one scene of shooting the same condition with one, then
Fixed pattern noise can be eliminated to subtracting each other by this two.However, this mode need to be noted down and store whole shading according to do difference
State modulator (temperature, yield value, time for exposure), needs very big memory.In view of this, well-known technique have in fact it is improved
It is necessary.
Summary of the invention
Therefore, the main object of the present invention is to provide a kind of in image sensor, it is only necessary to calculate corresponding each
Each offset of column pixel compensates, and can save storage space and reduce the fixation pattern noise removal of computational complexity
Method.
The present invention discloses a kind of fixed pattern noise removal method, is used in an image sensor, the fixation pattern noise
Removing method includes to calculate each offset of corresponding each column pixel according to multiple compensated pixel value in each column pixel；With
And each offset according to each column pixel, it is compensated when sampling multiple photosensitive area pixel values of a photosensitive area, to produce
Raw multiple compensation photosensitive area pixel values；Wherein, multiple photosensitive area pixels are photosensitive in the photosensitive area generates multiple photosensitive area pixel
Value.
Cooperate following schemes, the detailed description of embodiment and claims herein, other mesh of the invention are addressed by
Be specified in advantage after.
Detailed description of the invention
Figure 1A and Figure 1B is respectively the schematic diagram of a real image and the noise image with the fixed pattern noise in column.
Fig. 2 is the schematic diagram of the fixed pattern noise removal process of the embodiment of the present invention one.
Fig. 3 is the schematic diagram of one image sensor of the embodiment of the present invention.
Fig. 4 is the schematic diagram of another image sensor of the embodiment of the present invention.
Fig. 5 is the schematic diagram of another image sensor of the embodiment of the present invention.
Fig. 6 to Fig. 8 is the schematic diagram of other three image sensor of the embodiment of the present invention.
Wherein, the reference numerals are as follows:
20 processes
200,202,204,206 step
30,40,50,60,70,80 image sensor
32 image processors
300,500 picture element matrix
302 samplers
304,504 Memory Controller
306,308,506,508 linear memory
310,312 multiplier
314 adders
316,402,316 ', 402 ' subtracters
318,318 ' analog-digital converter
320,520 photosensitive area
322,522 shading region
400 computing units
600,700,800 digital analog converter
IMG real image
NIMG noise image
CAPVi、CAPVi', CAPVi＂ compensates photosensitive area pixel value
ID image data
R red pixel
Gr, Gb green pixel
B blue pixel
APViPhotosensitive area pixel value
AG analog gain
OBAiShading region certain primary color pixel average
OBCAiShading region column pixel average
Specific embodiment
Referring to FIG. 2, Fig. 2 be the fixed pattern noise removal of the embodiment of the present invention one (fixed pattern noise,
FPN) the schematic diagram of process 20.As shown in Fig. 2, fixed pattern noise removal process 20 is in an image sensor comprising
Following steps:
Step 200: starting.
Step 202: according to multiple compensated pixel value in each column pixel, calculating each offset of corresponding each column pixel.
Step 204: according to each offset of each column pixel, when sampling multiple photosensitive area pixel values of a photosensitive area
It compensates, to generate multiple compensation photosensitive area pixel values；Wherein, photosensitive to generate this more for multiple photosensitive area pixels in the photosensitive area
A photosensitive area pixel value.
Step 206: terminating.
According to fixed pattern noise removal process 20, the present invention first according to multiple compensated pixel value in each column pixel, is calculated
Each offset of corresponding each column pixel is sampling the multiple of a photosensitive area further according to each offset of each column pixel
When multiple photosensitive area pixel values produced by photosensitive area pixel is photosensitive, multiple photosensitive area pixel value is compensated, it is more to generate
A compensation photosensitive area pixel value.In this case, since the present invention only needs to store corresponding each column pixel in memory
Each offset is even not required to store in memory, therefore need to store whole shading in memory compared to well-known technique and shine
Storage space can substantially be saved.In this way, the present invention only needs each offset for calculating corresponding each column pixel to compensate,
And storage space can be saved and reduce computational complexity.
For example, referring to FIG. 3, Fig. 3 is the schematic diagram of one image sensor 30 of the embodiment of the present invention.As shown in figure 3,
Image sensor 30 can produce compensation photosensitive area pixel value CAPViGiving an image processor 32 makes it generate an image data ID,
Image sensor 30 include a picture element matrix 300, a sampler 302, a Memory Controller 304, linear memory 306,
308,310,312, one adder 314 of multiplier, a subtracter 316 and an analog-digital converter (analog to
Digital converter, ADC) 318, wherein picture element matrix 300 includes a photosensitive area (Active Pixel Area)
320 and a shading region (Optical Black Area) 322, and picture element matrix 300 is that Bell schemes (Bayer Pattern) knot
Structure, therefore its each pixel is only a red pixel R, one in green pixel Gr, Gb and a blue pixel B three primary colors pixel
To sense particular color.
In simple terms, under an original state, image sensor 30 can first set sensitivity (ISO) and increase as a specific operation
Benefit, so that sampler 302 samples under the specific operation gain and calculates in a shading region 322 each primary color pixels in each column pixel
Each column primary color pixels average value sum (CP(c)j)/CPN(c)j、sum(CP(c)k)/CPN(c)kWith each primary colors picture of this in shading region 322
Each primary color pixels average value AVE of elementj、AVEkDifference LM306(c)j、LM308(c)k(the certain primary color pixel of particular bar it is average with
The average difference of whole certain primary color pixels is the fixation pattern noise of the certain primary color pixel of particular bar), then by memory
Controller 304 stores in on-line memory 306,308, and following (whole pixels are not photosensitive in shading region 322, in this embodiment
There can be 16 column calculating averagely with benefit, and it is each described in each primary color pixels value, that is, step 202 in each column pixel in shading region 322
Multiple compensated pixel value in column pixel):
LM306(c)j=AVEj–sum(CP(c)j)/CPN(c)j,AVEj=sum(OBPj)/OBPNj,j=R,Gr
LM308(c)k=AVEk–sum(CP(c)k)/CPN(c)k,AVEk=sum(OBPk)/OBPNk,k=Gb,B
Wherein, sum (CP(c)j)/CPN(c)j、sum(CP(c)k)/CPN(c)kRespectively indicate primary color pixels j, k in a field c
Quantity of the pixel value summation divided by primary color pixels j, k, sum (OBPj)/OBPNj、sum(OBPk)/OBPNkRespectively indicate shading region
In 322 the pixel value summation of primary color pixels j, k divided by primary color pixels j, k quantity.
For example, the 1st column Yin Beier graph structure of left side only has red pixel R and green pixel Gb, when being intended to calculate the 1st column
Column red pixel average value sum (CP(1)R)/CPN(1)RWhen, can by shading region 322 in the 1st column all red pixel R picture
Element value is added the then quantity divided by the 1st column red pixel R, then calculates the red pixel of red pixel R in shading region 322 again
Average value AVER, i.e., the pixel value of red pixel R all in shading region 322 is added the then number divided by all red pixel R
Amount, then subtracts each other and takes difference LM306(1)RIt is stored in the position of corresponding 1st column red pixel R.The rest may be inferred, can calculate other
The difference LM of corresponding red pixel R, green pixel Gr, Gb and blue pixel B in column306(c)j、LM308(c)kIt stores respectively again
In on-line memory 306,308, wherein since separately column have same pixel arrangement in Bell's graph structure, only need two
Alignment memory 306,308 can store the difference of the average value of all column primary color pixels, and since fixed pattern noise is solid
Determine noise, therefore can set specific operation gain is a maximum actual gain clearly to note down.
Then, sensitivity is set as specific operation gain in original state image sensor 30, then Memory Controller
304 by difference LM306(c)j、LM308(c)kAfter storing on-line memory 306,308, under a sense state, sampler 302 is to photosensitive
The sampling of area 320 generates photosensitive area pixel value APVi, and it is an analog gain AG by multiplier that image sensor 30, which sets sensitivity,
310 accordingly to photosensitive area pixel value APViGain is carried out, then by analog-digital converter 318 by photosensitive area pixel value after gain
APViSwitch to a digital form.At the same time, Memory Controller 304 can be by reading corresponding difference in linear memory 306,308
Value LM306(c)j、LM308(c)k, then specific operation gain set by analog gain AG and original state is multiplied by as multiplier 312
One ratio obtains fixing pattern noise under analog gain AG (because fixed pattern noise is steady noise, it is therefore assumed that can be with gain
Equal proportion zoom), then by one of whole certain primary color pixels in shading region 322 under the aggregation of adder 314 analog gain AG
Shading region certain primary color pixel average OBAi(the not irradiation, therefore shading region certain primary color pixel average of shading region 322
OBAiRepresent the size of existing dark current under the non-irradiation of certain primary color pixel) each offset of each column pixel is obtained, then subtract
Musical instruments used in a Buddhist or Taoist mass 316 is again by photosensitive area pixel value APViEach offset for subtracting corresponding each column pixel obtains compensation photosensitive area pixel value
CAPVi, it is as follows:
OBAi=sum(AGOBPi)/AGOBPNi
CAPVi=APVi-OBAi+LM(c)i*AG
i=R,Gr,R,Gr；LM(c)i=LM306(c)j、LM308(c)k
Wherein, sum (AGOBPj)/AGOBPNjIndicate that the pixel value of primary color pixels i in shading region 322 under analog gain AG is total
With the quantity divided by primary color pixels i.
In this way, which image sensor 30 only need to store difference using two alignment memories 306,308 in original state
LM306(c)j、LM308(c)k, then the simple combination for passing through multiplier 312, adder 314 and subtracter 316 in sense state
The fixed pattern noise of elimination is compensated, therefore storage space can be saved and reduce computational complexity.
It is worth noting that, essentially consisting in for above-described embodiment can calculate each offset of corresponding each column pixel and be mended
It repays, to save storage space and reduce computational complexity.Those of ordinary skill in the art, which work as, to modify or change accordingly,
And it is without being limited thereto.For example, referring to FIG. 4, Fig. 4 is the schematic diagram of another image sensor 40 of the embodiment of the present invention.Image
Sensor 40 is similar to 30 part of image sensor, therefore the identical component of function and signal are indicated with the same symbol.Image passes
Sensor 40 and image sensor 30 main difference is that, image sensor 40 does not pass through memory storage in the initial state
Difference, but sampler 302 samples generation photosensitive area pixel value APV to photosensitive area 320 under sense stateiAnd multiplier 310
When carrying out subsequent operation with analog-digital converter 318, while being sampled by a computing unit 400 and being calculated each in shading region 322
Each shading region column pixel average OBCA of column pixeliAs each offset of each column pixel, (this column pixel average is wrapped simultaneously
Dark current composition and fixed pattern noise component are included, and in shading region 322 in each column pixel described in each column pixel value, that is, step 202
Each column pixel in multiple compensated pixel value), then by subtracter 402 by photosensitive area pixel value APViSubtract corresponding each column pixel
Each offset (i.e. each shading region column pixel average OBCAi) obtain compensation photosensitive area pixel value CAPVi', as follows:
OBCAi=sum(OBCPi)/OBCPNi
CAPVi'=APVi-OBCAi
i=R,Gr,R,Gr
Wherein, sum (OBCPj)/OBCPNjIndicate under analog gain AG in shading region 322 primary color pixels i in specific fields
Pixel value summation divided by primary color pixels i quantity.
In this way, since image sensor 40 direct sample and calculates in shading region 322 each when photosensitive area 320 is photosensitive
Each shading region column pixel average OBCA of column pixeliAs each offset of each column pixel, then pass through subtracter 402
The fixed pattern noise of elimination is compensated, therefore is not required to memory and computational complexity can be reduced.
Furthermore referring to FIG. 5, Fig. 5 is the schematic diagram of another image sensor 50 of the embodiment of the present invention.Image sensor 50
It is similar to 30 part of image sensor, therefore the identical component of function and signal are indicated with the same symbol.Image sensor 50 with
Image sensor 30 main difference is that, image sensor 50 sets sensitivity under an original state and increases as a specific operation
After benefit, the connection of photosensitive area pixel in a photosensitive area 520 of a sampler 502 and a picture element matrix 500 can be cut off (due to disconnecting
Link between sampler 502 and picture element matrix 500, therefore 502 reading values of sampler are corresponding 500 part of picture element matrix
Circuit values), then calculate sampler 502 and put down corresponding to each column primary colors circuit of each primary color pixels in each column pixel in photosensitive area 520
Mean value sum (CC(c)j)/CCN(c)j、sum(CC(c)k)/CCN(c)kCorrespond to each primary colors picture in photosensitive area 520 with sampler 502
Each primary colors circuit average value CAVE of elementj、CAVEkDifference LM506(c)j、LM508(c)k(the certain primary color picture corresponding to particular bar
The average difference average with the circuit values corresponding to whole certain primary color pixels of the circuit values of element is that sampler 502 corresponds to spy
Determine fixation pattern noise caused by the certain primary color pixel on column), then on-line memory is stored by a Memory Controller 504
506, in 508, as follows (in photosensitive area 520 in each column pixel in each column pixel described in each primary colors circuit average value, that is, step 202
Multiple compensated pixel value):
LM506(c)j=CAVEj–sum(CC(c)j)/CCN(c)j
CAVEj=sum(APCj)/APCNj,j=R,Gr
LM508(c)k=CAVEk–sum(CC(c)k)/CCN(c)k
CAVEk=sum(APCk)/APCNk,k=R,Gr
Wherein, sum (CC(c)j)/CCN(c)j、sum(CC(c)k)/CCN(c)kSampler 502 is respectively indicated corresponding to photosensitive area
Quantity of the circuit values summation of primary color pixels j, k divided by primary color pixels j, k, sum (APC in 520 1 field cj)/APCNj、sum
(APCk)/APCNkSampler 502 is respectively indicated corresponding to the circuit values summation of primary color pixels j, k in photosensitive area 520 divided by primary colors
The quantity of pixel j, k.
For example, the 1st column Yin Beier graph structure of left side only has red pixel R and green pixel Gb, when being intended to calculate the 1st column
Column red circuit average value sum (CC(1)R)/CCN(1)RWhen, it can be first by the separated company of sampler 502 and picture element matrix 500
Knot, then sampler 502 simulate each red pixel R in normal operating connection the 1st column of photosensitive area 520 obtain corresponding circuit values into
Row aggregation then calculates the red corresponding to red pixel R in photosensitive area 520 then divided by the quantity of the 1st column red pixel R again
Circuit average value CAVER, i.e., all red pixel R are obtained corresponding in the simulation of sampler 502 normal operating connection photosensitive area 520
Circuit values add up the then quantity divided by all red pixel R, then subtract each other and take difference LM506(1)RIt is stored in corresponding
The position of 1 column red pixel R.The rest may be inferred, can calculate corresponding red pixel R, green pixel Gr, Gb and indigo plant in other columns
The difference LM of color pixel B506(c)j、LM508(c)kIt is separately stored in linear memory 506,508 again, wherein due to Bell's graph structure
In separately column there is same pixel arrangement, therefore only need two alignment memories 506,508 that can store all column primary color pixels
Average value difference, and since fixed pattern noise is steady noise, can set specific operation gain is one maximum to grasp
Make gain clearly to note down.
Then, original state image sensor 50 set sensitivity as specific operation gain and disconnect sampler 502 with
Link between picture element matrix 500, then Memory Controller 504 is by difference LM506(c)j、LM508(c)kStorage on-line memory 306,
After 308, under a sense state, image sensor 50 is connected again to be linked between sampler 502 and picture element matrix 500, so that
Sampler 502 samples photosensitive area 520 and generates photosensitive area pixel value APVi, and image sensor 50 sets sensitivity and increases as simulation
Beneficial AG is by multiplier 310 accordingly to photosensitive area pixel value APViGain is carried out, then will be felt after gain by analog-digital converter 318
Light area pixel value APViSwitch to a digital form.At the same time, Memory Controller 504 can be by reading in linear memory 506,508
Take corresponding difference LM506(c)j、LM508(c)k, then as multiplier 312 be multiplied by analog gain AG with it is specific set by original state
One ratio of actual gain obtains fixing pattern noise under analog gain AG (being steady noise because fixing pattern noise, therefore false
If can be with gain equal proportion zoom), then by whole specific originals in shading region 322 under the aggregation of adder 314 analog gain AG
One shading region certain primary color pixel average OBA of color pixeli(the not irradiation, therefore shading region certain primary color picture of shading region 322
Plain average value OBAiRepresent the size of existing dark current under the non-irradiation of certain primary color pixel) obtain each compensation of each column pixel
Value, then subtracter 316 is again by photosensitive area pixel value APViEach offset for subtracting corresponding each column pixel obtains compensation sense
Light area pixel value CAPVi＂, as follows:
OBAi=sum(AGOBPi)/AGOBPNi
CAPVi＂=APVi-OBAi+LM(c)i*AG
i=R,Gr,R,Gr；LM(c)i=LM506(c)j、LM508(c)k
Wherein, sum (AGOBPj)/AGOBPNjIndicate that the pixel value of primary color pixels i in shading region 322 under analog gain AG is total
With the quantity divided by primary color pixels i.
In this way, which image sensor 50 also only need to store difference using two alignment memories 506,508 in original state
LM506(c)j、LM508(c)k, then under sense state be by the simple combination of multiplier 312, adder 314 and subtracter 316
The fixed pattern noise of elimination can be compensated, therefore storage space can be saved and reduce computational complexity, and since image passes
Sensor 50 disconnects to be linked between sampler 502 and picture element matrix 500, each primary colors electricity in each column pixel in recycling photosensitive area 520
Each offset of each column pixel of road mean value calculation, therefore can have lesser shading region 522(shadow compared to image sensor 30
As sensor 50 is not required to be averaged using shading region 522 with offset value calculation, therefore can only have 4 column).
In addition to this, in the above-described embodiments, image sensor 30,40,50 all under digital form to each offset and
Photosensitive area pixel value APViCompensate (i.e. each offset be digital form, in photosensitive area pixel value APViThrough Analog-digital Converter
Device 318 handles just to compensate after digital form).However, in other embodiments, it can also be under analog form to each compensation
Value and photosensitive area pixel value APViIt compensates.Fig. 6 to Fig. 8 is please referred to, Fig. 6 to Fig. 8 is the other three of embodiment of the present invention shadow
As the schematic diagram of sensor 60,70,80.Image sensor 60,70,80 is similar to 30,40,50 part of image sensor, therefore
The identical component of function and signal are indicated with the same symbol.The master of image sensor 60,70,80 and image sensor 30,40,50
It wants the difference is that image sensor 60,70,80 is first respectively by each offset through digital analog converter (digital to
Analog converter, DAC) 600,700,800 analog form is converted to by digital form after, then respectively by subtracter
316 ', 402 ' are to the photosensitive area pixel value APV for after gain being still analog formiIt is compensated under analog form, then by simulating
318 ' of digital quantizer is converted to digital form.In this way, which image sensor 60,70,80 can be under analog form to each benefit
Repay value and photosensitive area pixel value APViIt compensates.
In well-known technique, need to by the shading photograph (black picture) of one scene of shooting the same condition with one, then by this
Two can eliminate fixed pattern noise to subtracting each other, but this mode need to be noted down and store whole shading according to do different parameters control
(temperature, yield value, time for exposure), need very big memory.In comparison, the present invention can calculate corresponding each column pixel
Each offset compensate, therefore only need each offset for storing corresponding each column pixel in memory or be even not required to
It stores in memory, and storage space can be saved and reduce computational complexity.
The foregoing is only a preferred embodiment of the present invention, is not intended to restrict the invention, for the skill of this field
For art personnel, the invention may be variously modified and varied.All within the spirits and principles of the present invention, made any to repair
Change, equivalent replacement, improvement etc., should all be included in the protection scope of the present invention.
Claims (9)
1. a kind of fixed pattern noise removal method, in an image sensor, which is characterized in that include:
According to multiple compensated pixel value in each column pixel, each offset of corresponding each column pixel is calculated,
Include:
Set a specific operation gain；And
Under the specific operation gain and an original state, samples and calculate each primary color pixels in the shading region column a Zhong Gaige pixel
Each column primary color pixels average value and the shading region in each primary color pixels each primary color pixels average value difference, and be stored in
In one memory；Wherein, whole pixels are not photosensitive in the shading region；And
According to each offset of each column pixel, compensated when sampling multiple photosensitive area pixel values of a photosensitive area, with
Generate multiple compensation photosensitive area pixel values；
Wherein, multiple photosensitive area pixels are photosensitive in the photosensitive area generates multiple photosensitive area pixel value.
2. fixed pattern noise removal method as described in claim 1, which is characterized in that according to multiple in each column pixel
The step of compensated pixel value, each offset of the corresponding each column pixel of calculating, includes:
Calculate a shading region certain primary color pixel average of whole certain primary color pixels in the shading region under an analog gain；With
And
By being somebody's turn to do for pixels whole in each primary color pixels average value of each primary color pixels in each column pixel and each column pixel
The difference of each pixel average is multiplied by the ratio between the analog gain and the specific operation gain, then adds up the shading region picture
Each offset of plain average value as each column pixel.
3. fixed pattern noise removal method as described in claim 1, which is characterized in that the specific operation gain is one maximum
Actual gain.
4. fixed pattern noise removal method as described in claim 1, which is characterized in that according to multiple in each column pixel
The step of compensated pixel value, each offset of the corresponding each column pixel of calculating, includes:
When multiple photosensitive area pixel is photosensitive in the photosensitive area, each shading of the shading region column a Zhong Gaige pixel is sampled and calculated
Each offset of the column pixel average in area as each column pixel.
5. fixed pattern noise removal method as described in claim 1, which is characterized in that each offset and multiple photosensitive
Area's pixel value compensates under a digital form.
6. fixed pattern noise removal method as described in claim 1, which is characterized in that each offset and multiple photosensitive
Area's pixel value compensates under an analog form.
7. a kind of fixed pattern noise removal method, in an image sensor, which is characterized in that include:
According to multiple compensated pixel value in each column pixel, each offset of corresponding each column pixel is calculated,
Include:
Set a specific operation gain；
Cut off the connection of multiple photosensitive area pixel in a sampler and a photosensitive area；And
Under the specific operation gain and an original state, the sampler is calculated corresponding to each in each column pixel in the photosensitive area
Each column primary colors circuit average value and the sampler of primary color pixels correspond to each primary colors electricity of each primary color pixels in the photosensitive area
The difference of road average value, and be stored in a memory；And
According to each offset of each column pixel, compensated when sampling multiple photosensitive area pixel values of the photosensitive area, with
Generate multiple compensation photosensitive area pixel values；
Wherein, multiple photosensitive area pixels are photosensitive in the photosensitive area generates multiple photosensitive area pixel value.
8. fixed pattern noise removal method as claimed in claim 7, which is characterized in that according to multiple in each column pixel
The step of compensated pixel value, each offset of the corresponding each column pixel of calculating, includes:
Calculate a shading region pixel average of whole pixels in a shading region；And
The sampler corresponds to each primary colors circuit average value of each primary color pixels and sampling in each column pixel in the photosensitive area
The difference that device corresponds to each column circuit average value of whole pixels in each column pixel is multiplied by an analog gain and the specific operation
A ratio between gain, then the shading region pixel average is added up as each offset of each column pixel；
Wherein, whole pixels are not photosensitive in the shading region.
9. fixed pattern noise removal method as claimed in claim 7, which is characterized in that the specific operation gain is one maximum
Actual gain.
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| CN110365925B (en) * | 2019-07-11 | 2021-08-31 | 北京安酷智芯科技有限公司 | Reading circuit, and method and device for determining bias circuit noise |
| CN114079735B (en) * | 2020-08-19 | 2024-02-23 | 瑞昱半导体股份有限公司 | Image compensation system for fixed image noise |
| CN113365002B (en) * | 2021-06-04 | 2022-09-16 | 深圳市汇春科技股份有限公司 | Fixed mode noise dynamic compensation device and method and terminal equipment |
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| US20110128420A1 (en) * | 2009-11-30 | 2011-06-02 | Stmicroelectronics (Research & Development) Limited | Method and system for repeated fixed pattern noise correction |
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