CN104111766B - The calibration method of resistive touch screen - Google Patents
The calibration method of resistive touch screen Download PDFInfo
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- CN104111766B CN104111766B CN201410355371.1A CN201410355371A CN104111766B CN 104111766 B CN104111766 B CN 104111766B CN 201410355371 A CN201410355371 A CN 201410355371A CN 104111766 B CN104111766 B CN 104111766B
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Abstract
The invention provides a kind of calibration method of resistive touch screen, including step：M platform electronic equipments are chosen in the electronic equipment of a collection of use resistive touch screen, the carrying out to every resistive touch screen of the electronic equipment of taking-up is tested, to obtain the calibration parameter of the electronic equipment, the physical coordinates (X of datum mark Cc, Yc), the logical coordinates (X of datum mark CLc, YLc), X-axis deviation factor kxAnd Y-axis deviation factor ky；Take the X-axis deviation factor k of m platform electronic equipmentsx, and Y-axis deviation factor ky, respectively obtain the average value of the twoAndBy the physical coordinates (X of datum mark Cc, Yc), the logical coordinates (X of datum mark CLc, YLc), X-axis deviation factor average valueAnd Y-axis deviation factor average valueIt is stored in each this batch of electronic equipment.
Description
Technical field
The present invention relates to the method for electronic device touchscreen calibration, more particularly to a kind of calibration side of resistive touch screen
Method.
Background technology
Resistive touch screen is a kind of sensor, and the physical location of touch point in rectangular area (X, Y) is converted to generation by it
The voltage of Table X coordinate and Y-coordinate.Many LCD modules all employ resistive touch screen.
Resistive touch screen is a kind of sensor, and substantially film is plus the structure of glass, and film and glass are adjacent
Simultaneously go up and scribble ITO (nano indium tin metal oxide) coating, ITO has good electric conductivity and the transparency.Grasped when touching
When making, the ITO of film lower floor can touch the ITO of glass superstrate, and corresponding electric signal is spread out of via inductor, by conversion electricity
Road is sent to processor, and X, Y value on screen are converted into by computing, and completes the action for clicking, and is presented on screen.Specifically
Ground, the screen body portion of electric resistance touch screen is one piece of multi-layer compound film coordinated very much with display surface, by one layer of glass or
Used as basic unit, surface scribbles the ITO conductive layer of layer of transparent to lucite, is stamped one layer of outer surface cure process, light again above
The scratch resistant plastic layer of cunning, its inner surface is also coated with one layer of ITO conductive layer, there is many tiny (be less than between two conductive layers
Mil) transparent isolation point they are separated insulation.During the tactile touch screens of point, two-layer ITO conductive layer occurs one and connects
Contact, because wherein a face conductive layer connects the 5V even voltages of Y direction so that the voltage of detecting layer is changed into non-zero from zero,
After controller detects this connection, A/D conversions are carried out, and the magnitude of voltage that will be obtained is compared with 5V, you can obtain the Y-axis of touch point
Coordinate, similarly draws the coordinate of x-axis, here it is the most basic principle of resistive technologies touch-screen.
After being completed using the electronic equipment of touch screens, typically before shipment, touch screens can be calibrated.Resistance
The general principle for shielding calibration is that the logical coordinates (being obtained by clicking on touch screens) for collecting CPU is set up one a pair with display screen
The relation answered.Realize it is of the invention during, inventor find there are the following problems in the prior art, due to calibration procedure
Time relationship, it is impossible to each point to touch screens is acquired, and to ensure precision, and the quantity of collection point again can not be too
It is few, so calibration process is wasted time and energy, and in a calibration process, it is easy to occur because staff's operational error causes school
Quasi- failure, so as to need to recalibrate or the underproof situation of misinterpretation touch screens.Particularly, during production in enormous quantities, carry out
The each touch screens of equipment calibrated by platform, and production efficiency is relatively low.
The content of the invention
For this reason, it may be necessary to a kind of calibration method of quick accurately resistive touch screen is provided, during solving to produce in enormous quantities
The problem that touch screens prover time is long, efficiency is low.
To achieve the above object, a kind of calibration method of resistive touch screen, including step are inventor provided：
M platform electronic equipments, wherein m >=1 are chosen in the electronic equipment of a collection of use resistive touch screen；
Carrying out to every resistive touch screen of the electronic equipment of taking-up is tested, and is joined with the calibration for obtaining the electronic equipment
Number, the calibration parameter includes the functional relation parameter between the physical coordinates and logical coordinates of each point on resistive touch screen,
The acquisition process of calibration parameter includes step：
Take the test point of n on every resistive touch screen of the electronic equipment of taking-up, n >=2,
Point touches each test point, obtains the logical coordinates of each test point,
Physical coordinates according to each test point calculate calibration parameter with logical coordinates；
Calibration parameter or its average value are stored in each this batch of electronic equipment.
Wherein, the carrying out to every resistive touch screen of the electronic equipment of taking-up is tested, to obtain the electronic equipment
Calibration parameter, the acquisition process of calibration parameter includes step：
Take the test point of n on resistive touch screen, n >=3, including more than 3 test points of different X-coordinate,
And more than 3 test points of different Y-coordinate, each test point physical coordinates are expressed as (Xa, Ya), (Xb, Yb)……(Xn,
Yn)；
Point touches each test point, obtains the logical coordinates (X of each test pointLa, YLa), (XLb, YLb)……(XLn, YLn)；
In test point, choose the p test points different to physics X-coordinate and calculate X-axis deviation factor kx, p >=1 chooses q pairs
The different test point of physics Y-coordinate calculates Y-axis deviation factor ky, q >=1, x-axis deviation factor kxComputing formula it is as follows：Wherein Δ XLiRepresent the logic X-coordinate difference of the different point of each pair physics X-coordinate, Δ XiRepresent each pair thing
The physics X-coordinate difference of the different point of reason X-coordinate, Y-axis deviation factor kyComputing formula it is as follows：Wherein Δ
YLiRepresent the logic Y-coordinate difference of the different point of each pair physics Y-coordinate, Δ YiRepresent the thing of the different point of each pair physics Y-coordinate
Reason Y-coordinate difference；
A point C points (X is chosen in test pointc, Yc) point is used as datum mark, the calibration parameter for recording the electronic equipment is as follows：
Physical coordinates (the X of datum mark Cc, Yc), the logical coordinates (X of datum mark CLc, YLc), X-axis deviation factor kxAnd Y-axis deviation system
Number ky；
Take the logical coordinates (X of the datum mark C of m platform electronic equipmentsLc, YLc), X-axis deviation factor kx, and Y-axis deviation factor
ky, respectively obtain the average value of these parameters And
By the physical coordinates (X of datum mark Cc, Yc), the average value of the logical coordinates of datum mark CX-axis deviation system
Number average valueAnd Y-axis deviation factor average valueIt is stored in each this batch of electronic equipment.
Optionally, put and touch each test point, obtain the logical coordinates (X of each test pointLa, YLa), (XLb, YLb)……(XLn,
YLn) after, compare the difference between the difference of logical coordinates between test point and the difference of physical coordinates, if test point is patrolled
The difference between the difference and the difference of physical coordinates of coordinate is collected within preset range, then carries out next step, otherwise repeated
Point touches each test point, to retrieve the logical coordinates (X of each test pointLa, YLa), (XLb, YLb)……(XLn, YLn), until surveying
Difference is within preset range between the difference of the logical coordinates of pilot and the difference of physical coordinates.
Optionally, the calibration parameter for obtaining electronic equipment also includes step：
A point C points (X is chosen in test pointc, Yc) put as datum mark, and choose a point E (Xe, Ye) point conduct calibration
Point, calculates the theoretical logic coordinate (X of E pointsLe’, YLe’), the theoretical logic coordinate computing formula of E points is as follows：XLe'=XLc+kx
(Xe-Xc), YLe'=YLc+ky(Ye-Yc)；
By the theoretical logic coordinate (X of E pointsLe’, YLe’) with the logical coordinates (X of E pointsLe, YLe) compare, if the reason of E points
By logical coordinates (XLe’, YLe’) with the logical coordinates (X of E pointsLe, YLe) difference the electronics is recorded within the scope of default, then
The calibration parameter of equipment is as follows：Physical coordinates (the X of datum mark Cc, Yc), the logical coordinates (X of datum mark CLc, YLc), X-axis deviation
Coefficient kxAnd Y-axis deviation factor ky, if it is not, repeating point touches each test point, obtain the logical coordinates (X of each test pointLa, YLa),
(XLb, YLb)……(XLn, YLn), and recalculate X-axis deviation factor kxAnd Y-axis deviation factor ky, then calculate the reason of E points
By logical coordinates, if until the theoretical logic coordinate (X of E pointsLe’, YLe’) with the logical coordinates (X of E pointsLe, YLe) difference pre-
If within the scope of.
Optionally, the resistive touch screen is rectangle, the test point quantity n=5, wherein 4 test point difference structures
Into 4 summits of a test rectangle, 4 of the test rectangle distinguish parallel in 4 with resistive touch screen, another survey
Pilot is located among test rectangle.
Optionally, the test point among test rectangle is particularly located at the midpoint of test rectangle.
Optionally, edge 3mm more than of the test point away from resistive touch screen.
Prior art is different from, above-mentioned technical proposal uses a batch electronic product of resistive touch screen in test
It is sampled, and utilizes the calibration parameter by obtaining these samples, tries to achieve X-axis deviation factor average valueAnd Y-axis deviation
Coefficient average valuePhysical coordinates and logical coordinates together with datum mark are stored in this collection of electronic product so that Mei Yitai
Equipment can in software read these parameters, and the mode without manually calibrating goes to obtain, and saves manpower.
Brief description of the drawings
Fig. 1 is the flow chart of the calibration method of resistive touch screen described in specific embodiment；
Fig. 2 is the distribution schematic diagram 1 of test point described in the calibration method of resistive touch screen described in specific embodiment；
Fig. 3 is the distribution schematic diagram 2 of test point described in the calibration method of resistive touch screen described in specific embodiment；
Fig. 4 is the distribution schematic diagram 3 of test point described in the calibration method of resistive touch screen described in specific embodiment.
Specific embodiment
To describe technology contents, structural feature, the objects and the effects of technical scheme in detail, below in conjunction with specific reality
Apply example and coordinate accompanying drawing to be explained in detail.
Fig. 1 is referred to, a kind of calibration method of resistive touch screen is present embodiments provided, comprised the following steps：
S101 chooses m platform electronic equipments, wherein m >=1, example in the electronic equipment of a collection of use resistive touch screen
Such as choose the electronic equipment that 30 screen sizes are the powered resistive touch screens of 320*240.Because sample selection quantity is more, finally
Calibration result it is more accurate, but it is also more to calibrate spent man-hour, therefore, according to the actual conditions and quality of product
Demand for control, can choose the different sample test of quantity, in some cases, it is also possible to only choose a sample test.
Carrying out to every resistive touch screen of the electronic equipment of taking-up is tested, and is joined with the calibration for obtaining the electronic equipment
Number, the acquisition process of calibration parameter includes step：
S102 takes the test point of n, n >=3, including more than 3 tests of different X-coordinate on resistive touch screen
More than point, and 3 test point of different Y-coordinate, each test point physical coordinates are expressed as (Xa, Ya), (Xb, Yb)……
(Xn, Yn)；In an embodiment as illustrated in figure 2, resistive touch screen 2 is rectangle, the test point quantity n=5, wherein 4 surveys
Pilot A, B, C, D respectively constitute 4 summits of a test rectangle 20,4 sides of the test rectangle 20 and resistive touch screen
4 sides difference it is parallel, another test point E be located at test rectangle 20 among, in some embodiments, positioned at test rectangle among
Test point is particularly located at the midpoint of test rectangle namely at the geometric center of rectangle.Specifically, on resistive touch screen
Five test points are taken, its physical coordinates is distributed as A (56.25,200), B (281.25,200), C (56.25,56.25), D
(281.25,56.25), E (168.75,128.125)；
The test point of distributed rectangular is easy to test to be calculated with result, certainly, in certain embodiments, due to being actually needed,
Can be distributed using the test point of other modes, such as oblique line shape, triangle, rhombus, the form such as hexagon, circle.
In embodiment, edge 3mm more than of the test point away from resistive touch screen, this is due to resistive touch screen
Often point is touched and is easily caused touch screens damage for marginal portion, therefore select from the position of more than resistive touch platen edge 3mm
As test point.
Simultaneously because wishing to obtain less relative error, in embodiment, the distance of each test point should be widened suitably, with
Reduce the error of final result.
S103 points touch each test point, obtain the logical coordinates (X of each test pointLa, YLa), (XLb, YLb)……(XLn, YLn)；
Correspondence above-described embodiment, progressively clicks on five points of ABCDE with resistance pen, obtains five logical coordinates A (90,320) of point, B
(450,321), C (91,90), D (450,89), E (270,205)；
S104 compares the difference between the difference of the logical coordinates between test point and the difference of physical coordinates, if test point
The difference of logical coordinates and the difference of physical coordinates between difference within preset range, then carry out next step, otherwise
Repeat point and touch each test point, to retrieve the logical coordinates (X of each test pointLa, YLa), (XLb, YLb)……(XLn, YLn), directly
To difference between the difference and the difference of physical coordinates of the logical coordinates of test point within preset range.The step for mesh
Be ensure calibration precision so that error amount is within demand accuracy rating.
For the ease of comparing, in embodiment, the rectangular distribution of physical coordinates of test point, so, in contrastive test point
The difference of logical coordinates and the difference of physical coordinates between difference when, due in the point X-axis on rectangle same side
Physical coordinates it is identical, or physical coordinates in Y-axis are identical, therefore it is 0 that can select the difference of physical coordinates between test point
Test point constitute and be compared for a pair, as long as calculating the logical coordinates difference between these test points, you can patrolled with being equal to
The difference between the difference and the difference of physical coordinates of coordinate is collected, this just greatly facilitates comparison.
Data for example shown in above-described embodiment, A points (logical coordinates (90,320)) and C points (logical coordinates C (91,90))
The logical coordinates difference of X-axis be 1 (91-90=1), the difference of physical coordinates is 0, and the two difference is 1；
The logical coordinates difference of the X-axis of B (logical coordinates (450,321)) and D (logical coordinates (450,89)) is 0 (450-
450=0), the difference of physical coordinates is 0, and difference therebetween is 0；
Therefore the difference between A and C, the logical coordinates difference of B and D and the difference of physical coordinates is within preset range 3.
The logical coordinates difference of the Y-axis of A and B is 1 (321-320=1), and the difference of physical coordinates is 0, and the two difference is 1；
The logical coordinates difference of the Y-axis of C and D is 1 (90-89=1), and the difference of physical coordinates is 0, difference therebetween
It is 1；
Therefore the difference between A and B, the logical coordinates difference of C and D and the difference of physical coordinates is within preset range 3,
Carry out next step
S105 chooses the p test points different to physics X-coordinate and calculates X-axis deviation factor k in test pointx, p >=1, choosing
Take the q test points different to physics Y-coordinate and calculate Y-axis deviation factor ky, q >=1,
X-axis deviation factor kxComputing formula it is as follows：Wherein Δ XLiRepresent each pair physics
The logic X-coordinate difference of the different point of X-coordinate, Δ XiThe physics X-coordinate difference of the different point of each pair physics X-coordinate is represented,
Specifically, in the present embodiment
Y-axis deviation factor kyComputing formula it is as follows：Wherein Δ YLiRepresent each pair physics Y
The logic Y-coordinate difference of the different point of coordinate, Δ YiRepresent the physics Y-coordinate difference of the different point of each pair physics Y-coordinate；
Specifically, in the present embodiment,
In fact, because the quantity of test point in different embodiments is different, and the matching method difference between test point,
Above-mentioned formula is applied to following various situations, for example：
In a pair to test point, each test point is only existed in a pair of test points combination of two between test point, such as A,
4 points of test rectangles of composition of B, C, D, are calculating kxWhen, A, B are a pair of test points, and C, D are another pair test point, calculate public
Formula is：Calculating kyWhen, A, C are a pair of test points, and B, D are tested for another pair
Point, computing formula isIn the absence of the test point for repeating；
By 4 points of test rectangles for constituting of A, B, C, D, p, q are respectively equal to 2 to correspondence,
Calculate X-axis deviation factor：
kx={ (450-90)/(281.25-56.25)+(450-91)/(281.25-56.25) }/2=1.60；
Y-axis deviation factor：
ky={ (320-90)/(200-56.25)+(321-89)/(200-56.25) }/2=1.61
It should be noted that two test points subtracted each other with coordinate in each monomial in multinomial in formula 2 in formula 1
It is different, but same test point can be presented in different monomials, for example as described in Figure 4 test point Triangle-Profile when
Situation.A pair pairs of test points are combined as between test point, but some test points are combined with multiple test points respectively, as shown in figure 4,
3 points of one triangles of composition of A, B, C, at this moment, are calculating kxWhen, A, B can be classified as a pair of test points, A, C are surveyed for another pair
Pilot, computing formula is：Now, A points are respectively combined with multiple test points, in meter
Calculate kyWhen, B, C are a pair of test points, and A, C are another pair test point, and computing formula is：
C points are respectively combined with multiple test points, and in such embodiment, test point centering has the test point for repeating.
S106 chooses a point C points (X in test pointc, Yc) put as datum mark, and choose a point E (Xe, Ye) point conduct
Calibration point, calculates the theoretical logic coordinate (X of E pointsLe’, YLe’), it is many that the selection of datum mark is preferably placed at that other test points surround
Within the shape of side, so that test result is more accurate.
Because the theoretical logic coordinate computing formula of any point F on resistive touch screen is as follows, XLf'=XLc+kx(Xf-
Xc) (formula 3), YLf'=YLc+ky(Yf-Yc) (formula 4)；The data of above-described embodiment are substituted into, is obtained：XLf=91+1.60 ×
(Xf, and Y -56.25)Lf=90+1.61 × (Yf-56.25)
The physical coordinates (168.75,128.125) of calibration point E are substituted into, the theoretical logic that we obtain calibration point E points is sat
Mark computing formula is as follows：(270,205.7)；
S107 is by the theoretical logic coordinate (X of E pointsLe’, YLe’) with the logical coordinates (X of E pointsLe, YLe) compare, if E points
Theoretical logic coordinate (XLe’, YLe’) with the logical coordinates (X of E pointsLe, YLe) difference within the scope of default, such as it is above-mentioned
Embodiment, the theoretical logic coordinate (270,205.7) of E points, the logical coordinates (270,205) with E points compares, the difference of abscissa
It is 0, the difference of ordinate is 0.7, within default scope 3；
Therefore the calibration parameter for recording the electronic equipment is as follows：Physical coordinates (the X of datum mark Cc, Yc), datum mark C's patrols
Collect coordinate (XLc, YLc), X-axis deviation factor kxAnd Y-axis deviation factor ky, if it is not, repeating point touches each test point, obtain each test
Logical coordinates (the X of pointLa, YLa), (XLb, YLb)……(XLn, YLn), and recalculate X-axis deviation factor kxAnd Y-axis deviation system
Number ky, the theoretical logic coordinate of E points is then calculated, if until the theoretical logic coordinate (X of E pointsLe’, YLe’) sat with the logic of E points
Mark (XLe, YLe) difference within the scope of default.The purpose of the step is the precision for ensureing calibration so that error amount exists
Within the accuracy rating of demand.
The calibration parameter that S108 records the electronic equipment is as follows：Physical coordinates (the X of datum mark Cc, Yc), datum mark C's patrols
Collect coordinate (XLc, YLc), X-axis deviation factor kxAnd Y-axis deviation factor ky；
S109 takes the logical coordinates (X of the datum mark C of m platform electronic equipmentsLc, YLc), X-axis deviation factor kx, and Y-axis deviation
Coefficient ky, respectively obtain the average value of three And
S110 is by the physical coordinates (X of datum mark Cc, Yc), the logical coordinates (X of datum mark CLc, YLc), X-axis deviation factor is put down
AverageAnd Y-axis deviation factor average valueIt is stored in each this batch of electronic equipment.
In another embodiment, in order to accelerate test, the test point of test is reduced, as shown in figure 3, employing tiltedly
3 points of A, B, C of line distribution as test point, wherein with C as test point, point on the basis of A, now p, q are respectively equal to 1.Why
Be distributed using oblique line 3 the reason for are that X-coordinate and Y-coordinate overlap between can avoiding test point, pull open the two it
Between coordinate difference, reduce error, while the quantity of test point can be retrieved.
It should be noted that herein, such as first and second or the like relational terms are used merely to a reality
Body or operation make a distinction with another entity or operation, and not necessarily require or imply these entities or deposited between operating
In any this actual relation or order.And, term " including ", "comprising" or its any other variant be intended to
Nonexcludability is included, so that process, method, article or terminal device including a series of key elements not only include those
Key element, but also other key elements including being not expressly set out, or also include being this process, method, article or end
The intrinsic key element of end equipment.In the absence of more restrictions, limited by sentence " including ... " or " including ... "
Key element, it is not excluded that also there is other key element in the process including the key element, method, article or terminal device.This
Outward, herein, " it is more than ", " being less than ", " exceeding " etc. are interpreted as not including this number；" more than ", " below ", " within " etc. understand
It is to include this number.
Although being described to the various embodiments described above, those skilled in the art once know basic wound
The property made concept, then can make other change and modification to these embodiments, so embodiments of the invention are the foregoing is only,
Not thereby scope of patent protection of the invention, the equivalent structure that every utilization description of the invention and accompanying drawing content are made are limited
Or equivalent flow conversion, or other related technical fields are directly or indirectly used in, similarly it is included in patent of the invention
Within protection domain.
Claims (6)
1. a kind of calibration method of resistive touch screen, including step：
M platform electronic equipments, wherein m >=1 are chosen in the electronic equipment of a collection of use resistive touch screen；
Carrying out to every resistive touch screen of the electronic equipment of taking-up is tested, to obtain the calibration parameter of the electronic equipment,
The calibration parameter includes the functional relation parameter between the physical coordinates and logical coordinates of each point, calibration on resistive touch screen
The acquisition process of parameter includes step：
Take the test point of n on every resistive touch screen of the electronic equipment of taking-up, n >=2,
Point touches each test point, obtains the logical coordinates of each test point,
Physical coordinates according to each test point calculate calibration parameter with logical coordinates；
Calibration parameter or its average value are stored in each this batch of electronic equipment；
Calibration parameter includes X-axis deviation factor kx, Y-axis deviation factor ky, and datum mark physical coordinates and logical coordinates, school
The acquisition process of quasi- parameter includes step：
The test point of n is taken on resistive touch screen, n >=3, the physics X-coordinate of 3 test points of wherein at least is different, and extremely
The physics Y-coordinate of few 3 test points is different, and each test point physical coordinates are expressed as (Xa, Ya), (Xb, Yb)……(Xn,
Yn)；
Point touches each test point, obtains the logical coordinates (X of each test pointLa, YLa), (XLb, YLb)……(XLn, YLn)；
In test point, choose the p test points different to physics X-coordinate and calculate X-axis deviation factor kx, q is chosen to physics Y in p >=1
The different test point of coordinate calculates Y-axis deviation factor ky, q >=1, x-axis deviation factor kxComputing formula it is as follows：Wherein Δ XLiRepresent the logic X-coordinate difference of the different point of each pair physics X-coordinate, Δ XiRepresent each pair thing
The physics X-coordinate difference of the different point of reason X-coordinate, Y-axis deviation factor kyComputing formula it is as follows：Wherein Δ
YLiRepresent the logic Y-coordinate difference of the different point of each pair physics Y-coordinate, Δ YiRepresent the thing of the different point of each pair physics Y-coordinate
Reason Y-coordinate difference；
A point C points (X is chosen in test pointc, Yc) point is used as datum mark, the calibration parameter for recording the electronic equipment is as follows：Benchmark
Physical coordinates (the X of point Cc, Yc), the logical coordinates (X of datum mark CLc, YLc), X-axis deviation factor kxAnd Y-axis deviation factor ky；
Take the logical coordinates (X of the datum mark C of m platform electronic equipmentsLc, YLc), X-axis deviation factor kx, and Y-axis deviation factor ky,
Respectively obtain the average value of above parameter And
By the physical coordinates (X of datum mark Cc, Yc), the average value of the logical coordinates of datum mark CX-axis deviation factor is put down
AverageAnd Y-axis deviation factor average valueIt is stored in each this batch of electronic equipment.
2. the calibration method of resistive touch screen according to claim 1, it is characterised in that point touches each test point, obtains
Logical coordinates (the X of each test pointLa, YLa), (XLb, YLb)……(XLn, YLn) after, compare logical coordinates between test point
Difference between difference and the difference of physical coordinates, if between the difference of the logical coordinates of test point and the difference of physical coordinates
Difference then carries out next step within preset range, otherwise repeats point and touches each test point, to retrieve patrolling for each test point
Collect coordinate (XLa, YLa), (XLb, YLb)……(XLn, YLn), until the difference of the difference of the logical coordinates of test point and physical coordinates
Between difference within preset range.
3. the calibration method of resistive touch screen according to claim 1, it is characterised in that obtain the calibration of electronic equipment
Parameter also includes step：
A point C points (X is chosen in test pointc, Yc) put as datum mark, and choose a point E (Xe, Ye) put as calibration point, meter
Calculate the theoretical logic coordinate (X of E pointsLe’, YLe’), the theoretical logic coordinate computing formula of E points is as follows：XLe'=XLc+kx(Xe-Xc),
YLe'=YLc+ky(Ye-Yc)；
By the theoretical logic coordinate (X of E pointsLe’, YLe’) with the logical coordinates (X of E pointsLe, YLe) compare, if the theory of E points is patrolled
Collect coordinate (XLe’, YLe’) with the logical coordinates (X of E pointsLe, YLe) difference the electronic equipment is recorded within the scope of default, then
Calibration parameter it is as follows：Physical coordinates (the X of datum mark Cc, Yc), the logical coordinates (X of datum mark CLc, YLc), X-axis deviation factor
kxAnd Y-axis deviation factor ky, if it is not, repeating point touches each test point, obtain the logical coordinates (X of each test pointLa, YLa), (XLb,
YLb)……(XLn, YLn), and recalculate X-axis deviation factor kxAnd Y-axis deviation factor ky, then calculate the theoretical logic of E points
Coordinate, if until the theoretical logic coordinate (X of E pointsLe’, YLe’) with the logical coordinates (X of E pointsLe, YLe) difference in default model
Within enclosing.
4. the calibration method of the resistive touch screen according to claims 1 to 3 any one, it is characterised in that the electricity
Resistive touch screen is rectangle, the test point quantity n=5, wherein 4 test points respectively constitute 4 summits of a test rectangle,
4 of the test rectangle distinguish parallel in 4 with resistive touch screen, and another test point is located among test rectangle.
5. the calibration method of resistive touch screen according to claim 4, it is characterised in that among test rectangle
Test point is particularly located at the midpoint of test rectangle.
6. the calibration method of the resistive touch screen according to claims 1 to 3 any one, it is characterised in that the survey
Edge 3mm more than of the pilot away from resistive touch screen.
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| CN108287633B (en) * | 2015-10-08 | 2021-06-01 | Oppo广东移动通信有限公司 | Calibration method and device of pressure sensor |
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